CN1981291B - 基于激光的用于处理目标表面材料的方法 - Google Patents
基于激光的用于处理目标表面材料的方法 Download PDFInfo
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- CN1981291B CN1981291B CN200580022203.XA CN200580022203A CN1981291B CN 1981291 B CN1981291 B CN 1981291B CN 200580022203 A CN200580022203 A CN 200580022203A CN 1981291 B CN1981291 B CN 1981291B
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Abstract
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Applications Claiming Priority (6)
Application Number | Priority Date | Filing Date | Title |
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US58426804P | 2004-06-30 | 2004-06-30 | |
US60/584,268 | 2004-06-30 | ||
US1520905A | 2005-06-14 | 2005-06-14 | |
US11/152,509 | 2005-06-14 | ||
US11/152,09 | 2005-06-14 | ||
PCT/US2005/021955 WO2006012124A2 (en) | 2004-06-30 | 2005-06-21 | Laser-based method and system for processing targeted surface material and article produced thereby |
Publications (2)
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CN1981291A CN1981291A (zh) | 2007-06-13 |
CN1981291B true CN1981291B (zh) | 2011-06-15 |
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CN200580022203.XA Active CN1981291B (zh) | 2004-06-30 | 2005-06-21 | 基于激光的用于处理目标表面材料的方法 |
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Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8367304B2 (en) * | 2008-06-08 | 2013-02-05 | Apple Inc. | Techniques for marking product housings |
CN102000912B (zh) * | 2010-09-21 | 2014-06-18 | 中国科学院理化技术研究所 | 一种激光微纳加工系统及方法 |
JP5814371B2 (ja) | 2010-09-21 | 2015-11-17 | 中国科学院理化技術研究所 | レーザマイクロ・ナノ加工方法 |
DE102010052338A1 (de) * | 2010-11-25 | 2012-05-31 | Steinert Elektromagnetbau Gmbh | Verfahren und Einrichtung zur Einzelkornsortierung von Schüttgütern beliebiger Art |
EP2683519A4 (en) * | 2011-03-10 | 2015-11-11 | Electro Scient Ind Inc | METHOD AND APPARATUS FOR LASERALLY MARKING ITEMS RELIABLY |
CN104942443B (zh) * | 2014-03-28 | 2017-01-25 | 汉达精密电子(昆山)有限公司 | 表面处理方法及其产品 |
RU2661977C1 (ru) * | 2014-07-03 | 2018-07-23 | Ниппон Стил Энд Сумитомо Метал Корпорейшн | Устройство лазерной обработки |
CN109856108B (zh) * | 2017-11-30 | 2021-05-18 | 北京华泰诺安探测技术有限公司 | 一种拉曼光谱检测系统和方法 |
CN109986212A (zh) * | 2019-05-13 | 2019-07-09 | 大族激光科技产业集团股份有限公司 | 一种激光彩色打标系统及其方法 |
CN110756998A (zh) * | 2019-09-25 | 2020-02-07 | 大族激光科技产业集团股份有限公司 | 在产品表面激光标记的方法 |
CN111325044B (zh) * | 2020-01-31 | 2021-08-20 | 中国原子能科学研究院 | 一种用于核电站新组件编码的确定方法、识别系统及识别方法 |
CN112643209A (zh) * | 2020-12-14 | 2021-04-13 | 大族激光科技产业集团股份有限公司 | 一种镀有dlc和pvd薄膜的工件激光加工方法和设备 |
Citations (6)
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US5059764A (en) * | 1988-10-31 | 1991-10-22 | Spectra-Physics, Inc. | Diode-pumped, solid state laser-based workstation for precision materials processing and machining |
US5460034A (en) * | 1992-07-21 | 1995-10-24 | The United States Of America As Represented By The Secretary Of The Air Force | Method for measuring and analyzing surface roughness on semiconductor laser etched facets |
CN1196018A (zh) * | 1995-07-17 | 1998-10-14 | 杰桑企业 | 给金刚石作标记 |
US6333485B1 (en) * | 1998-12-11 | 2001-12-25 | International Business Machines Corporation | Method for minimizing sample damage during the ablation of material using a focused ultrashort pulsed beam |
CN1336878A (zh) * | 1999-11-11 | 2002-02-20 | 皇家菲利浦电子有限公司 | 铝制品的阳极氧化处理层的标记方法 |
CN1346517A (zh) * | 1999-04-07 | 2002-04-24 | 西门子太阳公司 | 衬底薄膜烧蚀方法及其设备 |
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- 2005-06-21 CN CN200580022203.XA patent/CN1981291B/zh active Active
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5059764A (en) * | 1988-10-31 | 1991-10-22 | Spectra-Physics, Inc. | Diode-pumped, solid state laser-based workstation for precision materials processing and machining |
US5460034A (en) * | 1992-07-21 | 1995-10-24 | The United States Of America As Represented By The Secretary Of The Air Force | Method for measuring and analyzing surface roughness on semiconductor laser etched facets |
CN1196018A (zh) * | 1995-07-17 | 1998-10-14 | 杰桑企业 | 给金刚石作标记 |
US6333485B1 (en) * | 1998-12-11 | 2001-12-25 | International Business Machines Corporation | Method for minimizing sample damage during the ablation of material using a focused ultrashort pulsed beam |
CN1346517A (zh) * | 1999-04-07 | 2002-04-24 | 西门子太阳公司 | 衬底薄膜烧蚀方法及其设备 |
CN1336878A (zh) * | 1999-11-11 | 2002-02-20 | 皇家菲利浦电子有限公司 | 铝制品的阳极氧化处理层的标记方法 |
Non-Patent Citations (1)
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