CN104345182A - Multi-station test clamp - Google Patents

Abstract

The invention discloses a multi-station fixture for testing. The fixture includes an upper probe board, a lower probe board and a sample board; wherein, the upper probe board is provided with an upper probe array, and the lower probe board is provided with a lower probe board. Needle array, the sample board is set between the upper probe board and the lower probe board, on which there are several station slots for loading the samples to be tested, and the probes set on the upper and lower probe arrays are used to contact the samples to realize For the test, the station groove is divided into two parts: the sample positioning counterbore and the vertical through hole in the direction perpendicular to the sample plate. The sample positioning counterbore is used to load the sample, and the probe touches the sample through the vertical through hole . According to the invention, a large batch of test samples of different shapes and sizes can be carried out, the labor intensity of inspectors in the process of repeated batch feeding is reduced, the structure is simple, the performance is reliable, and the test efficiency is high.

Description

A multi-station test fixture

technical field

The invention belongs to the field of test fixtures, and more specifically relates to a multi-station test fixture.

Background technique

In order to ensure the accuracy and reliability of the electrical parameters of electrical components, especially for heat-sensitive and pressure-sensitive ceramic components widely used at present, it is necessary to test the withstand voltage life, current-time characteristics and aging characteristics of the finished products, while industrial mass production High test efficiency can distinguish the pros and cons of the product faster and improve the quality of the product.

Taking PTCR (Thermistor Ceramic Resistor) manufacturers as an example, they currently use multiple test equipment, multiple test fixtures, and multiple clamping methods to complete mass testing. However, this method requires a lot of equipment, high cost and low efficiency. In particular, the average daily output of some manufacturers is as high as more than one million pieces, while the test fixtures of a single device only have dozens of positions, and frequent loading and unloading is required during use, which is not only inefficient but also labor-intensive for testing personnel. At the same time, the current fixture structure needs different special fixtures to test samples of different sizes, which has poor versatility and is cumbersome to disassemble and maintain.

Contents of the invention

In view of the above defects or improvement needs of the prior art, the present invention provides a multi-station test fixture, the purpose of which is to solve the problem of guaranteeing the test by setting 128-512 station docking interfaces on the sample assembly board and the upper and lower fixtures. Under the premise that the volume of the equipment remains unchanged, it is a technical problem to increase the density of the test unit, and to improve the efficiency of mass testing and the versatility of the fixture itself for sample plates of different shapes.

In order to achieve the above object, according to one aspect of the present invention, a multi-station test fixture is provided, characterized in that the fixture includes an upper probe board, a lower probe board, and a sample board; wherein,

The upper probe board is provided with an upper probe array, the lower probe board is provided with a lower probe array, and the sample board is arranged between the upper probe board and the lower probe board, and a number of working chambers for loading samples to be tested are arranged on it. Position slots, the probes set on the upper and lower probe arrays are used to contact the sample to realize the test;

The station groove is divided into two parts: a sample positioning counterbore and a vertical through hole in the direction perpendicular to the sample plate. The sample positioning counterbore is used to load the sample, and the probe passes through the vertical through hole to contact the the above sample.

Further, the positioning counterbore is a universal counterbore, that is, the shape profile of the counterbore is the contour of several samples with different shapes stacked, so that samples with different shapes can be placed in the positioning counterbore.

Further, positioning through holes are provided on the four corners of the sample plate, which are used to cooperate with the positioning column to support the sample plate. The positioning column is sleeved with a limit spring, one end of which is in contact with the bottom of the sample plate.

Further, the distance between the lower probe board and the sample board leaves an effective gap for heat dissipation between the lower part of the sample and the sample board in the clamped state.

Further, the upper probe card is in contact with the sample plate through a limit bar, and the height of the limit bar can be adjusted, so that the distance between the lower probe card and the sample plate can be adjusted.

Further, the diameter of the vertical through hole is 2-5mm larger than the diameter of the probe.

Further, the depth of the positioning counterbore is greater than the thickness of the sample and not more than two thicknesses of the sample.

Further, the range of the effective gap is such that the sample protrudes from the upper plane of the positioning counterbore by 1-2 mm.

Further, the opening part of the positioning counterbore is processed with an inclined surface, which is trumpet-shaped.

Further, the angle range of the slope is 30° to 60°.

Generally speaking, compared with the prior art, the above technical solutions conceived by the present invention can achieve the following beneficial effects:

(1) The station groove on the sample plate is improved, and it is divided into two parts, one part is used to load the sample, and the other part is used to accommodate the supported probe, so that the sample can be suspended for a period of time under the action of the probe The effective distance can significantly improve the heat dissipation and stability during the sample testing process;

(2) The positioning counterbore in the station slot where the sample is placed is improved to a general-purpose counterbore, which can improve the versatility of the sample plate, and one sample plate can match a variety of test samples, reducing the need for multiple samples in the testing process. Levelness and position errors from board testing;

(3) The slope of the positioning counterbore is further improved to make it a trumpet shape, which makes it easier to load the sample into the station slot and screen out the excess samples, and further improves the efficiency of the test.

In a word, the multi-station sample plate of the patent of the present invention can be used for mass testing of sample pieces of different shapes and sizes, which reduces the labor intensity of inspectors in the process of repeated batch loading, simple structure, reliable performance, and high testing efficiency.

Description of drawings

Fig. 1 is the front view of multi-station fixture according to the present invention;

Fig. 2 is according to the top view of the sample plate section of multi-station fixture of the present invention;

Figure 3 is a top view of a sample plate with a universal counterbore according to the multi-station fixture of the present invention;

Fig. 4 is a schematic diagram of the assembly of the multi-station fixture and the testing instrument according to the present invention.

Throughout the drawings, the same reference numerals are used to designate the same elements or structures, wherein:

1-positioning column 2-limiting bar 3-upper probe plate 4-upper probe array 5-lower probe array 6-lower probe plate, 7-sample plate 8-positioning pin 9-spring 10-upper probe End 11-sample 12-lower probe end 13-beveled edge 14-positioning through hole 15-hand-held hole 16-sample base unit 17-positioning counterbore 18-vertical through hole 19-universal counterbore 20-compound outline

Detailed ways

In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention. In addition, the technical features involved in the various embodiments of the present invention described below may be combined with each other as long as they do not constitute a conflict with each other.

Example 1

Referring to Figures 1 to 3, the patent of the present invention is a left-right symmetrical structure design. The fixture main body includes a sample board 7, an upper probe board 3 and a lower probe board 5. The four peripheral corners of the sample board 7 are provided with positioning holes that penetrate the sample board. Through hole 14, the positioning through hole 14 cooperates with the positioning columns 1 on both sides, and the positioning column 1 is provided with a spring 9 in contact with the bottom of the sample plate 7, and the two are concentrically matched, wherein one end of the spring 9 is in contact with the sample plate 7, It can buffer the stroke and protect the lower probe from excessive impact.

The lower probe board 5 is fixedly supported by the positioning pin 8, wherein the upper probe board 3 can be connected with the driving mechanism to realize the pressing of the probes during the test and the removal of the probes after the test.

When utilizing the above-mentioned setting to work, the upper probe array 4 and the lower probe array 5 are respectively welded on the upper probe board 3 and the lower probe board 5, and the station groove 13 of the sample board and the upper and lower probe arrays are in the horizontal position. The direction is evenly distributed along the plane. The length and width of the basic unit 16 are 25mm*25mm, and the station groove and the probe array are concentrically matched in the vertical direction. When the driving mechanism drives the upper probe board 3 to move downward, the upper and lower probes The ends 10 , 12 are used to hold the sample 11 and enable a signal test of the sample 11 .

Example 2

This embodiment optimizes the upper probe board on the basis of Embodiment 1, specifically: the upper probe board 3 is in contact with the upper surface of the sample plate 7 through the limit bar 2, and the upper probe is adjusted by changing the height of the limit bar The distance between the plate 3 and the sample plate 7, so that the height of the limit bar 2 can be adjusted to press down or raise the sample plate 7, so that the distance between the lower probe plate 6 and the sample can be adjusted, so that it can be precisely clamped Lift the sample 11 and suspend it in the air, so that there is an effective gap between it and the sample plate. The range of the effective gap 14 can make the sample emerge from the upper plane of the positioning counterbore 17 by 1-2mm, so that it is easy to observe that the sample 11 is detached from the sample plate 7, and improved heat dissipation at the bottom of sample 11.

Example 3

The present embodiment adds the following structure on the basis of Embodiment 2: the station slot 13 is divided into two parts, the vertical through hole 18 and the positioning counterbore 17, the sample to be tested can be placed on the positioning counterbore 17, and the lower probe The probe on the plate 7 passes through the vertical through hole 18 to contact the sample 11, and the diameter of the vertical through hole is 2-5mm larger than the diameter of the probe, preventing the sample from being crushed and falling into the lower probe plate through the through hole. Short circuit and other faults.

Among them, as shown in Figure 3, the positioning countersunk hole 17 is improved into a general-purpose counterbore 19, wherein the general-purpose counterbore 19 is designed as a composite outer contour 20 after three kinds of samples are stacked, and a circular test sample and two sizes can be placed. The rectangular test sample, and in the case of satisfying the basic unit size of 25mm*25mm, the arrangement of the rectangular sample slots in the universal counterbore 19 is as follows: the long side of the rectangular size should try to be along the 45° direction of the angle between a and b Arrangement, that is, arrange along the diagonal direction of the basic unit.

Example 4

In this embodiment, the following structure is added on the basis of Embodiment 3: the positioning counterbore 17 on the upper surface of the sample plate is provided with a circumferential chamfer of 30° to 60° in the circumferential direction, so that the positioning counterbore is trumpet-shaped.

In this embodiment, it is considered that in order to facilitate loading, the depth of the positioning counterbore 17 of the sample plate must be slightly greater than the thickness of the sample and not more than the thickness of two samples. If it is greater than the thickness of two samples, it will cause multiple samples to be easily stacked at the positioning counterbore of a single station, and, in order to ensure that the During the feeding process, a single station corresponds to a single sample. According to the thickness of the counterbore on the end surface of the sample plate, a beveled edge of 30° to 60° is processed at the circumferential position, and excess sample pieces can be screened out with the help of the beveled edge. Screen out the station tank 13 under the external force.

Example 5

This embodiment adds the following structure on the basis of Embodiment 1: the front side of the sample plate 7 is provided with a number of hand-held holes 15, wherein the hand-held holes can be conveniently used to screen excess samples in a hand-held manner, and can It is used to fix the sample plate 17.

Example 6

As the optimal embodiment of the present invention, this embodiment optimizes the probe ends 10, 12 and the limit strip 2 on the basis of the above embodiments, specifically: the upper and lower probe ends 10, 12 are provided with A compressible elastic component, the height of the limit bar 2 is set to be lower than the height of the probe.

In this embodiment, the upper probe array 4 is first in contact with the sample 11, and the upper probe end 12 produces a certain amount of compression due to the height limit of the limit bar. The above-mentioned structural design can well fix the sample 11 before clamping; After the upper probe plate 3 is further driven to move downward, it contacts and cooperates with the end portion 10 of the lower probe to clamp the sample; A certain effective gap 14 , ie the sample 11 is released from the sample plate 7 . Through the above-mentioned structural design of the limit bar 2 and the probe, the clamp can gradually clamp the sample, which improves the reliability of clamping and the accuracy of testing.

Wherein the elastic parts of the probe ends 10, 12 are springs, and the height of the upper probe board limit bar 2 is 2-4 mm lower than the height of the probe, that is, the compression amount of the probe is 2-4 mm.

It is easy for those skilled in the art to understand that the above descriptions are only preferred embodiments of the present invention, and are not intended to limit the present invention. Any modifications, equivalent replacements and improvements made within the spirit and principles of the present invention, All should be included within the protection scope of the present invention.

Claims (10)

1. a multi-station test fixture, is characterized in that, this fixture comprises upper probe card (3), lower probe card (6), sample plate (7); Wherein, The upper probe board (3) is provided with the upper probe array (4), the lower probe board (6) is provided with the lower probe array (5), and the sample board (7) is arranged on the upper probe board (3) and the lower probe board (3). Between the plates (6), there are several station slots (13) for loading samples (11) to be tested, and the probes arranged on the upper and lower probe arrays (4, 5) are used to contact the samples ( 11) Realize the test; The station groove (13) is divided into two parts, a sample positioning counterbore (17) and a vertical through hole (18) in a direction perpendicular to the sample plate (7), and the sample positioning counterbore (17) is used for A sample (11) is loaded and the probe contacts the sample (11) through a vertical through hole (18). 2. multi-station test fixture as claimed in claim 1, is characterized in that, described positioning counterbore (17) is general counterbore, and the shape profile of counterbore is the contour that several samples with different shapes stack ( 20), so that samples with different shapes can be placed in the positioning counterbore (17). 3. The multi-station test fixture according to claim 1 or 2, characterized in that, positioning through holes (14) are provided on the four corners of the sample plate (7) for cooperating with the positioning column (1) To realize the support of the sample plate (7), a limit spring (9) is sheathed on the positioning column (1), one end of which is in contact with the bottom of the sample plate (7). 4. The multi-station test fixture according to claim 3, characterized in that, the distance between the lower probe board (6) and the sample board (7) makes the lower part of the sample (11) under the clamped state There is an effective gap (14) for heat dissipation between the sample plate (7). 5. multi-station test fixture as claimed in claim 4, is characterized in that, described upper probe plate (3) contacts with sample board (7) by limit bar (2), and the height of described limit bar It can be adjusted so that the distance between the lower probe board (6) and the sample board (7) can be adjusted. 6. The multi-station test fixture according to claim 3, wherein the diameter of the vertical through hole is 2-5mm larger than the diameter of the probe. 7. The multi-station test fixture according to any one of claims 4-6, wherein the depth of the positioning counterbore (17) is greater than the thickness of the sample (11) and no more than two samples (11) )thickness of. 8. The multi-station test fixture according to claim 4, characterized in that, the range of the effective gap is to make the sample (11) protrude from the upper plane of the positioning counterbore (17) by 1-2 mm. 9 . The multi-station test fixture according to claim 7 , characterized in that, the opening of the positioning counterbore ( 17 ) is processed with an inclined surface, which is trumpet-shaped. 10. The multi-station test fixture according to claim 9, wherein the angle range of the slope is 30° to 60°.