CN108226646B - Sensitive resistance measuring device and measuring method - Google Patents

Sensitive resistance measuring device and measuring method Download PDF

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Publication number
CN108226646B
CN108226646B CN201810046191.3A CN201810046191A CN108226646B CN 108226646 B CN108226646 B CN 108226646B CN 201810046191 A CN201810046191 A CN 201810046191A CN 108226646 B CN108226646 B CN 108226646B
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resistor
circuit
sensitive
voltage
resistance
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CN108226646A (en
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张小凤
孙万里
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Zhuhai Geehy Semiconductor Co Ltd
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Zhuhai Geehy Semiconductor Co Ltd
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/14—Measuring resistance by measuring current or voltage obtained from a reference source

Abstract

The invention provides a sensitive resistance measuring device and a measuring method, comprising an MCU circuit and a measuring circuit; the MCU circuit includes: the ADC unit is used for collecting the voltage value of the measuring circuit, and the power IO interface is used for supplying power to the measuring circuit; wherein, the ADC unit includes: the first voltage acquisition channel circuit and the second voltage acquisition channel circuit; the measurement circuit includes: the sensitive resistance branch circuit and the standard resistance branch circuit are connected in parallel; the sensitive resistance branch comprises a sensitive resistance RT and a standard resistance R which are connected in series; the standard circuit branch comprises two standard resistors R connected in series; the first voltage acquisition channel circuit is used for acquiring the voltage value of a series connection point between the series-connected sensitive resistor RT and the standard resistor R; the second voltage acquisition channel circuit is used for acquiring the voltage value of a series connection point between two standard resistors R connected in series. The sensitive resistor measuring device can effectively improve the accuracy of measuring the resistance value of the sensitive resistor.

Description

Sensitive resistance measuring device and measuring method
Technical Field
The invention relates to a measuring technology, in particular to a sensitive resistance measuring device and a measuring method.
Background
The sensitive resistor is a special resistor sensitive to the analog quantity such as illumination intensity, pressure, humidity and temperature. For example, a thermistor is an element whose resistance value varies with temperature, and is divided into a positive temperature coefficient thermistor and a negative temperature coefficient thermistor; the humidity sensitive resistor is an element with resistance value changing with humidity, and converts the humidity into an electric signal; in addition to the temperature/humidity sensitive resistors described above, there are many other types of sensitive resistors.
In the prior art, a scheme of direct resistance voltage division by an Analog to Digital Converter (ADC) is generally adopted for measuring a sensitive resistor, and as shown in fig. 1, a sensitive resistor measuring apparatus 10 includes a micro control Unit 101 (MCU) and a measuring circuit 102. The MCU101 comprises an ADC unit 1011 and a power IO interface 1012, wherein the ADC unit 1011 is used for collecting an electric signal of the sensitive resistor RT and converting the electric signal into a digital signal for computer display; the power IO interface 1012 is used for providing the measurement circuit 102 with a voltage VioThe power supply of (3). The measuring circuit 102 is composed of two resistors, wherein one end of the sensitive resistor RT is grounded, and the other end is connected with the standard resistor R. One end of a standard resistor R is connected with the sensitive resistor RT, and the other end is connected with a power IO interface1012, the measurement circuit 102 is powered through the power IO interface 1012. As shown in fig. 1, the ADC unit 1011 is used to collect the voltage Vx at one end of the sensing resistor RT, and the voltage at the other end of the standard resistor R connected to the power IO interface 1012 is VioFrom ohm's law, it can be known that:
(Vio-Vx)/RR＝Vx/RRT (1)
obtained according to equation (1):
RRT＝Vx╳RR/(Vio-Vx) (2)
according to the formula (2), the error influence factors influencing the resistance value of the sensitive resistor RT include: vx, R and VioWherein for VioIn a word: voltage V output from power IO interface 1012ioIn addition to supplying power to the measurement circuit 102, other circuit blocks in the measurement device 10 are also supplied with power, and the circuit blocks operate in different states at different times, i.e., VioIs dynamically variable, plus is influenced by ambient interference, etc., VioThe value of (a) will fluctuate greatly, producing errors; further, for Vx: due to the reference voltage V of the ADC unit 1011bThere may be an error resulting in the absolute voltage value V measured by the ADC unit 1011xErrors may also exist; finally, for R: the standard resistor R is affected by the production process and materials, and may have certain errors. Therefore, the resistance value of the sensitive resistor RT measured by the method has a large error.
If the sensitive resistor is a temperature/humidity sensitive resistor, the sensitive resistor is related to a temperature/humidity parameter to be measured; if there is an error in the measured value of the sensitive resistor, the accuracy of the acquired temperature/humidity parameters is affected, and therefore, a sensitive resistor measuring device and a measuring method capable of accurately measuring the resistance value of the sensitive resistor are urgently needed to ensure the accuracy of the temperature/humidity parameter acquisition.
Disclosure of Invention
The invention provides a sensitive resistor measuring device and a sensitive resistor measuring method, which aim to solve the technical problems of inaccurate resistance value measurement and large error of a sensitive resistor in the prior art.
One aspect of the present invention provides a sensitive resistance measuring apparatus, comprising:
MCU circuit, measuring circuit;
the MCU circuit includes: the ADC unit is used for collecting the voltage value of the measuring circuit, and the power IO interface is used for supplying power to the measuring circuit; wherein the ADC unit includes: the first voltage acquisition channel circuit and the second voltage acquisition channel circuit; the reference voltage of the first voltage acquisition channel circuit is the same as that of the second voltage acquisition channel circuit;
the measurement circuit includes: the sensitive resistance branch circuit and the standard resistance branch circuit are connected in parallel; the sensitive resistance branch comprises a sensitive resistance RT and a standard resistance R which are connected in series; the standard circuit branch comprises two standard resistors R connected in series;
the first voltage acquisition channel circuit is used for acquiring a voltage value of a series connection point between the sensitive resistor RT and the standard resistor R which are connected in series;
and the second voltage acquisition channel circuit is used for acquiring the voltage value of a series connection point between the two standard resistors R connected in series.
Optionally, the method further includes: a power supply branch;
the power supply branch is connected into a circuit for supplying power to the measuring circuit by the power IO interface;
the power supply branch includes: a selection switch and a capacitor;
the selection switch comprises two switch contacts; the first switch contact is used for communicating the capacitor with a circuit of the power IO interface so as to charge the capacitor by the power IO interface; the second switch contact is used for communicating the capacitor with the circuit of the measuring circuit, so that the capacitor supplies power for the measuring circuit.
Optionally, one end of a standard resistor R in the sensitive resistor branch is connected to the power IO interface, and the other end of the standard resistor R is connected to the sensitive resistor RT and the first voltage acquisition channel circuit respectively;
alternatively, the first and second electrodes may be,
one end of a sensitive resistor RT in the sensitive resistor branch circuit is connected with the power IO interface, and the other end of the sensitive resistor RT is connected with the standard resistor R and the first voltage acquisition channel circuit respectively.
Optionally, one end of a standard resistor R in the sensitive resistor branch is connected to the second switch contact, and the other end of the standard resistor R is connected to the sensitive resistor RT and the first voltage acquisition channel circuit respectively;
alternatively, the first and second electrodes may be,
one end of a sensitive resistor RT in the sensitive resistor branch circuit is connected with the second switch contact, and the other end of the sensitive resistor RT is connected with the standard resistor R and the first voltage acquisition channel circuit respectively.
Optionally, the standard resistor R is a fixed resistor.
Another aspect of the present invention provides a sensitive resistance measuring method, which uses the sensitive resistance measuring apparatus to perform measurement, including:
receiving a sensitive resistance measurement instruction;
respectively acquiring a first voltage value measured by the first voltage acquisition channel circuit and a second voltage value measured by the second voltage acquisition channel circuit according to the sensitive resistance measurement instruction;
and determining the resistance value of the sensitive resistor RT according to the resistance value of the standard resistor R, the first voltage value and the second voltage value.
Optionally, if one end of the standard resistor R in the sensitive resistor branch is connected to the power IO interface, and the other end of the standard resistor R is connected to the sensitive resistor RT and the first voltage acquisition channel circuit, respectively, where one end of the sensitive resistor RT is grounded; the first voltage value is the voltage value at two ends of the sensitive resistor RT; correspondingly, the determining the resistance value of the sensing resistor RT according to the resistance value of the standard resistor R, the first voltage value, and the second voltage value includes:
according to RRT＝Vx╳RR(2Vref-Vx), determining the resistance value of the sensitive resistor RT;
wherein, R isRTRepresenting the resistance value of the sensitive resistor RT, Vx representing the first voltage value, and RRRepresents the resistance value of the standard resistor R, and the Vref represents the second voltage value.
Optionally, if one end of the sensing resistor RT in the sensing resistor branch is connected to the power IO interface, and the other end of the sensing resistor RT is connected to the standard resistor R and the first voltage acquisition channel circuit, respectively, where one end of the standard resistor R is grounded; the first voltage value is the voltage value at two ends of the standard resistor R; correspondingly, the determining the resistance value of the sensing resistor RT according to the resistance value of the standard resistor R, the first voltage value, and the second voltage value includes:
according to RRT＝(2Vref–Vx)╳RRVx, determining the resistance value of the sensitive resistor RT;
wherein, R isRTRepresenting the resistance value of the sensitive resistor RT, Vx representing the first voltage value, and RRRepresents the resistance value of the standard resistor R, and the Vref represents the second voltage value.
Another aspect of the present invention provides a sensitive resistance measuring method, which uses the sensitive resistance measuring apparatus to perform measurement, including:
receiving a sensitive resistance measurement instruction;
sending a first switch contact switching instruction to the selector switch according to the sensitive resistance measurement instruction; the first switch contact switching instruction is used for enabling the selection switch to be switched from the first switch contact to the second switch contact so that the power IO interface stops charging the capacitor, and the capacitor supplies power to the measuring circuit;
respectively acquiring a first voltage value measured by the first voltage acquisition channel circuit and a second voltage value measured by the second voltage acquisition channel circuit;
and determining the resistance value of the sensitive resistor RT according to the resistance value of the standard resistor R, the first voltage value and the second voltage value.
Optionally, after determining the resistance value of the sensing resistor RT, the method further includes:
sending a second switch contact switching instruction to the selection switch; the second switch contact switching instruction is used for enabling the selection switch to be switched from the second switch contact to the first switch contact, so that the capacitor is disconnected with a circuit between the measuring circuits, the capacitor stops supplying power to the measuring circuits, the capacitor is communicated with a circuit between the power IO interfaces, and the power IO interfaces charge the capacitor.
According to the technical scheme, the sensitive resistance measuring device and the sensitive resistance measuring method provided by the invention comprise an MCU circuit and a measuring circuit; the MCU circuit includes: the ADC unit is used for collecting the voltage value of the measuring circuit, and the power IO interface is used for supplying power to the measuring circuit; wherein, the ADC unit includes: the first voltage acquisition channel circuit and the second voltage acquisition channel circuit; the measurement circuit includes: the sensitive resistance branch circuit and the standard resistance branch circuit are connected in parallel; the sensitive resistance branch comprises a sensitive resistance RT and a standard resistance R which are connected in series; the standard circuit branch comprises two standard resistors R connected in series; the first voltage acquisition channel circuit is used for acquiring the voltage value of a series connection point between the series-connected sensitive resistor RT and the standard resistor R; the second voltage acquisition channel circuit is used for acquiring the voltage value of a series connection point between two standard resistors R connected in series. The sensitive resistance measuring device realizes that the voltage measuring errors of the two branches are changed in equal proportion by acquiring the voltages of the two branches of the sensitive resistance branch and the standard resistance branch which are connected in parallel and symmetrically distributed in resistance, so that the influence of the voltage measuring errors on the resistance value of the sensitive resistance is eliminated, and the accuracy of the resistance value of the sensitive resistance measured by the sensitive resistance measuring device provided by the invention is higher.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings needed to be used in the description of the embodiments or the prior art will be briefly introduced below, and it is obvious that the drawings in the following description are some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to these drawings without creative efforts.
FIG. 1 is a schematic structural diagram of a prior art sensing resistor measuring device;
FIG. 2 is a schematic diagram of a sensitive resistance measuring device according to an exemplary embodiment of the present invention;
FIG. 3 is a schematic structural diagram of a sensitive resistance measuring device according to another exemplary embodiment of the present invention;
FIG. 4 is a schematic structural diagram of a sensitive resistance measuring device according to another exemplary embodiment of the present invention;
FIG. 5 is a schematic diagram of a sensitive resistance measuring device according to another exemplary embodiment of the present invention;
FIG. 6 illustrates a method of sensitive resistance measurement in accordance with an exemplary embodiment of the present invention;
FIG. 7 illustrates a method of sensitive resistance measurement in accordance with another exemplary embodiment of the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are some, but not all, embodiments of the present invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Fig. 2 is a schematic structural diagram of a sensitive resistance measuring apparatus according to an exemplary embodiment of the present invention, and as shown in fig. 2, the present embodiment provides a sensitive resistance measuring apparatus 20, including: an MCU circuit 201 and a measurement circuit 202; the MCU circuit 201 includes: an ADC unit 2011 for collecting a voltage value of the measurement circuit, and a power IO interface 2012 for supplying power to the measurement circuit 202; the ADC unit 2011 includes: a first voltage acquisition channel circuit 2011a, a second voltage acquisition channel circuit 2011 b; first voltage acquisition channel circuit 2011a and second voltage acquisition channelReference voltage V of line 2011bbThe same; the measurement circuit 202 includes: a sensitive resistance branch 2021 and a standard resistance branch 2022 which are connected in parallel; the sensitive resistor branch 2021 comprises a sensitive resistor RT and a standard resistor R which are connected in series; the standard circuit branch 2022 includes two standard resistors R connected in series; the first voltage acquisition channel circuit 2011a is used for acquiring a voltage value of a series connection point between the series-connected sensitive resistor RT and the standard resistor R; the second voltage acquisition channel circuit 2011b is configured to acquire a voltage value of a series connection point between two standard resistors R connected in series.
Specifically, the MCU circuit 201 includes an ADC unit 2011 for acquiring a voltage value of the measurement circuit 202 and a power IO interface 2012 for supplying power to the measurement circuit 202. The ADC unit 2011 includes two voltage acquisition circuits, that is, a first voltage acquisition channel circuit 2011a and a second voltage acquisition channel circuit 2011b, which can respectively acquire voltage values of two points of the measurement circuit 202, and a reference voltage for supplying power to the two voltage acquisition circuits of the ADC unit 2011 is Vb. The power IO interface 2012 is connected to the measurement circuit 202 and outputs a power voltage VioPower is supplied to the measurement circuit 202.
The measurement circuit 202 includes a sensitive resistor branch 2021 and a standard resistor branch 2022 connected in parallel. The sensitive resistor branch 2021 is formed by connecting a standard resistor R and a sensitive resistor RT in series. The layout relationship between the standard resistor R and the sensing resistor RT may be as shown in fig. 2, where one end of the standard resistor R is connected to the power IO interface 2012, and the other end is connected to the sensing resistor RT. One end of the sensitive resistor is grounded, and the other end of the sensitive resistor is connected with the standard resistor R. Of course, the two can be exchanged (as shown in fig. 4), as long as the two are in serial relation. The standard resistor branch 2022 is formed by connecting two standard resistors R in series, one end of each of the two standard resistors R connected in series is connected to each other, the other end of one standard resistor R is grounded, and the other end of the other standard resistor R is connected to the power IO interface 2012.
The sensitive resistance measuring device 20 provides a power supply voltage V for the measuring circuit 202 through the power supply IO interface 2012ioThe sense resistor R connected in series is acquired by the first voltage acquisition channel circuit 2011a of the ADC unit 2011The voltage value of the series connection point between the T and the standard resistor R, i.e. the voltage V at the end of the branch 2021 where the resistor RT and the standard resistor R are connected to each otherxThe second voltage acquisition channel circuit 2011b of the ADC unit 2011 acquires the voltage value of the serial connection point between the two standard resistors R connected in series, that is, acquires the voltage V at the end of the standard resistor branch 2022 where the two standard resistors R are connected in seriesrefFrom ohm's law, it can be known that:
Vio＝2╳Vref (3)
(2Vref-Vx)/RR＝Vx/RRT (4)
RRT＝Vx╳RR/(2Vref-Vx) (5)
from equation (5), it can be seen that the error influence factors influencing the resistance value of the sensing resistor RT include: vx、VrefAnd RR。VrefAnd VxThe reference resistance R may be obtained by collecting the first voltage collecting channel circuit 2011a and the second voltage collecting channel circuit 2011b of the ADC unit 2011, and in order to ensure stability of the reference resistance R, the reference resistance R may select a fixed-value resistance, and select a high-precision customized resistance, for example, a high-precision fixed-value resistance with a precision of ± 0.5% or ± 1%. Voltage V collected by first voltage collecting channel circuit 2011a of ADC unit 2011xAnd V collected by a second voltage collection channel circuit 2011brefThe variation of the two voltage values will follow the reference voltage VbAnd the ratio is changed in equal proportion.
In particular, as described in the background, due to the reference voltage VbResulting in the voltage value V measured by the ADC unit 2011xThere may be an error. However, as shown in fig. 2, the same reference voltage V is used for the measurement of the two voltage acquisition channel circuits (2011a and 2011b) of the ADC unit 2011bThe ratio of the measurement errors is the same, so that V can be eliminatedxAnd VrefThe error effect of (2). For example, if the first voltage acquisition channel circuit2011a and the second voltage acquisition channel 2011b use the same reference voltage VbReference voltage VbAnd 10% up/down, the voltages measured by the first voltage acquisition channel 2011a and the second voltage acquisition channel 2011b are correspondingly 10% up/down at the same time. Then, according to the formula (5), when V isrefAnd VxThe measured error ratios are the same, and the measured voltage values are respectively 1.1V under the assumption that the measured error ratios are equal to the upper 10 percent of the equal ratiorefAnd 1.1VxThen, the resistance value of the sensing resistor RT is:
RRT＝1.1Vx╳RR/(2╳1.1Vref-1.1╳Vx)＝Vx╳RR/(2Vref-Vx) (6)
as can be seen from equation (6), since VxAnd VrefUsing the same reference voltage VbThe measurement error is biased by 10% in equal proportion, so that V can be eliminatedxAnd VrefThe measurement error of the sensitive resistor RT is only related to the error of the standard resistor R, and since the standard resistor R is a fixed value resistor, and if a high-precision fixed value resistor is adopted, the resistance accuracy of the sensitive resistor measured by the sensitive resistor measuring device 20 provided in this embodiment is high.
The sensitive resistance measuring device provided by the embodiment comprises an MCU circuit and a measuring circuit; the MCU circuit includes: the ADC unit is used for collecting the voltage value of the measuring circuit, and the power IO interface is used for supplying power to the measuring circuit; wherein, the ADC unit includes: the first voltage acquisition channel circuit and the second voltage acquisition channel circuit; the measurement circuit includes: the sensitive resistance branch circuit and the standard resistance branch circuit are connected in parallel; the sensitive resistance branch comprises a sensitive resistance RT and a standard resistance R which are connected in series; the standard circuit branch comprises two standard resistors R connected in series; the first voltage acquisition channel circuit is used for acquiring the voltage value of a series connection point between the series-connected sensitive resistor RT and the standard resistor R; the second voltage acquisition channel circuit is used for acquiring the voltage value of a series connection point between two standard resistors R connected in series. The sensitive resistance measuring device realizes that the voltage measurement errors of the two branches are changed in equal proportion by acquiring the voltages of the two branches of the sensitive resistance branch and the standard resistance branch which are connected in parallel and symmetrically distributed in resistance, so that the influence of the voltage measurement errors on the resistance value of the sensitive resistance is eliminated, and the accuracy of the resistance value of the sensitive resistance tested by the sensitive resistance measuring device provided by the embodiment is higher.
Fig. 3 is a schematic structural diagram of a sensitive resistance measuring apparatus according to another exemplary embodiment of the present invention, as shown in fig. 3, on the basis of the embodiment shown in fig. 2, further including: a power supply branch 203; the power supply branch 203 is connected to a circuit for supplying power to the measurement circuit 202 through the power source IO interface 2012; the power supply branch 203 includes: a selection switch 2031 and a capacitor C; the selection switch 2031 includes two switch contacts; the first switch contact a is used for communicating the capacitor C with a circuit of the power source IO interface 2012, so that the power source IO interface 2012 charges the capacitor C; the second switch contact b is used to connect the capacitance C to the circuit of the measurement circuit 202, so that the capacitance C supplies power to the measurement circuit 202.
Specifically, the MCU circuit 201 includes an ADC unit 2011 for acquiring a voltage value of the measurement circuit 202 and a power IO interface 2012 for supplying power to the measurement circuit 202. The ADC unit 2011 includes two voltage acquisition circuits, that is, a first voltage acquisition channel circuit 2011a and a second voltage acquisition channel circuit 2011b, which can respectively acquire voltage values of two points of the measurement circuit 202, and a reference voltage for supplying power to the two voltage acquisition circuits of the ADC unit 2011 is Vb. The power IO interface 2012 is connected to the measurement circuit 202 and outputs a power voltage VioPower is supplied to the measurement circuit 202.
The measurement circuit 202 includes a sensitive resistor branch 2021 and a standard resistor branch 2022 connected in parallel. The sensitive resistor branch 2021 is formed by connecting a standard resistor R and a sensitive resistor RT in series. The layout relationship between the standard resistor R and the sensing resistor RT can be as shown in fig. 3, where one end of the standard resistor R is connected to the selection switch 2031, and the other end is connected to the sensing resistor RT. One end of the sensitive resistor RT is grounded, and the other end of the sensitive resistor RT is connected with the standard resistor R. The standard resistor branch 2022 is formed by connecting two standard resistors R in series, one end of each of the two standard resistors R connected in series is connected to each other, the other end of one standard resistor R is grounded, and the other end of the other standard resistor R is connected to the selection switch 2031.
The power supply branch 203 includes: a selection switch 2031 and a capacitor C; the selection switch 2031 includes two switch contacts; the switch contact a of the power source IO interface 2012 can be selectively connected, and the switch contact b of the sensitive resistor branch 2021 and the standard resistor branch 2022 connected in parallel can also be selectively connected. When the selection switch 2031 is connected to the switch contact a, the capacitor C is charged through the power IO interface 2012; when the selection switch 2031 is connected to the switch contact b, the capacitor C starts to discharge, supplying power to the sensitive resistor branch 2021 and the standard resistor branch 2022. When the sensitive resistance measuring device 20 is in an idle state, the selection switch 2031 is connected to the switch contact a, the capacitor C is charged through the power IO interface 2012, and electric energy is stored; when the sensitive resistor measuring device 20 is awakened to measure the resistance value of the sensitive resistor RT, the selection switch 2031 is connected to the switch contact b, the capacitor C starts to discharge, power is supplied to the measuring circuit 202, and V starts to be collectedrefAnd VxThe voltage value of (2). Therefore, the sensitive resistor measuring apparatus 20 shown in fig. 3 can obtain the resistance value of the sensitive resistor with high accuracy, and can also charge the capacitor C when the measurement is not performed, and stop charging the capacitor C when the measurement is performed, thereby having an advantage of low power consumption, and at the same time, because the power supply voltage V for supplying power to the measurement circuit 202 and outputting the power supply voltage V for the capacitor C instead of the power supply IO interface 2012ioThereby enabling the supply voltage VioThe influence of the load fluctuation does not reach the measuring circuit 202, so that the accuracy of measuring the resistance value of the sensitive resistor RT is further ensured.
The sensitive resistance measuring device 20 shown in fig. 3 operates as follows: providing a supply voltage V to the measurement circuit 202 by discharging the capacitor CioThe voltage V at the end of the sensitive resistor RT connected to the standard resistor R in the sensitive resistor branch 2021 is collected by the first voltage collecting channel circuit 2011a of the ADC unit 2011xThe voltage at the end of the standard resistor branch 2022 where the two series resistors are connected to each other is collected by the second voltage collecting channel circuit 2011b of the ADC unit 2011 as VrefWhen two voltage acquisition channels of the ADC unit 2011 perform measurement, the same reference voltage V is usedbThe error ratio of the measurement is the same, canElimination of VxAnd VrefThe measurement error of the sensitive resistor RT is only related to the error of the standard resistor R, and since the standard resistor R can be a high-precision fixed-value resistor, the precision of the resistance value of the sensitive resistor RT measured by the sensitive resistor measurement device 20 provided in this embodiment is high. The resistance value calculation method of the sensitive resistor RT is the same as that of the sensitive resistor measurement apparatus 20 shown in fig. 2, and when the first voltage acquisition channel circuit 2011a and the second voltage acquisition channel circuit 2011b use the same reference voltage Vb, and the reference voltage Vb is shifted up/down by 10%, correspondingly, the voltages measured by the first voltage acquisition channel circuit 2011a and the second voltage acquisition channel circuit 2011b are shifted up/down by 10% at the same time. Then, according to the formula (5), when V isrefAnd VxThe measured error ratios are the same, and the measured voltage values are respectively 1.1V under the assumption that the measured error ratios are equal to the upper 10 percent of the equal ratiorefAnd 1.1VxThen, the resistance value of the sensing resistor RT is:
RRT＝1.1Vx╳RR/(2╳1.1Vref-1.1╳Vx)＝Vx╳RR/(2Vref-Vx) (6)
as can be seen from equation (6), since VxAnd VrefUsing the same reference voltage VbThe measurement error is biased by 10% in equal proportion, so that V can be eliminatedxAnd VrefThe measurement error of the sensitive resistor RT is only related to the error of the standard resistor R, and since the standard resistor R is a fixed value resistor, and if a high-precision fixed value resistor is adopted, the resistance accuracy of the sensitive resistor measured by the sensitive resistor measuring device 20 provided in this embodiment is high. Meanwhile, the power supply branch 203 also provides a function of charging the capacitor C when measurement is not performed and stopping charging the capacitor C when measurement is performed, and has the advantage of low power consumption; and because the capacitor C is adopted to replace the power IO interface 2012 to supply power to the measurement circuit 202, the power voltage V is enabled to beioThe influence of the load fluctuation does not reach the measuring circuit 202, and the accuracy of measuring the resistance value of the sensitive resistor RT is further ensured.
Fig. 4 is a schematic structural diagram of a sensitive resistance measuring apparatus according to another exemplary embodiment of the present invention, as shown in fig. 4, which is based on the embodiment shown in fig. 2, and the positions of the standard resistor R and the standard resistor R in the sensitive resistor branch 2021 are exchanged. That is to say, in the sensitive resistance measuring apparatus 20 shown in fig. 2, one end of the standard resistor R in the sensitive resistor branch 2021 is connected to the power IO interface 2012, and the other end is connected to the sensitive resistor RT and the first voltage acquisition channel circuit 2011a respectively; in the sensitive resistance measuring apparatus 20 shown in fig. 4, one end of the sensitive resistor RT in the sensitive resistor branch 2021 is connected to the power IO interface 2012, and the other end is connected to the standard resistor R and the first voltage collecting channel circuit 2011a, respectively.
Specifically, the difference between the sensitive resistance measuring device 20 provided in this embodiment and the sensitive resistance measuring device 20 provided in fig. 2 is that the positions of the standard resistor R and the sensitive resistor RT of the sensitive resistor branch 2021 are different, one end of the sensitive resistor RT is connected to the power IO interface 2012, and the other end is connected to the standard resistor R. One end of the standard resistor R is grounded, and the other end of the standard resistor R is connected with the sensitive resistor RT.
As shown in FIG. 4, the measurement circuit 202 is supplied with a power supply voltage V via a power IO interface 2012ioThe voltage Vx at one end of the sensitive resistor RT connected with the standard resistor R in the sensitive resistor branch 2021 is collected through the first voltage collection channel circuit 2011a of the ADC unit 2011, and the voltage at one end of the two series resistors R connected with each other in the standard resistor branch 2022 is collected through the second voltage collection channel circuit 2011b of the ADC unit 2011 and is Vref, which can be known according to the ohm's law:
Vio＝2╳Vref (7)
(2Vref-Vx)/RRT＝Vx/RR (8)
RRT＝(2Vref–Vx)╳RR/Vx (9)
due to the reference voltage VbThe voltage value measured by the ADC unit 2011 may have an error. The same reference voltage V is adopted for the measurement of the two voltage acquisition channels of the ADC unit 2011bThe error ratio of the measurement is the same, and V can be eliminatedxAnd VrefThe error effect of (2). For example, first voltage acquisition channel circuit 2011a and second voltage acquisition channel circuit 2011b use the same reference voltage VbReference voltage VbAnd 10% up/down, the voltages measured by the first 2011a and the second 2011b voltage acquisition channels are simultaneously up/down 10%. According to the formula (9), when V isxAnd VrefAre the same, and the measured voltage values are 1.1V respectively on the assumption that the error ratios are equal and are biased by 10% upwardsrefAnd 1.1VxThe resistance value R of the sensitive resistor RTRTComprises the following steps:
RT＝(2╳1.1╳Vref–1.1Vx)╳R/1.1Vx＝(2Vref–Vx)╳R/Vx (10)
as can be seen from equation (10), since VxAnd VrefUsing the same reference voltage VbThe measurement error is biased by 10% in equal proportion, so that V can be eliminatedxAnd VrefThe measurement error of the sensitive resistor RT is only related to the error of the standard resistor R, the standard resistor R may be a fixed value resistor, and more preferably, a high-precision fixed value resistor is used, so that the precision of the resistance value of the sensitive resistor RT tested by the sensitive resistor measurement device 20 provided in this embodiment is high.
Fig. 5 is a schematic structural diagram of a sensitive resistance measuring apparatus according to another exemplary embodiment of the present invention, and as shown in fig. 5, the positions of the standard resistor R and the standard resistor R in the sensitive resistor branch 2021 are exchanged based on the embodiment shown in fig. 3. That is to say, in the sensitive resistance measuring apparatus 20 shown in fig. 3, one end of the standard resistor R in the sensitive resistor branch 2021 is connected to the second switch contact b, and the other end is connected to the sensitive resistor RT and the first voltage acquisition channel circuit 2011a respectively; in the sensitive resistance measuring apparatus 20 shown in fig. 5, one end of the sensitive resistor RT in the sensitive resistor branch 2021 is connected to the second switch contact b, and the other end is connected to the standard resistor R and the first voltage acquisition channel circuit 2011 a.
Specifically, the sensitive resistance measuring device 20 provided in the present embodiment and the sensitive resistor provided in fig. 3The difference of the inductance resistance measuring device 20 is that the positions of the standard resistance R and the sensitive resistance RT of the sensitive resistance branch 2021 are different, one end of the sensitive resistance RT is connected to the selection switch 2031, and the other end is connected to the standard resistance R. One end of the standard resistor R is grounded, and the other end of the standard resistor R is connected with the sensitive resistor RT. The resistance value calculation method of the sensitive resistor RT is the same as that of the sensitive resistor measurement apparatus 20 shown in fig. 4, and the first voltage acquisition channel circuit 2011a and the second voltage acquisition channel circuit 2011b use the same reference voltage VbReference voltage VbAnd 10% up/down, the voltages measured by the first 2011a and the second 2011b voltage acquisition channels are simultaneously up/down 10%. According to the formula (9), when V isxAnd VrefAre the same, and the measured voltage values are 1.1V respectively on the assumption that the error ratios are equal and are biased by 10% upwardsrefAnd 1.1VxThe resistance value R of the sensitive resistor RTRTComprises the following steps:
RT＝(2╳1.1╳Vref–1.1Vx)╳R/1.1Vx＝(2Vref–Vx)╳R/Vx (10)
as can be seen from equation (10), since VxAnd VrefUsing the same reference voltage VbThe measurement error is biased by 10% in equal proportion, so that V can be eliminatedxAnd VrefThe measurement error of the sensitive resistor RT is only related to the error of the standard resistor R, the standard resistor R may be a fixed value resistor, and more preferably, a high-precision fixed value resistor is used, so that the precision of the resistance value of the sensitive resistor RT tested by the sensitive resistor measurement device 20 provided in this embodiment is high.
Fig. 6 is a sensitive resistance measurement method according to an exemplary embodiment of the present invention, and as shown in fig. 6, the sensitive resistance measurement method according to this embodiment may implement measurement based on the sensitive resistance measurement device 20 shown in fig. 2 or fig. 4, where the measurement method specifically includes:
step 601, receiving a sensitive resistance measurement instruction.
Step 602, according to the sensitive resistance measurement instruction, respectively obtaining a first voltage value measured by the first voltage acquisition channel circuit and a second voltage value measured by the second voltage acquisition channel circuit.
Step 603, determining the resistance value of the sensitive resistor RT according to the resistance value of the standard resistor R, the first voltage value and the second voltage value.
Specifically, the processor for receiving the sensitive resistor measurement instruction may be a processor integrated in the MCU circuit 201, or may be a processor outside the sensitive resistor measurement apparatus 20, and the processor and the MCU circuit 201 are in communication interaction, so that the MCU circuit 201 executes a corresponding operation according to the instruction of the processor, for example, after receiving the sensitive resistor measurement instruction, the processor triggers the MCU circuit 201 to supply power to the measurement circuit 202, so that the ADC unit 2011 acquires the voltages of the sensitive resistor branch 2021 and the standard resistor branch 2022 to obtain the resistance of the sensitive resistor RT.
Based on the sensitive resistance measuring device shown in fig. 2, that is, if one end of the standard resistor R in the sensitive resistor branch 2021 is connected to the power IO interface 2012, the other end is connected to the sensitive resistor RT and the first voltage acquisition channel circuit 2011a, respectively, where one end of the sensitive resistor RT is grounded; the first voltage value is the voltage value at two ends of the sensitive resistor RT; correspondingly, determining the resistance value of the sensitive resistor RT according to the resistance value of the standard resistor R, the first voltage value, and the second voltage value in step 603 specifically includes:
according to RRT＝Vx╳RR(2Vref-Vx), and determining the resistance value of the sensitive resistor RT; wherein R isRTRepresenting the resistance of the sensitive resistor RT, Vx representing the first voltage value, RRRepresents the resistance value of the standard resistor R, and Vref represents the second voltage value.
Based on the sensitive resistance measuring device shown in fig. 4, that is, if one end of the sensitive resistance RT in the sensitive resistance branch 2021 is connected to the power IO interface 2012, the other end is connected to the standard resistance R and the first voltage acquisition channel circuit 2011a, respectively, where one end of the standard resistance R is grounded; the first voltage value is the voltage value at two ends of the standard resistor R; correspondingly, determining the resistance value of the sensitive resistor RT according to the resistance value of the standard resistor R, the first voltage value, and the second voltage value in step 603 specifically includes:
according to RRT＝(2Vref–Vx)╳RRVx, determining the resistance value of the sensitive resistor RT; wherein the content of the first and second substances,RRTrepresenting the resistance of the sensitive resistor RT, Vx representing the first voltage value, RRRepresents the resistance value of the standard resistor R, and Vref represents the second voltage value.
The sensitive resistance measuring method of the embodiment is based on a sensitive resistance measuring device, and the device comprises an MCU circuit and a measuring circuit; the MCU circuit includes: the ADC unit is used for collecting the voltage value of the measuring circuit, and the power IO interface is used for supplying power to the measuring circuit; wherein, the ADC unit includes: the first voltage acquisition channel circuit and the second voltage acquisition channel circuit; the measurement circuit includes: the sensitive resistance branch circuit and the standard resistance branch circuit are connected in parallel; the sensitive resistance branch comprises a sensitive resistance RT and a standard resistance R which are connected in series; the standard circuit branch comprises two standard resistors R connected in series; the first voltage acquisition channel circuit is used for acquiring the voltage value of a series connection point between the series-connected sensitive resistor RT and the standard resistor R; the second voltage acquisition channel circuit is used for acquiring the voltage value of a series connection point between two standard resistors R connected in series. Through the device, the first voltage value obtained by measuring the first voltage acquisition channel circuit and the second voltage value obtained by measuring the second voltage acquisition channel circuit are obtained respectively, and due to the parallel connection structure of the sensitive resistor branch circuit and the standard resistor branch circuit and the symmetrical distribution of the resistors of the two branch circuits, the voltage measurement errors of the two voltage values are changed in equal proportion, so that the influence of the voltage measurement errors on the resistance value of the sensitive resistor is eliminated, and the accuracy of the resistance value of the sensitive resistor obtained by testing the sensitive resistor measuring device based on the embodiment is improved.
Fig. 7 is a sensitive resistance measurement method according to another exemplary embodiment of the present invention, and as shown in fig. 7, the sensitive resistance measurement method according to this embodiment may implement measurement based on the sensitive resistance measurement device 20 shown in fig. 3 or fig. 5, where the measurement method specifically includes:
step 701, receiving a sensitive resistance measurement instruction.
Step 702, sending a first switch contact switching instruction to a selection switch according to a sensitive resistance measurement instruction; the first switch contact switching instruction is used for enabling the selection switch to be switched from the first switch contact to the second switch contact, so that the power IO interface stops charging the capacitor, and the capacitor supplies power to the measuring circuit.
And 703, respectively acquiring a first voltage value measured by the first voltage acquisition channel circuit and a second voltage value measured by the second voltage acquisition channel circuit.
And step 704, determining the resistance value of the sensitive resistor RT according to the resistance value of the standard resistor R, the first voltage value and the second voltage value.
Specifically, as in the above embodiment, the processor for receiving the sensitive resistance measurement instruction may be a processor integrated in the MCU circuit 201, or may be a processor outside the sensitive resistance measurement device 20, and the processor is in communication with the MCU circuit 201 to enable the MCU circuit 201 to perform a corresponding operation according to an instruction of the processor, for example, after the processor receives the sensitive resistance measurement instruction, the MCU circuit 201 is triggered to send a first switch contact switching instruction to the selection switch 2031 to switch the selection switch 2031 from the first switch contact a to the second switch contact b, so that the sensitive resistance measurement device 20 is switched from an idle state to a working state, where the idle state is a state where the power IO interface 2012 charges the capacitor C and stores electric energy when the first switch contact a is closed; the working state is a state in which when the second switch contact b is closed, the power IO interface 2012 stops charging the capacitor C, and the capacitor C discharges to supply power to the measurement circuit 202; the sense resistor measuring device 20 performs measurement of the resistance value of the sense resistor RT in an operating state to determine the resistance value of the sense resistor RT. After the resistance value of the sensitive resistor RT is determined, a second switch contact switching instruction can be sent to the selection switch; the second switch contact switching instruction is used for switching the selection switch 2031 from the second switch contact b to the first switch contact a, so that a circuit between the capacitor C and the measurement circuit 202 is disconnected, the capacitor C stops supplying power to the measurement circuit 202, a circuit between the capacitor C and the power IO interface 2012 is connected, and the power IO interface 2012 charges the capacitor C.
Based on the sensitive resistor measuring device shown in fig. 3, that is, if one end of the standard resistor R in the sensitive resistor branch 2021 is connected to the second switch contact b, the other end is connected to the sensitive resistor RT and the first voltage collecting channel circuit2011a are respectively connected, wherein one end of the sensitive resistor RT is grounded; the first voltage value is the voltage value at two ends of the sensitive resistor RT; correspondingly, the step 704 of determining the resistance value of the sensing resistor RT according to the resistance value of the standard resistor R, the first voltage value, and the second voltage value specifically includes: according to RRT＝Vx╳RR(2Vref-Vx), and determining the resistance value of the sensitive resistor RT; wherein R isRTRepresenting the resistance of the sensitive resistor RT, Vx representing the first voltage value, RRRepresents the resistance value of the standard resistor R, and Vref represents the second voltage value.
Based on the sensitive resistance measuring device shown in fig. 5, that is, if one end of the sensitive resistance RT in the sensitive resistance branch 2021 is connected to the second switch contact b, the other end is connected to the standard resistance R and the first voltage acquisition channel circuit 2011a, respectively, where one end of the standard resistance R is grounded; the first voltage value is the voltage value at two ends of the standard resistor R; correspondingly, the step 704 of determining the resistance value of the sensing resistor RT according to the resistance value of the standard resistor R, the first voltage value, and the second voltage value specifically includes: according to RRT＝(2Vref–Vx)╳RRVx, determining the resistance value of the sensitive resistor RT; wherein R isRTRepresenting the resistance of the sensitive resistor RT, Vx representing the first voltage value, RRRepresents the resistance value of the standard resistor R, and Vref represents the second voltage value.
Finally, it should be noted that: the above examples are only intended to illustrate the technical solution of the present invention, but not to limit it; although the present invention has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; and the modifications or the substitutions do not make the essence of the corresponding technical solutions depart from the scope of the technical solutions of the embodiments of the present invention.

Claims (6)

1. A sensitive resistance measuring device, comprising: MCU circuit, measuring circuit;
the MCU circuit includes: the ADC unit is used for collecting the voltage value of the measuring circuit, and the power IO interface is used for supplying power to the measuring circuit; wherein the ADC unit includes: the first voltage acquisition channel circuit and the second voltage acquisition channel circuit; the measurement circuit includes: the sensitive resistance branch circuit and the standard resistance branch circuit are connected in parallel; the sensitive resistance branch comprises a sensitive resistance RT and a standard resistance R which are connected in series; the standard circuit branch comprises two standard resistors R connected in series;
the first voltage acquisition channel circuit is used for acquiring a first voltage value of a series connection point between the sensitive resistor RT and the standard resistor R which are connected in series;
the second voltage acquisition channel circuit is used for acquiring a second voltage value of a series connection point between the two standard resistors R connected in series;
the device further comprises:
a power supply branch;
the power supply branch is connected into a circuit for supplying power to the measuring circuit by the power IO interface;
the power supply branch includes: a selection switch and a capacitor;
the selection switch comprises two switch contacts; the first switch contact is used for communicating the capacitor with a circuit of the power IO interface so as to charge the capacitor by the power IO interface; the second switch contact is used for communicating the capacitor with a circuit of the measuring circuit so that the capacitor supplies power to the measuring circuit, and the power supply voltage of the capacitor is 2 times of the voltage acquired by the second voltage acquisition channel circuit;
wherein the content of the first and second substances,
one end of a standard resistor R in the sensitive resistor branch circuit is connected with the second switch contact, the other end of the standard resistor R is respectively connected with the sensitive resistor RT and the first voltage acquisition channel circuit, and the other end of the sensitive resistor RT is grounded; the resistance value of the sensitive resistor RT is the product of a first ratio and the standard resistance value, the first ratio is the ratio of the first voltage value to a first difference value, and the first difference value is the difference value of twice the second voltage value and the first voltage value;
alternatively, the first and second electrodes may be,
one end of a sensitive resistor RT in the sensitive resistor branch circuit is connected with the second switch contact, the other end of the sensitive resistor RT is respectively connected with the standard resistor R and the first voltage acquisition channel circuit, and the other end of the standard resistor R is grounded; the resistance value of the sensitive resistor RT is the product of a second ratio and the standard resistance value, and the second ratio is the ratio of the first difference value and the first voltage value;
the reference voltage of the first voltage acquisition channel circuit is the same as the reference voltage of the second voltage acquisition channel circuit, and the error proportion of the reference voltage, the voltage acquired by the first voltage acquisition channel circuit and the voltage acquired by the second voltage acquisition channel circuit is the same.
2. The sensitive resistance measuring device of claim 1,
the standard resistor R is a constant value resistor.
3. A sensitive resistance measuring method for performing measurement using the sensitive resistance measuring apparatus according to claim 1, comprising:
receiving a sensitive resistance measurement instruction;
respectively acquiring a first voltage value measured by the first voltage acquisition channel circuit and a second voltage value measured by the second voltage acquisition channel circuit according to the sensitive resistance measurement instruction;
determining the resistance value of the sensitive resistor RT according to the resistance value of the standard resistor R, the first voltage value and the second voltage value;
wherein the content of the first and second substances,
if one end of a standard resistor R in the sensitive resistor branch is connected with the power IO interface, the other end of the standard resistor R is respectively connected with the sensitive resistor RT and the first voltage acquisition channel circuit, wherein one end of the sensitive resistor RT is grounded; the first voltage value is the voltage value at two ends of the sensitive resistor RT; correspondingly, the determining the resistance value of the sensing resistor RT according to the resistance value of the standard resistor R, the first voltage value, and the second voltage value includes:
according to RRT＝Vx╳RR/(2Vref-Vx) Determining the resistance value of the sensitive resistor RT;
wherein, R isRTRepresenting the resistance value of the sense resistor RT, VxRepresenting said first voltage value, said RRRepresents the resistance value of the standard resistor R, the VrefRepresenting the second voltage value.
4. The method according to claim 3, wherein if one end of the sensing resistor RT in the sensing resistor branch is connected to the power IO interface, the other end is connected to the standard resistor R and the first voltage collecting channel circuit, respectively, wherein one end of the standard resistor R is grounded; the first voltage value is the voltage value at two ends of the standard resistor R; correspondingly, the determining the resistance value of the sensing resistor RT according to the resistance value of the standard resistor R, the first voltage value, and the second voltage value includes:
according to RRT＝(2Vref–Vx)╳RR/VxDetermining the resistance value of the sensitive resistor RT;
wherein, R isRTRepresenting the resistance value of the sense resistor RT, VxRepresenting said first voltage value, said RRRepresents the resistance value of the standard resistor R, the VrefRepresenting the second voltage value.
5. A sensitive resistance measuring method for performing measurement using the sensitive resistance measuring apparatus according to claim 1, comprising:
receiving a sensitive resistance measurement instruction;
sending a first switch contact switching instruction to the selector switch according to the sensitive resistance measurement instruction; the first switch contact switching instruction is used for enabling the selection switch to be switched from the first switch contact to the second switch contact so that the power IO interface stops charging the capacitor, and the capacitor supplies power to the measuring circuit;
respectively acquiring a first voltage value measured by the first voltage acquisition channel circuit and a second voltage value measured by the second voltage acquisition channel circuit;
and determining the resistance value of the sensitive resistor RT according to the resistance value of the standard resistor R, the first voltage value and the second voltage value.
6. The method according to claim 5, wherein after determining the resistance value of the sensing resistor RT, the method further comprises:
sending a second switch contact switching instruction to the selection switch; the second switch contact switching instruction is used for enabling the selection switch to be switched from the second switch contact to the first switch contact, so that the capacitor is disconnected with a circuit between the measuring circuits, the capacitor stops supplying power to the measuring circuits, the capacitor is communicated with a circuit between the power IO interfaces, and the power IO interfaces charge the capacitor.
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