CN1432856A - 使用具有多晶半导体层的晶体管的图象显示装置及其制造方法 - Google Patents
使用具有多晶半导体层的晶体管的图象显示装置及其制造方法 Download PDFInfo
- Publication number
- CN1432856A CN1432856A CN03101599A CN03101599A CN1432856A CN 1432856 A CN1432856 A CN 1432856A CN 03101599 A CN03101599 A CN 03101599A CN 03101599 A CN03101599 A CN 03101599A CN 1432856 A CN1432856 A CN 1432856A
- Authority
- CN
- China
- Prior art keywords
- mentioned
- semiconductor layer
- gate electrode
- image display
- layer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000004065 semiconductor Substances 0.000 title claims abstract description 74
- 238000000034 method Methods 0.000 title claims description 16
- 239000012535 impurity Substances 0.000 claims abstract description 40
- 238000004519 manufacturing process Methods 0.000 claims abstract description 14
- 229910021420 polycrystalline silicon Inorganic materials 0.000 claims description 36
- 229910052796 boron Inorganic materials 0.000 claims description 15
- 229910021417 amorphous silicon Inorganic materials 0.000 claims description 12
- 229910052698 phosphorus Inorganic materials 0.000 claims description 10
- 239000011574 phosphorus Substances 0.000 claims description 10
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 claims description 9
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 claims description 9
- 229920005591 polysilicon Polymers 0.000 claims description 7
- 239000000758 substrate Substances 0.000 claims description 6
- 238000000137 annealing Methods 0.000 claims description 5
- 230000001678 irradiating effect Effects 0.000 claims description 5
- 238000010438 heat treatment Methods 0.000 claims description 4
- 238000009413 insulation Methods 0.000 abstract description 3
- 230000003247 decreasing effect Effects 0.000 abstract 1
- 239000010408 film Substances 0.000 description 46
- 239000010409 thin film Substances 0.000 description 31
- 239000003990 capacitor Substances 0.000 description 23
- 230000015572 biosynthetic process Effects 0.000 description 21
- 239000004973 liquid crystal related substance Substances 0.000 description 19
- 102100036464 Activated RNA polymerase II transcriptional coactivator p15 Human genes 0.000 description 13
- 101000713904 Homo sapiens Activated RNA polymerase II transcriptional coactivator p15 Proteins 0.000 description 13
- 229910004444 SUB1 Inorganic materials 0.000 description 13
- -1 phosphonium ion Chemical class 0.000 description 11
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 8
- 150000002500 ions Chemical class 0.000 description 8
- 229910052782 aluminium Inorganic materials 0.000 description 6
- 239000011248 coating agent Substances 0.000 description 6
- 238000000576 coating method Methods 0.000 description 6
- 238000002347 injection Methods 0.000 description 6
- 239000007924 injection Substances 0.000 description 6
- 229910004438 SUB2 Inorganic materials 0.000 description 5
- 101100311330 Schizosaccharomyces pombe (strain 972 / ATCC 24843) uap56 gene Proteins 0.000 description 5
- 239000004411 aluminium Substances 0.000 description 5
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 5
- 229920002120 photoresistant polymer Polymers 0.000 description 5
- 101150018444 sub2 gene Proteins 0.000 description 5
- 229910052681 coesite Inorganic materials 0.000 description 4
- 229910052906 cristobalite Inorganic materials 0.000 description 4
- 230000005684 electric field Effects 0.000 description 4
- 239000008393 encapsulating agent Substances 0.000 description 4
- 239000000377 silicon dioxide Substances 0.000 description 4
- 235000012239 silicon dioxide Nutrition 0.000 description 4
- 229910052682 stishovite Inorganic materials 0.000 description 4
- 229910052905 tridymite Inorganic materials 0.000 description 4
- 230000005540 biological transmission Effects 0.000 description 3
- 230000005855 radiation Effects 0.000 description 3
- 238000005229 chemical vapour deposition Methods 0.000 description 2
- 230000000052 comparative effect Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- MRNHPUHPBOKKQT-UHFFFAOYSA-N indium;tin;hydrate Chemical compound O.[In].[Sn] MRNHPUHPBOKKQT-UHFFFAOYSA-N 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 239000012528 membrane Substances 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 238000004151 rapid thermal annealing Methods 0.000 description 2
- 238000007789 sealing Methods 0.000 description 2
- 229910016006 MoSi Inorganic materials 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 238000005401 electroluminescence Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000012467 final product Substances 0.000 description 1
- 230000009931 harmful effect Effects 0.000 description 1
- 238000000059 patterning Methods 0.000 description 1
- 150000003017 phosphorus Chemical class 0.000 description 1
- 238000000206 photolithography Methods 0.000 description 1
- 238000005268 plasma chemical vapour deposition Methods 0.000 description 1
- 239000000047 product Substances 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 238000002834 transmittance Methods 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/66007—Multistep manufacturing processes
- H01L29/66075—Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials
- H01L29/66227—Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials the devices being controllable only by the electric current supplied or the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched, e.g. three-terminal devices
- H01L29/66409—Unipolar field-effect transistors
- H01L29/66477—Unipolar field-effect transistors with an insulated gate, i.e. MISFET
- H01L29/66742—Thin film unipolar transistors
- H01L29/6675—Amorphous silicon or polysilicon transistors
- H01L29/66757—Lateral single gate single channel transistors with non-inverted structure, i.e. the channel layer is formed before the gate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/40—Electrodes ; Multistep manufacturing processes therefor
- H01L29/43—Electrodes ; Multistep manufacturing processes therefor characterised by the materials of which they are formed
- H01L29/45—Ohmic electrodes
- H01L29/456—Ohmic electrodes on silicon
- H01L29/458—Ohmic electrodes on silicon for thin film silicon, e.g. source or drain electrode
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- Power Engineering (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Ceramic Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Nonlinear Science (AREA)
- Mathematical Physics (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Optics & Photonics (AREA)
- Thin Film Transistor (AREA)
- Liquid Crystal (AREA)
Abstract
Description
Claims (10)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP005845/2002 | 2002-01-15 | ||
JP2002005845 | 2002-01-15 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1432856A true CN1432856A (zh) | 2003-07-30 |
CN1213338C CN1213338C (zh) | 2005-08-03 |
Family
ID=27644769
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CNB031015999A Expired - Lifetime CN1213338C (zh) | 2002-01-15 | 2003-01-15 | 使用具有多晶半导体层的晶体管的图象显示装置 |
Country Status (4)
Country | Link |
---|---|
US (1) | US7009205B2 (zh) |
KR (1) | KR100547070B1 (zh) |
CN (1) | CN1213338C (zh) |
TW (1) | TWI224395B (zh) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7745293B2 (en) | 2004-06-14 | 2010-06-29 | Semiconductor Energy Laboratory Co., Ltd | Method for manufacturing a thin film transistor including forming impurity regions by diagonal doping |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100519377B1 (ko) * | 2003-04-08 | 2005-10-06 | 엘지.필립스 엘시디 주식회사 | 반사투과형 액정표시장치용 어레이기판 및 그 제조방법 |
KR100977223B1 (ko) * | 2003-09-25 | 2010-08-23 | 엘지디스플레이 주식회사 | 액정표시장치의 제조방법 |
KR100611652B1 (ko) * | 2004-06-28 | 2006-08-11 | 삼성에스디아이 주식회사 | 유기 전계 발광 표시 소자 및 그 제조방법 |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6429120B1 (en) * | 2000-01-18 | 2002-08-06 | Micron Technology, Inc. | Methods and apparatus for making integrated-circuit wiring from copper, silver, gold, and other metals |
TWI313059B (zh) * | 2000-12-08 | 2009-08-01 | Sony Corporatio | |
JP2002184710A (ja) * | 2000-12-18 | 2002-06-28 | Sony Corp | 半導体層のドーピング方法、薄膜半導体素子の製造方法、及び薄膜半導体素子 |
-
2003
- 2003-01-07 US US10/337,370 patent/US7009205B2/en not_active Expired - Lifetime
- 2003-01-14 KR KR1020030002365A patent/KR100547070B1/ko active IP Right Grant
- 2003-01-15 TW TW092100772A patent/TWI224395B/zh not_active IP Right Cessation
- 2003-01-15 CN CNB031015999A patent/CN1213338C/zh not_active Expired - Lifetime
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7745293B2 (en) | 2004-06-14 | 2010-06-29 | Semiconductor Energy Laboratory Co., Ltd | Method for manufacturing a thin film transistor including forming impurity regions by diagonal doping |
CN1770474B (zh) * | 2004-06-14 | 2011-12-14 | 株式会社半导体能源研究所 | 半导体器件及其制造方法 |
Also Published As
Publication number | Publication date |
---|---|
US7009205B2 (en) | 2006-03-07 |
CN1213338C (zh) | 2005-08-03 |
US20030164489A1 (en) | 2003-09-04 |
TWI224395B (en) | 2004-11-21 |
KR20030061677A (ko) | 2003-07-22 |
TW200306450A (en) | 2003-11-16 |
KR100547070B1 (ko) | 2006-01-31 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
ASS | Succession or assignment of patent right |
Free format text: FORMER OWNER: HITACHI DEVICE ENGINEERING CO., LTD. Owner name: IPS ALPHA SUPPORT CO., LTD. Owner name: HITACHI DISPLAY CO., LTD. Free format text: FORMER OWNER: HITACHI,LTD. Effective date: 20111122 Owner name: PANASONIC LCD CO., LTD. Free format text: FORMER OWNER: IPS ALPHA SUPPORT CO., LTD. |
|
C41 | Transfer of patent application or patent right or utility model | ||
TR01 | Transfer of patent right |
Effective date of registration: 20111122 Address after: Chiba County, Japan Co-patentee after: Panasonic Liquid Crystal Display Co.,Ltd. Patentee after: Hitachi Displays, Ltd. Address before: Chiba County, Japan Co-patentee before: IPS pioneer support society Patentee before: Hitachi Displays, Ltd. Effective date of registration: 20111122 Address after: Chiba County, Japan Co-patentee after: Hitachi Device Engineering Co.,Ltd. Patentee after: Hitachi Displays, Ltd. Address before: Tokyo, Japan Co-patentee before: Hitachi Device Engineering Co.,Ltd. Patentee before: Hitachi, Ltd. Effective date of registration: 20111122 Address after: Chiba County, Japan Co-patentee after: IPS Pioneer Support Society Patentee after: Hitachi Displays, Ltd. Address before: Chiba County, Japan Patentee before: Hitachi Displays, Ltd. Effective date of registration: 20111122 Address after: Chiba County, Japan Patentee after: Hitachi Displays, Ltd. Address before: Chiba County, Japan Co-patentee before: Hitachi Device Engineering Co.,Ltd. Patentee before: Hitachi Displays, Ltd. |
|
C56 | Change in the name or address of the patentee |
Owner name: JAPAN DISPLAY, INC. Free format text: FORMER NAME: APAN DISPLAY EAST, INC. Owner name: APAN DISPLAY EAST, INC. Free format text: FORMER NAME: HITACHI DISPLAY CO., LTD. |
|
CP01 | Change in the name or title of a patent holder |
Address after: Chiba County, Japan Patentee after: Japan Display East Inc. Patentee after: Panasonic Liquid Crystal Display Co.,Ltd. Address before: Chiba County, Japan Patentee before: Hitachi Displays, Ltd. Patentee before: Panasonic Liquid Crystal Display Co.,Ltd. Address after: Chiba County, Japan Patentee after: JAPAN DISPLAY Inc. Patentee after: Panasonic Liquid Crystal Display Co.,Ltd. Address before: Chiba County, Japan Patentee before: Japan Display East Inc. Patentee before: Panasonic Liquid Crystal Display Co.,Ltd. |
|
CP02 | Change in the address of a patent holder |
Address after: Tokyo, Japan Patentee after: JAPAN DISPLAY Inc. Patentee after: Panasonic Liquid Crystal Display Co.,Ltd. Address before: Chiba County, Japan Patentee before: JAPAN DISPLAY Inc. Patentee before: Panasonic Liquid Crystal Display Co.,Ltd. |
|
EE01 | Entry into force of recordation of patent licensing contract |
Application publication date: 20030730 Assignee: BOE TECHNOLOGY GROUP Co.,Ltd. Assignor: JAPAN DISPLAY Inc.|Panasonic Liquid Crystal Display Co.,Ltd. Contract record no.: 2013990000688 Denomination of invention: Image display unit with transistor possessing polycrystal semiconductor layer and its making process Granted publication date: 20050803 License type: Common License Record date: 20131016 |
|
LICC | Enforcement, change and cancellation of record of contracts on the licence for exploitation of a patent or utility model | ||
CX01 | Expiry of patent term | ||
CX01 | Expiry of patent term |
Granted publication date: 20050803 |