CN1882843A - Battery cell voltage and impedance measuring circuit - Google Patents

Battery cell voltage and impedance measuring circuit Download PDF

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Publication number
CN1882843A
CN1882843A CNA2004800338953A CN200480033895A CN1882843A CN 1882843 A CN1882843 A CN 1882843A CN A2004800338953 A CNA2004800338953 A CN A2004800338953A CN 200480033895 A CN200480033895 A CN 200480033895A CN 1882843 A CN1882843 A CN 1882843A
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circuit
voltage
mentioned
signal
impedance
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CN100549704C (en
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金得洙
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Powertron Engineering Co Ltd
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Powertron Engineering Co Ltd
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/30—Structural combination of electric measuring instruments with basic electronic circuits, e.g. with amplifier
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/36—Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC]
    • G01R31/3644—Constructional arrangements
    • G01R31/3648—Constructional arrangements comprising digital calculation means, e.g. for performing an algorithm
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
    • H03F3/45—Differential amplifiers

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Tests Of Electric Status Of Batteries (AREA)

Abstract

In general, in the circuit to measure and diagnose the cell post voltage and internal impedance in storage battery cells and find out their aging status, the impedance voltage signal which is induced by the constant current is added to the direct current voltage on the storage battery cell post. This invention provides a much better method to discriminate the battery cell voltage 1.OV - 12V and internal impedance voltage from the various noises on the battery cell post voltage like the induced ripple voltage, and then convert them to digital values by means of a A/D converter, and input the digital signals into a CPU. As a result, it raises the degree of accuracy in measurement of the internal impedance value of the battery.

Description

Battery tension and impedance measuring circuit
Technical field
Because in emergency power generation mechanism or communication network power facility, accumulator is used for fixing application in a large number, be very important so effectively safeguard these batteries.Business-like instrument and diagnostic system have been arranged now, and they are by measuring cell voltage and the internal driving method as diagnosis cell degradation degree (health status).In order to understand the aging performance (its internal impedance can increase according to degree of aging) such as objects such as accumulators, common method is with constant alternating current I sBe input to two ends, measure the voltage (V that produces owing to impedance then such as objects such as accumulators Is') (impedance voltage hereinafter referred to as), thereby record internal impedance and diagnose its health status.
As shown in Figure 1, the internal impedance value of accumulator is very little, exchanges the four-pole network method so use usually, reduces to minimum with the influence that will measure lead impedance or plug contact impedance.By the power end in the steady current source circuit to import constant alternating current I such as the two ends of objects such as accumulator s, record because above-mentioned steady current I from measuring junction sInternal impedance (the V that produces at two ends Is').
Background technology
For high capacity cell, the internal impedance in the battery is very little, is generally 1 milliohm or littler.Equally, the voltage (V of battery internal resistance generation Dc) also be several millivolts small-signal.Compare with the outside batteries voltage of 1.0-15 volt, this voltage very little (thousands of/one), and also a large amount of electromagnetic wave noises in it and the surrounding environment mix.Therefore, be necessary by all bandpass filter as disclosed squelch circuits such as (being intended to suitable amplifying signal) optimal design suitably with this signal from cell voltage (V Dc) in separate, remove the noise in the signal, accurate, high-resolution impedance voltage signal is input to A/D converting unit in the Main Processor Unit (MPU).
In addition, in the four-pole network circuit that above-mentioned signal is connected to the metering circuit input end, there is the protection fuse resistor, connects conductor resistance and spurious impedance component, the spurious impedance value is equally also arranged in metering circuit.Therefore, during the voltage that in measuring battery, produces by internal impedance, because internal impedance value is very weak signal, so need to propose a kind of method, it is designed to reduce the influence of spurious impedance, for example because four-pole network and the contact resistance of metering circuit and the voltage drop that impedance produced of cable line.
Here the method for Jie Shaoing is used the differential amplifier of a kind of high common mode voltage, not only be used to enlarge the measurement range of cell voltage and improve the resolution of accurately measuring, but also be used for the impedance voltage that the cell voltage DC component is comprised is coupled to coupling condenser, then by the bandpass filter filtering noise, make signal have very high accuracy and resolution, be digital signal by A/D converter with this conversion of signals then, it is calculated to obtain resistance value.
Summary of the invention
The present invention relates to a kind of circuit, it provides a kind of measurement accumulator direct current (DC) voltage (V Dc) and impedance voltage (V Is') method, specific practice is: with signal voltage (V Is) (it comprises by anti-little interchange (AC) impedance voltage that is produced of accumulator internal resistance, and it is imported by the four-pole network circuit) be converted to suitable level, and microprocessor unit (CPU) is calculated it.In addition, the present invention utilizes high common mode input differential amplifier that the impedance between accumulator and the metering circuit is maximized especially, thereby isolates this two circuit better.The present invention includes bandpass filter, A/D converter and cpu circuit, it accurately measures the impedance voltage (V by the internal impedance generation of accumulator Is') and direct current (DC) voltage (V of accumulator Dc).
But, as shown in Figure 2, the cell voltage that the bleeder circuit resistance R 1 in differential amplifier (1A) input end and R2 are used to measure 1.0～15V, wherein storage battery cell (V usually Is) be only about half of by dividing potential drop. be reduced to 0.5～7.5V, and be imported in the above-mentioned differential amplifier (1A).The output signal of above-mentioned differential amplifier (1A) successively by buffer circuit, in A/D converter, be converted into digital value, be input to direct current (DC) voltage (V of CPU then with counting cell Dc).In addition, because the anti-impedance voltage (V that is produced of accumulator internal resistance Is') be a very little signal, so utilize this circuit that it is measured in the following ways.Do not have in order to measure the voltage signal (V of accumulator Is) carry out dividing potential drop.By the DC coupling circuit of forming by resistance R s and Rd and the capacitor Cs above-mentioned voltage signal (V that directly is coupled Is) in DC component, only to obtain impedance voltage signal (V Is'), this signal is input to another separates differential amplifier (1B), to eliminate noise, then this signal is input to the A/D converter in the micro controller unit (MCU) by band pass filter circuit and buffer circuits.
But, if the impedance voltage (V that internal impedance produced of the DC voltage of accumulator and accumulator Is') by voltage divider resistance R 1 and R2 dividing potential drop, and with equally being connected to differential amplifier (1A) in traditional method, then voltage divider resistance R 1 and R2 are at cell voltage (V Is) DC voltage (V Dc) in introduced much noise.Therefore, when measuring in micro controller unit (MCU), measurement accuracy descends.And when measurement cable (four-pole network) is very long, between accumulator and voltage divider resistors R1 and R2, comprising closed circuit, above-mentioned voltage divider resistors R1 and R2 have load along measuring electric wire, wherein have electric current to pass through.When measuring cell voltage, because the resistance of cable conductor descends voltage, thereby produce measuring error, so can not the acquisition exact value in this measurement.
In addition, the DC coupling circuit of being made up of capacitor Cs and resistance R s and Rd is used for the input end of differential amplifier (1B), to obtain the impedance voltage signal (V of alternating current Is'), wherein the electric current of accumulator is flowed through and battery and amplification resistance R d series capacitors Cs by measuring cable, because the resistance in the cable conductor significantly reduces voltage, thereby can not obtain measured value accurately by tradition or existing method.
The present invention is intended to address these problems.In order to address these problems, the present invention uses bleeder circuit and DC coupling circuit not in classic method in the input end of differential amplifier (1), will comprise impedance voltage (V Is') battery voltage signal (V Is) offer the inlet circuit of micro controller unit (MCU), but directly will comprise impedance voltage (V Is') 0～16V cell voltage (V Is) be directly connected to the input end of above-mentioned differential amplifier (1) and the DC voltage (V of correct split cell Dc) and impedance voltage signal, so that being provided, a kind of optimization bandpass filter removes noise.In addition, the present invention uses a kind of suitable A/D converter circuit and peripheral circuit thereof, to produce desired resolution.This succinct method has guaranteed that measurement has higher accuracy.
Even outside batteries voltage is in 1～21V scope, the present invention is the maximum permissible voltage of micro controller unit (MCU) with signal transformation by the fixed voltage that the offset side at high common mode input differential amplifier applies a suitable negative level (-) also, thereby resolution is provided to more than 12 bits, by DC coupling circuit being placed on after the output terminal of differential amplifier (1), making and to measure small impedance voltage signal (V Is'), therefore can be with input impedance maximization from the metering circuit of four-pole network output stage, to reduce owing to determine the measuring error that impedance is produced.
In addition, the present invention not only might accurately measure battery tension (V by using a high common mode input differential amplifier of not measured influence circuit Dc) and impedance voltage (V Is'), also might be increased to impedance voltage on the cell voltage DC component, thereby produce high-resolution signal accurately by proper A/D converter by capacitor-coupled.Can get rid of the influence of noise signal effectively by the bandpass filter (BNP) of suitably design like this, therefore might obtain impedance voltage (V calculating Is) actual value.As another embodiment, the invention discloses a kind of method, the A/D converter that its use is embedded in the micro controller unit (MCU) comes actual this function.
Description of drawings
Fig. 1 is the schematic diagram that is used to measure battery tension and internal impedance.
Fig. 2 is the traditional circuit that is used to measure battery tension and internal impedance.
Fig. 3 is the block scheme of battery tension of the present invention and internal impedance voltage.
Fig. 4 is the circuit structure of one embodiment of the invention.
Fig. 5 is the circuit structure of another embodiment of the present invention.
Fig. 6 is the voltage divider/impact damper and the adder circuit of one embodiment of the present of invention.
Fig. 7 is the detailed circuit of operational amplifier group of the present invention.
Fig. 8 is a band pass filter circuit of the present invention.
Fig. 9 is the cutoff characteristic of bandpass filter of the present invention.
Embodiment
Describe operating process in detail below with reference to Fig. 3, Fig. 4 and Fig. 5.Fig. 3 and Fig. 4 explanation is not to the DC voltage (V of battery Dc) and the anti-impedance voltage signal that is produced of the internal resistance of cell carry out dividing potential drop, but be directly connected to the input end of above-mentioned differential amplifier (1).They also describe in detail and are used for certain negative (-) constant voltage is input to above-mentioned differential amplifier (1) offset side to obtain the circuit of the output signal accurate relevant with input signal.
As realizing an example of the present invention, negative (-) constant voltage that disclosed reference constant voltage circuit (2) is produced (is-8V) offset side of input (being connected to) high common mode input differential amplifier in an embodiment of the present invention, wherein-negative (-) constant voltage of 8V produces with reference to constant voltage diode by two, the price of these diodes is relatively cheap, and drift value is very little.Reference constant voltage circuit (2) comprises constant voltage diode ZD2, ZD3 and the current-limiting resistor R3 of mutual series connection.The negative electrode (-) of the rear end of above-mentioned resistor R 3 and above-mentioned constant voltage diode ZD2 is connected to respectively-12V and the earth point of controlling power supply.The negative constant voltage that this place produces is connected to the offset side of differential amplifier (1) by buffer circuit.In addition, at the two ends of above-mentioned constant voltage diode ZD2 series diode D1, variohm R4 and diode D2, to carry out dividing potential drop, the central terminal of variohm R4 is connected to the ADJ end of constant voltage diode ZD2, its connected mode can be adjusted the output voltage of constant voltage diode ZD2 by above-mentioned variohm R4, thereby can finely tune the output of reference constant voltage circuit.
Even (12V) change, the output voltage of used constant voltage diode (reference diode) can not become yet and be lower than the voltage of Zener diode in the foregoing circuit, so its characteristic is very good for ambient temperature and supply voltage.By employing have the circuit of above-mentioned composition and utilize variohm R4 the reference value of bias voltage is adjusted to approximately-7.8V～-8.3V in, might compensate owing to the different skews that produce of the characteristic of circuit component in the metering circuit are exported.
Usually, regardless of the size of input signal, all can make the output of operational amplifier saturated according to the size of supply voltage (Vc), to reach these numerical value.As realizing an alternative embodiment of the invention, if the supply voltage (Vc) of differential amplifier (1) is 12V, the saturated output valve of above-mentioned differential amplifier (1) is typically about 10V.If according to usual way, the bias voltage that is approximately 0V is put on the offset side of above-mentioned differential amplifier (1), skew with the compensation output voltage, then because the gain amplifier of differential amplifier is 1, when the input signal of above-mentioned differential amplifier (1) is 10V～16V or when higher, output valve corresponding with it is saturated, therefore can only export the input signal in 0～10V scope.Thereby, when the voltage of accumulator is 0～16V, can not measure the cell voltage that is higher than 10V.
Above-mentioned differential amplifier (1) is a kind of differential operational amplifier (for example, CMOS type or FET type), compares its impedance very high (input bias current is a milliampere level, even littler) with common differential operational amplifier.Even at the resistance of the input of the homophase of above-mentioned differential amplifier and inverting input linking number kilo-ohm, it also can accurately be worked.Because it is 1 that its design can make the gain amplifier of differential input voltage signal, so the output of above-mentioned differential amplifier (1) equals differential voltage signal (V+-V-) (storage battery cell) and is input to reference voltage (Vref) sum of offset side, it is expressed as (V+-V-)+Vref.Therefore, as input outside batteries voltage (V Is) 0V～16V voltage signal the time because bias reference voltage (Vref) is set to-8V, thus the output of above-mentioned differential amplifier (1) can obtain-8V～+ numerical value of 8V, it is within the saturation voltage scope that is lower than 10V.In addition, if be input to negative (-) reference voltage (Vref) of offset side be-11V, utilize the aforementioned calculation formula so even the more high voltage between 1～21V can be input to above-mentioned differential amplifier (1), also might obtain between-10V～+ output signal in the 10V scope.
By above-mentioned differential amplifier (1) be-8V with level translation～+ output voltage signal of 8V scope in, with DC current voltage (V DC) the component upward peak is several millivolts impedance voltage (V Is') with mix from the noise of outside.Eliminate above-mentioned output voltage signal (V by the DC filter circuit of forming by resistance R 1 and capacitor C 1 (3) Is) in ripple noise.So, obtain pure DC voltage (V DC) signal, and it is buffered in (buffering has prevented the load effect that the input-output impedance causes) buffer circuit (4), then buffering signals is connected to the input end of 12 bit A/D converter (5), to improve the resolution of measuring.That is to say, because the permission output area of the d. c. voltage signal of buffer circuit (4) is-10V～+ 10V, so might improve resolution by the micro controller unit (MCU) that employing has an A/D converter (its can conversion of signals to above-mentioned voltage range or voltage of equal value).
When the capacity of accumulator during less than hundreds of ampere hour, because the numerical value of internal impedance becomes up to tens of milliohms, so the A/D converter (5) that uses 10 bits or be lower than 10 bits reduces manufacturing cost, but its resolution also can descend a little, and might use an input range that is embedded among the micro controller unit (MCU) is the A/D converter of 0～5V.The MCU of Chu Shouing is installed with a multiplexer usually in its front on the market, and it has a circuit, is used for by high speed multiplex (MUX) switch the multi-channel analog input signal being converted to digital signal.Therefore, this micro controller unit (MCU) can be as wherein there being a plurality of A/D converters to carry out work.
In addition, because circuit is made up of above-mentioned A/D converter (the 5 or 9) circuit that is embedded in the micro controller unit (MCU), so the output of above-mentioned impact damper (4) must be in 0V～5V scope, or even at the signal input storage battery cell (V with 1V～16V Is) time also be so, be set to 7V (giving an example) by bias reference voltage (Vref) with above-mentioned differential amplifier (1), just might be in above-mentioned differential amplifier (1) acquisition-6V～+ output of 9V.Fig. 6 shows voltage divider/buffer circuits and the totalizer as one embodiment of the present of invention.In voltage divider/buffer circuits, will from above-mentioned differential amplifier (1)-6V～+ 9V output voltage dividing potential drop is 1/3rd, obtain-2V～+ signal of 3V, afterwards, in disclosed adder circuit, add voltage signal (V again F2), the level of above-mentioned-2V-+3V signal be transformed to 0V～+ 5V.Since the output signal of above-mentioned adder circuit between 0V～+ the 5V scope in, so might adopt the A/D converter that is embedded in micro controller unit (MCU) (its input range be 0V～+ 5V).
On the other hand, as mentioned above, be converted into-8V～+ 8V or-6V～+ battery voltage signal (V of 9V level Is) in do not comprise any DC component (of DC circuit coupled circuit (6) elimination of these DC component) by forming by capacitor C2 and R2, thereby the impedance voltage of a pure AC signal appears.Then, it is by bandpass filter (BNP) (7).Above-mentioned bandpass filter decays and suppresses its frequency range and is different from impedance voltage signal (V Is') noise signal.Because this Filter Design can be guaranteed to eliminate owing to the charging noise signal that ripple current produced with owing to the noise that induction produced that uses common narrow band filter, so might strengthen or improve its filter effect.Passed through the impedance voltage signal (V of bandpass filter (7) Is') the operational amplifier group (8) by the back again.Above-mentioned operational amplifier group (8) comprises (giving an example): the operational amplifier from the first order to the third level (15,17,19), and with large-scale impedance signal (V Is') be enlarged into the expectation level.In other words, this signal is amplified tens of times and even thousands of times, make signal level reach 10V, and use 12 bits to take advantage of the A/D converter of 12 bits (9,9a) to be converted into high-resolution digital signal, and in microprocessor unit CPU (10), it is accurately calculated.When utilizing disclosed zero (0) transposition circuit, needs measure above-mentioned impedance voltage signal (V Is') phase place the time, must be to above-mentioned impedance voltage signal (V Is') carry out complete filtering.For this reason, can the 2nd BNP (11) be installed afterwards in operational amplifier group (8).
An example of Fig. 8 Display Realization bandpass filter (7), its design only allows its frequency range and impedance voltage signal (V Is') similar signal.As mentioned above, bandpass filter (7) comprises disclosed isostructure narrow band filter, these wave filters are connected to the one-level in the two-stage, and each in the well-known above-mentioned narrow band filter includes two capacitors, three resistors and an operational amplifier.When being connected to these narrow band filters in this two-stage, can have the characteristic of this bandpass filter, it far is narrower than the broadband band-pass filter that is wherein connecting low-pass filter (LPF) and Hi-pass filter (HPF).
In order to simplify above-mentioned bandpass filter (7) circuit, might make among capacitor C1, C2, C3 and the C4 two to equate, or all four all equate, correctly select the resistance value of R1～R6 then.In order to make printed circuit board (PCB) (PCB) compactness, can use chip-type condensers usually.As an example, in order to simplify circuit structure, the value of capacitor C1, C2, C3 and C4 all is made as 10nF, might set lower limiting frequency (f by the resistance value of correct selection resistor R 1～R6 then L) and upper cut off frequency (f H), thereby be the desirable numerical value of deviser with the bandwidth settings of above-mentioned bandpass filter (7) at an easy rate.
As mentioned above, Fig. 9 shows the result utilize PSPICE that the filtering characteristic of bandpass filter (7) is carried out emulation, and its frequency band is by obtaining with the identical narrow band filter of two-step way syndeton.As can be seen from Figure 9, for example, when selecting resonance frequency (fr) to be 720Hz, the pad value that frequency 660Hz-780Hz (it is in 5% scope of resonance frequency (fr)) can be located is designed to approach zero (having maximum gain).In above-mentioned bandpass filter (7), if impedance voltage signal (V Is') frequency be 720Hz, then the pad value of this signal approaches zero (having maximum gain), because for the frequency in resonance frequency (fr) 5% scope, its pad value almost nil (having maximum gain) is so the impedance voltage signal (V by above-mentioned bandpass filter (7) Is') pad value always remain and approach zero, also be like this even resonance frequency (fr) changes at about 5% o'clock because of the variation of environment temperature.
And because resonance frequency (fr) equals 720Hz, its bandwidth far is narrower than traditional broadband band-pass filter (BPF) (lower limiting frequency (f wherein L) and upper cut off frequency (f H) be respectively 400Hz and 1000Hz), so might improve the attenuation characteristic of noise frequency, guarantee to eliminate because noise signal that the charging current ripple produces and because the noise that induction produces.On the contrary, has very narrow bandwidth owing to be designed to only to have the narrow band filter circuit of an operational amplifier, so might only locate to obtain maximum gain in designed resonance frequency (fr).Therefore, there is a shortcoming in it, is exactly measuring impedance voltage signal (V Is') time, the attenuation characteristic of wanted signal can change according to the variation of environment temperature, causes pad value to reduce, and this is because when variation of ambient temperature, also can change as the resistor of filter circuit element and the numerical value of capacitor.
As above by Fig. 3 and Fig. 4 illustrated and show, key of the present invention is with DC voltage (V according to ultimate principle Dc) signal is input to A/D converter (5), with impedance voltage signal (V Is') be input to another A/D converter (9).But this class device of selling on the market in practice, all has many passage multiplexers (MUX) with analog switch function usually in the A/D converter front.DC voltage (V Dc) signal and impedance voltage signal (V Is') be connected to the A/D converter circuit by above-mentioned multiplexer (MUX), and before calculating, be digital signal by analog signal conversion, in CPU (10), it is calculated then.
As mentioned above, might use A/D converter within the element that is embedded in above-mentioned micro controller unit (MCU) (its input range as 0V～+ 5V) with impedance voltage signal (V Is') be digital signal from analog signal conversion, its mode is similar to use and is embedded in the A/D converter of micro controller unit (MCU) with DC voltage (V Dc) the signal from analog conversion of signals is digital signal.As mentioned above, in most of the cases, the input range that is embedded in the A/D converter in the element of micro controller unit (MCU) be 0V～+ 5V.The above-mentioned bandpass filter of process (7) is several millivolts impedance voltage signal (V to size Is') carry out filtering, in first amplifier (15), amplify tens of times then, perhaps amplify hundreds of times and even thousands of times by second amplifier (17), become then-2.5V～+ signal of 2.5V.Block scheme among Fig. 7 is an embodiment of amplifier group (8) circuit, and as mentioned above, it is positioned at after bandpass filter (7) circuit.First adder (16) is identical with the adder structure among above-mentioned Fig. 6 with the structure of second adder (18), and they are connected respectively to the rear end of first amplifier (15) and second amplifier (17).By above-mentioned first or second adder with impedance voltage signal (V Is') be transformed to 0V～+ signal of 5V, and be input to A/D converter (9,9a).As mentioned above, operational amplifier group (8) circuit has the two-stage amplifier group, but when measurement range is very big, might use the amplifier group of being made up of polystage amplifier (15,17,19).
To carry out the necessary constant current signal of impedance computation (1s) by amplifier (12) and be amplified to suitable level, and be connected to another input end of above-mentioned multiplexer (MUX) circuit.By disclosed whiston bridge circuit (13) and another amplifier (14), the temperature signal that will produce in disclosed thermistor (temperature) sensor is amplified to suitable level, be connected to another input end of above-mentioned multiplexer (MUX) then, and in CPU (10), calculate and measure.
Fig. 5 explanation utilizes commercial device to realize an example of the present invention.Commercial A/D converter circuit comprises can being that the conversion of signals of 10V is the A/D converter of digital signal with level, and this A/D converter has built-in high speed multiplex (MUX) (MUX) circuit.This multiplexer (MUX) is used to receive the selection signal of CPU (10), and when needs calculate, and the simulating signal high-speed sequential of many passages is connected to A/D converter (ADC).(ADC) is digital signal with the analog input signal high-speed transitions by A/D converter, and the input end that is connected to CPU (10) calculates.As prototype circuit of the present invention, can use the AD7891 type A/D converter (ADC) of Analog Device company, might be the digital signal of 12 bits with the simulating signal high-speed transitions of 10V with switching time of 1.6 microseconds, when calculating, to improve resolution.As a result, improved the accuracy of measuring.

Claims (10)

1. one kind is used to measure the external voltage of accumulator and the circuit of internal impedance voltage, and it comprises:
High common mode input differential amplifier (1);
Reference constant voltage circuit (2);
DC filter circuit (3);
Buffer circuit (4);
DC coupling circuit (6);
Bandpass filter (7);
Operational amplifier group (8);
A/D converter (5,9) and CPU (10).
2. circuit as claimed in claim 1, wherein, A/D converter and CPU (10) that A/D converter (5,9) and CPU (10) are made up of (MUX) circuit of the multiplexer with a plurality of input channels and adc circuit replace.
3. circuit as claimed in claim 1, wherein, A/D converter (5,9) and CPU (10) are replaced by the A/D converter and the CPU of the micro controller unit that is embedded in the commercialization device (MCU).
4. circuit as claimed in claim 2, wherein, by the outside batteries voltage (V of impact damper (4) buffering and input Dc), by multistage amplification and with the impedance voltage signal (V of a plurality of signals output of operational amplifier group (8) Is'), such as the 10V simulating signal of constant current signal (Is), be imported into each input channel of multiplexer (MUX) respectively;
Be imported into the adc circuit of 12 bit A/D transducer (9a) by the selected above-mentioned simulating signal of the selection signal of CPU (10).
5. as claim 1 or 3 described circuit, wherein, the output voltage dividing potential drop that will obtain from above-mentioned differential amplifier (1) at voltage divider/impact damper is 1/3rd, and above-mentioned operational amplifier group (8) is made up of with the totalizer that is connected respectively to above-mentioned amplifier rear end the different amplifier of a plurality of gain amplifiers.
6. circuit as claimed in claim 1, wherein, bandpass filter (7) is contained in the two-stage relevant connection, and in this bandpass filter (7), narrow band filter comprises two capacitors, three resistors and an operational amplifier.
7. one kind is used to measure the outside batteries voltage of accumulator and the circuit of internal impedance voltage, and it comprises:
(i) test side (3., 4.) output is connected to the homophase and the inverting input of high common mode input differential amplifier (1),
By the offset side that (-) constant voltage (Vref) is transfused to (being connected to) above-mentioned differential amplifier (1) of bearing of reference constant voltage circuit (2) generation,
In disclosed DC filter circuit (3), filtering is carried out in the output of above-mentioned differential amplifier (1), and in impact damper (4), it is cushioned, and be digital signal by analog signal conversion;
(ii) on the other hand, the output of above-mentioned differential amplifier (1) is converted to the AC signal (V of impedance voltage then by DC coupling circuit (6) Is),
Then, above-mentioned AC signal is passed through bandpass filter (7) and operational amplifier (8),
Be digital signal then by analog signal conversion.
8. circuit as claimed in claim 7, wherein, reference constant voltage circuit (2) has two the constant voltage diode ZD2 and the ZD3 of mutual series connection, and current-limiting resistor R3;
Negative (-) constant voltage of above-mentioned reference constant voltage circuit (2) generation is connected to the offset side of differential amplifier (1) by buffer circuit;
Diode D1, variohm R4 and diode D2 are connected in series to each end of above-mentioned constant voltage diode ZD2;
The central terminal of above-mentioned variohm R4 is connected to the ADJ end of above-mentioned constant voltage diode ZD2, makes to use variohm R4 fine setting bias reference voltage (Vref).
9. circuit as claimed in claim 7, wherein, the offset side of above-mentioned differential amplifier (1) be connected to by disclosed reference constant voltage circuit (2) produced-the 8V constant voltage.
10. circuit as claimed in claim 7, wherein, high common mode input differential amplifier (1) comprises the differential operational amplifier element that its input impedance is very high, and hundreds of kilo-ohm (K Ω) resistors that are connected to the anti-phase of above-mentioned differential operational amplifier element and homophase input circuit;
Disclosed reference constant voltage circuit (2) is connected to the biasing adjustment end of above-mentioned differential operational amplifier element.
CNB2004800338953A 2003-12-04 2004-12-04 Battery tension and impedance measuring circuit Expired - Fee Related CN100549704C (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
KR2020030037800 2003-12-04
KR20-2003-0037800U KR200344389Y1 (en) 2003-12-04 2003-12-04 Battery cell voltage Measuring circuit using the high voltage common mode differential amplifier
KR1020040099962 2004-12-01

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