CN202583431U - Power supply aging rack and power supply aging system thereof - Google Patents
Power supply aging rack and power supply aging system thereof Download PDFInfo
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- CN202583431U CN202583431U CN 201220077377 CN201220077377U CN202583431U CN 202583431 U CN202583431 U CN 202583431U CN 201220077377 CN201220077377 CN 201220077377 CN 201220077377 U CN201220077377 U CN 201220077377U CN 202583431 U CN202583431 U CN 202583431U
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Abstract
The utility model relates to a power supply aging rack and a power supply aging system. The power supply aging rack of the utility model is a cabinet structure, wherein one or multiple aged power supplies which require an aging test are arranged in the cabinet structure, and the power supply aging rack is in an enclosed state in the aging test; and the power supply aging rack comprises a communication module, a constant temperature control device, one or multiple intelligent electronic loads, and a switch controller, wherein the communication module is used for receiving external communication signals, transmitting the signals to the power supply aging rack, and transmitting information of the power supply aging rack to the outside, the constant temperature control device is used for controlling the temperature of the power supply aging rack in a preset constant temperature, the one or multiple intelligent electronic loads are connected with the aged power supplies to provide loads for the aged power supplies, and the switch controller is connected with the aged power supplies to control the power supply states of the aged power supplies. According to the power supply aging rack and the power supply aging system thereof of the utility model, high-temperature aging tests can be carried out while powering-on/off tests of the aged power supplies in bad high-temperature environments can be realized, thereby better detecting power supplies with hidden troubles, and improving the reliability of manufactured products.
Description
Technical Field
The utility model relates to a power technology especially relates to a power ageing rack and a power ageing system that power supply unit aging testing used.
Background
In the power supply equipment test, the reliability of the power supply equipment is checked through a high-temperature full-load aging test, and early failure devices are removed. The traditional power source aging test device comprises a power distribution cabinet and a power load cabinet. In the test process, power supply equipment is connected with a power load unit in a power load cabinet, and a power distribution cabinet provides a power supply for the power supply equipment. In a conventional power source aging test, an alternating current power source is generally applied to a power source device for a predetermined time, so that the power source device can work in a high-temperature environment for a long time. However, such aging tests are not suitable for switching power supplies, particularly lighting power supplies (e.g., LED driving power supplies).
The switching power supply circuit generally has a large inductance and a large-capacity capacitor, and a high-voltage large-current power device, and a large surge current is generated at the moment of switching on and switching off, and the surge current is one of the main causes of damage to the device in the circuit. The traditional aging test method is that after power supply equipment is started and aged, the power supply equipment is shut down until the aging is finished, the power supply equipment is not subjected to power on/off impact resistance detection, and the surge resistance of a power device cannot be effectively tested. Traditional power ageing rack is generally fixed to be placed in ageing room, because need carry out high temperature ageing, consequently inside temperature is higher, and operational environment is very abominable.
In addition, in the conventional power supply aging system, the working mode of the power supply equipment is relatively specified, and after the configuration is completed, the power supply equipment needs to be reconfigured to realize another working mode, so that the efficiency is low, and the running cost is high.
Disclosure of Invention
In view of this, the present invention provides a novel power aging rack and a novel power aging system thereof to solve the problems of low operating efficiency and high cost of the conventional power aging system.
According to the power aging rack provided by the embodiment of the utility model, the power aging rack is of a cabinet structure, one or more aging power supplies needing aging tests are placed inside the power aging rack, and the power aging rack is in a closed state during the aging tests; the method comprises the following steps:
the communication module is used for receiving an external communication signal so as to transmit the external communication signal to the aging power supply and transmit the information of the power supply aging rack to the outside;
the constant temperature control device is used for controlling the temperature of the power supply aging rack to be maintained at a preset constant temperature;
one or more intelligent electronic loads connected with the aging power supply to provide loads for the aging power supply;
and the switch controller is respectively connected with an external power supply and the aging power supply and is used for controlling the power supply state of the aging power supply.
Preferably, the power supply ageing rack comprises a power supply interface for connecting with an external power supply.
Preferably, the working mode of the communication module is a wired communication mode or a wireless communication mode.
Further, the switch controller comprises a single chip microcomputer and a relay, the relay is connected with the power supply module, and the single chip microcomputer controls the state of the relay to control the switch state of the aging power supply.
Further, the constant temperature control device comprises a temperature sensing device to collect the internal temperature of the power supply aging rack.
Preferably, the power source aging rack further comprises a pulley located at the bottom of the power source aging rack and used for moving the power source aging rack.
A power burn-in system according to an embodiment of the present invention includes one or more of the above power burn-in racks, wherein,
each power supply aging rack is provided with an independent first address number;
each intelligent electronic load is provided with an independent second address number;
further comprising:
the power supply distribution cabinet is connected with the power supply aging rack to supply power to the power supply aging rack;
the communication equipment is connected with the power supply aging rack so as to transmit an external communication signal to the aging power supply through the communication module and transmit the information of the power supply aging rack to the outside;
and the host is connected with the communication equipment so as to receive the information of the power supply ageing rack through the communication equipment and send a certain communication signal to the power supply ageing rack through the communication equipment.
Further, the host configures the intelligent electronic load through selection of the second address number, so that the aging power supply works in a constant current mode or a constant voltage mode.
Furthermore, the host computer is used for setting the preset temperature of the power supply aging rack and then transmitting the preset temperature to the constant temperature control device through the communication equipment so as to control the temperature of the power supply aging rack to be maintained at the preset temperature.
Furthermore, the preset power-on time and the preset power-off time of the aging power supply are set through the host, and then are transmitted to the switch controller through the communication equipment to control the power-on time and the power-off time of the aging power supply so as to simulate the switch state of the aging power supply.
According to the power supply aging rack and the power supply aging system thereof, when a high-temperature aging test is carried out, the on-off test of an aging power supply under a severe high-temperature environment can be realized, the power supply equipment with hidden danger can be better detected, and the reliability of product delivery is improved;
the movable power supply ageing rack is convenient for an operator to move the power supply ageing rack; for example, an operator may move the power burn-in rack out of the burn-in room with a higher temperature, and then perform corresponding configuration on the power burn-in rack; after the configuration is finished, the power supply aging rack is moved into an aging room for aging test, so that the design is more humanized, and the operation is more convenient;
the power supply aging system with the communication function realizes the bidirectional communication between the host and each power supply aging rack, and can conveniently realize the control of the power supply aging racks, such as temperature, switch state, working mode and the like; the power supply aging system has higher operating efficiency and more flexible and convenient operation, and can be applied to more occasions.
Drawings
Fig. 1 is a block diagram of a power burn-in stand according to a preferred embodiment of the present invention;
fig. 2 is a schematic block diagram of a power supply burn-in system according to a preferred embodiment of the present invention;
fig. 3 is a schematic block diagram of a power supply burn-in system according to another preferred embodiment of the present invention.
Detailed Description
Several preferred embodiments of the present invention will be described in detail below with reference to the accompanying drawings, but the present invention is not limited to only these embodiments. The present invention covers any alternatives, modifications, equivalents, and alternatives falling within the spirit and scope of the invention. In the following description of the preferred embodiments of the present invention, specific details are set forth in order to provide a thorough understanding of the present invention, and it will be apparent to those skilled in the art that the present invention may be practiced without these specific details.
The following describes the power aging rack according to the present invention in detail with reference to the accompanying drawings.
Referring to fig. 1, a block diagram of a power burn-in rack according to an embodiment of the present invention is shown. In this embodiment, the power aging rack 100 is a cabinet structure, and one or more aging power supplies to be subjected to an aging test are placed inside the power aging rack 100, and the power aging rack 100 is in a closed state during the aging test; including one or more aging power supplies 103, a switch controller 101, a communications module 104, an intelligent electronic load 105 and a thermostatic control module 106. Wherein,
the switch controller 101 is connected with the aging power supply 103 and controls the power-on and power-off states of the aging power supply 103;
the intelligent electronic load 105 is respectively connected with each aging power supply 103 to provide a load for the aging power supply, so as to realize different working modes of the aging power supply 203;
the constant temperature control module 106 is configured to collect the temperature of the power supply burn-in rack 100, and control the temperature of the power supply burn-in rack 100 to maintain a preset constant value;
the communication module 104 is respectively connected with the switch controller 101, the intelligent electronic load 105 and the constant temperature control module 106;
the communication module 104 transmits the received switch signal SW to the switch controller 101, so that the switch controller 101 controls the aging power supply 103 to perform power-on and power-off operations according to the switch signal SW to simulate the switch state of the aging power supply;
the communication module 104 performs corresponding configuration on the intelligent electronic load 105 according to the received operating mode signal mode, so that each aging power supply 103 has a corresponding operating mode, such as a constant voltage mode or a constant current mode;
the communication module 104 transmits a preset temperature value to the constant temperature control module 106, and the constant temperature control module 106 performs corresponding temperature adjustment according to the preset temperature value, so that the temperature of the power supply burn-in rack 100 is matched with the preset temperature value; and, the thermostatic control module 106 also collects the current temperature of the power aging rack 100 to transmit to the outside through the communication module 104.
Further, the switch controller 101 may include a single chip microcomputer and a set of relays or electronic switches, and the actions of the relays or electronic switches are controlled by the single chip microcomputer, so as to control the power-on and power-off states of the aging power supply 103.
The power burn rack 100 may also include a power interface to receive an external power supply.
The communication between the communication module 104 and the switch controller 101, the constant temperature control module 106 and the outside world can be in a wired communication mode or a wireless communication mode; when wired communication is used, the power burn rack 100 may include a communication port to communicate with the outside.
The thermostatic control module 106 may include a temperature sensing device for collecting the temperature of the current power burn-in stand 100, and a temperature adjusting device for adjusting the temperature of the power burn-in stand to a preset temperature value. The temperature sensing device may be a thermocouple.
Preferably, the power burn-in stand 100 may further include a pulley at the bottom to facilitate moving the power burn-in stand 100.
Therefore, according to the power supply aging rack of the utility model, when a high-temperature aging test is carried out, the on-off test of an aging power supply under a severe high-temperature environment can be realized, the power supply equipment with hidden danger can be better detected, and the reliability of product delivery is improved; the movable power supply ageing rack is convenient for operators to move the power supply ageing rack, the design is more humanized, and the operation is more convenient.
In this embodiment, the switch controller 101 and the communication module 104 are located inside the power burn-in rack; in addition, the switch controller 101 and the communication module 104 can also be disposed in a cabinet device (control cabinet) and hung outside the power supply burn rack box.
The power supply burn-in system according to the present invention will be described in detail with reference to the following embodiments.
Referring to fig. 2, a schematic block diagram of a power supply burn-in system according to a preferred embodiment of the present invention is shown. In this embodiment, the power supply aging system 200 includes a power supply aging rack 201, a control cabinet 202, a power supply distribution cabinet 203, a host 204 and a communication device 205; wherein,
the power source aging rack 201 may be any of the power source aging racks according to the present invention, including but not limited to the power source aging rack shown in fig. 1;
the control cabinet 202 comprises a switch controller 206 and a communication module 207, and is hung outside the box body of the power supply aging rack 201.
The host 204 transmits a switch signal SW to the communication module 207 through the communication device 205, wherein the switch signal SW controls the switching action of the switch controller 206; when an electronic switch or a relay in a switch controller is closed, the power supply distribution cabinet 203 supplies power supply to the aging power source 213 through the switch controller 206 and the power supply interface 211 of the power source aging rack, and the aging power source 213 is in a working state; when the electronic switch or relay in the switch controller 206 is turned off, no power is supplied to the aging power source 213, and the aging power source 213 is in an off state; it can be seen that the power supply time and the power off time of the aging power supply 213 are set by the host 204, so that the frequent on-off test of the aging power supply at high temperature is realized.
Further, the intelligent electronic load 209 has an independent second address number, and the host 204 selects the corresponding second address number of the intelligent electronic load 209, and then transmits the second address number to the communication module 207 through the communication device 205; the communication module 207 transmits the signal to the intelligent electronic load through the communication port 212, so that different working modes of the aging power supply 213, such as a constant voltage mode or a constant current mode, can be selected.
Further, the host 204 sets a preset temperature of the power aging rack, and the communication module 207 and the communication port 212 transmit the preset temperature to the thermostatic control device 210 through the communication device 205, so as to adjust the temperature of the power aging rack, so that the temperature of the power aging rack matches the preset temperature.
The communication device 205 may be in a wired communication mode or a wireless communication mode, and when the communication device is in the wireless communication mode, the power aging rack 201 does not include the communication port 212.
Therefore, according to the intelligent power aging system of the utility model, the bidirectional communication between the host and each power aging rack is realized, and the control of the power aging rack, such as temperature, on-off state, working mode and the like, can be conveniently realized; the power supply aging system has higher operating efficiency and more flexible and convenient operation, and can be applied to more occasions.
Referring to fig. 3, a schematic block diagram of a power supply burn-in system in accordance with another preferred embodiment of the present invention is shown. In this embodiment, the power supply burn-in system 300 includes a plurality of power supply burn-in racks 301, where the power supply burn-in racks 301 may include a power supply interface 301-2 and a communication port 301-1, a power supply distribution cabinet 302, a communication device 303, and a host 304; wherein,
the power source burn-in rack 301 may be any of the power source burn-in racks described above according to the present invention, including but not limited to the power source burn-in rack shown in fig. 1;
the power supply distribution cabinet 302 supplies power to the power supply aging rack 301 through the power supply interface 301-2;
the communication equipment 303 is connected between the host 304 and the power supply ageing rack 301 so as to perform bidirectional communication between the host 304 and the power supply ageing rack 301;
for example, a preset aging temperature of the power supply aging rack is set through the host 304, and the preset aging temperature is transmitted to the constant temperature control device of the power supply aging rack 301 through the communication device 303, so as to adjust the temperature of the power supply aging rack 301;
the power-on and power-off time of the aging power supply in the power supply aging rack 301 is set through the host 304 and is transmitted to the switch controller of the power supply aging rack 301 through the communication equipment 303 so as to control the aging power supply to perform switching actions with the set power-on and power-off time, such as 10s (power-on time) for starting up and 10s (power-off time) for shutting down, so as to simulate frequent switching actions of the aging power supply, and further perform the on-off test of the aging power supply under the high-temperature test;
in this embodiment, each of the power burn-in frames 301 has an independent first address number, each of the intelligent electronic loads has an independent second address number, and the host 304 selects the corresponding power burn-in frame 301 by selecting the first address number; the host 304 then selects the corresponding intelligent electronic load by selecting the second address number to configure the power burn rack to a corresponding operating mode, such as a constant voltage mode or a constant current mode.
The communication device 303 may be in a wired communication mode or a wireless communication mode, and when the communication device is in the wireless communication mode, the power aging rack 301 does not include the communication port 301-1.
Therefore, according to the intelligent power aging system of the utility model, the bidirectional communication between the host and each power aging rack is realized, and the control of the power aging rack, such as temperature, on-off state, working mode and the like, can be conveniently realized; the power supply aging system has higher operating efficiency and more flexible and convenient operation, and can be applied to more occasions.
Having described the power burn-in rack and power burn-in system in accordance with the preferred embodiments of the present invention in detail, one of ordinary skill in the art will appreciate that other techniques or structures, as well as circuit layouts, components, etc., may be used with the described embodiments.
In accordance with the embodiments of the present invention as set forth above, these embodiments are not exhaustive and do not limit the invention to the precise embodiments described. Obviously, many modifications and variations are possible in light of the above teaching. The embodiments were chosen and described in order to best explain the principles of the invention and its practical application, to thereby enable others skilled in the art to best utilize the invention and its various embodiments with various modifications as are suited to the particular use contemplated. The present invention is limited only by the claims and their full scope and equivalents.
Claims (10)
1. A power supply aging rack is characterized in that the power supply aging rack is of a cabinet structure, one or more aging power supplies needing aging tests are placed in the power supply aging rack, and the power supply aging rack is in a closed state during the aging tests; the method comprises the following steps:
the communication module is used for receiving an external communication signal so as to transmit the external communication signal to the aging power supply and transmit the information of the power supply aging rack to the outside;
the constant temperature control device is used for controlling the temperature of the power supply aging rack to be maintained at a preset constant temperature;
one or more intelligent electronic loads connected with the aging power supply to provide loads for the aging power supply;
and the switch controller is respectively connected with an external power supply and the aging power supply and is used for controlling the power supply state of the aging power supply.
2. The power supply burn rack of claim 1 wherein said power supply burn rack includes a power supply interface for connection to an external power supply.
3. The power supply burn rack of claim 1 wherein said communication module operates in a wired or wireless manner.
4. The power supply burn-in stand of claim 1, wherein the switch controller comprises a single chip microcomputer and a relay, the relay is connected with the power supply module, and the single chip microcomputer controls the state of the relay to control the switch state of the burn-in power supply.
5. The power supply burn rack of claim 1 wherein said thermostatic control device includes a temperature sensing device to capture the internal temperature of said power supply burn rack.
6. The power supply burn rack of claim 1 further comprising a pulley at a bottom of said power supply burn rack for moving said power supply burn rack.
7. A power supply burn-in system comprising one or more power supply burn-in racks of any of claims 1-6,
each power supply aging rack is provided with an independent first address number;
each intelligent electronic load is provided with an independent second address number;
further comprising:
the power supply distribution cabinet is connected with the power supply aging rack to supply power to the power supply aging rack;
the communication equipment is connected with the power supply aging rack so as to transmit an external communication signal to the aging power supply through the communication module and transmit the information of the power supply aging rack to the outside;
and the host is connected with the communication equipment so as to receive the information of the power supply ageing rack through the communication equipment and send a certain communication signal to the power supply ageing rack through the communication equipment.
8. The power supply burn-in system of claim 7, wherein the host configures the smart electronic load to operate the burn-in power supply in a constant current mode or a constant voltage mode by selection of the second address number.
9. The power supply burn-in system of claim 7, wherein a preset temperature of the power supply burn-in rack is set by the host and then transmitted to the thermostat control device through the communication device to control the temperature of the power supply burn-in rack to be maintained at the preset temperature.
10. The power supply aging system of claim 7, wherein a preset power-on time and a preset power-off time of an aging power supply are set by a host and then transmitted to the switch controller through a communication device to control the power-on time and the power-off time of the aging power supply to simulate a switching state of the aging power supply.
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| Application Number | Priority Date | Filing Date | Title |
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| CN 201220077377 CN202583431U (en) | 2012-03-01 | 2012-03-01 | Power supply aging rack and power supply aging system thereof |
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| CN 201220077377 CN202583431U (en) | 2012-03-01 | 2012-03-01 | Power supply aging rack and power supply aging system thereof |
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Cited By (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103197261A (en) * | 2013-03-25 | 2013-07-10 | 天宇通讯科技(昆山)有限公司 | Automatic monitoring type electronic load current aging device |
| CN103219955A (en) * | 2013-04-08 | 2013-07-24 | 京信通信技术(广州)有限公司 | Aging method and aging device of radio frequency power amplifier |
| CN103323048A (en) * | 2013-05-28 | 2013-09-25 | 郑州精益达汽车零部件有限公司高新区分公司 | Automobile instrument panel dynamic aging system under high temperature |
| CN103353722A (en) * | 2013-06-24 | 2013-10-16 | 王平 | LED product aging controller and LED aging control method |
| CN103852733A (en) * | 2014-02-17 | 2014-06-11 | 上海大学 | LED power supply performance analysis device and method |
| CN104614622A (en) * | 2015-02-13 | 2015-05-13 | 南京六九零二科技有限公司 | Intelligent aging rack |
| CN105068019A (en) * | 2015-07-29 | 2015-11-18 | 东莞市锐源仪器股份有限公司 | Intelligent monitoring system based on power supply constant-temperature vibration aging |
| CN108599287A (en) * | 2018-01-24 | 2018-09-28 | 广东容祺智能科技有限公司 | A kind of lithium battery power supply interface aging prior-warning device |
| CN110426585A (en) * | 2019-08-15 | 2019-11-08 | 东莞市赐而得自动化科技有限公司 | Electronic product reliability test macro |
| CN111426976A (en) * | 2020-05-27 | 2020-07-17 | 成都思科瑞微电子有限公司 | High-power DC-DC aging test device |
| CN111654006A (en) * | 2020-06-04 | 2020-09-11 | Oppo（重庆）智能科技有限公司 | Environmental test chamber control method and device and computer readable storage medium |
| CN115700392A (en) * | 2022-10-28 | 2023-02-07 | 深圳市恒运昌真空技术有限公司 | Power supply aging test circuit and method |
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2012
- 2012-03-01 CN CN 201220077377 patent/CN202583431U/en not_active Expired - Lifetime
Cited By (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103197261A (en) * | 2013-03-25 | 2013-07-10 | 天宇通讯科技(昆山)有限公司 | Automatic monitoring type electronic load current aging device |
| CN103219955A (en) * | 2013-04-08 | 2013-07-24 | 京信通信技术(广州)有限公司 | Aging method and aging device of radio frequency power amplifier |
| CN103219955B (en) * | 2013-04-08 | 2016-09-07 | 京信通信技术(广州)有限公司 | The aging method of radio-frequency power amplifier and device |
| CN103323048B (en) * | 2013-05-28 | 2015-08-19 | 郑州精益达汽车零部件有限公司高新区分公司 | Automobile instrument panel dynamic burn-in systems under high temperature |
| CN103323048A (en) * | 2013-05-28 | 2013-09-25 | 郑州精益达汽车零部件有限公司高新区分公司 | Automobile instrument panel dynamic aging system under high temperature |
| CN103353722A (en) * | 2013-06-24 | 2013-10-16 | 王平 | LED product aging controller and LED aging control method |
| CN103852733A (en) * | 2014-02-17 | 2014-06-11 | 上海大学 | LED power supply performance analysis device and method |
| CN103852733B (en) * | 2014-02-17 | 2017-01-18 | 上海大学 | LED power supply performance analysis device and method |
| CN104614622A (en) * | 2015-02-13 | 2015-05-13 | 南京六九零二科技有限公司 | Intelligent aging rack |
| CN105068019A (en) * | 2015-07-29 | 2015-11-18 | 东莞市锐源仪器股份有限公司 | Intelligent monitoring system based on power supply constant-temperature vibration aging |
| CN108599287A (en) * | 2018-01-24 | 2018-09-28 | 广东容祺智能科技有限公司 | A kind of lithium battery power supply interface aging prior-warning device |
| CN110426585A (en) * | 2019-08-15 | 2019-11-08 | 东莞市赐而得自动化科技有限公司 | Electronic product reliability test macro |
| CN111426976A (en) * | 2020-05-27 | 2020-07-17 | 成都思科瑞微电子有限公司 | High-power DC-DC aging test device |
| CN111654006A (en) * | 2020-06-04 | 2020-09-11 | Oppo（重庆）智能科技有限公司 | Environmental test chamber control method and device and computer readable storage medium |
| CN111654006B (en) * | 2020-06-04 | 2022-06-14 | Oppo（重庆）智能科技有限公司 | Environmental test chamber control method and device and computer readable storage medium |
| CN115700392A (en) * | 2022-10-28 | 2023-02-07 | 深圳市恒运昌真空技术有限公司 | Power supply aging test circuit and method |
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| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C56 | Change in the name or address of the patentee | ||
| CP02 | Change in the address of a patent holder |
Address after: 10, 310023 floor, B zone, HOLLEY Science Park, No. 181, Wuchang Road, Yuhang District, Zhejiang, Hangzhou Patentee after: Hangzhou Letu Photoelectric Technology Co., Ltd. Address before: 10, 310023 floor, B zone, HOLLEY Science Park, No. 181, Wuchang Road, Zhejiang, Hangzhou Patentee before: Hangzhou Letu Photoelectric Technology Co., Ltd. |
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| DD01 | Delivery of document by public notice |
Addressee: Hangzhou Letu Photoelectric Technology Co., Ltd. Document name: Notification to Pay the Fees |
|
| TR01 | Transfer of patent right |
Effective date of registration: 20190604 Address after: 237300 Standardized Workshop B-8 of Jinwutong Pioneer Park, Jinzhai Modern Industrial Park, Luan City, Anhui Province Patentee after: Anhui Letu Electronic Technology Co., Ltd. Address before: 310023 10/F, Huali Science Park B, 181 Wuchang Avenue, Yuhang District, Hangzhou City, Zhejiang Province Patentee before: Hangzhou Letu Photoelectric Technology Co., Ltd. |
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| TR01 | Transfer of patent right | ||
| DD01 | Delivery of document by public notice |
Addressee: Hangzhou Letu Photoelectric Technology Co., Ltd. Document name: Notification of Passing Examination on Formalities |
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| DD01 | Delivery of document by public notice | ||
| CX01 | Expiry of patent term |
Granted publication date: 20121205 |
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| CX01 | Expiry of patent term |