CN203164235U - Elastic probe possessing insulating ferrules - Google Patents
Elastic probe possessing insulating ferrules Download PDFInfo
- Publication number
- CN203164235U CN203164235U CN 201320203355 CN201320203355U CN203164235U CN 203164235 U CN203164235 U CN 203164235U CN 201320203355 CN201320203355 CN 201320203355 CN 201320203355 U CN201320203355 U CN 201320203355U CN 203164235 U CN203164235 U CN 203164235U
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- Prior art keywords
- probe
- syringe
- insulating
- insulating ferrule
- ferrule
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Abstract
An elastic probe possessing insulating ferrules relates to the elastic probe in a chip test bench, and comprises a syringe, an upper test probe body and a lower test probe body arranged at the upper and lower ends in the interior of the syringe, and a spring arranged in the middle of the interior of the syringe. A groove is arranged on the outside of the upper test probe body and is used to install and fix a first insulating ferrule, fastening hooks are arranged on the outside of the syringe and are used to install and fix a second insulating ferrule, and in order to assemble the second insulating ferrule conveniently, each fastening hook is equipped with a chamfer. The two insulating ferrules enable the probe to be fixed in a probe positioning hole more stably, during the compression and circulation processes of the elastic probe, the two insulating ferrules enable the probe to move vertically in the probe positioning hole, and the probe does not incline.
Description
Technical field
The utility model relates to semicon industry, specially refers to the elastic probe in the chip testing seat.
Background technology
Whether semi-conductor chip must can satisfy the requirement of electric property through the performance test of electric aspect with checking chip in research and development and batch production process.The chip testing seat is the critical component in the proving installation: it provides the location for chip when testing; Transmit electric signal and electric current between chip and the measurement circuit plate.Good and bad reliability and the accuracy that directly influences chip testing of test bench performance.Test bench mainly comprises die attach flag, the elastic probe between probe holding plate and connection chip and the measurement circuit plate.The main effect of test bench is assignment test chip and elastic probe, and for fear of the short circuit between the elastic probe, most test bench all is to be made by ambroin.
Elastic probe plays the effect of conduction current and signal, and traditional probe all is made up of metal material., shown in accompanying drawing 4 and accompanying drawing 5, usually elastic probe has four parts: syringe (101), the last testing needle (102) that is arranged on syringe inside (101) upper and lower end and following testing needle (103), be arranged on the spring (104) at syringe (101) bosom position.Under the effect of external force, elastic probe has two kinds of different move modes: a kind of is single-lift, and last testing needle (102) and syringe (101) are mobile together; Another kind is double-acting, and move upper and lower needle body (102), (103), and syringe (101) is motionless.By the movement of elastic probe, come conductive electrical current signal by last testing needle (102), syringe (101) and following testing needle (103).
In recent years, along with chip testing frequency and bandwidth improve constantly, require its probe test seat also to want to satisfy demand under the high-frequency test.For this reason, developed high-frequency test seat and the elastic probe of being formed by metal material fully thereof.
This type of elastic probe has two kinds of application forms:
---only at last testing needle an insulating ferrule is set, this kind probe is easily crooked in the compression cycle process, causes bad test result.
---an insulating ferrule respectively is set on last testing needle and syringe, and this kind elastic probe can keep in the compression cycle process vertically, but after compression cycle repeatedly, following insulating ferrule can slide up and down, and causes unsettled test result.
The utility model content
The technical problems to be solved in the utility model is to overcome deficiency of the prior art, and a kind of new elastic probe with insulating ferrule is provided.Probe can stably be inserted in the pilot hole, both can vertically move, also can run-off the straight; Not only install easily, can also prevent that lasso from becoming flexible landing.
The utility model is to realize by following technical measures.A kind of elastic probe with insulating ferrule, comprise syringe, be arranged on the inner upper and lower end of described syringe last testing needle and following testing needle, be arranged on the spring at described syringe bosom position, also comprise: be arranged on described first insulating ferrule of going up the testing needle outside, be arranged on second insulating ferrule of described syringe outside, two trips of fixing described second insulating ferrule are set in described syringe outside.
The outside of testing needle arranges the groove of fixing described first insulating ferrule on described.
The chamfering of being convenient to assemble described second insulating ferrule all is set on described trip.
Constitute described first insulating ferrule, the described second insulating ferrule material is the Teflon material.
After the utility model adopted abovementioned technology, the groove on the last testing needle was fixed first insulating ferrule, from last testing needle top or the bottom push first insulating ferrule, can be fixed in groove; Two trips of syringe outside are fixed second insulating ferrule, from the syringe top or the bottom push second insulating ferrule and advance in two formed grooves of trip, can be fixed, prevent the loosening landing after compression cycle repeatedly of second insulating ferrule.Chamfering on the trip is convenient to the assembling of second insulating ferrule.Two insulating ferrules can make more stable being fixed in the probe pilot hole of probe.Elastic probe is in the compression cycle process, and last testing needle and syringe drive two insulating ferrules and move up and down together, and two insulating ferrules can make probe vertically mobile in the probe pilot hole, can not tilt.
Description of drawings
Accompanying drawing 1 is the structural representation of the utility model embodiment.
Accompanying drawing 2 is the A portion enlarged drawing in the accompanying drawing 1.
Accompanying drawing 3 is the B portion enlarged drawing in the accompanying drawing 1.
Accompanying drawing 4 is the structural representation of single-lift elastic probe in the prior art.
Accompanying drawing 5 is the structural representation of double-acting elastic probe in the prior art.
Among the figure: 1 is last testing needle, and 2 is syringe, and 3 are following testing needle, and 4 is spring, and 5 is first insulating ferrule, and 6 is groove, and 7 is second insulating ferrule, and 8 is trip, and 9 is the chamfering on the trip.101 is syringe of the prior art, and 102 is the testing needle of going up of the prior art, and 103 is testing needle down of the prior art, and 104 is spring of the prior art.
Embodiment
The utility model is described in further detail below in conjunction with drawings and Examples.
Embodiment such as Fig. 1-shown in Figure 3, a kind of elastic probe with insulating ferrule, comprise syringe 2, be arranged on syringe 2 inner upper and lower ends last testing needle 1 and following testing needle 3, be arranged on the spring 4 at syringe 2 bosom positions; In the outside of last testing needle 1 groove 6 is set, in order to install and to fix first insulating ferrule 5; In the outside of syringe 2 second insulating ferrule 7 is set, in the outside of syringe 2 trip 8 is set, in order to install and to fix second insulating ferrule 7; For the ease of second insulating ferrule 7 is assemblied on the syringe 2, on each trip 8 chamfering 9 is set all.The material 7 that constitutes first insulating ferrule 5, second insulating ferrule is Teflon materials.
From last testing needle 1 top or the bottom push first insulating ferrule 5 and advance groove 6, can be fixed within the groove 6; From syringe 2 tops or the bottom push second insulating ferrule 7 and advance in two trips, the 8 formed grooves, also second insulating ferrule 8 can be fixed.Two insulating ferrules can make more stable being fixed in the probe pilot hole of probe.Elastic probe is in the compression cycle process, and last testing needle 1 and syringe 2 drive two insulating ferrules (5 and 7) and move up and down together, and two insulating ferrules (5 and 7) can make probe vertical mobile in the probe pilot hole, can not tilt.
Above-described only is preferred implementation of the present utility model.Should be pointed out that for the person of ordinary skill of the art under the prerequisite that does not break away from the utility model principle, can also make some modification and improvement, these also should be considered as belonging to protection domain of the present utility model.
Claims (4)
1. elastic probe with insulating ferrule, comprise syringe (2), be arranged on the inner upper and lower end of described syringe (2) last testing needle (1) and following testing needle (3), be arranged on the spring (4) at described syringe (2) bosom position, also comprise: be arranged on described first insulating ferrule (5) of going up testing needle (1) outside, be arranged on second insulating ferrule (7) of described syringe (2) outside, two trips (8) of fixing described second insulating ferrule (7) are set in described syringe (2) outside.
2. a kind of elastic probe with insulating ferrule according to claim 1 is characterized in that: the outside of testing needle (1) arranges the groove (6) of fixing described first insulating ferrule (5) on described.
3. a kind of elastic probe with insulating ferrule according to claim 1 is characterized in that: the chamfering (9) of being convenient to assemble described second insulating ferrule (7) all is set on described trip (8).
4. a kind of elastic probe with insulating ferrule according to claim 1, it is characterized in that: the material that constitutes described first insulating ferrule (5), described second insulating ferrule (7) is the Teflon material.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201320203355 CN203164235U (en) | 2013-04-22 | 2013-04-22 | Elastic probe possessing insulating ferrules |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201320203355 CN203164235U (en) | 2013-04-22 | 2013-04-22 | Elastic probe possessing insulating ferrules |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN203164235U true CN203164235U (en) | 2013-08-28 |
Family
ID=49025412
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 201320203355 Expired - Lifetime CN203164235U (en) | 2013-04-22 | 2013-04-22 | Elastic probe possessing insulating ferrules |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN203164235U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI623751B (en) * | 2017-09-29 | 2018-05-11 | 中華精測科技股份有限公司 | Probe device and rectangular probe thereof |
| CN113009196A (en) * | 2021-03-02 | 2021-06-22 | 上海捷策创电子科技有限公司 | Probe for chip test and chip test device |
-
2013
- 2013-04-22 CN CN 201320203355 patent/CN203164235U/en not_active Expired - Lifetime
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI623751B (en) * | 2017-09-29 | 2018-05-11 | 中華精測科技股份有限公司 | Probe device and rectangular probe thereof |
| CN113009196A (en) * | 2021-03-02 | 2021-06-22 | 上海捷策创电子科技有限公司 | Probe for chip test and chip test device |
| CN113009196B (en) * | 2021-03-02 | 2022-03-18 | 上海捷策创电子科技有限公司 | Probe for chip test and chip test device |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CX01 | Expiry of patent term |
Granted publication date: 20130828 |
|
| CX01 | Expiry of patent term |