CN1661382A

CN1661382A - Testing apparatus

Info

Publication number: CN1661382A
Application number: CN 200410005960
Authority: CN
Inventors: 李中山; 杨清雨; 许进利
Original assignee: Asustek Computer Inc
Current assignee: Asustek Computer Inc
Priority date: 2004-02-23
Filing date: 2004-02-23
Publication date: 2005-08-31

Abstract

The present invention relates to a testing device. It includes a carrier plate and a first stopper, said first stopper has a first slide-connecting surface, a first side surface and a stopper top surface, in which the first slide-connecting surface is connected with first said surface and stopper top surface, and the height of the first slide-connecting surface and first side surface connected to first cross-connected line relatively to said carrier plate is equal to the height of a circuit board.

Description

Testing apparatus

Technical field

The present invention relates to a kind of Testing apparatus, particularly a kind of Testing apparatus that is used for locating circuit board.

Background technology

Along with the progress of electronics technology, common people are also more and more higher to the requirement of appliance and electronic on quality and price.For produce best in quality and on price competitive electronic product, electronic product manufacturer is except continuous research and development premium quality product, and does before product export outside the accurate complete test, more is devoted to seek how to increase production capacity and reduce cost.

As mentioned above, after a circuit board making is finished, must test circuit board, with testing circuit plate defectiveness whether, and the first step of testing promptly is with circuit board to be measured, is placed on the support plate in the Testing apparatus, locating circuit board.

Please refer to shown in Figure 1ly, Testing apparatus 1 is seated in tester table 7, and it comprises a utensil main body 11, a support plate 12, at least one first block 13 and at least one second block 14.Utensil main body 11 more comprises one first test cell 111, one second test cell 112 and several probes 113.Support plate 12 has several through holes 121, and is arranged at the top of first test cell 111.Second test cell 112 is arranged at the top of support plate 12.Second test cell 112 more comprises a location-plate 1121 and a test board 1122, and wherein location-plate 1121 is linked to tester table 7; And test board 1122 is arranged at location-plate 1121 belows, the top of support plate 12.Probe 113 is arranged on the test board 1122 and first test cell 111, and in order to contact with electronic component 22 on the circuit board 2, testing electronic element 22 functions have no abnormal.

First block 13 is a cube shaped, it comprise one with contacted first side 131 of the plate side 21 of circuit board 2 and a block end face 132 vertical with first side 131.Testing apparatus 1 more comprise at least one first screw, 15, the first blocks 13 have at least one first the perforation 133, the first the perforation 133 penetrate first block, 13, the first screws 15 penetrate first the perforation 133, so that first block 13 is fixed on the support plate 12.The structure of second block 14 and set-up mode are all identical with first block, its have one with plate side 21 contacted second sides 141 of circuit board 2, and have one second perforation, 142, one second screws 16 and penetrate second perforation 142 so that second block 14 is fixed on the support plate 12.

Because first block 13 and second block 14 be restricting circuits plate 2 mobile in different directions respectively, so after second side 141 of first side 131 of circuit board 2 and first block 13 and second block 14 contacted, circuit board 2 promptly was positioned on support plate 12.

After circuit board 2 is had good positioning, start tester table 7, the press of tester table 7 can press down, make second test cell 112 move closer to the support plate 12 and first test cell 111, and then probe 113 is contacted to test with electronic component 22 on the circuit board 2, wherein, be arranged at the probe 113 of first test cell 111, the through hole 121 that must pass on the support plate 12 could contact with the electronic component 22 on the circuit board 2.Ifs circuit plate 2 location are inaccurate, and then probe 113 can't positively contact with electronic component 22, also just can't accurately measure the state of circuit board 2.

In above-mentioned prior art, because the spacing of the position that first block 13 and second block 14 are set is big, makes when placing circuit board 2, need expend more time alignment circuit plate 2 the position that should put, this makes increase positioning time, reduces production capacity.Simultaneously,, in the process of test, very easily cause the damage of circuit board 2, increase cost of products also because be difficult to locate exactly.

As mentioned above, how providing a kind of utensil of locating circuit board fast and accurately is one of current important topic in fact.

Summary of the invention

Because above-mentioned problem the objective of the invention is to overcome the deficiencies in the prior art and defective, provide a kind of utensil of locating circuit board fast and accurately.

For reaching above-mentioned purpose, the invention provides a kind of utensil, comprise a support plate and at least one first block.First block is arranged on the support plate, its have one with contacted first side of plate side, the orthogonal block end face in one and first side, and one first slip face, and first slip face and be connected with first side and block end face.

First slips face slips to first side circuit board, and first side and first slips the first handing-over line that face the joins height with respect to support plate, can equal the height of circuit board in fact.

Utensil can more comprise at least one first screw, and first block can have at least one first perforation that penetrates first block simultaneously.First screw penetrates first perforation, so that first block is fixed on the support plate.When first screw unclamped, first block can move with respect to support plate on support plate.

Utensil can more comprise one second block.This second block comprises one second and slips face and one second side, and second slips face slips to support plate circuit board, and circuit board is contacted with second side.First side of second side and aforementioned first block is restricting circuits plate moving on support plate in different directions.In addition, with first block similarly, the-two handing-over lines that face the joins height with respect to support plate is slipped in second side and second, also can equal the height of circuit board in fact.

From the above, because in utensil of the present invention, first block has first and slips face, therefore can put more quickly and accurately and locating circuit board than prior art.

Description of drawings

Fig. 1 is a stereographic map of existing Testing apparatus;

Fig. 2 is the stereographic map according to the utensil of preferred embodiment of the present invention;

Fig. 3 A is the side view according to the block of preferred embodiment of the present invention;

Fig. 3 B is the opposite side view according to the block of preferred embodiment of the present invention;

Fig. 4 A is the stereographic map according to the block of preferred embodiment of the present invention;

Fig. 4 B is another stereographic map according to the block of preferred embodiment of the present invention;

Fig. 5 A is another synoptic diagram according to the block of preferred embodiment of the present invention;

Fig. 5 B is another synoptic diagram according to the block of preferred embodiment of the present invention;

Fig. 6 is the stereographic map according to the tester table of preferred embodiment of the present invention and utensil.

Symbol description among the figure

1 Testing apparatus

11 utensil main bodies

111 first test cells

112 second test cells

1121 location-plates

1122 test boards

113 probes

12 support plates

121 through holes

13 first blocks

131 first sides

132 block end faces

133 first perforation

14 second blocks

141 second sides

142 second perforation

15 first screws

2 circuit boards

21 plate sides

22 electronic components

3 utensils

31 support plates

32 first blocks

321 first slip face

322 first sides

323 block end faces

324 first handing-over lines

325 first perforation

33 first screws

34 second blocks

341 second sides

4 circuit boards

41 plate sides

5 circuit boards

51 electronic components

6 tester tables

61 utensil main bodies

611 first test cells

612 second test cells

613 probes

6121 location-plates

6122 test boards

62 support plates

63 first blocks

631 first slip face

7 tester tables

Embodiment

Hereinafter with reference to relevant drawings, the utensil according to preferred embodiment of the present invention is described, wherein components identical will be illustrated with identical reference marks.

Please refer to shown in Figure 2ly, comprise a support plate 31 and at least one first block 32 according to the utensil 3 of the embodiment of the invention.Support plate 31 is in order to carry a circuit board 4 that comprises at least one plate side 41.

First block 32 is arranged on the support plate 31, and has one first and slip face 321, one and plate side 41 contacted first sides 322 of circuit board 4, and one and first side, 322 orthogonal block end faces 323.First slips face 321 is positioned at first block 32, and is connected with first side 322 and block end face 323.First block 32 more comprises one first handing-over line 324, and it is first to slip the junction that face 321 and first side 322 join.

Utensil 3 more comprises at least one first screw 33.First block 32 has at least one first perforation 325, and first perforation 325 penetrates first block 32; First screw 33 penetrates first perforation 325, and first block 32 is fixed on the support plate 31.

Circuit board 4 had been fixed on the support plate 31 o'clock, big young pathbreaker first block 32 according to circuit board 4 is positioned on the support plate 31 earlier, passes first with first screw 33 again and bores a hole 325, and first block, 32 spiral shells are located on the support plate 31.Then, circuit board 4 is slipped face 321 near first, make circuit board 4 be able to slip face 321 along with first, slide on the support plate 31 apace, and contact with first side 322.

First to slip face 321 be an inclined-plane as shown in Figure 3A, or be depicted as a curved surface as Fig. 3 B.

Utensil 3 more comprises to shape, structure and the method to set up of one second block, 34, the second blocks 34 and all is same as first block 32.Because first block 32 and second block 34 be restricting circuits plate 4 mobile in different directions respectively, so after second side 341 of first side 322 of first block 32 and second block 34 and circuit board 4 contacted, circuit board 4 promptly was positioned on support plate 31.

First block 32 is depicted as a rectangle as Fig. 4 A, or is depicted as one L shaped as Fig. 4 B.Please refer to shown in Fig. 5 A and Fig. 5 B, when first block 32 be shaped as rectangle the time, first block 32 and second block 34 are arranged on the support plate 31 simultaneously, this two

block

32,34 is adjacent and have angle, and this angle is the right angle.In addition, please refer to shown in Fig. 4 B, when first block 32 when being L shaped, first block 32 itself promptly has a right angle.Therefore when putting circuit board 4, slipped face 321 along first by being allowed circuit board 4 slides with first side 322 and contacts, and because the first handing-over line 324 equals the height of circuit board 4 in fact with respect to the height of support plate 31, circuit board 4 is able to accurately slip to support plate 31 rapidly.In addition, when first block 32 when being L shaped, the position that is provided with of second block 34 can be according to required and adjust.

Please refer to shown in Figure 6ly, comprise a utensil main body 61, a support plate 62 and one first block 63 according to the tester table 6 of preferred embodiment of the present invention.First block 63 is arranged on the support plate 62, and has one first and slip face 631.Utensil main body 61 more comprises one first test cell 611 and one second test cell 612 and several probes 613, and support plate 62 is arranged at the top of first test cell 611, and second test cell 612 is arranged at the top of support plate 62.Second test cell 612 more comprises a location-plate 6121 and a test board 6122, and wherein location-plate 6121 is linked to utensil main body 61; Test board 6122 is arranged at location-plate 6121 belows, support plate 62 tops.

Because employed support plate 62, first block 63 and first slip face 631 in the present embodiment, its structure, set-up mode and effect are all identical with mentioned person in the aforementioned utensil 3, do not repeat them here; Only, because as previously mentioned, have first on first block 63 and slip face 631, it is more easy that the location of circuit board 5 becomes, make second test cell 612 when pressing down, probe 613 can contact with the electronic component 51 of circuit board 5 more accurately, also could measure whether defectiveness of circuit board 5 accurately.Certainly, utensil main body 61 also can for example only have second test cell 612 or first test cell 611 or the like according to required and adjust.

The above only is an illustrative, but not is restricted.Anyly do not break away from spirit of the present invention and category, and, all should be contained in the scope of claims its equivalent modifications of carrying out or change.

Claims

1. a utensil is used to locate a circuit board, and this circuit board more comprises at least one plate side, it is characterized in that, this utensil comprises:

One support plate, in order to carry this circuit board, this plate side is perpendicular to this support plate; And

One first block, it is arranged on this support plate, this first block have one with contacted first side of this plate side, one with the orthogonal block end face in this first side, reach one first and slip face, this first slips face between this first side and this block end face, and is connected with this first side and this block end face.

2. utensil as claimed in claim 1, wherein, this first side and this first slips one first handing-over line that face the joins height with respect to this support plate, equals the height of this circuit board in fact.

3. utensil as claimed in claim 1, wherein, this first slips face this circuit board is slipped to this first side.

4. utensil as claimed in claim 1, wherein, this first angle that slips face and this first side is an obtuse angle.

5. utensil as claimed in claim 1, wherein, first to slip face be a curved surface or an inclined-plane for this.

6. utensil as claimed in claim 1, wherein, this first block is a rectangle or L shaped.

7. utensil as claimed in claim 1, wherein, this utensil more comprises one second block, this second block more comprises one second and slips face and one second side, this first side and this second side are adjoining mutually, and this second slips face and make this circuit board slip to this support plate and this circuit board is contacted with this second side.

8. utensil as claimed in claim 7, wherein, this second side and this second slips one second handing-over line that face the joins height with respect to this support plate, equals the height of this circuit board in fact.

9. utensil as claimed in claim 7, wherein, this first side and this second side are orthogonal.

10. utensil as claimed in claim 7, wherein, this second angle that slips face and this second side is an obtuse angle.