CN202392701U - Light box structure on chip test machine - Google Patents
Light box structure on chip test machine Download PDFInfo
- Publication number
- CN202392701U CN202392701U CN2011204973238U CN201120497323U CN202392701U CN 202392701 U CN202392701 U CN 202392701U CN 2011204973238 U CN2011204973238 U CN 2011204973238U CN 201120497323 U CN201120497323 U CN 201120497323U CN 202392701 U CN202392701 U CN 202392701U
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- China
- Prior art keywords
- lamp box
- box structure
- mounting flange
- testing machine
- light
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Abstract
The utility model relates to the field of a chip test, in particular to a light box structure on a chip test machine. The light box structure comprises a fixing plate, wherein the fixing plate is fixed on a base at the upper part of the chip test machine; a vertically-downward cylinder is arranged on the fixing plate; a drive end of the cylinder is connected with a light box fixing flange; a circuit substrate with multiple LEDs (light emitting diodes) is arranged on the bottom surface of the light box fixing flange; a luminous surface of the circuit substrate is covered by a layer or multiple layers of light filtering plates; the circuit substrate and the light filtering plate are mounted in a light filtering plate fixing flange; an upper pressure plate is fixed below the light filtering plate fixing flange; a through hole of an optical imaging lens corresponding to a test position is formed in the upper pressure plate; a lower pressure plate is arranged at the lower part of the upper pressure plate corresponding to each test position; and the optical imaging lens is mounted in the lower pressure plate. The light box structure provided by the utility model is provided with multiple induction lenses, and the component in the light box generates light and projects the light to multiple photosensitive chips to be tested so as to measure multiple photosensitive chips once and improve the test efficiency of the photosensitive chips.
Description
Technical field
The utility model relates to the chip testing field, the lamp box structure on especially a kind of chip testing machine.
Background technology
In the chip testing field, having a kind of is test to the image collection chip in camera or the camera; This type of detection generally detects through a lamp box; Lamp box passes through the luminous irradiation of camera sensitive chip; Chip testing machine can be tested each sensitive chip then, but existing sensitization lamp box generally all is separately sensitive chip to be tested, and large batch of test does not suit to carry out.
Summary of the invention
The invention provides the lamp box structure on a kind of chip testing machine that can once test a plurality of sensitive chips.
To achieve these goals, the lamp box structure on the chip testing machine of the utility model adopts following technical scheme:
It comprises that one is fixed in the fixed head on the chip testing machine top base; Described fixed head is provided with vertically downward a cylinder; The drive end of described cylinder connects a lamp box mounting flange, and lamp box mounting flange bottom surface is provided with the circuit substrate that has a plurality of LED, covers one or more layers filter on the light-emitting area of described circuit substrate; Described circuit substrate and filter are installed in the filter mounting flange; Be fixed with a top board below the described filter mounting flange, be provided with the through hole of corresponding each test position in the described top board, corresponding each test position, described top board bottom is provided with a lower platen; Each lower platen is provided with a screwed hole, and an optical imagery camera lens is installed in the screwed hole.
Preferably, be provided with insulation board between described lamp box mounting flange and the filter mounting flange.
Preferably, described every metafiltration tabula rasa is a multi-segment structure.
Preferably, be provided with the mounting groove that circuit substrate is installed in the described filter mounting flange, be provided with the optical filtering groove that the multistage filter is installed in the described mounting groove.
Preferably, described optical filtering groove is a multilevel hierarchy.
Preferably, described induction camera lens and lower platen are single file multiple row structure side by side.
Preferably, described filter mounting flange is provided with an air admission hole, and described lower platen is provided with outgassing groove.
Owing to adopted said structure; Lamp box structure on the chip testing machine of the utility model is provided with a plurality of optical imagery camera lenses; The inner parts of structure lamp box produce light and project a plurality of sensitive chips to be measured; Thereby realize once a plurality of sensitive chips being measured, improve the efficient of sensitive chip test.
Description of drawings
Fig. 1 is the parts explosive view of the utility model;
Fig. 2 is the front view after the assembling of the utility model;
Fig. 3 is the D place enlarged drawing among Fig. 2;
Fig. 4 is the utility model and pallet fit structure sketch map.
The utility model purpose, function and advantage will combine embodiment, further specify with reference to accompanying drawing.
The specific embodiment
Like Fig. 1-shown in Figure 4; Lamp box structure on the chip testing machine of the utility model embodiment comprises that one is fixed in the fixed head 1 on the chip testing machine top base; Described fixed head 1 is provided with vertically downward a cylinder 2; The drive end of described cylinder 2 connects a lamp box mounting flange 3, and lamp box mounting flange 3 bottom surfaces are provided with the circuit substrate 4 that has a plurality of LED, because LED is that spot light is in order to obtain soft uniform test light; Present embodiment covers one or more layers filter 5 on the light-emitting area of described circuit substrate 4; Comprise two-layer filter in the present embodiment, described circuit substrate 4 is installed in the filter mounting flange 6 with filter 5, is fixed with a top board 7 below the described filter mounting flange 6; Be provided with the through hole of the optical imagery camera lens 8 of corresponding each test position in the described top board 7; Corresponding each test position, described top board 7 bottoms is provided with a lower platen 9, and corresponding each the test position of lower platen is provided with a screwed hole position 92, and optical imagery camera lens 8 is installed in screwed hole position 92.
When lamp box mounting flange 3 and filter mounting flange 6 are metallic support,, be provided with insulation board 10 between described lamp box mounting flange 3 and the filter mounting flange 6 in order to keep the insulation between the two.
In the present embodiment; Described every metafiltration tabula rasa is a multi-segment structure; In order to hold the filter 5 of circuit substrate 4 and multi-segment structure, in described filter mounting flange 6, be provided with the mounting groove 61 that circuit substrate is installed, be provided with the optical filtering groove 62 that the multistage filter is installed in the described mounting groove.In order to realize the installation of multilayer filter, described optical filtering groove is a multilevel hierarchy, and in conjunction with the two-layer filter structure in the present embodiment, optical filtering groove 62 also is two-layer configuration accordingly.
In the present embodiment, described optical imagery camera lens 8 is a single file multiple row structure side by side with lower platen 9.
As shown in Figure 4, the lamp box structure of the chip testing machine of present embodiment is when work, and the pallet that is loaded with sensitive chip runs to assigned address, and the induction chip that lamp box structure presses down being arranged side by side detects; After test finished, lamp box structure rose, and pallet is further forward, is pressing down test; The above-mentioned course of work that circulates finishes until test, but lamp box structure in the process that rises, lower platen takes up tested sensitive chip easily; Make it break away from pallet, when sensitive chip adheres to the lower platen bottom, when press down next time; Then can the chip of adhesion be damaged, described top board 7 is provided with an air admission hole 71, and described lower platen 9 is provided with outgassing groove 91.
The above is merely the preferred embodiment of the utility model; Be not thus the restriction the utility model claim; Every equivalent structure or equivalent flow process conversion that utilizes the utility model specification and accompanying drawing content to be done; Or directly or indirectly be used in other relevant technical fields, all in like manner be included in the scope of patent protection of the utility model.
Claims (7)
1. the lamp box structure on the chip testing machine; It is characterized in that: comprise that one is fixed in the fixed head on the chip testing machine top base, described fixed head is provided with vertically downward a cylinder, and the drive end of described cylinder connects a lamp box mounting flange; Lamp box mounting flange bottom surface is provided with the circuit substrate that has a plurality of LED; Cover one or more layers filter on the light-emitting area of described circuit substrate, described circuit substrate and filter are installed in the filter mounting flange, are fixed with a top board below the described filter mounting flange; Be provided with the through hole of corresponding each test position in the described top board; Corresponding each test position, described top board bottom is provided with a lower platen, and each lower platen is provided with a screwed hole, and an optical imagery camera lens is installed in the screwed hole.
2. the lamp box structure on the chip testing machine as claimed in claim 1 is characterized in that: be provided with insulation board between described lamp box mounting flange and the filter mounting flange.
3. the lamp box structure on the chip testing machine as claimed in claim 2 is characterized in that: described every metafiltration tabula rasa is a multi-segment structure.
4. the lamp box structure on the chip testing machine as claimed in claim 3 is characterized in that: be provided with the mounting groove that circuit substrate is installed in the described filter mounting flange, be provided with the optical filtering groove that the multistage filter is installed in the described mounting groove.
5. the lamp box structure on the chip testing machine as claimed in claim 4 is characterized in that: described optical filtering groove is a multilevel hierarchy.
6. the lamp box structure on the chip testing machine as claimed in claim 5 is characterized in that: described induction camera lens and lower platen are single file multiple row structure side by side.
7. the lamp box structure on the chip testing machine as claimed in claim 6 is characterized in that: described filter mounting flange is provided with an air admission hole, and described lower platen is provided with outgassing groove.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2011204973238U CN202392701U (en) | 2011-12-02 | 2011-12-02 | Light box structure on chip test machine |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2011204973238U CN202392701U (en) | 2011-12-02 | 2011-12-02 | Light box structure on chip test machine |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN202392701U true CN202392701U (en) | 2012-08-22 |
Family
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2011204973238U Expired - Lifetime CN202392701U (en) | 2011-12-02 | 2011-12-02 | Light box structure on chip test machine |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN202392701U (en) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103439539A (en) * | 2013-09-03 | 2013-12-11 | 苏州创瑞机电科技有限公司 | Mega-pixel CMOS optical chip module automatic testing socket |
| CN104166064A (en) * | 2014-09-01 | 2014-11-26 | 苏州市吴中区胥口广博模具加工厂 | Circuit board photosensitive element testing device |
| CN106896315A (en) * | 2017-04-28 | 2017-06-27 | 上海捷策创电子科技有限公司 | A kind of sensitive chip test equipment |
| CN108620344A (en) * | 2017-03-21 | 2018-10-09 | 深圳市华宇半导体有限公司 | The automatic sensitive chip automatization test system of smart mobile phone and its control method |
| CN108668124A (en) * | 2017-04-01 | 2018-10-16 | 宁波舜宇光电信息有限公司 | The sensitive chip test method and equipment calculated based on charge |
-
2011
- 2011-12-02 CN CN2011204973238U patent/CN202392701U/en not_active Expired - Lifetime
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103439539A (en) * | 2013-09-03 | 2013-12-11 | 苏州创瑞机电科技有限公司 | Mega-pixel CMOS optical chip module automatic testing socket |
| CN104166064A (en) * | 2014-09-01 | 2014-11-26 | 苏州市吴中区胥口广博模具加工厂 | Circuit board photosensitive element testing device |
| CN108620344A (en) * | 2017-03-21 | 2018-10-09 | 深圳市华宇半导体有限公司 | The automatic sensitive chip automatization test system of smart mobile phone and its control method |
| CN108668124A (en) * | 2017-04-01 | 2018-10-16 | 宁波舜宇光电信息有限公司 | The sensitive chip test method and equipment calculated based on charge |
| CN108668124B (en) * | 2017-04-01 | 2021-03-02 | 宁波舜宇光电信息有限公司 | Photosensitive chip testing method and device based on charge calculation |
| CN106896315A (en) * | 2017-04-28 | 2017-06-27 | 上海捷策创电子科技有限公司 | A kind of sensitive chip test equipment |
| CN106896315B (en) * | 2017-04-28 | 2023-12-08 | 上海捷策创电子科技有限公司 | Photosensitive chip test equipment |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| EE01 | Entry into force of recordation of patent licensing contract |
Assignee: Shenzhen Kun Kun science and Technology Industrial Co., Ltd. Assignor: Jin Yingjie Contract record no.: 2012440020281 Denomination of utility model: Light box structure on chip test machine Granted publication date: 20120822 License type: Exclusive License Record date: 20121109 |
|
| LICC | Enforcement, change and cancellation of record of contracts on the licence for exploitation of a patent or utility model | ||
| CX01 | Expiry of patent term | ||
| CX01 | Expiry of patent term |
Granted publication date: 20120822 |