CN203337570U - Detecting system - Google Patents
Detecting system Download PDFInfo
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- CN203337570U CN203337570U CN2013204303076U CN201320430307U CN203337570U CN 203337570 U CN203337570 U CN 203337570U CN 2013204303076 U CN2013204303076 U CN 2013204303076U CN 201320430307 U CN201320430307 U CN 201320430307U CN 203337570 U CN203337570 U CN 203337570U
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Abstract
The embodiment of the utility model provides a detecting system. The detecting system comprises an image collecting device, a data processing device and a substrate bearing device. Two-dimensional image information of a substrate is obtained through the image collecting device, and then the data processing device is used for detecting whether the substrate is damaged or not according to the two-dimensional image information obtained by the image collecting device and the preset specification standard data of the substrate. Due to the fact that when the substrate is detected according to the two-dimensional image information obtained by the image collecting device and the preset specification standard data of the substrate, the substrate can be detected according to the specification standard data from a plurality of aspects, leak detection cannot happen easily, the detecting precision is high, and the precision of damage detection of the substrate can be effectively improved.
Description
Technical field
The utility model relates to the display technique field, relates in particular to a kind of detection system.
Background technology
Panel of LCD comprises color membrane substrates and array base palte, and color membrane substrates and array base palte are all to using glass substrate to carry out different processes as the most basic starting material and form.Wherein the manufacture process of array base palte usually need to circulate and carries out film forming, exposure, etching and peel off these techniques to make many patterned layer.Because the thickness of glass on glass substrate is thinner, usually at 0.3-0.7mm, glass edge is very easily broken or damaged in process of production, once glass is damaged or broken, can causes and have a strong impact on product and equipment.
Usually the substrate defect detection method of array base station or color membrane substrates mainly contains vacuum suction and reports to the police and camera be set at the edge of substrate traffic direction whether record edge damaged.Wherein vacuum suction is reported to the police to be substrate is carried out to vacuum suction, detects the vacuum tightness after adsorbing, if do not reach default vacuum tightness, determines the base station breakage, is reported to the police.But this method easily is subject to the impact of the fluctuation of vacuum supply pressure, platen flatness, the slight deformation of substrate, therefore false alarm or undetected easily appears; Camera is set at the edge of substrate traffic direction and records whether edge is damaged can only detect the damaged of substrate travel edge, and can't detect the substrate edges vertical with direct of travel is damaged, therefore, current substrate defect detection method is the damaged situation of base stations detected effectively, and accuracy of detection is lower.
Summary of the invention
The utility model embodiment provides a kind of detection system, to improve the precision of substrate defect detection.
A kind of detection system comprises:
For obtaining the image capture device of two-dimensional image information of substrate;
For according to described two-dimensional image information and the whether damaged data processing equipment of the described substrate of predefined substrate specification standards Data Detection, with described image capture device, be connected.
The utility model embodiment provides a kind of detection system, comprise image capture device, data processing equipment, obtain the two-dimensional image information of substrate by image capture device, whether the two-dimensional image information obtained according to image capture device by data processing equipment again and predefined substrate specification standards data detect substrate damaged, while due to the two-dimensional image information obtained according to image capture device and predefined substrate specification standards data, substrate being detected, can be detected according to the specification standards data of many aspects, therefore be not prone to undetected survey, accuracy of detection is also higher, can effectively improve the precision of substrate defect detection.
The accompanying drawing explanation
One of structural representation of the detection system that Fig. 1 provides for the utility model embodiment;
The structural representation of a kind of image capture device that Fig. 2 provides for the utility model embodiment;
Two of the structural representation of the detection system that Fig. 3 provides for the utility model embodiment;
One of substrate bearing equipment structural representation that Fig. 4 provides for the utility model embodiment;
Two of the substrate bearing equipment structural representation that Fig. 5 provides for the utility model embodiment;
A kind of data processing equipment structural representation that Fig. 6 provides for the utility model embodiment;
A kind of preferably detection system structural representation that Fig. 7 provides for the utility model embodiment.
Embodiment
The utility model embodiment provides a kind of detection system, comprise image capture device, data processing equipment, and substrate bearing equipment, obtain the two-dimensional image information of substrate by image capture device, whether the two-dimensional image information obtained according to image capture device by data processing equipment again and predefined substrate specification standards data detect substrate damaged, while due to the two-dimensional image information obtained according to image capture device and predefined substrate specification standards data, substrate being detected, can be detected according to the specification standards data of many aspects, therefore be not prone to undetected survey, accuracy of detection is also higher, can effectively improve the precision of substrate defect detection.
As shown in Figure 1, the utility model embodiment provides a kind of detection system, comprising:
For obtaining the image capture device 101 of two-dimensional image information of substrate;
For according to two-dimensional image information and the whether damaged data processing equipment 102 of predefined substrate specification standards Data Detection substrate, with image capture device 101, be connected.
Obtain the two-dimensional image information of substrate by image capture device 101, then the two-dimensional image information obtained according to image capture device 101 by data processing equipment 102 and predefined substrate specification standards data whether detect substrate damaged.While due to scanning obtains according to image capture device 101 two-dimensional image information and predefined substrate specification standards data, substrate being detected, can be detected according to the specification of the many aspects such as shape, area, therefore be not prone to undetected survey, accuracy of detection is also higher.
Wherein, substrate can be that display base plate in display device manufacturing process, underlay substrate etc. have formed or not yet be formed with all kinds of substrates of component graphics, and does not limit display type, such as thinking liquid crystal display, electroluminescence demonstration etc.;
Image capture device can be the equipment that possesses the two dimensional image acquisition function of existing any type, and charge coupled cell (Charge Coupled Device, the CCD) scanning device of take in the utility model embodiment describes as example.
Concrete, as shown in Figure 2, image capture device 101 comprises:
CCD201, the CDD driving circuit 202 be connected with CCD201 and be connected to the lens 203 on CCD201, wherein lens 203 are for increasing the sweep length of CCD201.
In practical application, can be according to substrate the width on the pixel direction determine the multiple that zooms in or out of lens 203 so that the width of substrate on the pixel direction is within the sweep length of CCD201.
Wherein, CCD201 can be specially:
Preferably, as shown in Figure 3, the detection system that the utility model embodiment provides also comprises: for the substrate bearing equipment 103 of bearing substrate, be positioned at the below of image capture device 101;
Concrete, when CCD201 is line array CCD 201, because line array CCD 201 can be read each pixel data with form line by line, therefore substrate bearing equipment 103 can be transfer type substrate load bearing equipment 103 as shown in Figure 4, be arranged on the below of lens 203, after substrate is placed on transfer type substrate load bearing equipment 103, can with the rotating speed of fixing, drive the travelling belt on transfer type substrate load bearing equipment 103 to move along certain direction by the servomotor of transfer type substrate load bearing equipment 103, thereby drive substrate with same speed motion, line array CCD 201 can be lined by line scan to each pixel data of the position of bearing substrate in substrate bearing equipment 103, obtain this surperficial two-dimensional image information.
When CCD201 is area array CCD 201, because area array CCD 201 can directly scan the two-dimensional image information that obtains the position of bearing substrate in substrate bearing equipment 103, therefore substrate bearing equipment 103 can be panel type substrate bearing equipment 103 as shown in Figure 5, is arranged on the below of lens 203.
Certainly, those skilled in the art can adopt other feasible patterns that image capture device 101 and substrate bearing equipment 103 are set, and two kinds of preferably set-up modes only are provided herein, no longer one by one narration.
In practical application, as shown in Figure 6, data processing equipment 102 comprises:
Be connected the digital-to-analog conversion card 601 of the two dimensional gray data of substrate with image capture device 101 for determining according to the two-dimensional image information of this face;
For according to two dimensional gray data and the whether damaged processor 602 of predefined substrate specification standards Data Detection substrate, with digital-to-analog conversion card 601, be connected.
The mode that the two-dimensional image information that processor 602 obtains according to CCD201 and predefined substrate specification standards Data Detection are placed in the substrate on substrate bearing equipment 103 has a lot, preferably, the two-dimensional image information that can obtain according to many-sided specification standards data and the CCD201 scanning of substrate is detected, to improve the precision that substrate is detected, the utility model embodiment provides two kinds of preferably embodiments.
The first embodiment is for determining the area of substrate according to two-dimensional image information, predefined substrate specification standards data are predefined substrate area data, obtain the two-dimensional image information of substrate, the mode that can obtain the two-dimensional image information of the position of bearing substrate in substrate bearing equipment 103 by CCD201 realizes, the electric signal that will embody two-dimensional image information by digital-to-analog conversion card 601 again is converted to digital signal, form the two dimensional gray data of this face, can obtain the two dimensional gray data of substrate, processor 602 can be determined according to predefined threshold value the pixel corresponding to gradation data of counterpart substrate in the two dimensional gray data, the threshold value that can distinguish substrate and substrate bearing equipment 103 that wherein predefined threshold value can be determined according to the gray scale of the face of substrate and substrate bearing equipment 103 bearing substrates, for example, when the gray-scale value of substrate is 5, and the gray-scale value of substrate bearing equipment 103 is 0 o'clock, can set the threshold to 4, when processor 602 is determined pixel corresponding to the gradation data of counterpart substrate in the two dimensional gray data, gray-scale value can be greater than to the pixel that 4 pixel is defined as counterpart substrate, preferably, by the pixel point identification of counterpart substrate, be 1, by the pixel point identification of counterpart substrate load bearing equipment 103, be 0, thereby identify the distribution in the two-dimensional image information that substrate obtains in scanning, obtain 0 of a two dimension, 1 value distribution dot matrix.
Because the two-dimensional image information obtained zooms in or out through lens 203, therefore to determine a constant value again according to the area that zooms in or out each pixel in coefficient and two-dimensional image information of lens 203, pass through formula
can determine the real area of substrate, wherein a
ijfor 0,1 value distribution dot matrix i of two dimension capable in 0,1 being worth of j pixel, C is definite constant value, definite area value and predefined substrate area data are compared, if definite area value is less than predefined substrate area data, can determine that substrate exists damaged.
The second embodiment is for determining the profile of substrate according to two-dimensional image information, predefined substrate specification standards data are predefined substrate profile data, in practical application, can obtain by the method identical with the first embodiment 0,1 value distribution dot matrix of a two dimension.
Determine again the profile of substrate according to the two dimensional gray dot matrix, and compare with predefined substrate profile data, thereby determine that whether substrate is damaged.
As shown in Figure 7, the utility model embodiment provides a kind of concrete detection system, comprising:
Wherein digital-to-analog conversion card 601 is determined two-dimensional data matrix for the two-dimensional image information that scanning obtains according to line array CCD 201, and whether processor 602 is for damaged according to two-dimensional data matrix and predefined substrate area data and predefined substrate profile Data Detection substrate.
The utility model embodiment provides a kind of detection system, comprise image capture device 101, data processing equipment 102, and substrate bearing equipment 103, obtain the two-dimensional image information of substrate by image capture device 101, whether the two-dimensional image information obtained according to image capture device by data processing equipment 102 again and predefined substrate specification standards data detect substrate damaged, while due to the two-dimensional image information obtained according to image capture device 101 and predefined substrate specification standards data, substrate being detected, can be detected according to the specification standards data of many aspects, therefore be not prone to undetected survey, accuracy of detection is also higher, can effectively improve the precision of substrate defect detection.
Obviously, those skilled in the art can carry out various changes and modification and not break away from spirit and scope of the present utility model the utility model.Like this, if within of the present utility model these are revised and modification belongs to the scope of the utility model claim and equivalent technologies thereof, the utility model also is intended to comprise these changes and modification interior.
Claims (9)
1. a detection system, is characterized in that, comprising:
For obtaining the image capture device of two-dimensional image information of substrate;
For according to described two-dimensional image information and the whether damaged data processing equipment of the described substrate of predefined substrate specification standards Data Detection, with described image capture device, be connected.
2. the system as claimed in claim 1, is characterized in that, also comprises:
For the substrate bearing equipment of bearing substrate, be positioned at the below of described image capture device.
3. the system as claimed in claim 1, is characterized in that, described image capture device is specially:
Charge coupled cell CCD scanning device.
4. system as described as claim 1 or 3, is characterized in that, described image capture device comprises:
CCD, the CDD driving circuit be connected with described CCD and be connected to the lens for the sweep length that increases described CCD on described CCD.
5. system as claimed in claim 4, is characterized in that, described CCD is specially:
Line array CCD; Perhaps
Area array CCD.
6. system as claimed in claim 5, is characterized in that, described CCD is line array CCD, and described system also comprises:
For the transfer type substrate load bearing equipment of bearing substrate, be positioned at the below of described lens.
7. system as claimed in claim 5, is characterized in that, described CCD is area array CCD, and described system also comprises:
For the panel type substrate bearing equipment of bearing substrate, be positioned at the below of described lens.
8. the system as claimed in claim 1, is characterized in that, described data processing equipment comprises:
Be connected the digital-to-analog conversion card of the two dimensional gray data of described substrate with described image capture device for determining according to described two-dimensional image information;
For according to described two dimensional gray data and the whether damaged processor of the described substrate of predefined substrate specification standards Data Detection, with described digital-to-analog conversion card, be connected.
9. system as claimed in claim 8, is characterized in that, described processor is specially: computer PC; Perhaps
On-site programmable gate array FPGA; Perhaps
Complex programmable logic device (CPLD).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2013204303076U CN203337570U (en) | 2013-07-17 | 2013-07-17 | Detecting system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2013204303076U CN203337570U (en) | 2013-07-17 | 2013-07-17 | Detecting system |
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| CN203337570U true CN203337570U (en) | 2013-12-11 |
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| CN2013204303076U Expired - Fee Related CN203337570U (en) | 2013-07-17 | 2013-07-17 | Detecting system |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104897692A (en) * | 2015-06-16 | 2015-09-09 | 中信戴卡股份有限公司 | Online detection system and method for finish turning effects of aluminum alloy castings |
| WO2016138744A1 (en) * | 2015-03-02 | 2016-09-09 | 京东方科技集团股份有限公司 | Display panel surface flatness detection device and method |
-
2013
- 2013-07-17 CN CN2013204303076U patent/CN203337570U/en not_active Expired - Fee Related
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2016138744A1 (en) * | 2015-03-02 | 2016-09-09 | 京东方科技集团股份有限公司 | Display panel surface flatness detection device and method |
| US9964403B2 (en) | 2015-03-02 | 2018-05-08 | Boe Technology Group Co., Ltd. | Device and method for detecting flatness of surface of display panel |
| CN104897692A (en) * | 2015-06-16 | 2015-09-09 | 中信戴卡股份有限公司 | Online detection system and method for finish turning effects of aluminum alloy castings |
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| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20131211 |
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| CF01 | Termination of patent right due to non-payment of annual fee |