CN103166639A - Apparatus and method for assessing the integrity of analog-digital converter - Google Patents

Apparatus and method for assessing the integrity of analog-digital converter Download PDF

Info

Publication number
CN103166639A
CN103166639A CN2012105480260A CN201210548026A CN103166639A CN 103166639 A CN103166639 A CN 103166639A CN 2012105480260 A CN2012105480260 A CN 2012105480260A CN 201210548026 A CN201210548026 A CN 201210548026A CN 103166639 A CN103166639 A CN 103166639A
Authority
CN
China
Prior art keywords
resistor
stress
subjected
voltage
controller
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN2012105480260A
Other languages
Chinese (zh)
Inventor
安东尼·费雷·法布雷加斯
乔斯·加布里埃尔·费尔南德斯·巴纳尔斯
大卫·加梅斯·阿拉里
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Lear Corp
Original Assignee
Lear Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US13/707,107 external-priority patent/US20130158904A1/en
Application filed by Lear Corp filed Critical Lear Corp
Publication of CN103166639A publication Critical patent/CN103166639A/en
Pending legal-status Critical Current

Links

Images

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/10—Calibration or testing
    • H03M1/1009—Calibration
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B60—VEHICLES IN GENERAL
    • B60L—PROPULSION OF ELECTRICALLY-PROPELLED VEHICLES; SUPPLYING ELECTRIC POWER FOR AUXILIARY EQUIPMENT OF ELECTRICALLY-PROPELLED VEHICLES; ELECTRODYNAMIC BRAKE SYSTEMS FOR VEHICLES IN GENERAL; MAGNETIC SUSPENSION OR LEVITATION FOR VEHICLES; MONITORING OPERATING VARIABLES OF ELECTRICALLY-PROPELLED VEHICLES; ELECTRIC SAFETY DEVICES FOR ELECTRICALLY-PROPELLED VEHICLES
    • B60L3/00—Electric devices on electrically-propelled vehicles for safety purposes; Monitoring operating variables, e.g. speed, deceleration or energy consumption
    • B60L3/12—Recording operating variables ; Monitoring of operating variables
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B60—VEHICLES IN GENERAL
    • B60L—PROPULSION OF ELECTRICALLY-PROPELLED VEHICLES; SUPPLYING ELECTRIC POWER FOR AUXILIARY EQUIPMENT OF ELECTRICALLY-PROPELLED VEHICLES; ELECTRODYNAMIC BRAKE SYSTEMS FOR VEHICLES IN GENERAL; MAGNETIC SUSPENSION OR LEVITATION FOR VEHICLES; MONITORING OPERATING VARIABLES OF ELECTRICALLY-PROPELLED VEHICLES; ELECTRIC SAFETY DEVICES FOR ELECTRICALLY-PROPELLED VEHICLES
    • B60L53/00—Methods of charging batteries, specially adapted for electric vehicles; Charging stations or on-board charging equipment therefor; Exchange of energy storage elements in electric vehicles
    • B60L53/10—Methods of charging batteries, specially adapted for electric vehicles; Charging stations or on-board charging equipment therefor; Exchange of energy storage elements in electric vehicles characterised by the energy transfer between the charging station and the vehicle
    • B60L53/14—Conductive energy transfer
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B60—VEHICLES IN GENERAL
    • B60L—PROPULSION OF ELECTRICALLY-PROPELLED VEHICLES; SUPPLYING ELECTRIC POWER FOR AUXILIARY EQUIPMENT OF ELECTRICALLY-PROPELLED VEHICLES; ELECTRODYNAMIC BRAKE SYSTEMS FOR VEHICLES IN GENERAL; MAGNETIC SUSPENSION OR LEVITATION FOR VEHICLES; MONITORING OPERATING VARIABLES OF ELECTRICALLY-PROPELLED VEHICLES; ELECTRIC SAFETY DEVICES FOR ELECTRICALLY-PROPELLED VEHICLES
    • B60L58/00—Methods or circuit arrangements for monitoring or controlling batteries or fuel cells, specially adapted for electric vehicles
    • B60L58/10—Methods or circuit arrangements for monitoring or controlling batteries or fuel cells, specially adapted for electric vehicles for monitoring or controlling batteries
    • B60L58/12—Methods or circuit arrangements for monitoring or controlling batteries or fuel cells, specially adapted for electric vehicles for monitoring or controlling batteries responding to state of charge [SoC]
    • B60L58/15—Preventing overcharging
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B60—VEHICLES IN GENERAL
    • B60L—PROPULSION OF ELECTRICALLY-PROPELLED VEHICLES; SUPPLYING ELECTRIC POWER FOR AUXILIARY EQUIPMENT OF ELECTRICALLY-PROPELLED VEHICLES; ELECTRODYNAMIC BRAKE SYSTEMS FOR VEHICLES IN GENERAL; MAGNETIC SUSPENSION OR LEVITATION FOR VEHICLES; MONITORING OPERATING VARIABLES OF ELECTRICALLY-PROPELLED VEHICLES; ELECTRIC SAFETY DEVICES FOR ELECTRICALLY-PROPELLED VEHICLES
    • B60L58/00—Methods or circuit arrangements for monitoring or controlling batteries or fuel cells, specially adapted for electric vehicles
    • B60L58/10—Methods or circuit arrangements for monitoring or controlling batteries or fuel cells, specially adapted for electric vehicles for monitoring or controlling batteries
    • B60L58/16—Methods or circuit arrangements for monitoring or controlling batteries or fuel cells, specially adapted for electric vehicles for monitoring or controlling batteries responding to battery ageing, e.g. to the number of charging cycles or the state of health [SoH]
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B60—VEHICLES IN GENERAL
    • B60L—PROPULSION OF ELECTRICALLY-PROPELLED VEHICLES; SUPPLYING ELECTRIC POWER FOR AUXILIARY EQUIPMENT OF ELECTRICALLY-PROPELLED VEHICLES; ELECTRODYNAMIC BRAKE SYSTEMS FOR VEHICLES IN GENERAL; MAGNETIC SUSPENSION OR LEVITATION FOR VEHICLES; MONITORING OPERATING VARIABLES OF ELECTRICALLY-PROPELLED VEHICLES; ELECTRIC SAFETY DEVICES FOR ELECTRICALLY-PROPELLED VEHICLES
    • B60L7/00—Electrodynamic brake systems for vehicles in general
    • B60L7/10—Dynamic electric regenerative braking
    • B60L7/18—Controlling the braking effect
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B60—VEHICLES IN GENERAL
    • B60L—PROPULSION OF ELECTRICALLY-PROPELLED VEHICLES; SUPPLYING ELECTRIC POWER FOR AUXILIARY EQUIPMENT OF ELECTRICALLY-PROPELLED VEHICLES; ELECTRODYNAMIC BRAKE SYSTEMS FOR VEHICLES IN GENERAL; MAGNETIC SUSPENSION OR LEVITATION FOR VEHICLES; MONITORING OPERATING VARIABLES OF ELECTRICALLY-PROPELLED VEHICLES; ELECTRIC SAFETY DEVICES FOR ELECTRICALLY-PROPELLED VEHICLES
    • B60L2240/00—Control parameters of input or output; Target parameters
    • B60L2240/40—Drive Train control parameters
    • B60L2240/54—Drive Train control parameters related to batteries
    • B60L2240/547—Voltage
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/124—Sampling or signal conditioning arrangements specially adapted for A/D converters
    • H03M1/129—Means for adapting the input signal to the range the converter can handle, e.g. limiting, pre-scaling ; Out-of-range indication
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02T—CLIMATE CHANGE MITIGATION TECHNOLOGIES RELATED TO TRANSPORTATION
    • Y02T10/00—Road transport of goods or passengers
    • Y02T10/60—Other road transportation technologies with climate change mitigation effect
    • Y02T10/70—Energy storage systems for electromobility, e.g. batteries
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02T—CLIMATE CHANGE MITIGATION TECHNOLOGIES RELATED TO TRANSPORTATION
    • Y02T10/00—Road transport of goods or passengers
    • Y02T10/60—Other road transportation technologies with climate change mitigation effect
    • Y02T10/7072—Electromobility specific charging systems or methods for batteries, ultracapacitors, supercapacitors or double-layer capacitors
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02T—CLIMATE CHANGE MITIGATION TECHNOLOGIES RELATED TO TRANSPORTATION
    • Y02T90/00—Enabling technologies or technologies with a potential or indirect contribution to GHG emissions mitigation
    • Y02T90/10—Technologies relating to charging of electric vehicles
    • Y02T90/14—Plug-in electric vehicles

Abstract

An apparatus for determining integrity of an electronic device in a vehicle is provided. The apparatus comprises a controller operably coupled to a high voltage measuring circuit and to an analog-to-digital converter (ADC). The high voltage measuring circuit receives a high voltage signal and includes at least one stressed resistor for reducing the high voltage signal into a suitable voltage signal. The ADC performs a measurement with the suitable voltage that is indicative of the high voltage signal in a normal operation mode. The controller is configured to apply a calibrated voltage to the at least one stressed resistor in a calibration mode. The controller is further configured to calculate a resistance value of the at least one stressed resistor based on applying the calibrated voltage to the at least one stressed resistor to determine if the at least one stressed resistor is in a stressed state.

Description

Device and method for assessment of the integrity of analog-digital converter
The cross reference of related application
The application requires the rights and interests of the 61/576th, No. 454 U.S. Provisional Application submitting on December 16th, 2011 and the priority of the 13/707th, No. 107 U. S. application requiring to submit on December 6th, 2012, and the disclosure of above-mentioned application is all incorporated into by reference at this.
Technical field
Execution mode disclosed herein relates generally to for assessment of the device and method about the integrity (integrity) of measuring the various electronic equipments that high-tension analogue-to-digital converters (ADC) use.
Background technology
Drift about the various parts that are associated with analog-digital converter (ADC) may occur in time.Such drift may affect the accuracy of the various readouts that obtained by ADC and need at large to be paid close attention to.
The measurement data that the 6th, 445, No. 315 United States Patent (USP)s giving den Breejen provide the ADC by the separation in a plurality of passages that may be correlated with to collect.In this case, data can be transferred to microcontroller or programmable logic device to be used for centralized processing.Gain and the skew of ADC in different passages, particularly its drift relative to each other, be to need problems of concern.Especially, provide a pair of precision resistor to calibrate different passages.ADC can be factory-calibrated and these two precision resistors between ratio be stored in ADC.ADC can recently carry out the later stage self calibration mutually by the gain that it is relative and the resistor ratio of storage.The gain of one in ADC can be adjusted with respect to another, to keep relative gain calibration.Yet for specific application, absolute gain is non-calibration (because resistor separates), only has the relative gain between ADC to be correlated with.
Summary of the invention
A kind of device of integrity of the electronic equipment for determining the vehicles is provided.This device comprises the controller that operationally is coupled to the high voltage measuring circuit and is coupled to analogue-to-digital converters (ADC).This high voltage measuring circuit receives high voltage signal and comprises that at least one for high voltage signal being reduced to suitable voltage signal is subjected to the resistor (stressed resistor) of stress.ADC carries out measurement under normal manipulation mode with suitable voltage, this measures the expression high voltage signal.Controller is configured under calibration mode, calibration voltage to be applied to this, and at least one is subjected to the resistor of stress.Controller also be configured to based on calibration voltage is applied to this at least one be subjected to the resistor of stress to calculate this at least one is subjected to the resistance value of the resistor of stress, whether at least one is under the state that is subjected to stress by the resistor of stress to determine this.
Description of drawings
The execution mode of present disclosure is pointed out in claims especially.Yet in conjunction with the drawings with reference to following detailed description, the further feature of various execution modes will become obviously and will be understood best, in the accompanying drawings:
Fig. 1 has described the device for assessment of the integrity of the various electronic equipments that use about ADC according to a kind of execution mode;
Fig. 2 has described the device for assessment of the integrity of the various electronic equipments that use about ADC according to another kind of execution mode;
Fig. 3 has described the device for assessment of the integrity of the various electronic equipments that use about ADC according to another kind of execution mode;
Fig. 4 has described the device for assessment of the integrity of the various electronic equipments that use about ADC according to another kind of execution mode;
Fig. 5 has described and has been used for determining when according to a kind of execution mode the method that enters the integrity of the various electronic equipments that calibration mode uses about ADC with assessment from normal manipulation mode; And
Fig. 6 A-6B has described a kind of method for assessment of the integrity of the various electronic equipments that use about ADC according to execution mode.
Embodiment
As required, detailed execution mode of the present invention is open at this; However, it should be understood that disclosed execution mode is only can be with the example of the present invention of various and selectable forms embodiments.Accompanying drawing is not necessarily pro rata; Some features may be exaggerated or be dwindled to show the details of concrete parts.Therefore, disclosed ad hoc structure and function detail should not be construed as restriction in this article, and are only used for instructing those skilled in the art to implement in every way representative basis of the present invention.
The execution mode of present disclosure is substantially a plurality of circuit or other electronic equipment and provides.To whole references of these circuit and other electronic equipment and by each provide functional and be not intended to be constrained to and only be included in the content that illustrates and describe herein.Although specific label may be assigned to disclosed various circuit or other electronic equipment, such label also is not intended to the scope that restriction is used for the operation of these circuit and these other electronic equipments.Such circuit and other electronic equipment can be based on the particular types of the electric realization of expectation and combination with one another and/or separately by any way.Will be appreciated that, any circuit disclosed herein or other electronic equipment can comprise that cooperation with each other is with microprocessor, integrated circuit, memory device (for example, FLASH, RAM, ROM, EPROM, EEPROM or their other suitable version) and the software of any number of carrying out operation disclosed herein.
The execution mode of present disclosure is provided for assessing the device and method of the integrity of the various electronic equipments that use about the ADC that is used for various high voltage applications substantially.For example, resistor may stand a large amount of stress when connecting placement with the high voltage input.Under needs used high voltage input condition between ADC measurement resistor two ends, such resistor may be aging due to its a large amount of power losss that experience in time.This value that may cause these resistors changes in time.This situation also may affect the ability of the accurate high voltage reading of providing of ADC in time.Execution mode provided herein can come assessment electronics integrity in time termly by operation under calibration mode, conclude that wherein various voltage measuring values determine whether these electronic equipments have been subjected to stress excessively (that is, its corresponding value changes) in time.The execution mode that provides herein can be subjected to the stress transient state that notice is provided in the situation that various electronic equipment demonstrates.These aspects and other side will be described in greater detail below.
Fig. 1 has described the device 10 for assessment of the integrity of the various electronic equipments that use about ADC12 according to a kind of execution mode.Device 10 generally comprises ADC12, high voltage measuring circuit (" measuring circuit ") 14 and operationally is coupled to each other controller 20.High voltage measuring circuit 14 comprises a plurality of circuit 26a-26n that measure respectively high voltage VM1-VMn.Each circuit 26a-26n will represent that the analog signal of such measuring voltage VM1 – VMn is provided to the corresponding A/D passage ADC1 – ADCn of ADC12.Each ADC1 – ADCn passage is configured to receive predetermined voltage VREF1 – VREFn.
In an example, device 10 can use about the high-voltage charge system, is used to electronic or hybrid vehicles 16 chargings.For example, for the purpose of a plurality of voltage measuring values is provided when using about the charge or discharge operation of the vehicles 16, device 10 can be configured to measure until the voltage of 500V.In another example; device 10 can use about regenerative braking operation; to measure following voltage: the high voltage (for example, 48V or minimum value are 36V or higher) that (i) is for example produced by alternating current generator, (ii) battery input voltage and the protection voltage between at least one switch ends that (iii) produces due to regenerative braking.In another example, different measuring voltages can be corresponding to other high voltage applications, for example battery charger output voltage, the relevant voltage of using about the protection switch and the voltage between battery two ends.Usually, these measuring voltages use ADC12 to be digitized, in order to use digital value in Processing Algorithm, with the performance of controlling high-voltage system and the misuse of avoiding the element in high-voltage system.For example, may be necessary that, avoid overcharging to battery with digital measurement voltage in battery charger, perhaps measure cell voltage to calculate state-of-charge (SOC) and health degree (SOH), with the undertension state avoiding producing due to over-discharge can the infringement of battery (that is, to).Above example can show the high voltage VMI-VMn why ADC12 measures any number.It should be understood that disclosed execution mode in this article can be used for the vehicular applications of any number, and those execution modes that provide and to be not intended to be exhaustively.
Measuring circuit 14 comprises for more than first the resistor RU1-RUn that receives respectively a plurality of high voltage VM1-VMn.Measuring circuit 14 also comprises more than second the resistor RD1-RDn that forms voltage divider together with RU1-RUn.Form such voltage divider, high voltage VM1-VMn is reduced to the suitable voltage levvl that receives for by ADC12.It should be understood that some ADC can not reach high voltage measuring.In this case, voltage divider is reduced to high voltage the voltage that is suitable for by the ADC12 processing.ADC12 receives suitable voltage from voltage divider and carries out the measurement that high voltage is inputted.The measured high voltage of expression as at this suitable voltage of ADC12 place's reception.Measuring circuit 14 also comprises more than the 3rd resistor RDC1 – RDCn.
Measuring circuit 14 comprises more than first switch SW U1 – SWUn and SWD1 – SWDn, more than second switch SW DC1 – SWDCn, more than the 3rd switch SW C1 – SWCn and a plurality of multiplexer circuit 18a – 18n.Multiplexer circuit 18a generally comprises the first input 22a and the second input 24a.Multiplexer circuit 18n generally comprises the first input 22n and the second input 24n.A plurality of switching selector SW_MUX1 – SW_MUXn are provided for input 22a-22n and the 24a-24n that activates respectively multiplexer circuit 18a – 18n.
Device 10 can be controlled so as under normal manipulation mode and operate, and makes device 10 measure high voltage VM1 – VMn.Whether device 10 can also be controlled so as under calibration mode and operates, and makes more than first resistor RU1 – RUn tested, aging due to the high voltage VM1 – VMn that introduces or be subjected to stress excessive to determine it.Similarly, under calibration mode, power supply 28 also can be tested to determine whether VCAL drifts about in time.VCAL is normally made to carry out the voltage reference value of calibration mode by controller 20.
To explain normal manipulation mode about the circuit 26a that installs in 10.For the sake of brevity, will be not in relation to circuit 26n and describe normal manipulation mode.For example, it should be understood that as following described about circuit 24, similar operation will be performed and will be similarly applicable to the circuit 26n in device 10.For circuit 26, unique exception is to replace SWC1, SWU1, RU1, RD1, RDC1, SWD1, SWDC1 etc. with different electronic equipment SWCn, SWUn, RUn, RDn, RDCn, SWDn, SWDCn etc.
Under normal manipulation mode, high voltage measuring circuit 14 is provided to ADC12 with measuring voltage VM1-VMn.Controller 20 is controlled to be switch SW C1 and SWDC opens (that is, disconnecting), simultaneously switch SW U1 and SWD1 is controlled to be closure (that is, connecting).Controller 20 also is set as 1 with switching selector SW_MUX1, makes input 22n receive measuring voltage VM1.Thereby, to the input voltage of ADC1 (be VADC) for example:
VADC1=VM1*RD1/ (RD1+RU1)=VM1/DIV1 (equation 1)
Usually, DIV1 is the constant that equals (RD1+RU1)/RD1.At the end of line place, controller 20 storage values DIV1, and with such value determine the device 10 be in the scene in the time whether need to calibrate again.In the time of under being in normal manipulation mode, can find out, the resistor RU1 in the divider network of equation 1 stands the more stress of stress that stands than resistor RD1.For example, suppose that VM1 is in the scope of 500V.Equal 1.2V if be applied to the VREF1 of ADC1, so for the input voltage that remains to ADC1 (for example, VADC1), the ratio between the resistance of the resistor in divider network should be approximately 500 or as follows:
RU1=500*RD1 (equation 2)
For example, if RD1 equals 1 kilohm (that is, 1000 ohm), RU1 equals 500 kilohms and DIV1=(RD1+RU1)/RD1=501 so.
Usually, different voltage VREF1-VREFn is respectively applied to ADC1-ADCn.It should be understood that in the situation that VCAL or RU1 drift about in time, any one in voltage VREF1-VREFn can be revised or calibration more in time.This will explain below in more detail.
The recruitment that is placed in the stress on RU1 can show in the following manner again.For example, in the situation that RD1=1KOhm, RU1=500KOhm and VM1=500V, the power consumption on RU1 provides by following equation:
V_RU1=VM1*RU1/ (RD1+RU1)=499V (equation 3)
P_RU1=V_RU 2/ RU1=0.5W (equation 4)
Power consumption in RD1 can show by following equation:
V_RD1=VM1*RD1/ (RD1+RU1)=1V (equation 5)
P_RD1=V_RD1 2/ RD1=0.001W (equation 6)
As shown, the power consumption on RD1 is less than the power consumption on RU1 significantly.This situation demonstrates when being in operator scheme RU1(of lower time and RUn) amount of the stress that may experience.Because be placed in the recruitment of the stress on RU1 and RUn, such resistor also operates at the temperature of the temperature that is much higher than RD1 and RDn.This situation may cause RU1 and RUn serious aging (for example, its corresponding resistance nominal value may change in time), and RD1 and RDn can be aging with slow a lot of speed simultaneously, if having at all aging.
It should be understood that RU1 and RUn can be formed by single resistor, but can instead be formed by a plurality of resistors, these a plurality of resistors are one another in series to reduce the stress to a certain degree on these resistors.For example, RU1 and RUn can each be the resistor network of the resistor of five 100 kilohms.Although RU1 and RUn can be formed by the resistance-type network that comprises a plurality of resistors, such network still may show than RD1 and the large stress levels of RDn.Therefore, in view of above content, may need to compensate the variation on RD1 and RDn.This can be placed under calibration mode and realize by installing 10.
Again, will explain about installing circuit 26a in 10 operation of calibration mode.Purpose for simplicity, calibration mode operation will be not in relation to circuit 26n and describe.For example, it should be understood that as following described about circuit 26a, similar operation will be performed and will be similarly applicable to the circuit 26n in device 10.For circuit 26n, exception is to replace SWC1, SWU1, RU1, RD1, RDC1, SWD1, SWDC1 etc. with different electronic equipment SWCn, SWUn, RUn, RDn, RDCn, SWDn, SWDCn etc.
Measuring circuit 14 comprises power supply 28, and when device 10 is in calibration mode lower time, power supply 28 is provided to measuring circuit 14 with predetermined voltage VCAL.Under calibration mode, device 10 is not measured high voltage VM1 – VMn.Controller 20 is controlled to be switch SW C1 and SWDC1 closure and switch SW U1 and SWD1 is controlled to be and opens.Resistor RDC1 uses under calibration mode usually.This condition has guaranteed that RDC1 is not used very continually, and this has further guaranteed not drift or aging in time of RDC1.In addition, controller 20 control switch selector SW_MUX1 are zero, to activate the input 22a of multiplexer 18a.Thereby the first measuring voltage Meas_1_A in ADC_1 is:
Meas_1_A=VADC1=VCAL (equation 7a)
Controller 20 reads and stores Meas_1_A, whether still within the acceptable range to determine VCAL.
Then controller 20 is controlled to be one with switching selector SW_MUX1, to activate input 22n.Thereby the second measuring voltage Meas_2_A in ADC_1 is:
Meas_1_B=VADC1=VCAL*RDC1/ (RDC1+RU1) (equation 7b)
By using equation 7a and 7b, the following equation of controller 20 use is determined the value of RU1:
RU1=RDC1* (Meas_1_A-Meas_1_B)/Meas_1_B (equation 8)
The RU1 value that use calculates, device 10 determines whether RU1 changes in time, and if need just to calibrate the constant value of DIV1 again.For example, compare with the storage values of RU1 as the value of the RU1 that calculates according to equation 8, determine whether it has changed or aging in time.In the situation that the calculated value of RU1 surpasses the storage values of RU1 under calibration mode, then controller 20 determines that the value of RU1 changes in time.
As above specified about equation 1, controller 20 stores the constant value of DIV1.In the situation that RU1 is confirmed as is aging, controller 20 is revised the constant value of (or calibration again) DIV1, to solve the aging of RU1.DIV1(or any other constant value, for example DIV2 – DIVn) this again compensation for calibrating errors be subjected to resistor RU1 aging of stress, and make ADC12 can device 10 at the scene in the time exact value that represents measuring voltage VM1 – VMn is provided.
Fig. 2 has described the another kind of device 10' for assessment of the integrity of the various electronic equipments that use about ADC12 according to a kind of execution mode.Device 10 ' be similar to device 10 operation of Fig. 1.Yet, the device 10' can with single switch SWDCn and single resistor RDCn determine RU1 and RUn whether aging.In this is realized, do not change normal manipulation mode and may not need switch SW DC1 and resistor RDC1.Again, under calibration mode, switch SW DCn and resistor RDCn use about device 10' usually.
Under calibration mode, controller 20 is controlled to be switch SW Cn and SWDCn closure and switch SW Un and SWDn is controlled to be and opens.In addition, controller 20 is controlled to be zero with switching selector SW_MUXn, to activate input 22a and 24a.Thereby the first measuring voltage Meas_n_A in ADC_1 is:
Meas_n_A=VADCn=VCAL (equation 9a)
Controller 20 reads and stores Meas_1_A, whether still within the acceptable range to determine VCAL.
Then controller 20 is controlled to be one with switching selector SW_MUXn.Thereby the second measuring voltage Meas_n_B in ADCn is:
Meas_n_B=VADCn=VCAL*RDCn/ (RDCn+RUn) (equation 9b)
By using equation 9a and 9b, the following equation of controller 20 use is determined the value of RUn.Controller 20 is similar to equation 8 and calculates RUn.
RUn=RDC* (Meas_n_A-Meas_n_B)/Meas_n_B (equation 10)
The RUn value that use calculates, device 10' determines whether RUn changes in time, and if need just to calibrate the constant value of DIV1 again.
Fig. 3 has described the another kind of device 10 for assessment of the integrity of the various electronic equipments that use about ADC12 according to another kind of execution mode ".Device 10 " provides additional Circuits System to compensate or monitored resistance device RU1 and RUn aging usually.For example, resistor RUC1 – RUCn, switch SW UC1 – SWUCn and SWUB1 – SWUBn are provided.
Now will be about installing 10 " circuit 26a the normal mode operation is described.Purpose for simplicity will be not in relation to circuit 26n and describe the normal mode operation.For example, it should be understood that as following described about circuit 26a, except the term of the resistor that changes for circuit 26n and switch, similar operation will be performed and will be similarly applicable to device 10 " in circuit 26n.
Under normal manipulation mode (for example, when device 10 " when measuring the VM1 for the first circuit 24), controller 20 is controlled to be switch SW C1, SWUC1 and SWDC1 and opens (that is, disconnecting); and switch SW U1, SWUB1 and SWD1 are controlled to be closure (that is, connecting).Controller 20 also is set as 1 with switching selector SW_MUX1, makes input 22n receive measuring voltage VM1.Thereby, to the input voltage of ADC_1 be:
VADC1=VM1*RD1/ (RD1+RU1)=VM1/DIV1 (equation 11)
Now will be about installing 10 " circuit 26a calibration mode is described.Purpose for simplicity, calibration mode operation will be not in relation to circuit 26n and describe.For example, it should be understood that as following described about circuit 26a, except the term of the resistor that changes for circuit 26n and switch, similar operation will be performed and will be similarly applicable to device 10 " in circuit 26n.
Controller 20 is controlled to be zero to activate input 22a with switching selector SW_MUX1.Thereby the first measuring voltage Meas_1_A in ADC_1 is:
Meas_1_A=VADC1=VCAL (equation 12)
Controller 20 reads and stores Meas_1_A, whether still within the acceptable range to determine VCAL.
Controller 20 then control switch selector SW_MUX1 is one.Controller 20 go back control switch SWC1, SWUB1, SWDC1 for closed (that is, connecting) and switch SW U1, SWUC1 to SWD1 for opening (that is, disconnection).Thereby the second measuring voltage Meas_1_B in ADC_1 is:
Meas_1_B=VADC1=VCAL*RDC1/ (RDC1+RU1) (equation 13a)
Controller 20 calculates VADC1 in view of equation 13.After this calculated, controller 20 can determine whether the value of RU1 drifts about in time:
RU1=RDC1* (Meas_1_A-Meas_1_B)/Meas_1_B (equation 13b)
Controller 20 remains one with switching selector SW_MUX1.Then controller 20 is controlled to be switch SW C1, SWUC1 and SWD1 closure (that is, connecting) and switch SW U1, SWUB1 and SWDC1 are controlled to be opens (that is, disconnecting).Thereby the 3rd measuring voltage Meas_1_C in ADC_1 is:
Meas_1_C=VADC1=VCAL*RD1/ (RD1+RUC1) (equation 13c)
Controller 20 calculates VADC in view of equation 14.After this calculated, controller 20 determined whether the value of resistor RD1 drifts about in time.
RD1=RUC1*Meas_1_C/ (Meas_1_A-Meas_1_C) (equation 14)
In case the value of RU1 and RD1 is known, the constant value of calibrating again as described above DIV1 just becomes possibility.Usually, less than 10 the time, such difference can represent little power consumption when the ratio between RU1 and RD1, insignificant aging corresponding in RD1 or RU1 of this little power consumption.Yet in the situation that the ratio between RU1 and RD1 surpasses predetermined rate value, this situation can represent aging may the surpassing of RU1 and/or RD1 can ignore level.
Fig. 4 has described the another kind of device 10 for assessment of the integrity of the various electronic equipments that use about ADC12 according to another kind of execution mode " '.Device 10 " ' can use about high voltage precision voltage reference value VCAL_HV.This high voltage precision voltage reference value can be provided for simple implementation.
Now will be about installing 10 " ' circuit 26a the normal mode operation is described.Purpose for simplicity will be not in relation to circuit 26n and describe the normal mode operation.For example, it should be understood that as following described about circuit 26a, except the term of the resistor that changes for circuit 26n and switch, similar operation will be performed and will be similarly applicable to device 10 " ' in circuit 26n.
Under normal manipulation mode (for example, when device 10 " ' when measuring the VM1 for circuit 26a), controller 20 is controlled to be switch SW C1 opens (that is, disconnecting), and switch SW U1 is controlled to be closure (that is, connecting).Controller 20 also is set as 1 with switching selector SW_MUX1, makes input 22n receive measuring voltage VM1.Thereby, to the input voltage of ADC_1 be:
VADC1=VM1*RD1/ (RD1+RU1)=VM1/DIV1 (equation 15)
Now will be about installing 10 " ' circuit 26a calibration mode is described.Purpose for simplicity, calibration mode operation will be not in relation to circuit 26n and describe.For example, it should be understood that as following described about circuit 26a, except the term of the resistor that changes for circuit 26n and switch, similar operation will be performed and will be similarly applicable to device 10 " ' in circuit 26n.
Controller 20(i) switching selector SW_MUX1 is controlled to be zero, (ii) switch SW C1 is controlled to be closure (that is, connecting) and (iii) switch SW U1 is controlled to be and open (that is, disconnecting) (for example, input 22a is activated).Thereby, to the input voltage of ADC be:
VADC1=VCAL_HV*RDC1/ (RDC1+RUC1) (equation 16)
Then controller 20 is controlled to be one with switching selector SW_MUX1, to activate input 22a.Thereby the input voltage of ADC is:
VADC1=VCAL_HV*RD1/ (RDC+RU1) (equation 17)
After carrying out two kinds of measurements, whether controller 20 is determined the value of RU1 and RD1, change in time with the value of determining them.In case these values are known, calibration DIV1 just becomes possibility.
Fig. 5 has described and has been used for determining when according to a kind of execution mode the method 100 that enters the integrity of the various electronic equipments that calibration mode uses about ADC 12 with assessment from normal manipulation mode.
In operation 102, controller 20 is initialised, and makes time (t) sum counter value N be initialised.In addition, controller 20 storages are corresponding to the value t(n of the scheduled time).Calibration mode is left and entered to this scheduled time with the time of the integrity of the various electronic equipments apparatus for evaluating 10,10', 10 " and 10 " ' corresponding to controller 20 as mentioned above from normal manipulation mode usually.In an example, scheduled time t(n) can be corresponding to uniformly-spaced (equispaced time instant) constantly, it follows equation t (n)=nT, and wherein T is constant; Perhaps scheduled time t(n) can be corresponding to unequal interval constantly, it is followed, and for example each engine starts or the situation when the engine power down; Perhaps scheduled time t(n) can be corresponding to particular moment, it calculates by the variation modeling to Voltage Reference and/or resistor, as what propose in co-pending the 13/679th, No. 370 U. S. application of submitting on November 16th, 2012, this U. S. application accordingly by reference integral body incorporate into.
In operation 104, controller 20 operates under normal manipulation mode.As mentioned above, device 10,10', 10 " and 10 " ' can carry out and measure high-tension operation, to provide the vehicles relevant operation." and 10 " ' when operating under normal mode, controller 20 can increase the time (t) as device 10,10', 10.It should be understood that the time (t) may increase along with a plurality of normal mode operations.For example, when moving under normal manipulation mode, the time (t) may disappear or continue with the repeatedly use of device 10,10', 10 " and 10 " ' as device 10,10', 10 " and 10 " '.
In operation 106, controller 20 can compare the current time (t) and scheduled time t(n).For example, controller 20 can comparison means 10,10', 10 " and 10 " ' under normal manipulation mode at elapsed time or All Time and the scheduled time t(n of set point place's operation), to determine that whether the time (t) is over t(n).For example, can carry out this comparison when each engine starts or when the engine power down.Triggered time (t) and scheduled time t(n) the vehicles operation of comparison can change based on the desired standard of specific implementation.
If the time (t) surpasses scheduled time t(n), method 100 moves on to operation 108 so.If do not surpass, method 100 is retracted operation 104 so.
In operation 108, controller 20 will install 10,10', 10 " with 10 " ' is controlled to be from normal manipulation mode and moves on to calibration mode.
In operation 110, controller 20 increases Counter Value N and retracts operation 104 with one.Counter N stores the number of the calibration of completing.Therefore, possible is, the number of times that determine 10,10', 10 " and 10 " ' has been calibrated and warning is provided the calibration again of some after or stops carrying out calibration again because install 10,10', 10 " and 10 " ' may surpass it and expect operation lifetime.
Fig. 6 A-6B has described a kind of method 200 for assessment of the integrity of the various electronic equipments that use about ADC12 according to execution mode.Purpose for simplicity, will be as mentioned about install 10, the circuit 26a of 10', 10 " and 10 " ' describes the method.It should be understood that method 200 similarly is applicable to circuit 26n.
In operation 202, controller 22 is set count value i and is equaled 1.Count value i usually corresponding to be placed in corresponding circuit 26a under calibration mode, 26b, 26c ... ..26n.For example, for about the device 10 shown in Fig. 1, when i=1, this situation indication circuit 26a will be placed under calibration mode, and the rest may be inferred along with count value increases.
In operation 204, controller 20 relatively count value i with install 10, different ADC(in 10', 10 ", 10 " ' for example, ADC_1 – ADC_N(is referring to figure 1 – 4)) total number (for example, N_ADC), with determine count value whether higher than device 10,10', 10 ", 10 " ' in the total number of different ADC.If count value i equals N_ADC+1, this situation ordinary representation whole circuit (26a, 26n) of operationally being coupled to ADC12 have been placed under calibration mode and have obtained the corresponding measured value of VADC1 – VADCn so.If satisfy this condition, method 200 proceeds to operation 220 so.If do not satisfy this condition, so the next circuit of this situation ordinary representation (for example, 26b, 26c ... ..26n) will be placed under calibration mode, to be used for measuring the purpose of VADCb-VADCn.If count value i be not equal to different ADC total number (for example, N_ADC), so method 200 move on to the operation 206.
In operation 206, controller 20(i) initialization selector switch SW_MX_i=0, Closing Switch SWCi and SWDCi also open switch SW Ui and SWDi, so that corresponding circuit 26a-26n is placed under calibration mode.
In operation 208, controller 20 is for example determined the first measuring voltage Meas_1_A(, referring to equation 7a), the first measuring voltage Meas_1_A equals VCALi and VADCi in this case.
In operation 210, controller 20 stores the first measuring voltage Meas_1_A.
In operation 212, controller 20 is set as 1 with selector switch SW_MX_i.
In operation 214, when selector switch SW _ MX_i was set as 1, the second measuring voltage Meas_1_B(that controller 20 is determined following settings was also referring to, equation 7b for example).In this case, VADCi measures according to following equation:
VADCi=VCAL*RDCi/ (RDCi+RUi) (equation 18)
In operation 216, controller 20 stores the second measuring voltage MEAS_1_B.
In operation 218, controller 20 increases count value i and turns back to operation 204 with one.
In operation 220, controller 20 is determined the first measuring voltage (for example, MEAS_1_i) whole and the second measuring voltage (for example, MEAS_2_i) whole whether respectively over the first preset range and the second preset ranges.For example, for whole circuit 26a – 26n, controller 20 is determined the first measuring voltage (for example, MEAS_1_i) whole and the second measuring voltage (for example, MEAS_2_i) whole whether respectively over the first preset range and the second preset ranges.If this situation is true, method 200 moves on to operation 222 so.If untrue, method 200 moves on to operation 226 so.
In operation 222, controller 20 is determined usually to provide the power supply 28 of VCAL just experiencing to lose efficacy and is provided electronic notification for the user: exist and lost efficacy.If VCAL is experiencing inefficacy, what this situation will cause the whole of the first measuring voltage MEAS_1_i and the second measuring voltage MEAS_2_i usually all provides off-limits value.
In operation 224, controller 20 stops carrying out calibration mode, because provide the power supply 28 of VCAL experiencing inefficacy.
In operation 226, for any circuit in circuit 26a – 26n, whether at least one in definite the second measuring voltage of controller 20 be (for example, MEAS_2_i) over the second preset range.If this situation is true, method 200 moves on to operation 228 so.If untrue, method 200 moves on to operation 230 so.
In operation 228, controller 20 provides electronic notification: the resistor in device 10,10', 10 " and 10 " ' is aging and no longer in suitable scope.
In operation 230, for circuit 26a, in the situation that being detected as, VCAL demonstrates drifting state (referring to operation 236), and in order to calibrate the purpose of any VREF1, controller 20 is set count value i and is equaled 1 again.For circuit 26a, in the situation that being detected as, RU1 demonstrates drifting state (referring to operation 238), in order to calibrate the purpose of RU1, controller 20 is set count value i and is equaled 1 again.
In operation 232, controller 20 relatively the different ADC in count value i and device 10,10', 10 " with 10 " ' total number (for example, N_ADC), with determine count value whether higher than device 10,10', 10 ", 10 " ' in the total number (N_ADC) of different ADC).If count value i equals N_ADC+1, this situation ordinary representation does not need to calibrate again so.In this case, then method 200 proceeds to operation 234.If count value i is not equal to N_ADC+1, this situation ordinary representation may need to calibrate again so, and will according to the needs for physical circuit 26a – 26n, carry out calibration again about operating 236 and/or 238.If count value i is not equal to predetermined value, method 200 moves on to operation 236 so, and the rest may be inferred.
In operation 236, the first measured value of controller 20 use VADC1 is calibrated for any one of the VREFi of given ADC_1 – ADC_n or a plurality of again.
Calibrate as follows.ADC12 generates according to following equation and is used for transducer input V INDigital output code.
Output=V IN* (2 n/ VREF)
Wherein, " output " is the digital output code with decimal system form, and " n " is the number of figure place of the resolution (resolution) of ADC.After manufacturing, device 10,10', 10 " and 10 " ' are in end of line place's calibration, and the output code that obtains is stored in memory and this value is used to the correction to follow measured value, as disclosed herein.When completing calibration, the code of storage is compared with the output code of measurement, and the value that is stored in memory is correspondingly revised.
The operation 238 in, the second measured value of controller 20 use VADC1 calibrate again in RU1-RUn any one or a plurality of.
As explained above, calibration is carried out by the constant value of revising DIV1.Consider ADC1 and the first measuring voltage and the second measuring voltage (for example, Meas_1_A and Meas_1_B), the following equation of controller 20 use is determined the value of RU1:
RU1=RDC1*(Meas_1_A-Meas_1_B)/Meas_1_B
After the value that calculates RU1, device 10,10', 10 ", 10 " ' determine whether it changes in time, and calibrate the constant value of DIV1 again.
In operation 240, controller 20 is increased to 2 with count value i, makes for circuit 26b, operation 136 and 138 can be re-executed again, in the situation that needs are calibrated again.
Although more than described illustrative embodiments, do not meant these execution modes and described the possible form of institute of the present invention.More properly, the word that uses in specification is descriptive rather than restrictive word, and should be understood that and can make multiple variation and without departing from the spirit and scope of the present invention.In addition, the feature of various enforceable execution modes can be combined, to form the other execution mode of the present invention.

Claims (20)

1. the device of the integrity of a electronic equipment that be used for to determine the vehicles, described device comprises:
Controller, it operationally is coupled to the high voltage measuring circuit and is coupled to analogue-to-digital converters (ADC), described high voltage measuring circuit is used for receiving high voltage signal and comprising the resistor that at least one is subjected to stress, be used for described high voltage signal is reduced to suitable voltage signal, come under normal manipulation mode, it to be carried out measurement to offer described ADC, described measurement represents described high voltage signal, and described controller is configured to:
Under calibration mode, calibration voltage is applied to described at least one be subjected to the resistor of stress; And
Based on described calibration voltage is applied to described at least one be subjected to the resistor of stress calculate described at least one be subjected to the resistance value of the resistor of stress, with determine described at least one whether be under the state that is subjected to stress by the resistor of stress.
2. device according to claim 1, wherein said controller also be configured to described calibration voltage is applied to described at least one be subjected to measure described calibration voltage before the resistor of stress, to produce the first measuring voltage.
3. device according to claim 2, wherein said controller also is configured to control at least one switch, is used for stoping described measuring circuit receive described high voltage signal and be used for making described measuring circuit can receive described calibration voltage under described calibration mode.
4. device according to claim 2, wherein said controller also be configured to described calibration voltage be applied to described at least one be subjected to the resistor of stress, to produce the second measuring voltage.
5. device according to claim 4, wherein said controller also be configured to based on described the second measuring voltage calculate described at least one be subjected to the resistance value of the resistor of stress.
6. device according to claim 1, wherein said controller also is configured to control at least one switch, is used for controlling described device and moves on to described calibration mode from described normal manipulation mode.
7. device according to claim 1, wherein said at least one be subjected to the resistor of stress and the first resistor cooperation so that voltage divider to be provided, be used for that described high voltage signal is reduced to described suitable voltage signal and come to carry out under described normal manipulation mode and measure.
8. device according to claim 1, wherein said high voltage signal is greater than 36 volts.
9. device according to claim 1, wherein said high voltage signal is greater than 400 volts.
10. the device of the integrity of a electronic equipment that be used for to determine the vehicles, described device comprises:
The high voltage measuring circuit, it is used for receiving high voltage signal and comprising the resistor that at least one is subjected to stress, is used for described high voltage signal is reduced to suitable voltage signal;
Analog-digital converter (ADC), it is used for receiving described suitable voltage levvl to carry out voltage measurement under normal manipulation mode, and described measurement represents described high voltage signal;
Described controller is configured to:
Under calibration mode, calibration voltage is applied to described at least one be subjected to the resistor of stress; And
Based on described calibration voltage is applied to described at least one be subjected to the resistor of stress calculate described at least one be subjected to the resistance value of the resistor of stress, with determine described at least one whether be under the state that is subjected to stress by the resistor of stress.
11. device according to claim 10, wherein said controller also be configured to described calibration voltage is applied to described at least one measure described calibration voltage before being subjected to the resistor of stress, to produce the first measuring voltage.
12. device according to claim 11, wherein said controller also is configured to control at least one switch, is used for stoping described measuring circuit receive described high voltage signal and be used for making described measuring circuit can receive described calibration voltage under described calibration mode.
13. device according to claim 11, wherein said controller also be configured to described calibration voltage be applied to described at least one be subjected to the resistor of stress, to produce the second measuring voltage.
14. device according to claim 13, wherein said controller also be configured to based on described the second measuring voltage calculate described at least one be subjected to the resistance value of the resistor of stress.
15. device according to claim 10, wherein said controller also are configured to control at least one switch, are used for controlling described device and move on to described calibration mode from described normal manipulation mode.
16. device according to claim 10, wherein said at least one be subjected to the resistor of stress and the first resistor cooperation so that voltage divider to be provided, be used for that described high voltage signal is reduced to described suitable voltage signal and come to carry out under described normal manipulation mode and measure.
17. device according to claim 10, wherein said high voltage signal is greater than 36 volts.
18. device according to claim 10, wherein said high voltage signal is greater than 400 volts.
19. the method for the integrity of the electronic equipment of determining the vehicles, described method comprises:
Receive high voltage signal;
Be subjected to the resistor of stress to reduce described high voltage signal by at least one, so that suitable voltage signal to be provided;
Described suitable voltage levvl is carried out digital translation measure to carry out under normal manipulation mode, described measurement represents described high voltage signal;
Under calibration mode, calibration voltage is applied to described at least one be subjected to the resistor of stress; And
Based on described calibration voltage is applied to described at least one be subjected to the resistor of stress calculate described at least one be subjected to the resistance value of the resistor of stress, with determine described at least one whether be under the state that is subjected to stress by the resistor of stress.
20. method according to claim 19 also comprises: described calibration voltage is applied to described at least one measure described calibration voltage before being subjected to the resistor of stress, to produce the first measuring voltage.
CN2012105480260A 2011-12-16 2012-12-17 Apparatus and method for assessing the integrity of analog-digital converter Pending CN103166639A (en)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US201161576454P 2011-12-16 2011-12-16
US61/576,454 2011-12-16
US13/707,107 2012-12-06
US13/707,107 US20130158904A1 (en) 2011-12-16 2012-12-06 Apparatus and method for assessing the integrity of analog-digital converter

Publications (1)

Publication Number Publication Date
CN103166639A true CN103166639A (en) 2013-06-19

Family

ID=48522341

Family Applications (1)

Application Number Title Priority Date Filing Date
CN2012105480260A Pending CN103166639A (en) 2011-12-16 2012-12-17 Apparatus and method for assessing the integrity of analog-digital converter

Country Status (2)

Country Link
CN (1) CN103166639A (en)
DE (1) DE102012223245A1 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105978564A (en) * 2015-03-11 2016-09-28 美国亚德诺半导体公司 Limiting aging effects in analog differential circuits

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102524184B1 (en) * 2018-11-16 2023-04-21 현대자동차주식회사 power DISTRIBUTION apparatus FOR VEHICLE and control method thereof

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6567022B1 (en) * 2002-08-12 2003-05-20 Lsi Corporation Matching calibration for dual analog-to-digital converters
CN1882843A (en) * 2003-12-04 2006-12-20 保诚电子工程有限公司 Battery cell voltage and impedance measuring circuit
CN101876686A (en) * 2009-04-28 2010-11-03 Vega格里沙贝两合公司 Be used to monitor the diagnostic circuit of analog-digital converter circuit

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6445315B1 (en) 2001-07-12 2002-09-03 Cirrus Logic, Inc. Calibration of isolated analog-to-digital converters

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6567022B1 (en) * 2002-08-12 2003-05-20 Lsi Corporation Matching calibration for dual analog-to-digital converters
CN1882843A (en) * 2003-12-04 2006-12-20 保诚电子工程有限公司 Battery cell voltage and impedance measuring circuit
CN101876686A (en) * 2009-04-28 2010-11-03 Vega格里沙贝两合公司 Be used to monitor the diagnostic circuit of analog-digital converter circuit

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105978564A (en) * 2015-03-11 2016-09-28 美国亚德诺半导体公司 Limiting aging effects in analog differential circuits

Also Published As

Publication number Publication date
DE102012223245A1 (en) 2013-06-20

Similar Documents

Publication Publication Date Title
CN111263889B (en) Method for operating a battery sensor and battery sensor
US7656164B2 (en) Method of voltage measurement and apparatus for same
KR101895619B1 (en) State judging device, battery apparatus, state judging method
CN101937066A (en) Self-calibrating method of internal reference resistors of multi-range digital electronic measuring instrument
KR101758408B1 (en) Device and method for determining a range of a battery characteristic curve
US9234943B2 (en) Method and system for battery current measurement calibration
JP5897701B2 (en) Battery state estimation device
US8253427B2 (en) Resistance bridge architecture and method
US10473724B2 (en) Method for determining a load current and battery sensor
CN102288823A (en) Determination of insulation resistance of an electric DC circuit
US11156643B2 (en) Current sensor with optimized current density distribution, method for determining a load current
US20110128020A1 (en) Test apparatus and power supply apparatus
CN103166639A (en) Apparatus and method for assessing the integrity of analog-digital converter
EP2273277A1 (en) Internal self-check resistance bridge and method
CN110824404B (en) DC voltage transformer field calibration method
CN113589045A (en) Sensitive resistance measuring device and measuring method
US20130158904A1 (en) Apparatus and method for assessing the integrity of analog-digital converter
US9885741B2 (en) Method for determining the supply voltages of a load, and load
WO2010136310A1 (en) Circuit arrangement and method for temperature measurement
US11287482B2 (en) Dual-voltage battery with current sensors, and calibration method for the same
KR101606232B1 (en) Electronic watt-hour meter
RU2507523C2 (en) Multi-channel device for measurement of insulation resistance in bundles and cables
US20100145652A1 (en) Method for estimating the temperature in an internal combustion engine
CN112834974A (en) Method for testing a battery sensor, and battery sensor
CN109983700A (en) For the method and apparatus of the existing detection of motor vehicles

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
WD01 Invention patent application deemed withdrawn after publication
WD01 Invention patent application deemed withdrawn after publication

Application publication date: 20130619