CN202871779U - 防塌丝多芯片集成电路引线框架 - Google Patents
防塌丝多芯片集成电路引线框架 Download PDFInfo
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- CN202871779U CN202871779U CN2012205707301U CN201220570730U CN202871779U CN 202871779 U CN202871779 U CN 202871779U CN 2012205707301 U CN2012205707301 U CN 2012205707301U CN 201220570730 U CN201220570730 U CN 201220570730U CN 202871779 U CN202871779 U CN 202871779U
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48135—Connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip
- H01L2224/48137—Connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip the bodies being arranged next to each other, e.g. on a common substrate
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/48245—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
- H01L2224/48247—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/49—Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
- H01L2224/491—Disposition
- H01L2224/4912—Layout
- H01L2224/49171—Fan-out arrangements
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- Lead Frames For Integrated Circuits (AREA)
Abstract
本实用新型涉及一种防塌丝多芯片集成电路引线框架,它包括第一基岛(1)、第二基岛(2)以及多个内引脚(3),其特征在于所述第一基岛(1)的左半部向下延伸,所述第二基岛(2)的右半部向上延伸,所述第一基岛(1)向下延伸的部分与第二基岛(2)向上延伸的部分错位布置。本实用新型通过第一基岛以及第二基岛结构的变化,可以减少粘贴在其表面芯片间的距离,减小连接引线的长度,从而使得在作业过程中不容易出现塌丝现象,降低了作业的难度,产品可靠性较高。
Description
技术领域
本实用新型涉及一种防塌丝多芯片集成电路引线框架,属于半导体封装行业。
背景技术
如图1所示,传统的多芯片集成电路引线框架包括第一基岛1、第二基岛2以及多个内引脚5,第一基岛1用于粘贴第一芯片3,第二基岛2用于粘贴第二芯片4,第一芯片3与第二芯片之间的连接引线6非常长,在作业过程中容易出现塌丝现象,增加了作业的难度,且其破断力远远低于其他连接引线,对产品的质量及可靠性存在潜在风险。因此寻求一种产品可靠性较高,降低作业难度的防塌丝多芯片集成电路引线框架尤为重要。
发明内容
本实用新型的目的在于克服上述不足,提供一种防塌丝多芯片集成电路引线框架,使得产品可靠性较高,降低作业难度。
本实用新型的目的是这样实现的:
一种防塌丝多芯片集成电路引线框架,它包括第一基岛、第二基岛以及多个内引脚,所述第一基岛的左半部向下延伸,所述第二基岛的右半部向上延伸,所述第一基岛向下延伸的部分与第二基岛向上延伸的部分错位布置。
与现有技术相比,本实用新型的有益效果是:
本实用新型通过第一基岛以及第二基岛结构的变化,可以减少粘贴在其表面芯片间的距离,减小连接引线的长度,从而使得在作业过程中不容易出现塌丝现象,降低了作业的难度,产品可靠性较高。
附图说明
图1为传统多芯片集成电路引线框架的结构示意图。
图2为本实用新型防塌丝多芯片集成电路引线框架的结构示意图。
其中:
第一基岛1
第二基岛2
第一芯片3
第二芯片4
内引脚5
连接引线6。
具体实施方式
参见图2,本实用新型涉及的一种防塌丝多芯片集成电路引线框架,它包括第一基岛1、第二基岛2以及多个内引脚3,所述第一基岛1用于粘贴第一芯片3,所述第二基岛2用于粘贴第二芯片4,所述第一基岛1的左半部向下延伸,所述第二基岛2的右半部向上延伸,所述第一基岛1向下延伸的部分与第二基岛2向上延伸的部分错位布置。
由于第一基岛1用于粘贴第一芯片3,且方向为竖放,故可以将其左半部往下延伸,延伸后将减少第一芯片3与第二芯片4之间的距离,从而减小连接引线6的长度,使生产更稳定可靠;由于第二基岛右部分为空白无利用区域,故可将第二基岛往上延伸,一方面可以缩短两芯片间的距离,尤其重要的是大大的增加了MOS管(金属—绝缘体—半导体)的散热面积。
Claims (1)
1.一种防塌丝多芯片集成电路引线框架,它包括第一基岛(1)、第二基岛(2)以及多个内引脚(3),其特征在于所述第一基岛(1)的左半部向下延伸,所述第二基岛(2)的右半部向上延伸,所述第一基岛(1)向下延伸的部分与第二基岛(2)向上延伸的部分错位布置。
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CN2012205707301U CN202871779U (zh) | 2012-11-01 | 2012-11-01 | 防塌丝多芯片集成电路引线框架 |
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CN2012205707301U CN202871779U (zh) | 2012-11-01 | 2012-11-01 | 防塌丝多芯片集成电路引线框架 |
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CF01 | Termination of patent right due to non-payment of annual fee | ||
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20130410 Termination date: 20181101 |