CN1673725A - Ultrafast time resolution X-ray diffractometer - Google Patents

Ultrafast time resolution X-ray diffractometer Download PDF

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Publication number
CN1673725A
CN1673725A CN 200510024985 CN200510024985A CN1673725A CN 1673725 A CN1673725 A CN 1673725A CN 200510024985 CN200510024985 CN 200510024985 CN 200510024985 A CN200510024985 A CN 200510024985A CN 1673725 A CN1673725 A CN 1673725A
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China
Prior art keywords
semi
time resolution
ray diffractometer
target
sample
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Pending
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CN 200510024985
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Chinese (zh)
Inventor
陈建文
高鸿奕
李儒新
徐至展
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Shanghai Institute of Optics and Fine Mechanics of CAS
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Shanghai Institute of Optics and Fine Mechanics of CAS
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Priority to CN 200510024985 priority Critical patent/CN1673725A/en
Publication of CN1673725A publication Critical patent/CN1673725A/en
Pending legal-status Critical Current

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Abstract

An ultrafast time-resolved X-ray diffractometer characterized in that it comprises: the system comprises a femtosecond laser system, wherein a semi-reflecting and semi-transmitting medium membrane plate is arranged on a laser output light path of the femtosecond laser system, an optical delay line, a plurality of reflectors and a sample are sequentially formed by three total reflection medium membrane plates on a transmission light path of the semi-reflecting and semi-transmitting medium membrane plate, a total reflection medium membrane plate, a concave reflector, a target, a Walter (Woltermicrror) mirror and a sample are sequentially arranged on a reflection light path of the semi-reflecting and semi-transmitting medium membrane plate, the concave reflector and the target are positioned in a target chamber, and an X-ray detector is arranged in the diffraction direction of the sample. The invention can be used for researching the transient process of an object with atomic scale, the time resolution can reach the sub-picosecond magnitude, the resolution between lattice movements can reach the m magnitude, and the invention is particularly suitable for researching crystal materials and biochemical processes.

Description

Superfast time resolution X-ray diffractometer
Technical field
The present invention relates to X-ray diffractometer, a kind of X-ray diffractometer of Superfast time resolution particularly, the time resolution of this Superfast time resolution X-ray diffractometer can reach the subpicosecond magnitude, lattice mobile space resolution can reach m magnitude, has been widely used in material science and biochemical field.
Background technology
The X-ray diffractometer of Chu Shouing in the market, it all is the static diffractometer that utilizes X-ray tube to do, and the researchist that material science and biomedical sector are engaged in transient buildup, almost be to be on tiptoe to have the X-ray diffractometer of a Superfast time resolution, work goes in for the study.
Obviously, the X-ray diffractometer of a Superfast time resolution of development is very urgent, on science and technology, can capture the commanding elevation and give one a leg up in the field ahead of the curve for the scientific research personnel of China, China is had in this field scientific instrument independent intellectual property right, that high-tech content is arranged; Economically, the domestic and international market still belongs to blank at present, in case capture wide international market and home market, can obtain huge economic benefits.
Summary of the invention
The technical problem to be solved in the present invention is to overcome above-mentioned prior art deficiency, a kind of Superfast time resolution X-ray diffractometer is provided, state in order to atom moment motion in observation biochemical reaction and the physical change process, describe unstable state and short-life intermediate state, thereby can understand how intramundane secret!
Essence of the present invention is to adopt pumping-probe technique means, promptly utilize the part of femto-second laser pulse, in sample, activate a ultrafast process (this is pumping), and then produce the ultrafast process that ultrafast X ray goes to measure this activation with another part of femtosecond pulse, go the whole process of perception (this is a probe) by a series of time-delays.
Technical solution of the present invention is as follows:
A kind of Superfast time resolution X-ray diffractometer, it is characterized in that constituting of it: comprise fs-laser system, on the laser output light path of fs-laser system, establish the semi-transparent medium lamina membranacea of crossing of a half reflection, the transmitted light path that sees through the medium lamina membranacea at this semi-reflection and semi is the optical delay line that is made of three blocks of total reflection medium film plates successively, polylith catoptron and sample, cross in this semi-transflective reflective on the reflected light path of medium lamina membranacea and be followed successively by the total reflection medium film plate, concave mirror, target, Wal spy (Woltermirror) mirror and sample, described concave mirror and target are in together in the target chamber, are provided with X-ray detector in the diffraction direction of sample.
The relation of each element is as follows:
On the laser output light path of femtosecond titanium sapphire laser system, settle beam splitter, output transmission A light beam and reflection B light beam, the A light beam produces a strain field to be studied through optical delay line and catoptron and sample interaction, and this Shu Guang is called the effect light beam.
Reflection B light beam enters in the target chamber through a catoptron, by concave mirror reflection and converge and be mapped to target and get on, produce a characteristic X-ray, and special mirror enters into sample through the Wal, and detection effect light beam A produces the process of strain, and B bundle light is called detecting light beam.
Described femtosecond titanium sapphire laser system is that a radiation wavelength is that 780~820nm, pulsewidth are that 5~100fs, output energy are the desktop apparatus of 10~1000nJ.
It is a reflection 50% that described semi-reflection and semi sees through the medium lamina membranacea, see through 50% medium lamina membranacea.
Described target is movably solid target, liquid target or a gas target.
Described concave mirror is an aspherical concave mirror.
Described target chamber is a vacuum chamber, and vacuum tightness is 10 -5τ.
The special mirror in described Wal is made up of paraboloidal mirror and hyperbolic mirror.
Described sample is crystal or a biological sample to be studied.
Described X-ray detector is the CCD camera of an X ray wave band.
Technique effect of the present invention is as follows
After the femto-second laser running, incide on 45 ° of semi-transflective reflective lamina membranaceas, be divided into two-beam A and B that intensity equates.The A light beam enters into the optical delay that the total reflection lamina membranacea constitutes, and incides on the testing sample through polylith total reflective mirror 1 then.The B light beam is through a total reflection lamina membranacea, incide on the target, produce characteristic X-ray, focused on the back as detecting light beam by the special mirror in Wal, be used as with after light beam and the sample effect and produce strain, and this strain progressively constantly expands to sample interior, therefore adopt different time delay, each layer carried out conventional chromatography record, just can obtain three-dimensional strain dynamic process.
Superfast time resolution X-ray diffractometer of the present invention is compared with technology formerly, can study the transient process of the object of atomic scale, temporal resolution can reach the subpicosecond magnitude, lattice moves a resolution can reach m magnitude, be particularly suitable for the research of crystalline material and Biochemical processes, for example can study the transient state diffraction, to explore biological 26S Proteasome Structure and Function relation with this.
Description of drawings
Fig. 1 is the structure principle chart of Superfast time resolution X-ray diffractometer embodiment of the present invention.
Embodiment
See also Fig. 1 earlier, Fig. 1 is the structure principle chart of Superfast time resolution X-ray diffractometer embodiment of the present invention, as seen from the figure, constituting of Superfast time resolution X-ray diffractometer of the present invention: comprise fs-laser system 1, on the laser output light path of fs-laser system 1, establish the semi-transparent medium lamina membranacea 2 of crossing of a half reflection, the transmitted light path that sees through medium lamina membranacea 2 at this semi-reflection and semi is followed successively by via three blocks of total reflection medium film plates 3,4,5 optical delay lines that constitute, polylith catoptron 8,9,11 and sample 14, cross in this semi-transflective reflective on the reflected light path of medium lamina membranacea 2 and be followed successively by total reflection medium film plate 6, concave mirror 10, target 7, special mirror 13 in Wal and sample 14, described concave mirror 10 and target 7 are in together in the target chamber 12, are provided with X-ray detector 15 in the diffraction direction of sample 14.
Described femtosecond titanium sapphire laser system 1 is that a radiation wavelength is that 780~820nm, pulsewidth are that 5~100fs, output energy are the desktop apparatus of 10~1000nJ.
It is reflections 50% that described semi-reflection and semi sees through medium lamina membranacea 2, see through 50% medium lamina membranacea.
Described target 7 is movably solid target, liquid target or a gas target.
Described concave mirror is an aspherical concave mirror.
Described target chamber 12 is vacuum chambers, and vacuum tightness is 10 -5τ.
The special mirror 13 in described Wal is made up of paraboloidal mirror and hyperbolic mirror.
Described sample 14 is crystal or biological samples to be studied.
The CCD camera that described X-ray detector 15 is X ray wave bands.
The target 7 of present embodiment is a movably copper target, after the pulse of femto second titanium precious stone laser and its interaction, will produce characteristic X-ray K α 1And K α 2Line, corresponding radiation wavelength are 1.540562 and 1.544398 .
Said vacuum chamber 12 adopts 3 mechanical pumps and 3 diffusion pumps, can make the interior vacuum tightness of target chamber reach 5 * 10 -7The vacuum chamber of τ can be ordered in the market.
The special mirror 13 in said Wal is made up of two paraboloidal mirrors and hyperbolic mirror, and market is on sale.
The principle of work and the basic process of Superfast time resolution X-ray diffractometer of the present invention are:
Incide semi-reflection and semi through after the medium lamina membranacea 2 when the pulse of femto second titanium precious stone laser, be divided into A bundle and B bundle.After A bundle delayed line 3,4,5 of femtosecond pulse and the catoptron 8,9,11, irradiation sample 14.
B bundle femtosecond pulse enters vacuum chamber 12 through completely reflecting mirror 6 reflections, is focused into by concave mirror 10 to be mapped on the solid copper target 7, produces the K of copper α 1Line and K α 2Line, this X ray is as x-ray source, special mirror focuses on through the Wal, survey sample 14 by the strain path that the illumination of A bundle is produced later, in different time delays, take the different x-ray diffractogram, adjust lag line again, just can obtain the crystal dynamic changing process, temporal resolution can reach 2 psecs, and lattice mobile space resolution can reach milli dust spacing.

Claims (9)

1, a kind of Superfast time resolution X-ray diffractometer, it is characterized in that constituting of it: comprise fs-laser system (1), on the laser output light path of fs-laser system (1), establish the semi-transparent medium lamina membranacea (2) of crossing of a half reflection, the transmitted light path that sees through medium lamina membranacea (2) at this semi-reflection and semi is by three blocks of total reflection medium film plates (3 successively, 4,5) optical delay line of Gou Chenging, polylith catoptron and sample (14), cross in this semi-transflective reflective on the reflected light path of medium lamina membranacea (2) and be followed successively by total reflection medium film plate (6), concave mirror (10), solid target (7), special mirror (13) in Wal and sample (14), described concave mirror (10) and solid target (7) are in together in the target chamber (12), are provided with X-ray detector (15) in the diffraction direction of sample (14).
2, Superfast time resolution X-ray diffractometer according to claim 1 is characterized in that described femtosecond titanium sapphire laser system (1) is that a radiation wavelength is that 780~820nm, pulsewidth are that 5~100fs, output energy are the desktop apparatus of 10~1000nJ.
3, Superfast time resolution X-ray diffractometer according to claim 1 is characterized in that it is a reflection 50%, the medium lamina membranacea through 50% that described semi-reflection and semi sees through medium lamina membranacea (2).
4, Superfast time resolution X-ray diffractometer according to claim 1 is characterized in that described target (7) is movably solid target, liquid target or a gas target.
5, Superfast time resolution X-ray diffractometer according to claim 1 is characterized in that described concave mirror (10) is an aspherical concave mirror.
6, Superfast time resolution X-ray diffractometer according to claim 1 is characterized in that described target chamber (12) is a vacuum chamber, and vacuum tightness is 10 -5τ.
7, Superfast time resolution X-ray diffractometer according to claim 1 is characterized in that the special mirror in described Wal (13) is made up of paraboloidal mirror and hyperbolic mirror.
8, Superfast time resolution X-ray diffractometer according to claim 1 is characterized in that described sample (14) is crystal or a biological sample to be studied.
9, Superfast time resolution X-ray diffractometer according to claim 1 is characterized in that described X-ray detector (15) is the CCD camera of an X ray wave band.
CN 200510024985 2005-04-08 2005-04-08 Ultrafast time resolution X-ray diffractometer Pending CN1673725A (en)

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107796761A (en) * 2017-09-06 2018-03-13 中国科学院光电研究院 A kind of ultrafast laser pinpoints irradiation unit
CN111103311A (en) * 2019-12-12 2020-05-05 上海交通大学 Picosecond laser driven ultrafast X-ray dynamic imaging method

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107796761A (en) * 2017-09-06 2018-03-13 中国科学院光电研究院 A kind of ultrafast laser pinpoints irradiation unit
CN107796761B (en) * 2017-09-06 2020-05-05 中国科学院光电研究院 Ultrafast laser fixed point irradiation device
CN111103311A (en) * 2019-12-12 2020-05-05 上海交通大学 Picosecond laser driven ultrafast X-ray dynamic imaging method

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