CN201749175U - I-V characteristic test system used for solar battery chips and components - Google Patents
I-V characteristic test system used for solar battery chips and components Download PDFInfo
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- CN201749175U CN201749175U CN2010201300458U CN201020130045U CN201749175U CN 201749175 U CN201749175 U CN 201749175U CN 2010201300458 U CN2010201300458 U CN 2010201300458U CN 201020130045 U CN201020130045 U CN 201020130045U CN 201749175 U CN201749175 U CN 201749175U
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Abstract
The utility model discloses an I-V characteristic test system used for solar battery chips and components. The system comprises a simulated sunlight test environment, an I-V test circuit and a multi-way data collector; the simulated sunlight test environment includes a constant temperature test box with controllable and adjustable temperature, a simulated sunlight long-arc xenon lamp and an irradiance meter, the simulated sunlight long-arc xenon lamp is arranged in the test box, and the power of the simulated sunlight long-arc xenon lamp can be continuously adjusted; the I-V test circuit includes an adjustable electronic load and a current sampler; and the voltage and the current to be tested of a sample, and the control temperature and the irradiance in the test process are processed by the multi-way data collector. The utility model has the advantages that the intensity of simulated sunlight can be continuously adjusted; the temperature of the test environment is adjustable and controllable; the irradiance of a light source can be continuously monitored; and the test system has the test capability of processing single-chips and components or multi-chips and components.
Description
Technical field
The utility model relates to solar cell, specifically is meant the I-V characteristic test system of solar battery chip and assembly.
Background technology
Traditional solar cell and assembly I-V characteristic test have impulsive measurement and continuous light to measure two kinds.The at present common general light source area of continuous light test macro is less, the scope of tested object is narrower, and test light is strong fixed, and the scope of voltage-measurable and electric current is all less, temperature, irradiance can not be monitored in real time, not too are fit to the present solar chip and the development need of assembly.
Summary of the invention
Problem based on above-mentioned prior art existence, the purpose of this utility model is to propose a kind of simulated solar irradiation test environment that repeats, the scope of voltage-measurable and electric current is all bigger, temperature, irradiance can be monitored in real time, the I-V characteristic test system of can be simultaneously a plurality of solar battery chips and assembly being tested.
A kind of I-V characteristic test system that is used for solar battery chip and assembly of the present utility model comprises: simulated solar irradiation test environment, I-V test circuit and multi-channel data acquisition device.
Described simulated solar irradiation test environment is by the adjustable constant temperature test box of Controllable Temperature, and the irradiance that simulated solar irradiation xenon long-arc lamp, irradiance meter, the placement that places the power of test box to regulate continuously detects simulated solar irradiation is taken into account the operator's console of sample and formed.
Described I-V test circuit is made up of adjustable electronic load and current sampler.
The tested electric current of the tested voltage and current sampling thief output of sample chip or assembly two ends, temperature of controlling in the test process and irradiance carry out data processing by the multi-channel data acquisition device.
The utility model has the advantages that: the simulated solar irradiation light intensity is adjustable continuously; It is controlled that the temperature of test environment is adjustable; But the irradiance continuous monitoring of light source; Have the power of test of handling single-chip and assembly or multicore sheet and assembly, the core number that the native system maximum can be tested simultaneously is 8.Test chip and assembly can the survey scope be: Voc (adds attenuator voltage-measurable is brought up to 100 volts or higher) from 0.5 volt to 50 volts, and Isc is from 0.1 milliampere to 10 amperes.
Description of drawings
Fig. 1 is the cross-sectional view of constant temperature test box.
Fig. 2 is the distribution schematic diagram of xenon long-arc lamp at the test box inner top surface.
Fig. 3 is the current sampler schematic diagram.
Fig. 4 is an I-V characteristic test electrical connection graph.
Embodiment
Below in conjunction with accompanying drawing embodiment of the present utility model is described in further detail:
End face in the constant temperature test box 1 is evenly equipped with four continuously adjustable xenon long-arc lamps 2 of power and makes up the simulated solar radiant.Every xenon long-arc lamp range of adjustment is: 0-1500 watt.Because the power of light source can be regulated continuously, the irradiance test condition that we can obtain wanting, the response characteristic of testing solar battery chip under the various conditions or assembly.Irradiance is adjustable from 0.2sun to 1.0sun.
The irradiance of light source is by placing the irradiance meter 3 in the test box 1 to survey, and its data are carried out data processing by the multi-channel data acquisition device.The irradiance probe has one-level probe and secondary probe, when precision measurement, considers to adopt the one-level probe, when common test, considers to adopt the secondary probe.Present embodiment adopts the product of Italian DeltaOHM company, the sensitivity parameter that provides above according to probe:
Internal resistance: 36.2 ohm;
Sensitivity: 14.56uV/ (W/m
2);
Field range: 2 π sr;
Spectral range: 305nm-2800nm (50%);
335nm-2200nm(95％)；
Operating temperature range :-40 ℃-80 ℃;
Weight: 0.45Kg;
We have made an enlargement factor is 68.68 low drift low noise amplifier, and its output response is: the 1sun/l volt.
Temperature and humidity in the constant temperature test box 1 is surveyed by temperature sensor 6 that places constant temperature test box sidewall and humidity sensor 7, and its data are carried out data processing by the multi-channel data acquisition device.
Multi-channel data acquisition device 8: can select suitable multi-channel data acquisition device according to user's oneself needs, as the product of KEITHLEY, GRAPHTEC or other company.Our system has adopted the GL-800 of GRAPHTEC company, and it is the automatic data acquisition device of one 20 passage.20 test channel for this equipment have two basic test channel: one is used for the test environment temperature, and another is used for the irradiance of testing light source.Outside these two basic passages, keep two channel standbies, if needed, can test other parameter (as humidity etc.).For remaining 16 test channel, we are divided into 8 groups to them; Every group comprises two test channel, is used for testing a solar battery chip or assembly, and one of them passage is used for test voltage, and another passage is surveyed electric current.
The multi-channel data acquisition device can connect computing machine or carry out data acquisition with addition of USB storage merely by netting twine, and the fastest sampling time is 100 milliseconds.The USB storage of an external 8G with the fastest sample rate work, was 1 year writing time.Tested object is: voltage, temperature (using the Pt100 thermal resistance), humidity (using the B-530 humidity sensor to do 0 volt to 1 volt ratio conversion of voltage).
Current measurement in the I-V test:, current signal must be converted to suitable voltage signal and carry out data acquisition because the automatic data acquisition device that we use can only be gathered voltage signal.For this reason, we have designed current sampler 9 and have finished this work, and current sampler is made up of sampling resistor and low drift low noise amplifier.We have made four current samplers according to the difference of measurement range, and the range of current that can survey is respectively: 1mA/1 volt, 10mA/1 volt, 0.1A/1 volt and 1A/1 volt.Our range of current that can survey has satisfied the testing requirement of different solar battery chips from 0.1mA to 10A like this.
I-V test is adopted and is decided voltage operation mode, the selecting for use of adjustable electronic load 10: according to the watt level of test chip, should select for use different adjustable electronic loads to measure.In our system, adopted the adjustable electronic load of a 120W.For the test of powerful solar battery chip, can select powerful adjustable electronic load for use, as 200W, 250W, 300W, 500W etc.
For each solar battery chip or assembly two test signals are arranged, correspond respectively to the voltage and current signal of tested solar chip or assembly.They are sent in the GL-800 automatic data acquisition device with temperature signal and irradiance signal and handle.
The subsequent treatment of test data: we can utilize the proprietary data converse routine to convert it data file of EXCEL form to very easily by the I-V performance data that GL-800 automatic data acquisition device measures, and then can obtain the I-V curve very easily.The P-V curve be can obtain from the I-V curve, and then all characteristic parameters: Voc, Isc, Vm, Im, Pm, FF, η obtained.
Claims (2)
1. I-V characteristic test system that is used for solar battery chip and assembly, comprising: simulated solar irradiation test environment, I-V test circuit and multi-channel data acquisition device (8) is characterized in that:
Described simulated solar irradiation test environment is by the adjustable constant temperature test box (1) of Controllable Temperature, places simulated solar irradiation xenon long-arc lamp (2), irradiance meter (3) that the power of test box can regulate continuously, places the irradiance meter (3) that detects simulated solar irradiation and the operator's console (5) of sample (4) is formed;
Described I-V test circuit is made up of adjustable electronic load (10) and current sampler (9);
The tested electric current of the tested voltage and current sampling thief output of sample (4), temperature of controlling in the test process and irradiance carry out data processing by multi-channel data acquisition device (8).
2. according to a kind of I-V characteristic test system that is used for solar battery chip and assembly of claim 1, it is characterized in that: described current sampler is made up of sampling resistor and low drift low noise amplifier.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2010201300458U CN201749175U (en) | 2010-03-12 | 2010-03-12 | I-V characteristic test system used for solar battery chips and components |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2010201300458U CN201749175U (en) | 2010-03-12 | 2010-03-12 | I-V characteristic test system used for solar battery chips and components |
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| CN201749175U true CN201749175U (en) | 2011-02-16 |
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| CN2010201300458U Expired - Fee Related CN201749175U (en) | 2010-03-12 | 2010-03-12 | I-V characteristic test system used for solar battery chips and components |
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Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102183719A (en) * | 2011-03-08 | 2011-09-14 | 中山大学 | IV (current-voltage) characteristic simulation test method of solar cell or module |
| CN102520330A (en) * | 2011-12-01 | 2012-06-27 | 华中科技大学 | Volt-ampere characteristic testing system of solar cell photovoltaic device |
| CN103399246A (en) * | 2013-08-29 | 2013-11-20 | 雷海平 | Automatic detection and classification control system for electric properties of battery piece |
| CN104135231A (en) * | 2014-08-22 | 2014-11-05 | 张从尧 | Solar cell performance tester |
| CN104237790A (en) * | 2013-06-09 | 2014-12-24 | 国家纳米科学中心 | Device and method for measuring service life of solar cell |
| CN104635038A (en) * | 2013-11-15 | 2015-05-20 | 江苏天宇光伏科技有限公司 | Method for measuring small cell panel component by electronic load meter |
| CN109490781A (en) * | 2018-11-13 | 2019-03-19 | 中山瑞科新能源有限公司 | A kind of method for rapidly testing for CdTe solar battery stable electrical parameter |
| CN114236363A (en) * | 2022-01-04 | 2022-03-25 | 深圳凯瑞通电子有限公司 | Stability testing method and system based on integrated circuit chip |
-
2010
- 2010-03-12 CN CN2010201300458U patent/CN201749175U/en not_active Expired - Fee Related
Cited By (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102183719A (en) * | 2011-03-08 | 2011-09-14 | 中山大学 | IV (current-voltage) characteristic simulation test method of solar cell or module |
| CN102183719B (en) * | 2011-03-08 | 2013-07-03 | 中山大学 | IV (current-voltage) characteristic simulation test method of solar cell or module |
| CN102520330A (en) * | 2011-12-01 | 2012-06-27 | 华中科技大学 | Volt-ampere characteristic testing system of solar cell photovoltaic device |
| CN102520330B (en) * | 2011-12-01 | 2014-01-22 | 华中科技大学 | Volt-ampere characteristic testing system of solar cell photovoltaic device |
| CN104237790A (en) * | 2013-06-09 | 2014-12-24 | 国家纳米科学中心 | Device and method for measuring service life of solar cell |
| CN103399246A (en) * | 2013-08-29 | 2013-11-20 | 雷海平 | Automatic detection and classification control system for electric properties of battery piece |
| CN103399246B (en) * | 2013-08-29 | 2015-12-23 | 烟台市牟平海联联合有限责任公司 | A kind of electrical performance of cell detects and control system of classifying automatically |
| CN104635038A (en) * | 2013-11-15 | 2015-05-20 | 江苏天宇光伏科技有限公司 | Method for measuring small cell panel component by electronic load meter |
| CN104135231A (en) * | 2014-08-22 | 2014-11-05 | 张从尧 | Solar cell performance tester |
| CN109490781A (en) * | 2018-11-13 | 2019-03-19 | 中山瑞科新能源有限公司 | A kind of method for rapidly testing for CdTe solar battery stable electrical parameter |
| CN114236363A (en) * | 2022-01-04 | 2022-03-25 | 深圳凯瑞通电子有限公司 | Stability testing method and system based on integrated circuit chip |
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Legal Events
| Date | Code | Title | Description |
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| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20110216 Termination date: 20140312 |