CN1779479A - Realization of multiple-chip parallel test for asynchronous communication chip - Google Patents
Realization of multiple-chip parallel test for asynchronous communication chip Download PDFInfo
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- CN1779479A CN1779479A CN 200410084656 CN200410084656A CN1779479A CN 1779479 A CN1779479 A CN 1779479A CN 200410084656 CN200410084656 CN 200410084656 CN 200410084656 A CN200410084656 A CN 200410084656A CN 1779479 A CN1779479 A CN 1779479A
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- asynchronous communication
- communication chip
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Abstract
A method for realizing multiple chips parallel test of asynchronous communication chip includes carrying out data sample on all tested element response as per set frequency and collecting all responded data samples, selecting proper mode to carry out data arrangement for obtaining actual response to be used to carry out on specification/ fault judgment.
Description
Technical field
The present invention relates to the method for testing in the test of large scale integrated circuit asynchronous communication chip, particularly relate to a kind of method that asynchronous communication chip is realized multicore sheet concurrent testing.
Background technology
For asynchronous communication chip, even tester sends under the situation of instruction at the same time, the response time of each detected element (DUT, Device Under Test) also can be different.As DUT1,2 among Fig. 1,3 response is the fastest and have a mistiming T4 the most slowly.Because the restriction of the design specification of existing tester and existing measuring technology can't realize simultaneously the pass/fail of a plurality of (as 8,16) chip being judged.
Summary of the invention
The technical problem to be solved in the present invention provides a kind of method to asynchronous communication chip realization multicore sheet concurrent testing, and it can realize a plurality of chips of asynchronous communication chip are tested simultaneously to greatest extent.
For solving the problems of the technologies described above, a kind of method that asynchronous communication chip is realized multicore sheet concurrent testing of the present invention, carry out data sampling by response according to certain frequency to all detected element, the data sample of all responses is adopted down, and according to the concrete condition of data sample, carry out data preparation, thereby obtain actual response, and simultaneously it is carried out pass/fail and judge.
Adopt method of the present invention can obviously shorten the test duration of chip.For example adopt general tester to test simultaneously to 4 chips.And adopt 16 with after surveying, and testing efficiency has reached 4 with about 3～4 times that survey, and it is about about 70% that this means that also the test duration of one piece of chip has shortened, and greatly reduces the testing cost of chip.
Description of drawings
Fig. 1 is the asynchrony phenomenon synoptic diagram of asynchronous communication chip response when instruction is synchronous in the prior art;
Fig. 2 uses method data sample sample area synoptic diagram of the present invention;
Fig. 3 is a test macro synoptic diagram of using the method for the invention.
Embodiment
As shown in Figure 3, adopt method of the present invention that the multicore sheet of asynchronous communication chip is carried out concurrent testing, can adopt the hardware testing system 1 that constitutes by hardware such as large-scale logic tester, automatic prober platform and application specific probe cards, and will test by software testing system 2 these hardware systems 1 of input that operating system, special test program and special test vector etc. constitute.
Tested object is an asynchronous communication chip; The number of concurrent testing can be 4/8,16/32, for example, can stick into row test simultaneously to the CPU of nearly 16 SIM (subscriber identificationmodule subscriber identification module) card or other asynchronous communications.
Described special test program has adopted the mode of all I/O terminals being carried out multi-point sampling, and the form of all response wave shapes with data collected.And adopted the mode of production of seriation, promptly to similar different series product, test procedure has very high transplantability.Described special test vector has adopted the mode of production of hardware and software platform, promptly can produce the test vector of standard according to different instructions automatically.
In test process, a plurality of detected element seals are added instruction when tester simultaneous, after waiting for a period of time, begin data sampling is carried out in the response on the I/O terminal of all detected element, the frequency of sampling can be adjusted to some extent with the difference of properties of product, but frequency is high more, and test result is accurate more.The part of band wedged bottom line belongs to sample area among Fig. 2.
After all I/O terminal samplings are finished, according to the concrete condition of data sample, sampled data is put in order, promptly can obtain correct test result.
Claims (4)
1, a kind of method that asynchronous communication chip is realized multicore sheet concurrent testing, it is characterized in that: at first, response to all detected element is carried out data sampling according to certain frequency, then, concrete condition according to data sample, carry out data processing, thereby obtain actual response, and simultaneously it is carried out pass/fail and judge.
2, a kind of method to asynchronous communication chip realization multicore sheet concurrent testing described in claim 1, it is characterized in that: the chip of concurrent testing is 4,8,16 or 32.
3, a kind of method that asynchronous communication chip is realized multicore sheet concurrent testing described in claim 1, it is characterized in that: the multicore sheet to asynchronous communication chip carries out concurrent testing, can adopt the hardware testing system that constitutes by large-scale logic tester, automatic prober platform and application specific probe card, and will import this hardware system by the software testing system that operating system, special test program and special test vector constitute and test.
4, a kind of method to asynchronous communication chip realization multicore sheet concurrent testing as claimed in claim 3, it is characterized in that: described special test vector can produce the test vector of standard automatically according to different instructions.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200410084656 CN1779479A (en) | 2004-11-26 | 2004-11-26 | Realization of multiple-chip parallel test for asynchronous communication chip |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200410084656 CN1779479A (en) | 2004-11-26 | 2004-11-26 | Realization of multiple-chip parallel test for asynchronous communication chip |
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| CN1779479A true CN1779479A (en) | 2006-05-31 |
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| CN 200410084656 Pending CN1779479A (en) | 2004-11-26 | 2004-11-26 | Realization of multiple-chip parallel test for asynchronous communication chip |
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Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102081139A (en) * | 2009-11-30 | 2011-06-01 | 上海华虹Nec电子有限公司 | Method for accurately calculating waiting time in semiconductor test |
| CN108958220A (en) * | 2018-07-03 | 2018-12-07 | 合肥通用机械研究院有限公司 | A kind of the intelligence instrument configuration software and method of fluid machinery TT&C system |
| CN109239576A (en) * | 2018-08-03 | 2019-01-18 | 光梓信息科技（上海）有限公司 | A kind of high speed optical communication chip test system and method |
| CN109361567A (en) * | 2018-11-14 | 2019-02-19 | 北京中电华大电子设计有限责任公司 | A kind of method and device of test lot product UART communication compatibility |
| CN110286314A (en) * | 2019-06-27 | 2019-09-27 | 深圳米飞泰克科技有限公司 | SCM Based asynchronous communication parallel test system and test method |
-
2004
- 2004-11-26 CN CN 200410084656 patent/CN1779479A/en active Pending
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102081139A (en) * | 2009-11-30 | 2011-06-01 | 上海华虹Nec电子有限公司 | Method for accurately calculating waiting time in semiconductor test |
| CN108958220A (en) * | 2018-07-03 | 2018-12-07 | 合肥通用机械研究院有限公司 | A kind of the intelligence instrument configuration software and method of fluid machinery TT&C system |
| CN109239576A (en) * | 2018-08-03 | 2019-01-18 | 光梓信息科技（上海）有限公司 | A kind of high speed optical communication chip test system and method |
| CN109361567A (en) * | 2018-11-14 | 2019-02-19 | 北京中电华大电子设计有限责任公司 | A kind of method and device of test lot product UART communication compatibility |
| CN109361567B (en) * | 2018-11-14 | 2020-09-15 | 北京中电华大电子设计有限责任公司 | Method and device for testing UART (universal asynchronous receiver/transmitter) communication compatibility of batch products |
| CN110286314A (en) * | 2019-06-27 | 2019-09-27 | 深圳米飞泰克科技有限公司 | SCM Based asynchronous communication parallel test system and test method |
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