CN110967120B - High-precision laser wavelength measuring instrument based on slope filter - Google Patents
High-precision laser wavelength measuring instrument based on slope filter Download PDFInfo
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Abstract
The invention provides a high-precision laser wavelength measuring instrument based on a slope filter.A fiber flange is used for connecting a measured light source and the laser wavelength measuring instrument, so that the measured light source is accessed to the laser wavelength measuring instrument through the fiber flange; the optical attenuator is connected to the other end of the optical fiber flange plate, the narrow line width light source is connected with the optical attenuator through the coupler, and enters the slope filter through the isolator and the gain flattening filter; the waveform of the optical signal is flat after passing through a gain flattening filter; after passing through the slope filter, the optical power of the light with different wavelengths changes, and the light is converted into an electric signal by the wavelength monitoring component to be output; and calculating real-time wavelength and corresponding parameters through data acquisition and AD conversion, comparing the real-time wavelength and the corresponding parameters with the standard wavelength and the corresponding parameters recorded by the wavelength calibration light source, and calculating and reading the real-time light wavelength value output by the laser to be detected according to the real-time wavelength value.
Description
Technical Field
The invention relates to the technical field of optical measurement, in particular to a high-precision laser wavelength measuring method based on a slope filter.
Background
The optical wavelength measurement technology has important application in the fields of high-speed optical communication, optical fiber sensing, metering science, basic research and the like. Most of the existing optical wavelength measuring systems are made based on the classical optical interference or diffraction principle. For example, a spectrometer based on the michelson interference principle, which is the main stream, calibrates the wavelength of light to be measured by comparing the input wavelength with an internal reference standard wavelength. Such wavemeters are characterized by high measurement accuracy, but require a high stroke of the moving parts, e.g. up to 10-6On the order of magnitude of accuracy, the stroke of the moving part is about 15mm for a 633nm wavelength, and therefore it is not suitable for use in a working environment susceptible to mechanical vibrations. For another example, a laser wavelength meter based on Fizeau interference has a high difficulty in optical tuning and optical path alignment due to the fact that its optical system requires more optical elements to be coupled, and the period and phase of its interference pattern are measured by digitally filtering the electrical signal output from the photodetector to find the zero position of the interference fringe, so as to determine the period and phase of the interference patternAnd calculating to obtain the wavelength of the laser to be measured. Therefore, the measuring speed is only 2-3 times/second, and the application of the wavelength meter in the rapid real-time measurement control is limited. In addition, the laser wavelength monitoring device based on the etalon roughly adjusts the output wavelength of the laser according to the theoretical control gain medium temperature, adjusts the temperature of the etalon to be set temperature, and obtains the output laser wavelength according to the etalon transmission efficiency. Since the free spectral range of the etalon is narrow, it is necessary to specify within which free spectral range of the etalon the output wavelength falls. The optical fiber type laser wavelength meter is manufactured based on the photoelectric couple effect of the Fe transparent hollow cathode lamp, the precision of the calibrated wavelength can reach 0.01pm, but the wavelength measuring device comprises a grating monochromator, a high-sensitivity CCD (charge coupled device) light receiver, a wavelength calibrating device, a wavelength precision measuring device and the like, so the structure is relatively complex, and the cost is higher. In addition, in a wavemeter using a diffraction grating and a CMOS (or CCD) matrix photoreceiver, although there is no moving part, since the CMOS matrix as the receiver is expensive and the resolution of the light wave is affected by the density of the matrix arrangement, the wavemeter with higher accuracy is more expensive. Generally, the existing wavelength measuring instruments are generally in the current situation that the accuracy is high and the price is high, or the size is large and the carrying is inconvenient, and the wavelength measuring instruments with high accuracy, low cost and light size are reported.
Disclosure of Invention
The invention aims to provide a high-precision laser wavelength measuring instrument based on a slope filter, which has the characteristics of high precision, small volume, simple structure, low cost and the like and is mainly used for measuring the wavelength of a C-band (1528 nm-1565 nm) laser in real time.
The technical scheme adopted by the invention for solving the technical problems is as follows: a ramp filter based high precision laser wavelength meter comprising: the device comprises an optical fiber flange plate, an optical attenuator, a narrow linewidth light source, a coupler, an isolator, a gain flattening filter and a wavelength monitoring component; the wavelength monitoring component is formed by connecting a slope filter and a photoelectric detector.
The optical fiber flange is used for connecting a detected light source and the laser wavelength measuring instrument, so that the detected light source is connected to the laser wavelength measuring instrument through the optical fiber flange; the optical attenuator is connected to the other end of the optical fiber flange plate, and the narrow-linewidth light source is connected with the optical attenuator through the coupler and enters the slope filter through the isolator and the gain flattening filter;
the waveform of the optical signal is flat after passing through a gain flattening filter; after passing through the slope filter, the optical power of the light with different wavelengths changes, and the light is converted into an electric signal by the wavelength monitoring component to be output; and calculating real-time wavelength and corresponding parameters through data acquisition and AD conversion, comparing the real-time wavelength and the corresponding parameters with the standard wavelength and the corresponding parameters recorded by the wavelength calibration light source, and calculating and reading the real-time light wavelength value output by the laser to be detected according to the real-time wavelength value.
In a preferred embodiment: the narrow linewidth light source is used for calibrating a wavelength measuring instrument, the central wavelength of the narrow linewidth light source is 1550nm, and the linewidth is in KHz magnitude.
In a preferred embodiment: the bandwidth of the gain flattening filter covers the C wave band of optical fiber communication.
In a preferred embodiment: the bandwidth of the ramp filter covers the C-band of optical fiber communication.
In a preferred embodiment: when the wavelength measuring instrument does not need calibration, the narrow linewidth light source is in a closed non-working state; when the wavelength measuring instrument needs calibration, the instrument is operated under the condition that a measured light source is not accessed.
In a preferred embodiment: the optical signal emitted by the narrow-linewidth light source is received by the wavelength monitoring component, converted into an electric signal through the slope filter and the photoelectric detector, calculated and read a real-time optical wavelength value, compared with a preset standard wavelength, and when the deviation between the optical wavelength value and the preset standard wavelength is greater than a preset deviation threshold value, a compensation parameter is calculated and data compensation is carried out on the wavelength monitoring component;
and repeating the process, and measuring the real-time wavelength of the calibration light source again until the deviation is less than the preset deviation threshold value of the measuring instrument, thereby indicating that the calibration of the measuring instrument is finished.
Compared with the prior art, the invention has the beneficial effects that:
1. the simple and low-cost slope filter is used as a core element of the laser wavelength monitoring assembly, the measurement precision can reach the pm magnitude, the measurement range can cover the whole optical communication C wave band, and the slope filter is simple in structure, easy to implement and low in cost.
2. The 1550nm narrow line width light source is adopted as the calibration light source of the wavelength measuring instrument, so that the calibration precision can be ensured, and the measurement precision of the instrument is kept in the pm magnitude.
3. The gain flattening filter is adopted, so that the light input to the wavelength monitoring component has good flatness in the whole wave band, and the accuracy of wavelength measurement is improved.
Drawings
Fig. 1 is a schematic diagram of the present invention.
Detailed Description
The invention is further explained in detail with the accompanying drawings and the embodiments; however, the high-precision laser wavelength measuring instrument based on the ramp filter of the present invention is not limited to this embodiment.
Example 1
Referring to fig. 1, the invention relates to a high-precision laser wavelength measuring instrument based on a ramp filter, comprising: the device comprises an optical fiber flange 2, an optical attenuator 3, a 1550nm narrow line width light source 4, a coupler 5, an isolator 6, a gain flattening filter 7 and a wavelength monitoring component 8; the wavelength monitoring component 8 is formed by connecting a ramp filter 801 and a photodetector 802.
The method comprises the steps that a detected light source 1 is connected to a laser wavelength measuring instrument through an optical fiber flange 2, an optical attenuator 3 is connected to the optical fiber flange 2 in the laser wavelength measuring instrument at first, the optical power of the detected light source 1 is properly attenuated, the optical power input to the wavelength measuring instrument is guaranteed to be in a reasonable range, and the wavelength measuring instrument is prevented from being damaged due to too large input optical power.
The optical signal of the measured light source 1 is transmitted to the wavelength monitoring component 8 through the optical attenuator 3, the coupler 5, the isolator 6 and the gain flattening filter 7. The isolator 6 is used for preventing the echo in the optical path from causing interference and damage to the 1550nm narrow linewidth calibration light source 4 and the measured light source 1. The bandwidth of the gain flattening filter 7 covers the C-band (1528 nm-1565 nm) of optical fiber communication, which is about 40nm, so that the light input from the light source 1 to the wavelength monitoring component 8 has good flatness in the whole band, thereby improving the accuracy of wavelength measurement.
The specific explanation for monitoring the laser wavelength with the ramp filter is as follows: the wavelength monitoring component 8 is used for receiving and monitoring the wavelength of the detected light source 1. The bandwidth of the ramp filter 801 covers the C-band (1528 nm-1565 nm) of fiber-optic communication, which is about 40nm, so that the optical signal input to the wavelength monitoring component is included in the bandwidth of the ramp filter 801. The optical signal is flat in waveform after passing through the gain flattening filter 7, and the optical power of the light with different wavelengths is almost the same. After passing through the ramp filter 801, the optical power of the light with different wavelengths changes, and the light is converted into an electrical signal by the photodetector 802 for output. And calculating real-time wavelength and corresponding parameters through data acquisition and AD conversion, comparing the real-time wavelength and the corresponding parameters with the standard wavelength and the corresponding parameters recorded by the wavelength calibration light source, and calculating and reading the real-time light wavelength value output by the laser to be detected according to the real-time wavelength value.
The specific explanation for wavelength calibration using a 1550nm narrow linewidth light source is as follows: the 1550nm narrow line width light source 4 is used for calibration of a wavelength measuring instrument and calibration of standard wavelength, wherein the central wavelength is 1550.1200nm, and the line width is in KHz magnitude. When the wavelength measuring instrument is started, the fact that no laser to be measured is connected to the instrument is ensured. The calibration light source 4 emits a narrow linewidth laser with a center wavelength of 1550.1200nm, and the laser enters the wavelength monitoring component 8 through the first coupler 5, the isolator 6 and the gain flattening filter 7. The optical signal passing through the ramp filter 801 is converted into an electrical signal by the photodetector 802, and the real-time wavelength and corresponding parameters are calculated through data acquisition and AD conversion. Comparing the light wavelength value with a preset standard wavelength, and calculating a compensation parameter when the deviation between the light wavelength value and the preset standard wavelength is greater than a preset deviation threshold (0.5 pm in the embodiment), so as to perform data compensation on the wavelength monitoring component. Repeating the process, and measuring the real-time wavelength of the calibration light source again until the deviation is smaller than a preset deviation threshold (0.5 pm in the embodiment) of the measuring instrument, which indicates that the measuring instrument is calibrated; so that the 1550nm narrow linewidth calibration light source can be closed to monitor the wavelength of the light source to be detected.
The above embodiments are only used to further illustrate the high-precision laser wavelength measuring instrument based on the ramp filter of the present invention, but the present invention is not limited to the above embodiments, and any simple modifications, equivalent changes and modifications made to the above embodiments according to the technical spirit of the present invention fall within the scope of the technical solution of the present invention.
Claims (4)
1. A high accuracy laser wavelength measuring apparatu based on ramp filter, its characterized in that includes: the device comprises an optical fiber flange plate, an optical attenuator, a wavelength calibration light source, a coupler, an isolator, a gain flattening filter and a wavelength monitoring component; the wavelength monitoring component is formed by connecting a slope filter and a photoelectric detector; the wavelength calibration light source is a narrow linewidth light source;
the optical fiber flange is used for connecting a detected light source and the laser wavelength measuring instrument, so that the detected light source is connected to the laser wavelength measuring instrument through the optical fiber flange; the optical attenuator is connected to the other end of the optical fiber flange plate, and the wavelength calibration light source is connected with the optical attenuator through a coupler and enters the slope filter through the isolator and the gain flattening filter;
the waveform of the optical signal is flat after passing through a gain flattening filter; after passing through the slope filter, the optical power of the light with different wavelengths changes, and the light is converted into an electric signal by the wavelength monitoring component to be output; calculating real-time wavelength and corresponding parameters through data acquisition and AD conversion, comparing the real-time wavelength and the corresponding parameters with standard wavelength and corresponding parameters recorded by a wavelength calibration light source, and calculating and reading real-time light wavelength values output by the laser to be measured according to the standard wavelength and the corresponding parameters;
when the wavelength measuring instrument does not need to be calibrated, the wavelength calibration light source is in a closed and non-working state; when the wavelength measuring instrument needs to be calibrated, the instrument is carried out under the condition that a measured light source is not accessed;
during calibration: the optical signal emitted by the wavelength calibration light source is received by the wavelength monitoring component, converted into an electric signal through the slope filter and the photoelectric detector, a real-time optical wavelength value is calculated and read, the optical wavelength value is compared with a preset standard wavelength, when the deviation between the optical wavelength value and the preset standard wavelength is greater than a preset deviation threshold value, a compensation parameter is calculated, and data compensation is carried out on the wavelength monitoring component;
and repeating the process, and measuring the real-time wavelength of the wavelength calibration light source again until the deviation is less than the preset deviation threshold value of the measuring instrument, thereby indicating that the measuring instrument is calibrated.
2. The high-precision laser wavelength measuring instrument based on the ramp filter as claimed in claim 1, wherein: the wavelength calibration light source is used for calibrating a wavelength measuring instrument, the central wavelength of the wavelength calibration light source is 1550nm, and the line width of the wavelength calibration light source is in the KHz magnitude.
3. The high-precision laser wavelength measuring instrument based on the ramp filter as claimed in claim 1, wherein: the bandwidth of the gain flattening filter covers the C wave band of optical fiber communication.
4. The high-precision laser wavelength measuring instrument based on the ramp filter as claimed in claim 1, wherein: the bandwidth of the ramp filter covers the C-band of optical fiber communication.
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Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5729347A (en) * | 1996-11-08 | 1998-03-17 | So; Vincent | Optical wavelength measurement system |
| CN203323891U (en) * | 2013-06-06 | 2013-12-04 | 中国电子科技集团公司第四十一研究所 | Optical wavelength meter based on AWG and optical switch |
| CN103674287A (en) * | 2013-12-16 | 2014-03-26 | 中国电子科技集团公司第四十一研究所 | Laser wavelength monitoring device based on etalons |
| CN106092337A (en) * | 2016-05-18 | 2016-11-09 | 中国电子科技集团公司第四十研究所 | The calibrating installation of a kind of ultraviolet wavelength measuring instrument and method |
| CN207335881U (en) * | 2017-03-08 | 2018-05-08 | 中山市华思光电科技发展有限公司 | Laser center wavelength measuring device |
| CN108871419A (en) * | 2018-04-20 | 2018-11-23 | 南京航空航天大学 | More physical quantity optical fiber sensing systems, the control of its feedback loop and its detection method |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7683312B2 (en) * | 2007-10-23 | 2010-03-23 | Us Sensor Systems, Inc. | Fiber-optic interrogator with normalization filters |
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- 2019-11-08 CN CN201911086656.9A patent/CN110967120B/en active Active
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5729347A (en) * | 1996-11-08 | 1998-03-17 | So; Vincent | Optical wavelength measurement system |
| CN203323891U (en) * | 2013-06-06 | 2013-12-04 | 中国电子科技集团公司第四十一研究所 | Optical wavelength meter based on AWG and optical switch |
| CN103674287A (en) * | 2013-12-16 | 2014-03-26 | 中国电子科技集团公司第四十一研究所 | Laser wavelength monitoring device based on etalons |
| CN106092337A (en) * | 2016-05-18 | 2016-11-09 | 中国电子科技集团公司第四十研究所 | The calibrating installation of a kind of ultraviolet wavelength measuring instrument and method |
| CN207335881U (en) * | 2017-03-08 | 2018-05-08 | 中山市华思光电科技发展有限公司 | Laser center wavelength measuring device |
| CN108871419A (en) * | 2018-04-20 | 2018-11-23 | 南京航空航天大学 | More physical quantity optical fiber sensing systems, the control of its feedback loop and its detection method |
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