JPS5742824A - Method and device for sequential determination of light wavelength - Google Patents
Method and device for sequential determination of light wavelengthInfo
- Publication number
- JPS5742824A JPS5742824A JP11885480A JP11885480A JPS5742824A JP S5742824 A JPS5742824 A JP S5742824A JP 11885480 A JP11885480 A JP 11885480A JP 11885480 A JP11885480 A JP 11885480A JP S5742824 A JPS5742824 A JP S5742824A
- Authority
- JP
- Japan
- Prior art keywords
- light
- interferometers
- interference
- measured
- wavelength
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000003287 optical effect Effects 0.000 abstract 2
- 238000003491 array Methods 0.000 abstract 1
- BJQHLKABXJIVAM-UHFFFAOYSA-N bis(2-ethylhexyl) phthalate Chemical compound CCCCC(CC)COC(=O)C1=CC=CC=C1C(=O)OCC(CC)CCCC BJQHLKABXJIVAM-UHFFFAOYSA-N 0.000 abstract 1
- 238000005259 measurement Methods 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
- G01J9/02—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods
- G01J9/0246—Measuring optical wavelength
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Spectrometry And Color Measurement (AREA)
Abstract
PURPOSE:To improve the precision of the measurement of the wavelength of continuous or pulse light by using two interferometers which increase in interference length gradually and by making a sequential approximation of the wavelength of light to be measured from a known standard position on the basis of the position of the characteristics point of the measured light and the order of interference. CONSTITUTION:Light L0 to be measured or reference light L3 is split by beam splitters M0-M4 and applied to, for example, optical interferometers I1-I4 of Fabry-Pe rot etalon. The interferometers I1-I4 increase in interference length gradually and photodiode arrays R1-R4 convert interference rings projected from respective optical interferometers into electric signals, which are outputted to A/D converters AD1-AD4. Digital signals from the AD1-AD4 are supplied to a computer MC for wavelength calculation. The standard positions of the interferometers I1-I4 are found by the reference light L3, and the characteristic points are also found by the bright or dark point of the interference light of the measured light L0, thus finding primary - quadratic approximate wavelengths.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11885480A JPS5742824A (en) | 1980-08-28 | 1980-08-28 | Method and device for sequential determination of light wavelength |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11885480A JPS5742824A (en) | 1980-08-28 | 1980-08-28 | Method and device for sequential determination of light wavelength |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5742824A true JPS5742824A (en) | 1982-03-10 |
JPS6131807B2 JPS6131807B2 (en) | 1986-07-23 |
Family
ID=14746777
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP11885480A Granted JPS5742824A (en) | 1980-08-28 | 1980-08-28 | Method and device for sequential determination of light wavelength |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5742824A (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
AT390836B (en) * | 1988-03-11 | 1990-07-10 | Tabarelli Werner | DEVICE FOR DETERMINING THE WAVE LENGTH OR DETERMINATION OF CRUMINUM |
US8319969B2 (en) | 2008-02-13 | 2012-11-27 | Hewlett-Packard Development Company, L.P. | Color detector having area scaled photodetectors |
US8330955B2 (en) | 2008-02-12 | 2012-12-11 | Hewlett-Packard Development Company, L.P. | Color detector |
CN113324665A (en) * | 2020-02-29 | 2021-08-31 | 华为技术有限公司 | Wavemeter, method for obtaining parameters of wavemeter and method for on-line calibration |
-
1980
- 1980-08-28 JP JP11885480A patent/JPS5742824A/en active Granted
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
AT390836B (en) * | 1988-03-11 | 1990-07-10 | Tabarelli Werner | DEVICE FOR DETERMINING THE WAVE LENGTH OR DETERMINATION OF CRUMINUM |
US8330955B2 (en) | 2008-02-12 | 2012-12-11 | Hewlett-Packard Development Company, L.P. | Color detector |
US8319969B2 (en) | 2008-02-13 | 2012-11-27 | Hewlett-Packard Development Company, L.P. | Color detector having area scaled photodetectors |
CN113324665A (en) * | 2020-02-29 | 2021-08-31 | 华为技术有限公司 | Wavemeter, method for obtaining parameters of wavemeter and method for on-line calibration |
CN113324665B (en) * | 2020-02-29 | 2022-10-11 | 华为技术有限公司 | Wavemeter, method for obtaining parameters of wavemeter and method for on-line calibration |
Also Published As
Publication number | Publication date |
---|---|
JPS6131807B2 (en) | 1986-07-23 |
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