JPS5742824A - Method and device for sequential determination of light wavelength - Google Patents

Method and device for sequential determination of light wavelength

Info

Publication number
JPS5742824A
JPS5742824A JP11885480A JP11885480A JPS5742824A JP S5742824 A JPS5742824 A JP S5742824A JP 11885480 A JP11885480 A JP 11885480A JP 11885480 A JP11885480 A JP 11885480A JP S5742824 A JPS5742824 A JP S5742824A
Authority
JP
Japan
Prior art keywords
light
interferometers
interference
measured
wavelength
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP11885480A
Other languages
Japanese (ja)
Other versions
JPS6131807B2 (en
Inventor
Fujio Shimizu
Noritoshi Konishi
Hiroshi Kato
Keiko Kasuya
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
RIKEN Institute of Physical and Chemical Research
Original Assignee
RIKEN Institute of Physical and Chemical Research
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by RIKEN Institute of Physical and Chemical Research filed Critical RIKEN Institute of Physical and Chemical Research
Priority to JP11885480A priority Critical patent/JPS5742824A/en
Publication of JPS5742824A publication Critical patent/JPS5742824A/en
Publication of JPS6131807B2 publication Critical patent/JPS6131807B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
    • G01J9/02—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods
    • G01J9/0246—Measuring optical wavelength

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectrometry And Color Measurement (AREA)

Abstract

PURPOSE:To improve the precision of the measurement of the wavelength of continuous or pulse light by using two interferometers which increase in interference length gradually and by making a sequential approximation of the wavelength of light to be measured from a known standard position on the basis of the position of the characteristics point of the measured light and the order of interference. CONSTITUTION:Light L0 to be measured or reference light L3 is split by beam splitters M0-M4 and applied to, for example, optical interferometers I1-I4 of Fabry-Pe rot etalon. The interferometers I1-I4 increase in interference length gradually and photodiode arrays R1-R4 convert interference rings projected from respective optical interferometers into electric signals, which are outputted to A/D converters AD1-AD4. Digital signals from the AD1-AD4 are supplied to a computer MC for wavelength calculation. The standard positions of the interferometers I1-I4 are found by the reference light L3, and the characteristic points are also found by the bright or dark point of the interference light of the measured light L0, thus finding primary - quadratic approximate wavelengths.
JP11885480A 1980-08-28 1980-08-28 Method and device for sequential determination of light wavelength Granted JPS5742824A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11885480A JPS5742824A (en) 1980-08-28 1980-08-28 Method and device for sequential determination of light wavelength

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11885480A JPS5742824A (en) 1980-08-28 1980-08-28 Method and device for sequential determination of light wavelength

Publications (2)

Publication Number Publication Date
JPS5742824A true JPS5742824A (en) 1982-03-10
JPS6131807B2 JPS6131807B2 (en) 1986-07-23

Family

ID=14746777

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11885480A Granted JPS5742824A (en) 1980-08-28 1980-08-28 Method and device for sequential determination of light wavelength

Country Status (1)

Country Link
JP (1) JPS5742824A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AT390836B (en) * 1988-03-11 1990-07-10 Tabarelli Werner DEVICE FOR DETERMINING THE WAVE LENGTH OR DETERMINATION OF CRUMINUM
US8319969B2 (en) 2008-02-13 2012-11-27 Hewlett-Packard Development Company, L.P. Color detector having area scaled photodetectors
US8330955B2 (en) 2008-02-12 2012-12-11 Hewlett-Packard Development Company, L.P. Color detector
CN113324665A (en) * 2020-02-29 2021-08-31 华为技术有限公司 Wavemeter, method for obtaining parameters of wavemeter and method for on-line calibration

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AT390836B (en) * 1988-03-11 1990-07-10 Tabarelli Werner DEVICE FOR DETERMINING THE WAVE LENGTH OR DETERMINATION OF CRUMINUM
US8330955B2 (en) 2008-02-12 2012-12-11 Hewlett-Packard Development Company, L.P. Color detector
US8319969B2 (en) 2008-02-13 2012-11-27 Hewlett-Packard Development Company, L.P. Color detector having area scaled photodetectors
CN113324665A (en) * 2020-02-29 2021-08-31 华为技术有限公司 Wavemeter, method for obtaining parameters of wavemeter and method for on-line calibration
CN113324665B (en) * 2020-02-29 2022-10-11 华为技术有限公司 Wavemeter, method for obtaining parameters of wavemeter and method for on-line calibration

Also Published As

Publication number Publication date
JPS6131807B2 (en) 1986-07-23

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