CN1502066A - 集成多工艺控制器的方法和装置 - Google Patents
集成多工艺控制器的方法和装置 Download PDFInfo
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- CN1502066A CN1502066A CNA018227414A CN01822741A CN1502066A CN 1502066 A CN1502066 A CN 1502066A CN A018227414 A CNA018227414 A CN A018227414A CN 01822741 A CN01822741 A CN 01822741A CN 1502066 A CN1502066 A CN 1502066A
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- 238000000034 method Methods 0.000 title claims abstract description 64
- 230000008569 process Effects 0.000 title abstract description 49
- 238000013515 script Methods 0.000 claims abstract description 72
- 230000009471 action Effects 0.000 claims abstract description 42
- 238000004519 manufacturing process Methods 0.000 claims abstract description 22
- 238000012545 processing Methods 0.000 claims abstract description 11
- 230000008859 change Effects 0.000 claims description 5
- 238000011084 recovery Methods 0.000 claims description 3
- 230000000977 initiatory effect Effects 0.000 abstract 1
- 230000006870 function Effects 0.000 description 23
- 238000005516 engineering process Methods 0.000 description 19
- 238000010586 diagram Methods 0.000 description 11
- 238000004891 communication Methods 0.000 description 10
- 239000004065 semiconductor Substances 0.000 description 10
- 238000007405 data analysis Methods 0.000 description 6
- 230000018109 developmental process Effects 0.000 description 6
- 238000003754 machining Methods 0.000 description 6
- 238000007726 management method Methods 0.000 description 6
- 235000012431 wafers Nutrition 0.000 description 6
- 238000011161 development Methods 0.000 description 4
- 230000008901 benefit Effects 0.000 description 3
- 230000002950 deficient Effects 0.000 description 3
- 230000001419 dependent effect Effects 0.000 description 3
- 230000008021 deposition Effects 0.000 description 3
- 230000003993 interaction Effects 0.000 description 3
- 230000002452 interceptive effect Effects 0.000 description 3
- 230000004048 modification Effects 0.000 description 3
- 238000012986 modification Methods 0.000 description 3
- 238000000206 photolithography Methods 0.000 description 3
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 3
- 229920005591 polysilicon Polymers 0.000 description 3
- 238000003860 storage Methods 0.000 description 3
- 230000000712 assembly Effects 0.000 description 2
- 238000000429 assembly Methods 0.000 description 2
- 230000003139 buffering effect Effects 0.000 description 2
- 238000004422 calculation algorithm Methods 0.000 description 2
- 238000004364 calculation method Methods 0.000 description 2
- 239000003054 catalyst Substances 0.000 description 2
- 238000010276 construction Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000007689 inspection Methods 0.000 description 2
- 238000009434 installation Methods 0.000 description 2
- 238000005498 polishing Methods 0.000 description 2
- 241001269238 Data Species 0.000 description 1
- 230000004913 activation Effects 0.000 description 1
- 230000002776 aggregation Effects 0.000 description 1
- 238000004220 aggregation Methods 0.000 description 1
- 230000004075 alteration Effects 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 238000013480 data collection Methods 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 238000002513 implantation Methods 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 238000003780 insertion Methods 0.000 description 1
- 230000037431 insertion Effects 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 230000009191 jumping Effects 0.000 description 1
- 230000000873 masking effect Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000007620 mathematical function Methods 0.000 description 1
- 230000006386 memory function Effects 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 238000005457 optimization Methods 0.000 description 1
- 239000013618 particulate matter Substances 0.000 description 1
- 238000002203 pretreatment Methods 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 238000005070 sampling Methods 0.000 description 1
- 241000894007 species Species 0.000 description 1
- 230000000153 supplemental effect Effects 0.000 description 1
Images
Classifications
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B19/00—Programme-control systems
- G05B19/02—Programme-control systems electric
- G05B19/418—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS], computer integrated manufacturing [CIM]
- G05B19/41865—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS], computer integrated manufacturing [CIM] characterised by job scheduling, process planning, material flow
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B19/00—Programme-control systems
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B19/00—Programme-control systems
- G05B19/02—Programme-control systems electric
- G05B19/18—Numerical control [NC], i.e. automatically operating machines, in particular machine tools, e.g. in a manufacturing environment, so as to execute positioning, movement or co-ordinated operations by means of programme data in numerical form
- G05B19/4093—Numerical control [NC], i.e. automatically operating machines, in particular machine tools, e.g. in a manufacturing environment, so as to execute positioning, movement or co-ordinated operations by means of programme data in numerical form characterised by part programming, e.g. entry of geometrical information as taken from a technical drawing, combining this with machining and material information to obtain control information, named part programme, for the NC machine
- G05B19/40937—Numerical control [NC], i.e. automatically operating machines, in particular machine tools, e.g. in a manufacturing environment, so as to execute positioning, movement or co-ordinated operations by means of programme data in numerical form characterised by part programming, e.g. entry of geometrical information as taken from a technical drawing, combining this with machining and material information to obtain control information, named part programme, for the NC machine concerning programming of machining or material parameters, pocket machining
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
- Y02P90/02—Total factory control, e.g. smart factories, flexible manufacturing systems [FMS] or integrated manufacturing systems [IMS]
Abstract
Description
Claims (10)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US09/789,140 | 2001-02-20 | ||
US09/789,140 US6801817B1 (en) | 2001-02-20 | 2001-02-20 | Method and apparatus for integrating multiple process controllers |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1502066A true CN1502066A (zh) | 2004-06-02 |
CN1307496C CN1307496C (zh) | 2007-03-28 |
Family
ID=25146700
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CNB018227414A Expired - Fee Related CN1307496C (zh) | 2001-02-20 | 2001-10-22 | 集成多工艺控制器的方法和装置 |
Country Status (9)
Country | Link |
---|---|
US (1) | US6801817B1 (zh) |
EP (1) | EP1415126B1 (zh) |
JP (1) | JP2004531794A (zh) |
KR (1) | KR100804287B1 (zh) |
CN (1) | CN1307496C (zh) |
AU (1) | AU2002228893A1 (zh) |
DE (1) | DE60127319T2 (zh) |
TW (1) | TW574639B (zh) |
WO (1) | WO2002066923A2 (zh) |
Families Citing this family (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20100153183A1 (en) * | 1996-09-20 | 2010-06-17 | Strategyn, Inc. | Product design |
US9785140B2 (en) | 2000-02-01 | 2017-10-10 | Peer Intellectual Property Inc. | Multi-protocol multi-client equipment server |
EP1546827A1 (en) * | 2002-09-30 | 2005-06-29 | Tokyo Electron Limited | Method and apparatus for the monitoring and control of a semiconductor manufacturing process |
US20060167947A1 (en) | 2003-03-01 | 2006-07-27 | Dunkle Mark V | Communications interface database for electronic diagnostic apparatus |
US7375035B2 (en) * | 2003-04-29 | 2008-05-20 | Ronal Systems Corporation | Host and ancillary tool interface methodology for distributed processing |
US20050192690A1 (en) * | 2004-02-26 | 2005-09-01 | Taiwan Semiconductor Manufacturing Co. | Chip probing equipment and test modeling for next generation MES (300MM) |
US7457671B2 (en) * | 2004-09-30 | 2008-11-25 | Rockwell Automation Technologies, Inc. | Systems and methods that facilitate management of add-on instruction generation, selection, and/or monitoring during execution |
US7672749B1 (en) * | 2005-12-16 | 2010-03-02 | GlobalFoundries, Inc. | Method and apparatus for hierarchical process control |
US8214244B2 (en) | 2008-05-30 | 2012-07-03 | Strategyn, Inc. | Commercial investment analysis |
US8666977B2 (en) | 2009-05-18 | 2014-03-04 | Strategyn Holdings, Llc | Needs-based mapping and processing engine |
TWI512415B (zh) * | 2014-09-04 | 2015-12-11 | Formosa Plastics Corp | 製程控制系統 |
JP7465056B2 (ja) * | 2018-05-25 | 2024-04-10 | 株式会社東芝 | 分析用データ作成装置 |
JP6870664B2 (ja) * | 2018-07-10 | 2021-05-12 | 株式会社安川電機 | 制御システム、制御装置及びプログラム |
Family Cites Families (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4472783A (en) * | 1980-07-21 | 1984-09-18 | Kearney & Trecker Corporation | Flexible manufacturing system |
GB2128607A (en) * | 1982-10-18 | 1984-05-02 | Ici Plc | An enantiomeric pair of cyhalothrin isomers and process for preparation thereof |
DE3581000D1 (de) * | 1984-05-19 | 1991-02-07 | British Aerospace | Industrielle verarbeitungs- und herstellungsverfahren. |
US4606001A (en) * | 1984-05-22 | 1986-08-12 | General Electric Company | Customized canned cycles for computer numerical control system |
US4842528A (en) * | 1987-03-27 | 1989-06-27 | Amp Incorporated | Solder post retention means |
US4912625A (en) * | 1987-09-30 | 1990-03-27 | The Boeing Company | Graphics verification system for numerical control programs |
DE19508476A1 (de) * | 1995-03-09 | 1996-09-12 | Siemens Ag | Leitsystem für eine Anlage der Grundstoff- oder der verarbeitenden Industrie o. ä. |
JP3114159B2 (ja) * | 1995-11-29 | 2000-12-04 | 株式会社荏原製作所 | 鋳型製造方法 |
GB2329041B (en) * | 1996-06-13 | 1999-09-08 | Mitsubishi Electric Corp | Automatic programming device for multi-system machine tool |
US6240330B1 (en) * | 1997-05-28 | 2001-05-29 | International Business Machines Corporation | Method for feedforward corrections for off-specification conditions |
US6424878B1 (en) * | 1998-04-28 | 2002-07-23 | International Business Machines Corporation | Method and apparatus for implementing custom business logic |
US6292708B1 (en) * | 1998-06-11 | 2001-09-18 | Speedfam-Ipec Corporation | Distributed control system for a semiconductor wafer processing machine |
US7069101B1 (en) * | 1999-07-29 | 2006-06-27 | Applied Materials, Inc. | Computer integrated manufacturing techniques |
-
2001
- 2001-02-20 US US09/789,140 patent/US6801817B1/en not_active Expired - Fee Related
- 2001-10-22 CN CNB018227414A patent/CN1307496C/zh not_active Expired - Fee Related
- 2001-10-22 JP JP2002566601A patent/JP2004531794A/ja active Pending
- 2001-10-22 EP EP01990016A patent/EP1415126B1/en not_active Expired - Lifetime
- 2001-10-22 WO PCT/US2001/047271 patent/WO2002066923A2/en active IP Right Grant
- 2001-10-22 KR KR1020037010629A patent/KR100804287B1/ko not_active IP Right Cessation
- 2001-10-22 DE DE60127319T patent/DE60127319T2/de not_active Expired - Lifetime
- 2001-10-22 AU AU2002228893A patent/AU2002228893A1/en not_active Abandoned
- 2001-12-18 TW TW90131299A patent/TW574639B/zh not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
TW574639B (en) | 2004-02-01 |
AU2002228893A1 (en) | 2002-09-04 |
JP2004531794A (ja) | 2004-10-14 |
DE60127319T2 (de) | 2008-01-10 |
WO2002066923A3 (en) | 2004-02-19 |
EP1415126A2 (en) | 2004-05-06 |
DE60127319D1 (de) | 2007-04-26 |
WO2002066923A2 (en) | 2002-08-29 |
US6801817B1 (en) | 2004-10-05 |
CN1307496C (zh) | 2007-03-28 |
KR100804287B1 (ko) | 2008-02-18 |
EP1415126B1 (en) | 2007-03-14 |
KR20030078911A (ko) | 2003-10-08 |
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C06 | Publication | ||
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C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
ASS | Succession or assignment of patent right |
Owner name: GLOBALFOUNDRIES Free format text: FORMER OWNER: ADVANCED MICRO DEVICES INC. Effective date: 20100705 |
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C41 | Transfer of patent application or patent right or utility model | ||
COR | Change of bibliographic data |
Free format text: CORRECT: ADDRESS; FROM: CALIFORNIA, THE UNITED STATES TO: CAYMAN ISLANDS, BRITISH |
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TR01 | Transfer of patent right |
Effective date of registration: 20100705 Address after: Grand Cayman, Cayman Islands Patentee after: Globalfoundries Semiconductor Inc. Address before: American California Patentee before: Advanced Micro Devices Inc. |
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CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20070328 Termination date: 20161022 |
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CF01 | Termination of patent right due to non-payment of annual fee |