CN202710187U - Novel FP etalon characteristic research and high accuracy wavelength determinator - Google Patents
Novel FP etalon characteristic research and high accuracy wavelength determinator Download PDFInfo
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- CN202710187U CN202710187U CN 201220311746 CN201220311746U CN202710187U CN 202710187 U CN202710187 U CN 202710187U CN 201220311746 CN201220311746 CN 201220311746 CN 201220311746 U CN201220311746 U CN 201220311746U CN 202710187 U CN202710187 U CN 202710187U
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Abstract
The utility model relates to a novel FP etalon characteristic research and high accuracy wavelength determinator belonging to the spectrum type testing devices. The determinator comprises a He-Ne discharge tube light source, a reflector group, a condenser group, an optical filter group, an FP etalon having adjustable pressure, a medium and long-focus lens group, a digital camera receiver, which are sequentially fixedly disposed on a platform group according to the sequence of the optical path; a Hg light source, and a measuring telescope group. The utility model is advantageous in that the structure is novel, the etalon spacing can be accurately measured by using a mercury lamp and three yellow lights having the similar wavelengths of the He-Ne discharge tube light source, the partially overlapped phenomenon of the measured wavelength interference ring can be prevented by using the air pressure fine tuning, the small change of the optical path caused by the air pressure can be accurately corrected by the air pressure measurement, therefore the interference ring overlapped phenomenon can be solved, the clear and divided image can be acquired, and great convenience can be brought to the measurement and the analysis.
Description
Technical field
The utility model belongs to the spectral class testing apparatus.Refer in particular to the high-performance instrument that a kind of Fabry Perot (FP) etalon that utilizes two parallel plane mirrors to form comes the fine structure of analysis spectral line.
Background technology
Two difficult points in the past surveying wavelength with FP were: (a) in the past the settle the standard accuracy of tool spacing of coincidence method is not high enough; (b) in the past etalon because temperature slow drift or the little change of structure may make the spacing microvariations, thereby the measurement annulus of coincidence method is overlapped, or make tested wavelength annulus and reference wavelength annulus overlap to affect measurement.Often occur because of the overlapping phenomenon of interference circle, can't obtain the clear image that separates, brought great inconvenience for measurement and analysis.
Summary of the invention
The utility model provides a kind of novel FP etalon characteristic research and pin-point accuracy etalon, and is overlapping because of interference circle to solve, and causes obtaining the clear image that separates, and gives and measures and analyze the problem of very big inconvenience of having brought.
The technical solution of the utility model is: middle telephoto lens group is fixedly connected with digital camera receiver group, the FP etalon group that air pressure is adjustable is fixedly connected with the barometer group by silicone tube, the barometer group is fixedly connected with the aspiration pump group by silicone tube, He-Ne discharge tube light source, the catoptron group, the condenser group, filter set, the FP etalon group that air pressure is adjustable, middle telephoto lens group, digital camera receiver group is fixedly connected on the platform group according to the order of light path successively, the Hg lamp source is fixedly connected with the platform group, and be positioned under the catoptron group, the measuring telescope group is fixedly connected with the platform group, and be positioned at the rear of aspiration pump group, the below of digital camera receiver group.
The utility model has the advantage of: novel structure, adopt the mercury lamp 3 kind yellow wavelengths Accurate Determining etalon spacings close with He-Ne discharge tube light source medium wavelength, adopt the air pressure fine setting to avoid the phenomenon of overlapping of tested wavelength interference circle, and the light path minor alteration that air pressure causes can accurately be revised by barometric surveying, solved because of the overlapping phenomenon of interference circle, obtained the clear image that separates, brought great convenience for measurement and analysis.
Description of drawings
Fig. 1 is structural representation of the present utility model.
Embodiment
Middle telephoto lens group 7 is fixedly connected with digital camera receiver group 8, the FP etalon group 6 that air pressure is adjustable is fixedly connected with barometer group 11 by silicone tube, barometer group 11 is fixedly connected with aspiration pump group 10 by silicone tube, He-Ne discharge tube light source 2, catoptron group 3, condenser group 4, filter set 5, the FP etalon group 6 that air pressure is adjustable, middle telephoto lens group 7, digital camera receiver group 8 is fixedly connected on the platform group 12 according to the order of light path successively, Hg lamp source 1 is fixedly connected with platform group 12, and be positioned under the catoptron group 3, measuring telescope group 9 is fixedly connected with platform group 12, and be positioned at the rear of aspiration pump group 10, the below of digital camera receiver group 8.
The FP etalon group 6 that air pressure is adjustable, this FP etalon is comprised of FP etalon and air pressure adjustable air chamber between 30-101kPa of 2mm, 4mm, 8mm different interval.
The exact value at etalon interval is calculated by coincidence method with the line wavelength of canonical reference light source.Sealing will be got well between structural requirement two plane mirrors of FP etalon group, and the depth of parallelism between two plane mirrors will be carried out meticulous adjustment.
The light that Hg lamp source 1 is sent converges with the light that directly sees through the catoptron group that He-Ne discharge tube light source 2 sends after catoptron group 3 reflection, together through condenser group 4, filter set 5, be incident upon on the adjustable FP etalon group 6 of air pressure, behind the FP etalon, form interference circle, again through in after 7 imagings of telephoto lens group, directly the image takings of interference circle are got off by digital camera receiver group 8.In order to obtain the clear image that separates, when doing experiment, can the atmospheric pressure value in the FP etalon group slowly be adjusted between 0.3 ~ 1 atmospheric pressure by aspiration pump group 10.Can monitor by measuring telescope group 9 variation of interference circle image.Behind the image of group interference circles more than having photographed clearly, just can utilize special-purpose software that doughnut is looked like to measure, analyzed.
Claims (1)
1. a novel FP etalon characteristic research and pin-point accuracy etalon, it is characterized in that: middle telephoto lens group is fixedly connected with digital camera receiver group, the FP etalon group that air pressure is adjustable is fixedly connected with the barometer group by silicone tube, the barometer group is fixedly connected with the aspiration pump group by silicone tube, He-Ne discharge tube light source, the catoptron group, the condenser group, filter set, the FP etalon group that air pressure is adjustable, middle telephoto lens group, digital camera receiver group is fixedly connected on the platform group according to the order of light path successively, the Hg lamp source is fixedly connected with the platform group, and be positioned under the catoptron group, the measuring telescope group is fixedly connected with the platform group, and be positioned at the rear of aspiration pump group, the below of digital camera receiver group.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201220311746 CN202710187U (en) | 2012-06-30 | 2012-06-30 | Novel FP etalon characteristic research and high accuracy wavelength determinator |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201220311746 CN202710187U (en) | 2012-06-30 | 2012-06-30 | Novel FP etalon characteristic research and high accuracy wavelength determinator |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN202710187U true CN202710187U (en) | 2013-01-30 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 201220311746 Expired - Fee Related CN202710187U (en) | 2012-06-30 | 2012-06-30 | Novel FP etalon characteristic research and high accuracy wavelength determinator |
Country Status (1)
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| CN (1) | CN202710187U (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104819776A (en) * | 2015-05-04 | 2015-08-05 | 中国科学院国家天文台南京天文光学技术研究所 | Calibration lamp system for astroobservation spectrometer |
| CN107144224A (en) * | 2017-06-16 | 2017-09-08 | 中国计量大学 | A kind of use F P etalons measure the apparatus and method of two-dimensional micro-displacement |
| WO2021196723A1 (en) * | 2020-03-31 | 2021-10-07 | 北京科益虹源光电技术有限公司 | Laser wavelength measurement device and method |
-
2012
- 2012-06-30 CN CN 201220311746 patent/CN202710187U/en not_active Expired - Fee Related
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104819776A (en) * | 2015-05-04 | 2015-08-05 | 中国科学院国家天文台南京天文光学技术研究所 | Calibration lamp system for astroobservation spectrometer |
| CN107144224A (en) * | 2017-06-16 | 2017-09-08 | 中国计量大学 | A kind of use F P etalons measure the apparatus and method of two-dimensional micro-displacement |
| CN107144224B (en) * | 2017-06-16 | 2019-04-16 | 中国计量大学 | A kind of apparatus and method with F-P etalon measurement two-dimensional micro-displacement |
| WO2021196723A1 (en) * | 2020-03-31 | 2021-10-07 | 北京科益虹源光电技术有限公司 | Laser wavelength measurement device and method |
| US11971307B2 (en) | 2020-03-31 | 2024-04-30 | Beijing RSLaserOpto-Electronics Technology Co. Ltd | Device and method for measuring wavelength for laser device |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20130130 Termination date: 20180630 |