CN200958995Y - Microelement analyzer - Google Patents
Microelement analyzer Download PDFInfo
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- CN200958995Y CN200958995Y CN 200620074969 CN200620074969U CN200958995Y CN 200958995 Y CN200958995 Y CN 200958995Y CN 200620074969 CN200620074969 CN 200620074969 CN 200620074969 U CN200620074969 U CN 200620074969U CN 200958995 Y CN200958995 Y CN 200958995Y
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- amplifying circuit
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Abstract
The utility model relates to a metallic element analyzer, solving the problem of that the existing microcomputer analyzer needs to replace light sources with different wavelengths for testing while analyzing multielements, including a plurality of channels, a multiway selection switch, an amplifying circuit, an AD converting circuit, a processor, an output unit and a rectifying voltage regulator circuit. Each channel includes the light source, a cuvette and an optical electrical converter. An output signal of the optical electrical converter of each channel is connected with the amplifying circuit by the multiway selection switch, which is transmitted to the processor for data processing through the AD converting circuit after being amplified by the amplifying circuit. The channels are provided to be six. After adding three channels, customers can not only independently choose the element which needs to be tested and the light source wavelength which is selected, but set different parameters for testing. The utility model is in particular applicable to analyze the multielement contents such as manganese, phosphorus, silicon, nickel, chromium, copper, zinc, titanium, magnesium and lead, etc of alloy steels and cast irons without complicated adjustments, which has a simple and convenient use, an accurate measurement and a smaller inaccuracy.
Description
Technical field
The utility model relates to a kind of metallic element analyzer, belong to photoelectricity and field of analytic instrument.
Technical background
Along with progress of science and technology, all trades and professions require generally to improve to product quality, and each large and small iron and steel and foundry enterprise are more and more accurate to the content requirement of the various elements in the metal materials such as iron and steel.In order to test the content of essential element in the iron and steel such as manganese, phosphorus, silicon, each analytical instrument factory has produced a kind of microcomputer elemental analyser that utilizes the element of photoelectric colorimetry principle design.
Existing element microcomputer elemental analyser, generally comprise three passages, amplifying circuit, A/D convertor circuit, processor, output unit, regulator rectifier circuit, each passage includes light source, the cuvette of splendid attire detected solution, photoelectric commutator, the output signal of the photoelectric commutator of each passage connects amplifying circuit, after amplifying circuit amplifies, send into processor through A/D convertor circuit again and carry out data processing, export the output unit that is connected with processor again to, regulator rectifier circuit is a light source, photoelectric commutator, amplifying circuit, A/D convertor circuit, processor, output unit provides power supply.Please the RY-RS-1 type microcomputer elemental analyser that Analytical Instrument Co., Ltd produces as Nanjing benevolence.Its principle of work is the light transmission cuvette of light source generation and detected solution wherein, shine on the photoelectric commutator, photoelectric commutator becomes light signal into electric signal output, this signal is changed laggard line data through amplification, AD and is handled, and calculates the concentration of detected solution according to the size of photoelectric commutator output electric signal.
In the existing analyser three adopt fixed wave length than the light source in the chrominance channel, have adapted to the needs of ordinary steel, iron being analyzed manganese, phosphorus, silicone content.But with analyser in the alloy steel when the content of other multielements such as the nickel manganese, phosphorus, the silicon, chromium, copper, zinc, titanium, magnesium, lead is analyzed, because this instrument has only the passage of three fixed wave length, usually need to change light source and solve, bring inconvenience to the user.In addition, because the illumination intensity of light source difference of various wavelength, the sensitivity of accepting pick-up unit exists than big-difference, causes and changes back adjustment difficulty, and error is bigger, influences the actual measurement effect.
Summary of the invention
The utility model solves is that existing microcomputer elemental analyser need be changed the problem that the light source of different wave length is tested when multielement is analyzed, the present invention is on original triple channel basis, increased the ratio chrominance channel of three configurable different wave lengths in addition, the multiple element of analyzing fast, easily in the alloy material for the user has brought convenience.
Microcomputer elemental analyser of the present invention, comprise a plurality of passages, multidiameter option switch, amplifying circuit, A/D convertor circuit, processor, output unit, regulator rectifier circuit, each passage includes light source, cuvette, photoelectric commutator, the output signal of the photoelectric commutator of each passage connects amplifying circuit by multidiameter option switch, after amplifying circuit amplifies, send into processor through A/D convertor circuit again and carry out data processing, export the output unit that is connected with processor again to, regulator rectifier circuit is a light source, photoelectric commutator, amplifying circuit, A/D convertor circuit, processor, output unit provides power supply, described port number is 4-6, is preferably 6.
Above-mentioned microcomputer elemental analyser, described light source are halogen tungsten lamp, xenon lamp, light emitting diode, laser instrument or grating beam splitting monochromator; Described photoelectric commutator is a photoelectric cell.
After increasing by three passages, can different parameters be set test by the element of the autonomous required test of selection of user and selected optical source wavelength.The content that is specially adapted to alloy steel, cast iron etc. are carried out multielements such as manganese, phosphorus, silicon, nickel, chromium, copper, zinc, titanium, magnesium, lead is analyzed; And need not to carry out loaded down with trivial details adjustment, easy to use; Measure accurately, error is less.
Description of drawings
Fig. 1 is the structural representation (block diagram) of the utility model embodiment.
Embodiment
Microcomputer elemental analyser shown in Fig. 1, comprise passage 11,12 ... totally 6 passages such as 16 grades, and each passage includes light source, cuvette, photoelectric commutator.As, passage 11 comprises light source 11-1, cuvette 11-2, photoelectric commutator 11-3; Passage 12 comprises light source 12-1, cuvette 12-2, photoelectric commutator 12-3; Passage 16 comprises light source 16-1, cuvette 16-2, photoelectric commutator 16-3.
Above-mentioned light source all adopts light emitting diode, and above-mentioned photoelectric commutator all adopts photoelectric cell.
The photronic output signal of each passage connects amplifying circuit 3 by multidiameter option switch 2, after amplifying circuit 3 amplifies, send into processor 5 through A/D convertor circuit 4 again and carry out data processing, export the output unit 6 (as display) that is connected with processor 5 again to and show.Regulator rectifier circuit 7 provides power supply for light emitting diode, photoelectric cell, amplifying circuit 3, A/D convertor circuit 4, processor 5, output unit 6.
This instrument has increased by three than the chrominance channel in the middle of the process that original triple channel microcomputer elemental analyser is expanded, and has correspondingly increased the tapping device of three different light sources, three cuvettes, three photoelectric cells and newly-increased three cuvettes.Because six passages adopt separate working method, can different circuit parameters be set to different light sources, make the photoelectric cell as receiving end be in optimum Working, guarantee the accuracy of test.
The electric signal of photoelectric cell output is transported to multidiameter option switch respectively, by the user operate select different states signal is delivered to that amplifying circuit carries out that signal amplifies and after the AD conversion is delivered to main equipment board to carry out data processing output show.For example: needing the content of test manganese element in the alloying metal in certain, according to chemical assay method, need be that the light source of 530nm is tested with wavelength.So we select light source 11-1 to test.We place passage 11 with multidiameter option switch, adjust light source regulation voltage device and make photronic output voltage at (this parameter is generally tested before instrument dispatches from the factory) about 150mv.After adjusting the corresponding full scale, zero-bit of passage, can test normally.
Claims (4)
1. microcomputer elemental analyser, comprise a plurality of passages, multidiameter option switch, amplifying circuit, A/D convertor circuit, processor, output unit, regulator rectifier circuit, each passage includes light source, cuvette, photoelectric commutator, the output signal of the photoelectric commutator of each passage connects amplifying circuit by multidiameter option switch, after amplifying circuit amplifies, send into processor through A/D convertor circuit again and carry out data processing, export the output unit that is connected with processor again to, regulator rectifier circuit is a light source, photoelectric commutator, amplifying circuit, A/D convertor circuit, processor, output unit provides power supply, it is characterized in that: described port number is 4-6.
2. microcomputer elemental analyser according to claim 1, described port number are 6.
3. microcomputer elemental analyser according to claim 1 and 2 is characterized in that: described light source is halogen tungsten lamp, xenon lamp, light emitting diode, laser instrument or grating beam splitting monochromator.
4. microcomputer elemental analyser according to claim 1 and 2 is characterized in that: described photoelectric commutator is a photoelectric cell.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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CN 200620074969 CN200958995Y (en) | 2006-07-20 | 2006-07-20 | Microelement analyzer |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
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CN 200620074969 CN200958995Y (en) | 2006-07-20 | 2006-07-20 | Microelement analyzer |
Publications (1)
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CN200958995Y true CN200958995Y (en) | 2007-10-10 |
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CN 200620074969 Expired - Fee Related CN200958995Y (en) | 2006-07-20 | 2006-07-20 | Microelement analyzer |
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Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102359972A (en) * | 2011-07-18 | 2012-02-22 | 山西太钢不锈钢股份有限公司 | Full-elemental analysis method for stainless steel sample |
CN102374984A (en) * | 2010-08-10 | 2012-03-14 | 北京北机机电工业有限责任公司 | Method for measuring nickel content in low alloy steel by spectrophotometry |
CN108957083A (en) * | 2017-05-18 | 2018-12-07 | 罗德施瓦兹两合股份有限公司 | Electrical test and measuring device, measurement expansion equipment and test and measuring system |
-
2006
- 2006-07-20 CN CN 200620074969 patent/CN200958995Y/en not_active Expired - Fee Related
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102374984A (en) * | 2010-08-10 | 2012-03-14 | 北京北机机电工业有限责任公司 | Method for measuring nickel content in low alloy steel by spectrophotometry |
CN102374984B (en) * | 2010-08-10 | 2013-07-10 | 北京北机机电工业有限责任公司 | Method for measuring nickel content in low alloy steel by spectrophotometry |
CN102359972A (en) * | 2011-07-18 | 2012-02-22 | 山西太钢不锈钢股份有限公司 | Full-elemental analysis method for stainless steel sample |
CN108957083A (en) * | 2017-05-18 | 2018-12-07 | 罗德施瓦兹两合股份有限公司 | Electrical test and measuring device, measurement expansion equipment and test and measuring system |
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C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
C19 | Lapse of patent right due to non-payment of the annual fee | ||
CF01 | Termination of patent right due to non-payment of annual fee |