CN205861581U - A kind of scalable electron probe specimen holder - Google Patents
A kind of scalable electron probe specimen holder Download PDFInfo
- Publication number
- CN205861581U CN205861581U CN201620710275.9U CN201620710275U CN205861581U CN 205861581 U CN205861581 U CN 205861581U CN 201620710275 U CN201620710275 U CN 201620710275U CN 205861581 U CN205861581 U CN 205861581U
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- Prior art keywords
- plate
- base
- specimen holder
- right plate
- left plate
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- Analysing Materials By The Use Of Radiation (AREA)
- Sampling And Sample Adjustment (AREA)
Abstract
The utility model discloses a kind of scalable electron probe specimen holder, including base, the both sides of base are respectively arranged with left plate and right plate, sliding tray is offered on base, left plate and right plate are placed in sliding tray, left plate and right plate can regulate both distances in sliding tray, and the base between left plate and right plate is provided with the centre post stretched, and left plate, right plate and base are provided with some location screw.Realize differing heights is inlayed the clamping of all product by the height of regulation centre post, meanwhile, left and right sides plate is designed as mobile side board, thus completes the clamping to different size sample, expanded the range of specimen holder, be conducive to analyzing carrying out of work.
Description
Technical field
This utility model belongs to engineering machinery field, concrete a kind of scalable electron probe specimen holder.
Background technology
Electron probe is a kind of microcell chemical analysis means, and its ultimate principle is mutual with solid matter according to high energy electron
The principle of effect, utilizes the beam bombardment sample surfaces of the sufficiently high a branch of fine focusing of energy, excites sample to produce feature X and penetrates
Line signal, reaches the purpose of solid sample Microanalysis.
At present, electron probe only has a set of for clamping the specimen holder inlaying all product, because completing the tune in height direction
Save and make analysis work receive a certain degree of restriction.
Utility model content
The purpose of this utility model is to overcome above-mentioned deficiency, it is provided that a kind of scalable electron probe specimen holder, it is possible to
It is applicable to all product of edge of different size.
In order to achieve the above object, this utility model includes base, and the both sides of base are respectively arranged with left plate and right side
Plate, base offers sliding tray, left plate and right plate and is placed in sliding tray, and left plate and right plate can be in sliding trays
Regulate both distances, the base between left plate and right plate is provided with the centre post stretched, left plate,
Some location screw it is provided with on right plate and base.
Described centre post is threaded rod.
Described centre post is arranged on the middle part of base.
Location screw on described left plate and right plate is symmetrical arranged.
Location screw on described base is symmetrical arranged along axis.
Described left plate is concordant with the top of right plate.
Compared with prior art, this utility model realizes differing heights is inlayed sample by the height of regulation centre post
The clamping of sample, meanwhile, is designed as the left and right sides plate mobile side board, thus completes the clamping to different size sample, expands
The range of specimen holder, is conducive to analyzing carrying out of work.
Further, centre post of the present utility model is threaded rod, it is possible to by selecting regulation support height, make tune
It is more accurate to save.
Accompanying drawing explanation
Fig. 1 is structural representation of the present utility model;
Wherein, 1, left plate;2, centre post;3, base;4, right plate;5, position screw.
Detailed description of the invention
Below in conjunction with the accompanying drawings this utility model is described further.
Seeing Fig. 1, this utility model includes that base 3, the both sides of base 3 are respectively arranged with left plate 1 and right plate 4, left
Side plate 1 is concordant with the top of right plate 4, base 3 offers sliding tray, left plate 1 and right plate 4 and is placed in sliding tray, left
Side plate 1 and right plate 4 can regulate both distances in sliding tray, and the base 3 between left plate 1 and right plate 4 sets
Being equipped with the centre post 2 that can stretch, left plate 1, right plate 4 and base 3 are provided with some location screw 5, center is propped up
Strut 2 is threaded rod, and the location screw 5 that centre post 2 is arranged on the middle part of base 3, left plate 1 and right plate 4 is symmetrical
Arranging, the location screw 5 on base 3 is symmetrical arranged along axis.
Test sample after edge sample is placed on centre post 2, center of rotation support bar 2, makes sample upper surface with left
Side plate 1 is concordant with the top of right plate 4, regulates left side plate position so that it is contact with sample, and by two on base 3
Left side plate position is fixed by individual location screw 5, then by the location screw 5 on regulation left side plate, by sample levels and
Firmly it is clamped on specimen holder.
Claims (6)
1. a scalable electron probe specimen holder, it is characterised in that include that base (3), the both sides of base (3) are respectively provided with
There are left plate (1) and right plate (4), base (3) offer sliding tray, left plate (1) and right plate (4) and is placed in sliding tray
In, left plate (1) and right plate (4) can regulate both distances in sliding tray, left plate (1) and right plate (4) it
Between base (3) on be provided with the centre post (2) that stretches, left plate (1), right plate (4) and base (3) are upper to be arranged
There are some location screw (5).
A kind of scalable electron probe specimen holder the most according to claim 1, it is characterised in that described centre post
(2) it is threaded rod.
A kind of scalable electron probe specimen holder the most according to claim 1, it is characterised in that described centre post
(2) middle part of base (3) it is arranged on.
A kind of scalable electron probe specimen holder the most according to claim 1, it is characterised in that described left plate (1)
It is symmetrical arranged with the location screw (5) on right plate (4).
A kind of scalable electron probe specimen holder the most according to claim 1, it is characterised in that on described base (3)
Location screw (5) be symmetrical arranged along axis.
A kind of scalable electron probe specimen holder the most according to claim 1, it is characterised in that described left plate (1)
Concordant with the top of right plate (4).
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201620710275.9U CN205861581U (en) | 2016-07-05 | 2016-07-05 | A kind of scalable electron probe specimen holder |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201620710275.9U CN205861581U (en) | 2016-07-05 | 2016-07-05 | A kind of scalable electron probe specimen holder |
Publications (1)
Publication Number | Publication Date |
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CN205861581U true CN205861581U (en) | 2017-01-04 |
Family
ID=57644685
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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CN201620710275.9U Active CN205861581U (en) | 2016-07-05 | 2016-07-05 | A kind of scalable electron probe specimen holder |
Country Status (1)
Country | Link |
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CN (1) | CN205861581U (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN108398451A (en) * | 2018-04-13 | 2018-08-14 | 中国地质大学(武汉) | The irregular sample stage of electron probe |
CN108732194A (en) * | 2018-03-18 | 2018-11-02 | 桂林理工大学 | Multicapacity convenient can vary electron probe sample stage |
-
2016
- 2016-07-05 CN CN201620710275.9U patent/CN205861581U/en active Active
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN108732194A (en) * | 2018-03-18 | 2018-11-02 | 桂林理工大学 | Multicapacity convenient can vary electron probe sample stage |
CN108398451A (en) * | 2018-04-13 | 2018-08-14 | 中国地质大学(武汉) | The irregular sample stage of electron probe |
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C14 | Grant of patent or utility model | ||
GR01 | Patent grant |