CN203312255U - Scanning electron microscope sample table easy to fix and adjust samples - Google Patents
Scanning electron microscope sample table easy to fix and adjust samples Download PDFInfo
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- CN203312255U CN203312255U CN2013201477324U CN201320147732U CN203312255U CN 203312255 U CN203312255 U CN 203312255U CN 2013201477324 U CN2013201477324 U CN 2013201477324U CN 201320147732 U CN201320147732 U CN 201320147732U CN 203312255 U CN203312255 U CN 203312255U
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Abstract
The utility model discloses a scanning electron microscope sample table easy to fix and adjust samples in the field of metal physical analysis to solve the problem that irregular big samples cannot be fixed and angles of the samples cannot be adjusted on the prior sample tables. The sample table includes a circular base which is connected with a mechanical part of a scanning electron microscope through center screws. Three baffles capable of ascending and descending are annularly arranged around the circular base. The bottom parts of the baffles capable of ascending and descending are connected with the base respectively through screws and realize ascending and descending respectively and an ascending and descending range of the baffles capable of ascending and descending is 0-10mm above the base. Through adjusting height of each baffle capable of ascending and descending respectively, the scanning electron microscope sample table easy to fix and adjust the samples supports the irregular samples so that the samples do not slide in a moving and inclining process of the sample table. Moreover, the irregular samples can be adjusted to a best viewing angle so that observation quality of the scanning electron microscope is improved.
Description
Technical field
The utility model relates to a kind of sample platform of scanning electronic microscope that is easy to fix and adjust sample of metal physics analysis field.
Background technology
ESEM is utilize static or at sample surfaces, do the electron beam of a branch of fine focus of raster scan, and the bombardment sample surfaces produces various signals, utilizes the electromagnetic lens system imaging, the instrument that solid material is analyzed.Sample stage is the important component part of ESEM, is to carry out sample to observe essential carrying and adjustment means.By it, can realize the motion of sample in all directions, thereby obtain suitable sample observation place.Usually the sample stage of ESEM is the flat base of a circle, and ESEM is controlled by the computer control system pair mechanical part be connected with round base, realizes movement and the inclination of sample stage at different directions.Some problems but conventional sample stage exists in observing sample below:
1, when specimen size is large and profile when irregular, usually need some auxiliary materials to support sample, sample can be positioned on sample stage more reposefully.Place like this sample in the observation process, along with sample stage moves, the supplemental support material may produce loosening, thereby causes sample to move, and the quality of image is observed in impact, may fall down sample stage when serious, the damage ESEM.
2, when large dimension specimen need to carry out oblique view, even be fixed on sample stage by conducting resinl, angle of inclination can not be too large, otherwise sample is easily from the sample stage landing.
The utility model content
The purpose of this utility model is to overcome the prior art defect, and a kind of sample platform of scanning electronic microscope fixing and the adjustment sample that is easy to is provided.
The technical solution of the utility model is achieved in that a kind of sample platform of scanning electronic microscope fixing and the adjustment sample that is easy to, and comprises pedestal, and it is, around pedestal, is equipped with the liftable baffle plate.
Preferably, the liftable baffle plate has two at least, is separately fixed at around pedestal.
Preferably, the liftable baffle plate is provided with three, is separately fixed at around pedestal ringwise.
Preferably, liftable baffle plate bottom is connected with pedestal by screw and realizes separately lifting.
Preferably, the range of liftable baffle plate is the above 0～10mm of pedestal.
The utility model is by regulating respectively the height of each adjustable end stop, can support irregular sample, sample bench move and the process that tilts in can not slide, and can access the optimal viewing angle of irregular sample, improve the observation quality of ESEM.
The accompanying drawing explanation
Fig. 1 is the utility model structure vertical view.
In figure, the 1-pedestal; 2-liftable baffle plate; The 3-screw.
Embodiment
Below in conjunction with accompanying drawing, be further described:
As shown in Figure 1, a kind of sample platform of scanning electronic microscope that is easy to fix and adjust sample, comprise the round base 1 be connected with the mechanical part of ESEM by center bolt 3, it is, three liftable baffle plates 2 have been circular layout around round base 1, liftable baffle plate 2 bottoms are connected with pedestal respectively by screw 3 and can realize separately lifting, and according to practical experience, the range of liftable baffle plate 2 is that the above 0～10mm of pedestal can meet the demands.
The utility model is mainly to be applicable to for the irregular sample design of large scale, and main operational steps is as follows:
1, by screw 3, pedestal 1 center is connected with the mechanical part of ESEM;
2, after sample is finished to preliminary treatment, place on sample stage, by the screw 3 of regulating liftable baffle plate 2 bottoms, determine the height of each liftable baffle plate 2, the sample sightingpiston is horizontal; As needs, sample bench is carried out to oblique view, can support sample with liftable baffle plate 2 sides, by regulating other two liftable baffle plates 2, the sample sightingpiston is horizontal;
3, after sample was placed, sample room vacuumized processing, and after the required level of vacuum of the equipment that reaches, making alive carries out the sample observation.
Claims (5)
1. one kind is easy to sample platform of scanning electronic microscope fixing and the adjustment sample, comprises pedestal, it is characterized in that: around pedestal, be equipped with the liftable baffle plate.
2. according to claim 1ly a kind ofly be easy to fixing and adjust the sample platform of scanning electronic microscope of sample, it is characterized in that: the liftable baffle plate has two at least, is separately fixed at around pedestal.
3. according to claim 2ly a kind ofly be easy to fixing and adjust the sample platform of scanning electronic microscope of sample, it is characterized in that: the liftable baffle plate is provided with three, is separately fixed at around pedestal ringwise.
4. according to claim 1,2 or 3 described a kind of sample platform of scanning electronic microscope fixing and the adjustment sample that are easy to, it is characterized in that: liftable baffle plate bottom is connected with pedestal by screw and realizes separately lifting.
5. according to the described a kind of sample platform of scanning electronic microscope fixing and the adjustment sample that is easy to of claim 1 or 3, it is characterized in that: the range of liftable baffle plate is the above 0～10mm of pedestal.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2013201477324U CN203312255U (en) | 2013-03-28 | 2013-03-28 | Scanning electron microscope sample table easy to fix and adjust samples |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2013201477324U CN203312255U (en) | 2013-03-28 | 2013-03-28 | Scanning electron microscope sample table easy to fix and adjust samples |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN203312255U true CN203312255U (en) | 2013-11-27 |
Family
ID=49618442
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2013201477324U Expired - Fee Related CN203312255U (en) | 2013-03-28 | 2013-03-28 | Scanning electron microscope sample table easy to fix and adjust samples |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN203312255U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106876234A (en) * | 2017-04-17 | 2017-06-20 | 南京大学 | A kind of sample stage for the analysis of mineral facies automatic identification |
| CN110857925A (en) * | 2018-08-17 | 2020-03-03 | 河南中镜科仪科技有限公司 | Adjustable wide mouthful of sample centre gripping platform |
-
2013
- 2013-03-28 CN CN2013201477324U patent/CN203312255U/en not_active Expired - Fee Related
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106876234A (en) * | 2017-04-17 | 2017-06-20 | 南京大学 | A kind of sample stage for the analysis of mineral facies automatic identification |
| CN106876234B (en) * | 2017-04-17 | 2018-06-26 | 南京大学 | A kind of sample stage for the analysis of mineral facies automatic identification |
| CN110857925A (en) * | 2018-08-17 | 2020-03-03 | 河南中镜科仪科技有限公司 | Adjustable wide mouthful of sample centre gripping platform |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| TR01 | Transfer of patent right | ||
| TR01 | Transfer of patent right |
Effective date of registration: 20170717 Address after: 430083, Gate No. 2, Qingshan District, Hubei, Wuhan Patentee after: Wuhan iron and Steel Company Limited Address before: 430080 Wuhan, Hubei Friendship Road, No. 999, Wuchang Patentee before: Wuhan Iron & Steel (Group) Corp. |
|
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20131127 Termination date: 20180328 |