CN1667584A - Motherboard function test board - Google Patents

Abstract

A motherboard function test board, used for on-line automatic comprehensive testing of motherboard functions, including a VGA and AGP conversion circuit, activated by a trigger signal for initial testing, and realized by a signal automatic switching circuit between AGP and VGA Automatic switching; an Audio test circuit, by controlling a CPLD Out0 and a CPLD Out2 signal, and respectively forming a test circuit with the main board audio source under test, to realize a comprehensive test of the main board audio circuit; a battery test circuit, which will be tested The main board battery is compared with the standard value of a battery, and the defective products with a power value lower than the standard value are screened out; a Front Panel test circuit can automatically monitor the case model, hard disk display and power supply display of the main board under test. And detection, the test results can be displayed directly on the display.

Description

Motherboard function test board

【Technical field】

The invention relates to a main board function testing device, in particular to a main board function testing board which can comprehensively test various functions of the tested main board.

【technical background】

After the main board is assembled, it needs to go through a comprehensive functional test to determine whether it is a good product, and the main board test is mainly for various errors on the main board, such as open circuit, short circuit and incorrect contact parts, etc. The condition is detected, that is, combined with the error signal data generated by the test machine and the wiring data generated by the computer-aided design of the motherboard to be tested, the maintenance personnel can quickly find out the cause of the failure of the circuit board under test on the screen, thereby saving money. Time to overhaul defective products.

Existing motherboard function testing machine is to insert a motherboard to be tested on a test board, and then connect to the slot of the connector to be tested in a manual plugging and unplugging manner through a number of cables connected to the testing machine. and chip pins to guide the test signal out. However, there are usually many components on the motherboard to be tested, and it takes a lot of labor to plug and unplug the slots connected to the components and the wiring of the chip pins one by one. And time, and workers are prone to pinch their fingers due to fatigue or misuse during long-term operation.

Later, the industry improved the above operation mode. The improvement method is to use a probe fixing board to connect the test signal of the motherboard components to be tested to an adapter board through a number of probes, and the adapter board is electrically connected to the test board. On the fixture, it can perform general tests on main components and interfaces such as the CPU (central processing unit), hard disk, and PCI (Peripheral Component Interface, peripheral device interface) slots on the motherboard to be tested. The testing of other components cannot be considered, and the poor quality of components such as audio and power supply will also affect the quality and yield of the entire motherboard, which will bring certain troubles to users. For example, if the voltage value of the power supply is lower than the standard voltage value, it will affect the setting of the CMOS value on the main board, resulting in faults such as failure to save the preset password value.

【Content of invention】

The purpose of the present invention is to provide a motherboard function test board which is easy to operate and can carry out comprehensive testing on the motherboard to be tested.

Mainboard function test board of the present invention comprises a VGA (Video Graphic Array, video graphics array) and AGP (Accelerated Graphics Port, graphics acceleration port) conversion circuit, an Audio (audio frequency) test circuit, a battery test circuit, a Serial Port ( Serial port) test circuit, a FrontPanel (panel) test circuit, an IDE2 (Integrated Drive Electronics, integrated circuit device) interface, a PCI, IDE1, SATA (Serial Advanced Technology Attachment, hard disk interface), Floppy (floppy disk drive), USB (Universal Serial Bus Universal Serial Bus) transfer interface and a network card test circuit. Wherein, the VGA and AGP conversion circuit activates the initial test by a trigger signal, and realizes automatic switching between AGP and VGA by a signal automatic switching circuit; the Audio test circuit controls a CPLD (Complex programmable Logic Device, complex formula can Programmable logic circuit) Out0 (output) and a CPLD Out2 signal, and respectively form a test circuit with the sound source of the main board under test to realize a comprehensive test of the sound source circuit of the main board; Compared with the standard value, the defective products whose power value is lower than the standard value are screened out to ensure the power supply yield of the motherboard produced; Monitoring and detection, the test results can be directly displayed on the display screen without manual observation and control.

The invention has the advantages of comprehensive detection of the functions of the tested mainboard, which improves the yield of the mainboard produced, and the realization of the test function is all automatically completed by the circuit, which saves manpower and improves work efficiency.

【Description of drawings】

The present invention will be further described below in conjunction with the embodiments with reference to the accompanying drawings.

Fig. 1 is a test schematic diagram of a motherboard function test board of the present invention.

Fig. 2 is a structural schematic diagram of the main board function test board of the present invention.

Fig. 3 (A) is the test signal conversion module of the motherboard function test board of the present invention.

Fig. 3 (B) is another embodiment of the test signal conversion module of the motherboard function test board of the present invention.

Fig. 4 is the VGA&AGP conversion circuit diagram of the motherboard function test board of the present invention.

Fig. 5 is the Front Panel test schematic diagram of the motherboard function test board of the present invention.

Fig. 6 is an Audio test circuit diagram of the motherboard function test board of the present invention.

Fig. 7 is a battery test circuit diagram of the motherboard function test board of the present invention.

【Detailed ways】

Referring to FIG. 1 , the motherboard function test board 10 performs various functional tests on a motherboard 14 to be tested through a probe fixing board 12 . When testing, at first main board 14 to be tested is placed on this probe fixed board 12, by the probe (figure not marked) on this probe fixed board 12 the signal on the main board 14 to be tested is transferred to On this motherboard function test board 10, the other side of this motherboard function test board 10 is connected with some test fixtures 16, and this test fixture 16 is the instrument, display screen etc. of some display test states and results, can be controlled by this host computer. The signals transferred from the board function test board 10 are analyzed and displayed.

Please continue to refer to Fig. 2, this motherboard function test board 10 comprises a VGA&AGP conversion circuit 20, an Audio test circuit 30, a battery test circuit 40, a Serial Port test circuit 50, a Front Panel test circuit 60, a test signal conversion Module 70 , a PCI, IDE1, SATA, Floppy, USB transfer interface 80 and a network card test circuit 90 . Wherein, the Serial Port test circuit 50, PCI, IDE1, SATA, Floppy, USB transfer interface 80 and network card test circuit 90 are used to test the performances of the main sockets of the motherboard. This IDE2 interface 72 is responsible for the signal output from the motherboard to be tested that is transferred on the motherboard function test board 10, and is converted into an I/O control signal 724 by the CPLD to convert the CPLD into an I/O control signal, and outputs To the VGA&AGP conversion circuit 20, the Audio test circuit 30, the battery test circuit 40 and the Front Panel test circuit 60 as system test signals.

Please refer to FIG. 3(A), the test signal conversion module 70 converts the motherboard signal to be tested transferred from the motherboard function test board into an I/O control signal that is conveniently processed by the test system. The test signal conversion module 70 includes a control chip 725, an input end of the control chip 725 is connected to the IDE2 interface 70, and receives a test signal from the motherboard to be tested, and the control chip 725 converts the test signal by the CPLD In order to test the I/O control signal that the test system is compatible and processed, at the same time, the other input terminal of the control chip 725 receives a device signal 722, and the device signal 722 can monitor the state of the signal output by the control chip 725 to ensure the The I/O control signal output by the control chip 725 is in a correct state, thereby ensuring the smooth progress of the entire testing process. Of course, the signal conversion function of this module can also be realized in other ways, but any module that can output the signal under test and convert it into a control signal that is easily compatible and acceptable to the test system can achieve this operation, as shown in Figure 3(B). Conversion module 70', the test signal conversion module 70' is a control chip 725' that outputs the signal to be tested through the printer interface 72' on the motherboard to be tested, and at the same time, the other input end of the control chip 725' is also connected to A device signal 722', the device signal 722' is used to monitor whether the state of the signal output by the control chip 725' is correct, so as to ensure the smooth progress of the entire test process. In the following description of the present invention, only the test signal conversion module 70 in FIG. 3(A) is used as the module for realizing the test signal conversion function.

Please continue to refer to Fig. 4, this VGA&AGP conversion circuit 20 comprises an AGP display 100, a trigger AGP_RST (Reset reset) signal 120, a signal automatic switching circuit 140, a control circuit 160, a CPLD Out5 control signal 170 and a VGA display 180 . In this circuit, the display priority is determined by the AGP_RST signal 120. If the AGP_RST signal 120 is at high level, the AGP display 100 is active, and if the AGP_RST signal 120 is at low level, the VGA display 180 is active. After the circuit is connected, the default AGP_RST signal 120 is a high level, that is, the AGP is first connected to display 100, if a graphics card is integrated on the motherboard to be tested, the AGP is prohibited from displaying 100, and the AGP_RST signal 120 is changed to a low level ; If there is no integrated graphics card on the motherboard to be tested, the AGP slot (not shown) that is inserted into the AGP graphics card is tested first. After the test is completed, the trigger AGP_RST signal 120 becomes low level, and the AGP display 100 is prohibited, meanwhile, the CPLD Out5 control signal 170 converted by the test signal conversion module 70 is delivered to the control circuit 160, the control circuit 160 is activated, and the test information carried by the CPLD Out5 is output to the signal automatically The switching circuit 140 activates the switching process to complete the switching from the AGP display to the VGA display. The VGA display 180 is valid, and the system tests the VGA display 180 .

Please refer to Figure 5, the Front Panel test circuit can complete the test of Chassis ID (chassis type), HDD LED (hard disk display) and Power LED (power supply display). This circuit is connected to a Chassis ID 610, a HDD LCD 620 and a PowerLED 640 respectively by a FrontPanel device 600, and the Chassis ID 610 is responsible for collecting the model of the main board under test, and then outputs it to a control circuit 611, the control circuit 611 Activated by an active-low write I/O control port 613, the port input information of the write I/O control port 613 comes from the test signal conversion module 70, and its output terminal is connected with a read motherboard register 615, By reading the motherboard model parameters pre-stored in the read motherboard register 615 and the matching chassis model, the chassis type matching the tested motherboard is displayed on the display screen. The HDD LED 620 is controlled and activated by an IDE1 HDD LED control signal 623, and the system sends an input value to the low-level effective write I/O control port 621 signal through the test signal conversion module 70, and then sends it to the IDE1 HDD LED control signal 623. After the IDE1HDD LED control signal 623 receives the write I/O control port 621 signal, the HDD LED signal 620 is activated for display, and then the HDD LED signal 620 is output to a control circuit 625. After the control circuit 625 is tested and compared, Send to a level detection circuit 627 again, this level detection circuit 627 is low level effective, promptly if when the test result is low level, then show that this HDD LED 620 shows normally, if when the test result is high level, Then it shows that the HDD LED 620 displays abnormally and there is a fault, and further detection is required to get rid of the fault. The Power LED 640 is activated by a write to a host board register 641. When detection is carried out to this step, the system provides the test input signal for writing the motherboard register 641 by the test signal test module 70, after the input signal is sent to the PowerLED 640, after being processed by the control comparison circuit 643, the comparison result is sent to In the level detection circuit 645, the level detection circuit 645 is also active low.

Please refer to Fig. 6, the input end of this Audio test circuit comprises a CPLD Out0 signal 300, a CPLD Out1 signal 330 and a main board sound source 320 under test, and this CPLD Out0 signal 300 and this CPLD Out1 signal 330 all come from this test signal Conversion module 70. When the CPLD Out0 signal 300 is low level, it can form a Line Out (input)/HP (Headphone earphone)-Line In (output) circuit 340 with the main board sound source 320 under test, and perform earphone operation on the main board sound source 320 under test. The test of audio frequency input/output quality aspect; When CPLD Out0 signal 300 is high level, it can form a MIC (Microphone loudspeaker)-Line In circuit 350 with tested motherboard sound source 320, carry out the loudspeaker input quality test. No matter the CPLD Out0 signal 300 is low level or high level, as long as the CPLD Out2 signal 330 is at low level, the system will process the CPLDOut2 signal 330 preferentially. When the CPLD Out2 signal 330 is low level, it will form a CD (Compact Disk)_In-Speaker loop 360 with the mainboard audio 320 under test. When the system starts to test, the initial state of the CPLD Out2 signal 330 is a high level, and the system first sets the CPLD Out0 signal 300 to a low level, so that it forms a Line Out/HP-LineIn loop with the measured motherboard sound source 320 340, then the system collects various parameters required for testing, and is output to a test loop 380 by the Line Out/HP-LineIn loop 340 for functional testing. Then, the system changes the setting of the CPLD Out0 signal 300 to a high level, so that it forms the MIC-LineIn loop 350 with the mainboard sound source 320 under test, and then the system will also collect various parameters required for testing, by The MIC-Line In circuit 350 is output to the test circuit 380 for functional testing. After the CPLD Out0 signal 300 has been processed, the system changes the level of the CPLD Out2 signal 330 from high to low, and shields the CPLDOut0 signal 300, so that it forms the CD_In-Speaker loop 360 with the mainboard sound source 320 under test, Its output is also connected to the test loop 380 for functional testing.

Please refer to FIG. 7 , the battery test circuit compares the tested motherboard battery with the system preset standard value, and screens out defective products whose voltage value is lower than the standard value, so as to achieve the purpose of testing. The battery test circuit mainly includes a battery standard value control circuit 400, a mainboard battery 410 to be tested, a CPLDOutput1 (output) control signal 430, a control circuit 450, a standard value and true value comparison circuit 470 and a CPLD Input ( Input) detection circuit 490, during testing, the output terminal of the mainboard battery 410 under test is connected to the control circuit 450, and the CPLD Output1 control signal 430 comes from the test signal conversion module 70, which serves as the activation of the control circuit 450 The signal is only valid in the state of low level. After the control circuit 450 is activated, the measured value of the motherboard battery 410 will be collected and sent to the standard value and real value comparison circuit 470. At the same time, the standard value is compared with the real value The circuit 470 will also receive the standard voltage value from the battery standard value control circuit 400, then compare the standard value with the real value and send it to the CPLD Input detection circuit 490, if the comparison value is low, the CPLD Input detection The expression result of the detection circuit 490 will be displayed as "Pass" (through), if the comparison value is high level, the expression result of the CPLD Input detection circuit 490 will be displayed as "Fail" (not passed).

Claims (8)

1. a mainboard functional test board, comprising a test signal conversion module and an Audio test circuit, is characterized in that: the test signal conversion module converts the signal of the mainboard to be tested into a control signal, including a CPLD Out0 signal and A CPLD Out2 signal, the Audio test circuit forms a Line Out/HP-Line In circuit and a MIC-Line In circuit respectively with the mainboard audio source under test by controlling the level status of the CPLD Out0 signal and the CPLD Out2 signal And a CD_In-Speaker loop, to achieve a comprehensive test of the motherboard audio circuit. 2. The motherboard function test board according to claim 1, wherein the test signal conversion module comprises a test signal output port, a control chip, a device signal and an I/O control signal. 3. The motherboard function test board according to claim 1, wherein the test signal output port is used to output the test signal of the motherboard to be tested, and output it to the control chip. 4. The motherboard function test board according to claim 1, wherein the device signal is used to monitor whether the I/O control signal output by the control chip is in a correct state. 5. The motherboard function test board as claimed in claim 1, wherein: the actuation priority of the CPLD Out2 signal in the Audio test circuit is higher than the CPLD Out0 signal, and the CPLD Out2 signal is in the Active at low level, disabled at high level. 6. The main board function test board as claimed in claim 1, characterized in that: when the CPLD Out0 signal is low level, it forms the Line Out/HP-Line In loop with the main board audio source under test. 7. The main board function test board as claimed in claim 1, characterized in that: when the CPLD Out0 signal is a high level, it forms the MIC-Line In loop with the tested main board audio source. 8. main board function test board as claimed in claim 1, is characterized in that: when described CPLD Out2 signal is low level, forms described CD_In-Speaker loop with tested main board audio source.

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