CN113324665A

CN113324665A - Wavemeter, method for obtaining parameters of wavemeter and method for on-line calibration

Info

Publication number: CN113324665A
Application number: CN202010132650.7A
Authority: CN
Inventors: 秦华强; 赵晗; 贾伟
Original assignee: Huawei Technologies Co Ltd
Current assignee: Huawei Technologies Co Ltd
Priority date: 2020-02-29
Filing date: 2020-02-29
Publication date: 2021-08-31
Anticipated expiration: 2040-02-29
Also published as: WO2021169518A1; CN113324665B

Abstract

The application provides a wavelength meter, a method for obtaining parameters of the wavelength meter and an online calibration method, and belongs to the technical field of optical communication. The wavelength meter comprises a first optical splitter, a first optical path converter, an etalon and a plurality of first photoelectric detectors, wherein the first optical splitter is used for splitting input calibration light to obtain a plurality of sub-calibration light beams, the sub-calibration light beams comprise first sub-calibration light beams and second sub-calibration light beams, the first optical path converter is used for changing the propagation direction of the first sub-calibration light beams and/or the second sub-calibration light beams, the etalon is used for carrying out interference processing on the second sub-calibration light beams to obtain third sub-calibration light beams, the first photoelectric detectors are used for converting the received first sub-calibration light beams or the received third sub-calibration light beams into a plurality of first electric signals, and the first electric signals are used for calibrating the wavelength meter. By adopting the method and the device, the wavemeter can be calibrated on line.

Description

Wavemeter, method for obtaining parameters of wavemeter and method for on-line calibration

Technical Field

The present application relates to the field of optical communication technologies, and in particular, to a wavelength meter, a method for obtaining parameters of the wavelength meter, and an online calibration method.

Background

The laser frequency is an important parameter in optical communication, and it is particularly important to accurately measure the laser frequency. At present, the wavelength meter has high measurement accuracy, so the wavelength meter is widely applied to the measurement of laser frequency, and the wavelength meter can be an Etalon (Etalon) -based wavelength meter. When wavelength measurement is carried out by using a wavemeter based on Etalon, the transmittance of light to be measured is determined according to a light signal of the light to be measured after the light to be measured passes through the Etalon measured by a photoelectric detector, and then the wavelength of the transmittance of the light to be measured corresponding to the reference transmittance curve is determined by using a reference transmittance curve of Etalon. Since the measurement accuracy of the method for measuring the wavelength by using Etalon is related to the slope of the transmittance curve at the wavelength to be measured (when the wavelength is at a position where the slope of the transmittance curve is large, the measurement accuracy of the wavelength is high, and when the wavelength to be measured is at the top peak or the bottom of the transmittance curve, the slope of the transmittance is very low, and the measurement accuracy of the wavelength is poor), the wavelength measurement scheme based on Etalon needs to use the position where the slope of the transmittance curve is large to meet the requirement of high measurement accuracy.

In the related art, Etalon with a plurality of different parameters (Etalon refractive index, Etalon end face reflectance, etc.) is used to obtain transmittance curves differing in a plurality of Free Spectral Ranges (FSRs), and high-precision wavelength measurement in a wide Spectral Range is realized by splicing high-slope portions of the transmittance curves.

In the field of communications, when a wavelength meter is applied to an optical communication system, in order to ensure the measurement accuracy of the wavelength meter and the continuity of services, the wavelength meter needs to be calibrated online, however, in the related art, only a scheme for measuring the wavelength is provided, and a scheme for calibrating the wavelength meter online is not provided, so that a scheme for calibrating the wavelength meter online is needed.

Disclosure of Invention

The application provides a wavelength meter, a method for acquiring parameters of the wavelength meter and an online calibration method, which are used for online calibration of the wavelength meter.

In a first aspect, a wavelength meter is provided that includes a first beam splitter, a first optical path transformer, an etalon, and a plurality of first photodetectors. The first light splitter is used for splitting the input calibration light to obtain a plurality of sub-calibration lights, wherein the plurality of sub-calibration lights comprise a first sub-calibration light and a second sub-calibration light. The first optical path changer is used for changing the propagation direction of the first sub-calibration light and/or the second sub-calibration light. The first sub-calibration light directly entering the first photodetector may be used as reference light for the calibration light. The etalon is used for the second sub-calibration light to perform interference processing to obtain third sub-calibration light, the third sub-calibration light is output to the first photoelectric detectors, the plurality of first photoelectric detectors are used for converting the received first sub-calibration light or the third sub-calibration light into a plurality of first electric signals, and the plurality of first electric signals are used for calibrating the wavelength meter. Thus, since the wavelength meter has the calibration light entering therein and shares the etalon with the portion for measuring the light to be measured, the wavelength meter can be calibrated without affecting the measurement portion of the wavelength, so that an on-line calibration wavelength meter can be provided.

In a possible implementation manner, the wavelength meter may further include a plurality of second photodetectors, and the first optical splitter is further configured to split the input light to be measured to obtain a plurality of sub light to be measured, where the plurality of sub light to be measured includes the first sub light to be measured and the plurality of second sub light to be measured. The first optical path converter is further used for changing the propagation direction of the first sub light to be measured and/or the second sub light to be measured. The first sub light to be measured directly enters the second photodetector to be used as reference light of the light to be measured. The etalon is also used for respectively carrying out interference processing on the multiple second sub light to be detected to obtain multiple third sub light to be detected, and the multiple third sub light to be detected are respectively output to different second photoelectric detectors. The second photodetectors are configured to convert the received first sub light to be detected or the received third sub light to be detected into second electrical signals, and the second electrical signals are used to determine a wavelength of the light to be detected. Therefore, the combination of the first optical splitter and the second optical path converter can be used in the wavelength meter to divide one beam of light to be measured into a plurality of second sub light to be measured in different propagation directions, so that the multi-angle etalon is realized, the wavelength measurement can be realized without a plurality of etalons, and the structure of the wavelength meter is simplified.

In a possible implementation manner, the wavemeter further includes a linear filter and a third photodetector, and the multi-beam sub light-to-be-detected further includes a fourth sub light-to-be-detected. The linear filter is used for filtering the received fourth sub light to be detected to obtain fifth sub light to be detected, and outputting the fifth sub light to be detected to the third photoelectric detector. The third photoelectric detector is used for converting the fifth sub light to be measured into a third electric signal, and the third electric signal is used for determining the wavelength position of the wavelength of the light to be measured in the reference transmittance curve corresponding to the light to be measured. In this way, since the linear filter is used in the wavelength meter, the approximate wavelength position of the wavelength of the light to be measured in the target reference transmittance curve of the light to be measured can be determined by the linear filter, the range of the light to be measured corresponding to the wavelength meter does not need to be stored in advance, the approximate wavelength position of the light to be measured does not need to be input additionally, and the wavelength meter can be suitable for measuring the wavelength in a wider range.

In one possible implementation, the first optical path changer is any one of a collimator array, a convex lens, or a concave lens. The collimator array is composed of a group of lenses, and each beam of light entering the first light path converter enters different lenses.

In a possible implementation manner, the wavelength meter further includes a processor, the processor is electrically connected to the plurality of first photodetectors, and the processor is electrically connected to the plurality of second photodetectors. The processor is used for calibrating the wavelength meter according to the calibration parameters provided by the plurality of first photodetectors, and the processor is also used for determining the wavelength of the light to be measured according to the first measurement parameters provided by the plurality of second photodetectors. In this way, since the wavelength meter further includes a processor, the wavelength meter can directly calibrate the reference transmittance curve of the light to be measured by the processor, and directly determine the wavelength of the light to be measured.

In a second aspect, there is provided a method of obtaining parameters of a wavemeter, the method being applied to the wavemeter of the first aspect, the method comprising:

a light is input into a wavelength meter, and the wavelength meter can divide one light input each time into a plurality of sub-beams, wherein the plurality of sub-beams comprise a first sub-beam and a second sub-beam. The wavelength meter can directly convert the first sub-beam into a first electric signal, and perform interference processing on the second sub-beam to obtain a third sub-beam. And finally, the wavelength meter determines the voltage value or the current value of the first electric signal and the second electric signal as the parameter of the wavelength meter. The parameters of the wavelength meter comprise a calibration parameter and a first measurement parameter, the calibration parameter is used for calibrating the wavelength meter, and the first measurement parameter is used for determining the wavelength of the light to be measured by the wavelength meter. In this way, the processor is provided with parameters for the wavelength meter, so that the processor can perform the corresponding processing.

In one possible implementation, the parameter of the wavemeter is a calibration parameter. Monochromatic light with different wavelengths in the calibration light is input into the wavelength meter according to a preset sequence. The wavelength meter divides the calibration light input each time to obtain a plurality of sub-calibration lights, wherein the sub-calibration lights comprise a first sub-calibration light and a second sub-calibration light, and the power of the sub-calibration lights is the same. The wavelength meter may directly convert the first sub-calibration light into a first electrical signal, and may perform interference processing on the second sub-calibration light to obtain a third sub-calibration light. The wavelength meter converts the third sub-calibration light into a second electrical signal. The wavelength meter uses the voltage value or the current value of the first electric signal and the second electric signal as the calibration parameter of the wavelength meter. Therefore, calibration parameters are provided for the processor, so that the processor can calibrate the reference transmittance curve of the light to be measured, and the on-line calibration of the wavemeter can be realized.

In a possible implementation manner, the parameter of the wavelength meter is a first measurement parameter, and in an optical communication system, when an optical module (a receiving end, a transmitting end, or the like) needs to measure a wavelength of a light beam (subsequently referred to as light to be measured), the light to be measured may be input to the wavelength meter. The wavelength meter may split the input light to be measured to obtain a plurality of sub-lights to be measured, where the plurality of sub-lights to be measured include a first sub-light to be measured and a second sub-light to be measured. The wavelength meter may directly convert the first sub-calibration light into the first electrical signal, and may perform interference processing on the second sub-calibration light to obtain a plurality of third sub-measurement lights. The wavelength meter converts the third sub-beams of light to be measured into a second electric signal. The wavelength meter takes the voltage value or the current value of the first electric signal and the second electric signal as a first measurement parameter of the wavelength meter. In this way, the processor is provided with the first measurement parameter such that the processor can determine the wavelength of light to be measured based on the first measurement parameter and a pre-stored reference transmittance curve.

In a possible implementation manner, the parameter of the wavelength meter may further include a second measurement parameter, and after the wavelength meter splits the light to be measured, the obtained multiple beams of light to be measured further include a fourth sub light to be measured. The wavelength meter can perform filtering processing on the fourth sub light to be measured to obtain a fifth sub light to be measured. And then the wavelength meter converts the fifth sub light to be measured into a third electric signal, and determines the voltage value or the current value of the third electric signal as a second measurement parameter. In this way, the subsequent processor may determine the wavelength position of the wavelength of the light to be measured in the target reference transmittance curve corresponding to the light to be measured by using the second measurement parameter, without storing the range of the light to be measured corresponding to the wavelength meter in advance, or inputting the approximate wavelength position of the light to be measured additionally, so that the wavelength meter may be suitable for measuring wavelengths in a wider range.

In a third aspect, there is provided an online calibration method, which is applied to the wavemeter of the first aspect, and includes:

and determining a transmittance curve corresponding to the current calibration light according to the calibration parameters obtained from each first photoelectric detector, and then determining the adjustment parameters of the wavelength meter according to the transmittance curve corresponding to the calibration light and the reference transmittance curve corresponding to the calibration light. And correcting the reference transmittance curve corresponding to the light to be measured according to the adjustment parameters to obtain a target reference transmittance curve corresponding to the light to be measured. Therefore, when the wavelength meter is calibrated, the calibration parameters can be used for determining the target reference transmittance curve corresponding to the light to be measured, the target reference transmittance curve can be used for determining the wavelength of the light to be measured subsequently, and the measurement accuracy of the wavelength meter can be maintained as much as possible.

In a possible implementation manner, when determining the adjustment parameter, a transmittance curve corresponding to the calibration light and a reference transmittance curve corresponding to the calibration light may be determined, and if the minimum transmittances of the two transmittance curves are different, the reflectance of the standard in the adjustment parameter of the wavelength meter may be determined. If the free spectral regions of the two transmittance curves are different, the refractive index of the standard in the adjustment parameter of the wavelength meter can be determined according to the free spectral region of the transmittance curve corresponding to the calibration light. In this way, the tuning parameters of the wavemeter can be determined.

In a possible implementation manner, the reflectivity and the refractive index in the adjustment parameter may also be substituted into a transmittance curve formula of a reference transmittance curve corresponding to the light to be measured, so as to obtain a target reference transmittance curve corresponding to the light to be measured. Thus, a target reference transmittance curve may be determined by the transmittance curve formula.

In one possible implementation, the method further includes: the electric signal provided by the second photodetector for detecting the reference light of the to-be-detected light and the electric signal provided by the second photodetector for detecting the to-be-detected light output by the etalon are acquired in the first measurement parameter, and the transmittance of the to-be-detected light through the etalon is determined. And then determining the ratio of the electric signal provided by the third detector and the electric signal provided by the second photoelectric detector for detecting the reference light of the light to be detected, and determining the wavelength position of the wavelength of the light to be detected corresponding to the ratio in the transmittance curve corresponding to the linear filter. And then determining the wavelength of the light to be measured according to the wavelength position, the transmittance and the target reference transmittance curve. In this way, since the period of the wavelength of the light to be measured in the reference transmittance curve of the light to be measured can be determined, the range of the light to be measured corresponding to the wavelength meter does not need to be stored in advance, and the approximate wavelength position of the light to be measured does not need to be input additionally, so that the wavelength meter can be applied to the wavelength measurement in a wider range.

In a possible implementation manner, a free spectral region to which the wavelength position belongs may be selected from a target reference transmittance curve corresponding to the light to be measured according to the wavelength position. And then obtaining a target reference transmittance curve with the highest slope in the free spectral region of the selected target reference transmittance curve, and selecting a wavelength corresponding to the transmittance (the transmittance is the transmittance of the light to be measured with the same etalon incident angle as the selected target reference transmittance curve) in the target reference transmittance curve to determine the wavelength as the wavelength of the light to be measured. In this way, since the free spectral range can be selected by using the approximate wavelength position of the light to be measured, the wavelength of the light to be measured can be directly selected in the free spectral range, the light to be measured range corresponding to the wavelength meter does not need to be stored in advance, the approximate wavelength position of the light to be measured does not need to be input additionally, and the wavelength meter can be suitable for measuring the wavelength in a wider range.

In a possible implementation manner, the reflectivity and the refractive index in the adjustment parameter may be substituted into a transmittance curve formula of a reference transmittance curve corresponding to the calibration light, so as to obtain a corrected reference transmittance curve corresponding to the calibration light. Thus, a corrected reference transmittance curve corresponding to the calibration light can be determined by the transmittance curve formula, and then the corrected reference transmittance curve can be used for next calibration of the wavelength meter.

In a fourth aspect, a wavelength meter is provided, where the wavelength meter includes a first optical splitter, a first optical path converter, an etalon, and a plurality of first photodetectors, where the first optical splitter is configured to split input light to be measured to obtain a plurality of sub-light-to-be-measured lights, and the plurality of sub-light-to-be-measured lights include a first sub-light-to-be-measured light and a second sub-light-to-be-measured light. The first optical path converter is used for changing the propagation direction of the first sub light to be detected and/or the second sub light to be detected, so that the first sub light to be detected is directly carried out on the first photoelectric detector, and a plurality of beams of the second sub light to be detected are subjected to etalon at different incidence angles. The first sub light to be measured directly enters the first photodetector to be used as reference light of the light to be measured. The etalon is used for respectively carrying out interference processing on the multiple second sub light to be detected to obtain multiple third sub light to be detected, and the multiple third sub light to be detected are respectively output to different first photoelectric detectors. The plurality of first photodetectors are configured to convert the received first sub light to be detected or the received third sub light to be detected into a plurality of second electrical signals, and the plurality of second electrical signals are configured to determine a wavelength of the light to be detected. Like this, owing to can use first beam splitter and first optical path converter, output the light of waiting to survey of many different propagation directions, so the second of input etalon waits to survey the light and be the light that awaits measuring of a plurality of different propagation directions, has realized the multi-angle etalon, so do not need a plurality of etalons just can realize the wavelength and measure, and then can make the structure of wavemeter simpler.

In a possible implementation manner, the wavemeter further includes a linear filter and a second photodetector, and the multi-beam sub light-to-be-detected further includes a fourth sub light-to-be-detected. The first optical path converter outputs the fourth sub light to be detected to the linear filter, and the linear filter can perform filtering processing on the received fourth sub light to be detected to obtain fifth sub light to be detected and output the fifth sub light to the second photoelectric detector. The second photodetector may convert the fifth sub light to be measured into a second electrical signal, where the second electrical signal is used to determine a wavelength position of the wavelength of the light to be measured in a reference transmittance curve corresponding to the light to be measured. In this way, since the linear filter is used in the wavelength meter, the approximate wavelength position of the wavelength of the light to be measured in the target reference transmittance curve of the light to be measured can be determined by the linear filter, the range of the light to be measured corresponding to the wavelength meter does not need to be stored in advance, the approximate wavelength position of the light to be measured does not need to be input additionally, and the wavelength meter can be suitable for measuring the wavelength in a wider range.

In a possible implementation manner, the wavelength meter further includes a plurality of third photodetectors, and the first optical splitter is further configured to split the input calibration light to obtain a plurality of sub-calibration lights, where the plurality of sub-calibration lights includes the first sub-calibration light and the second sub-calibration light. The first optical path changer is further configured to change a propagation direction of the first sub-collimated light and/or the second sub-collimated light, so that the first sub-collimated light enters the second photodetector and the second sub-collimated light enters the etalon. The first sub-calibration light directly enters the third photodetector as reference light of the calibration light. The etalon is further used for the second sub-calibration light to perform interference processing to obtain third sub-calibration light, the third sub-calibration light is output to a third photoelectric detector, the plurality of third photoelectric detectors are used for converting the received first sub-calibration light or the received third sub-calibration light into a plurality of third electric signals, and the plurality of third electric signals are used for calibrating the wavelength meter. Thus, since the wavelength meter has the calibration light entering and uses one etalon with the part for measuring the light to be measured, the wavelength meter can be calibrated without affecting the measurement part of the wavelength, and the wavelength meter with online calibration can be provided.

In one possible implementation, the wavelength meter may further include a second beam splitter, a second optical path changer, and a plurality of third photodetectors. The second beam splitter is used for splitting the input calibration light to obtain a plurality of sub-calibration lights, and the plurality of sub-calibration lights comprise the first sub-calibration light and the second sub-calibration light. The second optical path changer is used for changing the propagation direction of the first sub-calibration light and/or the second sub-calibration light. The first sub-calibration light directly enters the third photodetector as reference light of the calibration light. The etalon is further used for the second sub-calibration light to perform interference processing to obtain third sub-calibration light, the third sub-calibration light is output to a third photoelectric detector, the plurality of third photoelectric detectors are used for converting the received first sub-calibration light or the received third sub-calibration light into a plurality of third electric signals, and the plurality of third electric signals are used for calibrating the wavelength meter. Thus, since the wavelength meter has the calibration light entering and uses one etalon with the part for measuring the light to be measured, the wavelength meter can be calibrated without affecting the measurement part of the wavelength, and the wavelength meter with online calibration can be provided.

In one possible implementation, the first optical path changer is any one of a collimator array, a convex lens, or a concave lens.

In a possible implementation manner, the wavelength meter further includes a processor, the processor is electrically connected to the plurality of first photodetectors, and the processor is electrically connected to the plurality of second photodetectors. In this way, since the wavelength meter further includes a processor, the processor in the wavelength meter can directly calibrate the reference transmittance curve of the light to be measured, and can directly determine the wavelength of the light to be measured.

In a fifth aspect, a method for online calibration is provided, the method comprising:

splitting the calibration light input each time to obtain a plurality of sub-calibration lights, wherein the plurality of sub-calibration lights comprise a first sub-calibration light and a second sub-calibration light, and the calibration lights comprise monochromatic lights with various wavelengths and are input according to a preset sequence; converting the first sub-calibration light into a first electric signal, and performing interference processing on the second sub-calibration light to obtain a third sub-calibration light; converting the third sub-calibration light into a second electrical signal; and taking the voltage value or the current value of the first electric signal and the second electric signal as a calibration parameter of the wavelength meter. Determining a transmittance curve corresponding to the calibration light according to the calibration parameter; determining an adjustment parameter of the wavelength meter according to the transmittance curve corresponding to the calibration light and the reference transmittance curve corresponding to the calibration light; and correcting the reference transmittance curve corresponding to the light to be measured according to the adjustment parameters to obtain a target reference transmittance curve corresponding to the light to be measured.

According to the scheme, monochromatic light with different wavelengths in the calibration light is input into the wavemeter according to the preset sequence. The wavelength meter divides the calibration light input each time to obtain a plurality of sub-calibration lights, wherein the sub-calibration lights comprise a first sub-calibration light and a second sub-calibration light, and the power of the sub-calibration lights is the same. The wavelength meter may directly convert the first sub-calibration light into a first electrical signal, and may perform interference processing on the second sub-calibration light to obtain a third sub-calibration light. The wavelength meter converts the third sub-calibration light into a second electrical signal. The wavelength meter uses the voltage value or the current value of the first electric signal and the second electric signal as the calibration parameter of the wavelength meter. Then, the ratio of the voltage value (or current value) of each second electrical signal to the voltage value (current value) of the first electrical signal in the calibration parameter is determined, and each ratio corresponds to the transmittance of monochromatic light with different wavelengths, so that a transmittance curve corresponding to the current calibration light can be obtained. And then, determining the adjustment parameters of the wavelength meter according to the transmittance curve corresponding to the calibration light and the reference transmittance curve corresponding to the calibration light. And correcting the reference transmittance curve corresponding to the light to be measured according to the adjustment parameters to obtain a target reference transmittance curve corresponding to the light to be measured. Therefore, when the wavelength meter is calibrated, the calibration parameters can be used for determining the target reference transmittance curve corresponding to the light to be measured, the target reference transmittance curve can be used for determining the wavelength of the light to be measured subsequently, and the measurement accuracy of the wavelength meter can be maintained as much as possible.

In one possible implementation, the method further includes: splitting the input light to be detected to obtain a plurality of sub light to be detected, wherein the plurality of sub light to be detected comprises a first sub light to be detected and a plurality of second sub light to be detected, converting the first sub light to be detected into a third electric signal, and respectively carrying out interference processing on the plurality of second sub light to be detected to obtain a plurality of third sub light to be detected; and respectively converting the multiple third sub lights to be measured into fourth electric signals, and taking the voltage values or the current values of the third electric signals and the fourth electric signals as first measurement parameters of the wavelength meter. Determining the transmissivity of the light to be measured through the etalon according to the first measurement parameter; and determining the wavelength of the light to be measured according to the transmittance and the target reference transmittance curve. Thus, the determined wavelength of the light to be measured can be more accurate because the target reference transmittance curve is more accurate.

In one possible implementation, the method further includes: the multi-beam sub-to-be-detected light further includes a fourth sub-to-be-detected light, and the method further includes: filtering the fourth sub light to be detected to obtain a fifth sub light to be detected, and converting the fifth sub light to be detected into a fifth electric signal; and determining a voltage value or a current value of the fifth electric signal as a second measurement parameter, wherein the second measurement parameter is used for determining the wavelength position of the light to be measured in the reference transmittance curve of the light to be measured. And determining the transmittance of the light to be measured passing through the etalon according to the first measurement parameter, determining the wavelength position corresponding to the wavelength of the light to be measured in the transmittance curve corresponding to the linear filter according to the first measurement parameter and the second measurement parameter, and determining the wavelength of the light to be measured according to the wavelength position, the transmittance and a target reference transmittance curve. In this way, since the period of the wavelength of the light to be measured in the reference transmittance curve of the light to be measured can be determined, the range of the light to be measured corresponding to the wavelength meter does not need to be stored in advance, and the approximate wavelength position of the light to be measured does not need to be input additionally, so that the wavelength meter can be applied to the wavelength measurement in a wider range.

In one possible implementation, determining an adjustment parameter of the wavelength meter according to the transmittance curve corresponding to the calibration light and the reference transmittance curve corresponding to the calibration light includes: if the minimum transmittance in the transmittance curve corresponding to the calibration light and the reference transmittance curve corresponding to the calibration light are different, determining the reflectivity of a standard in the adjustment parameters of the wavelength meter according to the minimum transmittance in the transmittance curve corresponding to the calibration light; and if the free spectral region of the transmissivity curve corresponding to the calibration light is different from the free spectral region of the reference transmissivity curve corresponding to the calibration light, determining the refractive index of the standard in the adjustment parameters of the wavelength meter according to the free spectral region of the transmissivity curve corresponding to the calibration light. In this way, the tuning parameters of the wavemeter can be determined.

In a possible implementation manner, correcting a reference transmittance curve corresponding to light to be measured according to an adjustment parameter to obtain a target reference transmittance curve corresponding to the light to be measured, includes: and obtaining a target reference transmittance curve corresponding to the light to be measured according to the reflectance, the refractive index and a transmittance curve formula of the reference transmittance curve corresponding to the light to be measured. Thus, a target reference transmittance curve may be determined by the transmittance curve formula.

In one possible implementation, determining the wavelength of light to be detected according to the wavelength position, the transmittance and the target reference transmittance curve includes: and according to the wavelength position, selecting a free spectral region to which the wavelength position belongs from a target reference transmittance curve corresponding to the light to be detected. Then, a target reference transmittance curve with the highest slope is obtained in the free spectral region of the selected target reference transmittance curve, and in the target reference transmittance curve, a wavelength corresponding to the transmittance (the transmittance is the transmittance of the light to be measured having the same etalon incident angle as the selected reference transmittance curve) is selected and determined as the wavelength of the light to be measured. In this way, since the free spectral range can be selected by using the approximate wavelength position of the light to be measured, the wavelength of the light to be measured can be directly selected in the free spectral range, the light to be measured range corresponding to the wavelength meter does not need to be stored in advance, the approximate wavelength position of the light to be measured does not need to be input additionally, and the wavelength meter can be suitable for measuring the wavelength in a wider range.

In a sixth aspect, there is provided an apparatus for online calibration, the apparatus being applied to the wavelength meter according to the first aspect, the apparatus comprising:

a determining module for determining a transmittance curve corresponding to the calibration light according to the calibration parameters obtained from each of the first photodetectors; determining an adjustment parameter of the wavelength meter according to the transmittance curve corresponding to the calibration light and the reference transmittance curve corresponding to the calibration light;

and the correction module is used for correcting the reference transmittance curve corresponding to the light to be measured according to the adjustment parameter to obtain a target reference transmittance curve corresponding to the light to be measured.

In one possible implementation, the determining module is configured to:

if the minimum transmittance in the transmittance curve corresponding to the calibration light and the reference transmittance curve corresponding to the calibration light are different, determining the reflectance of a standard in the adjustment parameters of the wavelength meter according to the minimum transmittance in the transmittance curve corresponding to the calibration light;

and if the free spectral region of the transmissivity curve corresponding to the calibration light is different from the free spectral region of the reference transmissivity curve corresponding to the calibration light, determining the refractive index of the standard in the adjustment parameters of the wavelength meter according to the free spectral region of the transmissivity curve corresponding to the calibration light.

In one possible implementation, the modification module is configured to:

and obtaining a target reference transmittance curve corresponding to the light to be measured according to the reflectance, the refractive index and a transmittance curve formula of a reference transmittance curve corresponding to the light to be measured.

In a possible implementation manner, the determining module is further configured to determine, according to the first measurement parameter obtained from each second photodetector, a transmittance of the light to be measured passing through the etalon; according to the first measurement parameter and a second measurement parameter obtained from a third photoelectric detector, determining a wavelength position corresponding to the wavelength of the light to be measured in the target reference transmittance curve; and determining the wavelength of the light to be detected according to the wavelength position, the transmittance and the target reference transmittance curve.

In a seventh aspect, a computing device is provided, the computing device comprising a processor and a memory, wherein:

the memory having stored therein computer instructions;

the processor executes the computer instructions to implement the method of the third aspect.

In an eighth aspect, a computer-readable storage medium is provided, which stores computer instructions, which, when executed by a computing device, cause the computing device to perform the method of the third aspect.

Drawings

FIG. 1 is a schematic diagram of a wavelength meter provided in an exemplary embodiment of the present application;

FIG. 2 is a schematic diagram of a wavelength meter provided in an exemplary embodiment of the present application;

FIG. 3 is a schematic diagram of optical path transmission provided by an exemplary embodiment of the present application;

FIG. 4 is a schematic diagram of a wavelength meter provided in an exemplary embodiment of the present application;

FIG. 5 is a schematic diagram of a wavelength meter provided in an exemplary embodiment of the present application;

FIG. 6 is a schematic diagram of a wavelength meter provided in an exemplary embodiment of the present application;

FIG. 7 is a schematic diagram of a wavelength meter provided in an exemplary embodiment of the present application;

FIG. 8 is a schematic diagram of a wavelength meter provided in an exemplary embodiment of the present application;

FIG. 9 is a schematic illustration of optical beam transmission provided by an exemplary embodiment of the present application;

FIG. 10 is a schematic illustration of optical beam transmission provided by an exemplary embodiment of the present application;

FIG. 11 is a schematic flow chart of a method for obtaining parameters of a wavemeter according to an exemplary embodiment of the present application;

FIG. 12 is a flowchart illustrating a method for obtaining calibration parameters according to an exemplary embodiment of the present application;

FIG. 13 is a flowchart illustrating a method for obtaining measurement parameters according to an exemplary embodiment of the present application;

FIG. 14 is a flowchart illustrating a method for calibrating a wavelength on-line according to an exemplary embodiment of the present application;

FIG. 15 is a schematic diagram of a wavelength meter provided in an exemplary embodiment of the present application;

FIG. 16 is a schematic diagram of a wavelength meter provided in an exemplary embodiment of the present application;

fig. 17 is a schematic structural diagram of an apparatus for online calibration according to an exemplary embodiment of the present application.

Description of the drawings

A first beam splitter 101, a first optical path changer 102;

an etalon 103, a first photodetector 104;

a second photodetector 105, a second beam splitter 106;

a second optical path changer 107, a linear filter 108;

a third photodetector 109 and a processor 110.

Detailed Description

To make the objects, technical solutions and advantages of the present application more clear, embodiments of the present application will be described in further detail below with reference to the accompanying drawings.

To facilitate an understanding of the embodiments of the present application, the following first introduces concepts of the terms involved:

a wavemeter, which is a device that measures the wavelength of an electromagnetic wave in a transmission line, is generally implemented by the resonance characteristics of a resonant cavity. Such as an etalon-based wavemeter, wherein the etalon is a Fabry-Perot (F-P) standing wave cavity. The etalon is composed of two pieces of plane glass, the inner surfaces of the two pieces of plane glass are plated with high-reflectivity moulds, and after light beams enter the etalon, the light beams are reflected in an air layer between the two plated surfaces in an anti-corrosion mode, so that interference is formed. The wavelength meter is generally installed at a transmitting/receiving end, an intermediate node, and the like in an optical communication system.

When the wavelength meter is applied to an optical communication system, calibration is usually required to ensure the measurement accuracy of the wavelength meter, however, in the related art, only a scheme for measuring the wavelength is provided, and a scheme for calibrating the wavelength meter is not provided, so that a scheme for calibrating the wavelength meter on line is required.

The present application provides a wavemeter which can be used for calibration of a wavemeter in an optical communication system, as shown in fig. 1, the wavemeter can include a first optical splitter 101, a first optical path transformer 102, an etalon 103, and a plurality of first photodetectors 104, and the first photodetectors 104 can be photodiodes. The etalon 103 is an etalon for measuring a wavelength by a wavelength meter. The first beam splitter 101 may comprise a collimated light entrance port, which may be used for inputting collimated light. The first beam splitter 101 is configured to split the input calibration light to obtain a plurality of sub-calibration lights, and the power of each sub-calibration light may be the same. The plurality of sub-calibration lights includes a first sub-calibration light and a second sub-calibration light. The plurality of sub-collimated light beams are parallel beams.

The plurality of sub-collimated lights output from the first beam splitter 101 may be input to the first optical path changer 102, and the first optical path changer 102 may change the traveling directions of the first sub-collimated light and the second sub-collimated light; or the first optical path changer 102 may change the propagation direction of the first sub-collimated light; alternatively, the first optical path changer 102 may change the propagation direction of the second sub-calibration light such that the propagation directions of the first sub-calibration light and the second sub-calibration light are different.

The first sub-collimated light output from the first optical path converter 102 directly enters the first photodetector 104 without passing through the etalon 103, and the first photodetector 104 converts the received first sub-collimated light into a first electrical signal. The first sub-calibration light serves as reference light of the calibration light.

The second sub-calibration light output from the first optical path converter 102 enters the etalon 103, and the etalon 103 performs interference processing on the received second sub-calibration light to output third sub-calibration light.

The third sub-collimated light output from the etalon 103 enters the first photodetector 104, and the first photodetector 104 converts the received third sub-collimated light into a first electrical signal.

These first electrical signals are used to calibrate the wavelength meter (the calibration process is described later).

It should be noted here that the photodetectors used for the first sub-calibration light and the second sub-calibration light are both the first photodetector 104, but the same first photodetector 104 is not actually used.

In this way, since the wavelength meter includes the calibration portion of the wavelength meter and the calibration portion of the wavelength meter conducts calibration by introducing the calibration light through the calibration light inlet without affecting the measurement portion of the wavelength meter, it is possible to provide an on-line calibration wavelength meter.

It should be noted here that, assuming that the second sub-calibration light is a plurality of beams, in the etalon 103, the second sub-calibration light output by the first optical path transformer 102 enters the etalon 103 at different incident angles (i.e. different propagation directions), and after entering the etalon 103, the beam angle may change, depending on the refractive index inside the etalon 103: n sin theta_m＝n₀sinθ_0mWhere m is a positive integer greater than 0, n is the refractive index of the etalon 103, n is₀Is the refractive index of the air with which the etalon 103 is in contact, θ m is the angle between the light ray inside the etalon 103 and the normal to the end face of the etalon 103, θ₀m is the angle between the incident beam and the normal to the end face of the etalon 103. Suppose that there are 4 beams of light entering the etalon 103 and m takes the values 1,2,3, 4.

In a possible implementation manner, the second sub-calibration light may be one beam or multiple beams, and only one beam is shown in the embodiment of the present application.

In one possible implementation, as shown in fig. 2, the wavemeter further includes a wavelength measuring part, which may use the same first optical splitter 101, first optical path converter 102 and etalon 103 as the calibration part of the wavemeter, which may further include a plurality of second photodetectors 105. The second photodetector 105 may be a photodiode, similar to the first photodetector 104. The first optical splitter 101 further includes a light inlet for light to be measured, and is used for inputting the light to be measured.

The first optical splitter 101 is further configured to split the input light to be measured to obtain multiple sub-light-to-be-measured lights, where the multiple sub-light-to-be-measured lights include a first sub-light-to-be-measured light and a second sub-light-to-be-measured light. The plurality of sub-beams of light to be detected are parallel beams.

The plurality of sub light to be measured output from the first beam splitter 101 may be output to the first optical path changer 102, and the first optical path changer 102 may change the propagation directions of the first sub light to be measured and the second sub light to be measured; or the first optical path changer 102 may change the traveling direction of the first sub-light to be detected; alternatively, the first optical path changer 102 may change the traveling direction of the second sub-light to be detected.

The first sub light to be measured output from the first optical path converter 102 directly enters the second photodetector 105 without passing through the etalon 103, and the second photodetector 105 converts the received first sub light to be measured into a second electrical signal. The first sub light to be measured is used as reference light of the light to be measured.

The multiple beams of second sub light to be measured output from the first optical path converter 102 enter the etalon 103, and the etalon 103 performs interference processing on the received multiple beams of second sub light to be measured respectively and outputs multiple beams of third sub light to be measured.

The plurality of third sub light to be measured output from the etalon 103 enter different second photodetectors 105, and the second photodetectors 105 convert the received third sub light to be measured into second electrical signals.

These second electrical signals are used to determine the wavelength (the process of determining the wavelength is described later).

It should be noted here that although the photodetectors used for the first sub-measurement light and the second sub-measurement light are both the second photodetector 105, the same second photodetector 105 is not actually used. The calibration light enters the first optical splitter and the light to be measured enters the optical splitter through different light inlets, so that the measurement part of the calibration wavelength timing wavemeter can be normally carried out.

In this way, since only one etalon 103 is used as a wavelength measuring section included in the wavelength meter, the structure of the wavelength meter can be simplified. And the wavelength meter adopts the first light splitter 101 and the first light path converter 102, so that a plurality of beams of second sub light to be measured enter the etalon 103 in different propagation directions, and further a measuring part of the wavelength meter forms a multi-angle etalon 103 (the multi-angle etalon 103 means that a plurality of beams of second sub light to be measured enter the etalon 103 at different incident angles), and the multi-angle etalon 103 formed by the first light splitter 101 and the first light path converter 102 has adjustable light splitting ratios of the beams of light to be measured, and can realize a higher measurable power dynamic range by designing the light splitting ratio of the first light splitter 101. And the wavelength measuring part of the wavelength meter and the calibration part of the wavelength meter adopt the same etalon 103, so that the calibration and the measurement can be carried out simultaneously, namely the wavelength meter is calibrated on line.

Moreover, the wavelength meter uses few devices and has a simple structure. The angle of each light beam output by the first optical path changer 102 is determined by the relative position of the light outlet of the first optical splitter 101 and the first optical path changer 102, and the device and parameters required to be adjusted are few, so that the assembly and debugging are easy. In addition, because the relative position is adjusted, angle adjustment is not needed, and therefore, after the device is fixed, the angle of each light beam is not easy to change, and the structural stability is good. For example, as shown in fig. 3, the light to be measured enters from the light inlet of the first optical splitter 101, is split by the first optical splitter 101 and output to the first optical path changer 102 (such as a collimator array, etc.), and the distance between each beam of the second light to be measured and the optical axis of each collimator in the collimator array is designed, so that the angles of the light emitted by each collimator are different. Δ L1 to Δ L4 correspond to distances of the 4 beams of light to be measured from the optical axis of the collimator corresponding thereto, respectively. The corresponding relation between the outgoing angles theta 01 to theta 04 and delta L1 to delta L4 of each beam of second sub light to be measured is as follows: and tan θ n is Δ Ln/f, where n is 1,2,3, and 4, and corresponds to 4 second sub-light-to-be-detected beams, and f is the focal length of the collimator.

Moreover, the wavelength meter uses few devices, is a mature process device, is low in price, is easy to assemble and debug, and is low in assembly cost and total cost. In addition, the wavelength meter has a compact structure and small volume as a whole due to the fact that the number of devices is small and the size of each device is small.

In a possible implementation manner, the second sub light to be measured may be two beams, and two beams are shown in the structural diagram of the wavelength meter.

In one possible implementation, as shown in fig. 4, the wavelength meter includes a wavelength measuring part, which may use a first optical splitter 101 and a first optical path converter 102 different from the calibration part of the wavelength meter, i.e. a second optical splitter 106 and a second optical path converter 107. The wavemeter may also include a plurality of second photodetectors 105. The second photodetector 105 may be a photodiode, similar to the first photodetector 104.

The second optical splitter 106 is configured to split the input light to be measured to obtain multiple sub-light-to-be-measured lights, where the multiple sub-light-to-be-measured lights include a first sub-light-to-be-measured light and a second sub-light-to-be-measured light.

The plurality of sub light-to-be-measured lights output from the second beam splitter 106 may be output to the second optical path changer 107, and the second optical path changer 107 may change the propagation directions of the first sub light-to-be-measured light and the second sub light-to-be-measured light; or the second optical path changer 107 may change the traveling direction of the first sub-light to be detected; alternatively, the second optical path changer 107 may change the traveling direction of the second sub-light to be detected.

The first sub light to be measured output from the second optical path converter 107 directly enters the second photodetector 105 without passing through the etalon 103, and the second photodetector 105 converts the received first sub light to be measured into a second electrical signal. The first sub light to be measured is used as reference light of the light to be measured.

The plurality of second sub light beams to be measured output from the second optical path converter 107 enter the etalon 103, and the etalon 103 performs interference processing on the received plurality of second sub light beams to be measured respectively and outputs a plurality of third sub light beams to be measured.

The multiple beams of the third sub light to be measured output from the etalon 103 enter different second photodetectors 105, and the second photodetectors 105 convert the received third sub light to be measured into second electrical signals.

In this way, since only one etalon 103 is used as a wavelength measuring section included in the wavelength meter, the structure of the wavelength meter can be simplified. The wavelength meter adopts the second optical splitter 106 and the second optical path converter 107, so that the measuring part of the wavelength meter forms the multi-angle etalon 103, and the multi-angle etalon 103 formed by the second optical splitter 106 and the second optical path converter 107 has adjustable splitting ratio of each beam of light to be measured, and can realize higher measurable power dynamic range by designing the splitting ratio of the second optical splitter 106.

In one possible implementation, corresponding to the wavelength meter shown in fig. 2, as shown in fig. 5, the wavelength meter further includes a linear filter 108 and a third photodetector 109, and the third photodetector 109 may be the same as the first photodetector 104, or may be a photodiode. The plurality of sub-light-to-be-measured lights obtained after the first beam splitter 101 splits the light to be measured further include a fourth sub-light-to-be-measured. Thus, the first optical path changer 102 can also output the fourth sub light to be detected, and enter the linear filter 108. The linear filter 108 performs filtering processing on the received fourth sub light to be measured to obtain a fifth sub light to be measured. The linear filter 108 outputs the fifth sub light to be measured to the third photodetector 109 without passing through the etalon 103. The third photodetector 109 may convert the fifth sub light to be measured into a third electrical signal, which may be used to determine a wavelength position of the wavelength of the light to be measured in a reference transmittance curve corresponding to the light to be measured (described later). Thus, the fourth sub-light to be measured first enters the linear filter 108 and then enters the third photodetector 109 after being output by the first optical path converter 102, without passing through the etalon.

In this way, since the linear filter 108 is used in the wavelength meter, the approximate wavelength position of the wavelength of the light to be measured in the target reference transmittance curve of the light to be measured can be determined by the linear filter 108, and the wavelength meter can be applied to wavelength measurement in a wider range without storing the light to be measured range corresponding to the wavelength meter in advance or inputting the approximate wavelength position of the light to be measured additionally.

In one possible implementation, corresponding to the wavelength meter shown in fig. 4, as shown in fig. 6, the wavelength meter further includes a linear filter 108 and a third photodetector 109, and the third photodetector 109 is the same as the first photodetector 104, and may also be a photodiode. The plurality of sub-lights-to-be-measured obtained after the second beam splitter 106 splits the light-to-be-measured further includes a fourth sub-light-to-be-measured. Thus, the second optical path changer 107 can also output the fourth sub light to be detected, entering the linear filter 108. The linear filter 108 performs filtering processing on the received fourth sub light to be measured to obtain a fifth sub light to be measured. The linear filter 108 outputs the fifth sub light to be measured to the third photodetector 109 without passing through the etalon 103. The third photodetector 109 may convert the fifth sub light to be measured into a third electrical signal, which may be used to determine a wavelength position of the wavelength of the light to be measured in a reference transmittance curve corresponding to the light to be measured (described later).

The linear filter 108 is a frequency-selective device, and the specific filtering process is that the linear filter 108 passes the optical signal with a specific wavelength, and filters the optical signals with the remaining wavelengths.

In a possible implementation manner, corresponding to fig. 2, as shown in fig. 7, the wavelength meter further includes a processor 110, where the processor 110 is electrically connected to the plurality of first photodetectors 104, respectively, and the processor 110 is electrically connected to the plurality of second photodetectors 105, respectively. The processor 110 may calibrate the wavelength meter based on the calibration parameters provided by the plurality of first photo-detectors 104, and the processor 110 is further configured to determine the wavelength of light to be measured based on the first measurement parameters provided by the plurality of second photo-detectors 105. thus, since the wavelength meter further includes the processor 110, the wavelength meter may directly calibrate the reference transmittance curve of light to be measured via the processor 110 and directly determine the wavelength of light to be measured.

In a possible implementation manner, corresponding to fig. 5, as shown in fig. 8, the wavelength meter further includes a processor 110, and the processor 110 is electrically connected to the third photodetector 109.

In one possible implementation, corresponding to fig. 1, the wavelength meter may also be externally connected with a processor 110 for calibrating the reference transmittance curve of the light to be measured and directly determining the wavelength of the light to be measured.

In one possible implementation, the first optical path changer 102 is any one of a collimator array, a convex lens, or a concave lens. The collimator array is composed of a group of lenses, and each light beam entering the first optical path changer 102 enters a different lens.

As shown in fig. 9, if the first optical path changer 102 adopts a lens (convex lens or concave lens), the plurality of second sub light to be measured are respectively output to different positions of the first optical path changer 102, and fig. 9 shows a concave lens, Δ L1 to Δ L4 respectively correspond to the distances of the 4 second sub light to be measured from the optical axis of the concave lens. The corresponding relation between the outgoing angles theta 01 to theta 04 and delta L1 to delta L4 of each beam of second sub light to be measured is as follows: and tan θ n is Δ Ln/f, where n is 1,2,3, and 4, and corresponds to 4 second sub-light-to-be-detected light beams, and f is the focal length of the concave lens.

In one possible implementation, the second optical path changer 107 is any one of a collimator array, a convex lens, or a concave lens. The collimator array is composed of a group of lenses, and each beam of light entering the second optical path changer 102 enters a different lens. As shown in fig. 10, if the second optical path changer 107 employs the collimator array, the 4 second sub-beams to be measured are respectively output to different lenses of the second optical path changer 107. Since the parallel second sub light to be measured enters the lens through different positions of the lens and is refracted by the lens and then exits at different angles, the second optical path changer 107 can change the propagation direction of the parallel 4 beams of second sub light to be measured, and in fig. 10, Δ L1 to Δ L4 respectively correspond to the distances from the optical axes of the corresponding collimators (such as convex lenses, etc.) to the 4 beams of second sub light to be measured. The corresponding relation between the outgoing angles theta 01 to theta 04 and delta L1 to delta L4 of each beam of second sub light to be measured is as follows: and tan θ n is Δ Ln/f, where n is 1,2,3, and 4, and corresponds to 4 second sub-light-to-be-detected beams, and f is the focal length of the collimator.

In one possible implementation, the first beam splitter 101 and the second beam splitter 106 may employ a Planar Light wave Circuit (PLC).

The embodiment of the present application also provides a method for obtaining parameters of a wavelength meter, corresponding to the wavelength meter shown in fig. 1 to 8. As shown in fig. 11, the execution flow of the method may be:

step 1101, splitting an input beam of light to obtain a plurality of sub-beams, wherein the plurality of sub-beams include a first sub-beam and a second sub-beam.

In this embodiment, the wavelength meter may split an input beam of light to obtain a plurality of sub-beams, which include a first sub-beam and a second sub-beam. The multiple sub-beams are parallel beams, so the propagation directions of the multiple sub-beams are the same. This step may be specifically performed by the first beam splitter 101.

Step 1102, converting the first sub-beam into a first electrical signal, and performing interference processing on the second sub-beam to obtain a third sub-beam.

In particular, the conversion of the first sub-beam into the first electrical signal may be performed by the first photodetector 104 and the obtaining of the third sub-beam may be performed by the etalon 103.

Step 1103, converting the third sub-beam into a second electrical signal.

This particular step may be performed by the first photodetector 104.

And 1104, using the voltage values or the current values of the first electric signals and the second electric signals as parameters of the wavelength meter.

This particular step may be performed by the first photodetector 104.

As shown in fig. 12, when the wavelength meter includes the calibration part, the procedure of obtaining the calibration parameters of the wavelength meter includes:

step 1201, splitting the calibration light input each time to obtain a plurality of sub-calibration lights, wherein the plurality of sub-calibration lights include a first sub-calibration light and a second sub-calibration light, and the calibration lights include monochromatic lights with various wavelengths and are input according to a preset sequence.

In this embodiment, the calibration light includes monochromatic lights with multiple wavelengths, and each time the wavelength is input, the calibration light is input according to a preset sequence of the monochromatic lights with multiple wavelengths. Thus, the wavelength meter can obtain the second electric signals of the monochromatic light with different wavelengths according to the preset sequence. For example, the calibration light includes monochromatic lights with four wavelengths of a, b, c, and d, the preset sequence is a, c, b, and d, and in one calibration process, a is input first, c is input again, b is input again, and d is input finally.

The wavelength meter may split the calibration light input each time to obtain a plurality of sub-calibration lights including a first sub-calibration light and a second sub-calibration light. This step may be specifically performed by the first beam splitter 101.

Step 1202, converting the first sub-calibration light into a first electrical signal, and performing interference processing on the second sub-calibration light to obtain a third sub-calibration light.

In this embodiment, the wavelength meter may directly convert the first sub-calibration light into the first electrical signal, and may perform interference processing on the second sub-calibration light to obtain the third sub-calibration light.

In particular, the conversion of the first sub-collimated light into the first electrical signal may be performed by the first photodetector 104, and the obtaining of the third sub-collimated light may be performed by the etalon 103.

Step 1203, converting the third sub-calibration light into a second electrical signal.

This particular step may be performed by the first photodetector 104.

And 1204, taking the voltage value or the current value of the first electric signal and the second electric signal as a calibration parameter of the wavelength meter.

The calibration parameters of the wavelength meter may be used to calibrate the wavelength meter (described later), and this step may be specifically performed by the first photodetector 104.

Thus, the calibration portion of the wavelength meter may provide the processor 110 with calibration parameters for the processor 110 to calibrate the wavelength meter based on the calibration parameters.

It should be noted here that the light source of the calibration light may output monochromatic light with different wavelengths according to a preset sequence, and the calibration parameters include transmission information of the monochromatic light with different wavelengths passing through the etalon, so that the current calibration transmittance curve may be determined based on the calibration parameters subsequently.

In addition, in the flow of the calibration part of the wavelength meter shown in fig. 12, in the present embodiment, there is also provided a flow of the measurement part of the wavelength meter, as shown in fig. 13, the execution flow may be as follows:

step 1301, splitting the input light to be measured to obtain multiple beams of sub light to be measured, wherein the multiple beams of sub light to be measured include a first sub light to be measured and a second sub light to be measured.

In this embodiment, in an optical communication system, when an optical module (a receiving end, a transmitting end, etc.) needs to measure a wavelength of a light beam (hereinafter referred to as light to be measured), the light to be measured may be input to a wavelength meter. The wavelength meter may split the input light to be measured to obtain a plurality of sub-lights to be measured, where the plurality of sub-lights to be measured include a first sub-light to be measured and a second sub-light to be measured.

Step 1302, converting the first sub light to be measured into a first electrical signal, and performing interference processing on the plurality of second sub light to be measured respectively to obtain a plurality of third sub light to be measured.

In this embodiment, the wavelength meter may directly convert the first sub light to be measured into the first electrical signal, and may perform interference processing on the second sub light to be measured to obtain a plurality of third sub light to be measured.

Specifically, the conversion of the first sub light to be measured into the first electrical signal may be performed by the second photodetector 105, and the obtaining of the third sub light to be measured may be performed by the etalon 103.

And step 1303, respectively converting the multiple third sub light to be measured into second electrical signals.

This step in particular may be performed by the second photodetector 105.

In step 1304, the voltage values or the current values of the first electrical signal and the second electrical signal are used as the first measurement parameters of the wavelength meter.

Wherein the first measurement parameter of the wavelength meter may be used for determining the wavelength of the light to be measured (described later), this particular step may be performed by the second photodetector 105.

Thus, the calibration portion of the wavelength meter may provide the processor 110 with the first measurement parameter for the processor 110 to determine the wavelength of light to be measured based on the first measurement parameter.

In a possible implementation manner, the measurement parameters of the wavelength meter may further include a second measurement parameter (the second measurement parameter is used to determine a wavelength position of the light to be measured in the reference transmittance curve of the light to be measured), and the process of obtaining the second measurement parameter is as follows:

after the wavelength meter divides light to be measured, the obtained multi-beam light to be measured also comprises a fourth sub light to be measured. The wavelength meter can perform filtering processing on the fourth sub light to be measured to obtain a fifth sub light to be measured. And then the wavelength meter converts the fifth sub light to be measured into a third electric signal, and determines the voltage value or the current value of the third electric signal as a second measurement parameter.

In this way, the subsequent processor 110 may determine the wavelength position of the wavelength of the light to be measured in the target reference transmittance curve corresponding to the light to be measured by using the second measurement parameter, without storing the range of the light to be measured corresponding to the wavelength meter in advance, or inputting the approximate wavelength position of the light to be measured additionally, so that the wavelength meter may be suitable for measuring wavelengths in a wider range.

The measurement portion of the wavemeter in the above-mentioned flow of fig. 13 may use the same optical splitter and optical path converter as the calibration portion, and of course, the measurement portion of the wavemeter may use a different optical splitter and optical path converter from the calibration portion.

In the embodiment of the present application, as shown in fig. 14, a process of the processor 110 calibrating the wavemeter on line based on the calibration parameter is further provided:

in step 1401, a transmittance curve corresponding to the calibration light is determined according to the calibration parameters obtained from each of the first photodetectors 104.

The transmittance curve may be expressed in a rectangular coordinate system, with the horizontal axis representing the wavelength and the vertical axis representing the transmittance.

In the present embodiment, the processor 110 determines a ratio of a voltage value of the first electrical signal provided by the first photodetector 104 into which the third sub-calibration light outputted from the etalon enters and a voltage value of the electrical signal provided by the first photodetector 104 detecting the reference light (i.e., the first sub-calibration light) of the calibration light, and obtains a transmittance of the second sub-calibration light through the etalon. The light source of the calibration light can output monochromatic light with various wavelengths, and the monochromatic light with various wavelengths is output each time according to a preset sequence. Thus, the first electrical signal detected by the first photodetector 104 at each time is an electrical signal corresponding to monochromatic light of one wavelength, the processor 110 may obtain a stored preset sequence of the calibration light, and determine, based on the preset sequence, a wavelength corresponding to the first electrical signal provided by the first photodetector 104 at each time, and then may determine the transmittance of the monochromatic light of each wavelength through the etalon 103, and further may determine a transmittance curve of the calibration light.

Here, one transmittance curve may be determined if the second sub-calibration light passing through the etalon is one beam at a time, and a plurality of transmittance curves having different incident angles may be determined if the second sub-calibration light passing through the etalon is a plurality of beams at a time. Only one transmittance curve may be used in the present application. The voltage value of the first electric signal is used, but it is needless to say that the current value of the first electric signal may be used.

Step 1402, determining an adjustment parameter of the wavelength meter according to the transmittance curve corresponding to the calibration light and the reference transmittance curve corresponding to the calibration light.

Wherein the reference transmittance curve is a pre-stored transmittance curve. The reference transmittance curve is a transmittance curve measured using calibration light before the wavelength meter is shipped. Alternatively, the reference transmittance curve is a reference transmittance curve obtained by calibrating the reference transmittance curve corresponding to the calibration light last time.

In this embodiment, if a transmittance curve is determined in step 1401, the processor 110 may compare the transmittance curve corresponding to the calibration light with the reference transmittance curve corresponding to the calibration light to obtain the adjustment parameter of the wavelength meter. In step 1401, a plurality of transmittance curves are determined, and the processor 110 may compare the transmittance curve corresponding to the calibration light and the reference transmittance curve corresponding to the calibration light only at the same incident angle (the incident angle of the incident etalon) to obtain the adjustment parameter of the wavelength meter.

In one possible implementation, the adjustment parameter may be determined as follows:

and if the minimum transmittance in the transmittance curve corresponding to the calibration light is different from the minimum transmittance in the reference transmittance curve corresponding to the calibration light, determining the reflectance of the standard in the adjustment parameter of the wavelength meter according to the minimum transmittance in the transmittance curve corresponding to the calibration light. And if the free spectral region of the transmissivity curve corresponding to the calibration light is different from the free spectral region of the reference transmissivity curve corresponding to the calibration light, determining the refractive index of the standard in the adjustment parameters of the wavelength meter according to the free spectral region of the transmissivity curve corresponding to the calibration light.

In this embodiment, the processor 110 may obtain the minimum transmittance of the transmittance curve corresponding to the calibration light and the minimum transmittance of the reference transmittance curve corresponding to the calibration light, and then may determine whether the minimum transmittances of the transmittance curve corresponding to the calibration light and the reference transmittance curve corresponding to the calibration light are the same. When the two minimum transmittances are not the same, the processor 110 may determine the reflectivity of the standard 103 in the adjustment parameters of the wavelength meter according to the minimum transmittance in the transmittance curve corresponding to the calibration light. Specifically, formula (1) may be adopted:

wherein, in the formula (1), R represents the reflectance of the etalon 103, TF_minThe minimum transmittance in the transmittance curve corresponding to the calibration light is indicated.

The processor 110 may obtain a free spectral region of the transmittance curve corresponding to the calibration light and a free spectral region of the reference transmittance curve corresponding to the calibration light, and then may determine whether the transmittance curve corresponding to the calibration light and the free spectral region of the reference transmittance curve corresponding to the calibration light are the same. When the two free spectral regions are not the same, the processor 110 can determine the index of refraction of the standard in the tuning parameters of the wavemeter based on the free spectral region in the transmittance curve corresponding to the calibration light. Specifically, formula (2) may be adopted:

in formula (2), n is the refractive index of the etalon 103, c is the light velocity, FSR is the free spectral range of the transmittance curve (i.e., the period of the transmittance curve) corresponding to the current calibration light, l is the cavity length of the etalon 103, and θ is the angle between the light inside the etalon 103 and the normal of the end face of the etalon 103.

And 1403, correcting the reference transmittance curve corresponding to the light to be measured according to the adjustment parameters to obtain a target reference transmittance curve corresponding to the light to be measured.

The reference transmittance curve corresponding to the light to be measured may be a transmittance curve corresponding to each incident angle of the etalon 103, which is obtained by measuring the wavelength of the monochromatic light with multiple wavelengths incident on the wavelength meter before the wavelength meter leaves the factory. Or, the reference transmittance curve corresponding to the light to be measured is a target reference transmittance curve obtained by calibrating the reference transmittance curve of the light to be measured last time.

In this embodiment, the processor 110 may obtain a reference transmittance curve corresponding to the to-be-measured light stored in advance, and then may correct the reference transmittance curve corresponding to the to-be-measured light by using the adjustment parameter, so as to obtain a target reference transmittance curve corresponding to the to-be-measured light.

Here, since the light to be measured entering the etalon 103 is a plurality of beams (it can be considered that the light to be measured having a plurality of incident angles enters the etalon 103) and one transmittance curve is associated with each beam, the target reference transmittance curve corresponding to the light to be measured which is finally determined is a plurality of beams.

In one possible implementation manner, in step 1403, a target reference transmittance curve corresponding to the light to be measured can be obtained by using the following method:

and obtaining a target reference transmittance curve corresponding to the light to be measured according to the reflectance, the refractive index and a transmittance curve formula of the reference transmittance curve corresponding to the light to be measured.

In this embodiment, the transmittance curve formula of the reference transmittance curve corresponding to the light to be measured is as follows:

wherein, TF (λ) is the transmittance at the wavelength λ, λ is the wavelength on the reference transmittance curve corresponding to the light to be measured, R is the reflectivity of the etalon 103, n is the refractive index of the etalon 103, π is the circumferential index, l is the cavity length of the etalon 103, and θ is the angle between the light inside the etalon 103 and the normal of the end face of the etalon 103.

In this way, by substituting n in the formula (2) and R in the formula (1) into the formula (3), the target reference transmittance curve corresponding to the light to be measured can be obtained.

The subsequent wavelength meter determines the transmittance using the second electrical signal provided by the second photodetector 105 when determining the wavelength of light to be measured. The processor 110 may then determine a wavelength corresponding to the transmittance in the target reference transmittance curve, that is, the wavelength of the light to be measured.

It should be noted that, if the reference transmittance curve corresponding to the calibration light is the reference transmittance curve at the time of factory shipment, the reference transmittance curve corresponding to the light to be measured is also the reference transmittance curve at the time of factory shipment; if the reference transmittance curve corresponding to the calibration light is the reference transmittance curve after the last correction, the reference transmittance curve corresponding to the light to be measured is also the target reference transmittance curve after the last correction.

In one possible implementation, the wavelength of light to be detected may be determined as follows:

determining the transmittance of the light to be measured passing through the etalon according to the first measurement parameter obtained from each second photodetector 105; according to the first measurement parameter and the second measurement parameter obtained from the third photodetector 109, in the target reference transmittance curve, the wavelength position corresponding to the wavelength of the light to be measured is determined; and determining the wavelength of the light to be measured according to the wavelength position, the transmittance and the target reference transmittance curve.

In this embodiment, the processor 110 determines a ratio of a voltage value of the second electrical signal provided by the second photodetector 105, into which the third sub light to be measured output by the etalon enters, to a voltage value of the second electrical signal provided by the second photodetector 105, which detects the reference light (i.e., the first sub light to be measured) of the light to be measured, and obtains the transmittance of the light to be measured through the etalon. Since a plurality of beams of the second sub light to be measured enter the etalon, a plurality of transmittances can be obtained.

The processor 110 may determine a ratio of a voltage value of the third electrical signal (i.e., the second measurement parameter) provided by the third photodetector 109 to a voltage value of the second electrical signal provided by the second photodetector 105 detecting the reference light (i.e., the first sub-light to be detected) of the light to be detected, and obtain the transmittance of the light to be detected through the linear filter 108. The processor 110 then determines the wavelength location of the wavelength corresponding to the transmittance in the transmittance curve corresponding to the linear filter.

The processor 110 may then determine the wavelength of light to be detected using the wavelength position, the transmittance, and the target reference transmittance curve.

The voltage values of the second electrical signal and the third electrical signal are used, but it is needless to say that the current values of the second electrical signal and the third electrical signal may be used.

In one possible implementation, using the wavelength position, the transmittance and the target reference transmittance curve, the wavelength of the light to be measured is determined in such a way that:

the processor 110 can select a free spectral region to which the wavelength position belongs from a target reference transmittance curve corresponding to the light to be measured. Then, in the selected free spectral region, a target reference transmittance curve with the highest slope at the wavelength position is obtained. In the target reference transmittance curve, a wavelength corresponding to a transmittance (the transmittance is a transmittance of the light to be measured having the same etalon incident angle as the selected target reference transmittance curve) is selected and determined as a wavelength of the light to be measured. In this way, since the free spectral range can be selected by using the approximate wavelength position of the light to be measured, the wavelength of the light to be measured can be directly selected in the free spectral range, the light to be measured range corresponding to the wavelength meter does not need to be stored in advance, the approximate wavelength position of the light to be measured does not need to be input additionally, and the wavelength meter can be suitable for measuring the wavelength in a wider range.

In one possible implementation, the processor 110 may further substitute the reflectivity and the refractive index in the adjustment parameter into a transmittance curve formula of a reference transmittance curve corresponding to the calibration light to obtain a modified reference transmittance curve corresponding to the calibration light. Thus, a corrected reference transmittance curve corresponding to the calibration light can be determined by the transmittance curve formula, and then the corrected reference transmittance curve can be used for next calibration of the wavelength meter. Of course, when the reference transmittance curve of the calibration light corrected this time is used for calibrating the reference transmittance curve of the light to be measured next time, the target reference transmittance curve of the light to be measured after the reference transmittance curve of the light to be measured is calibrated this time is also used.

It should be noted that, the processor 110 determines the wavelength of the light to be detected, and the processor 110 may be the processor 110 of the wavelength meter or may be the processor 110 externally connected to the wavelength meter, which is not limited in the embodiment of the present application.

In addition, the embodiment of the present application also provides a wavelength meter, which includes a wavelength measuring portion, specifically, as shown in fig. 15, the wavelength meter includes a first optical splitter 101, a first optical path converter 102, an etalon 103, and a plurality of first photodetectors 104. The first photodetector 104 may be a photodiode. The first optical splitter 101 further includes a light inlet for light to be measured, and is used for inputting the light to be measured.

The first optical splitter 101 is configured to split the input light to be measured to obtain multiple sub-light-to-be-measured lights, where the multiple sub-light-to-be-measured lights include a first sub-light-to-be-measured light and a second sub-light-to-be-measured light.

The first sub light to be measured output from the first optical path converter 102 directly enters the first photodetector 104 without passing through the etalon 103, and the first photodetector 104 converts the received first sub light to be measured into a first electrical signal. The first sub light to be measured is used as reference light of the light to be measured.

The multiple beams of second sub light to be measured output from the first optical path converter 102 enter the etalon 103 in different propagation directions (i.e., different incident angles), and the etalon 103 performs interference processing on the received multiple beams of second sub light to be measured respectively to output multiple beams of third sub light to be measured.

A plurality of third sub light to be measured output from the etalon 103 enter different first photodetectors 104, and the first photodetectors 104 convert the received third sub light to be measured into first electrical signals.

The plurality of first electrical signals are used to determine the wavelength (the process of determining the wavelength is described above).

It should be noted here that although the photodetectors used for the first sub-measurement light and the second sub-measurement light are both the first photodetector 104, the same first photodetector 104 is not actually used.

In this way, since only one etalon 103 is used as a wavelength measuring section included in the wavelength meter, the structure of the wavelength meter can be simplified. The wavelength meter adopts the first optical splitter 101 and the first optical path converter 102, so that the measuring part of the wavelength meter forms the multi-angle etalon 103, and the multi-angle etalon 103 formed by the first optical splitter 101 and the first optical path converter 102 has adjustable splitting ratio of each beam of light to be measured, and can realize higher measurable power dynamic range by designing the splitting ratio of the first optical splitter 101.

In a possible implementation manner, on the basis of fig. 15, a calibration part of the wavelength meter may be further added, and the calibration part may be the same as the description of fig. 1, and the structure diagram is shown in fig. 2, and is not described again here.

In a possible implementation manner, a calibration part of a wavelength meter may be added on the basis of fig. 15, the calibration part is different from the first optical splitter 101 and the first optical path converter 102 used in fig. 15, and the structure diagram is similar to fig. 4 and is not described again here.

In a possible implementation, on the basis of fig. 15, as shown in fig. 16, the wavelength meter further includes a linear filter 108 and a second photodetector 105, which may also be a photodiode. The multiple sub-light-to-be-detected lights split by the first splitter 101 further include a fourth sub-light-to-be-detected light. The linear filter 108 may perform filtering processing on the fourth sub light to be measured to obtain a fifth sub light to be measured, and the second photodetector 105 may convert the fifth sub light to be measured into a second electrical signal, where the second electrical signal is used to determine a wavelength position of a wavelength of the light to be measured in a reference transmittance curve corresponding to the light to be measured.

In fig. 15 and 16, the first beam splitter 101 may be a PLC, and the first optical path changer 102 may be any one of a convex lens, a collimator array, and a concave lens.

Fig. 17 is a block diagram of an apparatus for online calibration according to an embodiment of the present application. The apparatus may be implemented as part or all of an apparatus in software, hardware, or a combination of both. The apparatus provided in the embodiment of the present application may implement the process described in fig. 14 in the embodiment of the present application, and the apparatus includes: determining module 1710 and modifying module 1720, wherein:

a determining module 1710, configured to determine a transmittance curve corresponding to the calibration light according to the calibration parameter obtained from each first photodetector; determining an adjustment parameter of the wavelength meter according to the transmittance curve corresponding to the calibration light and the reference transmittance curve corresponding to the calibration light; the method can be specifically used for realizing the determination functions of step 1401 and step 1402 and the implicit steps included in step 1401 and step 1402.

The correcting module 1720 is configured to correct a reference transmittance curve corresponding to the light to be measured according to the adjustment parameter, so as to obtain a target reference transmittance curve corresponding to the light to be measured. It can be specifically used to implement the correction function of step 143 and the implicit steps included in step 1403.

In one possible implementation, the determining module 1710 is configured to:

In one possible implementation, the modification module 1720 is configured to:

In a possible implementation manner, the determining module 1710 is further configured to determine, according to the first measurement parameter obtained from each second photodetector, a transmittance of the light to be measured passing through the etalon; according to the first measurement parameter and a second measurement parameter obtained from a third photoelectric detector, determining a wavelength position corresponding to the wavelength of the light to be measured in the target reference transmittance curve; and determining the wavelength of the light to be detected according to the wavelength position, the transmittance and the target reference transmittance curve.

The division of the modules in the embodiments of the present application is illustrative, and is only a logical function division, and in actual implementation, there may be another division manner, and in addition, each functional module in each embodiment of the present application may be integrated in one processor, may also exist alone physically, or may also be integrated in one module by two or more modules. The integrated module can be realized in a hardware mode, and can also be realized in a software functional module mode.

In the above embodiments, all or part of the implementation may be realized by software, hardware, firmware or any combination thereof, and when the implementation is realized by software, all or part of the implementation may be realized in the form of a computer program product. The computer program product comprises one or more computer program instructions which, when loaded and executed on a server or terminal, cause the processes or functions described in accordance with embodiments of the application to be performed, in whole or in part. The computer instructions may be stored in a computer readable storage medium or transmitted from one computer readable storage medium to another, for example, the computer instructions may be transmitted from one website, computer, server, or data center to another website, computer, server, or data center by wire (e.g., coaxial cable, fiber optics, digital subscriber line) or wirelessly (e.g., infrared, wireless, microwave, etc.). The computer readable storage medium can be any available medium that can be accessed by a server or a terminal or a data storage device, such as a server, a data center, etc., that incorporates one or more of the available media. The usable medium may be a magnetic medium (such as a floppy Disk, a hard Disk, a magnetic tape, etc.), an optical medium (such as a Digital Video Disk (DVD), etc.), or a semiconductor medium (such as a solid state Disk, etc.).

Claims

1. A wavemeter, comprising a first beam splitter, a first optical path transformer, an etalon, and a plurality of first photodetectors;

the first optical splitter is used for splitting the input calibration light to obtain a plurality of sub-calibration lights, wherein the plurality of sub-calibration lights comprise a first sub-calibration light and a second sub-calibration light;

the first optical path converter is used for changing the propagation direction of the first sub-calibration light and/or the second sub-calibration light so that the first sub-calibration light enters the first photoelectric detector and the second sub-calibration light enters the etalon;

the etalon is used for performing interference processing on the second sub-calibration light to obtain third sub-calibration light;

the plurality of first photodetectors are configured to convert the received first sub-calibration light or the third sub-calibration light into a plurality of first electrical signals, which are used to calibrate the wavelength meter.

2. The wavemeter according to claim 1, further comprising a plurality of second photodetectors;

the first light splitter is further configured to split the input light to be measured to obtain a plurality of sub light to be measured, where the plurality of sub light to be measured includes a first sub light to be measured and a plurality of second sub light to be measured;

the first optical path converter is further configured to change a propagation direction of the first sub light to be measured and/or the second sub light to be measured;

the etalon is also used for respectively carrying out interference processing on the multiple second sub light to be measured to obtain multiple third sub light to be measured;

the second photoelectric detectors are used for converting the received first sub-light to be measured or the third sub-light to be measured into second electric signals, and the second electric signals are used for determining the wavelength of the light to be measured.

3. The wavemeter according to claim 2, further comprising a linear filter and a third photodetector;

the multi-beam sub light to be measured further includes a fourth sub light to be measured;

the linear filter is used for filtering the received fourth sub light to be detected to obtain a fifth sub light to be detected;

the third photoelectric detector is used for converting the fifth sub light to be measured into a third electric signal, and the third electric signal is used for determining the wavelength position of the light to be measured in a reference transmittance curve corresponding to the light to be measured.

4. The wavemeter according to claim 2 or 3, characterized in that it further comprises a processor;

the processor is electrically connected with the plurality of first photoelectric detectors;

the processor is electrically connected with the plurality of second photoelectric detectors;

the processor is used for calibrating the wavelength meter according to the calibration parameters provided by the plurality of first photodetectors, and the processor is further used for determining the wavelength of the light to be measured according to the first measurement parameters provided by the plurality of second photodetectors.

5. A method of obtaining a parameter of a wavemeter, for use in a wavemeter, the method comprising:

splitting an input beam of light to obtain a plurality of sub-beams, wherein the plurality of sub-beams comprise a first sub-beam and a second sub-beam;

converting the first sub-beam into a first electric signal, and performing interference processing on the second sub-beam to obtain a third sub-beam;

converting the third sub-beam into a second electrical signal;

and taking the voltage value or the current value of the first electric signal and the second electric signal as the parameter of the wavelength meter.

6. The method of claim 5, wherein the parameter of the wavemeter is a calibration parameter, the calibration parameter being used to calibrate the wavemeter;

the splitting of the input beam of light to obtain a plurality of sub-beams comprises: splitting the calibration light input each time to obtain a plurality of sub-calibration lights, wherein the plurality of sub-calibration lights comprise a first sub-calibration light and a second sub-calibration light, the calibration lights comprise monochromatic lights with various wavelengths, and the calibration lights are input according to a preset sequence;

the converting the first sub-beam into a first electrical signal and performing interference processing on the second sub-beam to obtain a third sub-beam includes: converting the first sub-calibration light into a first electric signal, and performing interference processing on the second sub-calibration light to obtain a third sub-calibration light;

said converting said third sub-beam into a second electrical signal comprises: converting the third sub-calibration light into a second electrical signal.

7. The method according to claim 5, wherein the parameter of the wavemeter is a first measurement parameter, which is used to determine the wavelength of light to be measured;

the splitting of the input beam of light to obtain a plurality of sub-beams comprises: splitting the input light to be measured to obtain a plurality of sub light to be measured, wherein the plurality of sub light to be measured comprise a first sub light to be measured and a plurality of second sub light to be measured;

the converting the first sub-beam into a first electrical signal and performing interference processing on the second sub-beam to obtain a third sub-beam includes: converting the first sub light to be measured into a first electric signal, and respectively carrying out interference processing on the multiple second sub light to be measured to obtain multiple third sub light to be measured;

said converting said third sub-beam into a second electrical signal comprises: and respectively converting the multiple third sub light to be measured into second electric signals.

8. The method of claim 7, wherein the plurality of beams of sub-light-to-be-detected further comprises a fourth sub-light-to-be-detected;

the method further comprises the following steps:

filtering the fourth sub light to be detected to obtain a fifth sub light to be detected;

converting the fifth sub light to be measured into a third electric signal;

and determining a voltage value or a current value of the third electric signal as a second measurement parameter, wherein the second measurement parameter is used for determining a wavelength position of the light to be measured in a reference transmittance curve of the light to be measured.

9. A method of on-line calibration, applied to the wavemeter of any of claims 1 to 4, the method comprising:

determining a transmittance curve corresponding to the calibration light according to the calibration parameters obtained from each first photodetector;

determining an adjustment parameter of the wavelength meter according to the transmittance curve corresponding to the calibration light and the reference transmittance curve corresponding to the calibration light;

and correcting a reference transmittance curve corresponding to the light to be measured according to the adjustment parameter to obtain a target reference transmittance curve corresponding to the light to be measured.

10. The method of claim 9, wherein determining the adjustment parameter for the wavemeter based on the transmittance curve for the calibration light and the reference transmittance curve for the calibration light comprises:

11. The method according to claim 10, wherein the correcting a reference transmittance curve corresponding to light to be measured according to the adjustment parameter to obtain a target reference transmittance curve corresponding to the light to be measured includes:

12. The method according to any one of claims 9 to 11, further comprising:

determining the transmissivity of the light to be measured passing through the etalon according to the first measurement parameters obtained from each second photoelectric detector;

according to the first measurement parameter and a second measurement parameter obtained from a third photoelectric detector, determining a wavelength position corresponding to the wavelength of the light to be measured in a transmittance curve corresponding to the linear filter;

and determining the wavelength of the light to be detected according to the wavelength position, the transmittance and the target reference transmittance curve.

13. A wavemeter, comprising a first beam splitter, a first optical path transformer, an etalon, and a plurality of first photodetectors;

the first light splitter is used for splitting input light to be measured to obtain a plurality of sub light to be measured, wherein the plurality of sub light to be measured comprise a first sub light to be measured and a plurality of second sub light to be measured;

the first optical path converter is used for changing the propagation direction of the first sub light to be detected and/or the second sub light to be detected, so that the first sub light to be detected enters the first photoelectric detector, and the plurality of beams of second sub light to be detected enter the etalon;

the etalon is used for respectively carrying out interference processing on the multiple second sub light to be measured to obtain multiple third sub light to be measured;

the second photoelectric detectors are used for converting the received first sub-light to be measured or the third sub-light to be measured into first electric signals, and the first electric signals are used for determining the wavelength of the light to be measured.

14. The wavemeter according to claim 13, further comprising a linear filter and a second photodetector;

the second photoelectric detector is used for converting the fifth sub light to be measured into a second electric signal, and the second electric signal is used for determining the wavelength position of the light to be measured in a reference transmittance curve corresponding to the light to be measured.

15. A computing device, comprising a processor and a memory, wherein:

the memory having stored therein computer instructions;

the processor executes the computer instructions to implement the method of online calibration of any of claims 9 to 12.