CN109084904A - A kind of high-accuracy wavelength measuring device based on three F-P etalons - Google Patents
A kind of high-accuracy wavelength measuring device based on three F-P etalons Download PDFInfo
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- CN109084904A CN109084904A CN201811138095.8A CN201811138095A CN109084904A CN 109084904 A CN109084904 A CN 109084904A CN 201811138095 A CN201811138095 A CN 201811138095A CN 109084904 A CN109084904 A CN 109084904A
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
Abstract
The invention patent discloses a kind of high-accuracy wavelength measuring device based on three F-P etalons.Incident light is divided into two-beam after one-to-two fiber coupler, light beam is incident on photodetector as reference light, another light beam is incident on one point of four fiber coupler, light is divided into four beams, it is incident on photodetector after the linear filter of light beam, another three road light after corresponding multiple optical fiber collimating via being incident on corresponding F-P etalon, generate corresponding transmitted light and corresponding reflected light, the transmitted light of generation is after corresponding single optical fiber calibrator, the light intensity of corresponding transmitted light is acquired by photodetector again, after the reflected light back of generation returns to multiple optical fiber collimating, the light intensity of corresponding reflected light is acquired through photodetector, finally, the light intensity signal that No. eight photodetectors acquire is acquired into corresponding voltage signal by capture card, and it is input to progress analytical calculation on computer and obtains wavelength.
Description
Technical field
The invention patent belongs to laser frequency spectrum characterisitic parameter fields of measurement, in particular to a kind of based on three F-P etalons
High-accuracy wavelength measuring device.
Background technique
The light source for the features such as laser has coherence good as a kind of, high directivity, in scientific research, medical treatment, national defence peace
The fields such as complete and service for life play very important effect, and important parameter one of of the optical wavelength as laser is that optical fiber is logical
The important indicator of the performance of letter, sensing and accurate measurement etc..It is what telecom operators and systems provider generally used
In system, according to standard branch office of ITU-T(international telecommunication union telecommunication) to the regulation of optical channel wavelength and channel spacing, laser
The measurement accuracy of outgoing light wavelength should be in ± 0.25 GHz(Yang Yang, and Liu Bing, the DWDM technology such as Zhao Yong is in novel Wavelength demodulation
Application [J] in method is infrared and laser engineering, 2016,45 (8): 94-100), therefore, high-precision wavelength measurement is
It can guarantee the quality and stability of communication, meanwhile, the precise measurement of optical maser wavelength has important role in sensory field of optic fibre, right
In the FBG (FBG) demodulator system of tunable wave length, high-precision wavemeter is needed to carry out the output wave of real time calibration monitoring laser
It is long, the drift bring measurement error of laser output light wavelength is eliminated, thus the reliability and stability of lifting system.It is existing
Common high-precision wavemeter is mainly based upon Michelson interference, Fizeau interference and Fabry Perot principle of interference.Mikey
Your interference is to generate dual-beam by light splitting amplitude of vibration method, then adjust the position of the reflecting mirror in interferometer first, to realize two
Interference phenomenon of the light beam in coincidence face, when mobile mirror, the quantity of the interference fringe of reference laser diode and testing laser
It can change, the variable quantity of interference fringe is read by CCD to obtain the optical wavelength of light to be measured, Michelson interference type wavelength
Meter includes mechanical scanning component, and needs built-in reference laser, and use environment condition is harsh, and structure is complicated, with high costs,
It is difficult to realize the measurement of burst pulse.Fizeau interference type wavemeter is a kind of wavemeter that structure is fixed, utilizes fizeau fringe
Spatial coherence, the optical signal that space interference changes is changed by electric signal by line array CCD at any time, wave can be calculated
Long value, Fizeau interference type wavemeter need ccd image processing technique, and computationally intensive and result is easy to be affected by temperature, need by
Whole device is placed in insulating box, limits the occasion of wavemeter application.General F-P (Fabry-Perot) interference-type wavelength
Meter is equally to carry out contrast conting interference fringe quantity using area array CCD and reference laser diode by combining multiple F-P cavities, from
And obtaining the wavelength of light beam to be measured, the F-P interference-type wavemeter of this structure also needs built-in reference laser diode and CCD figure
As processing, therefore the cost of great number is brought, limits related application range.Compared with above-mentioned wavemeter, the present invention uses three
A F-P etalon cooperates, and by easy optical power detecting, establishes using wavelength response curve as the equation group of function, right
The case where acquired solution, analyses and compares, the wavelength of you can get it light beam to be measured, is using FSR(Free Spectral Range) it is lower
F-P etalon when, the period of shorter response curve can effectively promote the resolution ratio to wavelength measurement.The present invention is without figure
As processing and built-in reference laser diode, and the three cooperative frame modes of F-P etalon used, it can be avoided and such as exist
Chinese patent CN106949220A bring maximal accuracy when two identical F-P etalons are used only is confined to linear filtering
, there is higher measurement accuracy in the problem of resolution ratio of device.
Summary of the invention
The invention proposes one kind without reference to laser, is combined using three F-P etalons and a linear filter
Easy high-precision wavelength real-time measurement apparatus.Testing laser light beam passes through three F-P etalons after beam splitting respectively
With a linear filter, the accurate survey to laser beam wavelength to be measured is realized by the optical power value of measurement transmission and reflection
Amount.The device structure is compact, and it is convenient to operate, being capable of the high-precision large-scale optical maser wavelength of real-time measurement.
Technical solution of the invention is as follows:
A kind of high-accuracy wavelength measuring device based on three F-P etalons, it is characterised in that: light beam to be measured passes through one-to-two optical fiber
Coupler be divided into two-beam be incident on respectively optical fiber 1. with optical fiber 2., by the outgoing beam of optical fiber 1. directly by the first photoelectricity
Detector receives；Into the light beam of optical fiber 2. via one point of four fiber coupler be divided into four bundles light be incident on respectively optical fiber 3.,
Optical fiber 4., optical fiber 5. with optical fiber 6.: optical fiber 3. in the light beam that is emitted after the first multiple optical fiber collimating of light beam be 10. irradiated to by
First turntable turn an angle after the first F-P etalon on, optical fiber 3. in light beam by the first F-P etalon produce
Raw transmitted light receives and is transferred to the second photodetector by the first single optical fiber calibrator, optical fiber 3. in light beam by the
The reflected light that one F-P etalon generates is irradiated on the first multiple optical fiber collimating, and third photoelectricity is 7. transmitted to using optical fiber
On detector；Optical fiber 4. in the beam orthogonal that is emitted after the second multiple optical fiber collimating of light beam be irradiated to by the second turntable
On the 2nd F-P etalon after turning an angle, optical fiber 4. in light beam by the 2nd F-P etalon generate transmitted light
Receive and be transferred to the 4th photodetector by the second single optical fiber calibrator, optical fiber 4. in light beam marked by the 2nd F-P
The reflected light that quasi- tool generates is irradiated on the second multiple optical fiber collimating, and the 5th photodetector is 8. transmitted to using optical fiber
On；Optical fiber 5. in the light beam that is emitted after third multiple optical fiber collimating of light beam equally turned by third turntable according to being vertically mapped to
On the 3rd F-P etalon after dynamic certain angle, optical fiber 5. in light beam pass through the transmitted light quilt that the 3rd F-P etalon generates
Third single optical fiber calibrator receives and is transferred to the 6th photodetector, optical fiber 5. in light beam produced by the 3rd F-P etalon
Raw the reflected beams are irradiated on third multiple optical fiber collimating, are 9. transmitted on the 7th photodetector using optical fiber；Light
It is fine 6. in light beam be transmitted to the 8th photoelectric sensor via linear filter；First photoelectric sensor to the 8th photoelectric sensor
Collected signal acquires via data collecting card and uploads to computer and analyzed and calculated.Wherein, the first multi fiber is quasi-
Straight device, the second multiple optical fiber collimating, third multiple optical fiber collimating, the first F-P etalon, the 2nd F-P etalon, the 3rd F-P mark
Quasi- tool, the first turntable, the second turntable, third turntable, the first single optical fiber calibrator, the second single optical fiber calibrator, third
Single optical fiber calibrator is both placed in insulating box to completely cut off interference of the ambient temperature variation to F-P performance.
Because the optical power that linear filter transmits in certain optical wavelength range and incident optical maser wavelength are linear
Relationship, testing laser after one-to-two fiber coupler and one point of four fiber coupler, by optical fiber 6. the inside light beam pass through
The transmissivity of linear filter can obtain a rough light wave long value, because the transmissivity of F-P etalon is to the response of wavelength
Periodically variation, so showing that lambda1-wavelength is sinusoidal in the wavelength response of the 3rd F-P etalon by linear filter
The period position of curve, then the probable value of wavelength to be measured that is obtained by the 3rd F-P etalon determine the first F-P etalon and
The period of the wavelength response curve of 2nd F-P etalon.Here linear filter should be less than third to the Measurement Resolution of laser
The Free Spectral Range FSR of the wavelength response curve cycle of F-P etalon, the first F-P etalon and the 2nd F-P etalon is consistent
And be the 3rd F-P etalon FSR(Free Spectral Range) 1/4.
The above-mentioned corresponding wavelength response curve of three F-P etalons is sinusoidal pattern, according to linear filter positioning the
The period of the wavelength response curve of three F-P etalons obtains two wavelength values, so that it is determined that the first F-P etalon and the 2nd F-P
The period of the wavelength response curve of etalon, then carry out analytical integration and obtain final accurate wavelength value.Wherein the first F-P standard
Has the 1/4 of FSR consistent with the FSR of the 2nd F-P etalon and for the 3rd F-P etalon.By adjusting the second turntable, is enabled
The light of two multiple optical fiber collimatings outgoing adjusts third turntable, the outgoing of third multiple optical fiber collimating perpendicular to the 2nd F-P etalon
Light perpendicular to the 3rd F-P etalon, adjust the first turntable, enable the first F-P etalon rotate by a certain angle, so that the first F-
The wavelength response curve of P etalon and the 2nd F-P etalon has 90 degree of phase difference, for compensating in response curve upper ripple spike
The case where measurement and differentiation multiple solutions of paddy, thus improving measurement accuracy.Three F-P etalons should all be controlled in same temperature
The lower variation bring measurement error to avoid the response curve phase for leading to F-P etalon because of temperature change.
The beneficial effects of the present invention are:
1, measuring system of the present invention need to only detect the optical power by three F-P etalons and linear filter, so that it may
To obtain the wavelength value of incident laser, it is not necessarily to image procossing, later data processing is easy quickly.
2, a rough wavelength value is estimated by linear filter and the biggish F-P etalon of FSR, then passes through two
The smaller F-P etalon of FSR further solves accurate wavelength value, and lower FSR can be improved the resolution ratio of measurement result.
This scheme also obtains further improving precision not only without reference to laser, implements also easily, and control
Cost.
3, compared to the scheme only calculated with two F-P etalons in Chinese patent CN106949220A, two are used
A smaller F-P etalon of FSR and the relatively large F-P etalon of a FSR are solved when linear filter is in resolution ratio
In the case where poor, there is the problem of multiple solutions in bring when solving the equation of periodic function, not only reduce calculation amount also into
One step improves measurement accuracy.
Detailed description of the invention
Fig. 1 is structural block diagram of the invention；
Fig. 2 is the 3rd F-P etalon of 100Ghz and the wavelength response curve graph of linear filter；
Fig. 3 is the wavelength response curve graph of three F-P etalons.
Specific embodiment
The working principle of the invention:
F-P etalon is made of two pieces of parallel glass plates, and the inner surface of glass plate is coated with high-reflecting film, and light beam is with certain inclination angle
It is incident in F-P etalon, light beam is reflected in intracavity round trip, through deriving, can show that the ratio between reflected light and transmitted light intensity are
(1-1)
In formula, δ is phase, and R is the reflectivity of highly reflecting films in F-P etalon.
By the long relationship of phase and chamber:
(1-2)
In formula, n is intracavitary refractive index, and l is that chamber is long, and θ is light in the angle of intracavity reflecting, and λ is lambda1-wavelength, in calculating,
Refractive index and chamber are grown because temperature is constant in device, therefore are definite value.So as to obtain, the phase of wavelength response curve only with angle
θ is related, and suitable incident angle can make the curve of two identical F-P etalons be staggered 90 degree of phase.
It can be obtained in conjunction with formula (1-1) and (1-2):
(1-3)
By (1-3) it is found that incident light vertical irradiation obtained on the 3rd F-P etalon 8 of 100Ghz to FSR
Waveform is as shown in Figure 2.
As shown in Figure 2, when detection is existed by the optical power and resolution ratio for the 3rd F-P etalon 8 that FSR is 100Ghz
When the optical power value of the linear filter 12 of 0.6nm, in addition to wave crest and trough, it is generally possible to determine two in some section
Wavelength value under this situation, can not solve unique correct light wave long value, therefore introduce two such as a and b two o'clock in figure
The first F-P etalon 6 of F-P etalon of 25Ghz and the 2nd F-P etalon 7, the first F-P etalon 6 and the 2nd F-P etalon 7
Period be about 100Ghz F-P 1/4, in order to avoid the wavelength response slope of curve close at 0 because of noise caused by
The poor situation of noise marks the first F-P and also to solve the problems, such as to obtain multiple solutions in the calculating of periodic function
Quasi- tool 6 rotates by a certain angle to form an angle with incident light shape, enables the phase of the first F-P etalon 6 and the 2nd F-P etalon 7
Difference is 90 degree, keeps the wave crest of the wavelength response curve of the first F-P etalon 6 and the 2nd F-P etalon 7 and trough right respectively
Should be in the linear zone of the 2nd F-P etalon 7 and 6 response curve of the first F-P etalon, response curve such as Fig. 3, it can be with from figure
Find out, in the case where determining a point and b point, for the first F-P etalon 6 and the 2nd F-P etalon 7, an optical power ratio
Value can correspond to out 3 wavelength values in one section of section centered on a point, and by comparing, a point is marked in discovery in the first F-P
The A point wavelength value obtained in the wavelength value of the C point obtained on quasi- tool 6 and the 2nd F-P etalon 7 is consistent, that is, passes through three F-P marks
The equation group of the wavelength response curve building of quasi- tool solution having the same in the section；And for one section of area centered on b point
In, the uncommon solution of the equation group of building, therefore it can be concluded that the corresponding λ value of point A and C is exactly the accurate wave of light to be measured
Long value.
To sum up, the important process of test of the invention is as follows:
In conjunction with Fig. 1, Fig. 2 and Fig. 3, the transmitted optical power of the linear filter 12 obtained by the 8th photodetector 24 determine with
The value of the resolution ratio of linear filter is the section of width, and the period of the 3rd F-P etalon 8 is determined with obtained section, is led to
It crosses the 6th photodetector 22 and the 7th photodetector 23 obtains the optical power ratio by the 3rd F-P etalon 8, optical power
Ratio, which corresponded in period of the 3rd F-P etalon 8, obtains two or a rough wavelength value, then two by obtaining or
One wavelength value determines the computation interval of the wavelength response curve of its first F-P etalon 6 and the 2nd F-P etalon 7.With section
For domain, the second photodetector 18 is substituted into the first F-P to the optical power ratio that the 5th photodetector 21 obtains respectively
The wavelength response curve of etalon 6 and the 2nd F-P etalon 7 constitutes equation, the wavelength value solved is compared, three F-
The most similar or common solution of the corresponding equation of P etalon, the wavelength value of light as to be measured.
Measuring process of the invention are as follows:
Step 1) is according to Fig. 1, and connect optical path: light beam to be measured is divided into two-beam by one-to-two fiber coupler (1) and enters respectively
Be mapped to optical fiber 1. with optical fiber 2., by the outgoing beam of optical fiber 1. directly by the first photodetector (17) receive；Into optical fiber
2. light beam via one point of four fiber coupler (2) be divided into four bundles light be incident on respectively optical fiber 3., optical fiber 4., optical fiber 5. and light
It is fine 6., optical fiber 3. in the light beam that is emitted after the first multiple optical fiber collimating (3) of light beam be 10. irradiated to and turned by the first turntable (9)
On the first F-P etalon (6) after dynamic proper angle, this suitable angle makes the wavelength response of the first F-P etalon (6) just
The wavelength response sine curve of chord curve and the 2nd F-P etalon (7) generates 90 degree of phase difference, optical fiber 3. in light beam passing through
The transmitted light for crossing the generation of the first F-P etalon (6), which is received by the first single optical fiber calibrator (14) and is transferred to the second photoelectricity, to be visited
Survey device (18), optical fiber 3. in light beam by the first F-P etalon (6) generate reflected light be irradiated to the first multi fiber collimation
On device (3), 7. it is transmitted to using optical fiber on third photodetector (19)；Optical fiber 4. in light beam collimated through the second multi fiber
The beam orthogonal that device (4) is emitted afterwards is irradiated to the 2nd F-P etalon (7) after being turned an angle by the second turntable (10)
On, optical fiber 4. in light beam by the 2nd F-P etalon (7) generate transmitted light connect by the second single optical fiber calibrator (15)
Receive and be transferred to the 4th photodetector (20), optical fiber 4. in light beam in the reflected light generated by the 2nd F-P etalon (7)
It is irradiated on the second multiple optical fiber collimating (4), is 8. transmitted to using optical fiber on the 5th photodetector (21)；Optical fiber 5. in
The light beam that is emitted after third multiple optical fiber collimating (5) of light beam equally according to being vertically mapped to by third turntable (11) rotation one
On the 3rd F-P etalon (8) after determining angle, optical fiber 5. in light beam pass through the 3rd F-P etalon (8) generate transmitted light
Received by third single optical fiber calibrator (16) and be transferred to the 6th photodetector (22), optical fiber 5. in light beam pass through the 3rd F-
The reflected light that P etalon (8) generates is irradiated on third multiple optical fiber collimating (5), and the 7th light is 9. transmitted to using optical fiber
On electric explorer (23)；Optical fiber 6. in light beam be transmitted to the 8th photoelectric sensor (24) via linear filter (12)；First
Photoelectric sensor (17) is acquired and is uploaded to via data collecting card (25) to the 8th photoelectric sensor (24) collected signal
Computer (26) is analyzed and is calculated.
Step 2 measures roughly wavelength value according to Fig. 2: the linear filter 12 obtained by the 8th photodetector 24
Transmitted optical power is determined using the value of the resolution ratio of linear filter as the section of width, and the 3rd F-P is determined with obtained section
The period of etalon 8 is obtained by the 6th photodetector 22 and the 7th photodetector 23 through the 3rd F-P etalon 8
Optical power ratio, optical power ratio correspond in period of the 3rd F-P etalon 8 and obtain two or a rough wavelength value.
Step 3) accurately measures wavelength value according to Fig. 3: determining its first F-P by two obtained or a wavelength value
The computation interval of the wavelength response curve of etalon 6 and the 2nd F-P etalon 7.Using section as domain, by the second photodetection
Device 18 substitutes into the first F-P etalon 6 and the 2nd F-P etalon 7 to the optical power ratio that the 5th photodetector 21 obtains respectively
Wavelength response curve constitute equation, the wavelength value solved is compared, the corresponding equation most phase of three F-P etalons
Close either common solution, the wavelength value of light as to be measured.
Claims (2)
1. a kind of high-accuracy wavelength measuring device based on three F-P etalons, it is characterised in that: light beam to be measured passes through one-to-two light
Fine coupler (1) be divided into two-beam be incident on respectively optical fiber 1. with optical fiber 2., by the outgoing beam of optical fiber 1. directly by
One photodetector (17) receives；Four bundles light difference is divided into via one point of four fiber coupler (2) into the light beam of optical fiber 2.
Be incident on optical fiber 3., optical fiber 4., optical fiber 5. with optical fiber 6., optical fiber 3. in light beam be emitted after the first multiple optical fiber collimating (3)
Light beam be 10. irradiated on the first F-P etalon (6) after being turned an angle by the first turntable (9), optical fiber 3. in light
Beam is received by the first single optical fiber calibrator (14) in the transmitted light generated by the first F-P etalon (6) and is transferred to second
Photodetector (18), optical fiber 3. in light beam by the first F-P etalon (6) generate reflected light be irradiated to more than first light
On fine collimator (3), 7. it is transmitted to using optical fiber on third photodetector (19)；Optical fiber 4. in light beam through more than second light
The beam orthogonal that fine collimator (4) is emitted afterwards is irradiated to the mark of the 2nd F-P after being turned an angle by the second turntable (10)
Quasi- tool (7) on, optical fiber 4. in light beam by the 2nd F-P etalon (7) generate transmitted light collimated by the second single fiber
Device (15), which receives, is simultaneously transferred to the 4th photodetector (20), optical fiber 4. in light beam generated by the 2nd F-P etalon (7)
Reflected light be irradiated on the second multiple optical fiber collimating (4), be 8. transmitted to using optical fiber on the 5th photodetector (21)；
Optical fiber 5. in the light beam that is emitted after third multiple optical fiber collimating (5) of light beam equally according to being vertically mapped to by third turntable
(11) on the 3rd F-P etalon (8) after turning an angle, optical fiber 5. in light beam by the 3rd F-P etalon (8) generate
Transmitted light received by third single optical fiber calibrator (16) and be transferred to the 6th photodetector (22), optical fiber 5. in light beam
It is irradiated on third multiple optical fiber collimating (5) by the reflected light that the 3rd F-P etalon (8) generates, is 9. passed using optical fiber
It is delivered on the 7th photodetector (23)；Optical fiber 6. in light beam be transmitted to the 8th photoelectric sensor via linear filter (12)
(24)；First photoelectric sensor (17) is acquired to the 8th photoelectric sensor (24) collected signal via data collecting card (25)
And it uploads to computer (26) and is analyzed and calculated；In the system, the first multiple optical fiber collimating (3), the second multi fiber collimation
Device (4), third multiple optical fiber collimating (5), the first F-P etalon (6), the 2nd F-P etalon (7), the 3rd F-P etalon (8),
First turntable (9), the second turntable (10), third turntable (11), the first single optical fiber calibrator (14), the second single fiber are quasi-
Straight device (15), third single optical fiber calibrator (16) are both placed in insulating box (13).
2. a kind of high-accuracy wavelength measuring device based on three F-P etalons according to claim 1, it is characterised in that:
The second turntable (10) are rotated, enable incident light perpendicular to the 2nd F-P etalon (7), and rotate third turntable (11), are enabled
Incident light enables incident light in the first F-P standard perpendicular to the 3rd F-P etalon (8), while by adjusting the first turntable (9)
There is certain incidence angle on tool (6), makes the wavelength response sine curve and the 2nd F-P etalon (7) of the first F-P etalon (6)
Wavelength response sine curve generate 90 degree of phase difference.
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| CN201811138095.8A CN109084904A (en) | 2018-09-28 | 2018-09-28 | A kind of high-accuracy wavelength measuring device based on three F-P etalons |
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| CN201811138095.8A CN109084904A (en) | 2018-09-28 | 2018-09-28 | A kind of high-accuracy wavelength measuring device based on three F-P etalons |
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Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110927119A (en) * | 2019-11-18 | 2020-03-27 | 中国科学院上海光学精密机械研究所 | Device and method for detecting ultralow residual reflectivity of boundary surface of large-size sheet laser neodymium glass |
| CN111385020A (en) * | 2018-12-29 | 2020-07-07 | 海思光电子有限公司 | Wavelength measuring device |
| CN112054842A (en) * | 2020-08-13 | 2020-12-08 | 武汉光迅科技股份有限公司 | Device for adjusting wavelength |
| CN113295285A (en) * | 2020-02-24 | 2021-08-24 | 朗美通经营有限责任公司 | Optical frequency measuring device |
| CN113324665A (en) * | 2020-02-29 | 2021-08-31 | 华为技术有限公司 | Wavemeter, method for obtaining parameters of wavemeter and method for on-line calibration |
| WO2021185301A1 (en) * | 2020-03-19 | 2021-09-23 | 华为技术有限公司 | Wavelength measurement device and wavelength measurement method |
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| US20030035120A1 (en) * | 2001-08-14 | 2003-02-20 | Myatt Christopher J. | Multiple-interferometer device for wavelength measuring and locking |
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| CN111385020A (en) * | 2018-12-29 | 2020-07-07 | 海思光电子有限公司 | Wavelength measuring device |
| CN111385020B (en) * | 2018-12-29 | 2022-04-29 | 海思光电子有限公司 | Wavelength measuring device |
| CN110927119A (en) * | 2019-11-18 | 2020-03-27 | 中国科学院上海光学精密机械研究所 | Device and method for detecting ultralow residual reflectivity of boundary surface of large-size sheet laser neodymium glass |
| CN110927119B (en) * | 2019-11-18 | 2022-06-28 | 中国科学院上海光学精密机械研究所 | Device and method for detecting ultralow residual reflectivity of boundary surface of large-size sheet laser neodymium glass package |
| CN113295285A (en) * | 2020-02-24 | 2021-08-24 | 朗美通经营有限责任公司 | Optical frequency measuring device |
| CN113324665A (en) * | 2020-02-29 | 2021-08-31 | 华为技术有限公司 | Wavemeter, method for obtaining parameters of wavemeter and method for on-line calibration |
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| CN113494967A (en) * | 2020-03-19 | 2021-10-12 | 华为技术有限公司 | Wavelength measuring device and method for measuring wavelength |
| CN112054842A (en) * | 2020-08-13 | 2020-12-08 | 武汉光迅科技股份有限公司 | Device for adjusting wavelength |
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