CN1816422A - 用于化学机械平整化的功能分级垫的合成 - Google Patents
用于化学机械平整化的功能分级垫的合成 Download PDFInfo
- Publication number
- CN1816422A CN1816422A CNA2004800188570A CN200480018857A CN1816422A CN 1816422 A CN1816422 A CN 1816422A CN A2004800188570 A CNA2004800188570 A CN A2004800188570A CN 200480018857 A CN200480018857 A CN 200480018857A CN 1816422 A CN1816422 A CN 1816422A
- Authority
- CN
- China
- Prior art keywords
- polishing pad
- zones
- pad
- functional classification
- different
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
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Images
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/20—Lapping pads for working plane surfaces
- B24B37/24—Lapping pads for working plane surfaces characterised by the composition or properties of the pad materials
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24D—TOOLS FOR GRINDING, BUFFING OR SHARPENING
- B24D11/00—Constructional features of flexible abrasive materials; Special features in the manufacture of such materials
- B24D11/04—Zonally-graded surfaces
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24D—TOOLS FOR GRINDING, BUFFING OR SHARPENING
- B24D7/00—Bonded abrasive wheels, or wheels with inserted abrasive blocks, designed for acting otherwise than only by their periphery, e.g. by the front face; Bushings or mountings therefor
- B24D7/14—Zonally-graded wheels; Composite wheels comprising different abrasives
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y40/00—Manufacture or treatment of nanostructures
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Porous Artificial Stone Or Porous Ceramic Products (AREA)
Abstract
Description
Claims (13)
Applications Claiming Priority (9)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US47530703P | 2003-06-03 | 2003-06-03 | |
US47528303P | 2003-06-03 | 2003-06-03 | |
US47537403P | 2003-06-03 | 2003-06-03 | |
US47530503P | 2003-06-03 | 2003-06-03 | |
US60/475,283 | 2003-06-03 | ||
US60/475,307 | 2003-06-03 | ||
US60/475,305 | 2003-06-03 | ||
US60/475,374 | 2003-06-03 | ||
PCT/US2004/017638 WO2005000529A1 (en) | 2003-06-03 | 2004-06-03 | Synthesis of a functionally graded pad for chemical mechanical planarization |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1816422A true CN1816422A (zh) | 2006-08-09 |
CN1816422B CN1816422B (zh) | 2011-06-22 |
Family
ID=33556644
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN2004800188570A Expired - Lifetime CN1816422B (zh) | 2003-06-03 | 2004-06-03 | 用于化学机械平整化的功能分级垫的合成 |
Country Status (5)
Country | Link |
---|---|
JP (2) | JP4746540B2 (zh) |
KR (1) | KR101108024B1 (zh) |
CN (1) | CN1816422B (zh) |
SG (2) | SG168412A1 (zh) |
WO (1) | WO2005000529A1 (zh) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN100445037C (zh) * | 2007-09-21 | 2008-12-24 | 南京航空航天大学 | 用于化学机械抛光的分层冷冻磨料抛光垫及其制备方法 |
CN105397609A (zh) * | 2015-11-03 | 2016-03-16 | 大连理工大学 | 一种光学零件高精度平面的修形加工方法 |
CN106132630A (zh) * | 2014-04-03 | 2016-11-16 | 3M创新有限公司 | 抛光垫和系统以及制造和使用此类抛光垫和系统的方法 |
CN110815038A (zh) * | 2018-08-08 | 2020-02-21 | 湖北鼎龙控股股份有限公司 | 抛光垫及其制备方法、应用 |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101616535B1 (ko) * | 2005-02-18 | 2016-04-29 | 넥스플래너 코퍼레이션 | 화학적 기계적인 평탄화를 위해 적합화된 연마 패드와 그 연마 패드의 제조 및 사용 방법 |
TWI385050B (zh) * | 2005-02-18 | 2013-02-11 | Nexplanar Corp | 用於cmp之特製拋光墊及其製造方法及其用途 |
CN102119069B (zh) * | 2008-08-08 | 2015-04-15 | 可乐丽股份有限公司 | 抛光垫及抛光垫的制造方法 |
US8883034B2 (en) | 2009-09-16 | 2014-11-11 | Brian Reiss | Composition and method for polishing bulk silicon |
US8697576B2 (en) | 2009-09-16 | 2014-04-15 | Cabot Microelectronics Corporation | Composition and method for polishing polysilicon |
US8815110B2 (en) | 2009-09-16 | 2014-08-26 | Cabot Microelectronics Corporation | Composition and method for polishing bulk silicon |
US9156124B2 (en) | 2010-07-08 | 2015-10-13 | Nexplanar Corporation | Soft polishing pad for polishing a semiconductor substrate |
US9731456B2 (en) | 2013-03-14 | 2017-08-15 | Sabic Global Technologies B.V. | Method of manufacturing a functionally graded article |
TWI689406B (zh) * | 2014-10-17 | 2020-04-01 | 美商應用材料股份有限公司 | 研磨墊及製造其之方法 |
Family Cites Families (20)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63297416A (ja) * | 1987-05-28 | 1988-12-05 | Dainippon Ink & Chem Inc | 熱硬化型ウレタンエラストマ−組成物 |
JPH01257018A (ja) * | 1988-04-07 | 1989-10-13 | Fuji Heavy Ind Ltd | 異種発泡体の同時一体成形法 |
US5197999A (en) * | 1991-09-30 | 1993-03-30 | National Semiconductor Corporation | Polishing pad for planarization |
JPH09262759A (ja) * | 1996-03-28 | 1997-10-07 | Naoetsu Seimitsu Kako Kk | 面加工装置 |
US6062958A (en) * | 1997-04-04 | 2000-05-16 | Micron Technology, Inc. | Variable abrasive polishing pad for mechanical and chemical-mechanical planarization |
JPH11226861A (ja) * | 1998-02-13 | 1999-08-24 | Toshiba Mach Co Ltd | 研磨布及び平面研磨装置 |
JPH11333699A (ja) * | 1998-03-24 | 1999-12-07 | Sony Corp | 研磨パッド、研磨装置および研磨方法 |
US5897426A (en) * | 1998-04-24 | 1999-04-27 | Applied Materials, Inc. | Chemical mechanical polishing with multiple polishing pads |
JPH11347919A (ja) * | 1998-06-09 | 1999-12-21 | Oki Electric Ind Co Ltd | 半導体素子の研磨平坦化装置及び研磨平坦化方法 |
JP2000158325A (ja) * | 1998-11-26 | 2000-06-13 | Promos Technol Inc | 化学機械研磨の装置と方法 |
JP2000176829A (ja) * | 1998-12-18 | 2000-06-27 | Tdk Corp | 研磨装置 |
US6413153B1 (en) * | 1999-04-26 | 2002-07-02 | Beaver Creek Concepts Inc | Finishing element including discrete finishing members |
JP3425894B2 (ja) * | 1999-05-27 | 2003-07-14 | ロデール ホールディングス インコーポレイテッド | 加工品の表面を平坦化する方法 |
US6234875B1 (en) * | 1999-06-09 | 2001-05-22 | 3M Innovative Properties Company | Method of modifying a surface |
JP2001100545A (ja) * | 1999-09-30 | 2001-04-13 | Ricoh Co Ltd | 中間転写体及び該中間転写体を用いた画像形成装置 |
US6257973B1 (en) * | 1999-11-04 | 2001-07-10 | Norton Company | Coated abrasive discs |
KR100394572B1 (ko) * | 2000-12-28 | 2003-08-14 | 삼성전자주식회사 | 복합특성을 가지는 씨엠피 패드구조와 그 제조방법 |
US6632259B2 (en) * | 2001-05-18 | 2003-10-14 | Rodel Holdings, Inc. | Chemical mechanical polishing compositions and methods relating thereto |
US6841480B2 (en) * | 2002-02-04 | 2005-01-11 | Infineon Technologies Ag | Polyelectrolyte dispensing polishing pad, production thereof and method of polishing a substrate |
US20040171339A1 (en) * | 2002-10-28 | 2004-09-02 | Cabot Microelectronics Corporation | Microporous polishing pads |
-
2004
- 2004-06-03 KR KR1020057022758A patent/KR101108024B1/ko active IP Right Grant
- 2004-06-03 CN CN2004800188570A patent/CN1816422B/zh not_active Expired - Lifetime
- 2004-06-03 JP JP2006515172A patent/JP4746540B2/ja not_active Expired - Lifetime
- 2004-06-03 SG SG200802604-9A patent/SG168412A1/en unknown
- 2004-06-03 SG SG2012073722A patent/SG2012073722A/en unknown
- 2004-06-03 WO PCT/US2004/017638 patent/WO2005000529A1/en active Application Filing
-
2010
- 2010-03-18 JP JP2010063374A patent/JP5448177B2/ja not_active Expired - Lifetime
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN100445037C (zh) * | 2007-09-21 | 2008-12-24 | 南京航空航天大学 | 用于化学机械抛光的分层冷冻磨料抛光垫及其制备方法 |
CN106132630A (zh) * | 2014-04-03 | 2016-11-16 | 3M创新有限公司 | 抛光垫和系统以及制造和使用此类抛光垫和系统的方法 |
CN105397609A (zh) * | 2015-11-03 | 2016-03-16 | 大连理工大学 | 一种光学零件高精度平面的修形加工方法 |
CN105397609B (zh) * | 2015-11-03 | 2017-06-27 | 大连理工大学 | 一种光学零件高精度平面的修形加工方法 |
CN110815038A (zh) * | 2018-08-08 | 2020-02-21 | 湖北鼎龙控股股份有限公司 | 抛光垫及其制备方法、应用 |
CN110815038B (zh) * | 2018-08-08 | 2021-06-04 | 湖北鼎龙控股股份有限公司 | 抛光垫及其制备方法、应用 |
Also Published As
Publication number | Publication date |
---|---|
KR101108024B1 (ko) | 2012-01-25 |
JP5448177B2 (ja) | 2014-03-19 |
SG168412A1 (en) | 2011-02-28 |
JP2010135861A (ja) | 2010-06-17 |
JP2006526902A (ja) | 2006-11-24 |
CN1816422B (zh) | 2011-06-22 |
WO2005000529A1 (en) | 2005-01-06 |
WO2005000529A8 (en) | 2005-03-17 |
SG2012073722A (en) | 2016-11-29 |
JP4746540B2 (ja) | 2011-08-10 |
KR20060017824A (ko) | 2006-02-27 |
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Address after: Illinois, USA Patentee after: CMC materials Co. Address before: Illinois, USA Patentee before: Cabot Microelectronics Corp. |
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