CN1928488A - 用于感测探针位置的设备和方法 - Google Patents
用于感测探针位置的设备和方法 Download PDFInfo
- Publication number
- CN1928488A CN1928488A CNA2006101062509A CN200610106250A CN1928488A CN 1928488 A CN1928488 A CN 1928488A CN A2006101062509 A CNA2006101062509 A CN A2006101062509A CN 200610106250 A CN200610106250 A CN 200610106250A CN 1928488 A CN1928488 A CN 1928488A
- Authority
- CN
- China
- Prior art keywords
- heating element
- equipment
- bias voltage
- probe
- electromotive force
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Images
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B9/00—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor
- G11B9/12—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor using near-field interactions; Record carriers therefor
- G11B9/14—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor using near-field interactions; Record carriers therefor using microscopic probe means, i.e. recording or reproducing by means directly associated with the tip of a microscopic electrical probe as used in Scanning Tunneling Microscopy [STM] or Atomic Force Microscopy [AFM] for inducing physical or electrical perturbations in a recording medium; Record carriers or media specially adapted for such transducing of information
- G11B9/1409—Heads
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q80/00—Applications, other than SPM, of scanning-probe techniques
Landscapes
- Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
- Investigating Or Analyzing Materials Using Thermal Means (AREA)
- Semiconductor Memories (AREA)
Abstract
Description
Claims (17)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP05405528.0 | 2005-09-08 | ||
EP05405528 | 2005-09-08 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1928488A true CN1928488A (zh) | 2007-03-14 |
CN100585324C CN100585324C (zh) | 2010-01-27 |
Family
ID=37858558
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN200610106250A Expired - Fee Related CN100585324C (zh) | 2005-09-08 | 2006-07-07 | 用于感测探针位置的设备和方法 |
Country Status (2)
Country | Link |
---|---|
US (2) | US7755373B2 (zh) |
CN (1) | CN100585324C (zh) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2017166215A1 (zh) * | 2016-03-31 | 2017-10-05 | 深圳迈瑞生物医疗电子股份有限公司 | 液面检测装置及检测方法和全自动取样装置 |
CN111133272A (zh) * | 2017-09-26 | 2020-05-08 | 瑞尼斯豪公司 | 测量探针装置和方法 |
Families Citing this family (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8373431B2 (en) * | 2006-01-13 | 2013-02-12 | International Business Machines Corporation | Probe for scanning over a substrate and data storage device |
US7983138B2 (en) * | 2006-10-11 | 2011-07-19 | Seagate Technology Llc | Surface spacing using rigid spacers |
US7928343B2 (en) * | 2007-12-04 | 2011-04-19 | The Board Of Trustees Of The University Of Illinois | Microcantilever heater-thermometer with integrated temperature-compensated strain sensor |
US8719960B2 (en) * | 2008-01-31 | 2014-05-06 | The Board Of Trustees Of The University Of Illinois | Temperature-dependent nanoscale contact potential measurement technique and device |
WO2010022285A1 (en) | 2008-08-20 | 2010-02-25 | The Board Of Trustees Of The University Of Illinois | Device for calorimetric measurement |
US20100116038A1 (en) * | 2008-11-12 | 2010-05-13 | International Business Machines Corporation | Feedback- enhanced thermo-electric topography sensing |
US8387443B2 (en) * | 2009-09-11 | 2013-03-05 | The Board Of Trustees Of The University Of Illinois | Microcantilever with reduced second harmonic while in contact with a surface and nano scale infrared spectrometer |
KR101647302B1 (ko) * | 2009-11-26 | 2016-08-10 | 삼성전자주식회사 | 프로브 카드 및 이를 포함하는 테스트 장치 |
JP5394309B2 (ja) * | 2010-04-19 | 2014-01-22 | 富士通コンポーネント株式会社 | プローブ及びプローブの製造方法 |
US8533861B2 (en) | 2011-08-15 | 2013-09-10 | The Board Of Trustees Of The University Of Illinois | Magnetic actuation and thermal cantilevers for temperature and frequency dependent atomic force microscopy |
US8914911B2 (en) | 2011-08-15 | 2014-12-16 | The Board Of Trustees Of The University Of Illinois | Magnetic actuation and thermal cantilevers for temperature and frequency dependent atomic force microscopy |
WO2014113959A1 (en) * | 2013-01-24 | 2014-07-31 | Intel Corporation | Integrated hardware and software for probe |
US20190152675A1 (en) * | 2017-11-17 | 2019-05-23 | Bby Solutions, Inc. | Waterproof Structure |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CH643397A5 (de) * | 1979-09-20 | 1984-05-30 | Ibm | Raster-tunnelmikroskop. |
DE3675158D1 (de) * | 1985-11-26 | 1990-11-29 | Ibm | Verfahren und mikroskop zur erzeugung von topographischen bildern unter anwendung atomarer wechselwirkungskraefte mit subaufloesung. |
JPH02206043A (ja) * | 1989-02-03 | 1990-08-15 | Olympus Optical Co Ltd | 記憶装置 |
JP2744359B2 (ja) * | 1991-04-24 | 1998-04-28 | キヤノン株式会社 | 情報再生及び/又は情報記録装置 |
TW550622B (en) * | 2000-11-03 | 2003-09-01 | Ibm | Data storage device and read/write component for data storage device |
CN1233988C (zh) * | 2000-11-16 | 2005-12-28 | 国际商业机器公司 | 读热阻传感器阵列的方法和装置 |
TWI244619B (en) * | 2001-03-23 | 2005-12-01 | Ibm | Data read/write systems |
JP3966514B2 (ja) * | 2002-05-23 | 2007-08-29 | インターナショナル・ビジネス・マシーンズ・コーポレーション | 記憶装置、および記憶装置を操作する方法 |
US7483363B2 (en) * | 2004-10-14 | 2009-01-27 | International Business Machines Corporation | Data storage device and method for operating a data storage device |
-
2006
- 2006-07-07 CN CN200610106250A patent/CN100585324C/zh not_active Expired - Fee Related
- 2006-09-08 US US11/518,110 patent/US7755373B2/en not_active Expired - Fee Related
-
2009
- 2009-08-20 US US12/544,246 patent/US7952369B2/en not_active Expired - Fee Related
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2017166215A1 (zh) * | 2016-03-31 | 2017-10-05 | 深圳迈瑞生物医疗电子股份有限公司 | 液面检测装置及检测方法和全自动取样装置 |
CN111133272A (zh) * | 2017-09-26 | 2020-05-08 | 瑞尼斯豪公司 | 测量探针装置和方法 |
CN111133272B (zh) * | 2017-09-26 | 2021-10-29 | 瑞尼斯豪公司 | 测量探针装置和方法 |
US11415412B2 (en) | 2017-09-26 | 2022-08-16 | Renishaw Plc | Measurement probe apparatus and method |
Also Published As
Publication number | Publication date |
---|---|
US7755373B2 (en) | 2010-07-13 |
US7952369B2 (en) | 2011-05-31 |
US20100026332A1 (en) | 2010-02-04 |
US20070063141A1 (en) | 2007-03-22 |
CN100585324C (zh) | 2010-01-27 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN1928488A (zh) | 用于感测探针位置的设备和方法 | |
RU2459214C2 (ru) | Комплект зондов для микроскопа со сканирующим зондом | |
US10556793B2 (en) | Thermal measurements using multiple frequency atomic force microscopy | |
Pantazi et al. | Probe-based ultrahigh-density storage technology | |
JP6517888B2 (ja) | 走査型プローブ顕微鏡およびその動作方法 | |
CN106841687B (zh) | 采用开尔文探针力显微镜进行多参数同步测量的方法 | |
CN106645808B (zh) | 一种多参数同步测量的开尔文探针力显微镜 | |
Smirnov et al. | Diamond-modified AFM probes: from diamond nanowires to atomic force microscopy-integrated boron-doped diamond electrodes | |
US7787350B2 (en) | Data storage device | |
JP2006194883A (ja) | 基板上を走査するためのプローブおよびデータ・ストレージ・デバイス | |
CN1504853A (zh) | 参数修正电路和参数修正方法 | |
Lee et al. | Microcantilevers integrated with heaters and piezoelectric detectors for nano data-storage application | |
US7483363B2 (en) | Data storage device and method for operating a data storage device | |
JP4979229B2 (ja) | 基板に亘って走査するプローブ | |
CN100427921C (zh) | 用于扫描探针显微镜的薄膜断面定位方法 | |
CN1027470C (zh) | 集成电路多相功率测量器 | |
Sebastian et al. | Nanopositioning for probe storage | |
CN1967687A (zh) | 使用悬臂结构的毫微数据写入和读取设备及其制造方法 | |
Pozidis et al. | Scanning probes entering data storage: From promise to reality | |
US20050157575A1 (en) | Storage device and method | |
JP4103136B2 (ja) | データ記録再生装置 | |
JP2009036528A (ja) | 表面物性の測定方法及び微細加工方法 | |
US8373431B2 (en) | Probe for scanning over a substrate and data storage device | |
TWI267627B (en) | Scanning probe data storage and microscopy | |
JP2005345411A (ja) | 微小表面温度分布測定装置 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
TR01 | Transfer of patent right |
Effective date of registration: 20171117 Address after: Grand Cayman, Cayman Islands Patentee after: GLOBALFOUNDRIES INC. Address before: American New York Patentee before: Core USA second LLC Effective date of registration: 20171117 Address after: American New York Patentee after: Core USA second LLC Address before: American New York Patentee before: International Business Machines Corp. |
|
TR01 | Transfer of patent right | ||
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20100127 Termination date: 20180707 |
|
CF01 | Termination of patent right due to non-payment of annual fee |