CN103674287A - Laser wavelength monitoring device based on etalons - Google Patents
Laser wavelength monitoring device based on etalons Download PDFInfo
- Publication number
- CN103674287A CN103674287A CN201310689840.9A CN201310689840A CN103674287A CN 103674287 A CN103674287 A CN 103674287A CN 201310689840 A CN201310689840 A CN 201310689840A CN 103674287 A CN103674287 A CN 103674287A
- Authority
- CN
- China
- Prior art keywords
- detector
- wavelength
- laser
- road laser
- road
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Images
Abstract
The invention provides a laser wavelength monitoring device based on etalons. The two etalons insensitive to temperature are adopted in the device to serve as periodic filter elements, optical signals are received by a detector, wavelength values of output laser are obtained by analyzing optical signal information passing through the two etalons, and the wavelength values are used for monitoring the wavelength of a tunable laser device. Through the adoption of the scheme, the laser wavelength monitoring device based on the etalons is high in accuracy and scanning speed, capable of achieving the real-time monitoring of the wavelength, low in price, wide in working temperature range, good in wavelength stability, capable of being used for monitoring the output wavelength of tunable laser and also capable of being used for testing narrow linewidth laser wavelength of other types.
Description
Technical field
The invention belongs to wavelength monitoring technical field, in particular a kind of optical maser wavelength monitoring device based on etalon.
Background technology
Tunable laser has tunable wave length, Wavelength stabilized, line width, low noise advantages, is widely used in the fields such as optical communication, biochemical analysis, metering, and tunable laser module also can be applicable to the fields such as optical sensing.
Tunable laser kind is in the market a lot, different according to principle of work, can be divided into optical fiber grating with tunable laser instrument, tunable distributed feedback laser (DFB), tunable distributed Bragg reflection laser (DBR), adjustable vertical cavity surface reflection laser (VCSEL), cavity semiconductor tunable laser etc.Tunable laser generally has a set of wavelength monitoring device, Real-Time Monitoring laser output wavelength, when output wavelength exists relatively large deviation with setting wavelength, wavelength monitoring device can provide feedback signal to Laser Control System, thereby adjustment output wavelength, is consistent itself and setting value.
The wavelength monitoring device of main flow has following several:
1, Michelson interferometer type wavemeter.Although the wavemeter of the type has the advantages that precision is high, the stroke of moving component is had relatively high expectations, as reached 10
-6the precision of magnitude, for 633nm wavelength, the stroke of moving component should be greatly about 15mm, and measuring system is subject to the impact of mechanical vibration like this, should not be in the application of the workplace of circumstance complication.
2, take rope laser interferometer wavemeter.Chinese invention patent publication number is the disclosed Fizeau laser wavemeter of the patent of CN1077530A, and its measuring accuracy can reach 10
-6but the optical system of this invention needs the more optical element of coupling technique, the difficulty that tuned optical and light path are aimed at is higher.
3, optical-fiber type wavemeter.Chinese invention patent publication number is that the disclosed optical-fiber type laser wavemeter of the patent of CN102155997A utilizes the precision of the photoelectric coupling effect calibration wavelength of the transparent hollow cathode lamp of Fe can reach 0.1nm, this wavelength measuring apparatus is used grating monochromator, high-sensitive CCD photoreceiver, wavelength calibration device and wavelength measuring apparatus etc., structure relative complex, cost is high.
4, the optical maser wavelength monitoring device based on etalon.Chinese invention patent number utilizes the transfer efficiency of etalon for the disclosed tunable laser of patent of CN102931584 and monitors optical maser wavelength, concrete control method is: first according to theoretical ride gain medium temperature coarse adjustment laser output wavelength, the temperature of adjusting etalon is design temperature, by etalon transfer efficiency, obtains Output of laser wavelength.Using the ratio of monitor photodiode array output signal and wavelength locking photodiode output signal as the transfer efficiency of etalon, but should being laser, the transfer efficiency of etalon passes through to follow previous energy ratio after etalon, the method of taking in patent CN102931584 is rather amiss, perhaps data are carried out the processing in early stage or later stage in implementation process, but in patent, do not provided detailed description.And the free spectrum interval of etalon is narrower, so must clear and definite output wavelength drop in which free spectrum interval of etalon.
Existing optical maser wavelength monitoring device mainly contains interferometer type wavemeter, optical-fiber type wavelength is taken into account the wavelength monitoring device based on etalon, mainly contains following shortcoming:
(1) the wavemeter measuring accuracy of interferometer type wavemeter is high, but need high-precision standard wavelength source as with reference to light, usually adopt frequency stabilized laser as with reference to light, frequency stabilized laser cost is high, volume is large, high for requirement for environmental conditions, and tuned optical and light path to aim at difficulty higher, cost is also higher.
(2) optical-fiber type wavemeter adopts monochromator to carry out light splitting, and travelling speed is fast, low price, but precision is lower, in 0.1nm magnitude, can not meet the requirement of tunable laser to wavelength high precision.
(3) the wavelength monitoring system based on temperature control etalon utilizes the transfer efficiency of etalon to obtain wavelength information, fast response time, simple in structure, but etalon is to responsive to temperature, and the free spectrum interval of etalon is narrower, so must clear and definite output wavelength drop in which free spectrum interval of etalon.
Therefore, there is defect in prior art, needs to improve.
Summary of the invention
Technical matters to be solved by this invention is for the deficiencies in the prior art, and a kind of optical maser wavelength monitoring device based on etalon is provided.
Technical scheme of the present invention is as follows:
An optical maser wavelength monitoring device based on etalon, wherein, comprises that 11 minute beam splitter of 4,2 etalons, 3 detectors and treatment circuit form; Described incident light is divided into 4 tunnels by the beam splitter of 1 minute 4, and from top to bottom, first via laser is exported as pilot signal; The second road laser is directly received by the first detector, carries out power monitoring; Third Road laser, Si road laser by the first etalon and the second etalon, enter the second detector and the 3rd detector respectively; Described the second road laser, described Third Road laser and described Si road laser enter treatment circuit after described the first detector, described the second detector and described the 3rd detector, described treatment circuit comprises that signal amplifies, filtering, AD sampling and signal are processed, photoelectric conversion for signal, noise filtering, and by the first detector described in AD sampling analysis, the value of described the second detector and described the 3rd detector, by signal fusing, obtain the information of optical wavelength, carry out wavelength signals detection.
Described monitoring device, wherein, described treatment circuit is analyzed described the second road laser, described Third Road laser and described Si road laser through described the first detector, described the second detector and described the 3rd detector, obtains described the second road laser, described Third Road laser and described Si road and swashs light wavelength tranmittance information.
Described monitoring device, wherein, the concrete steps of described analysis are: the output signal of described the second road laser, described Third Road laser and the described Si road laser of process described the first detector, described the second detector and described the 3rd detector is set to powertrace, and described powertrace is arranged on to ordinate is power, in the plane that horizontal ordinate is wavelength, measure peak wavelength and the peak period of powertrace.
Described monitoring device, wherein, will be through described the first detector, the described second road laser of described the second detector and described the 3rd detector, the output signal of described Third Road laser and described Si road laser is carried out wavelength output, wavemeter is connected respectively to detection signal output port, carry out in real time input, described the first detector, described the second detector and described the 3rd detector carry out data acquisition output by the A/D convertor circuit in data processing circuit, obtain described the first detector, the data of described the second detector and described the 3rd detector, by normalization, set up wavelength data table, by search algorithm, obtain wavelength value, for wavelength monitoring.
Adopt such scheme, 1, precision is high, sweep velocity is fast, can realize the Real-Time Monitoring of wavelength.2, low price.3, operating temperature range is wide, and wavelength stability is good.4, except for monitoring the output wavelength of tunable laser, also can be used for testing the narrow-linewidth laser wavelength of other types.
Accompanying drawing explanation
Fig. 1 is the structural representation of apparatus of the present invention.
Fig. 2 is the waveform schematic diagram of detector output signal in apparatus of the present invention.
Fig. 3 is apparatus of the present invention medium wavelength scaling system schematic diagram.
Embodiment
Below in conjunction with the drawings and specific embodiments, the present invention is described in detail.
Embodiment 1
The present invention adopts two etalon Real-Time Monitoring wavelength, and Fig. 1 is the schematic diagram of wavelength monitoring parts, and incident light is divided into 4 tunnels by the beam splitter 10 of 1 minute 4, and export as pilot signal on a road; One tunnel is directly received by detector 201, carries out power monitoring; Another two-way is respectively by etalon 101,102, and the transmission peak wavelength that enters 202,203, two etalons 101,102 of detector is different, and free spectral range is not identical yet; Processing of circuit part is amplified light signal, and filtering and AD transform, and the signal of three detectors is analyzed, and can obtain the wavelength of input optical signal.
Fig. 2 has provided the oscillogram schematic diagram of three detector output signals, and wherein ordinate is power, and horizontal ordinate is wavelength, the powertrace that curve 1 receives for detector 1, and this curve is a power (now ignoring the impact of wavelength characteristic); Curve 2 and curve 3, for light is by the powertrace after etalon, can find out, two curves have different peak wavelengths, and the peak wavelength cycle is not identical yet; The peak wavelength of etalon is highly stable, and within the scope of-5 ℃～70 ℃, peak wavelength maximum deviation is less than 3pm.Therefore the temperature range of-5 ℃～70 ℃, the wavelength accuracy of device is less than 3pm.
Two similar two rulers of etalon, can calibrate the wavelength of incident optical signal, as shown in Figure 2, wavelength is the light of λ, after wavelength detection system, can on three detectors, produce different signals, the light signal of detector 201 outputs is p1, this power has represented the watt level of Output of laser, for normalization below; Detector 202 outputs are by the optical signal power p2 of etalon 101, detector 203 outputs are by the optical signal power p3 of etalon 102, as shown in Figure 3, the trend of three signals is different, due to the characteristic of etalon, after normalization, wavelength X and power p2 and p3 are corresponding, the corresponding one group of performance number of each wavelength, can judge wavelength value thus.
The wavelength value of this device adopts demarcates as the device of Fig. 3, utilize the tunable laser that wavelength had been calibrated to carry out wavelength output as signal source, wavemeter is connected to detection signal output port, carry out in real time input, three detectors are by data acquisition output, by computer control tunable laser, wavemeter, and obtain the data of three detectors; By normalization, set up wavelength data table, obtaining of wavelength can obtain fast by search algorithm.
Device of the present invention adopts three road light, and two etalon temperatures are insensitive, have certain wavelength interval, and this system can be used as the effective ways that wavelength detects.
In the present invention, utilize wavemeter and tunable laser to carry out wavelength calibration, set up wavelength data table, in actual use, by search algorithm, can obtain fast and accurately wavelength data.
Embodiment 2
On the basis of above-described embodiment, the present invention is further described, and a kind of optical maser wavelength monitoring device based on etalon of the present invention wherein, comprises that 11 minute beam splitter of 4,2 etalons, 3 detectors and treatment circuit form; Described incident light is divided into 4 tunnels by the beam splitter of 1 minute 4, and from top to bottom, first via laser is exported as pilot signal; The second road laser is directly received by the first detector, carries out power monitoring; Third Road laser, Si road laser by the first etalon and the second etalon, enter the second detector and the 3rd detector respectively; Described the second road laser, described Third Road laser and described Si road laser enter treatment circuit after described the first detector, described the second detector and described the 3rd detector, described treatment circuit comprises that signal amplifies, filtering, AD sampling and signal are processed, photoelectric conversion for signal, noise filtering, and by the first detector described in AD sampling analysis, the value of described the second detector and described the 3rd detector, by signal fusing, obtain the information of optical wavelength, carry out wavelength signals detection.
Described treatment circuit is analyzed described the second road laser, described Third Road laser and described Si road laser through described the first detector, described the second detector and described the 3rd detector, obtains described the second road laser, described Third Road laser and described Si road and swashs light wavelength tranmittance information.
The concrete steps of described analysis are: the output signal of described the second road laser, described Third Road laser and the described Si road laser of process described the first detector, described the second detector and described the 3rd detector is set to powertrace, and described powertrace is arranged on to ordinate is power, in the plane that horizontal ordinate is wavelength, measure peak wavelength and the peak period of powertrace.
In above-mentioned, the output signal of described the second road laser, described Third Road laser and described Si road laser through described the first detector, described the second detector and described the 3rd detector is carried out to wavelength output, wavemeter is connected respectively to detection signal output port, carry out in real time input, described the first detector, described the second detector and described the 3rd detector carry out data acquisition output by the A/D convertor circuit in data processing circuit, obtain the data of described the first detector, described the second detector and described the 3rd detector; By normalization, set up wavelength data table, by search algorithm, obtain wavelength value, for wavelength monitoring.
The invention provides a kind of optical maser wavelength monitoring device based on etalon, this device adopts the etalon of two temperature-insensitives as periodic filter original paper, and by detector receiving optical signals, by analyzing the wavelength information that can obtain laser by the light signal of two etalons, for tunable laser wavelength monitoring.
Adopt such scheme, 1, precision is high, sweep velocity is fast, can realize the Real-Time Monitoring of wavelength.2, low price.3, operating temperature range is wide, and wavelength stability is good.4, except for monitoring the output wavelength of tunable laser, also can be used for testing the narrow-linewidth laser wavelength of other types.
Should be understood that, for those of ordinary skills, can be improved according to the above description or convert, and all these improvement and conversion all should belong to the protection domain of claims of the present invention.
Claims (4)
1. the optical maser wavelength monitoring device based on etalon, is characterized in that, comprises that 11 minute beam splitter of 4,2 etalons, 3 detectors and treatment circuit form; Described incident light is divided into 4 tunnels by the beam splitter of 1 minute 4, and from top to bottom, first via laser is exported as pilot signal; The second road laser is directly received by the first detector, carries out power monitoring; Third Road laser, Si road laser by the first etalon and the second etalon, enter the second detector and the 3rd detector respectively; Described the second road laser, described Third Road laser and described Si road laser enter treatment circuit after described the first detector, described the second detector and described the 3rd detector, described treatment circuit comprises that signal amplifies, filtering, AD sampling and signal are processed, photoelectric conversion for signal, noise filtering, and by the first detector described in AD sampling analysis, the value of described the second detector and described the 3rd detector, by signal fusing, obtain the information of optical wavelength, carry out wavelength signals detection.
2. monitoring device as claimed in claim 1, it is characterized in that, described treatment circuit is analyzed described the second road laser, described Third Road laser and described Si road laser through described the first detector, described the second detector and described the 3rd detector, obtains described the second road laser, described Third Road laser and described Si road and swashs light wavelength tranmittance information.
3. monitoring device as claimed in claim 2, it is characterized in that, the concrete steps of described analysis are: the output signal of described the second road laser, described Third Road laser and the described Si road laser of process described the first detector, described the second detector and described the 3rd detector is set to powertrace, and described powertrace is arranged on to ordinate is power, in the plane that horizontal ordinate is wavelength, measure peak wavelength and the peak period of powertrace.
4. monitoring device as claimed in claim 3, it is characterized in that, will be through described the first detector, the described second road laser of described the second detector and described the 3rd detector, the output signal of described Third Road laser and described Si road laser is carried out wavelength output, wavemeter is connected respectively to detection signal output port, carry out in real time input, described the first detector, described the second detector and described the 3rd detector carry out data acquisition output by the A/D convertor circuit in data processing circuit, obtain described the first detector, the data of described the second detector and described the 3rd detector, by normalization, set up wavelength data table, by search algorithm, obtain wavelength value, for wavelength monitoring.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310689840.9A CN103674287B (en) | 2013-12-16 | 2013-12-16 | A kind of optical maser wavelength based on etalon monitors device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310689840.9A CN103674287B (en) | 2013-12-16 | 2013-12-16 | A kind of optical maser wavelength based on etalon monitors device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN103674287A true CN103674287A (en) | 2014-03-26 |
| CN103674287B CN103674287B (en) | 2016-06-22 |
Family
ID=50312533
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201310689840.9A Active CN103674287B (en) | 2013-12-16 | 2013-12-16 | A kind of optical maser wavelength based on etalon monitors device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN103674287B (en) |
Cited By (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105762635A (en) * | 2016-04-20 | 2016-07-13 | 钱乐彬 | Wavelength control device for adjustable optical module, and method thereof |
| CN105977776A (en) * | 2016-06-22 | 2016-09-28 | 中国科学院光电研究院 | Absolute wavelength calibration and adjustment device and method |
| CN106940220A (en) * | 2016-01-04 | 2017-07-11 | 中国计量学院 | A kind of wavelength real-time measurement apparatus of Simple low-cost |
| CN107941467A (en) * | 2017-12-08 | 2018-04-20 | 山西大学 | The method for directly acquiring distributed feedback semiconductor lasing light emitter current-modulation wavelength response |
| CN109084904A (en) * | 2018-09-28 | 2018-12-25 | 中国计量大学 | A kind of high-accuracy wavelength measuring device based on three F-P etalons |
| CN109818251A (en) * | 2019-01-22 | 2019-05-28 | 昂纳信息技术（深圳）有限公司 | A kind of wavelength locker and system |
| CN110708117A (en) * | 2018-07-09 | 2020-01-17 | 中兴通讯股份有限公司 | Method, apparatus and storage medium for determining wavelength information of optical signal |
| CN110967120A (en) * | 2019-11-08 | 2020-04-07 | 厦门彼格科技有限公司 | High-precision laser wavelength measuring instrument based on slope filter |
| CN111262123A (en) * | 2018-11-30 | 2020-06-09 | 福州高意通讯有限公司 | Flexible grid double-standard wavelength locker |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002257632A (en) * | 2001-03-06 | 2002-09-11 | Advantest Corp | Optical wavelength measuring instrument and its method, program and recording medium with the program recorded thereon |
| JP2003324241A (en) * | 2002-02-28 | 2003-11-14 | Furukawa Electric Co Ltd:The | Wavelength monitor and semiconductor laser module |
| CN201156736Y (en) * | 2007-11-16 | 2008-11-26 | 上海未来宽带技术及应用工程研究中心有限公司 | Light property detector |
| CN202662972U (en) * | 2012-04-20 | 2013-01-09 | 武汉理工光科股份有限公司 | Laser light source system with tunable output wavelength |
-
2013
- 2013-12-16 CN CN201310689840.9A patent/CN103674287B/en active Active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002257632A (en) * | 2001-03-06 | 2002-09-11 | Advantest Corp | Optical wavelength measuring instrument and its method, program and recording medium with the program recorded thereon |
| JP2003324241A (en) * | 2002-02-28 | 2003-11-14 | Furukawa Electric Co Ltd:The | Wavelength monitor and semiconductor laser module |
| CN201156736Y (en) * | 2007-11-16 | 2008-11-26 | 上海未来宽带技术及应用工程研究中心有限公司 | Light property detector |
| CN202662972U (en) * | 2012-04-20 | 2013-01-09 | 武汉理工光科股份有限公司 | Laser light source system with tunable output wavelength |
Non-Patent Citations (1)
| Title |
|---|
| 陈东，贾兆丽: "可调谐半导体激光波长调制光谱信号分析", 《大气与环境光学学报》, vol. 3, no. 3, 31 May 2008 (2008-05-31), pages 193 - 198 * |
Cited By (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106940220A (en) * | 2016-01-04 | 2017-07-11 | 中国计量学院 | A kind of wavelength real-time measurement apparatus of Simple low-cost |
| CN106940220B (en) * | 2016-01-04 | 2019-10-08 | 中国计量学院 | A kind of laser wavelength real-time measurement device of Simple low-cost |
| CN105762635A (en) * | 2016-04-20 | 2016-07-13 | 钱乐彬 | Wavelength control device for adjustable optical module, and method thereof |
| CN105762635B (en) * | 2016-04-20 | 2018-11-23 | 深圳市极致兴通科技有限公司 | A kind of wavelength control apparatus and method of adjustable light module |
| CN105977776B (en) * | 2016-06-22 | 2019-03-19 | 中国科学院光电研究院 | A kind of calibration of absolute wavelength and calibrating installation and its method |
| CN105977776A (en) * | 2016-06-22 | 2016-09-28 | 中国科学院光电研究院 | Absolute wavelength calibration and adjustment device and method |
| CN107941467A (en) * | 2017-12-08 | 2018-04-20 | 山西大学 | The method for directly acquiring distributed feedback semiconductor lasing light emitter current-modulation wavelength response |
| CN107941467B (en) * | 2017-12-08 | 2020-01-03 | 山西大学 | Method for directly obtaining current modulation wavelength response of distributed feedback semiconductor laser source |
| CN110708117A (en) * | 2018-07-09 | 2020-01-17 | 中兴通讯股份有限公司 | Method, apparatus and storage medium for determining wavelength information of optical signal |
| CN110708117B (en) * | 2018-07-09 | 2022-10-11 | 中兴通讯股份有限公司 | Method, apparatus and storage medium for determining wavelength information of optical signal |
| CN109084904A (en) * | 2018-09-28 | 2018-12-25 | 中国计量大学 | A kind of high-accuracy wavelength measuring device based on three F-P etalons |
| CN111262123A (en) * | 2018-11-30 | 2020-06-09 | 福州高意通讯有限公司 | Flexible grid double-standard wavelength locker |
| CN109818251A (en) * | 2019-01-22 | 2019-05-28 | 昂纳信息技术（深圳）有限公司 | A kind of wavelength locker and system |
| CN110967120A (en) * | 2019-11-08 | 2020-04-07 | 厦门彼格科技有限公司 | High-precision laser wavelength measuring instrument based on slope filter |
| CN110967120B (en) * | 2019-11-08 | 2021-09-07 | 厦门彼格科技有限公司 | High-precision laser wavelength measuring instrument based on slope filter |
Also Published As
| Publication number | Publication date |
|---|---|
| CN103674287B (en) | 2016-06-22 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN103674287B (en) | A kind of optical maser wavelength based on etalon monitors device | |
| CN101718942B (en) | Multi-channel fiber Bragg grating (FBG) demodulator | |
| CN101666689B (en) | Wavelength optimization-type high-performance distributed optical fiber sensing system and sensing method | |
| CN108051400B (en) | Scanning laser interference type optical fiber sound wave phase-locked detection system and method | |
| CN101929880B (en) | Novel Brillouin optical time domain analyzer | |
| CN103162724B (en) | Optical fiber grating sensor demodulation instrument and method based on dynamic scanning | |
| CN103674110B (en) | A kind of distribution type fiber-optic temperature strain sensor based on Brillouin's light amplification detection | |
| CN100495070C (en) | Microwave windfinding laser radar apparatus | |
| CN107917669B (en) | Demodulation method of optical fiber displacement sensor | |
| CN101308089B (en) | Ethyne gas optical checking method and apparatus | |
| CN102353452B (en) | System for measuring free spectral range of F-P (Fabry-Perot) cavity | |
| CN103697922A (en) | High-speed demodulation system of optical fiber F-P cavity sensor | |
| CN104243018B (en) | A kind of chromatic dispersion measurement system | |
| CN205843813U (en) | A kind of device of all-fiber formula time domain short scan tera-hertz spectra based on fiber stretcher | |
| CN108362388B (en) | Method for measuring phase noise of dual-channel differential laser | |
| CN103808692A (en) | Mach-Zehnder interferometer and micro-cavity cascaded intensity detection type sensor | |
| CN106017533A (en) | Rapid tuning real-time calibration fiber grating demodulation device and work method | |
| CN108287132A (en) | A kind of Terahertz asynchronous high-speed scanning system trigger signal generation device and method | |
| CN107796422B (en) | Optical fiber displacement sensor demodulating equipment | |
| RU2608394C1 (en) | Device for measuring parameters of physical fields | |
| CN103196472B (en) | Based on fiber grating dynamic strain (FBG) demodulator and the method for random unequal interval sampling | |
| CN107733641B (en) | High-speed high-adjustable-bandwidth quantum balance homodyne detector and control method thereof | |
| CN105353210A (en) | High-sensitivity large-bandwidth photon microwave measuring device and method | |
| CN210774379U (en) | High-speed real-time sampling and measuring device for intermediate infrared ultrafast optical signal | |
| CN103292916B (en) | Based on the photelectric receiver time stability method of testing of dual-acousto-optic shift |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CP02 | Change in the address of a patent holder | ||
| CP02 | Change in the address of a patent holder |
Address after: 233000 726 Huaguang Road, Bengbu, Anhui Patentee after: The 41st Institute of CETC Address before: 266555 No. 98 Xiangjiang Road, Qingdao economic and Technological Development Zone, Shandong Patentee before: The 41st Institute of CETC |