CN1632759A - Method capable of smartly implementing EEPROM simulation function in chip - Google Patents
Method capable of smartly implementing EEPROM simulation function in chip Download PDFInfo
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- CN1632759A CN1632759A CN 200310122679 CN200310122679A CN1632759A CN 1632759 A CN1632759 A CN 1632759A CN 200310122679 CN200310122679 CN 200310122679 CN 200310122679 A CN200310122679 A CN 200310122679A CN 1632759 A CN1632759 A CN 1632759A
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Abstract
This invention relates to a flexible method to realize the EEPROM artificial function. The artificial chip of intelligent card comprises the storage application extension procedure EEPROM. The artificial device comprises substitute artificial chip EEPROM SRAM. There is set with option signals between the artificial device and artificial chip. When adjusting the above application procedure code content, the option signal-informing chip downloads the extension procedure into the artificial SRAM to substitute the EEPROM for adjusting.
Description
Technical field
The present invention relates to smart card hardware analogue system field, relate in particular to the method that a kind of intelligent card emluator is realized EEPROM copying in the sheet flexibly.
Background technology
The structure of the MCU that uses is different from general MCU chip in the smart card product, and the storer in the sheet generally also has the interior EEPROM of sheet of larger capacity except being used to deposit the PROM of Chip Operating System (COS program).This part EEPROM promptly can deposit some fixing data as nonvolatile memory, also can be when needed, and for example in the many application of expansion, use as program storage the expansion area that becomes PROM, deposits the application extension program.
EEPROM as the process that the program area uses is in the sheet, HEX file after at first the mode (MOVX instruction) downloaded with data as data field (XRAM) of EEPROM compiles the application extension program separately is put into the appointed area of EEPROM in the sheet, by the switching of register, EEPROM in the sheet is switched to program storage area then.As program storage area the time, the logical address of the address of this part EEPROM and original PROM program storage area is continuous.
At present, in the design of intelligent card emluator, generally all be to adopt SRAM to substitute the interior PROM of emulation chip (hereinafter to be referred as EV-CHIP) and EEPROM as storer.Because the PROM of smart card MCU generally adopts mask generation, and there is not the restriction in time sequential routine, in simulation process, can use plug-in SRAM to substitute, emulation and debug process to the COS program in SRAM are very near truly using the PROM process, be believable, the target program that final debugging is finished is applied in the real chip and generally can go wrong.EEPROM still is that the program area use all must be followed certain time sequential routine as the data field in the sheet, and the SRAM that substitutes EEPROM in the sheet in the intelligent card emluator does not have the restriction in time sequential routine, objectively cause the inconsistent of simulation process and true use, in the simulation process that uses intelligent card emluator, can't find the problem on the EEPROM program area time sequential routine.On emulator, use SRAM to replace that EEPROM has debugged the application extension program of finishing in the sheet, download in the sheet of real chip and may can't use or make mistakes owing to the problem in time sequential routine behind the EEPROM.
Using SRAM to substitute PROM in the sheet in intelligent card emluator, though the method for using plug-in eeprom chip to substitute the EEPROM in the sheet is a way that addresses the above problem, is not a good method.Because, the different model that each company produces, the EEPROM of different capabilities exists either large or small difference on the time sequential routine, the plug-in EEPROM of intelligent card emluator must guarantee with sheet in EEPROM adopts is same process, has the identical time sequential routine, owing to there is not a kind of plug-in eeprom chip that can substitute all kinds EEPROM, objectively limited the selection of the alternative EEPROM model of emulator greatly, limited the versatility of intelligent card emluator on the time sequential routine of EEPROM, brought great inconvenience for the use of intelligent card emluator the multiple EV-CHIP of homologous series (these chips may only there are differences).
In addition, if using plug-in EEPROM to substitute the interior EEPROM of sheet, intelligent card emluator carries out artificial debugging, because the operating speed of EEPROM is than slow many of the operating speed of SRAM, and in EEPROM in the debug process of application extension program, what the most of the time debug process was concerned about is program itself, and slow excessively execution speed can influence the efficient of debugging work greatly.
Therefore the implementation method that needs EEPROM copying in a kind of new sheet of design finds equilibrium point between the authenticity of emulation and speed, can guarantee to obtain in debug process higher efficient again.
Summary of the invention
The object of the present invention is to provide a kind of intelligent card emluator, make the SRAM that can select to use in the application extension program process of intelligent card emluator EEPROM in simulated slice on the emulator substitute EEPROM in the emulation chip (EV-CHIP), or directly use the interior EEPROM of EV-CHIP to carry out emulation, debugging.
The object of the present invention is achieved like this: the method that can realize EEPROM copying in the sheet flexibly, be used to use intelligent card emluator emulation, in the process of Test Application extender, be connected with bus between the emulation chip in emulator and the smart card, comprise data bus and address bus, comprise the EEPROM that deposits the application extension program and the PROM of deposit operation system in the described emulation chip, the SRAM that has alternative EEPROM in the emulator, also be provided with the selection signal between emulator and the emulation chip, when the above-mentioned application extension program code content of debugging, select signal to select the notice emulation chip application extension program to be downloaded among the SRAM of emulator, debug by EEPROM in the SRAM replacement sheet; When test and during proving program, select signal to select the notice emulation chip that the application extension program is downloaded to the EEPROM of emulation chip, carry out by EEPROM.Equally, the transposing of the high-low level in above-mentioned two processes also can be finished goal of the invention.
The following feature that the present invention also has: in the design process of EV-CHIP, when the EEPROM in using EV-CHIP uses as the program area, the bus (comprising data bus, address bus, read/write and chip selection signal) of EEPROM part is opened out to emulator fully, is implemented in to use copying (comprising full speed running, single step run, breakpoint operation etc.) complete when EEPROM debugs the application extension program in the sheet.Emulator uses the SRAM in no time sequential routine to substitute the interior EEPROM of EV-CHIP, and to the multiple emulation chip that homologous series only there are differences on the time sequential routine of EEPROM, emulator only need be changed emulation chip just can realize copying to them.
Compared with prior art, the invention has the beneficial effects as follows: both guaranteed the efficient of artificial debugging work, guaranteed the authenticity of application extension procedure simulation again.And during EEPROM Simulation Application extender in using EV-CHIP, intelligent card emluator still can provide complete copying.To the multiple emulation chip that homologous series only there are differences on the time sequential routine of EEPROM, emulator only need be changed emulation chip just can realize copying to them.
Description of drawings
Fig. 1 is the transmission of the signal between intelligent card emluator and an emulation chip synoptic diagram in the relevant embodiment of the invention.
The application extension program was downloaded the back program and is deposited synoptic diagram when Fig. 2 was the EEPROM that directly uses in the emulation chip.
The application extension program was downloaded the back program and is deposited synoptic diagram when Fig. 3 was to use the SRAM that provides in the emulator to substitute in the sheet EEPROM.
Wherein:
EA_EP: the application extension program deposit position from intelligent card emluator is selected signal.
RD/WR, the read/write of CS:EEPROM, chip selection signal.
The data bus of DATA:EEPROM.
The address bus of ADD:EEPROM.
GND: earth signal.
Embodiment
Below in conjunction with drawings and Examples the present invention is further described.
Consult shown in Figure 2ly, deposits the PROM of Chip Operating System (COS) program except being used in the emulation chip of smart card product, also have EEPROM in the sheet of larger capacity.This part EEPROM promptly can deposit some fixing data as nonvolatile memory, also can be when needed, and for example in the many application of expansion, use as program storage the expansion area that becomes PROM.Please cooperate and consult shown in Figure 3ly, in intelligent card emluator, have SRAM that replaces emulation chip PROM and the SRAM that substitutes emulation chip EEPROM.
See also shown in Figure 1ly, the bus (comprising data bus, address bus, read/write and chip selection signal) of the EEPROM of intelligent card artificial chip (EV-CHIP) part is opened out to intelligent card emluator fully, and all is grounded by earth signal GND.Comprise also that between intelligent card emluator and EV-CHIP a signal wire is to realize the transmission of application extension program deposit position selection signal.When EEPROM emulation in using EV-CHIP, debugging application extension program, emulator also can be realized complete copying (comprising full speed running, single step run, breakpoint operation etc.).
EEPROM in the alternative sheet of selecting to use emulator to provide according to request for utilization in the memory configurations in intelligent card emluator Integrated Development Environment (IDE) of SRAM in EEPROM or the use EV-CHIP.If, be purpose with the debugged program code content, the debugging efficiency of having relatively high expectations can select to use the SRAM of EEPROM in the alternative sheet that emulator provides.If after code debugging is finished substantially, when needing further debugging, proving program, can select to use the EEPROM in the EV-CHIP, to obtain the simulated effect of approaching true operating position.
See also Fig. 1, shown in 2,3, the RPOM district in the emulation chip is a masking process owing to what adopt, is using the SRAM on the emulator to replace so deposit the PROM district of Chip Operating System (COS) program.During EEPROM, emulator is set to low level to the EA_EP signal in the SRAM that select to use emulator to provide in Integrated Development Environment (IDE) substitutes sheet, informs the download of EV-CHIP application extension program and operates among the SRAM of emulator.The logical address of application extension program and master routine are continuous.During EEPROM when select to use EV-CHIP in IDE in, emulator is set to high level to the EA_EP signal, informs that EV-CHIP application extension program downloads and operate among the EEPROM in the EV-CHIP.The logical address of application extension program and master routine also are continuous.
According to above principle, also the high-low level in the present embodiment can be replaced, promptly when debugging application extension program code, EA_EP is changed to high level, and when thereafter debugging, checking application extension program, EA_EP is changed to low level.And if the EEPROM in the described emulation chip uses flash memory FLASH to replace, the design is suitable equally.
See also shown in Figure 1, the bus (comprising data bus, address bus, read/write and chip selection signal) of the EEPROM part of EV-CHIP is opened out to emulator fully, when EEPROM emulation in using EV-CHIP, debugging application extension program, emulator also can be realized complete copying (comprising full speed running, single step run, breakpoint operation etc.).
See also shown in Fig. 1,2 and 3, emulator uses the SRAM in no time sequential routine to substitute the interior EEPROM of EV-CHIP, to the multiple emulation chip that homologous series only there are differences on the time sequential routine of EEPROM, emulator only need be changed emulation chip just can realize copying to them.
In sum, the present invention has finished inventor's purpose, the method that is provided makes the SRAM that can use in the application extension program process of intelligent card emluator EEPROM in simulated slice on the emulator substitute EEPROM in the EV-CHIP, can use directly also that real EEPROM carries out emulation, debugging in the EV-CHIP.During EEPROM Simulation Application extender in using EV-CHIP, intelligent card emluator still can provide complete copying.Promptly guarantee the efficient of artificial debugging process, guaranteed the authenticity of application extension procedure simulation again, and emulator has had versatility to isonomic emulation chip.
Claims (7)
1. method that can realize EEPROM copying in the sheet flexibly, be used to use intelligent card emluator emulation, in the process of Test Application extender, be connected with bus between the emulation chip in emulator and the smart card, comprise data bus and address bus, comprise the EEPROM that deposits the application extension program and the PROM of deposit operation system in the described emulation chip, the SRAM that has alternative EEPROM in the emulator, it is characterized in that: also be provided with the selection signal between emulator and the emulation chip, when the above-mentioned application extension program code content of debugging, select signal to select the notice emulation chip application extension program to be downloaded among the SRAM of emulator, debug by EEPROM in the SRAM replacement sheet; When test and during proving program, select signal to select the notice emulation chip that the application extension program is downloaded to the EEPROM of emulation chip, carry out by EEPROM.
2. the method that can realize EEPROM copying in the sheet flexibly as claimed in claim 1, it is characterized in that: when debugging application extension program code, select signal to be set to low level and inform with this that emulation chip downloads to the application extension program among the SRAM of emulator and carry out.
3. the method that can realize EEPROM copying in the sheet flexibly as claimed in claim 1, it is characterized in that: when test and checking application extension program, select signal to be set to low level and inform with this that emulation chip downloads to the application extension program among the EEPROM of emulation chip and carry out.
4. the method that can realize EEPROM copying in the sheet flexibly as claimed in claim 1, it is characterized in that: emulation chip is finished opening by bus to emulator, when making EEPROM test in the emulation chip and checking application extension program, intelligent card emluator still can provide complete copying.
5. as claim 1 or the 2 or 3 described methods that can realize EEPROM copying in the sheet flexibly, it is characterized in that: the SRAM that further comprises an alternative PROM in the emulator.
6. as claim 1 or 2 or the 3 or 4 described methods that can realize EEPROM copying in the sheet flexibly, it is characterized in that: the EEPROM in the described emulation chip can be flash memory FLASH.
7. as claim 1 or 2 or the 3 or 4 described methods that can realize EEPROM copying in the sheet flexibly, it is characterized in that: the PROM in the described emulation chip can be flash memory FLASH.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB2003101226793A CN1306408C (en) | 2003-12-24 | 2003-12-24 | Method capable of smartly implementing EEPROM simulation function in chip |
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| Application Number | Priority Date | Filing Date | Title |
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| CNB2003101226793A CN1306408C (en) | 2003-12-24 | 2003-12-24 | Method capable of smartly implementing EEPROM simulation function in chip |
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| CN1632759A true CN1632759A (en) | 2005-06-29 |
| CN1306408C CN1306408C (en) | 2007-03-21 |
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Cited By (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN100384286C (en) * | 2005-12-29 | 2008-04-23 | 北京握奇数据系统有限公司 | Smart card testing method |
| CN101751328B (en) * | 2008-12-12 | 2011-07-27 | 北京中电华大电子设计有限责任公司 | Simulation method of FLASH/electrically erasable programmable read-only memory (EEPROM) |
| CN101329649B (en) * | 2007-06-20 | 2011-11-02 | 上海华虹集成电路有限责任公司 | Display apparatus of EEPROM in emulator |
| CN101751322B (en) * | 2008-11-28 | 2012-06-06 | 上海华虹集成电路有限责任公司 | Contact type intelligent card emulator and breakpoint setting method |
| CN103678073A (en) * | 2012-09-25 | 2014-03-26 | 上海华虹集成电路有限责任公司 | Simulation system |
| CN104346207A (en) * | 2013-07-31 | 2015-02-11 | 上海华虹集成电路有限责任公司 | Simulator |
| CN104346249A (en) * | 2013-07-31 | 2015-02-11 | 上海华虹集成电路有限责任公司 | Simulation debugging system |
| CN105487968A (en) * | 2014-10-09 | 2016-04-13 | 上海华虹集成电路有限责任公司 | Simulator capable of equivalently realizing EEPROM (Electrically Erasable Programmable Read-Only Memory) |
| CN105573924A (en) * | 2014-10-09 | 2016-05-11 | 上海华虹集成电路有限责任公司 | Simulation system |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108762970A (en) * | 2018-06-12 | 2018-11-06 | 上海航天计算机技术研究所 | A kind of highly reliable spaceborne computer program storage device |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH04296678A (en) * | 1991-03-26 | 1992-10-21 | Sharp Corp | Verificaiton method at design stage of semiconductor integrated circuit |
-
2003
- 2003-12-24 CN CNB2003101226793A patent/CN1306408C/en not_active Expired - Fee Related
Cited By (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN100384286C (en) * | 2005-12-29 | 2008-04-23 | 北京握奇数据系统有限公司 | Smart card testing method |
| CN101329649B (en) * | 2007-06-20 | 2011-11-02 | 上海华虹集成电路有限责任公司 | Display apparatus of EEPROM in emulator |
| CN101751322B (en) * | 2008-11-28 | 2012-06-06 | 上海华虹集成电路有限责任公司 | Contact type intelligent card emulator and breakpoint setting method |
| CN101751328B (en) * | 2008-12-12 | 2011-07-27 | 北京中电华大电子设计有限责任公司 | Simulation method of FLASH/electrically erasable programmable read-only memory (EEPROM) |
| CN103678073A (en) * | 2012-09-25 | 2014-03-26 | 上海华虹集成电路有限责任公司 | Simulation system |
| CN104346207A (en) * | 2013-07-31 | 2015-02-11 | 上海华虹集成电路有限责任公司 | Simulator |
| CN104346249A (en) * | 2013-07-31 | 2015-02-11 | 上海华虹集成电路有限责任公司 | Simulation debugging system |
| CN104346249B (en) * | 2013-07-31 | 2016-03-02 | 上海华虹集成电路有限责任公司 | Emulation debugging system |
| CN105487968A (en) * | 2014-10-09 | 2016-04-13 | 上海华虹集成电路有限责任公司 | Simulator capable of equivalently realizing EEPROM (Electrically Erasable Programmable Read-Only Memory) |
| CN105573924A (en) * | 2014-10-09 | 2016-05-11 | 上海华虹集成电路有限责任公司 | Simulation system |
| CN105573924B (en) * | 2014-10-09 | 2018-06-19 | 上海华虹集成电路有限责任公司 | Analogue system |
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| Publication number | Publication date |
|---|---|
| CN1306408C (en) | 2007-03-21 |
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