Background technology
The test jobs flow process of known motherboard as shown in Figure 1, when step S101, operating personnel are positioned over motherboard on the functional test anchor clamps, this moment, motherboard touched the microswitch on the press, made microswitch issue a signal transmitted to press, and started press; When step S102, operating personnel's both hands are pushed down the press button and are made press decline location, and this moment, motherboard was subjected to the downforce of press, and closely contacted with the functional test anchor clamps; When step S103, operating personnel press " AC power (AC the Power) " button on the press, open and will be used for the power supply unit of the computer power that the simulation framework plate need to connect under actual state; When step S104, operating personnel press functional test anchor clamps " power supply (Power) ON " button, if all normally then begin motherboard is tested, if having unusual condition then operating personnel press press " AC power " button shutdown (step S109); When step S105, judge the test result of motherboard by the program in the functional test anchor clamps, when test result when being good, then the hummer of functional test anchor clamps can give the alarm (step S106), and this moment, operating personnel pressed " data-switching (Data Switch) " button to confirm test result (step S107); When the test result of step S105 when being bad, operating personnel then directly press " data-switching " button to confirm test result (step S107).
Pressing " data-switching " button with after confirming test result (step S107), when if the test result of motherboard is " being (OK) ", then operating personnel press " F5 " on the lower keyboard with functional test anchor clamps shutdown (step S108), press press " AC power " button again, with press shutdown (step S109); If when the test result of motherboard was " not (NO) ", then operating personnel pressed press " AC power " button again after hanging up bad card on the Test Host plate, with press shutdown (step S109).
When step S110, operating personnel press press rising button, and press is risen; When step S111, operating personnel take out the Test Host plate, and affix one's seal thereon.
As shown in the above description, operating personnel are respectively when step S102, step S103, step S104, step S107, step S108, step S109 and step S110, all need press different buttons, so that carry out next step, for the staff who all is in numerous and diverse operation for a whole day, very easily produce the phenomenon of erroneous judgement, test leakage, and influence product quality.
In addition, known press formula function test system (FCT) is based on general air cushion bed, (the Function Box of test fixture on the frame, F/B) after, mode with one man operation two machines is tested, owing to be subjected to the restriction of all factors such as test mode, mode of operation, and can't effectively improve output always.
Summary of the invention
In view of this, the objective of the invention is to provide in order to address the above problem a kind of Motherboard Automatic Test Equipment and method of testing thereof, it can easy operating personnel's test action, and promoting testing efficiency increases production capacity.
Another object of the present invention provides a kind of Motherboard Automatic Test Equipment and method of testing thereof, and it can reduce test leakage, Cancellation Missed chapter, and can improve quality.
A further object of the present invention provides a kind of Motherboard Automatic Test Equipment and method of testing thereof, and it can improve the degree of stability of functional test anchor clamps.
Above-mentioned purpose of the present invention is achieved in that a kind of Motherboard Automatic Test Equipment, in order to test at least one motherboard, comprising: in order at least one functional test anchor clamps of carrying and Test Host plate, its signal according to motherboard produces test result; With at least one display device of functional test anchor clamps electric connection, in order to show the test result of motherboard; With the control device of functional test anchor clamps and display device electric connection, in order to start functional test anchor clamps and display device; And at least one hold-down devices that electrically connects with control device, the wherein lifting of control device may command hold-down devices is so that the functional test anchor clamps detect the signal of motherboard.
Motherboard Automatic Test Equipment of the present invention, it also comprises: with at least one automatic stamping device of control device electric connection, in order to affix one's seal on motherboard; With at least one inductor that control device electrically connects, in order to when hold-down devices descends, whether sensing has unusual condition; With at least one main switch of control device electric connection, in order to the start-up control device; At least one power supply unit that electrically connects with control device, the computer power that in fact connects in order to the simulation framework plate.
Motherboard Automatic Test Equipment of the present invention, its functional test anchor clamps are provided with the microswitch that electrically connects with control device, when being positioned on the functional test anchor clamps when motherboard, send signal to control device.
Motherboard Automatic Test Equipment of the present invention, its control device are the programmable controller, and hold-down devices is a press, and display device is a Debug Card.
Simultaneously, the invention provides a kind of method of testing of utilizing above-mentioned Motherboard Automatic Test Equipment, comprising: motherboard (a) is provided, motherboard is placed on the functional test anchor clamps; (b) hold-down devices is descended, so that the functional test anchor clamps can detect the signal of motherboard really; (c) display device is started; (d) the functional test anchor clamps are started, so that functional test anchor clamps Test Host plate and produce test result; (e) test result is shown on display device; And (f) hold-down devices is risen.
In addition, the invention provides a kind of method of testing of utilizing above-mentioned Motherboard Automatic Test Equipment, comprising: motherboard (a) is provided, motherboard is placed on the functional test anchor clamps, to start microswitch; (b) push main switch, to start the programmable controller; (c) press is descended, and make the functional test anchor clamps can detect the signal of motherboard really; (d) Debug Card and power supply unit are started; (e) the functional test anchor clamps are started, so that functional test anchor clamps Test Host plate and produce test result; (f) test result is shown on Debug Card; (g) automatic stamping device is started; And (h) press is risen.
Below, in conjunction with the embodiments shown in accompanying drawing, Motherboard Automatic Test Equipment of the present invention and method of testing thereof are described in further detail.
Embodiment
Below with reference to Fig. 2 Motherboard Automatic Test Equipment 10 of the present invention is described, it can be used to test several piece motherboard 20 simultaneously, in Fig. 2, is to show the embodiment that can test two motherboards simultaneously.
In this embodiment, Motherboard Automatic Test Equipment 10 is made of two functional test anchor clamps 1, two display device 2, a control device 3 and two hold-down devices 4.
Functional test anchor clamps 1 can be used to carrying and Test Host plate 20 respectively, and can produce test result according to the signal of motherboard 20; Display device 2 electrically connects with functional test anchor clamps 1, is used for showing the test result of tested motherboard 20; Control device 3 electrically connects with functional test anchor clamps 1, display device 2 and hold-down devices 4 respectively, be used for starting functional test anchor clamps 1 and display device 2, and the lifting of may command hold-down devices 4, so that functional test anchor clamps 1 can detect the signal of motherboard 20 really.
In addition, Motherboard Automatic Test Equipment 10 also comprises four inductors 5 and two main switches 6; Inductor 5 is separately positioned on the both sides of hold-down devices 4 and is positioned at the both sides, path that operating personnel send into Test Host plate 20 Motherboard Automatic Test Equipment 10, and electrically connect with control device 3, in order to rise in hold-down devices 4, when descending, whether sensing has any unusual condition, when for example operating personnel or foreign matter enter the scope of activities of hold-down devices 4, inductor 5 can send signal immediately to control device 3, makes control device 3 send signal and to hold-down devices 4 it is promptly stopped.Main switch 6 electrically connects with control device 3 respectively, in order to start-up control device 3.
With reference to Fig. 3, Motherboard Automatic Test Equipment 10 also comprises two power supply units 8 and two automatic stamping devices 9; Power supply unit 8 electrically connects with control device 3 respectively, is used for the computer power that simulation test motherboard 20 need connect actually; Automatic stamping device 9 electrically connects with control device 3, and when the test result of Test Host plate 20 was good, automatic stamping device 9 was used for affixing one's seal on motherboard 20.
In addition, functional test anchor clamps 1 are provided with the microswitch 7 that electrically connects with control device 3, when being placed on the functional test anchor clamps 1 when Test Host plate 20, send signal to control device 3, determine that motherboard 20 has been placed on the functional test anchor clamps 1, and can proceed test.
And control device 3 can be a programmable controller, and hold-down devices 4 can be a press, and display device 2 can be a Debug Card.
Referring again to Fig. 3, except functional test anchor clamps 1 are and control device 3 two-way connections, inductor 5, main switch 6, microswitch 7 and power supply unit 8 be input signal to control device 3, control device 3 then is to output signal to display device 2, hold-down devices 4 and automatic stamping device 9.
With reference to Fig. 4, method of testing of the present invention is described, when step S201, operating personnel are placed on motherboard 20 to be measured on the functional test anchor clamps 1, after motherboard 20 is positioned at the position location, promptly can start the microswitch 7 (step S202) on the functional test anchor clamps 1, determine that motherboard 20 has been placed on the functional test anchor clamps 1, and can proceed test.
When step S203, operating personnel press main switch 6 and start test, and this timed unit 3 will make hold-down devices 4 begin to descend (about 2.5 seconds, step S204) simultaneously, and priming inductor 5 (step S205); It should be noted that when if inductor detects any unusual condition hold-down devices 4 is automatic emergency stop (step S206), and after rearranging (reset, step S207), return step S203.
Then in step S208, control device 3 will make " AC power (ACPower) " conducting of hold-down devices 4, also promptly start power supply unit 8, and then control device 3 starts functional test anchor clamps 1 (step S209); When step S210, control device 3 confirms that whether power-supply controller of electric 8 is opened, and takes 30 seconds approximately; When step S211, reaffirm whether functional test anchor clamps 1 are opened, if do not open, then get back to step S208.
When step S212, control device 3 informing function test fixtures 1 begin to carry out test procedure, if test result is the words of good (pass), then export good signal to display device 2 (step S213), and make good lamp bright (step S214) on the display device 2, then control device 3 is affixed one's seal (step S215) automatic stamping device 9 on motherboard 20, and control device 3 rises (step S216) hold-down devices 4 afterwards, and makes operating personnel can take out motherboard 20 (step S217).
If test result is the words of bad (fail), then export bad signal to display device 2 (step S218), and make bad lamp bright (step S219) on the display device 2, then control device 3 makes hold-down devices 4 risings (step S219), make operating personnel can take out motherboard 20 (step S221), after operating personnel took out motherboard 20, bad lamp extinguished (step S222).
Can learn that by above-mentioned steps operating personnel are when operation Motherboard Automatic Test Equipment of the present invention, in test process, only need when step S203, press main switch 6, all the other steps all automatically perform by control device 3, and the test quality is greatly improved.
In addition, in the present embodiment, be to cooperate (can be described as two machines/station) with a control device with two hold-down devices, two device for testing functions etc., but when implementing installing, be not limited to this, can be according to factory building size, manpower requirement etc., do the design at multimachine/station, these need are made a little change with the circuit in the control device and are got final product.
Simultaneously, when step S201, operating personnel can be earlier with motherboard to be measured with after audio test fixture (audio loop back) combines, be placed on again on the functional test anchor clamps, whether the audio of Test Host plate normal so simultaneously.
Because the present invention is unit with press with multimachine/station, utilize the programmable control system to do effectively to link, press is possessed complete control system, and operating personnel's operation makes a button key into, just finish all tests, reach quick, convenient, simple test purpose.
And, because whole test system is intelligent, can clearly differentiates tested motherboard and whether test and finish, whether the bad phenomenon of quality is arranged, reach zero test leakage, do not flow out the purpose of defective products.
Have again,,, reach and reduce the purpose that manpower reduces human cost so can improve the board number of test by the cycle conversion of test duration because mode of operation is simplified.
Though the present invention with preferred embodiment openly as above; but it is not in order to limit the present invention; any the those of ordinary skill that professional domain is interior; in not breaking away from design of the present invention and scope; when can doing suitable change and retouching, so protection scope of the present invention is when being as the criterion with claim institute restricted portion.