CN1567509A - Method for repairing defects of electrode pattern - Google Patents
Method for repairing defects of electrode pattern Download PDFInfo
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- CN1567509A CN1567509A CNA031486819A CN03148681A CN1567509A CN 1567509 A CN1567509 A CN 1567509A CN A031486819 A CNA031486819 A CN A031486819A CN 03148681 A CN03148681 A CN 03148681A CN 1567509 A CN1567509 A CN 1567509A
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- electrode pattern
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- sunk part
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
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- Y02W—CLIMATE CHANGE MITIGATION TECHNOLOGIES RELATED TO WASTEWATER TREATMENT OR WASTE MANAGEMENT
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Abstract
The invention provides a method of repairing the defects in an electrode pattern, containing: executing a detecting program to detect if the electrode pattern on the plasma display has defects, executing a first repairing program to fill the sunk parts and executing a second program to eliminate the raised parts. In the first repairing program, it uses conductive plasma to fill the sunk parts and in the second one, uses a laser beam to eliminate the raised parts, so as to give full play to stable discharge of the electrode.
Description
Technical field
The invention provides the method for a kind of correction of the defect (defect), refer to a kind of method of utilizing electric conducting material and laser beam to repair the electrode pattern defective especially.
Background technology
Development along with electronics and information industry, flat-panel screens (flat panel display, FPD) application and demand constantly enlarge, plasma scope (plasma display panet wherein, PDP) because have that volume is little, characteristics such as large scale and visual angle are wide, therefore become the product that has development potentiality in the flat-panel screens.
Plasma scope consists predominantly of a prebasal plate (front substrate), one metacoxal plate (backsubstrate), one ionized gas (not shown) is filled in and is used for producing ultraviolet ray between prebasal plate and the metacoxal plate, and many electrode (sustain electrode) of keeping parallel to each other is arranged at the prebasal plate surface, use as discharge.Include many auxiliary electrodes (bus electrode) on the prebasal plate in addition, be electrically connected on respectively respectively and keep on the electrode.Then include a plurality of addressing-electrodes (address electrode) on the metacoxal plate, its direction is with respectively to keep electrode vertical, and a plurality of barrier ribs (rib), its direction is parallel with each addressing-electrode, and a fluorescent layer is coated on each barrier rib sidewall and each addressing-electrode.Wherein, appoint two adjacent barrier ribs and its top corresponding two to keep electrode and form a discharge cell (discharge cell) as luminous usefulness.Generally speaking, plasma scope is to be arranged in a combination by hundreds thousand of individual discharge cells of hundreds of microns approximately, its principle of luminosity is to give this to keeping electrode one starting resistor, make and be filled in ionized gas discharge between prebasal plate and metacoxal plate and the generation ultraviolet ray, when ultraviolet irradiation difference fluorescent layer, just can make the fluorescent layer of each discharge cell send redness, green and blue light respectively as showing usefulness.
As known from the above, but plasma scope can normal operation wherein a key factor be each discharge cell keep whether regular picture of electrode pair, make ionization produce ultraviolet ray.And keep reason that electrode can't discharge often because in the manufacturing process of electrode pattern, because making electrode pattern produce defective, all factors cause.In addition, because the too high meeting of starting resistor of keeping electrode causes plasma scope overheated and cause component life to shorten easily, therefore on electrode pattern design, also constantly weed out the old and bring forth the new, in the hope of reducing the starting resistor of keeping electrode, put the also raising relatively of electrode pattern complexity before this, so the making of electrode pattern is complicated more.To keep electrode is example, the material of keeping electrode is a transparent conductive material, as tin indium oxide (ITO) or indium zinc oxide (IZO) etc., its manufacture method generally is with sputtering way transparent conductive material to be formed at the prebasal plate surface earlier, utilizes a mask and etch process to define electrode pattern then.Yet under the situation that electrode pattern precision constantly promotes, live width is more and more little, electrode pattern is easy to the existence because of particulate (particle), or the scratch on the mask produces defective, cause keep electrode can't stable discharging behind the starting resistor of being scheduled to, or cause and keep electrode in the situation that does not give paradoxical discharge under the situation of starting resistor.
The electrode pattern defective of plasma scope causes the electrode discharge poor effect, and the plasma scope display effect is worsened, yet there is no relevant solution for the defective that is caused at present when making electrode pattern.Manufacturer often adopts looser product pipe standards, using the raising yield avoids raising the cost in a large number, but even so, still have the plasma scope of significant proportion because the electrode pattern defective too much has a strong impact on the plasma scope quality, even scrap, have a strong impact on the production capacity of plasma scope.Therefore for the high plasma scope of present cost, how solving the electrode pattern defective to promote the stability of electrode discharge, is that suitable important topic is gone up in present plasma scope research and development.
Summary of the invention
Therefore main purpose of the present invention is to provide a kind of method of repairing plasma scope electrode pattern defective, to solve the problem that above-mentioned electrode pattern defective is caused.
The invention provides a kind of method of repairing the electrode pattern defective.This method includes carries out a trace routine, whether have defective with the electrode pattern that detects on this plasma display, carry out one first Hotfix, to fill up the sunk part of this electrode pattern, and carry out one second Hotfix, to remove the ledge of this electrode pattern.Wherein in this first Hotfix, be to utilize an electrocondution slurry to fill up the sunk part of this electrode pattern, and in this second Hotfix, be to utilize a laser beam (laser beam) to remove the ledge of this electrode pattern, make the electrode pattern of the plasma scope discharging function of playing stably.
Because the present invention repairs the method for electrode pattern defective, utilize one first Hotfix to fill up the sunk part of electrode pattern with electrocondution slurry, and utilize one second Hotfix to remove the ledge of this electrode pattern with laser beam, can electrode pattern because of manufacturing process in unavoidable pollution or other factors effectively repair after producing defective, avoiding plasma scope to keep electrode because of minority can't regular picture influence whole display effect.
Description of drawings
In order further to understand feature of the present invention and technology contents, see also following about detailed description of the present invention and accompanying drawing.Yet accompanying drawing is only for reference and explanation usefulness, is not to be used for the present invention is limited, wherein:
Fig. 1 repairs the flow chart of electrode pattern method for the present invention;
Fig. 2 repairs the schematic diagram of electrode pattern for first embodiment of the invention;
Fig. 3 repairs the schematic diagram of electrode pattern for second embodiment of the invention;
Fig. 4 repairs the schematic diagram of electrode pattern for third embodiment of the invention; And
Fig. 5 repairs the schematic diagram of electrode pattern for fourth embodiment of the invention.
Description of reference numerals in the accompanying drawing is as follows:
10 electrode patterns, 12 transparency electrodes
14 auxiliary electrodes, 16 sunk parts
17 broken string parts, 18 electrocondution slurries
20 sunk parts, 30 electrode patterns
32 transparency electrodes, 34 auxiliary electrodes
100 beginnings of 36 ledges
110 carry out a trace routine
120 judge whether defectiveness of electrode pattern
130 carry out one first Hotfix
140 carry out one second Hotfix
150 finish
Embodiment
Please refer to Fig. 1, Fig. 1 repairs the flow chart of the method for electrode pattern defective for the present invention.As shown in Figure 1, the present invention's method of repairing the electrode pattern defective includes the following step:
Step 100: beginning;
Step 110: carry out a trace routine, detect the electrode pattern of plasma scope;
Step 120: judge whether defectiveness of electrode pattern,, then do not finish to repair flow process if having if defectiveness is then repaired;
Step 130: carry out one first Hotfix, to fill up the sunk part of electrode pattern;
Step 140: carry out one second Hotfix, to remove the ledge of electrode pattern; And
Step 150: finish.
As mentioned above, the method that the present invention repairs the electrode pattern defective is to carry out a trace routine after the plasma scope electrode pattern completes, utilize optical detection or electro-detection mode to judge whether defectiveness of electrode pattern, if electrode pattern has defective and then carries out follow-up Hotfix, if the electrode pattern zero defect then finishes Hotfix, then carry out first Hotfix, fill up the holes of electrode pattern, not exclusively be electrically connected or sunk part such as broken string, and carry out one second Hotfix, remove the ledge of electrode pattern.Wherein, this first Hotfix is to utilize an electric conducting material, as silver paste (silverpaste), the gold paste material, elargol, contain the slurry of electrically conducting transparent materials such as ITO or IZO etc., spread upon the holes of this electrode pattern, sunk parts such as incomplete electrical connection or broken string, make its recovery or receive original electrode pattern, to reach the regular picture function, second Hotfix then is to utilize a laser beam with the outstanding part excision that maybe should not exist of electrode pattern, make and keep electrode and keep normal discharging gap (discharge gap), avoid the discharge cell of plasma scope to produce abnormal discharge situation.
Please refer to Fig. 2, Fig. 2 repairs the schematic diagram of electrode pattern 10 for first embodiment of the invention.As shown in Figure 2, electrode pattern 10 is the electrode of keeping of a plasma display, includes an envelope transparency electrode 12, and on each transparency electrode 12 and be connected with an auxiliary electrode 14, be used for increasing the conductivity of transparency electrode 12, and unusual sunk parts such as holes 16.Repair the method for electrode pattern according to first embodiment of the invention, when carrying out trace routine or electro-detection program and detecting electrode pattern 10 when including sunk part 16, the present invention promptly utilizes an electrocondution slurry 18, as above-mentioned silver paste (silverpaste), ITO slurry, IZO slurry, gold paste material or elargol etc., spread upon the sunk part 16 of electrode pattern 10, fill up sunk part 16 to utilize electrocondution slurry 18, make electrode pattern 10 revert to complete electrode pattern, and then the conduction discharging function of bringing into normal play.
Please refer to Fig. 3, Fig. 3 repairs the schematic diagram of electrode pattern 10 for second embodiment of the invention.As shown in Figure 3, electrode pattern 10 is the electrode of keeping of a plasma display, includes a pair of auxiliary electrode 14, a plurality ofly is connected in this to T type transparency electrode 12 relative on the auxiliary electrode 14, and unusual electrode broken string part 17.The shape of transparency electrode 12 in the present embodiment and arrangement are more stable for the discharging function that makes transparency electrode 12, but relatively are easy to generate as shown in Figure 3 abnormal broken line part 17 in manufacturing process.Similarly repair the method for electrode pattern according to first embodiment of the invention, when carrying out trace routine or electro-detection program and detecting electrode pattern 10 includes broken string during part 17, the present invention promptly utilizes an electrocondution slurry 18, as above-mentioned silver paste, ITO slurry, IZO slurry, gold paste material or elargol etc., spread upon the broken string part 17 of electrode pattern 10, utilize electrocondution slurry 18 to fill up broken string part 17, make electrode pattern 10 revert to complete electrode pattern, and then the conduction discharging function of bringing into normal play.
As mentioned above, utilize sunk part 16 or broken string part 17 complete fill up of electrocondution slurry 18 with electrode pattern 10, but Efficient software patching electrode pattern 10, and the electrode that the makes plasma scope discharging function of bringing into normal play, yet because electrocondution slurry 18 generally is by including the not good metal materials of light transmittance such as silver or gold, so utilize electrocondution slurry 18 that though the complete sunk part 16 of filling up electrode pattern or broken string part 17 can be made the electrode function of bringing into normal play, but if the area of sunk part 16 or broken string part 17 is bigger, then electrocondution slurry 18 may influence the light transmittance of plasma scope discharge cell, causes the display brightness deficiency.Therefore the mode of utilizing part to fill up in third embodiment of the invention is repaired the sunk part 16 of electrode pattern 10, in the hope of under the situation that does not influence the discharge cell light transmittance, make the electrode discharging function of bringing into normal play, part method for repairing and mending as for the broken string part 17 of electrode pattern 10, with the method for repairing and mending of sunk part 16, below seldom give unnecessary details.
Please refer to Fig. 4, Fig. 4 repairs the schematic diagram of electrode pattern 10 for third embodiment of the invention.As shown in Figure 4, electrode pattern 10 is the electrode of keeping of a plasma display, includes a pair of transparency electrode 12, and all is connected with an auxiliary electrode 14 on the transparency electrode 12, is used for increasing the conductivity of transparency electrode 12, and a unusual sunk part 16.Repair the method for electrode pattern according to second embodiment of the invention, when carrying out trace routine, detect electrode pattern 10 when including sunk part 16, the present invention promptly utilizes an electrocondution slurry 18, spread upon the sunk part 16 of electrode pattern 10, to utilize electrocondution slurry 18 to fill up sunk part 16 electrode pattern 10 is regained one's integrity, reach the regular picture function.Wherein, be with first embodiment of the invention main difference part, in third embodiment of the invention, influence plasma scope discharge cell light transmittance for avoiding electrocondution slurry 18, so the mode that adopts part to fill up is filled up sunk part 16, repairs electrode pattern 10.As shown in Figure 4, the sunk part 16 of electrode pattern 10 only has the subregion to be filled up with electrocondution slurry 18, forms a strip and repairs lines, so not only can recover the discharging function of electrode, can take into account light transmittance again.Another sunk part 20 is as shown in Figure 4 repaired lines because area is bigger so utilize electrocondution slurry 18 to fill up out two strips in addition, makes electrode regular picture.It should be noted that in addition in the third embodiment of the present invention, owing to be that the mode of utilizing part to repair is repaired electrode pattern 10, therefore when carrying out trace routine 110, promptly judge the kind of electrode pattern 10 sunk parts earlier, make and when carrying out first Hotfix 130, can adjust quantity and the shape that electrocondution slurry 18 is filled up, under the prerequisite that does not influence the plasma scope light transmittance, Efficient software patching electrode pattern 10 makes the electrode discharging function of bringing into normal play.
Please refer to Fig. 5, Fig. 5 repairs the schematic diagram of electrode pattern 30 for fourth embodiment of the invention.As shown in Figure 5, electrode pattern 30 is the electrode of keeping of a plasma display, includes a pair of transparency electrode 32, and on the transparency electrode 32 and be connected with an auxiliary electrode 34, is used for increasing the conductivity of transparency electrode 32, and unusual ledge 36.Wherein the ledge 36 on the transparency electrode 32 may shorten the discharging gap of keeping electrode and causes discharge instability, or touching relative transparency electrode 32 forms short circuit, and cause the continuous discharge of plasma scope discharge cell, make to produce bright spot on the plasma scope screen.Repair the method for electrode pattern according to third embodiment of the invention, when carrying out trace routine, detect electrode pattern 30 when including ledge 36, the present invention promptly utilizes a laser beam to remove the ledge 36 of electrode pattern 30, avoids electrode to produce paradoxical discharge.
The electrode pattern of plasma scope is because factors such as particle contamination are easy to generate defective, it is complicated day by day to add electrode pattern design, the ratio that makes the electrode pattern defective produce improves relatively, and the cost costliness of plasma scope, it is quite big for the manufacturing cost influence to produce yield, therefore the invention provides a kind of method of repairing electrode pattern, include and carry out a trace routine, to detect the electrode pattern defective on this plasma display, carry out one first Hotfix, filling up the sunk part of this electrode pattern, and carry out one second Hotfix, to remove the ledge of this electrode pattern.That is utilize an electrocondution slurry to fill up the electrode pattern sunk part respectively, and utilize a laser beam to remove the electrode pattern ledge, but therefore different types of defective on the Efficient software patching electrode pattern make the electrode discharging function of bringing into normal play.And method of the present invention also can reasonably be applied in the auxiliary electrode (bus electrode) and the addressing-electrode (address electrode) of plasma scope, or even the electrode repair technology of other Electro-Optical Displays.
The above only is the preferred embodiments of the present invention, and all equalizations of doing according to claims of the present invention change and modify, and all should belong to the covering scope of patent of the present invention.
Claims (21)
1. the method for a defect mending, it is used for repairing the defective of the electrode pattern on the substrate, and this method includes:
Carry out a trace routine, whether have defective with this electrode pattern that detects on this substrate; And
Carry out one first Hotfix, to repair the defective of this electrode pattern.
2. the method for claim 1, wherein this electrode pattern is the electrode pattern of keeping of a plasma display.
3. method as claimed in claim 2, wherein this material of keeping electrode pattern includes a transparent conductive material or a metallic conduction material.
4. the method for claim 1, wherein the defective packets of this electrode pattern contains holes, not exclusively is electrically connected or sunk part such as broken string.
5. method as claimed in claim 4, wherein this first Hotfix utilizes an electric conducting material to fill up this sunk part.
6. method as claimed in claim 5, wherein this first Hotfix is intactly filled up this sunk part.
7. method as claimed in claim 5, wherein this first Hotfix is partly filled up this sunk part.
8. method as claimed in claim 5, wherein this electric conducting material includes silver paste, tin indium oxide slurry, indium zinc oxide slurry, gold paste material, or elargol.
9. the method for claim 1, wherein the defective packets of this electrode pattern contains a ledge.
10. method as claimed in claim 9 also includes one second Hotfix, and this second Hotfix utilizes a laser beam to remove this ledge.
11. the method for claim 1, wherein this trace routine includes optical detection program or electro-detection program.
12. the method for a defect mending, it is used for repairing the defective of the electrode pattern on the plasma display, and the defective packets of this electrode pattern contains one first defective and one second defective, and this method includes:
Carry out a trace routine, to detect the defective of this electrode pattern on this plasma display;
Carry out one first Hotfix, to repair this first defective; And
Carry out one second Hotfix, to remove this second defective.
13. method as claimed in claim 11, wherein the material of this electrode pattern includes a transparent conductive material or a metallic conduction material.
14. method as claimed in claim 11, wherein this first defective packets contains holes, not exclusively is electrically connected or sunk part such as broken string.
15. method as claimed in claim 13, wherein this first Hotfix utilizes an electric conducting material to fill up this sunk part of this electrode pattern.
16. method as claimed in claim 14, wherein this electric conducting material includes silver paste, tin indium oxide slurry, indium zinc oxide slurry, gold paste material, or elargol.
17. method as claimed in claim 14, wherein this first Hotfix utilizes this electric conducting material intactly to fill up this sunk part.
18. method as claimed in claim 14, wherein this first Hotfix utilizes this electric conducting material partly to fill up this sunk part.
19. method as claimed in claim 11, wherein this second defective is a ledge of this electrode pattern.
20. method as claimed in claim 18, wherein this second Hotfix utilizes a laser beam to remove this ledge.
21. method as claimed in claim 18, wherein this trace routine includes optical detection program or electro-detection program, and this electrode pattern includes and keeps electrode, auxiliary electrode and addressing-electrode.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNA031486819A CN1567509A (en) | 2003-06-17 | 2003-06-17 | Method for repairing defects of electrode pattern |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNA031486819A CN1567509A (en) | 2003-06-17 | 2003-06-17 | Method for repairing defects of electrode pattern |
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| Publication Number | Publication Date |
|---|---|
| CN1567509A true CN1567509A (en) | 2005-01-19 |
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| CNA031486819A Pending CN1567509A (en) | 2003-06-17 | 2003-06-17 | Method for repairing defects of electrode pattern |
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Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN100452279C (en) * | 2005-07-18 | 2009-01-14 | 乐金电子（南京）等离子有限公司 | Method for manufacturing plasma display panel |
| CN101937819A (en) * | 2010-09-27 | 2011-01-05 | 四川虹欧显示器件有限公司 | Method and device for restoring electrode short-circuit defects of plasma display screen |
| CN102723249A (en) * | 2012-06-20 | 2012-10-10 | 安徽鑫昊等离子显示器件有限公司 | Method for restoring electrode of plasma display panel |
| CN104409320A (en) * | 2014-10-27 | 2015-03-11 | 昆山国显光电有限公司 | Substrate broken line restoration method and apparatus |
| CN107346641A (en) * | 2017-06-05 | 2017-11-14 | 莱特泰克（昆山）光电科技有限公司 | A kind of large display screen photoelectric glass manufacture method |
-
2003
- 2003-06-17 CN CNA031486819A patent/CN1567509A/en active Pending
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN100452279C (en) * | 2005-07-18 | 2009-01-14 | 乐金电子（南京）等离子有限公司 | Method for manufacturing plasma display panel |
| CN101937819A (en) * | 2010-09-27 | 2011-01-05 | 四川虹欧显示器件有限公司 | Method and device for restoring electrode short-circuit defects of plasma display screen |
| CN101937819B (en) * | 2010-09-27 | 2012-09-05 | 四川虹欧显示器件有限公司 | Method and device for restoring electrode short-circuit defects of plasma display screen |
| CN102723249A (en) * | 2012-06-20 | 2012-10-10 | 安徽鑫昊等离子显示器件有限公司 | Method for restoring electrode of plasma display panel |
| CN104409320A (en) * | 2014-10-27 | 2015-03-11 | 昆山国显光电有限公司 | Substrate broken line restoration method and apparatus |
| CN107346641A (en) * | 2017-06-05 | 2017-11-14 | 莱特泰克（昆山）光电科技有限公司 | A kind of large display screen photoelectric glass manufacture method |
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