CN203163962U - Automatic general solar wafer detection platform - Google Patents
Automatic general solar wafer detection platform Download PDFInfo
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- CN203163962U CN203163962U CN 201320057540 CN201320057540U CN203163962U CN 203163962 U CN203163962 U CN 203163962U CN 201320057540 CN201320057540 CN 201320057540 CN 201320057540 U CN201320057540 U CN 201320057540U CN 203163962 U CN203163962 U CN 203163962U
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Abstract
The utility model provides an automatic general solar wafer detection platform, comprising a control unit, an equipment body, a stacked wafer feeding mechanism, a wafer conveying mechanism, a measuring module, a wafer gathering mechanism, a control module and a signal processing module. The tacked wafer feeding mechanism automatically transmits the wafers to a conveying belt; the conveying belt drives the wafers into the measuring module; and after measurement, the control module automatically sort the wafers into different wafer gathering benches according to the measurement result. The platform has functions of automatic feeding and conveying and simple sorting, can carry out expansion function and realize corresponding detection function through configuration of required measure modules. Compared with the prior art, the automatic general solar wafer detection platform has configuration flexibility and selectivity, shortens development period of novel machines, lowers exploitation and production costs and facilitates later maintenance.
Description
Technical field
The utility model relates to the solar wafer detection platform, especially relates to a kind of full automatic general solar wafer inspection platform.
Background technology
Wafer is the carrier of solar battery sheet, and the quality of wafer quality has directly determined the height of solar battery sheet conversion efficiency, and therefore, solar energy production producer need carry out the detection of a plurality of parameters to the wafer of producing.Along with the fierceness further of market competition and the development of sun power industry technology level, more and more higher to the detection requirement of wafer.
Existing wafer manufacture producer usually is faced with the client new detection requirement, and intra-company lacks corresponding checkout equipment, or the insufficiency face of existing sorter, lack the part measurement function, present general solution is to adopt manual detection or purchase a multi-functional sorter in addition.But use the method for manual detection can increase human cost, not only measuring speed is slow, and rises because artificial factor makes fallout ratio and loss easily.Do not possess unifunctional screening installation and do not provide in the market yet, purchase the waste that a multi-functional sorter then can cause function and resource in addition.
The utility model content
The purpose of this utility model provides a kind of full-automatic general detection platform at solar wafer, emphasis detects or bad and real-time sorting parameter, perhaps replenish certain measuring ability that existing equipment lacks, the user can select the quantity of measurement function and measuring unit according to the demand of self, and can carry out the function expansion.
Full-automatic general solar wafer detection platform provided by the utility model comprises: control module, apparatus body, stacked wafer feed mechanism, wafer transport mechanism, measurement module, slice receiving mechanism of slice, control module and signal processing module;
Described control module comprises sensor and actuator module, controller module and power module:
Sensor and actuator module comprise stroke limit sensor, wafer acquisition sensor, stepper motor, cylinder, solenoid valve, wherein the stroke limit sensor makes zero for the position of stepper motor, the wafer acquisition sensor is for detection of the residing position of wafer, stepper motor, cylinder, solenoid valve is used for driving wafer feed mechanism, wafer transport mechanism, and the mechanical action of sorting slice receiving mechanism of slice;
Controller module comprises microprocessor unit, communication module, light-emitting diode display interface, digital input and output modules, stepper motor driver, wherein microprocessor unit sends steering order, coordinate the work of each module, communication module is finished the communication with host computer, digital input and output modules is finished various kinds of sensors, transform electric work between solenoid valve and the microprocessor unit, stepper motor driver is for generation of the driving signal that can drive the stepper motor action; Device module processed designs according to modular thought, is divided into different circuit boards according to difference in functionality, and can dispose according to difference in functionality demand flexible combination;
Described stacked wafer feed mechanism comprises the jacking mechanism with stacked wafer jack-up, the wafer in the film magazine is grasped and is discharged into the Acetabula device on the conveying belt, drives the slide unit of sucker transmission wafer etc.;
Described wafer transport mechanism is driven by synchronous pulley by motor, and belt is flat belt, and belt speed is adjustable, regulates the travelling speed of belt according to the processing speed of measurement module;
Described measurement module is located in the middle of two sections belts of wafer transport mechanism, can freely dispose according to user's demand, and the measurement function that can select comprises: thickness, electricity model, resistivity, outward appearance, stria, latent split etc.;
Described slice receiving mechanism of slice is divided into the qualified platform that takes up, wafer jacking mechanism, defective platform and other sheet platform that takes up that takes up; The qualified platform that takes up has elevating mechanism, is judged as qualified slice, thin piece and finally enters qualified film magazine, whenever enters the certain position of a slice lifting table decline; The wafer jacking mechanism will be sent into defective film magazine through judging the defective wafer jack-up in district according to the instruction of control module; Other sheet receiving can mainly receives and has little time to handle or slice, thin piece undetermined.
Further, full-automatic general solar wafer detection platform provided by the utility model can install expansion platform additional at tail end, described expansion platform comprises platform body, conveyor module and the non-qualified platform that takes up, and the qualified platform that takes up of former full-automatic general solar wafer detection platform is contained in the tail end of expansion platform.Expansion platform does not possess the material loading function, and qualified that last process sorts out flows into the general extension platform, can further detect and sorting.The function expansion of carrying out in this way repeatedly just can realize multi-functional sorting.
Full-automatic general solar wafer detection platform provided by the utility model has the function of automatic charging, conveying and simple and easy sorting, and when having been arranged, new detection demand can carry out the function expansion, the user can select the quantity of measurement function and measuring unit according to the demand of self, just can realize corresponding measuring ability by the measurement module of configuration needs.Compared with prior art, have higher configuration flexibility and alternative, simultaneously can be so that the construction cycle of new architecture to be shorter, exploitation and production cost are lower, later maintenance is more convenient, is specially adapted to need to increase newly the solar wafer manufacturer of a certain or several measuring abilities.
Description of drawings
Fig. 1 is the mono functional module figure of full-automatic general solar wafer detection platform provided by the utility model.
Fig. 2 is the structural representation of full-automatic general solar wafer detection platform provided by the utility model.
Fig. 3 is the expansion platform module map of full-automatic general solar wafer detection platform provided by the utility model.
Embodiment
For allow above-mentioned purpose of the present utility model, feature and advantage can be understandable in detail, below with reference to accompanying drawing embodiment of the present utility model is elaborated.
Fig. 1 is the mono functional module figure of full-automatic general solar wafer detection platform provided by the utility model, is used for all parameter measurements and the sorting of solar wafer.Platform comprises apparatus body 01, stacked wafer feed mechanism 02, conveyor module 03, measurement module 04, non-qualified receiving platform 05, qualified receiving platform 06, control module 07 and signal processing module 08.
Fig. 2 is the structural representation of full-automatic general solar wafer detection platform provided by the utility model.As shown in Figure 2, pile up the feeding manipulator 12 that material loading structure 02 comprises wafer material loading elevating mechanism 11, material loading sucker 13 and transports wafer.When beginning to measure, a folded wafer to be measured is put into a film magazine, after pressing ACK button, material loading elevating mechanism 11 rises under the drive of motor, and sensor 31 is housed on the material loading sucker 13, treat that sensor 31 detects wafer after, material loading elevating mechanism 11 stops, material loading sucker 13 is down motion under the drive of cylinder, picks up wafer, and feeding manipulator 12 motions are sent to belt conveyor 20 with wafer.
The front end of measurement module 14 has a sensor 32, treat that 32 detect and begin image data after wafer enters surveyed area, transfer data to signal processing module 08, handle through data through the wafer of measured zone, system can provide measurement result, judges qualified, defective or other.
When wafer arrived the top of sensor 33, control module 07 can be controlled jacking mechanism 18 according to signal processing results, if qualified, cylinder is jack-up not, and wafer flows to the qualified platform 17 that takes up; If qualified of right and wrong, cylinder is jack-up under the control of solenoid valve, and wafer is sent into non-qualified receiving can 16, thereby realizes sorting function.
Fig. 3 is the multifunction module figure after the full-automatic general solar wafer detection platform process provided by the utility model expansion, can carry out a plurality of measuring abilities expansions on the basis of general main platform 40.
Qualified of sorting out of general-purpose platform master platform 40 flows directly into expansion platform 41 and carries out second Function detection, qualified that flows out from second expansion platform 41 directly enters the 3rd expansion platform 42 and carries out Function detection and sorting, and last qualified enters the qualified platform 06 that takes up.
In sum, the utlity model has automatic charging and simple and easy sorting function, the user can be by disposing the measurement function that different measurement module realizations needs.
Claims (2)
1. a full-automatic general solar wafer detection platform is characterized in that: comprise control module, apparatus body, stacked wafer feed mechanism, wafer transport mechanism, measurement module, slice receiving mechanism of slice, control module and signal processing module;
Described control module comprises sensor and actuator module, controller module and power module; Sensor and actuator module comprise stroke limit sensor, wafer acquisition sensor, stepper motor, cylinder, solenoid valve; Controller module comprises microprocessor unit, communication module, light-emitting diode display interface, digital input and output modules, stepper motor driver;
Described stacked wafer feed mechanism comprises the jacking mechanism with stacked wafer jack-up;
Described wafer transport mechanism is driven by synchronous pulley by motor, and belt is flat belt, and belt speed is adjustable;
Described measurement module is located in the middle of two sections belts of wafer transport mechanism, can freely dispose according to user's demand;
Described slice receiving mechanism of slice is divided into the qualified platform that takes up, wafer jacking mechanism, defective platform and other sheet platform that takes up that takes up.
2. full-automatic general solar wafer detection platform as claimed in claim 1, it is characterized in that: the function of platform can be expanded, also comprise expansion platform, described expansion platform comprises platform body, conveyor module and the non-qualified platform that takes up, described expansion platform is installed at the rear end of general-purpose platform, and the qualified platform that takes up of former full-automatic general solar wafer detection platform is contained in the tail end of expansion platform.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201320057540 CN203163962U (en) | 2013-01-31 | 2013-01-31 | Automatic general solar wafer detection platform |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201320057540 CN203163962U (en) | 2013-01-31 | 2013-01-31 | Automatic general solar wafer detection platform |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN203163962U true CN203163962U (en) | 2013-08-28 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 201320057540 Expired - Lifetime CN203163962U (en) | 2013-01-31 | 2013-01-31 | Automatic general solar wafer detection platform |
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| Country | Link |
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| CN (1) | CN203163962U (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104259109A (en) * | 2014-07-28 | 2015-01-07 | 中国电子科技集团公司第四十八研究所 | Stepping silicon wafer quality sorting system |
| CN106876525A (en) * | 2017-03-21 | 2017-06-20 | 衡水英利新能源有限公司 | A kind of silicon chip or semi-finished product cell piece slicing apparatus |
| CN113716268A (en) * | 2021-07-09 | 2021-11-30 | 无锡奥特维科技股份有限公司 | Silicon wafer classifying and collecting method |
-
2013
- 2013-01-31 CN CN 201320057540 patent/CN203163962U/en not_active Expired - Lifetime
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104259109A (en) * | 2014-07-28 | 2015-01-07 | 中国电子科技集团公司第四十八研究所 | Stepping silicon wafer quality sorting system |
| CN106876525A (en) * | 2017-03-21 | 2017-06-20 | 衡水英利新能源有限公司 | A kind of silicon chip or semi-finished product cell piece slicing apparatus |
| CN113716268A (en) * | 2021-07-09 | 2021-11-30 | 无锡奥特维科技股份有限公司 | Silicon wafer classifying and collecting method |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CX01 | Expiry of patent term | ||
| CX01 | Expiry of patent term |
Granted publication date: 20130828 |