CN102539000A - Thermodetector bracket - Google Patents
Thermodetector bracket Download PDFInfo
- Publication number
- CN102539000A CN102539000A CN2012100076478A CN201210007647A CN102539000A CN 102539000 A CN102539000 A CN 102539000A CN 2012100076478 A CN2012100076478 A CN 2012100076478A CN 201210007647 A CN201210007647 A CN 201210007647A CN 102539000 A CN102539000 A CN 102539000A
- Authority
- CN
- China
- Prior art keywords
- fixed frame
- thermocouple
- arm
- temperature
- thermodetector
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Landscapes
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
The invention relates to a thermodetector bracket, which ensures that a thermocouple probe of a thermodetector of a sintering furnace is tightly contacted with a silicon wafer for measuring temperature, and belongs to the field of electronic equipment. The thermodetector bracket mainly comprises a fixed frame, a fixed arm, and detection metal arms; the frame arm is arranged on one side of the fixed frame; the detection metal arms are arranged on the fixed frame through bolts; the head of each metal arm is provided with a thermocouple probe and a thermoelectric thermometer which are connected with each other through a first lead; and each thermoelectric thermometer is connected with a thermocouple connector through a second lead. The thermodetector bracket has a simple, compact and reasonable structure; the arranged metal wires have certain ductility, so a thermocouple can be fully contacted with the silicon wafer, and the silicon wafer cannot be crushed; and the position of a thermocouple probe bracket can be adjusted, temperature of different points of the silicon wafer can be tested, and a probe end is sunk to be fully contacted with the silicon wafer and cannot slide easily.
Description
Technical field
The present invention relates to a kind of temperature measurer carriage, the silicon chip that specifically is used for sintering furnace temperature measurer thermocouple probe and thermometric fully contacts, and belongs to electronic device field.
Background technology
At present, the manufacture of solar cells both domestic and external manufacturing firm net belt type tunnel sintering furnace that mainly uses American-European enterprise and produced.Sintering furnace vertically on be provided with preheating exhaust zone, heating zone, sintering zone and cooling area successively, at the heating fluorescent tube of different area arrangements different densities, the heating fluorescent tube of these different densities is heated to different temperature for each zone.The silicon chip that prints electrode passes through the different furnace temperature district of sintering furnace successively through the guipure transmission, accomplishes the electrode sintering process of preheating binder removal, intensification, sintering and cooling.
The employed technological comparative maturity of this net belt type tunnel sintering furnace, but in the differences in absorbed heat of each warm area of whole sintering process, caused actual temperature and design temperature generation difference in the stove owing to temperature fluctuation, each surface of contact.And concerning slurry and battery sintering process, the actual temperature of silicon chip surface more can directly reflect the situation of change that silicon chip is heated than design temperature.Because the peak temperature of sintering need maintain between 700-800 ℃, and the sintering time of programming rate, high-temperature region etc. all have direct influence to final battery efficiency.Therefore, when the actual temperature curve when requiring temperature inconsistent, the battery sheet efficient that sintering goes out can be had a strong impact on.In order to address this problem, we select temperature measurer to simulate the temperature real change of silicon chip surface usually, thereby instruct the furnace temperature of sintering furnace to set.The probe of temperature measurer uses thermopair usually, then through contacting the actual temperature that records silicon chip surface between probe and silicon chip.But thermocouple probe in actual use, often has with silicon chip the phenomenon that contacts not closely, is prone to slip, makes that the error that records temperature is very big.
Summary of the invention
The objective of the invention is to overcome above-mentioned weak point, thereby a kind of temperature measurer carriage be provided, can let thermocouple probe and silicon chip firm, closely contact, the feasible furnace temperature that records is more accurate.
According to technical scheme provided by the invention, the temperature measurer carriage mainly comprises fixed frame, frame arm and detection metal arm, and said frame arm is installed in fixed frame one side; Said detection metal arm is installed on the fixed frame through screw; Head at metal arm is provided with thermocouple probe and thermoelectric thermometer; Connect through first lead between said thermocouple probe and the thermoelectric thermometer, said thermoelectric thermometer connects thermocouple junction through second lead.
Be connected with the tinsel of net distribution on the said fixed frame, tinsel is connected on the fixed frame through screw.Said detection metal arm has four.Said second lead is fastened on the fixed frame through screw.Said fixed frame adopts carbofrax material to process.Said thermocouple probe is provided with recessed portion.
Compared with present technology the present invention has the following advantages:
The present invention is simple, compact and reasonable for structure; The tinsel that is provided with has certain ductility, can let thermopair fully contact with silicon chip, can silicon chip not crushed again; Survey metal arm and can adjust the position, the temperature of enough test silicon wafer differences has at sound end recessedly to make it fully contact silicon chip to be difficult for sliding simultaneously.
Description of drawings
Fig. 1 is the metal arm structural representation.
Fig. 2 is a structural representation of the present invention.
Embodiment
Following the present invention will combine the embodiment in the accompanying drawing to further describe:
Like Fig. 1 ~ shown in Figure 2, the present invention mainly comprises fixed frame 1, frame arm 2 and surveys metal arm 3 that said frame arm 2 is installed in fixed frame 1 one sides; Said detection metal arm 3 is installed on the fixed frame 1 through screw 4; Head at metal arm 3 is provided with thermocouple probe 5 and thermoelectric thermometer 6; Connect through first lead 7 between said thermocouple probe 5 and the thermoelectric thermometer 6, said thermoelectric thermometer 6 connects thermocouple junction 9 through second lead 8.
Be connected with the tinsel 10 of net distribution on the said fixed frame 1, tinsel 10 is connected on the fixed frame 1 through screw 4.Said detection metal arm 3 has four.Said second lead 8 is fastened on the fixed frame 1 through screw 4.Said fixed frame 1 adopts carbofrax material to process.Said thermocouple probe 5 is provided with recessed portion.
Principle of work of the present invention is: during work, tested silicon chip is fixed, compress silicon chip through four thermocouple probes of surveying on the metal arm 35.Difference of temperature through thermoelectric thermometer; The temperature of silicon chip passes on the thermocouple probe 5; Produce electromotive force between thermocouple probe 5 and the thermoelectric thermometer 6; Pass to thermocouple junction 9 through first lead, and thermocouple junction 5 connects temperature measurer when work, temperature measurer has just detected the temperature of silicon chip.Survey metal arm 3 for four and be fastened on fixed frame 1, can regulate four positions of surveying metal arm 3 through adjustment screw 4, to detect the temperature of silicon chip difference through screw 4.
Claims (6)
1. a temperature measurer carriage comprises fixed frame (1), frame arm (2) and surveys metal arm (3), and it is characterized in that: said frame arm (2) is installed in fixed frame (1) one side; Said detection metal arm (3) is installed on the fixed frame (1) through screw (4); Head at metal arm (3) is provided with thermocouple probe (5) and thermoelectric thermometer (6); Connect through first lead (7) between said thermocouple probe (5) and the thermoelectric thermometer (6), said thermoelectric thermometer (6) connects thermocouple junction (9) through second lead (8).
2. temperature measurer carriage as claimed in claim 1 is characterized in that: said fixed frame (1) adopts carbofrax material to process.
3. temperature measurer carriage as claimed in claim 1 is characterized in that: be connected with the tinsel (10) of net distribution on the said fixed frame (1), tinsel (10) is connected on the fixed frame (1) through screw (4).
4. temperature measurer carriage as claimed in claim 1 is characterized in that: said detection metal arm (3) is provided with four.
5. temperature measurer carriage as claimed in claim 1 is characterized in that: said second lead (8) is fastened on the fixed frame (1) through screw (4).
6. temperature measurer carriage as claimed in claim 1 is characterized in that: said thermocouple probe (5) is provided with recessed portion.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2012100076478A CN102539000A (en) | 2012-01-04 | 2012-01-04 | Thermodetector bracket |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2012100076478A CN102539000A (en) | 2012-01-04 | 2012-01-04 | Thermodetector bracket |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN102539000A true CN102539000A (en) | 2012-07-04 |
Family
ID=46346459
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2012100076478A Pending CN102539000A (en) | 2012-01-04 | 2012-01-04 | Thermodetector bracket |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN102539000A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102944120A (en) * | 2012-11-19 | 2013-02-27 | 中山大学 | Integral multifunctional sintering furnace temperature inspection instrument carrier |
| CN103604513A (en) * | 2013-11-21 | 2014-02-26 | 国网安徽省电力公司滁州供电公司 | Improved transformer substation temperature gauge support |
| CN104707954A (en) * | 2013-12-17 | 2015-06-17 | 北京有色金属研究总院 | Auxiliary temperature measurement system and method of semi-solid-state secondary heating device |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6402372B1 (en) * | 1999-08-30 | 2002-06-11 | Electronic Controls Design, Inc. | Process temperature monitor, and method for monitoring process temperatures |
| CN201402188Y (en) * | 2009-04-24 | 2010-02-10 | 湖北中烟工业有限责任公司 | Durable and rapid thermocouple |
| WO2010088237A1 (en) * | 2009-01-30 | 2010-08-05 | Embedded Designs Inc. | Method and apparatus for measuring part temperature through a conveyorized thermal processor |
| CN202453104U (en) * | 2012-01-04 | 2012-09-26 | 无锡卡利克斯科技有限公司 | Supporting frame of temperature measuring instrument |
-
2012
- 2012-01-04 CN CN2012100076478A patent/CN102539000A/en active Pending
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6402372B1 (en) * | 1999-08-30 | 2002-06-11 | Electronic Controls Design, Inc. | Process temperature monitor, and method for monitoring process temperatures |
| WO2010088237A1 (en) * | 2009-01-30 | 2010-08-05 | Embedded Designs Inc. | Method and apparatus for measuring part temperature through a conveyorized thermal processor |
| CN201402188Y (en) * | 2009-04-24 | 2010-02-10 | 湖北中烟工业有限责任公司 | Durable and rapid thermocouple |
| CN202453104U (en) * | 2012-01-04 | 2012-09-26 | 无锡卡利克斯科技有限公司 | Supporting frame of temperature measuring instrument |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102944120A (en) * | 2012-11-19 | 2013-02-27 | 中山大学 | Integral multifunctional sintering furnace temperature inspection instrument carrier |
| CN102944120B (en) * | 2012-11-19 | 2014-07-09 | 中山大学 | Integral multifunctional sintering furnace temperature inspection instrument carrier |
| CN103604513A (en) * | 2013-11-21 | 2014-02-26 | 国网安徽省电力公司滁州供电公司 | Improved transformer substation temperature gauge support |
| CN104707954A (en) * | 2013-12-17 | 2015-06-17 | 北京有色金属研究总院 | Auxiliary temperature measurement system and method of semi-solid-state secondary heating device |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN101608988B (en) | Uni-directional stretching test clamp for warm shaping of metal plate | |
| CN103411996A (en) | Measuring equipment and measuring method for heat conductivity coefficients of solid materials | |
| CN104122448B (en) | High-temperature test fixture | |
| CN105806887A (en) | Measuring method and measuring jig for thermal resistance junction to case of power semiconductor device | |
| CN104111267A (en) | Thin film material Seebeck coefficient measuring instrument | |
| CN108896840B (en) | Device and method for in-situ real-time measurement of high-temperature piezoelectric strain constant of piezoelectric material | |
| CN102539000A (en) | Thermodetector bracket | |
| CN104280577A (en) | Electric connecting apparatus | |
| CN101776627A (en) | Method and device for measuring continuous cooling phase transformation points of aluminum alloy | |
| CN202453104U (en) | Supporting frame of temperature measuring instrument | |
| CN101504439B (en) | Poikilothermia Schottky diode characteristic tester | |
| CN103765568A (en) | System for the heat treatment of substrates, and method for detecting measurement data in said system | |
| CN102353468A (en) | Device for measuring temperature of solar cell sintering furnace and using method thereof | |
| CN110530927A (en) | A kind of thermoelectric material Seebeck coefficient test device and method | |
| CN204330183U (en) | A kind of Combined thermocouple assay furnace | |
| CN102799168A (en) | Non-contact heating temperature controller performance testing device | |
| CN105388181A (en) | Thermal resistance measurement sensor system | |
| CN110933784B (en) | One-dimensional heat transfer high-temperature uniform heating plate and heating device | |
| CN102621468A (en) | Detecting structure and detecting method for temperature coefficient of resistance (TCR) | |
| CN107255650A (en) | One kind is on thermoelectric material Seebeck coefficient testing methods | |
| CN103336024A (en) | Thermoelectric performance testing system for thermoelectric material | |
| CN202033113U (en) | Structure for testing welding temperature of solar cell piece | |
| CN206132673U (en) | A sample platform for going on high warm electrical parameter measuring | |
| CN105222991A (en) | Disc type solar energy condenser focussing plane energy flux density measuring method and measurement mechanism | |
| CN108680601A (en) | A kind of dry-type distribution transformer winding material non-destructive testing test clip |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C12 | Rejection of a patent application after its publication | ||
| RJ01 | Rejection of invention patent application after publication |
Application publication date: 20120704 |