CN202394939U - Ball grid array package structure with single buried base island, multiple circles of pins and passive device - Google Patents

Ball grid array package structure with single buried base island, multiple circles of pins and passive device Download PDF

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Publication number
CN202394939U
CN202394939U CN2011204862555U CN201120486255U CN202394939U CN 202394939 U CN202394939 U CN 202394939U CN 2011204862555 U CN2011204862555 U CN 2011204862555U CN 201120486255 U CN201120486255 U CN 201120486255U CN 202394939 U CN202394939 U CN 202394939U
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CN
China
Prior art keywords
pin
pins
passive device
interior
grid array
Prior art date
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Expired - Lifetime
Application number
CN2011204862555U
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Chinese (zh)
Inventor
王新潮
梁志忠
谢洁人
吴昊
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
JCET Group Co Ltd
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Jiangsu Changjiang Electronics Technology Co Ltd
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Filing date
Publication date
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Priority to CN2011204862555U priority Critical patent/CN202394939U/en
Application granted granted Critical
Publication of CN202394939U publication Critical patent/CN202394939U/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/93Batch processes
    • H01L24/95Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips
    • H01L24/97Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips the devices being connected to a common substrate, e.g. interposer, said common substrate being separable into individual assemblies after connecting
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/73Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
    • H01L2224/732Location after the connecting process
    • H01L2224/73251Location after the connecting process on different surfaces
    • H01L2224/73265Layer and wire connectors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/013Alloys
    • H01L2924/0132Binary Alloys
    • H01L2924/01322Eutectic Alloys, i.e. obtained by a liquid transforming into two solid phases
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/06Polymers
    • H01L2924/078Adhesive characteristics other than chemical
    • H01L2924/07802Adhesive characteristics other than chemical not being an ohmic electrical conductor
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/181Encapsulation

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  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Lead Frames For Integrated Circuits (AREA)

Abstract

The utility model relates to a ball grid array package structure with a single buried base island, multiple circles of pins and a passive device. The ball grid array package structure comprises a plurality of circles of external pins (1), wherein internal pins (3) are formed on the front sides of the external pins (1) in a multi-layer electroplating manner; chips (4) are arranged between the internal pins (3); the front sides of the chips (4) and the those of the internal pins (3) are connected through metal wires (5); the passive device (10) is arranged between the internal pins (3) in a bridging manner; plastic package materials (6) are wrapped and sealed outside the upper parts of both an internal base island (2) and the internal pins (3), as well as the chips (4) and the metal wires (5); and solder balls (9) are arranged at the backs of the external pins (1). The utility model has the benefits that a high-temperature resistant glue film at the back is omitted, so that the package cost is lowered; the selectable product types are wide; the bonding quality of the metal wires and the stability of the product reliability are good; the binding capabilities of both the plastic package body and the metal pins are strong; and high-density capability of internal pins is achieved.

Description

Single base island embedded many circle pin passive device ball grid array package structures
Technical field
The utility model relates to the base island embedded many circle pin passive device ball grid array package structures of a kind of list, belongs to the semiconductor packaging field.
Background technology
Traditional lead frame structure mainly contains two kinds:
First kind: after adopting metal substrate to carry out chemical etching and plating, stick the resistant to elevated temperatures glued membrane of one deck at the back side of metal substrate and form the leadframe carrier (as shown in Figure 3) that to carry out encapsulation process;
Second kind: employing is at first carried out chemistry at the back side of metal substrate and is etched partially; Again sealing of plastic packaging material carried out in the aforementioned zone that has etched partially through chemistry; The chemical etching of pin in afterwards the front of metal substrate being carried out; Carry out the plating on pin surface in the lead frame after the completion again, promptly accomplish the making (as shown in Figure 5) of lead frame.
And there has been following not enough point in above-mentioned two kinds of lead frames in encapsulation process:
First kind:
1, but the lead frame of this kind must stick the glued membrane of one deck costliness high temperature resistance because of the back side, so directly increased high cost;
2, also because but the glued membrane of one deck high temperature resistance must be sticked in the back side of the lead frame of this kind; So the load technology in encapsulation process can only be used conduction or nonconducting bonding material; And the technology that can not adopt eutectic technology and slicken solder is fully carried out load, so selectable product category just has bigger limitation;
3, again because but the glued membrane of one deck high temperature resistance must be sticked in the back side of the lead frame of this kind; And in the metal wire bonding technology in encapsulation process; Because but the glued membrane of this high temperature resistance is a soft materials; So caused the instability of metal wire bonding parameter, seriously influenced the quality of metal wire bonding and the stability of production reliability;
4, again because but the glued membrane of one deck high temperature resistance must be sticked in the back side of the lead frame of this kind; And the plastic package process process in encapsulation process; Infiltrate plastic packaging material because the injecting glue pressure during plastic packaging is easy to cause between lead frame and the glued membrane, and be that the kenel of conduction is because infiltrated plastic packaging material and become insulation pin (as shown in Figure 4) on the contrary the former metal leg that should belong to.
Second kind:
1, because carried out the etching operation of secondary respectively, so increased the cost of operation operation more;
2, the composition of lead frame be metallics add epoxy resin material (plastic packaging material) thus at high temperature easily because the expansion of different material and shrinkage stress inequality, generation lead frame warpage issues;
3, also because the warpage of lead frame directly has influence on the precision of the device chip in the packaging process and thereby yield is produced in the smooth and easy influence of lead frame transport process;
4, also because the warpage of lead frame directly has influence on the aligning accuracy of the metal wire bonding in the packaging process and thereby yield is produced in the smooth and easy influence of lead frame transport process;
5, because the positive interior pin of lead frame is to adopt etched technology, must be so the pin of pin is wide in the etching greater than 100 μ m, and the gap of interior pin and interior pin also must be greater than 100 μ m, so difficult high density ability of accomplishing interior pin.
Summary of the invention
The purpose of the utility model is to overcome above-mentioned deficiency; Provide a kind of list base island embedded many circle pin passive device ball grid array package structures, it has saved the high temperature resistant glued membrane at the back side, has reduced packaging cost; Selectable product category is wide; The quality of metal wire bonding and the good stability of production reliability, the constraint ability of plastic-sealed body and metal leg is big, has realized the high density ability of interior pin.
The purpose of the utility model is achieved in that the base island embedded many circle pin passive device ball grid array package structures of a kind of list; Be characterized in: it comprises outer pin; Said outer pin is provided with many circles, and said outer pin front forms interior pin through the multilayer plating mode, is provided with chip between said interior pin and the interior pin; Be connected with metal wire between said chip front side and the interior pin front; Cross-over connection has passive device between said interior pin and the interior pin, and said interior pin top and chip, metal wire and passive device are encapsulated with plastic packaging material outward, and zone that said outer pin is peripheral and the zone between outer pin and the outer pin are equipped with gap filler; And expose outside the gap filler at the back side of outer pin, and the back side of the outer pin outside exposing gap filler is provided with the tin ball.
Form interior Ji Dao through the multilayer plating mode between pin and the interior pin in said, basic island was positive in said chip was arranged at.
Said the first metal layer can adopt nickel, copper, nickel, palladium, five layers of metal level of gold or nickel, copper, silver-colored three-layer metal layer, perhaps other similar structures.With nickel, copper, nickel, palladium, five layers of metal level of gold is example; Wherein the ground floor nickel dam mainly plays the effect on anti-etching barrier layer; And middle copper layer, nickel dam and palladium layer mainly play a part to combine to increase, and outermost gold layer mainly plays the effect with the metal wire bonding.
Compared with prior art, the beneficial effect of the utility model is:
1, but the glued membrane of the expensive high temperature resistance of one deck need not sticked in the back side of this kind lead frame, so directly reduced high cost;
2, because the back surface of the lead frame does not require such a layer of paste-resistant temperature of the film, so that during the process of the package in addition to the conductive or non-conductive adhesive material, but also with eutectic process as well as soft solder process for loading, so a wider choice of species;
3,, guaranteed the stability of metal wire bonding parameter, guaranteed the stability of reliability of quality and the product of metal wire bonding again because but the glued membrane of one deck high temperature resistance need not sticked in the back side of the lead frame of this kind;
, thereby in the technical process of encapsulation, can not cause between lead frame and the glued membrane fully and infiltrate plastic packaging material 4, again because but the glued membrane of one deck high temperature resistance need not sticked in the back side of the lead frame of this kind;
5, because the fine rule electric plating method has been adopted in the front, so positive pin widths minimum can reach 25 μ m, and reach 25 μ m apart from minimum between interior pin and the interior pin, embody the high density ability of the interior pin of lead frame fully;
6, owing to used the plating mode and the back etched technology of positive interior pin; So can the pin in lead frame front be extended to as much as possible the next door of Ji Dao; Impel chip and pin distance significantly to shorten, so the cost of metal wire also can significantly reduce (the especially metal wire of expensive proof gold matter);
7, also because the shortening of metal wire makes the also speedup (especially the product of storage class and need the calculating of mass data more outstanding) significantly of signal output speed of chip; Because the length of metal wire has shortened, so also significantly reduce in the interference of the existing dead resistance of metal wire, parasitic capacitance and stray inductance to signal;
8, because of having used the plating elongation technology of interior pin,, make the volume and the area of encapsulation significantly to dwindle so can be easy to produce the distance between high pin number and highdensity pin and the pin;
9, because volume after being encapsulated is significantly dwindled, more directly embody material cost and significantly descend, because the minimizing of material usage has also reduced environmental issue puzzlements such as discarded object significantly.
10, when the plastic-sealed body paster is to pcb board; Because of implanting or be coated with the tin ball in the position at plastic-sealed body pin and Ji Dao; It is big that spacing between the plastic-sealed body back side and the pcb board becomes, and especially the problem that causes tin fusion difficulty can not blown because of hot blast in the inner ring pin of plastic-sealed body or zone, basic island.
When if 11 plastic-sealed body pasters are not fine to pcb board, need do over again again heavily and to paste, because there are enough height at the tin cream place, cleaning agent cleans easily, maintenance easily behind the tin ball of burn-oning does not weld to take away like the tin ball and welds a ball again again behind the tin ball and get final product.
Description of drawings
Fig. 1 is the base island embedded many circle pin passive device ball grid array package structure sketch mapes of a kind of list of the utility model.
Fig. 2 is the vertical view of Fig. 1.
Fig. 3 was not for there was the sketch map that high temperature resistant glued membrane is sticked at the pin lead frame back side on four sides in the past.
The sketch map of flash when the four sides that Fig. 4 sticks high temperature resistant glued membrane for the back side does not in the past have the pin leadframe package.
Fig. 5 was for sealed the structural representation of two-sided etched lead frame in the past in advance.
Wherein:
Outer pin 1
In basic island 2
Interior pin 3
Chip 4
Metal wire 5
Plastic packaging material 6
Gap filler 7
Conduction or non-conductive bonding material 8
Tin ball 9
Passive device 10.
Embodiment
Referring to Fig. 1, Fig. 2; The base island embedded many circle pin passive device ball grid array package structures of a kind of list of the utility model; It comprises outer pin 1; Said outer pin 1 is provided with many circles, pin 3 in said outer pin 1 front forms through the multilayer plating mode, basic island 2 in forming through the multilayer plating mode between said interior pin 3 and the interior pin 3; Basic island 2 is referred to as the first metal layer with interior pin 3 in said; 2 fronts, basic island are provided with chip 4 through conduction or non-conductive bonding material 8 in said, said chip 4 positive with interior pin 3 fronts between be connected with metal wire 5, between said interior pin 3 and the interior pin 3 through conducting electricity or 8 cross-over connections of non-conductive bonding material have passive device 10; Basic island 2 and interior pin 3 tops and chip 4, metal wire 5 and the passive device 10 outer plastic packaging materials 6 that are encapsulated with in said; Zone that said outer pin 1 is peripheral and the zone between outer pin 1 and the outer pin 1 are equipped with gap filler 7, and the back side of outer pin 1 exposes outside the gap filler 7, and the back side of the outer pin 1 outside exposing gap filler 7 is provided with tin ball 9.
Basic island 2 in also can not forming between pin 3 and the interior pin 3 in said through the multilayer plating mode; If basic island 2 in not forming between interior pin 3 and the interior pin 3, gap filler 7 fronts in chip 4 directly is arranged at through conduction or non-conductive bonding material 8 at this moment between pin 3 and the interior pin 3.

Claims (2)

1. base island embedded many circle pin passive device ball grid array package structures of a list; It is characterized in that: it comprises outer pin (1); Said outer pin (1) is provided with many circles; Said outer pin (1) is positive to form interior pin (3) through the multilayer plating mode; Be provided with chip (4) between pin (3) and the interior pin (3) in said, said chip (4) positive with interior pin (3) front between be connected with metal wire (5), cross-over connection has passive device (10) between said interior pin (3) and the interior pin (3); The outer plastic packaging material (6) that is encapsulated with of pin (3) top and chip (4), metal wire (5) and passive device (10) in said; Zone that said outer pin (1) is peripheral and the zone between outer pin (1) and the outer pin (1) are equipped with gap filler (7), and the back side of outer pin (1) exposes outside the gap filler (7), and the back side of the outer pin (1) outside exposing gap filler (7) is provided with tin ball (9).
2. the base island embedded many circle pin passive device ball grid array package structures of a kind of list according to claim 1; It is characterized in that: form interior Ji Dao (2) through the multilayer plating mode between pin (3) and the interior pin (3) in said, said chip (4) is arranged at interior Ji Dao (2) front.
CN2011204862555U 2011-11-30 2011-11-30 Ball grid array package structure with single buried base island, multiple circles of pins and passive device Expired - Lifetime CN202394939U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN2011204862555U CN202394939U (en) 2011-11-30 2011-11-30 Ball grid array package structure with single buried base island, multiple circles of pins and passive device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN2011204862555U CN202394939U (en) 2011-11-30 2011-11-30 Ball grid array package structure with single buried base island, multiple circles of pins and passive device

Publications (1)

Publication Number Publication Date
CN202394939U true CN202394939U (en) 2012-08-22

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ID=46669844

Family Applications (1)

Application Number Title Priority Date Filing Date
CN2011204862555U Expired - Lifetime CN202394939U (en) 2011-11-30 2011-11-30 Ball grid array package structure with single buried base island, multiple circles of pins and passive device

Country Status (1)

Country Link
CN (1) CN202394939U (en)

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Legal Events

Date Code Title Description
C14 Grant of patent or utility model
GR01 Patent grant
TR01 Transfer of patent right

Effective date of registration: 20161222

Address after: The 200127 Tianjin Tianjin FTA test area (Dongjiang Bonded Port) No. 6865 North Road, 1-1-1802-7 financial and trade center of Asia

Patentee after: Xin Xin finance leasing (Tianjin) Co., Ltd.

Address before: 214434 Binjiang Middle Road, Jiangyin Development Zone, Jiangsu, China, No. 275, No.

Patentee before: Jiangsu Changdian Sci. & Tech. Co., Ltd.

EE01 Entry into force of recordation of patent licensing contract
EE01 Entry into force of recordation of patent licensing contract

Assignee: Jiangsu Changjiang Electronics Technology Co., Ltd.

Assignor: Xin Xin finance leasing (Tianjin) Co., Ltd.

Contract record no.: 2017320000152

Denomination of utility model: Ball grid array package structure with single buried base island, multiple circles of pins and passive device

Granted publication date: 20120822

License type: Exclusive License

Record date: 20170614

EC01 Cancellation of recordation of patent licensing contract
EC01 Cancellation of recordation of patent licensing contract

Assignee: JIANGSU CHANGJIANG ELECTRONICS TECHNOLOGY Co.,Ltd.

Assignor: Xin Xin finance leasing (Tianjin) Co., Ltd.

Contract record no.: 2017320000152

Date of cancellation: 20200416

TR01 Transfer of patent right
TR01 Transfer of patent right

Effective date of registration: 20200424

Address after: 214434, No. 78, mayor road, Chengjiang, Jiangsu, Jiangyin, Wuxi

Patentee after: JIANGSU CHANGJIANG ELECTRONICS TECHNOLOGY Co.,Ltd.

Address before: 1-1-1802-7, North Zone, financial and Trade Center, No. 6865, Asia Road, Tianjin pilot free trade zone (Dongjiang Free Trade Port Area), Tianjin

Patentee before: Xin Xin finance leasing (Tianjin) Co., Ltd.

CX01 Expiry of patent term
CX01 Expiry of patent term

Granted publication date: 20120822