CN209803254U

CN209803254U - Touch screen aging test system

Info

Publication number: CN209803254U
Application number: CN201921949305.1U
Authority: CN
Inventors: 方雷锋; 范浩雷
Original assignee: Jiangxi United Touch Technology Co Ltd
Current assignee: Zhejiang lianxinkang Technology Co.,Ltd.
Priority date: 2019-11-13
Filing date: 2019-11-13
Publication date: 2019-12-17
Anticipated expiration: 2029-11-13

Abstract

The utility model relates to a touch-sensitive screen aging testing system, this system include IC chip, power supply interface and oscilloscope, and the IC chip includes series connection's product connection interface and functional test interface, and the product connection interface includes GND1 port, VCC1 port, SCL1 port, SDA1 port, INT1 port and RST1 port, and SCL1 port and SDA1 port are connected with the oscilloscope when being used for aging testing, the functional test interface with the same type of port one-to-one of product connection interface is connected, and functional test interface function test connects with a test equipment during the test. The utility model discloses set up product connection interface and functional test interface, distinguish aging testing experiment and functional test district, during aging testing, oscilloscope connects and confirms whether normal work of product at SCL1 port and SDA1 port, need not to be connected with test equipment, the test equipment's that significantly reduces consumption.

Description

touch screen aging test system

Technical Field

The utility model relates to an aging testing technical field especially relates to a touch-sensitive screen aging testing system.

Background

Touch screens (TP for short) are transparent products, and can complete coordinate reporting when powered on. The aging test process comprises the following steps: the TP product is operated for more than 10 days after being manufactured, whether the long-time operation of the TP product is stable in function is detected by the aid of environmental conditions such as high temperature, high humidity and the like, and the function test needs to be carried out by means of a computer and computer software to display the function condition of the TP product.

The existing TP product aging test needs to be provided with a test board to be connected to a USB interface of a computer, the aging test experiment and the functional test process are connected with the computer, a large number of computers and test boards are continuously input to complete the product functional aging test of hundreds of pieces, and the computers and the test boards generate loss after long-time work, so that the test cost of the input is very high.

SUMMERY OF THE UTILITY MODEL

An object of the utility model is to provide a touch-sensitive screen aging testing system solves current touch-sensitive screen aging testing experiment and functional test and all needs to connect the computer and lead to the too high problem of test cost.

The utility model provides a touch-sensitive screen aging testing system, including power supply interface and IC chip, the IC chip includes product connection interface and functional test interface through wire series connection, product connection interface includes GND1 port, VCC1 port, SCL1 port, SDA1 port, INT1 port and RST1 port, GND1 port ground connection, VCC1 port is connected the power supply interface, SCL1 port and SDA1 port are connected oscilloscope when being used for aging testing;

The functional test interface comprises a GND2 port, a VCC2 port, an SCL2 port, an SDA2 port, an INT2 port and an RST2 port, the functional test interface is connected with the same type ports of the product connection interface in a one-to-one correspondence mode, and the functional test interface is used for connecting test equipment during functional test.

According to the utility model provides a touch-sensitive screen aging testing system has following beneficial effect: the utility model discloses a touch-sensitive screen aging testing system sets up product connection interface and functional test interface, distinguish aging testing experiment and functional test, when carrying out aging testing experiment, oscilloscope connection confirms whether normal work of product at SCL1 port and SDA1 port, need not to be connected with test equipment, confirm the concrete function of TP product when needs, test equipment just is used for testing concrete function with functional test interface connection, above-mentioned design has saved test equipment's operating time and has reduced its loss, the test cost has significantly reduced.

Additionally, according to the utility model provides a touch-sensitive screen aging testing system can also have following additional technical characterstic:

Further, the IC chips are provided in plurality, and the IC chips are connected in parallel.

Furthermore, the SCL1 port and the SDA1 port are respectively connected with a pull-up resistor, and the two pull-up resistors are respectively connected with the power supply interface.

Further, the testing device is a computer.

Furthermore, a thimble is arranged on the function test interface and is pressed against the function test interface.

Furthermore, an I2C circuit led out from the thimble is connected with a test board, and the test board is connected with the test equipment.

Further, the power supply interface comprises a GND3 port and a VCC3 port, the GND3 port is connected with the GND1 port, and the VCC3 port is connected with the VCC1 port.

Additional aspects and advantages of the invention will be set forth in part in the description which follows and, in part, will be obvious from the description, or may be learned by practice of the invention.

Drawings

the above and/or additional aspects and advantages of the present invention will become apparent and readily appreciated from the following description of the embodiments, taken in conjunction with the accompanying drawings of which:

Fig. 1 is a schematic structural diagram of a touch screen aging test system according to an embodiment of the present invention;

Fig. 2 is a schematic circuit connection diagram of a touch screen aging test system according to an embodiment of the present invention;

FIG. 3 is a schematic diagram of a circuit connection of a touch screen aging test system according to another embodiment of the present invention

10. A power supply interface; 20. an IC chip; 30. a product connection interface; 40. a functional test interface; 50. an oscilloscope; 60. and (6) testing the equipment.

Detailed Description

In order to make the objects, features and advantages of the present invention more comprehensible, embodiments of the present invention are described in detail below with reference to the accompanying drawings. Several embodiments of the invention are given in the accompanying drawings. The invention may, however, be embodied in many different forms and should not be construed as limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete.

Referring to fig. 1 and fig. 2, an embodiment of the present invention provides a touch screen aging test system, which includes a power supply interface 10, an IC chip 20, and an oscilloscope 50.

The IC chip 20 includes a product connection interface 30 and a functional test interface 40 connected in series by a wire, the product connection interface 30 includes a GND1 port, a VCC1 port, an SCL1 port, an SDA1 port, an INT1 port and an RST1 port, the GND1 port is grounded, the VCC1 port is connected to the power supply interface 10, the SCL1 port and an SDA1 port are used for connecting the oscilloscope 50 during burn-in test, the functional test interface 40 includes a GND2 port, a VCC2 port, an SCL2 port, an SDA2 port, an INT2 port and an RST2 port, the functional test interface is connected to the similar ports of the product connection interface in a one-to-one correspondence manner, that is, the GND2 port is connected to the GND1 port, the SCL2 port is connected to the SCL1 port, and the functional test interface 40 may be connected to a test device 60 for testing the functions of the touch screen.

The utility model discloses a working process does: the power supply interface 10 supplies power for the work of the IC chip 20 by connecting a VCC1 port, a TP product to be subjected to an aging test experiment is connected to the product connection interface 30 by welding or buckling and pressing a connector, the TP product is subjected to a power-on aging test experiment, at the moment, the oscilloscope 50 is connected to the SCL1 port and the SDA1 port, the waveform signals of the SCL1 port and the SDA1 port are measured by the oscilloscope 50, whether the product normally works is confirmed by comparing the waveform signals of the existing test equipment 60 test product, in the aging test experiment process, the functional test interface 40 has a signal to pass through, if the specific function of the TP product is temporarily required to be confirmed in the aging test experiment process, the test equipment 60 is connected to the functional test interface 40, and whether the specific function of the TP product is good or not is judged by.

From the above description, the beneficial effects of the present invention are: the utility model discloses a touch-sensitive screen aging testing system sets up product connection interface 30 and functional test interface 40, distinguishes aging testing experiment and functional test, when carrying out aging testing experiment, oscilloscope 50 is connected whether normal work of product is confirmed to SCL1 port and SDA1 port, need not to be connected with test equipment 60, confirms the concrete function of TP product when needs, test equipment 60 just is connected with functional test interface 40 and is used for testing concrete function, above-mentioned design has saved test equipment 60's operating time and has reduced its loss, the test expense that has significantly reduced.

based on the above embodiments, please refer to fig. 3, an IC chip 20 according to another embodiment of the present invention has 2, and 2 IC chips 20 are connected in parallel. The utility model discloses an in other embodiments can be 3, 4, 5, even hundreds of IC chip 20 parallel connection to realize that hundreds of TP products carry out aging testing experiment and functional test simultaneously.

One power supply interface 10 supplies power to a plurality of IC chips 20 by adopting a mode of connecting the IC chips 20 in parallel, the constant current source power supply mode realizes that hundreds of TP products simultaneously carry out aging test experiments and functional tests with the lowest test cost, and the power supply voltage and current of the constant current source are adjusted according to the number of the TP products, so that the TP products connected in parallel can normally work. And the SCL, SDA, INT, RST ports between the IC chips 20 are relatively independent, and no signal crosstalk occurs.

Specifically, the SCL1 port and the SDA1 port are respectively connected to a pull-up resistor, and the two pull-up resistors are respectively connected to the power supply interface 10. The SCL1 port and the SDA1 port are respectively connected to a pull-up resistor, the two pull-up resistors are labeled as R1 and R2, and the two pull-up resistors are respectively connected to the VCC1 port to connect with the power supply interface 10.

Specifically, the testing device 60 is a computer.

Specifically, a thimble is arranged on the functional test interface 40, and the thimble is pressed against the functional test interface 40.

Specifically, an I2C line led out from the thimble is connected to a test board, and the test board is connected to the test device 60.

The thimble is pressed on the functional test interface 40, an I2C circuit led out from the thimble is connected to a test board, the test board is connected to a computer, and whether the specific function of the TP product is good or not is judged through data display of test software of the computer. In the function test process, the TP product is not required to be disassembled from the product connecting interface 30, and the function is tested by pressing the reserved function test interface 40 with a thimble to be connected to the test equipment 60, so that the test labor is saved. The test board only works during function test, so that the test board is prevented from being invested and consumed during an aging test experiment.

Specifically, the power supply interface 10 includes a GND3 port and a VCC3 port, the GND3 port is connected to the GND1 port, and the VCC3 port is connected to the VCC1 port.

To sum up, the utility model provides a pair of touch-sensitive screen aging testing system sets up product connection interface 30 and functional test interface 40, distinguishes aging testing experiment and functional test, when carrying out the aging testing experiment, oscilloscope 50 is connected whether SCL1 port and SDA1 port confirm the product and normally work, need not to be connected with test equipment 60, confirms the concrete function of TP product when needs, and test equipment 60 just is connected with functional test interface 40 and is used for testing concrete function, and test equipment 60's operating time has been saved and its loss has been reduced to above-mentioned design, the test expense that has significantly reduced.

The above-mentioned embodiments only represent some embodiments of the present invention, and the description thereof is specific and detailed, but not to be construed as limiting the scope of the present invention. It should be noted that, for those skilled in the art, without departing from the spirit of the present invention, several variations and modifications can be made, which are within the scope of the present invention. Therefore, the protection scope of the present invention should be subject to the appended claims.

Claims

1. The touch screen aging test system is characterized by comprising a power supply interface and an IC chip, wherein the IC chip comprises a product connecting interface and a function test interface which are connected in series through a conducting wire, the product connecting interface comprises a GND1 port, a VCC1 port, an SCL1 port, an SDA1 port, an INT1 port and a RST1 port, the GND1 port is grounded, the VCC1 port is connected with the power supply interface, and the SCL1 port and the SDA1 port are used for connecting an oscilloscope during aging test;

2. The touch screen burn-in test system of claim 1, wherein a plurality of said IC chips are provided, and a plurality of said IC chips are connected in parallel.

3. The touch screen aging test system according to claim 1 or 2, wherein a pull-up resistor is connected to each of the SCL1 port and the SDA1 port, and the two pull-up resistors are connected to the power supply interface.

4. The touch screen burn-in system of claim 1, wherein the test device is a computer.

5. The touch screen aging test system of claim 4, wherein a thimble is disposed on the functional test interface, and the thimble pushes against the functional test interface.

6. The touch screen aging test system of claim 5, wherein the thimble leads out an I2C line to connect with a test board, the test board being connected with the test equipment.

7. the touch screen burn-in test system of claim 1, wherein the power interface comprises a GND3 port and a VCC3 port, the GND3 port is connected with the GND1 port, and the VCC3 port is connected with the VCC1 port.