CN202453104U - Supporting frame of temperature measuring instrument - Google Patents
Supporting frame of temperature measuring instrument Download PDFInfo
- Publication number
- CN202453104U CN202453104U CN2012200111602U CN201220011160U CN202453104U CN 202453104 U CN202453104 U CN 202453104U CN 2012200111602 U CN2012200111602 U CN 2012200111602U CN 201220011160 U CN201220011160 U CN 201220011160U CN 202453104 U CN202453104 U CN 202453104U
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- CN
- China
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- fixed frame
- temperature
- frame
- silicon chips
- thermocouple
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- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Abstract
The utility model relates to a supporting frame of a temperature measuring instrument, which is particularly used for full contact of thermocouple probes and temperature-measuring silicon chips of a thermodetector of a sintering furnace and belongs to the field of electronic equipment. The supporting frame mainly comprises a fixed frame, a frame arm and detecting metal arms, wherein the frame arm si arranged at one side of the fixed frame; the detecting metal arms are arranged on the fixed frame by screws; the head parts of the detecting metal arms are provided with the thermocouple probes and temperature-difference thermoelectric thermometers which are connected by first guide wires; and the thermoelectric thermometers are connected with the thermocouple probes by second guide wires. The supporting frame has the advantages that the structure is simple, compact and reasonable; arranged metal wires have certain ductility, so that the thermocouples and the silicon chips can be fully contacted, and the silicon chips can not be crushed; the positions of thermocouple probe brackets can be adjusted, the temperatures of different points on the silicon chips can be tested, and simultaneously the probe ends are concave downwards so as to be fully contacted with the silicon chips instead of sliding easily.
Description
Technical field
The utility model relates to a kind of temperature measurer carriage, and the silicon chip that specifically is used for sintering furnace temperature measurer thermocouple probe and thermometric fully contacts, and belongs to electronic device field.
Background technology
At present, the manufacture of solar cells both domestic and external manufacturing firm net belt type tunnel sintering furnace that mainly uses American-European enterprise and produced.Sintering furnace vertically on be provided with preheating exhaust zone, heating zone, sintering zone and cooling area successively, at the heating fluorescent tube of different area arrangements different densities, the heating fluorescent tube of these different densities is heated to different temperature for each zone.The silicon chip that prints electrode passes through the different furnace temperature district of sintering furnace successively through the guipure transmission, accomplishes the electrode sintering process of preheating binder removal, intensification, sintering and cooling.
The employed technological comparative maturity of this net belt type tunnel sintering furnace, but in the differences in absorbed heat of each warm area of whole sintering process, caused actual temperature and design temperature generation difference in the stove owing to temperature fluctuation, each surface of contact.And concerning slurry and battery sintering process, the actual temperature of silicon chip surface more can directly reflect the situation of change that silicon chip is heated than design temperature.Because the peak temperature of sintering need maintain between 700-800 ℃, and the sintering time of programming rate, high-temperature region etc. all have direct influence to final battery efficiency.Therefore, when the actual temperature curve when requiring temperature inconsistent, the battery sheet efficient that sintering goes out can be had a strong impact on.In order to address this problem, we select temperature measurer to simulate the temperature real change of silicon chip surface usually, thereby instruct the furnace temperature of sintering furnace to set.The probe of temperature measurer uses thermopair usually, then through contacting the actual temperature that records silicon chip surface between probe and silicon chip.But thermocouple probe in actual use, often has with silicon chip the phenomenon that contacts not closely, is prone to slip, makes that the error that records temperature is very big.
Summary of the invention
The purpose of the utility model is to overcome above-mentioned weak point, thereby a kind of temperature measurer carriage is provided, can let thermocouple probe and silicon chip firm, closely contact, the feasible furnace temperature that records is more accurate.
According to the technical scheme that the utility model provides, the temperature measurer carriage mainly comprises fixed frame, frame arm and detection metal arm, and said frame arm is installed in fixed frame one side; Said detection metal arm is installed on the fixed frame through screw; Head at metal arm is provided with thermocouple probe and thermoelectric thermometer; Connect through first lead between said thermocouple probe and the thermoelectric thermometer, said thermoelectric thermometer connects thermocouple junction through second lead.
Be connected with the tinsel of net distribution on the said fixed frame, tinsel is connected on the fixed frame through screw.Said detection metal arm has four.Said second lead is fastened on the fixed frame through screw.Said fixed frame adopts carbofrax material to process.Said thermocouple probe is provided with recessed portion.
Compared with present technology the utility model has the following advantages:
The utility model is simple, compact and reasonable for structure; The tinsel that is provided with has certain ductility, can let thermopair fully contact with silicon chip, can silicon chip not crushed again; Survey metal arm and can adjust the position, the temperature of enough test silicon wafer differences has at sound end recessedly to make it fully contact silicon chip to be difficult for sliding simultaneously.
Description of drawings
Fig. 1 is the metal arm structural representation.
Fig. 2 is the utility model structural representation.
Embodiment
Following the utility model will combine the embodiment in the accompanying drawing to further describe:
Like Fig. 1 ~ shown in Figure 2, the utility model mainly comprises fixed frame 1, frame arm 2 and surveys metal arm 3 that said frame arm 2 is installed in fixed frame 1 one sides; Said detection metal arm 3 is installed on the fixed frame 1 through screw 4; Head at metal arm 3 is provided with thermocouple probe 5 and thermoelectric thermometer 6; Connect through first lead 7 between said thermocouple probe 5 and the thermoelectric thermometer 6, said thermoelectric thermometer 6 connects thermocouple junction 9 through second lead 8.
Be connected with the tinsel 10 of net distribution on the said fixed frame 1, tinsel 10 is connected on the fixed frame 1 through screw 4.Said detection metal arm 3 has four.Said second lead 8 is fastened on the fixed frame 1 through screw 4.Said fixed frame 1 adopts carbofrax material to process.Said thermocouple probe 5 is provided with recessed portion.
The principle of work of the utility model is: during work, tested silicon chip is fixed, compress silicon chip through four thermocouple probes of surveying on the metal arm 35.Difference of temperature through thermoelectric thermometer; The temperature of silicon chip passes on the thermocouple probe 5; Produce electromotive force between thermocouple probe 5 and the thermoelectric thermometer 6; Pass to thermocouple junction 9 through first lead, and thermocouple junction 5 connects temperature measurer when work, temperature measurer has just detected the temperature of silicon chip.Survey metal arm 3 for four and be fastened on fixed frame 1, can regulate four positions of surveying metal arm 3 through adjustment screw 4, to detect the temperature of silicon chip difference through screw 4.
Claims (6)
1. a temperature measurer carriage comprises fixed frame (1), frame arm (2) and surveys metal arm (3), and it is characterized in that: said frame arm (2) is installed in fixed frame (1) one side; Said detection metal arm (3) is installed on the fixed frame (1) through screw (4); Head at metal arm (3) is provided with thermocouple probe (5) and thermoelectric thermometer (6); Connect through first lead (7) between said thermocouple probe (5) and the thermoelectric thermometer (6), said thermoelectric thermometer (6) connects thermocouple junction (9) through second lead (8).
2. temperature measurer carriage as claimed in claim 1 is characterized in that: said fixed frame (1) adopts carbofrax material to process.
3. temperature measurer carriage as claimed in claim 1 is characterized in that: be connected with the tinsel (10) of net distribution on the said fixed frame (1), tinsel (10) is connected on the fixed frame (1) through screw (4).
4. temperature measurer carriage as claimed in claim 1 is characterized in that: said detection metal arm (3) is provided with four.
5. temperature measurer carriage as claimed in claim 1 is characterized in that: said second lead (8) is fastened on the fixed frame (1) through screw (4).
6. temperature measurer carriage as claimed in claim 1 is characterized in that: said thermocouple probe (5) is provided with recessed portion.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2012200111602U CN202453104U (en) | 2012-01-04 | 2012-01-04 | Supporting frame of temperature measuring instrument |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2012200111602U CN202453104U (en) | 2012-01-04 | 2012-01-04 | Supporting frame of temperature measuring instrument |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN202453104U true CN202453104U (en) | 2012-09-26 |
Family
ID=46868959
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2012200111602U Expired - Fee Related CN202453104U (en) | 2012-01-04 | 2012-01-04 | Supporting frame of temperature measuring instrument |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN202453104U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102539000A (en) * | 2012-01-04 | 2012-07-04 | 无锡卡利克斯科技有限公司 | Thermodetector bracket |
| CN105466230A (en) * | 2015-12-04 | 2016-04-06 | 河南航天精工制造有限公司 | Furnace temperature uniformity testing tool and testing support |
-
2012
- 2012-01-04 CN CN2012200111602U patent/CN202453104U/en not_active Expired - Fee Related
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102539000A (en) * | 2012-01-04 | 2012-07-04 | 无锡卡利克斯科技有限公司 | Thermodetector bracket |
| CN105466230A (en) * | 2015-12-04 | 2016-04-06 | 河南航天精工制造有限公司 | Furnace temperature uniformity testing tool and testing support |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20120926 Termination date: 20150104 |
|
| EXPY | Termination of patent right or utility model |