CN209656750U - A kind of chip of laser test device using novel probe - Google Patents

A kind of chip of laser test device using novel probe Download PDF

Info

Publication number
CN209656750U
CN209656750U CN201920250204.9U CN201920250204U CN209656750U CN 209656750 U CN209656750 U CN 209656750U CN 201920250204 U CN201920250204 U CN 201920250204U CN 209656750 U CN209656750 U CN 209656750U
Authority
CN
China
Prior art keywords
chip
spring
test device
side wall
needle
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN201920250204.9U
Other languages
Chinese (zh)
Inventor
彭朝亮
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Huaxin Zhisheng Microelectronics (chongqing) Co Ltd
Original Assignee
Huaxin Zhisheng Microelectronics (chongqing) Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Huaxin Zhisheng Microelectronics (chongqing) Co Ltd filed Critical Huaxin Zhisheng Microelectronics (chongqing) Co Ltd
Priority to CN201920250204.9U priority Critical patent/CN209656750U/en
Application granted granted Critical
Publication of CN209656750U publication Critical patent/CN209656750U/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

The utility model discloses a kind of chip of laser test devices using novel probe, including bottom plate, boss, localization tool, needle stand, pcb board, needle body and chip, placing groove is offered on the roof of the localization tool, the chip is placed in placing groove, the surrounding of the placing groove symmetrically offers spring groove, second spring is fixedly installed on the side wall of each spring groove, the second spring is mounted on trapezoid block close to one end of chip, the trapezoid block is slidably connected in corresponding spring groove, each trapezoid block all extends to the outside of chip far from one end of ipsilateral second spring and contacts with each other with its side wall.Stable accurate positioning can be carried out to chip by the setting of each structure in this programme to fix, and avoided deviation occur when detection, while can increase the stability of backshank and syringe needle movement, reduced mobile deviation.

Description

A kind of chip of laser test device using novel probe
Technical field
The utility model relates to chip of laser the field of test technology more particularly to a kind of lasers using novel probe Apparatus for testing chip.
Background technique
Burn-in test to chip of laser be laser manufacture in critical step, in this step, need using Positioning fixture positions the chip of laser, is then in contact and is powered with chip using probe, wherein is usually Probe is mounted on to the top of chip, and its bottom is allow to be depressed into chip surface.
Through retrieving, China Patent No. CN208224429U discloses a kind of chip of laser test dress using novel probe It sets, which includes bottom plate, and plate upper surface is equipped with the boss of horizontal full-length, and rule is fixed with several needles on boss , multiple groups probe is fixed in each needle stand corresponding position, every group of probe and a chip are corresponding, and probe includes hollow cylinder knot The needle handle of structure is formed with cavity, the backshank of cavity upper end connecting cylinder shape and the cylindrical syringe needle that is slidably connected, needle inside needle handle Seat is equipped with several stepped holes, and stepped hole includes upper rank hole and the location hole of lower end of upper end, upper rank hole jacket needle handle, syringe needle Enter outside across location hole, backshank is electrically connected pcb board, and the length of needle handle and the ratio of needle length are 2: 1, the length of syringe needle Ratio with positioning hole length is 2: 1.
Above-mentioned test device has the drawback that localization tool is unstable to the positioning of chip in practical operation, shadow It rings detection normal operating to carry out, while stability is poor when probe is flexible, it is therefore desirable to improve.
Utility model content
Purpose of the utility model is to solve positioning of the localization tool in the prior art to chip is unstable, influence to examine It surveys normal operating to carry out, while stability poor disadvantage when probe is flexible, and a kind of laser using novel probe proposed Device apparatus for testing chip.
To achieve the goals above, the utility model adopts the technical scheme that
A kind of chip of laser test device using novel probe, including bottom plate, boss, localization tool, needle stand, PCB Plate, needle body and chip offer placing groove on the roof of the localization tool, and the chip is placed in placing groove, described to put The surrounding for setting slot symmetrically offers spring groove, is fixedly installed with second spring on the side wall of each spring groove, and described Two springs are mounted on trapezoid block close to one end of chip, and the trapezoid block is slidably connected in corresponding spring groove, Mei Geti Shape block all extends to the outside of chip far from one end of ipsilateral second spring and contacts with each other with its side wall.
Preferably, the inside of each needle body offers telescopic cavity, is equipped with the first bullet in each telescopic cavity Spring, the both ends of each first spring are fixedly installed with limit plate, two sides of the limit plate far from the first spring It is respectively fixed with backshank and syringe needle, the backshank is located at the upside of needle body, and the syringe needle is located at the downside of needle body.
Preferably, the backshank extends to the outside of needle body far from one end of ipsilateral limit plate, and first spring is separate One end of ipsilateral limit plate extends to the outside of needle body, and the length ratio of the backshank and syringe needle is 1:2.
Preferably, it is symmetrically installed on the side wall of two limit plates there are two sliding block, on the side wall of the telescopic cavity The vertical chute to match with corresponding sliding block is offered respectively, and each sliding block, which is slided with corresponding the vertical chute, to be connected It connects.
Preferably, the backshank length is 3.4mm, and the length of the syringe needle is 1.7mm.
Preferably, sheet rubber is mounted on side wall of two trapezoid blocks far from ipsilateral second spring one end.
Compared with the prior art, the utility model has the beneficial effects that:
1, chip need to be only pressed when positioning and makes it into corresponding placing groove, can pass through the second bullet in four spring grooves Spring and trapezoid block are fixed, and then are fixed on chip stabilization accurately in placing groove.
2, by the way that sliding block is arranged on the side wall of limit plate, it can be ensured that backshank and the stable carry out telescopic moving of syringe needle, drop The deviation of low movement.
In conclusion can carry out stablizing accurate positioning fixation to chip by the setting of each structure in this programme, keep away Occur deviation when test free, while the stability of backshank and syringe needle movement can be increased, reduces mobile deviation.
Detailed description of the invention
Fig. 1 be the utility model proposes the overall structure of chip of laser test device using novel probe a kind of show It is intended to;
Fig. 2 be the utility model proposes a kind of chip of laser test device using novel probe localization tool and The scheme of installation of chip;
Fig. 3 be the utility model proposes a kind of chip of laser test device using novel probe needle body amplification Figure;
Fig. 4 be the utility model proposes a kind of chip of laser test device using novel probe part A structure Enlarged drawing;
Fig. 5 be the utility model proposes a kind of chip of laser test device using novel probe part B structure Enlarged drawing.
In figure: 1 bottom plate, 2 boss, 3 localization tools, 4 needle stands, 5 pcb boards, 6 needle bodies, 61 backshanks, 62 syringe needles, 63 first bullets Spring, 64 limit plates, 65 sliding blocks, 7 chips, 8 spring grooves, 9 second springs, 10 trapezoid blocks.
Specific embodiment
The following will be combined with the drawings in the embodiments of the present invention, carries out the technical scheme in the embodiment of the utility model Clearly and completely describe, it is clear that the described embodiments are only a part of the embodiments of the utility model, rather than whole Embodiment.
In the description of the present invention, it should be understood that term " on ", "lower", "front", "rear", "left", "right", The orientation or positional relationship of the instructions such as "top", "bottom", "inner", "outside" is to be based on the orientation or positional relationship shown in the drawings, and is only For ease of description the utility model and simplify description, rather than the device or element of indication or suggestion meaning must have it is specific Orientation, be constructed and operated in a specific orientation, therefore should not be understood as limiting the present invention.
Referring to Fig.1-5, a kind of chip of laser test device using novel probe, including bottom plate 1, boss 2, positioning control Have 3, needle stand 4, pcb board 5, needle body 6 and chip 7, offers placing groove on the roof of localization tool 3, chip 7 is placed on placing groove Interior, the surrounding of placing groove symmetrically offers spring groove 8, and second spring 9 is fixedly installed on the side wall of each spring groove 8, the Two springs 9 are mounted on trapezoid block 10 close to one end of chip 7, and trapezoid block 10 is slidably connected in corresponding spring groove 8, each Trapezoid block 10 all extends to the outside of chip 7 far from one end of ipsilateral second spring 9 and contacts with each other with its side wall, and two trapezoidal Block 10 is mounted on sheet rubber on the side wall far from ipsilateral 9 one end of second spring, sheet rubber can avoid trapezoid block 10 and make to chip 7 At damage.
Above-mentioned bottom plate 1, boss 2, localization tool 3, needle stand 4, pcb board 5, needle body 6 and chip 7 concrete operations mechanism exist It is illustrated in the file of China Patent No. CN208224429U, therefore is repeated no more in this programme.
The inside of each needle body 6 offers telescopic cavity, and the first spring 63, each first bullet are equipped in each telescopic cavity The both ends of spring 63 are fixedly installed with limit plate 64, and two limit plates 64 are respectively fixed with backshank far from the side of the first spring 63 61 and syringe needle 62, backshank 61 be located at the upside of needle body 6, syringe needle 62 is located at the downside of needle body 6.
Backshank 61 extends to the outside of needle body 6 far from one end of ipsilateral limit plate 64, and the first spring 63 is far from ipsilateral limit One end of plate 64 extends to the outside of needle body 6, and the length ratio of backshank 61 and syringe needle 62 is 1:2, and 61 length of backshank is 3.4mm, The length of syringe needle 62 is 1.7mm.
Be symmetrically installed on the side wall of two limit plates 64 there are two sliding block 65, offered respectively on the side wall of telescopic cavity with The vertical chute that corresponding sliding block 65 matches, each sliding block 65 are slidably connected with corresponding the vertical chute.
Backshank 61 and syringe needle 62 are carried out by the sliding block 65 on 64 side wall of limit plate and the vertical chute in flexible groove sidewall It cooperates, so that stable telescopic moving can be realized, and mobile accuracy is high.
The preferable specific embodiment of the above, only the utility model, but the protection scope of the utility model is not It is confined to this, anyone skilled in the art is within the technical scope disclosed by the utility model, practical according to this Novel technical solution and its utility model design are subject to equivalent substitution or change, should all cover the protection model in the utility model Within enclosing.

Claims (6)

1. a kind of chip of laser test device using novel probe, including bottom plate (1), boss (2), localization tool (3), needle Seat (4), pcb board (5), needle body (6) and chip (7), which is characterized in that offer placement on the roof of the localization tool (3) Slot, the chip (7) are placed in placing groove, and the surrounding of the placing groove symmetrically offers spring groove (8), each spring It is fixedly installed on the side wall of slot (8) second spring (9), the second spring (9) is mounted on close to the one end of chip (7) Trapezoid block (10), the trapezoid block (10) are slidably connected in corresponding spring groove (8), and each trapezoid block (10) is far from ipsilateral the One end of two springs (9) all extends to the outside of chip (7) and contacts with each other with its side wall.
2. a kind of chip of laser test device using novel probe according to claim 1, which is characterized in that each The inside of the needle body (6) offers telescopic cavity, is equipped in each telescopic cavity the first spring (63), and each described The both ends of one spring (63) are fixedly installed with limit plate (64), and the one of two limit plates (64) separate first spring (63) Side is respectively fixed with backshank (61) and syringe needle (62), and the backshank (61) is located at the upside of needle body (6), and the syringe needle (62) is located at The downside of needle body (6).
3. a kind of chip of laser test device using novel probe according to claim 2, which is characterized in that described Backshank (61) extends to the outside of needle body (6) far from the one end of ipsilateral limit plate (64), and first spring (63) is far from ipsilateral One end of limit plate (64) extends to the outside of needle body (6), and the length ratio of the backshank (61) and syringe needle (62) is 1:2.
4. a kind of chip of laser test device using novel probe according to claim 3, which is characterized in that two Be symmetrically installed on the side wall of the limit plate (64) there are two sliding block (65), offered respectively on the side wall of the telescopic cavity with The vertical chute that corresponding sliding block (65) matches, each sliding block (65) are slidably connected with corresponding the vertical chute.
5. a kind of chip of laser test device using novel probe according to claim 4, which is characterized in that described Backshank (61) length is 3.4mm, and the length of the syringe needle (62) is 1.7mm.
6. a kind of chip of laser test device using novel probe according to claim 1, which is characterized in that two Sheet rubber is mounted on the side wall of separate ipsilateral second spring (9) one end of the trapezoid block (10).
CN201920250204.9U 2019-02-28 2019-02-28 A kind of chip of laser test device using novel probe Active CN209656750U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201920250204.9U CN209656750U (en) 2019-02-28 2019-02-28 A kind of chip of laser test device using novel probe

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201920250204.9U CN209656750U (en) 2019-02-28 2019-02-28 A kind of chip of laser test device using novel probe

Publications (1)

Publication Number Publication Date
CN209656750U true CN209656750U (en) 2019-11-19

Family

ID=68525380

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201920250204.9U Active CN209656750U (en) 2019-02-28 2019-02-28 A kind of chip of laser test device using novel probe

Country Status (1)

Country Link
CN (1) CN209656750U (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112845115A (en) * 2020-12-31 2021-05-28 华芯智造微电子(重庆)有限公司 Efficient automatic sorting method
CN112845187A (en) * 2020-12-31 2021-05-28 华芯智造微电子(重庆)有限公司 Automatic sorting machine
CN114325003A (en) * 2020-10-10 2022-04-12 深圳市容微精密电子有限公司 Novel probe internal connection structure
CN116519983A (en) * 2023-06-26 2023-08-01 中久光电产业有限公司 Semiconductor laser aging measuring device

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114325003A (en) * 2020-10-10 2022-04-12 深圳市容微精密电子有限公司 Novel probe internal connection structure
CN112845115A (en) * 2020-12-31 2021-05-28 华芯智造微电子(重庆)有限公司 Efficient automatic sorting method
CN112845187A (en) * 2020-12-31 2021-05-28 华芯智造微电子(重庆)有限公司 Automatic sorting machine
CN112845187B (en) * 2020-12-31 2023-01-10 华芯智造微电子(重庆)有限公司 Automatic sorting machine
CN116519983A (en) * 2023-06-26 2023-08-01 中久光电产业有限公司 Semiconductor laser aging measuring device

Similar Documents

Publication Publication Date Title
CN209656750U (en) A kind of chip of laser test device using novel probe
US11619654B2 (en) Probe for characteristic inspection of a connector
KR101173119B1 (en) A Socket for Testing the Electronic Components
KR100603957B1 (en) Printed circuit holding device
CN207883670U (en) A kind of high-precision of chip positions fixed module entirely
US20090325402A1 (en) Burn-in socket with imporved contacts
JP7382189B2 (en) Charge/discharge inspection device for small secondary batteries and its charge/discharge inspection method
CN203350338U (en) Cell phone PCB plate voltage testing jig
KR20100005458U (en) A universal adapter for testing socket of BGA package
CN203084016U (en) Joint for multimeter and multimeter with joint
CN112666492A (en) Lever type testing conduction device
JP7344062B2 (en) Transport tray for small secondary batteries and its transport method
CN103412173A (en) Mobile phone PCB voltage testing jig
CN109490754B (en) Circuit board parallel test system
CN202049210U (en) Automatic test device for spring leaves on FPC
KR20090038102A (en) Ssd carrier for testtray
CN208109950U (en) Test equipment
CN213934100U (en) FlexPCB optical function test carrier
CN218217439U (en) Testing arrangement of side button for cell-phone
CN216485158U (en) Transformer test jig
CN216622449U (en) Spiral clamping groove type mounting structure of OTA test probe
CN216653352U (en) Rocker assembly, gamepad and electronic equipment
CN214795104U (en) Chip burning test equipment
CN207147851U (en) Consumptive material mounting bracket positioning and clamping mechanism for point sample instrument
CN208419938U (en) A kind of electroplated product appearance detection positioning device

Legal Events

Date Code Title Description
GR01 Patent grant
GR01 Patent grant
CP03 Change of name, title or address

Address after: Building 5, No. 57, Jinfu Avenue, Gunan street, Qijiang District, Chongqing

Patentee after: Huaxin Zhizao Microelectronics (Chongqing) Co., Ltd

Address before: Building 5, No. 57, Jinfu Avenue, Guinan street, Qijiang County, Chongqing

Patentee before: Huaxin Zhisheng Microelectronics (Chongqing) Co.,Ltd.

CP03 Change of name, title or address