CN113589045A - Sensitive resistance measuring device and measuring method - Google Patents

Sensitive resistance measuring device and measuring method Download PDF

Info

Publication number
CN113589045A
CN113589045A CN202110946707.1A CN202110946707A CN113589045A CN 113589045 A CN113589045 A CN 113589045A CN 202110946707 A CN202110946707 A CN 202110946707A CN 113589045 A CN113589045 A CN 113589045A
Authority
CN
China
Prior art keywords
circuit
resistor
sensitive
voltage
resistance
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CN202110946707.1A
Other languages
Chinese (zh)
Other versions
CN113589045B (en
Inventor
张小凤
孙万里
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Zhuhai Geehy Semiconductor Co Ltd
Original Assignee
Zhuhai Geehy Semiconductor Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Zhuhai Geehy Semiconductor Co Ltd filed Critical Zhuhai Geehy Semiconductor Co Ltd
Priority to CN202110946707.1A priority Critical patent/CN113589045B/en
Publication of CN113589045A publication Critical patent/CN113589045A/en
Application granted granted Critical
Publication of CN113589045B publication Critical patent/CN113589045B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/14—Measuring resistance by measuring current or voltage obtained from a reference source

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)

Abstract

The invention provides a sensitive resistance measuring device and a measuring method, comprising an MCU circuit and a measuring circuit; the MCU circuit includes: the ADC unit is used for collecting the voltage value of the measuring circuit, and the power IO interface is used for supplying power to the measuring circuit; wherein, the ADC unit includes: the first voltage acquisition channel circuit and the second voltage acquisition channel circuit; the measurement circuit includes: the sensitive resistance branch circuit and the standard resistance branch circuit are connected in parallel; the sensitive resistance branch comprises a sensitive resistance RT and a standard resistance R which are connected in series; the standard circuit branch comprises two standard resistors R connected in series; the first voltage acquisition channel circuit is used for acquiring the voltage value of a series connection point between the series-connected sensitive resistor RT and the standard resistor R; the second voltage acquisition channel circuit is used for acquiring the voltage value of a series connection point between two standard resistors R connected in series. The sensitive resistor measuring device can effectively improve the accuracy of measuring the resistance value of the sensitive resistor.

Description

Sensitive resistance measuring device and measuring method
Technical Field
The invention relates to a measuring technology, in particular to a sensitive resistance measuring device and a measuring method.
Background
The sensitive resistor is a special resistor sensitive to the analog quantity such as illumination intensity, pressure, humidity and temperature. For example, a thermistor is an element whose resistance value varies with temperature, and is divided into a positive temperature coefficient thermistor and a negative temperature coefficient thermistor; the humidity sensitive resistor is an element with resistance value changing with humidity, and converts the humidity into an electric signal; in addition to the temperature/humidity sensitive resistors described above, there are many other types of sensitive resistors.
In the prior art, a scheme of direct resistance voltage division by an Analog to Digital Converter (ADC) is generally adopted for measuring a sensitive resistor, and as shown in fig. 1, a sensitive resistor measuring apparatus 10 includes a micro control Unit 101 (MCU) and a measuring circuit 102. The MCU101 comprises an ADC unit 1011 and a power IO interface 1012, wherein the ADC unit 1011 is used for collecting an electric signal of the sensitive resistor RT and converting the electric signal into a digital signal for computer display; the power IO interface 1012 is used for providing the measurement circuit 102 with a voltage VioThe power supply of (3). The measuring circuit 102 is composed of two resistors, wherein one end of the sensitive resistor RT is grounded, and the other end is connected with the standard resistor R. One end of the standard resistor R is connected with the sensitive resistor RT, the other end of the standard resistor R is connected with the power IO interface 1012, and power is supplied to the measuring circuit 102 through the power IO interface 1012. As shown in fig. 1, the ADC unit 1011 is used to collect the voltage Vx at one end of the sensing resistor RT, and the voltage at the other end of the standard resistor R connected to the power IO interface 1012 is VioFrom ohm's law, it can be known that:
(Vio-Vx)/RR＝Vx/RRT (1)
obtained according to equation (1):
RRT＝Vx×RR/(Vio-Vx) (2)
according to the formula (2), the error influence factors influencing the resistance value of the sensitive resistor RT include: vx, R and VioWherein for VioIn a word: voltage V output from power IO interface 1012ioIn addition to supplying power to the measurement circuit 102, other circuit blocks in the measurement device 10 are also supplied with power, and the circuit blocks operate in different states at different times, i.e., VioIs dynamically variable, plus is influenced by ambient interference, etc., VioThe value of (a) will fluctuate greatly, producing errors; further, for Vx: due to the reference voltage V of the ADC unit 1011bThere may be an error resulting in the absolute voltage value V measured by the ADC unit 1011xErrors may also exist; finally, for R: the standard resistor R is affected by the production process and materials, and may have certain errors. Therefore, the resistance value of the sensitive resistor RT measured by the method has a large error.
If the sensitive resistor is a temperature/humidity sensitive resistor, the sensitive resistor is related to a temperature/humidity parameter to be measured; if there is an error in the measured value of the sensitive resistor, the accuracy of the acquired temperature/humidity parameters is affected, and therefore, a sensitive resistor measuring device and a measuring method capable of accurately measuring the resistance value of the sensitive resistor are urgently needed to ensure the accuracy of the temperature/humidity parameter acquisition.
Disclosure of Invention
The invention provides a sensitive resistor measuring device and a sensitive resistor measuring method, which aim to solve the technical problems of inaccurate resistance value measurement and large error of a sensitive resistor in the prior art.
One aspect of the present invention provides a sensitive resistance measuring apparatus, comprising:
MCU circuit, measuring circuit;
the MCU circuit includes: the ADC unit is used for collecting the voltage value of the measuring circuit, and the power IO interface is used for supplying power to the measuring circuit; wherein the ADC unit includes: the first voltage acquisition channel circuit and the second voltage acquisition channel circuit; the reference voltage of the first voltage acquisition channel circuit is the same as that of the second voltage acquisition channel circuit;
the measurement circuit includes: the sensitive resistance branch circuit and the standard resistance branch circuit are connected in parallel; the sensitive resistance branch comprises a sensitive resistance RT and a standard resistance R which are connected in series; the standard circuit branch comprises two standard resistors R connected in series;
the first voltage acquisition channel circuit is used for acquiring a voltage value of a series connection point between the sensitive resistor RT and the standard resistor R which are connected in series;
and the second voltage acquisition channel circuit is used for acquiring the voltage value of a series connection point between the two standard resistors R connected in series.
Optionally, the method further includes: a power supply branch;
the power supply branch is connected into a circuit for supplying power to the measuring circuit by the power IO interface;
the power supply branch includes: a selection switch and a capacitor;
the selection switch comprises two switch contacts; the first switch contact is used for communicating the capacitor with a circuit of the power IO interface so as to charge the capacitor by the power IO interface; the second switch contact is used for communicating the capacitor with the circuit of the measuring circuit, so that the capacitor supplies power for the measuring circuit.
Optionally, one end of a standard resistor R in the sensitive resistor branch is connected to the power IO interface, and the other end of the standard resistor R is connected to the sensitive resistor RT and the first voltage acquisition channel circuit respectively;
or,
one end of a sensitive resistor RT in the sensitive resistor branch circuit is connected with the power IO interface, and the other end of the sensitive resistor RT is connected with the standard resistor R and the first voltage acquisition channel circuit respectively.
Optionally, one end of a standard resistor R in the sensitive resistor branch is connected to the second switch contact, and the other end of the standard resistor R is connected to the sensitive resistor RT and the first voltage acquisition channel circuit respectively;
or,
one end of a sensitive resistor RT in the sensitive resistor branch circuit is connected with the second switch contact, and the other end of the sensitive resistor RT is connected with the standard resistor R and the first voltage acquisition channel circuit respectively.
Optionally, the standard resistor R is a fixed resistor.
Another aspect of the present invention provides a sensitive resistance measuring method, which uses the sensitive resistance measuring apparatus to perform measurement, including:
receiving a sensitive resistance measurement instruction;
respectively acquiring a first voltage value measured by the first voltage acquisition channel circuit and a second voltage value measured by the second voltage acquisition channel circuit according to the sensitive resistance measurement instruction;
and determining the resistance value of the sensitive resistor RT according to the resistance value of the standard resistor R, the first voltage value and the second voltage value.
Optionally, if one end of the standard resistor R in the sensitive resistor branch is connected to the power IO interface, and the other end of the standard resistor R is connected to the sensitive resistor RT and the first voltage acquisition channel circuit, respectively, where one end of the sensitive resistor RT is grounded; the first voltage value is the voltage value at two ends of the sensitive resistor RT; correspondingly, the determining the resistance value of the sensing resistor RT according to the resistance value of the standard resistor R, the first voltage value, and the second voltage value includes:
according to RRT＝Vx×RR(2Vref-Vx), determining the resistance value of the sensitive resistor RT;
wherein, R isRTRepresenting the resistance value of the sensitive resistor RT, Vx representing the first voltage value, and RRRepresents the resistance value of the standard resistor R, and the Vref represents the second voltage value.
Optionally, if one end of the sensing resistor RT in the sensing resistor branch is connected to the power IO interface, and the other end of the sensing resistor RT is connected to the standard resistor R and the first voltage acquisition channel circuit, respectively, where one end of the standard resistor R is grounded; the first voltage value is the voltage value at two ends of the standard resistor R; correspondingly, the determining the resistance value of the sensing resistor RT according to the resistance value of the standard resistor R, the first voltage value, and the second voltage value includes:
according to RRT＝(2Vref–Vx)×RRVx, determining the resistance value of the sensitive resistor RT;
wherein, R isRTRepresenting the resistance value of the sensitive resistor RT, Vx representing the first voltage value, and RRRepresents the resistance value of the standard resistor R, and the Vref represents the second voltage value.
Another aspect of the present invention provides a sensitive resistance measuring method, which uses the sensitive resistance measuring apparatus to perform measurement, including:
receiving a sensitive resistance measurement instruction;
sending a first switch contact switching instruction to the selector switch according to the sensitive resistance measurement instruction; the first switch contact switching instruction is used for enabling the selection switch to be switched from the first switch contact to the second switch contact so that the power IO interface stops charging the capacitor, and the capacitor supplies power to the measuring circuit;
respectively acquiring a first voltage value measured by the first voltage acquisition channel circuit and a second voltage value measured by the second voltage acquisition channel circuit;
and determining the resistance value of the sensitive resistor RT according to the resistance value of the standard resistor R, the first voltage value and the second voltage value.
Optionally, after determining the resistance value of the sensing resistor RT, the method further includes:
sending a second switch contact switching instruction to the selection switch; the second switch contact switching instruction is used for enabling the selection switch to be switched from the second switch contact to the first switch contact, so that the capacitor is disconnected with a circuit between the measuring circuits, the capacitor stops supplying power to the measuring circuits, the capacitor is communicated with a circuit between the power IO interfaces, and the power IO interfaces charge the capacitor.
According to the technical scheme, the sensitive resistance measuring device and the sensitive resistance measuring method provided by the invention comprise an MCU circuit and a measuring circuit; the MCU circuit includes: the ADC unit is used for collecting the voltage value of the measuring circuit, and the power IO interface is used for supplying power to the measuring circuit; wherein, the ADC unit includes: the first voltage acquisition channel circuit and the second voltage acquisition channel circuit; the measurement circuit includes: the sensitive resistance branch circuit and the standard resistance branch circuit are connected in parallel; the sensitive resistance branch comprises a sensitive resistance RT and a standard resistance R which are connected in series; the standard circuit branch comprises two standard resistors R connected in series; the first voltage acquisition channel circuit is used for acquiring the voltage value of a series connection point between the series-connected sensitive resistor RT and the standard resistor R; the second voltage acquisition channel circuit is used for acquiring the voltage value of a series connection point between two standard resistors R connected in series. The sensitive resistance measuring device realizes that the voltage measuring errors of the two branches are changed in equal proportion by acquiring the voltages of the two branches of the sensitive resistance branch and the standard resistance branch which are connected in parallel and symmetrically distributed in resistance, so that the influence of the voltage measuring errors on the resistance value of the sensitive resistance is eliminated, and the accuracy of the resistance value of the sensitive resistance measured by the sensitive resistance measuring device provided by the invention is higher.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings needed to be used in the description of the embodiments or the prior art will be briefly introduced below, and it is obvious that the drawings in the following description are some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to these drawings without creative efforts.
FIG. 1 is a schematic structural diagram of a prior art sensing resistor measuring device;
FIG. 2 is a schematic diagram of a sensitive resistance measuring device according to an exemplary embodiment of the present invention;
FIG. 3 is a schematic structural diagram of a sensitive resistance measuring device according to another exemplary embodiment of the present invention;
FIG. 4 is a schematic structural diagram of a sensitive resistance measuring device according to another exemplary embodiment of the present invention;
FIG. 5 is a schematic diagram of a sensitive resistance measuring device according to another exemplary embodiment of the present invention;
FIG. 6 illustrates a method of sensitive resistance measurement in accordance with an exemplary embodiment of the present invention;
FIG. 7 illustrates a method of sensitive resistance measurement in accordance with another exemplary embodiment of the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are some, but not all, embodiments of the present invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Fig. 2 is a schematic structural diagram of a sensitive resistance measuring apparatus according to an exemplary embodiment of the present invention, and as shown in fig. 2, the present embodiment provides a sensitive resistance measuring apparatus 20, including: an MCU circuit 201 and a measurement circuit 202; the MCU circuit 201 includes: an ADC unit 2011 for collecting a voltage value of the measurement circuit, and a power IO interface 2012 for supplying power to the measurement circuit 202; the ADC unit 2011 includes: a first voltage acquisition channel circuit 2011a, a second voltage acquisition channel circuit 2011 b; reference voltage V of first voltage acquisition channel circuit 2011a and second voltage acquisition channel circuit 2011bbThe same; the measurement circuit 202 includes: a sensitive resistance branch 2021 and a standard resistance branch 2022 which are connected in parallel; the sensitive resistor branch 2021 comprises a sensitive resistor RT and a standard resistor R which are connected in series; the standard circuit branch 2022 includes two standard resistors R connected in series; the first voltage acquisition channel circuit 2011a is used for acquiring a voltage value of a series connection point between the series-connected sensitive resistor RT and the standard resistor R; the second voltage acquisition channel circuit 2011b is configured to acquire a voltage value of a series connection point between two standard resistors R connected in series.
Specifically, the MCU circuit 201 includes an ADC unit 2011 for acquiring a voltage value of the measurement circuit 202 and a power IO interface 2012 for supplying power to the measurement circuit 202. The ADC unit 2011 includesThe two voltage acquisition circuits, i.e., the first voltage acquisition channel circuit 2011a and the second voltage acquisition channel circuit 2011b, may respectively acquire voltage values of two points of the measurement circuit 202, and the reference voltage for supplying power to the two voltage acquisition circuits of the ADC unit 2011 is Vb. The power IO interface 2012 is connected to the measurement circuit 202 and outputs a power voltage VioPower is supplied to the measurement circuit 202.
The measurement circuit 202 includes a sensitive resistor branch 2021 and a standard resistor branch 2022 connected in parallel. The sensitive resistor branch 2021 is formed by connecting a standard resistor R and a sensitive resistor RT in series. The layout relationship between the standard resistor R and the sensing resistor RT may be as shown in fig. 2, where one end of the standard resistor R is connected to the power IO interface 2012, and the other end is connected to the sensing resistor RT. One end of the sensitive resistor is grounded, and the other end of the sensitive resistor is connected with the standard resistor R. Of course, the two can be exchanged (as shown in fig. 4), as long as the two are in serial relation. The standard resistor branch 2022 is formed by connecting two standard resistors R in series, one end of each of the two standard resistors R connected in series is connected to each other, the other end of one standard resistor R is grounded, and the other end of the other standard resistor R is connected to the power IO interface 2012.
The sensitive resistance measuring device 20 provides a power supply voltage V for the measuring circuit 202 through the power supply IO interface 2012ioThe voltage value of the series connection point between the sensing resistor RT and the standard resistor R connected in series is collected through the first voltage collecting channel circuit 2011a of the ADC unit 2011, that is, the voltage V at the end where the sensing resistor RT and the standard resistor R are connected to each other in the sensing resistor branch 2021 is collectedxThe second voltage acquisition channel circuit 2011b of the ADC unit 2011 acquires the voltage value of the serial connection point between the two standard resistors R connected in series, that is, acquires the voltage V at the end of the standard resistor branch 2022 where the two standard resistors R are connected in seriesrefFrom ohm's law, it can be known that:
Vio＝2×Vref (3)
(2 Vref-Vx)/RR＝Vx/RRT (4)
RRT＝Vx×RR/(2 Vref-Vx) (5)
from equation (5), it can be seen that the error influence factors influencing the resistance value of the sensing resistor RT include: vx、VrefAnd RR。VrefAnd VxThe reference resistance R may be obtained by collecting the first voltage collecting channel circuit 2011a and the second voltage collecting channel circuit 2011b of the ADC unit 2011, and in order to ensure stability of the reference resistance R, the reference resistance R may select a fixed-value resistance, and select a high-precision customized resistance, for example, a high-precision fixed-value resistance with a precision of ± 0.5% or ± 1%. Voltage V collected by first voltage collecting channel circuit 2011a of ADC unit 2011xAnd V collected by a second voltage collection channel circuit 2011brefThe variation of the two voltage values will follow the reference voltage VbAnd the ratio is changed in equal proportion.
In particular, as described in the background, due to the reference voltage VbResulting in the voltage value V measured by the ADC unit 2011xThere may be an error. However, as shown in fig. 2, the same reference voltage V is used for the measurement of the two voltage acquisition channel circuits (2011a and 2011b) of the ADC unit 2011bThe ratio of the measurement errors is the same, so that V can be eliminatedxAnd VrefThe error effect of (2). For example, if the first voltage acquisition channel 2011a and the second voltage acquisition channel 2011b use the same reference voltage VbReference voltage VbAnd 10% up/down, the voltages measured by the first voltage acquisition channel 2011a and the second voltage acquisition channel 2011b are correspondingly 10% up/down at the same time. Then, according to the formula (5), when V isrefAnd VxThe measured error ratios are the same, and the measured voltage values are respectively 1.1V under the assumption that the measured error ratios are equal to the upper 10 percent of the equal ratiorefAnd 1.1VxThen, the resistance value of the sensing resistor RT is:
RRT＝1.1 Vx×RR/(2×1.1 Vref-1.1×Vx)＝Vx×RR/(2 Vref-Vx) (6)
from the formula (6)To see, since VxAnd VrefUsing the same reference voltage VbThe measurement error is biased by 10% in equal proportion, so that V can be eliminatedxAnd VrefThe measurement error of the sensitive resistor RT is only related to the error of the standard resistor R, and since the standard resistor R is a fixed value resistor, and if a high-precision fixed value resistor is adopted, the resistance accuracy of the sensitive resistor measured by the sensitive resistor measuring device 20 provided in this embodiment is high.
The sensitive resistance measuring device provided by the embodiment comprises an MCU circuit and a measuring circuit; the MCU circuit includes: the ADC unit is used for collecting the voltage value of the measuring circuit, and the power IO interface is used for supplying power to the measuring circuit; wherein, the ADC unit includes: the first voltage acquisition channel circuit and the second voltage acquisition channel circuit; the measurement circuit includes: the sensitive resistance branch circuit and the standard resistance branch circuit are connected in parallel; the sensitive resistance branch comprises a sensitive resistance RT and a standard resistance R which are connected in series; the standard circuit branch comprises two standard resistors R connected in series; the first voltage acquisition channel circuit is used for acquiring the voltage value of a series connection point between the series-connected sensitive resistor RT and the standard resistor R; the second voltage acquisition channel circuit is used for acquiring the voltage value of a series connection point between two standard resistors R connected in series. The sensitive resistance measuring device realizes that the voltage measurement errors of the two branches are changed in equal proportion by acquiring the voltages of the two branches of the sensitive resistance branch and the standard resistance branch which are connected in parallel and symmetrically distributed in resistance, so that the influence of the voltage measurement errors on the resistance value of the sensitive resistance is eliminated, and the accuracy of the resistance value of the sensitive resistance tested by the sensitive resistance measuring device provided by the embodiment is higher.
Fig. 3 is a schematic structural diagram of a sensitive resistance measuring apparatus according to another exemplary embodiment of the present invention, as shown in fig. 3, on the basis of the embodiment shown in fig. 2, further including: a power supply branch 203; the power supply branch 203 is connected to a circuit for supplying power to the measurement circuit 202 through the power source IO interface 2012; the power supply branch 203 includes: a selection switch 2031 and a capacitor C; the selection switch 2031 includes two switch contacts; the first switch contact a is used for communicating the capacitor C with a circuit of the power source IO interface 2012, so that the power source IO interface 2012 charges the capacitor C; the second switch contact b is used to connect the capacitance C to the circuit of the measurement circuit 202, so that the capacitance C supplies power to the measurement circuit 202.
Specifically, the MCU circuit 201 includes an ADC unit 2011 for acquiring a voltage value of the measurement circuit 202 and a power IO interface 2012 for supplying power to the measurement circuit 202. The ADC unit 2011 includes two voltage acquisition circuits, that is, a first voltage acquisition channel circuit 2011a and a second voltage acquisition channel circuit 2011b, which can respectively acquire voltage values of two points of the measurement circuit 202, and a reference voltage for supplying power to the two voltage acquisition circuits of the ADC unit 2011 is Vb. The power IO interface 2012 is connected to the measurement circuit 202 and outputs a power voltage VioPower is supplied to the measurement circuit 202.
The measurement circuit 202 includes a sensitive resistor branch 2021 and a standard resistor branch 2022 connected in parallel. The sensitive resistor branch 2021 is formed by connecting a standard resistor R and a sensitive resistor RT in series. The layout relationship between the standard resistor R and the sensing resistor RT can be as shown in fig. 3, where one end of the standard resistor R is connected to the selection switch 2031, and the other end is connected to the sensing resistor RT. One end of the sensitive resistor RT is grounded, and the other end of the sensitive resistor RT is connected with the standard resistor R. The standard resistor branch 2022 is formed by connecting two standard resistors R in series, one end of each of the two standard resistors R connected in series is connected to each other, the other end of one standard resistor R is grounded, and the other end of the other standard resistor R is connected to the selection switch 2031.
The power supply branch 203 includes: a selection switch 2031 and a capacitor C; the selection switch 2031 includes two switch contacts; the switch contact a of the power source IO interface 2012 can be selectively connected, and the switch contact b of the sensitive resistor branch 2021 and the standard resistor branch 2022 connected in parallel can also be selectively connected. When the selection switch 2031 is connected to the switch contact a, the capacitor C is charged through the power IO interface 2012; when the selection switch 2031 is connected to the switch contact b, the capacitor C starts to discharge, supplying power to the sensitive resistor branch 2021 and the standard resistor branch 2022. When the sensitive resistance measuring device 20 is in an idle state, the selection switch 2031 is connected to the switch contact a, the capacitor C is charged through the power IO interface 2012, and electric energy is stored; when the sensitive resistor measuring device 20 is awakened to measure the RT resistance value of the sensitive resistorWhen measuring, the selection switch 2031 is connected to the switch contact b, the capacitor C starts to discharge, power is supplied to the measurement circuit 202, and V starts to be collectedrefAnd VxThe voltage value of (2). Therefore, the sensitive resistor measuring apparatus 20 shown in fig. 3 can obtain the resistance value of the sensitive resistor with high accuracy, and can also charge the capacitor C when the measurement is not performed, and stop charging the capacitor C when the measurement is performed, thereby having an advantage of low power consumption, and at the same time, because the power supply voltage V for supplying power to the measurement circuit 202 and outputting the power supply voltage V for the capacitor C instead of the power supply IO interface 2012ioThereby enabling the supply voltage VioThe influence of the load fluctuation does not reach the measuring circuit 202, so that the accuracy of measuring the resistance value of the sensitive resistor RT is further ensured.
The sensitive resistance measuring device 20 shown in fig. 3 operates as follows: providing a supply voltage V to the measurement circuit 202 by discharging the capacitor CioThe voltage V at the end of the sensitive resistor RT connected to the standard resistor R in the sensitive resistor branch 2021 is collected by the first voltage collecting channel circuit 2011a of the ADC unit 2011xThe voltage at the end of the standard resistor branch 2022 where the two series resistors are connected to each other is collected by the second voltage collecting channel circuit 2011b of the ADC unit 2011 as VrefWhen two voltage acquisition channels of the ADC unit 2011 perform measurement, the same reference voltage V is usedbThe error ratio of the measurement is the same, and V can be eliminatedxAnd VrefThe measurement error of the sensitive resistor RT is only related to the error of the standard resistor R, and since the standard resistor R can be a high-precision fixed-value resistor, the precision of the resistance value of the sensitive resistor RT measured by the sensitive resistor measurement device 20 provided in this embodiment is high. The resistance value calculation method of the sensitive resistor RT is the same as that of the sensitive resistor measurement apparatus 20 shown in fig. 2, and when the first voltage acquisition channel circuit 2011a and the second voltage acquisition channel circuit 2011b use the same reference voltage Vb, and the reference voltage Vb is shifted up/down by 10%, correspondingly, the voltages measured by the first voltage acquisition channel circuit 2011a and the second voltage acquisition channel circuit 2011b are shifted up/down by 10% at the same time. Then, according to the formula (5), when V isrefAnd VxAre the same, provided thatAll are 10% higher than the equal proportion, the measured voltage values are respectively 1.1VrefAnd 1.1VxThen, the resistance value of the sensing resistor RT is:
RRT＝1.1 Vx×RR/(2×1.1Vref-1.1×Vx)＝Vx×RR/(2 Vref-Vx) (6)
as can be seen from equation (6), since VxAnd VrefUsing the same reference voltage VbThe measurement error is biased by 10% in equal proportion, so that V can be eliminatedxAnd VrefThe measurement error of the sensitive resistor RT is only related to the error of the standard resistor R, and since the standard resistor R is a fixed value resistor, and if a high-precision fixed value resistor is adopted, the resistance accuracy of the sensitive resistor measured by the sensitive resistor measuring device 20 provided in this embodiment is high. Meanwhile, the power supply branch 203 also provides a function of charging the capacitor C when measurement is not performed and stopping charging the capacitor C when measurement is performed, and has the advantage of low power consumption; and because the capacitor C is adopted to replace the power IO interface 2012 to supply power to the measurement circuit 202, the power voltage V is enabled to beioThe influence of the load fluctuation does not reach the measuring circuit 202, and the accuracy of measuring the resistance value of the sensitive resistor RT is further ensured.
Fig. 4 is a schematic structural diagram of a sensitive resistance measuring apparatus according to another exemplary embodiment of the present invention, as shown in fig. 4, which is based on the embodiment shown in fig. 2, and the positions of the standard resistor R and the standard resistor R in the sensitive resistor branch 2021 are exchanged. That is to say, in the sensitive resistance measuring apparatus 20 shown in fig. 2, one end of the standard resistor R in the sensitive resistor branch 2021 is connected to the power IO interface 2012, and the other end is connected to the sensitive resistor RT and the first voltage acquisition channel circuit 2011a respectively; in the sensitive resistance measuring apparatus 20 shown in fig. 4, one end of the sensitive resistor RT in the sensitive resistor branch 2021 is connected to the power IO interface 2012, and the other end is connected to the standard resistor R and the first voltage collecting channel circuit 2011a, respectively.
Specifically, the difference between the sensitive resistance measuring device 20 provided in this embodiment and the sensitive resistance measuring device 20 provided in fig. 2 is that the positions of the standard resistor R and the sensitive resistor RT of the sensitive resistor branch 2021 are different, one end of the sensitive resistor RT is connected to the power IO interface 2012, and the other end is connected to the standard resistor R. One end of the standard resistor R is grounded, and the other end of the standard resistor R is connected with the sensitive resistor RT.
As shown in FIG. 4, the measurement circuit 202 is supplied with a power supply voltage V via a power IO interface 2012ioThe voltage Vx at one end of the sensitive resistor RT connected with the standard resistor R in the sensitive resistor branch 2021 is collected through the first voltage collection channel circuit 2011a of the ADC unit 2011, and the voltage at one end of the two series resistors R connected with each other in the standard resistor branch 2022 is collected through the second voltage collection channel circuit 2011b of the ADC unit 2011 and is Vref, which can be known according to the ohm's law:
Vio＝2×Vref (7)
(2 Vref-Vx)/RRT＝Vx/RR (8)
RRT＝(2 Vref–Vx)×RR/Vx (9)
due to the reference voltage VbThe voltage value measured by the ADC unit 2011 may have an error. The same reference voltage V is adopted for the measurement of the two voltage acquisition channels of the ADC unit 2011bThe error ratio of the measurement is the same, and V can be eliminatedxAnd VrefThe error effect of (2). For example, first voltage acquisition channel circuit 2011a and second voltage acquisition channel circuit 2011b use the same reference voltage VbReference voltage VbAnd 10% up/down, the voltages measured by the first 2011a and the second 2011b voltage acquisition channels are simultaneously up/down 10%. According to the formula (9), when V isxAnd VrefAre the same, and the measured voltage values are 1.1V respectively on the assumption that the error ratios are equal and are biased by 10% upwardsrefAnd 1.1VxThe resistance value R of the sensitive resistor RTRTComprises the following steps:
RT＝(2×1.1×Vref–1.1Vx)×R/1.1Vx＝(2Vref–Vx)×R/Vx (10)
as can be seen from equation (10), since VxAnd VrefUsing the same reference voltage VbThe measurement error is biased by 10% in equal proportion, so that V can be eliminatedxAnd VrefThe measurement error of the sensitive resistor RT is only related to the error of the standard resistor R, the standard resistor R may be a fixed value resistor, and more preferably, a high-precision fixed value resistor is used, so that the precision of the resistance value of the sensitive resistor RT tested by the sensitive resistor measurement device 20 provided in this embodiment is high.
Fig. 5 is a schematic structural diagram of a sensitive resistance measuring apparatus according to another exemplary embodiment of the present invention, and as shown in fig. 5, the positions of the standard resistor R and the standard resistor R in the sensitive resistor branch 2021 are exchanged based on the embodiment shown in fig. 3. That is to say, in the sensitive resistance measuring apparatus 20 shown in fig. 3, one end of the standard resistor R in the sensitive resistor branch 2021 is connected to the second switch contact b, and the other end is connected to the sensitive resistor RT and the first voltage acquisition channel circuit 2011a respectively; in the sensitive resistance measuring apparatus 20 shown in fig. 5, one end of the sensitive resistor RT in the sensitive resistor branch 2021 is connected to the second switch contact b, and the other end is connected to the standard resistor R and the first voltage acquisition channel circuit 2011 a.
Specifically, the sensitive resistance measuring device 20 provided in this embodiment is different from the sensitive resistance measuring device 20 provided in fig. 3 in that the positions of the standard resistor R and the sensitive resistor RT of the sensitive resistor branch 2021 are different, one end of the sensitive resistor RT is connected to the selection switch 2031, and the other end is connected to the standard resistor R. One end of the standard resistor R is grounded, and the other end of the standard resistor R is connected with the sensitive resistor RT. The resistance value calculation method of the sensitive resistor RT is the same as that of the sensitive resistor measurement apparatus 20 shown in fig. 4, and the first voltage acquisition channel circuit 2011a and the second voltage acquisition channel circuit 2011b use the same reference voltage VbReference voltage VbAnd 10% up/down, the voltages measured by the first 2011a and the second 2011b voltage acquisition channels are simultaneously up/down 10%. According to the formula (9), when V isxAnd VrefAre the same, and are measured assuming that they are all equal to 10% upwardThe voltage values are respectively 1.1VrefAnd 1.1VxThe resistance value R of the sensitive resistor RTRTComprises the following steps:
RT＝(2×1.1×Vref–1.1Vx)×R/1.1Vx＝(2Vref–Vx)×R/Vx (10)
as can be seen from equation (10), since VxAnd VrefUsing the same reference voltage VbThe measurement error is biased by 10% in equal proportion, so that V can be eliminatedxAnd VrefThe measurement error of the sensitive resistor RT is only related to the error of the standard resistor R, the standard resistor R may be a fixed value resistor, and more preferably, a high-precision fixed value resistor is used, so that the precision of the resistance value of the sensitive resistor RT tested by the sensitive resistor measurement device 20 provided in this embodiment is high.
Fig. 6 is a sensitive resistance measurement method according to an exemplary embodiment of the present invention, and as shown in fig. 6, the sensitive resistance measurement method according to this embodiment may implement measurement based on the sensitive resistance measurement device 20 shown in fig. 2 or fig. 4, where the measurement method specifically includes:
step 601, receiving a sensitive resistance measurement instruction.
Step 602, according to the sensitive resistance measurement instruction, respectively obtaining a first voltage value measured by the first voltage acquisition channel circuit and a second voltage value measured by the second voltage acquisition channel circuit.
Step 603, determining the resistance value of the sensitive resistor RT according to the resistance value of the standard resistor R, the first voltage value and the second voltage value.
Specifically, the processor for receiving the sensitive resistor measurement instruction may be a processor integrated in the MCU circuit 201, or may be a processor outside the sensitive resistor measurement apparatus 20, and the processor and the MCU circuit 201 are in communication interaction, so that the MCU circuit 201 executes a corresponding operation according to the instruction of the processor, for example, after receiving the sensitive resistor measurement instruction, the processor triggers the MCU circuit 201 to supply power to the measurement circuit 202, so that the ADC unit 2011 acquires the voltages of the sensitive resistor branch 2021 and the standard resistor branch 2022 to obtain the resistance of the sensitive resistor RT.
Based on the sensitive resistance measuring device shown in fig. 2, that is, if one end of the standard resistor R in the sensitive resistor branch 2021 is connected to the power IO interface 2012, the other end is connected to the sensitive resistor RT and the first voltage acquisition channel circuit 2011a, respectively, where one end of the sensitive resistor RT is grounded; the first voltage value is the voltage value at two ends of the sensitive resistor RT; correspondingly, determining the resistance value of the sensitive resistor RT according to the resistance value of the standard resistor R, the first voltage value, and the second voltage value in step 603 specifically includes:
according to RRT＝Vx×RR(2Vref-Vx), and determining the resistance value of the sensitive resistor RT; wherein R isRTRepresenting the resistance of the sensitive resistor RT, Vx representing the first voltage value, RRRepresents the resistance value of the standard resistor R, and Vref represents the second voltage value.
Based on the sensitive resistance measuring device shown in fig. 4, that is, if one end of the sensitive resistance RT in the sensitive resistance branch 2021 is connected to the power IO interface 2012, the other end is connected to the standard resistance R and the first voltage acquisition channel circuit 2011a, respectively, where one end of the standard resistance R is grounded; the first voltage value is the voltage value at two ends of the standard resistor R; correspondingly, determining the resistance value of the sensitive resistor RT according to the resistance value of the standard resistor R, the first voltage value, and the second voltage value in step 603 specifically includes:
according to RRT＝(2Vref–Vx)×RRVx, determining the resistance value of the sensitive resistor RT; wherein R isRTRepresenting the resistance of the sensitive resistor RT, Vx representing the first voltage value, RRRepresents the resistance value of the standard resistor R, and Vref represents the second voltage value.
The sensitive resistance measuring method of the embodiment is based on a sensitive resistance measuring device, and the device comprises an MCU circuit and a measuring circuit; the MCU circuit includes: the ADC unit is used for collecting the voltage value of the measuring circuit, and the power IO interface is used for supplying power to the measuring circuit; wherein, the ADC unit includes: the first voltage acquisition channel circuit and the second voltage acquisition channel circuit; the measurement circuit includes: the sensitive resistance branch circuit and the standard resistance branch circuit are connected in parallel; the sensitive resistance branch comprises a sensitive resistance RT and a standard resistance R which are connected in series; the standard circuit branch comprises two standard resistors R connected in series; the first voltage acquisition channel circuit is used for acquiring the voltage value of a series connection point between the series-connected sensitive resistor RT and the standard resistor R; the second voltage acquisition channel circuit is used for acquiring the voltage value of a series connection point between two standard resistors R connected in series. Through the device, the first voltage value obtained by measuring the first voltage acquisition channel circuit and the second voltage value obtained by measuring the second voltage acquisition channel circuit are obtained respectively, and due to the parallel connection structure of the sensitive resistor branch circuit and the standard resistor branch circuit and the symmetrical distribution of the resistors of the two branch circuits, the voltage measurement errors of the two voltage values are changed in equal proportion, so that the influence of the voltage measurement errors on the resistance value of the sensitive resistor is eliminated, and the accuracy of the resistance value of the sensitive resistor obtained by testing the sensitive resistor measuring device based on the embodiment is improved.
Fig. 7 is a sensitive resistance measurement method according to another exemplary embodiment of the present invention, and as shown in fig. 7, the sensitive resistance measurement method according to this embodiment may implement measurement based on the sensitive resistance measurement device 20 shown in fig. 3 or fig. 5, where the measurement method specifically includes:
step 701, receiving a sensitive resistance measurement instruction.
Step 702, sending a first switch contact switching instruction to a selection switch according to a sensitive resistance measurement instruction; the first switch contact switching instruction is used for enabling the selection switch to be switched from the first switch contact to the second switch contact, so that the power IO interface stops charging the capacitor, and the capacitor supplies power to the measuring circuit.
And 703, respectively acquiring a first voltage value measured by the first voltage acquisition channel circuit and a second voltage value measured by the second voltage acquisition channel circuit.
And step 704, determining the resistance value of the sensitive resistor RT according to the resistance value of the standard resistor R, the first voltage value and the second voltage value.
Specifically, as in the above embodiment, the processor for receiving the sensitive resistance measurement instruction may be a processor integrated in the MCU circuit 201, or may be a processor outside the sensitive resistance measurement device 20, and the processor is in communication with the MCU circuit 201 to enable the MCU circuit 201 to perform a corresponding operation according to an instruction of the processor, for example, after the processor receives the sensitive resistance measurement instruction, the MCU circuit 201 is triggered to send a first switch contact switching instruction to the selection switch 2031 to switch the selection switch 2031 from the first switch contact a to the second switch contact b, so that the sensitive resistance measurement device 20 is switched from an idle state to a working state, where the idle state is a state where the power IO interface 2012 charges the capacitor C and stores electric energy when the first switch contact a is closed; the working state is a state in which when the second switch contact b is closed, the power IO interface 2012 stops charging the capacitor C, and the capacitor C discharges to supply power to the measurement circuit 202; the sense resistor measuring device 20 performs measurement of the resistance value of the sense resistor RT in an operating state to determine the resistance value of the sense resistor RT. After the resistance value of the sensitive resistor RT is determined, a second switch contact switching instruction can be sent to the selection switch; the second switch contact switching instruction is used for switching the selection switch 2031 from the second switch contact b to the first switch contact a, so that a circuit between the capacitor C and the measurement circuit 202 is disconnected, the capacitor C stops supplying power to the measurement circuit 202, a circuit between the capacitor C and the power IO interface 2012 is connected, and the power IO interface 2012 charges the capacitor C.
Based on the sensitive resistance measuring device shown in fig. 3, that is, if one end of the standard resistor R in the sensitive resistor branch 2021 is connected to the second switch contact b, the other end is connected to the sensitive resistor RT and the first voltage acquisition channel circuit 2011a, respectively, where one end of the sensitive resistor RT is grounded; the first voltage value is the voltage value at two ends of the sensitive resistor RT; correspondingly, the step 704 of determining the resistance value of the sensing resistor RT according to the resistance value of the standard resistor R, the first voltage value, and the second voltage value specifically includes: according to RRT＝Vx×RR(2Vref-Vx), and determining the resistance value of the sensitive resistor RT; wherein R isRTRepresenting the resistance of the sensitive resistor RT, Vx representing the first voltage value, RRRepresents the resistance value of the standard resistor R, and Vref represents the second voltage value.
Based on the sensitive resistor measuring device shown in fig. 5, that is, if one end of the sensitive resistor RT in the sensitive resistor branch 2021 is connected to the second switch contact b, and the other end is connected to the standard resistor R and the first voltage acquisition channel circuit 2011a, respectively, wherein the standard resistor R and the first voltage acquisition channel circuit 2011a are connected to the same circuit, the standard resistor R and the first voltage acquisition channel circuit are connected to the same circuitOne end of the quasi-resistor R is grounded; the first voltage value is the voltage value at two ends of the standard resistor R; correspondingly, the step 704 of determining the resistance value of the sensing resistor RT according to the resistance value of the standard resistor R, the first voltage value, and the second voltage value specifically includes: according to RRT＝(2Vref–Vx)×RRVx, determining the resistance value of the sensitive resistor RT; wherein R isRTRepresenting the resistance of the sensitive resistor RT, Vx representing the first voltage value, RRRepresents the resistance value of the standard resistor R, and Vref represents the second voltage value.
Finally, it should be noted that: the above examples are only intended to illustrate the technical solution of the present invention, but not to limit it; although the present invention has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; and the modifications or the substitutions do not make the essence of the corresponding technical solutions depart from the scope of the technical solutions of the embodiments of the present invention.

Claims (10)

1. An MCU detection circuit, comprising: MCU circuit, measuring circuit;
the MCU circuit includes: the ADC unit is used for collecting the voltage value of the measuring circuit, and the power IO interface is used for supplying power to the measuring circuit; wherein the ADC unit includes: the first voltage acquisition channel circuit and the second voltage acquisition channel circuit; the reference voltage of the first voltage acquisition channel circuit is the same as that of the second voltage acquisition channel circuit;
the measurement circuit includes: the sensitive resistance branch circuit and the standard resistance branch circuit are connected in parallel; the sensitive resistance branch comprises a sensitive resistance RT and a standard resistance R which are connected in series; the standard circuit branch comprises two standard resistors R connected in series;
the first voltage acquisition channel circuit is used for acquiring a first voltage value of a series connection point between the sensitive resistor RT and the standard resistor R which are connected in series;
and the second voltage acquisition channel circuit is used for acquiring a second voltage value of a series connection point between the two standard resistors R connected in series.
2. An MCU detection circuit as defined in claim 1, wherein the calibration resistor comprises a high precision fixed value resistor with a precision of ± 0.5% or ± 1%.
3. The MCU detection circuit of claim 1, further comprising: a power supply branch; the power supply branch is connected into a circuit for supplying power to the measuring circuit by the power IO interface;
the power supply branch includes: a selection switch and a capacitor;
the selection switch comprises two switch contacts; the first switch contact is used for communicating the capacitor with a circuit of the power IO interface so as to charge the capacitor by the power IO interface; the second switch contact is used for communicating the capacitor with a circuit of the measuring circuit so that the capacitor supplies power to the measuring circuit, and the power supply voltage of the capacitor is 2 times of the voltage acquired by the second voltage acquisition channel circuit.
4. The MCU detection circuit according to any one of claims 1 to 3, wherein the resistance value of the sense resistor RT, the resistance value of the standard resistor R, the first voltage value and the second voltage value satisfy the following relationship:
RRT＝Vx╳RR/(2Vref-Vx)
wherein, R isRTRepresenting the resistance value of the sensitive resistor RT, Vx representing the first voltage value, and RRRepresents the resistance value of the standard resistor R, and the Vref represents the second voltage value.
5. The MCU detection circuit according to any one of claims 1 to 3, wherein the resistance value of the sense resistor RT, the resistance value of the standard resistor R, the first voltage value and the second voltage value satisfy the following relationship:
RRT＝(2Vref–Vx)╳RR/Vx
wherein, R isRTRepresenting the resistance value of the sensitive resistor RT, Vx representing the first voltage value, and RRRepresents the resistance value of the standard resistor R, and the Vref represents the second voltage value.
6. The MCU detection circuit of claim 3, further comprising: a processor;
the processor is used for receiving a sensitive resistance measurement instruction; and triggering the MCU circuit to supply power to the measuring circuit, so that the ADC unit collects a first voltage value of the sensitive resistor branch and a second voltage value of the standard resistor branch, and determining the resistance value of the sensitive resistor RT based on the first voltage value and the second voltage value.
7. The MCU detection circuit of claim 3, wherein the MCU detection circuit is communicatively connected to an external processor;
the processor is used for receiving a sensitive resistance measurement instruction; and triggering the MCU circuit to supply power to the measuring circuit, so that the ADC unit collects a first voltage value of the sensitive resistor branch and a second voltage value of the standard resistor branch, and determining the resistance value of the sensitive resistor RT based on the first voltage value and the second voltage value.
8. MCU detection circuit according to claim 6 or 7,
after receiving the sensitive resistance measuring instruction, the processor sends a first switch contact switching instruction to the selection switch; the first switch contact switching instruction is used for enabling the selection switch to be switched from the first switch contact to the second switch contact, so that the power IO interface stops charging the capacitor, and the capacitor supplies power to the measuring circuit.
9. MCU detection circuit according to claim 8,
when the selection switch is switched from the first switch contact to the second switch contact, the ADC unit obtains a first voltage value through measurement of the first voltage acquisition channel circuit, obtains a second voltage value through measurement of the second voltage acquisition channel circuit, and sends the first voltage value and the second voltage value to the processor, so that the processor determines the resistance value of the sensitive resistor RT according to the resistance value of the standard resistor R, the first voltage value and the second voltage value.
10. The MCU detection circuit of claim 9,
after determining the resistance value of the sensitive resistor RT, the processor sends a second switch contact switching instruction to the selection switch; the second switch contact switching instruction is used for enabling the selection switch to be switched from the second switch contact to the first switch contact, so that the capacitor is disconnected with a circuit between the measuring circuits, the capacitor stops supplying power to the measuring circuits, the capacitor is communicated with a circuit between the power IO interfaces, and the power IO interfaces charge the capacitor.
CN202110946707.1A 2018-01-17 2018-01-17 Sensitive resistor measuring device and measuring method Active CN113589045B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202110946707.1A CN113589045B (en) 2018-01-17 2018-01-17 Sensitive resistor measuring device and measuring method

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CN202110946707.1A CN113589045B (en) 2018-01-17 2018-01-17 Sensitive resistor measuring device and measuring method
CN201810046191.3A CN108226646B (en) 2018-01-17 2018-01-17 Sensitive resistance measuring device and measuring method

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
CN201810046191.3A Division CN108226646B (en) 2018-01-17 2018-01-17 Sensitive resistance measuring device and measuring method

Publications (2)

Publication Number Publication Date
CN113589045A true CN113589045A (en) 2021-11-02
CN113589045B CN113589045B (en) 2024-09-20

Family

ID=62667268

Family Applications (2)

Application Number Title Priority Date Filing Date
CN202110946707.1A Active CN113589045B (en) 2018-01-17 2018-01-17 Sensitive resistor measuring device and measuring method
CN201810046191.3A Active CN108226646B (en) 2018-01-17 2018-01-17 Sensitive resistance measuring device and measuring method

Family Applications After (1)

Application Number Title Priority Date Filing Date
CN201810046191.3A Active CN108226646B (en) 2018-01-17 2018-01-17 Sensitive resistance measuring device and measuring method

Country Status (1)

Country Link
CN (2) CN113589045B (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2024077986A1 (en) * 2022-10-09 2024-04-18 华为技术有限公司 Control system, sensor, controller, and terminal device

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110488889A (en) * 2019-07-11 2019-11-22 湖南明康中锦医疗科技发展有限公司 A kind of Breathing Suppotion device temperature collection control method and system
CN112596569B (en) * 2020-12-17 2022-05-13 江苏科大亨芯半导体技术有限公司 Circuit and method for calibrating internal resistance of photoelectric integrated chip
CN113466698A (en) * 2021-06-24 2021-10-01 安徽锐能科技有限公司 Fill CC signal resistance detection circuitry slowly and rifle that charges

Citations (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1584605A (en) * 2004-06-03 2005-02-23 北京市公用事业科学研究所 DC micro-power consumption measuring instrument and method
CN101769966A (en) * 2010-01-27 2010-07-07 广东电网公司电力科学研究院 Method and device for measuring ground capacitance of DC system
US20120163414A1 (en) * 2010-12-28 2012-06-28 Hon Hai Precision Industry Co., Ltd. Thermal resistor test apparatus
CN102928657A (en) * 2012-10-31 2013-02-13 华为技术有限公司 Current measurement method and device
CN102928109A (en) * 2012-10-25 2013-02-13 重庆长安汽车股份有限公司 Signal collecting circuit
CN103513106A (en) * 2012-06-26 2014-01-15 中兴通讯股份有限公司 Measuring method, measuring circuit and monitoring apparatus
CN104568227A (en) * 2013-10-25 2015-04-29 珠海格力电器股份有限公司 Temperature sensing bulb detection circuit, method and device
CN204314387U (en) * 2015-01-05 2015-05-06 南京信息工程大学 A kind of precision resister measurement mechanism based on electric bridge
CN104952485A (en) * 2014-11-28 2015-09-30 珠海艾派克微电子有限公司 Resistor switching circuit, storage circuit and consumable chip
CN204807631U (en) * 2015-07-16 2015-11-25 石家庄汉迪电子仪器有限公司 High -voltage switch's dynamic contact resistance and static resistance test device
CN105865496A (en) * 2016-05-19 2016-08-17 新誉集团有限公司 System and method for measuring resistive transducer through bridge circuit
CN205581212U (en) * 2016-04-15 2016-09-14 桂林电子科技大学 Power battery internal resistance on -line monitoring system
CN106597063A (en) * 2017-01-25 2017-04-26 杭州士兰微电子股份有限公司 Current detecting circuit and current detecting method
CN107561369A (en) * 2016-06-30 2018-01-09 通用电气公司 The passive and wireless monitoring of individual other capacitor container

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56108971A (en) * 1980-02-01 1981-08-28 Advantest Corp Resistance measuring method and device using said measuring method
JP2654493B2 (en) * 1992-04-14 1997-09-17 照志 櫻井 Digital electric resistance meter circuit
CN2365677Y (en) * 1999-03-15 2000-02-23 江苏新科电子集团空调器制造有限公司 Apparatus for measuring resistance quantity with one chip machine
CN2380925Y (en) * 1999-06-26 2000-05-31 江苏新科电子集团空调器制造有限公司 Apparatus for measuring resistance of sensor
CN202145221U (en) * 2011-07-22 2012-02-15 湘潭市华宇科技有限公司 Device utilizing one-chip microcomputer for measuring resistance value
CN104793057A (en) * 2015-04-28 2015-07-22 华东光电集成器件研究所 Bridge-arm resistance test system for acceleration sensors
CN105547515B (en) * 2016-02-25 2017-08-22 中国科学院地质与地球物理研究所 A kind of self-floating bottom-water temperature detection system
CN205785249U (en) * 2016-05-19 2016-12-07 新誉集团有限公司 The system of resistance sensor measured by bridge circuit
CN106124839B (en) * 2016-06-19 2018-11-16 太原理工大学 Portable detector and its detection method for track frequency-shifting signal

Patent Citations (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1584605A (en) * 2004-06-03 2005-02-23 北京市公用事业科学研究所 DC micro-power consumption measuring instrument and method
CN101769966A (en) * 2010-01-27 2010-07-07 广东电网公司电力科学研究院 Method and device for measuring ground capacitance of DC system
US20120163414A1 (en) * 2010-12-28 2012-06-28 Hon Hai Precision Industry Co., Ltd. Thermal resistor test apparatus
CN103513106A (en) * 2012-06-26 2014-01-15 中兴通讯股份有限公司 Measuring method, measuring circuit and monitoring apparatus
CN102928109A (en) * 2012-10-25 2013-02-13 重庆长安汽车股份有限公司 Signal collecting circuit
CN102928657A (en) * 2012-10-31 2013-02-13 华为技术有限公司 Current measurement method and device
CN104568227A (en) * 2013-10-25 2015-04-29 珠海格力电器股份有限公司 Temperature sensing bulb detection circuit, method and device
CN104952485A (en) * 2014-11-28 2015-09-30 珠海艾派克微电子有限公司 Resistor switching circuit, storage circuit and consumable chip
CN204314387U (en) * 2015-01-05 2015-05-06 南京信息工程大学 A kind of precision resister measurement mechanism based on electric bridge
CN204807631U (en) * 2015-07-16 2015-11-25 石家庄汉迪电子仪器有限公司 High -voltage switch's dynamic contact resistance and static resistance test device
CN205581212U (en) * 2016-04-15 2016-09-14 桂林电子科技大学 Power battery internal resistance on -line monitoring system
CN105865496A (en) * 2016-05-19 2016-08-17 新誉集团有限公司 System and method for measuring resistive transducer through bridge circuit
CN107561369A (en) * 2016-06-30 2018-01-09 通用电气公司 The passive and wireless monitoring of individual other capacitor container
CN106597063A (en) * 2017-01-25 2017-04-26 杭州士兰微电子股份有限公司 Current detecting circuit and current detecting method

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
李波;陈光华;徐行;吴来杰;罗贤虎;: "基于热敏电阻的多通道高精度温度测量系统", 仪表技术与传感器, no. 05, 15 May 2008 (2008-05-15) *

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2024077986A1 (en) * 2022-10-09 2024-04-18 华为技术有限公司 Control system, sensor, controller, and terminal device

Also Published As

Publication number Publication date
CN108226646A (en) 2018-06-29
CN113589045B (en) 2024-09-20
CN108226646B (en) 2022-02-22

Similar Documents

Publication Publication Date Title
CN108226646B (en) Sensitive resistance measuring device and measuring method
CN105379120B (en) It is detected using Δ/Σ conversion capacitive proximity
US7656164B2 (en) Method of voltage measurement and apparatus for same
CN211528541U (en) Resistance measuring circuit of programmable constant current source
US20110115427A1 (en) Energy storage device
CN111263889A (en) Method for operating a battery sensor and battery sensor
CN104236401B (en) A kind of fire-working article test system and method for testing thereof
CN108663622B (en) Battery pack voltage measuring circuit and voltage measuring system
CN112698240A (en) Open short circuit testing device
JP7217681B2 (en) Measuring apparatus and measuring method for power storage device
CN108344522A (en) A kind of high-precision measurement circuit that band is calibrated automatically and method
US20150233995A1 (en) System and method for evaluating a capacitive interface
CN104459338B (en) Capacitor capacitance value measuring device and measuring method
CN213600773U (en) Current measuring circuit and measuring instrument capable of automatically switching measuring range
CN207704003U (en) It is a kind of to utilize power amplifier simulated battery charge-discharge circuit
KR101883547B1 (en) System comprising a photovoltaic cell and a luminous intensity measuring device and method for measuring luminous intensity received by the photovoltaic cell
CN109212318A (en) Resistance value measuring circuit and method, device for monitoring temperature, battery pack and management system
CN105277292A (en) Temperature measurement device
TWI505530B (en) Battery capacitance detecting system
CN113238088A (en) High-precision weak current measuring circuit and method based on charge balance
CN111650443A (en) Simple capacitance value measuring circuit and method
CN109507589A (en) Resistance value measuring circuit, device for monitoring temperature, battery pack and battery management system
CN204881767U (en) Measure device and car of fuel liquid level
CN216013471U (en) Circuit for automatically measuring voltage resistance and capacitance
CN106918354A (en) Sensing system and applicable sensing information determination method

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant