CN104345182B - A kind of multistation test fixture - Google Patents
A kind of multistation test fixture Download PDFInfo
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- CN104345182B CN104345182B CN201410593557.0A CN201410593557A CN104345182B CN 104345182 B CN104345182 B CN 104345182B CN 201410593557 A CN201410593557 A CN 201410593557A CN 104345182 B CN104345182 B CN 104345182B
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- 238000012360 testing method Methods 0.000 title claims abstract description 48
- 239000000523 sample Substances 0.000 claims abstract description 203
- 230000007246 mechanism Effects 0.000 claims description 4
- 230000002093 peripheral effect Effects 0.000 claims description 2
- 238000000034 method Methods 0.000 abstract description 5
- 230000008569 process Effects 0.000 abstract description 5
- 230000006835 compression Effects 0.000 description 3
- 238000007906 compression Methods 0.000 description 3
- 238000013461 design Methods 0.000 description 3
- 230000017525 heat dissipation Effects 0.000 description 3
- 238000012216 screening Methods 0.000 description 3
- 238000003491 array Methods 0.000 description 2
- 239000000919 ceramic Substances 0.000 description 2
- 239000002131 composite material Substances 0.000 description 2
- 230000006872 improvement Effects 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 230000009471 action Effects 0.000 description 1
- 230000032683 aging Effects 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000002146 bilateral effect Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000000149 penetrating effect Effects 0.000 description 1
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Abstract
The invention discloses a kind of multi-station clamp for testing, the fixture includes upper probe card, lower probe card, sample panel；Wherein, upper probe card sets upper probe array, lower probe card sets lower probe array, sample panel is arranged between probe card and lower probe card, some station grooves for loading sample to be tested are provided with, the probe set on upper and lower probe array is used to contact sample realization test, and station groove is being divided into Sample location counterbore and vertical through hole two parts on the direction of the sample panel, Sample location counterbore is used to load sample, and probe contacts the sample through vertical through hole.According to the present invention, high-volume test can be carried out to the sample strip of different shape size, reduce reviewer's batch labour intensity repeatedly in feeding process, simple structure, dependable performance, testing efficiency is high.
Description
Technical Field
The invention belongs to the field of test clamps, and particularly relates to a multi-station test clamp.
Background
In order to ensure the accuracy and reliability of the electrical parameters of the electrical elements, particularly for the thermosensitive and pressure-sensitive ceramic elements widely used at present, the voltage-resistant life, the current-time characteristic, the aging characteristic and the like of finished products must be tested, and the quality of the products can be more quickly distinguished only by high testing efficiency in industrial mass production, so that the quality of the products is improved.
Taking a PTCR (thermal ceramic resistor) manufacturer as an example, a large batch of tests are currently completed by adopting a plurality of test devices, a plurality of test fixtures and a plurality of clamping modes, but the mode has the disadvantages of more input devices, high cost and low efficiency. Particularly, the daily average output of part of manufacturers reaches more than one million sheets, and the test fixture of a single device only has dozens of work positions, so that the material loading and unloading must be frequently carried out during use, the efficiency is low, and the labor intensity of detection personnel is high. Meanwhile, the existing clamp structure is used for testing samples with different sizes, different special clamps are needed, the universality is poor, and the disassembly and the maintenance are complicated.
Disclosure of Invention
Aiming at the defects or the improvement requirements in the prior art, the invention provides a multi-station test fixture, which aims to solve the technical problem of improving the density of test units on the premise of ensuring that the volume of test equipment is not changed by arranging 512 station interfaces on a sample group plate and an upper fixture and a lower fixture, and improve the mass test efficiency and the universality of the fixture for sample plates with different shapes.
To achieve the above objects, according to one aspect of the present invention, there is provided a multi-station test fixture, characterized in that the fixture comprises an upper probe plate, a lower probe plate, a sample plate; wherein,
the upper probe plate is provided with an upper probe array, the lower probe plate is provided with a lower probe array, the sample plate is arranged between the upper probe plate and the lower probe plate, a plurality of station grooves for loading samples to be tested are arranged on the sample plate, and probes arranged on the upper probe array and the lower probe array are used for contacting the samples to realize testing;
the work station groove is divided into a sample positioning counter bore and a vertical through hole in the direction perpendicular to the sample plate, the sample positioning counter bore is used for loading a sample, and the probe penetrates through the vertical through hole to contact the sample.
Furthermore, the positioning counter bore is a universal counter bore, namely the shape and the contour of the counter bore are the contours of a plurality of samples in different shapes, so that the samples in different shapes can be placed in the positioning counter bore.
Furthermore, the corner edges around the sample plate are provided with positioning through holes for matching with positioning columns to support the sample plate, the positioning columns are sleeved with limiting springs, and one end of each limiting spring is in contact with the bottom of the sample plate.
Further, the distance between the lower probe plate and the sample plate is used for keeping a heat dissipation effective gap between the lower part of the sample and the sample plate in a clamping state.
Further, the upper probe plate is contacted with the sample plate through a limiting strip, and the height of the limiting strip can be adjusted, so that the distance between the lower probe plate and the sample plate can be adjusted.
Further, the diameter of the vertical through hole is 2-5mm larger than that of the probe.
Further, the depth of the positioning counter bore is larger than the thickness of the samples and does not exceed the thickness of two samples.
Further, the range of the effective gap is 1-2mm for the sample to emerge from the upper plane of the positioning counter bore.
Furthermore, the opening part of the positioning counter bore is processed with an inclined plane and is in a horn shape.
Further, the angle of the slope ranges from 30 ° to 60 °.
In general, compared with the prior art, the above technical solution contemplated by the present invention can achieve the following beneficial effects:
(1) the working position groove on the sample plate is improved and divided into two parts, one part is used for loading a sample, and the other part is used for accommodating a supported probe, so that the sample can be suspended for an effective distance under the action of the probe, the heat dissipation in the sample testing process can be obviously improved, and the stability is improved;
(2) the positioning counter bore in the station groove for placing the sample is improved into a universal counter bore, so that the universality of the sample plate can be improved, one sample plate can be matched with multiple test samples, and the levelness and position errors generated by testing by using multiple sample plates in the test process are reduced;
(3) the inclined plane is further added to the positioning counter bore to enable the positioning counter bore to be in a horn shape, so that the feeding and working position groove of the sample and the screening of redundant samples are easier, and the testing efficiency is further improved.
In a word, the multi-station sample plate disclosed by the invention can be used for testing sample pieces with different shapes and sizes in a large scale, the labor intensity of inspectors in the batch repeated feeding process is reduced, the structure is simple, the performance is reliable, and the testing efficiency is high.
Drawings
FIG. 1 is a front view of a multi-station fixture according to the present invention;
FIG. 2 is a top plan view of a sample plate cross-section of a multi-station fixture according to the present invention;
FIG. 3 is a top view of a sample plate with a universal counterbore of a multi-station fixture according to the present invention;
figure 4 is a schematic view of the multi-station fixture assembled with a test instrument according to the present invention.
The same reference numbers will be used throughout the drawings to refer to the same or like elements or structures, wherein:
1-positioning column 2-limiting strip 3-upper probe plate 4-upper probe array 5-lower probe array 6-lower probe plate 7-sample plate 8-positioning pin 9-spring 10-upper probe end 11-sample 12-lower probe end 13-station groove 14-positioning through hole 15-handheld hole 16-sample basic unit 17-positioning counter bore 18-vertical through hole 19-universal counter bore 20-composite outline counter bore
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention is described in further detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention. In addition, the technical features involved in the embodiments of the present invention described below may be combined with each other as long as they do not conflict with each other.
Example 1
Referring to fig. 1-3, the invention discloses a bilateral symmetry structure design, the clamp main body comprises a sample plate 7, an upper probe plate 3 and a lower probe plate 6, positioning through holes 14 penetrating through the sample plate are arranged at the peripheral corners of the sample plate 7, the positioning through holes 14 are matched with positioning columns 1 at two sides, springs 9 are arranged on the positioning columns 1 and are contacted with the bottom of the sample plate 7, the positioning columns and the sample plate 7 are in concentric fit, one end of each spring 9 is contacted with the sample plate 7, a buffer stroke can be achieved, and the lower probes are protected from overlarge impact force.
The lower probe plate 6 is fixedly supported by a positioning pin 8, wherein the upper probe plate 3 can be connected with a driving mechanism to realize the pressing-in of the probe in the test and the removal of the probe after the test.
When the device works, the upper probe plate 3 and the lower probe plate 6 are respectively welded with the upper probe array 4 and the lower probe array 5, the station grooves 13 and the upper and lower probe arrays of the sample plate are uniformly distributed along the plane in the horizontal direction, the length and the width of the basic unit 16 are 25mm by 25mm, the station grooves and the probe arrays are concentrically matched in the vertical direction, and when the driving mechanism drives the upper probe plate 3 to move downwards, the upper and lower probe end parts 10 and 12 are used for clamping the sample 11 and realizing the signal test of the sample 11.
Example 2
The upper probe plate is optimized on the basis of the embodiment 1, and specifically, the upper probe plate 3 is in contact with the upper surface of the sample plate 7 through the limiting strips 2, the distance between the upper probe plate 3 and the sample plate 7 is adjusted by changing the heights of the limiting strips, so that the sample plate 7 is pressed down or lifted up through the height adjustment of the limiting strips 2, the distance between the lower probe plate 6 and the sample can be adjusted, the sample 11 is accurately jacked and suspended in a clamped state, an effective gap is reserved between the sample plate and the sample 11, the sample can protrude out of the upper plane of the positioning counter bore 17 by 1-2mm due to the range of the effective gap, the condition that the sample 11 is separated from the sample plate 7 can be observed conveniently, and the heat dissipation performance of the bottom of the sample 11 is improved.
Example 3
The structure is added on the basis of the embodiment 2, the station groove 13 is divided into a vertical through hole 18 and a positioning counter hole 17, a sample to be tested can be placed on the positioning counter hole 17, a probe on the lower probe plate 7 penetrates through the vertical through hole 18 to be contacted with the sample 11, the diameter of the vertical through hole is 2-5mm larger than that of the probe, and the faults such as short circuit and the like caused by the fact that the sample falls into the lower probe plate through the through hole after being smashed are prevented.
As shown in fig. 3, the positioning counter bore 17 is modified into a universal counter bore 19, wherein the universal counter bore 19 is designed to be a composite outer contour 20 after stacking three samples, a round test sample and a rectangular test sample with two sizes can be placed, and under the condition that the basic unit size of 25mm × 25mm is met, the rectangular sample slots in the universal counter bore 19 are arranged as follows: the long sides of the rectangular dimension should be arranged as much as 45 ° of the angle between a and b, i.e. along the diagonal of the basic unit.
Example 4
The present embodiment adds the following structure to embodiment 3: a circumferential reverse bevel edge of 30-60 degrees is circumferentially arranged on the positioning counter bore 17 in the upper end face of the sample plate, so that the positioning counter bore is horn-shaped.
In this embodiment, considering that for the convenience of loading, the depth of the positioning counter bore 17 of the sample plate must be slightly greater than the thickness of the sample and not greater than the thickness of two samples, if the depth of the positioning counter bore is less than the thickness of the sample, a part of the sample emerges, a new groove for limiting the sample is formed, and the difficulty of loading and screening materials is caused, if the depth of the positioning counter bore is greater than the thickness of two samples, a plurality of samples are easily stacked in the positioning counter bore of a single station, and in order to ensure that the single station corresponds to a single sample in the loading process, a 30-60-degree bevel edge is processed at the circumferential position according to the difference of the thicknesses of the positioning counter bores on the upper end face of the sample plate, and redundant sample pieces can be screened out of the station groove 13 under the external.
Example 5
The present embodiment adds the following structure to embodiment 1: the front side of the sample plate 7 is provided with a plurality of hand-held holes 15, wherein the hand-held holes can be used for screening out redundant samples in a hand-held manner and can be used for fixing the sample plate 7.
Example 6
In the present embodiment, the probe ends 10 and 12 and the position-limiting strips 2 are optimized based on the above embodiments, specifically, compressible elastic members are disposed in the upper and lower probe ends 10 and 12, and the height of the position-limiting strips 2 is set to be lower than the height of the probes.
In the embodiment, the upper probe array 4 is firstly contacted with the sample 11, the end part 10 of the upper probe generates a certain amount of compression due to the height limitation of the limiting strip, and the sample 11 before clamping can be well fixed by the structural design; further driving the upper probe plate 3 to move downwards, and then contacting and matching with the end part 10 of the upper probe to clamp a sample; when the stroke reaches the end, the compression of the lower probe is maximized so that a certain effective gap is created between sample 11 and sample plate 7, i.e. sample 11 is detached from sample plate 7. Through the structural design of the limiting strip 2 and the probe, the fixture can progressively clamp a sample, and the clamping reliability and the testing accuracy are improved.
The elastic parts of the probe ends 10 and 12 are springs, the height of the limiting strip 2 is 2-4mm lower than that of the probe, namely the compression amount of the probe is 2-4 mm.
It will be understood by those skilled in the art that the foregoing is only a preferred embodiment of the present invention, and is not intended to limit the invention, and that any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the scope of the present invention.
Claims (10)
1. A multi-station test fixture is characterized by comprising an upper probe plate (3), a lower probe plate (6) and a sample plate (7); wherein,
the upper probe plate (3) is provided with an upper probe array (4), the lower probe plate (6) is provided with a lower probe array (5), the sample plate (7) is arranged between the upper probe plate (3) and the lower probe plate (6), a plurality of station grooves (13) for loading a sample (11) to be tested are arranged on the sample plate, and probes arranged on the upper probe array (4) and the lower probe array (5) are used for contacting the sample (11) to realize testing; the upper probe board (3) is connected with a driving mechanism to press in a probe during testing and move away the probe after testing, and when the driving mechanism drives the upper probe board (3) to move downwards, the upper probe array (4) and the lower probe array (5) clamp the sample (11) and realize signal testing of the sample (11);
the work station groove (13) is divided into a sample positioning counter bore (17) and a vertical through hole (18) in the direction perpendicular to the sample plate (7), the sample positioning counter bore (17) is used for loading a sample (11), and the probe penetrates through the vertical through hole (18) to contact the sample (11).
2. A multi-station test fixture as claimed in claim 1, wherein the positioning counter bore (17) is a universal counter bore, i.e. the shape and contour of the counter bore is the contour (20) of a plurality of samples with different shapes stacked on each other, so that the samples with different shapes can be placed in the positioning counter bore (17).
3. A multi-station test fixture as claimed in claim 1 or 2, wherein the peripheral corner edges of the sample plate (7) are provided with positioning through holes (14) for supporting the sample plate (7) by matching with the positioning posts (1), and the positioning posts (1) are sleeved with limiting springs (9) with one ends contacting with the bottoms of the sample plates (7).
4. A multi-station test fixture as claimed in claim 3, wherein the spacing between the lower probe plate (6) and the sample plate (7) is such that in the clamped condition a thermally effective gap is provided between the lower part of the sample (11) and the sample plate (7).
5. A multi-station test fixture as claimed in claim 4, wherein said upper probe card (3) is in contact with the sample plate (7) via a stop bar (2), the height of said stop bar (2) being adjustable so as to adjust the spacing between the lower probe card plate (6) and the sample plate (7).
6. A multi-station test fixture as claimed in claim 3, in which the vertical through-hole has a diameter 2-5mm greater than the diameter of the probe.
7. A multi-station test fixture as claimed in any one of claims 4 to 6, wherein the depth of the locating counterbore (17) is greater than the thickness of a sample (11) and does not exceed the thickness of two samples (11).
8. A multi-station test fixture as claimed in claim 4, wherein said effective clearance is in the range of 1-2mm for said specimen (11) to emerge from the upper plane of said locating counterbore (17).
9. A multi-station test fixture as claimed in claim 7, wherein the opening of the locating counterbore (17) is beveled and flared.
10. A multi-station test fixture as claimed in claim 9, wherein the angle of the ramp is in the range of 30 ° to 60 °.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410593557.0A CN104345182B (en) | 2014-10-29 | 2014-10-29 | A kind of multistation test fixture |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410593557.0A CN104345182B (en) | 2014-10-29 | 2014-10-29 | A kind of multistation test fixture |
Publications (2)
| Publication Number | Publication Date |
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| CN104345182A CN104345182A (en) | 2015-02-11 |
| CN104345182B true CN104345182B (en) | 2017-06-27 |
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| CN201410593557.0A Active CN104345182B (en) | 2014-10-29 | 2014-10-29 | A kind of multistation test fixture |
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Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN106443188B (en) * | 2016-11-09 | 2020-08-25 | 武汉新芯集成电路制造有限公司 | Resistance measuring probe |
| CN107876440B (en) * | 2017-12-12 | 2023-05-09 | 深圳新益昌科技股份有限公司 | Automatic static testing mechanism |
| CN110907666A (en) * | 2019-11-25 | 2020-03-24 | 杭州易正科技有限公司 | Integrated circuit packaging test seat capable of reducing probe abrasion |
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|---|---|---|---|---|
| CN1735810A (en) * | 2002-11-25 | 2006-02-15 | 佛姆费克托公司 | Probe array and method of its manufacture |
| CN101140297A (en) * | 2002-12-16 | 2008-03-12 | 佛姆费克托公司 | Apparatus and method for limiting over travel in a probe card assembly |
| CN101576576A (en) * | 2008-05-08 | 2009-11-11 | 南茂科技股份有限公司 | Probe card assembly and medium devices used for same |
| CN101655539A (en) * | 2008-08-19 | 2010-02-24 | 苏斯显微技术测试系统有限公司 | Method and device for forming a temporary electrical contact to a solar cell |
| CN101975917A (en) * | 2010-10-09 | 2011-02-16 | 中国电子科技集团公司第四十八研究所 | Electric test desk for testing crystal silicon solar cells |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20060250149A1 (en) * | 2005-05-04 | 2006-11-09 | Unitech Printed Circuit Board Corp. | Complex printed circuit board testing tool |
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2014
- 2014-10-29 CN CN201410593557.0A patent/CN104345182B/en active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1735810A (en) * | 2002-11-25 | 2006-02-15 | 佛姆费克托公司 | Probe array and method of its manufacture |
| CN101140297A (en) * | 2002-12-16 | 2008-03-12 | 佛姆费克托公司 | Apparatus and method for limiting over travel in a probe card assembly |
| CN101576576A (en) * | 2008-05-08 | 2009-11-11 | 南茂科技股份有限公司 | Probe card assembly and medium devices used for same |
| CN101655539A (en) * | 2008-08-19 | 2010-02-24 | 苏斯显微技术测试系统有限公司 | Method and device for forming a temporary electrical contact to a solar cell |
| CN101975917A (en) * | 2010-10-09 | 2011-02-16 | 中国电子科技集团公司第四十八研究所 | Electric test desk for testing crystal silicon solar cells |
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| CN104345182A (en) | 2015-02-11 |
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