CN201749079U - Infrared laser grinding defect detecting device - Google Patents
Infrared laser grinding defect detecting device Download PDFInfo
- Publication number
- CN201749079U CN201749079U CN2010202727412U CN201020272741U CN201749079U CN 201749079 U CN201749079 U CN 201749079U CN 2010202727412 U CN2010202727412 U CN 2010202727412U CN 201020272741 U CN201020272741 U CN 201020272741U CN 201749079 U CN201749079 U CN 201749079U
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- laser
- laser beam
- polishing scratch
- sample
- grinding defect
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Abstract
The utility model discloses an infrared laser grinding defect detecting device, which comprises a grinding defect system, a workbench sample and clamp system, a control system and a detecting examining system. The grinding defect system is composed of a long-pulse infrared grinding defect laser and a laser beam inlet optical system equipped below the grinding defect laser. The laser beam inlet optical system comprises an adjustable cable, a spectroscope, a light guiding system and a focus lens. The workbench sample and clamp system is equipped below the laser beam inlet optical system and composed of a feeding mechanism, a workbench, a clamp and a sample. The control system is composed of a controller, a laser power supply, a control module and a photo-diode trigger switch. The detecting examining system comprises a signal detecting examining system and a laser beam parameter detecting module. The utility model is enabled to detect the bonding interface between a sample covering material and a base.
Description
Technical field
The utility model relates to a kind of detecting instrument, and more particularly, the utility model relates to a kind of material interface bonding state pick-up unit.
Background technology
One of important means that improves the material surface performance is to cover other materials at material surface, the detection method of the interface bonding state of cladding material and matrix material has indentation method, bending methods etc. are multiple, be that interface bonding state by the test material sample carries out, but all there is its limitation Buddhist monk problem to be solved in these methods on measuring technique and Mechanics Calculation, be in particular in measurement data instability with a kind of method, the numerical value that diverse ways records differs greatly sometimes, therefore need seek the problem that new technology solves the detection method existence of existing sample cladding material-basal body interface bonding state.
The utility model content
The utility model proposes the infrared laser polishing scratch pick-up unit of the accurate test samples cladding material of a kind of energy-basal body interface bonding state at the deficiencies in the prior art.
The utility model is achieved through the following technical solutions technical goal.
Infrared laser polishing scratch pick-up unit, it comprises polishing scratch system, worktable and specimen holder system, control system; Described polishing scratch system is made up of polishing scratch laser instrument and the incoming laser beam light path system that is arranged on below the polishing scratch laser instrument, and described incoming laser beam light path system comprises adjustable optical cable, spectroscope, light-conducting system and the focus lamp of layout from top to bottom; Described worktable and specimen holder system are arranged on below the incoming laser beam light path system, are made up of feed mechanism, worktable, anchor clamps and sample; Described control system is made up of controller, laser power supply and control module, photodiode trigger switch; Its improvements are: the laser of described polishing scratch laser instrument is the long pulse infrared laser; Be provided with to detect and examine analysis system, described input is examined analysis system and is comprised that input examines analysis system, parameters of laser beam detection module.
In the said structure: the incoming laser beam light path system direct radiation specimen surface that the long pulse infrared laser beam that is sent by the polishing scratch laser instrument is formed via adjustable optical cable, spectroscope, light-conducting system, focus lamp etc., by laser power supply and control module laser energy is increased continuously, simultaneously controller make feed system drive worktable and on anchor clamps and sample do feed motion, thereby make laser produce polishing scratch, destroy until cladding material-basal body interface at specimen surface.Input is examined detected parameters such as analysis system test samples faying face stress, strain, surface heat reflected signal, the ellipse number of believing one side only, and the input is made up of signal detection system and parameters of laser beam detection module of input examines analysis system and examines and analyse, and judges the critical point of specimen surface destruction.With cladding material-pairing parameters of laser beam of basal body interface exfoliation, come characterization sample cladding material-basal body interface bond strength in conjunction with detected parameters mensuration and cladding material, matrix material physical parameter.
The utility model compared with prior art has following good effect: can accurate test samples cladding material-basal body interface bonding state.
Description of drawings
Fig. 1 is a principle schematic of the present utility model.
Embodiment
The utility model is described in further detail with reference to the accompanying drawings and in conjunction with the embodiments below.
Infrared laser polishing scratch pick-up unit, it comprises that polishing scratch system, worktable and specimen holder system, control system and detection examine analysis system; Described polishing scratch system is made up of polishing scratch laser instrument 1 and the incoming laser beam light path system that is arranged on below the polishing scratch laser instrument 1, and the laser of described polishing scratch laser instrument 1 is the long pulse infrared laser; Described incoming laser beam light path system comprises adjustable optical cable 2, spectroscope 4, light-conducting system 5 and the focus lamp of arranging 6 from top to bottom; Described worktable and specimen holder system are arranged on below the incoming laser beam light path system, are made up of feed mechanism 10, worktable 9, anchor clamps 8 and sample 7; Described control system is made up of with control module 14, photodiode trigger switch 3 controller 13, laser power supply; Described detection is examined analysis system and is comprised that input examines analysis system 11, parameters of laser beam detection module 12.
The utility model is performed such the test of sample cladding material-basal body interface bonding state: incoming laser beam light path system direct radiation sample 7 surfaces that the long pulse infrared laser beam that is sent by polishing scratch laser instrument 1 is formed via adjustable optical cable 2, spectroscope 4, light-conducting system 5, focus lamp 6 etc., by laser power supply and control module 14 laser energy is increased continuously, simultaneously controller 13 make feed system 10 drive worktable 9 and on anchor clamps 8 and sample 7 do feed motion, thereby make laser produce polishing scratch at specimen surface.Input is examined detected parameters such as analysis system test samples faying face stress, strain, surface heat reflected signal, the ellipse number of believing one side only, and the input is made up of signal detection system 11 and parameters of laser beam detection module 12 of input examines analysis system and examines and analyse, and judges the critical point of specimen surface destruction.With cladding material-pairing parameters of laser beam of basal body interface exfoliation, come characterization sample cladding material-basal body interface bond strength in conjunction with detected parameters mensuration and cladding material, matrix material physical parameter.
The utility model is test samples cladding material-basal body interface bonding state accurately.
Claims (1)
1. infrared laser polishing scratch pick-up unit, it comprises polishing scratch system, worktable and specimen holder system, control system; Described polishing scratch system is made up of polishing scratch laser instrument (1) and the incoming laser beam light path system that is arranged on below the polishing scratch laser instrument (1), and described incoming laser beam light path system comprises adjustable optical cable (2), spectroscope (4), light-conducting system (5) and the focus lamp (6) of layout from top to bottom; Described worktable and specimen holder system are arranged on below the incoming laser beam light path system, are made up of feed mechanism (10), worktable (9), anchor clamps (8) and sample (7); Described control system is made up of with control module (14), photodiode trigger switch (3) controller (13), laser power supply; It is characterized in that: the laser of described polishing scratch laser instrument (1) is the long pulse infrared laser; Be provided with to detect and examine analysis system, described input is examined analysis system and is comprised that input examines analysis system (11), parameters of laser beam detection module (12).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2010202727412U CN201749079U (en) | 2010-07-28 | 2010-07-28 | Infrared laser grinding defect detecting device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2010202727412U CN201749079U (en) | 2010-07-28 | 2010-07-28 | Infrared laser grinding defect detecting device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN201749079U true CN201749079U (en) | 2011-02-16 |
Family
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2010202727412U Expired - Fee Related CN201749079U (en) | 2010-07-28 | 2010-07-28 | Infrared laser grinding defect detecting device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN201749079U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101936876A (en) * | 2010-07-28 | 2011-01-05 | 泰州市天创仪器有限公司 | Infrared laser grinding crack detecting device |
-
2010
- 2010-07-28 CN CN2010202727412U patent/CN201749079U/en not_active Expired - Fee Related
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101936876A (en) * | 2010-07-28 | 2011-01-05 | 泰州市天创仪器有限公司 | Infrared laser grinding crack detecting device |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C17 | Cessation of patent right | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20110216 Termination date: 20110728 |