CN115129532B - Storage test equipment and hot plug test device thereof - Google Patents
Storage test equipment and hot plug test device thereof Download PDFInfo
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- CN115129532B CN115129532B CN202210910099.3A CN202210910099A CN115129532B CN 115129532 B CN115129532 B CN 115129532B CN 202210910099 A CN202210910099 A CN 202210910099A CN 115129532 B CN115129532 B CN 115129532B
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Abstract
The application discloses a storage test device and a hot plug test device thereof, which are applied to the technical field of product test and comprise: the mainboard to be tested is provided with N slots for connecting N interface cards, a switching circuit and a controller; the hot-plug adapter board is connected with the main board to be tested, the switch circuit is controlled to be in an off state after entering a test mode, and an ith level control signal is sent to the controller when an ith control instruction is received; the switch circuit is in a conducting state when in a default state so as to connect the controller and each slot position; the controller is respectively connected with the N slots, and when the ith level control signal is received, the level state of the target pin of the ith slot is controlled to perform hot plug testing on the ith slot. By applying the scheme of the application, each interface card is not required to be plugged and unplugged, the hot plug function of each interface card can be conveniently and efficiently tested, the test efficiency is improved, and the interface damage caused by repeated plugging and unplugging can be avoided.
Description
Technical Field
The invention relates to the technical field of product testing, in particular to storage testing equipment and a hot plug testing device thereof.
Background
In the field of large data volume and high-rate storage, huge bandwidth and interface quantity are required to be occupied for mass data transmission. Under the ultra-high transmission rate, the number and variety of interface cards externally supported by the equipment are increased, and the accompanying problem is how to ensure stable and reliable operation of a plurality of boards, so that the risks and problems are effectively found out in time in the research and development stage, which means that a large amount of tests are required, and the working efficiency is required to be improved while the test quality is ensured.
The "hot plug function" test of the interface card of the device is an important test item. However, as the number of interface cards supported by the storage device is large, the work efficiency is low due to the fact that the plug test is carried out one by one, the test period of the product is not facilitated to be shortened, and the development cost is increased.
In summary, how to test the hot plug function of each interface card more conveniently and efficiently is a technical problem that needs to be solved by those skilled in the art.
Disclosure of Invention
The invention aims to provide a storage test device and a hot plug test device thereof, so as to test the hot plug function of each interface card more conveniently and efficiently.
In order to solve the technical problems, the invention provides the following technical scheme:
A hot plug testing apparatus, comprising: the hot plug adapter plate and the main board to be tested are provided with N slots, a switch circuit and a controller;
the N slots are used for sequentially connecting N interface cards;
the hot-plug adapter plate is connected with the main board to be tested and is used for controlling the switch circuit to be in an off state after entering a test mode, and sending an ith level control signal to the controller when receiving an ith control instruction; n and i are positive integers, and i is more than or equal to 1 and less than or equal to N;
The switch circuit is respectively connected with the N slots and the controller and is used for: the controller is in a conducting state when in a default state, so that the controller is connected with each slot through the switch circuit;
the controller is connected with the N slots respectively and is used for: and when the ith level control signal is received, controlling the level state of a target pin of the ith slot in the N slots so as to perform hot plug testing on the ith slot.
Preferably, a first connector is arranged in the main board to be tested, and the first connector is respectively connected with the controller and the switch circuit; the hot-plug adapter plate is internally provided with a second connector and N control keys;
the second connector is connected with the first connector for: after the hot plug adapter plate enters a test mode, the switch circuit is controlled to be in an off state through the first connector; when an ith level control signal is received, the ith level control signal is sent to the controller through the first connector;
The N control keys are used for: when the ith control button is switched from a default state to a non-default state under the operation of a user, the ith control button confirms that the ith control instruction is received, and sends an ith level control signal to the second connector.
Preferably, the hot-plug adapter plate is also provided with N information prompting devices;
The N information prompting devices are sequentially connected with the N control keys, and when the ith control key is in a non-default state, the ith information prompting device connected with the ith control key outputs prompting information.
Preferably, a display device is further arranged in the hot plug adapter plate;
the display device is connected with the N control keys, and when any 1 or more control keys are in a non-default state, the numbers of the control keys in the non-default state are displayed.
Preferably, the method further comprises: n isolating switches, an isolating switch controller and a self-checking device;
the ith isolating switch is arranged between the second connector and the ith control key;
the self-checking device is used for: after the hot plug adapter plate is electrified, detecting the state of the hot plug adapter plate, and sending a self-checking passing signal to the isolating switch controller when the detection passes;
The isolating switch controller is used for: and after receiving the self-checking passing signal, controlling the isolating switches with N default states as off states to be switched into on states.
Preferably, the N isolating switches are all MOS tubes.
Preferably, the switch circuit is a switch circuit provided with an enabling end, and the hot-plug adapter plate is specifically used for: after entering a test mode, the switch circuit is controlled to be in an off state through an enabling end of the switch circuit.
Preferably, the method further comprises:
And the electrostatic protection device is arranged between the hot plug adapter plate and the controller.
Preferably, when a first connector for connecting the hot plug adapter board is disposed in the motherboard to be tested, the electrostatic protection device includes a plurality of electrostatic protection units, and 1 electrostatic protection unit is disposed on each line between the first connector and the controller.
A memory test device comprising a hot plug test apparatus as described above.
The technical scheme provided by the embodiment of the application is applied. The hot plug adapter plate is arranged to improve the working efficiency. Specifically, when the ith control instruction is received, the hot plug adapter board can send the ith level control signal to the controller in the main board to be tested, and the controller is respectively connected with the N slots, and can control the level state of the target pin of the ith slot in the N slots when the ith level control signal is received, so that the hot plug test of the ith slot is performed. According to the scheme, a worker is not required to plug the interface card, and only the hot plug adapter plate is required to be operated, so that the hot plug adapter plate receives a corresponding control instruction, and a controller in the main board to be tested can control the level state of the target pin of the corresponding slot in the N slots, namely the plug operation of the interface card is simulated, and the hot plug test of the interface card of the corresponding slot is realized. In addition, in some occasions, if the switch circuit is in a conducting state when the interface card is inserted into the slot, the corresponding pin in the slot can be pulled down all the time as long as the interface card is not pulled out, namely the controller cannot control the level state of the target pin of the slot according to the received level control signal.
In summary, in the scheme of the application, the operator does not need to insert and withdraw each interface card in sequence to test the hot plug function, but only needs to operate the hot plug adapter plate, so that the hot plug function of each interface card can be conveniently and efficiently tested, the testing efficiency is improved, and the interface damage caused by repeated insertion and withdrawal can be avoided.
Drawings
In order to more clearly illustrate the embodiments of the invention or the technical solutions in the prior art, the drawings that are required in the embodiments or the description of the prior art will be briefly described, it being obvious that the drawings in the following description are only some embodiments of the invention, and that other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
FIG. 1 is a schematic diagram of a hot plug testing device according to the present invention;
FIG. 2 is a schematic diagram of a hot plug testing device according to an embodiment of the present invention;
FIG. 3 is a schematic diagram of a hot plug testing device according to another embodiment of the present invention.
Detailed Description
The core of the invention is to provide a hot plug testing device, which is characterized in that a worker does not need to plug each interface card in sequence to test the hot plug function, but only needs to operate a hot plug adapter plate, so that the hot plug function of each interface card can be conveniently and efficiently tested, the testing efficiency is improved, and the interface damage caused by multiple plug can be avoided.
In order to better understand the aspects of the present invention, the present invention will be described in further detail with reference to the accompanying drawings and detailed description. It will be apparent that the described embodiments are only some, but not all, embodiments of the invention. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
Referring to fig. 1, fig. 1 is a schematic structural diagram of a hot plug testing device according to the present invention, where the hot plug testing device includes: the hot plug adapter board 20 and the main board 10 to be tested, wherein N slots, the switch circuit 11 and the controller 12 are arranged in the main board 10 to be tested;
The N slots are used for sequentially connecting N interface cards;
The hot plug adapter board 20 is connected with the main board 10 to be tested, and is used for controlling the switch circuit 11 to be in an off state after entering a test mode, and sending an ith level control signal to the controller 12 when receiving an ith control instruction; n and i are positive integers, and i is more than or equal to 1 and less than or equal to N;
the switch circuit 11 is connected to the N slots and the controller 12, respectively, for: the controller 12 is connected with each slot position through the switch circuit 11 when the controller is in a conducting state in a default state;
the controller 12 is connected to the N slots respectively, for: and when the ith level control signal is received, controlling the level state of the target pin of the ith slot in the N slots so as to perform hot plug testing on the ith slot.
Specifically, in the scheme of the application, the hot plug adapter board 20 is arranged, so that the hot plug function test of the main board 10 to be tested can be conveniently and efficiently performed.
The main board 10 to be tested is provided with N slots, N is a positive integer, and a specific value can be set according to needs, and in practical application, N is usually a positive integer not less than 2.
The N slots are respectively connected with N interface cards, and specific types of the interface cards can be set and selected according to needs, for example, an OCP (Open Computing Project ) interface card supporting protocols such as PCIE (PERIPHERAL COMPONENT INTERCONNECT EXPRESS, high-speed serial computer expansion bus standard) and the like.
In the scheme of the application, in order to facilitate the hot plug test, after the hot plug adapter board 20 is connected with the main board 10 to be tested, a worker only needs to operate the hot plug adapter board 20, namely the scheme of the application does not need to plug an interface card, but realizes the simulation of the 'plug interface card', thereby improving the test efficiency, and because the interface card does not need to be plugged, the interface damage caused by multiple plug can be avoided in the occasion of batch test.
It should be noted that, because the solution of the present application does not require the interface card to be plugged, in practical application, for a certain slot, the slot may not be plugged with the interface card in the whole process of performing the hot plug test, or may be plugged with the interface card all the time during the hot plug test. Of course, in more cases, in the process of hot plug testing, interface cards are always inserted into each slot.
If the interface card is always inserted into a certain slot in the process of the hot plug test, the hot plug test of the interface card is usually performed through the PRSNT pin, when the interface card is not inserted into the slot, the PRSNT pin on the slot is in a high level state, otherwise, after the interface card is inserted into the slot, the pin on the slot is grounded through the CPLD, i.e. is pulled down all the time. Therefore, in order to still realize the simulation of the 'plug-in interface card' under the condition that the interface card is always inserted into the slot positions, the application is provided with the switch circuits 11 respectively connected with the N slot positions and the controller 12.
Taking slot 1 in fig. 1 as an example, if the switch circuit 11 is not provided, after the slot 1 is inserted into the interface card, the hot plug test pin prsnt_1 of the slot 1 is grounded through the controller 12, i.e. the pin is pulled down, so that the pin level cannot be raised. The switch circuit 11 is in a conducting state when in a default state, so that the controller 12 can be connected with each slot through the switch circuit 11, that is, when hot plug testing is not performed, the switch circuit 11 is in a default conducting state, thus the original function of the main board 10 to be tested is not affected, and corresponding pins of the controller 12 can be normally connected to each slot.
When the hot plug test is needed, that is, after the hot plug adapter board 20 is connected with the motherboard 10 to be tested, the test mode can be entered, and then the switch circuit 11 is controlled to be in an off state. Because the switch circuit 11 is in an off state, the hot plug test pin prsnt_1 of the slot 1 in the above example is not pulled down all the time, so that the scheme of the present application can control the level of the pin to realize hot plug test.
When the hot plug adapter board 20 receives the ith control instruction, it indicates that the hot plug test of the ith slot is required, and thus, the ith level control signal may be sent to the controller 12. Because the simulation of the "plug interface card" needs to be implemented, in the scheme of the present application, a related circuit needs to be specially set, that is, the controller 12 needs to be connected with N slots, and it can be understood that, for example, when the controller 12 is connected with the prsnt_1 pin of the slot 1 through the pin a, the pin a can be connected with a high level or grounded under the control of the controller 12, so that the controller 12 controls the level state of the prsnt_1 pin of the slot 1 through the pin a, that is, the controller 12 can control the power-on or power-off of the slot 1, thereby implementing the hot plug test for the slot 1.
The controller 12 in the motherboard 10 to be tested according to the present application may be a CPLD (Compex Programmable Logic Device, complex programmable logic device) in general. When the controller 12 receives the i-th level control signal, it controls the level state of the target pin of the i-th slot to perform the hot plug test for the i-th slot. The target pins, i.e., pins in the ith slot that are used to indicate whether the ith slot is inserted into the interface card, e.g., prsnt_1 and prsnt_2 shown in fig. 1 are the target pins for the 1 st slot and the 2nd slot, respectively.
The level state of the target pin of the i-th slot is controlled to be either high or low, and can be set as needed, without affecting the implementation of the present invention.
For example, in one occasion, during the hot plug test, the interface card is always inserted into the 1 st slot, when the controller 12 does not control, the prsnt_1 pin is at a low level, when the controller 12 receives the 1 st level control signal, the prsnt_1 pin of the 1 st slot is controlled to be at a high level state, that is, the interface card of the 1 st slot is simulated to be pulled out, so as to realize the hot plug test for the 1 st slot. In another instance, in the hot plug test process, the 1 st slot is not plugged with an interface card all the time, when the controller 12 does not control, the prsnt_1 pin is in a high level state, when the controller 12 receives the 1 st level control signal, the prsnt_1 pin of the 1 st slot is controlled to be in a low level state, that is, the insertion of the interface card of the 1 st slot is simulated, so as to perform the hot plug test on the 1 st slot.
In addition, it should be noted that, whether the controller 12 receives the ith level control signal affects the level state of the target pin of the ith slot, so as to implement the hot plug test of the ith slot, and during the hot plug test, a worker may confirm whether the hot plug test of the ith slot is passed by observing the display lamp on the motherboard, the display lamp on the interface card, or by other setting means. For example, in the above example, when the interface card is always inserted into the 1 st slot, if the controller 12 does not control, the pin prsnt_1 is at a low level, and when the controller 12 receives the 1 st level control signal, the pin prsnt_1 controlling the 1 st slot is at a high level, that is, the interface card simulating the 1 st slot is pulled out, at this time, the indicator light on the interface card is not on, which indicates that the interface card is pulled out, and the motherboard 10 to be tested does not find any abnormality, so as to indicate that the hot plug test of the 1 st slot is passed. Otherwise, after receiving the 1 st level control signal, the operator may consider that the hot plug test of the 1 st slot fails if observing that the indicator light on the interface card is still in the on state.
The specific structure of the hot plug adapter plate 20 of the present application can be set according to actual needs, and the functions of the hot plug adapter plate 20 of the present application can be realized.
For example, in one embodiment of the present invention, referring to fig. 2, a motherboard 10 to be tested is provided with a first connector, and the first connector is connected to a controller 12 and a switch circuit 11 respectively; the hot plug adapter plate 20 is provided with a second connector and N control keys 21;
The second connector is connected with the first connector, and the second connector is used for: after the hot plug adapter board 20 enters a test mode, the switch circuit 11 is controlled to be in an off state through the first connector; upon receiving the i-th level control signal, transmitting the i-th level control signal to the controller 12 through the first connector;
The N control keys 21 are for: when the i-th control key 21 is switched from the default state to the non-default state by the user operation, it is confirmed that the i-th control instruction is received, and an i-th level control signal is transmitted to the second connector.
In this embodiment, the hot plug adapter board 20 is provided with a second connector and N control keys 21. It can be seen that the i-th control key 21 corresponds to the i-th slot. Each control key 21 may be set to a control key 21 in a default state that is a sprung state, and when the ith control key 21 is pressed by the user, that is, the ith control key 21 is switched from the default state to a non-default state under the operation of the user, the hot plug adapter board 20 at this time may be regarded as receiving the ith control instruction. At this time, since the ith control button 21 is pressed by the user, the second connector will send the ith level control signal to the first connector in the motherboard 10 to be tested, so that the controller 12 receives the ith level control signal, and further controls the level state of the target pin of the ith slot, so as to perform the hot plug test on the ith slot.
After the hot plug adapter board 20 enters the test mode, the switch circuit 11 is controlled to be in the off state by the first connector and the second connector. The triggering manner of the hot plug adapter 20 to enter the test mode may also be various, for example, if the hot plug adapter 20 is powered on and connected with the motherboard 10 to be tested, the hot plug adapter 20 automatically enters the test mode, and if the hot plug adapter 20 is not pulled out, the hot plug adapter 20 can pass through the second connector and the first connector, so as to control the switch circuit 11 to be in the off state.
The switch circuit 11 is controlled to be in the off state in various ways, and in practical application, it is considered that the control through the enabling terminal is more convenient, so that the switch circuit 11 can be the switch circuit 11 provided with the enabling terminal, and the hot-plug adapter board 20 can control the switch circuit 11 to be in the off state through the enabling terminal of the switch circuit 11 after entering the test mode. Buf_en shown in fig. 2 is the enable terminal of the switching circuit 11.
As described above, the user can determine whether the hot plug test of the corresponding slot is passed by observing whether the indicator light on the interface card is in the on state. In a specific embodiment of the present invention, considering that the slot position or the interface card in some occasions may not be provided with an indicator light, in order to enable a worker to conveniently learn the hot plug test result, the hot plug adapter board 20 may be further provided with N information prompting devices;
The N information presentation devices are sequentially connected to the N control keys 21, and when the i control key 21 is in a non-default state, the i information presentation device connected to the i control key 21 outputs presentation information.
In this embodiment, N information presentation devices are provided in the hot plug adapter board 20, and in view of cost and reliability, N LED indicator lamps may be generally selected as the N information presentation devices. Thus, when the user presses the ith control button 21, the ith information prompting device connected with the ith control button 21 is turned on to prompt the user to perform the hot plug test of the ith slot. And, if the ith information presentation apparatus is normally lighted, it may be indicated that the ith level control signal is successfully transmitted to the motherboard 10 to be tested, and it may be indicated that the corresponding line is normal. In the embodiment of fig. 2 of the present application, N information presentation devices are selected from the N LEDs 22.
In a specific embodiment of the present invention, a display device is further disposed in the hot plug adapter plate 20;
The display device is connected to the N control buttons 21, and when any 1 or more control buttons 21 are in a non-default state, the number of each control button 21 in the non-default state is displayed.
In the foregoing embodiment, N information presentation devices are provided. In this embodiment of the present invention, considering that the number of information presentation devices required is greater when the value of N is greater, this embodiment provides a single display device, which may be, for example, a display screen, so that when any 1 or more control keys 21 are in a non-default state, the display device may display the numbers of the respective control keys 21 that are currently in the non-default state, for example, the numbers of the displayed control keys 21 are 1,3,5, which indicates that the user currently presses the 1 st control key 21, the 3 rd control key 21, and the 5 th control key 21.
In one embodiment of the present invention, referring to fig. 3, the method may further include: n isolating switches 23, isolating switch controller, self-checking device;
the i-th disconnecting switch 23 is provided between the second connector and the i-th control key 21;
The self-checking device is used for: after the hot plug adapter plate 20 is electrified, detecting the state of the hot plug adapter plate 20, and sending a self-checking passing signal to the isolating switch controller when the detection passes;
the isolating switch controller is used for: after receiving the self-check passing signal, the isolating switches 23 controlling the N default states to be off states are all switched to on states.
In this embodiment, if the electrical connection between the hot plug adapter 20 and the motherboard 10 to be tested is directly opened after the hot plug adapter 20 is powered on, damage to the motherboard 10 to be tested may occur, for example, a short circuit occurs after the hot plug adapter 20 is powered on, and thus the motherboard 10 to be tested is damaged.
In this embodiment, the state of the hot plug adapter 20 is detected by the self-checking device, and of course, the specific detection mode and detection content of the self-checking device can be set and adjusted according to the need, and may depend on the specific circuit design of the hot plug adapter 20, which will not be described here.
When the detection passes, the self-checking device sends a self-checking passing signal to the isolating switch controller. When the isolating switch controller receives the self-checking passing signal, it indicates that the hot plug adapter board 20 passes the self-checking, so that the N isolating switches 23 can be controlled to be switched to the on state. It can be seen that, when the self-test is not completed or the self-test fails, the default states of the N isolation switches 23 are all off states, and the ith isolation switch 23 is disposed between the second connector and the ith control key 21, so that the situation that the motherboard 10 to be tested is damaged due to the fault of the hot-plug adapter board 20 can be effectively avoided, and the reliability of the scheme of the application is improved.
The specific type of the isolating switch 23 can be set and selected according to the needs, for example, in one specific embodiment of the present application, N isolating switches 23 can be all selected as MOS transistors, which is low in cost and small in volume. In fig. 3 of the present application, the self-test device and the isolation switch controller connected to the N isolation switches 23 are not shown.
In one embodiment of the present invention, the method may further include:
and an electrostatic protection device disposed between the hot plug adapter plate 20 and the controller 12.
In this embodiment, it is considered that the hot plug adapter board 20 needs to send a corresponding level control signal to the controller 12, and electrostatic interference may exist in the process, so an electrostatic protection device is disposed between the hot plug adapter board 20 and the controller 12, so as to eliminate the electrostatic interference, and further improve the reliability of the scheme of the present application.
Of course, the specific type and location of the electrostatic protection device may be set and selected as desired.
For example, in one embodiment of the present invention, when the first connector for connecting the hot plug adapter board 20 is provided in the motherboard 10 to be tested, the electrostatic protection device may include a plurality of electrostatic protection units 13, and 1 electrostatic protection unit 13 is provided on each line between the first connector and the controller 12. Referring to fig. 3, it should be noted that fig. 3 only shows 1 electrostatic protection unit 13 in this embodiment.
The technical scheme provided by the embodiment of the application is applied. The hot plug adapter plate 20 is provided to improve the working efficiency. Specifically, when the ith control instruction is received, the hot plug adapter board 20 may send the ith level control signal to the controller 12 in the motherboard 10 to be tested, where the controller 12 is connected with the N slots respectively, and may control the level state of the target pin of the ith slot in the N slots when the ith level control signal is received, so as to perform the hot plug test on the ith slot. It can be seen that, according to the scheme of the application, a worker is not required to plug the interface card, and only the hot plug adapter board 20 is required to be operated, so that the hot plug adapter board 20 receives a corresponding control instruction, and the controller 12 in the main board 10 to be tested can control the level state of the target pin of the corresponding slot in the N slots, namely, the plug operation of the interface card is simulated, and the hot plug test of the interface card of the corresponding slot is realized. In addition, in consideration of the present application, in some occasions, if the switch circuit 11 is in an on state when the interface card is inserted into the slot, as long as the interface card is not pulled out, the corresponding pin in the slot will be pulled down all the time, that is, the controller 12 cannot control the level state of the target pin of the slot according to the received level control signal, so in the scheme of the present application, the hot-plug adapter board 20 is connected with the motherboard 10 to be tested, after entering the test mode, the switch circuit 11 will be controlled to be in an off state, so that the pins related to the plug in each interface card will not be pulled down fixedly, that is, the target pin will not be pulled down fixedly, thereby ensuring that the hot-plug test of the present application can be executed effectively.
In summary, in the scheme of the application, the operator does not need to insert and withdraw each interface card in sequence to test the hot plug function, but only needs to operate the hot plug adapter board 20, so that the hot plug function of each interface card can be conveniently and efficiently tested, the testing efficiency is improved, and the interface damage caused by repeated insertion and withdrawal can be avoided.
Corresponding to the above embodiments of the hot plug testing device, the embodiments of the present invention further provide a storage testing apparatus, which may be referred to above in a mutually corresponding manner, and the storage testing apparatus may include the hot plug testing device in any of the above embodiments, which is not described herein.
It is further noted that relational terms such as first and second, and the like are used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Moreover, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising one … …" does not exclude the presence of other like elements in a process, method, article, or apparatus that comprises the element.
Those of skill would further appreciate that the various illustrative elements and algorithm steps described in connection with the embodiments disclosed herein may be implemented as electronic hardware, computer software, or combinations of both, and that the various illustrative elements and steps are described above generally in terms of functionality in order to clearly illustrate the interchangeability of hardware and software. Whether such functionality is implemented as hardware or software depends upon the particular application and design constraints imposed on the solution. Skilled artisans may implement the described functionality in varying ways for each particular application, but such implementation decisions should not be interpreted as causing a departure from the scope of the present invention.
The principles and embodiments of the present invention have been described herein with reference to specific examples, but the description of the examples above is only for aiding in understanding the technical solution of the present invention and its core ideas. It should be noted that it will be apparent to those skilled in the art that the present invention may be modified and practiced without departing from the spirit of the present invention.
Claims (9)
1. A hot plug testing apparatus, comprising: the hot plug adapter plate and the main board to be tested are provided with N slots, a switch circuit and a controller;
the N slots are used for sequentially connecting N interface cards;
the hot-plug adapter plate is connected with the main board to be tested and is used for controlling the switch circuit to be in an off state after entering a test mode, and sending an ith level control signal to the controller when receiving an ith control instruction; n and i are positive integers, and i is more than or equal to 1 and less than or equal to N;
The switch circuit is respectively connected with the N slots and the controller and is used for: the controller is in a conducting state when in a default state, so that the controller is connected with each slot through the switch circuit;
the controller is connected with the N slots respectively and is used for: when the ith level control signal is received, controlling the level state of a target pin of an ith slot in N slots so as to perform a hot plug test on the ith slot;
the main board to be tested is provided with a first connector which is respectively connected with the controller and the switch circuit; the hot-plug adapter plate is internally provided with a second connector and N control keys;
the second connector is connected with the first connector for: after the hot plug adapter plate enters a test mode, the switch circuit is controlled to be in an off state through the first connector; when an ith level control signal is received, the ith level control signal is sent to the controller through the first connector;
The N control keys are used for: when the ith control button is switched from a default state to a non-default state under the operation of a user, the ith control button confirms that the ith control instruction is received, and sends an ith level control signal to the second connector.
2. The hot plug testing device according to claim 1, wherein N information prompting devices are further provided in the hot plug adapter plate;
The N information prompting devices are sequentially connected with the N control keys, and when the ith control key is in a non-default state, the ith information prompting device connected with the ith control key outputs prompting information.
3. The hot plug testing device according to claim 1, wherein a display device is further provided in the hot plug adapter plate;
the display device is connected with the N control keys, and when any 1 or more control keys are in a non-default state, the numbers of the control keys in the non-default state are displayed.
4. The hot plug testing apparatus of claim 1, further comprising: n isolating switches, an isolating switch controller and a self-checking device;
the ith isolating switch is arranged between the second connector and the ith control key;
the self-checking device is used for: after the hot plug adapter plate is electrified, detecting the state of the hot plug adapter plate, and sending a self-checking passing signal to the isolating switch controller when the detection passes;
The isolating switch controller is used for: and after receiving the self-checking passing signal, controlling the isolating switches with N default states as off states to be switched into on states.
5. The hot plug testing device of claim 4, wherein the N isolation switches are MOS transistors.
6. The hot plug testing device according to claim 1, wherein the switch circuit is a switch circuit provided with an enabling terminal, and the hot plug adapter plate is specifically configured to: after entering a test mode, the switch circuit is controlled to be in an off state through an enabling end of the switch circuit.
7. The hot plug testing apparatus according to any one of claims 1 to 6, further comprising:
And the electrostatic protection device is arranged between the hot plug adapter plate and the controller.
8. The device according to claim 7, wherein when a first connector for connecting the hot plug adapter board is provided in the motherboard to be tested, the electrostatic protection device includes a plurality of electrostatic protection units, and 1 electrostatic protection unit is provided on each line between the first connector and the controller.
9. Storage test apparatus comprising a hot plug test device according to any one of claims 1 to 8.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202210910099.3A CN115129532B (en) | 2022-07-29 | Storage test equipment and hot plug test device thereof |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202210910099.3A CN115129532B (en) | 2022-07-29 | Storage test equipment and hot plug test device thereof |
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| CN115129532A CN115129532A (en) | 2022-09-30 |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112885274A (en) * | 2021-01-14 | 2021-06-01 | 苏州浪潮智能科技有限公司 | Display signal testing device and method |
| CN113742276A (en) * | 2021-08-26 | 2021-12-03 | 山东云海国创云计算装备产业创新中心有限公司 | Memory device and connection device and method of BBU (base band Unit) of memory device |
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112885274A (en) * | 2021-01-14 | 2021-06-01 | 苏州浪潮智能科技有限公司 | Display signal testing device and method |
| CN113742276A (en) * | 2021-08-26 | 2021-12-03 | 山东云海国创云计算装备产业创新中心有限公司 | Memory device and connection device and method of BBU (base band Unit) of memory device |
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