CN1438668A - 荫罩的制造方法以及荫罩制造用耐腐蚀层涂敷装置 - Google Patents

荫罩的制造方法以及荫罩制造用耐腐蚀层涂敷装置 Download PDF

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Publication number
CN1438668A
CN1438668A CN03120057A CN03120057A CN1438668A CN 1438668 A CN1438668 A CN 1438668A CN 03120057 A CN03120057 A CN 03120057A CN 03120057 A CN03120057 A CN 03120057A CN 1438668 A CN1438668 A CN 1438668A
Authority
CN
China
Prior art keywords
thin plate
metal thin
corrosion layer
band metal
type surface
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN03120057A
Other languages
English (en)
Chinese (zh)
Inventor
二阶堂胜
大川猛
隈本健二
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Publication of CN1438668A publication Critical patent/CN1438668A/zh
Pending legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G01R1/06722—Spring-loaded
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G01R1/0441—Details
    • G01R1/0466—Details concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G01R1/0483—Sockets for un-leaded IC's having matrix type contact fields, e.g. BGA or PGA devices; Sockets for unpackaged, naked chips
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • ing And Chemical Polishing (AREA)
  • Coating Apparatus (AREA)
  • Application Of Or Painting With Fluid Materials (AREA)
CN03120057A 2002-02-07 2003-01-31 荫罩的制造方法以及荫罩制造用耐腐蚀层涂敷装置 Pending CN1438668A (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2002031352A JP2003234065A (ja) 2002-02-07 2002-02-07 シャドウマスクの製造方法およびシャドウマスク製造用耐エッチング層塗布装置
JP2002031352 2002-02-07

Publications (1)

Publication Number Publication Date
CN1438668A true CN1438668A (zh) 2003-08-27

Family

ID=27677931

Family Applications (1)

Application Number Title Priority Date Filing Date
CN03120057A Pending CN1438668A (zh) 2002-02-07 2003-01-31 荫罩的制造方法以及荫罩制造用耐腐蚀层涂敷装置

Country Status (3)

Country Link
JP (1) JP2003234065A (ko)
KR (1) KR100501478B1 (ko)
CN (1) CN1438668A (ko)

Also Published As

Publication number Publication date
KR20030067537A (ko) 2003-08-14
KR100501478B1 (ko) 2005-07-18
JP2003234065A (ja) 2003-08-22

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Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C02 Deemed withdrawal of patent application after publication (patent law 2001)
WD01 Invention patent application deemed withdrawn after publication