CN1417589A - Probe card for LCD detection - Google Patents
Probe card for LCD detection Download PDFInfo
- Publication number
- CN1417589A CN1417589A CN02145991A CN02145991A CN1417589A CN 1417589 A CN1417589 A CN 1417589A CN 02145991 A CN02145991 A CN 02145991A CN 02145991 A CN02145991 A CN 02145991A CN 1417589 A CN1417589 A CN 1417589A
- Authority
- CN
- China
- Prior art keywords
- chaining pin
- guide plate
- mentioned
- lcd
- plate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R33/00—Coupling devices specially adapted for supporting apparatus and having one part acting as a holder providing support and electrical connection via a counterpart which is structurally associated with the apparatus, e.g. lamp holders; Separate parts thereof
- H01R33/94—Holders formed as intermediate parts for linking a counter-part to a coupling part
Abstract
The present invention provides a probe card for testing a liquid crystal display which is consisted of an assembly holder, a substrate holder, a needle holder, a circuit substrate with driver IC thereon that is sticked on the upper surface, a guide plate sticked at the bottom surface of the needle holder which is consist of a plurality of needle insert trench formed on the upper surface and an align trench formed at the outer surface of two side and parallel to the needle insert trench and is formed through the needle insert trench, and a needle plate inserted to the needle trench of guide plate which is flexible at two end, one end of the needle plate is through the guide hole formed on the guide plate to form an LCD connect end, the another end of the needle plate is stand out the upper surface of guide plate to form substrate connect end, and the needle plate connect to the outside surface of the needle holder that is stand out the upper surface of back end of needle holder to form a salient.
Description
Technical field
The present invention relates to a kind of LCD and check and use probe, and particularly relate to a kind ofly by dwindling the insertion thickness of chaining pin plate, and the thickness of the guide plate of the silicon materials that support above-mentioned chaining pin plate is dwindled, and when saving manufacturing expense, the slimming of promotion probe; Especially each of the chaining pin plate by stably protecting the contact circuit pattern connects terminally, and the LCD that can promote the performance checking efficiency of LCD checks and uses probe.
Background technology
In general, as image display as micro television and notebook, mainly be to use LCD (liquid crystal indicator), be provided with in order to apply tens of and even hundreds of splicing ears of electric signal (as signal of video signal, synchronizing signal, form and aspect signal etc.) in that the edge part of this LCD is highdensity, such LCD is before adorning in product, by applying experimental signal, and implement to check or the test picture whether bad picture shows checks.
The parts that device possessed that this kind used as the electrical characteristics of checking LCD are exactly probe.
Known employed probe, its chaining pin possesses the form that metal wire is arranged, owing to this chaining pin constitutes via epoxy resin is then fixing, so dwindling of chaining pin external diameter be limited, and produce can't with the nearest corresponding problem points of pattern trend towards Highgrade integration.
That is, the chaining pin seat installed surface that chaining pin is installed can be restricted, because the highly integrated meeting of LCD makes the quantity of splicing ear become very many and become very close, therefore has the chaining pin of metal wire, and it is impossible making it be arranged in right quantity closely.
For this reason, perhaps, multipotency structure of enough dwindling the chaining pin external diameter and the scheme of improving the structure that supports chaining pin has been suggested, on the other hand, even for the applicant, also applying for Japanese patent application 2001-32117 number and 2001-32118 patent case before.
In the invention of applying for before the applicant, proposed a kind of chaining pin, this kind chaining pin is to form with the laminal plate that uses the chip manufacture technology, simultaneously, has the structure that external diameter is dwindled significantly.
That is, dissolve most by pattern on laminal silicon plate and have the structure of the chaining pin of required shape, and produce most chaining pins simultaneously.
Yet, in the applicant's invention, because its fundamental purpose is to dwindle the external diameter of this chaining pin, so can produce so-called chaining pin plate and the structure that the supports most chaining pins more complicated problems point that becomes.And, also have the uneconomical problem of complicated structure and manufacturing cost that manufacturing process causes rising of resulting from.
For this reason, the inventor is by in the patented claim 2001-52433 patent case of filing an application with August 29 calendar year 2001 recently, propose to be connected simultaneously between a kind of pattern with LCD and circuit substrate pattern, the splicing ear of the LCD side by making the chaining pin plate and the length between the substrate-side splicing ear are dwindled to greatest extent and are promoted miniaturization and integrated, by easy being installed on the chaining pin seat of the guide plate that will support the chaining pin plate, and the structure that can carry out easier making and assembling.
Promptly as shown in Figure 6, the structure of assembling seat 1, substrate holder 2, chaining pin seat 3 and circuit substrate 4 is with roughly the same now.
In this structure, possessing in the bottom of chaining pin seat 3 has guide plate 5, in above-mentioned guide plate 5, be formed with Width with certain interval be provided be open upwards and with certain depth to recessed, the chaining pin insertion groove 5a that the end of chaining pin seat 3 leading sections can vertically be connected to have certain-length.
And, chaining pin plate 6 among the chaining pin insertion groove 5a of insertion guide plate 5 is that patterning prolongs " L " font downwards by an end, and the top that the end that prolongs the LCD with lifting elastic force forwards outstanding than the leading section of chaining pin seat 3 connects terminal 6a and the other end extends to till circuit substrate 4 bottoms, and the substrate of the circuit pattern of the flexible contact circuit substrate 4 of terminal part of prolongation connects the lamellar silicon plate that terminal 6b constitutes and forms it.
Yet, in this structure, the thickening that the thickness of guide plate 5 can be excessive, in order to make two guide plates 5 by engaging the structure that forms stack layer, thereby the generation operation not convenient problem such as too numerous and diverse that becomes.
When especially on guide plate 5, forming chaining pin insertion groove 5a, dark because working depth (about 500 μ m) formed, be inaccurate problem so exist so-called by processability that microscope is confirmed.
Promptly the degree of depth of seeing by microscope is the degree of 170～300 μ m, because be the degree of depth that forms about 500 μ m in said structure, so under processing chaining pin insertion groove 5d state, can't check its processing stage exactly.
So the state of the face that is provided with of chaining pin insertion groove 5a can not be recognized exactly, thereby survey makes the insertion state of chaining pin plate 6 become inhomogeneous and cause assembled state bad.
And, in applying for invention, because connecting terminal 6a is connected the guide plate 5 of terminal 6b side with substrate both-side ends, the LCD of chaining pin plate 6 has wide-open toward the outer side state, so can produce respectively connecting terminal 6a, 6b generation deflection deformation and making the problems such as bad that come in contact of so-called chaining pin plate 6.
Summary of the invention
Purpose of the present invention is for providing a kind of thickness slimming that makes guide plate, make the chaining pin insertion groove form the thickness that the enough microscopes of energy are recognized simultaneously, and make the chaining pin plate have the identical width of the degree of depth that inserts ditch with chaining pin, and have the LCD inspection probe of ultrathin typeization and correct assembleability.
Purpose of the present invention is sealed the both sides leading section of chaining pin insertion groove for a kind of passing through is provided, and can prevent that the LCD image from connecting the terminal LCD inspection probe that is connected terminal deflection deformation with substrate.
Especially, the invention provides and a kind ofly make commodity make unit price to reduce, and the LCD that goes for the highly integrated pattern of more economical LCD checks and uses probe by saving fee of material, this card can be this purpose is reached, therefore, structure of the present invention is by the assembling seat; Be connected and fixed on the substrate holder of a side of above-mentioned assembling seat bottom surface; Corresponding with the aforesaid substrate seat and be connected and fixed on the chaining pin seat of the opposite side of assembling seat bottom surface; Be connected the bottom surface of aforesaid substrate seat, and upper surface then there is the circuit substrate of drive IC; Possesses the bottom surface that has then at above-mentioned chaining pin seat, and single direction is formed uniformly and is open upwards and to most slotted hole shape chaining pin insertion grooves of lower recess in upper surface, be formed at the same horizontal line of chaining pin insertion groove on meter calibration tank on the outside end face of both sides, an and terminal guide plate that connects downwards of the leading section side of chaining pin insertion groove: possess in the chaining pin insertion groove that the above-mentioned guide plate of downward insertion is arranged and both sides form deflection deformation up and down, the terminal part of a side prolongs downwards and leading section by above-mentioned guide plate connects the outstanding LCD that forms in bottom surface of formed pilot hole and more above-mentioned guide plate downwards downwards and connects end, the terminal part of opposite side projects upwards above above-mentioned guide plate and the substrate that forms connects terminal, project upwards in the chaining pin plate of ganging up with projection of the side of connecting airtight above-mentioned chaining pin seat on the rearward end upper lateral part surface of above-mentioned chaining pin seat and to constitute.
Description of drawings
Fig. 1 checks the cross-sectional side view of using probe for adopting LCD of the present invention.
Fig. 2 adopts the oblique view of a guide plate part of the present invention for expression.
Fig. 3 adopts chaining pin plate oblique view of the present invention for expression.
Fig. 4 A, Fig. 4 B adopt the substrate of chaining pin plate of the present invention for expression and connect terminal cross-sectional side view.
Fig. 5 is for adopting user mode figure of the present invention.
Fig. 6 checks the cross-sectional side view of using probe for existing LCD.Symbol description:
10: assembling seat 20: substrate holder
31: chaining pin seat 40: circuit substrate
50: guide plate 51: the chaining pin insertion groove
52: pilot hole 53: meter calibration tank
54: buffer unit 60: the chaining pin plate
70:LCD (LCD)
Embodiment
Below, relevant example of the present invention uses accompanying drawing, explains detailedly.
The invention is characterized in by making guide plate have silicon plate with known chip same material, make its slimming simultaneously, patterned and obtain the chaining pin insertion groove in above-mentioned silicon plate, and the degree of depth of this chaining pin insertion groove forms the degree that available microscope is recognized, and can check the processing stage of chaining pin insertion groove, and prevent to insert the terminal deflection deformation of connection of two end sides of the chaining pin plate of chaining pin insertion groove.
The present invention as shown in Figure 1, the side in assembling seat 10 and this assembling seat 10 bottom surfaces is connected and fixed substrate holder 20, and with substrate holder 20 corresponding opposite sides possess chaining pin seat 30 is arranged and form and well-known category like structure.
At this moment, substrate holder 20 is made of insulating material with chaining pin seat 30, especially chaining pin seat 30 further requires its rigidity than substrate holder 20, so also can use non-insulating material, is comparatively ideal but at this moment then use the insulativity film in the bottom surface of chaining pin seat 30.
Probe in this structure and the applicant's the invention of motion is roughly similar.
But the difference of the present invention and preceding application invention is can promote slimming on the whole by guide plate 50 slimmings with silicon materials, prevents the distortion of chaining pin seat 60 simultaneously.
Below, explaining detailedly, assembling seat 10 in the present invention has the structure of integrated support probe as the invention of motion, and substrate holder 20 is to be made of insulating material, and be fastened on assembling seat 10 bottom surfaces.
What chaining pin seat 30 and substrate holder 20 were same is to be made of insulating material, and is fastened on the opposite side corresponding with substrate holder 20 of the bottom surface of assembling seat 10.
In addition, chaining pin seat 30 is from substrate holder 20 more downward prolongations, forms the thickness thick than substrate holder 20 simultaneously, and in the bottom surface of substrate holder 20 circuit substrate 40 that possesses the drive IC (not shown) arranged then.
Therefore, a termination of circuit substrate 40 in the bottom surface of substrate holder 20, forms the circuit pattern that electrically connects with P.e.c. in the bottom surface of circuit substrate 40 simultaneously.
On the other hand, circuit substrate 40 use flexible base plates are better.
Above-mentioned guide plate 50, as shown in Figure 2, possess oriented Width be arranged on upwards open at certain intervals and with prescribed depth to the formed most chaining pin insertion grooves 51 of lower recess.
At this moment, the thickness of chaining pin insertion groove 51 is comparatively ideal for confirming that processing characteristics forms the thickness of 200 μ m～300 μ m by microscope if can form the thickness of 300 μ m.
In addition, chaining pin insertion groove 51 as shown in Figure 2, particularly is provided with the pilot hole 52 of vertical perforation at the terminal part of the front that is positioned at chaining pin seat 30.
Especially the chaining pin insertion groove 51 of guide plate 50 is processed into the state of closed at both ends, and forms outboard end in both sides, and this structure is different with the structure of preceding application invention.
The lateral surface of this outboard end respectively with the same horizontal line of each chaining pin insertion groove 51 on to be vertically installed with 53 of meter calibration tankes can clearly knowing chaining pin insertion groove 51 positions be better.
In addition, possess the buffer unit 54 that has as shown in Figure 2 in the bottom of the LCD of guide plate 50 patterned side leading section, it is desirable that the further prolongation downwards that this buffer unit 54 is finer from the bottom surface of guide plate 50 forms.
Material as above-mentioned buffer unit 54 is to adopt ceramic thread, can certainly use the tungsten metal wire.
On the other hand, guide plate 50 as known, can only use two thickness silicon identical with the degree of depth of chaining pin insertion groove 51 to harden to close and forms it, is the easiest but make with the silicon plate that a slice has same thickness.
It is that one of chaining pin plate 60 is terminally prolonged downwards that LCD connects terminal 61, by connecting the pilot hole 52 of chaining pin insertion groove 51 in the leading section side of guide plate 60, and and terminal connections position that possess further outstanding downwards from the bottom of guide plate 50.
So each both side ends that connects terminal 61,62 sides is inserted and is arranged in the chaining pin insertion groove 51, and both side ends compares with central portion, make its thickness attenuation and form can about the thickness of deflection deformation be comparatively ideal.
So the thickness of the central portion that inserts in chaining pin insertion groove 51 forms the thickness identical with chaining pin insertion groove 51.
On the other hand, chaining pin plate 60 is formed with and projects upwards and make the terminal close-connected upper end of substrate holder 20 sides of chaining pin seat 30, can be in the bottom, side end face of chaining pin seat 30 the close-connected projection 63 of ganging up with.
Especially the substrate of chaining pin plate 60 connects the terminal structure that can form shown in Fig. 4 A.But shown in Fig. 4 B, prolong downwards to the bottom of correspondence, then can further prevent sectional area expansion and deflection in the chaining pin insertion groove 51 by making from the position that projects upwards.
And, as shown in Figure 1, chaining pin plate 60 close-connected bottom surfaces with chaining pin seat 30, in its a part of depression that forms, when chaining pin plate 60 is made, after removing the connection contact 64 that connects between the chaining pin plate 60, and in being above-mentioned dented space 31, the part position that stays during filling epoxy resin, can fixedly go out firm chaining pin plate 60.
By the above-mentioned probe that constitutes, in guide plate 50, chaining pin plate 60 is inserted in the chaining pin insertion grooves 50 downwards by top, under this assembled state, utilize epoxy resin to engage chaining pin seat 30 from the top of guide plate 50.
At this moment, chaining pin seat 30 with state that a side of the assembling seat 10 of its upside is combined closely under, in opposite side, combine substrate holder, then circuit substrate 40 on the bottom surface of substrate holder 20 simultaneously.
Therefore, if the guide plate 50 that inserts chaining pin plate 60 is bonded on the chaining pin seat 30, then formed circuit pattern can become the state that the substrate that connects chaining pin seat 60 separately connects end 62 on circuit substrate 40.
In addition, because substrate connects the state that the terminal part of the guide plate 50 of terminal 62 sides is sealings, so, when guide plate 50 combines with chaining pin seat 30, the substrate of chaining pin plate 60 connects terminal 62 and correctly is connected on the pattern of circuit substrate 40, and the meter calibration tank 53 that forms at the lateral surface of chaining pin insertion groove 51 on same horizontal line with chaining pin plate 50 can be observed and correctly set binding site.
And, when the probe that makes assembling is in this way checked the electrical specification of LCD, as shown in Figure 5, the LCD of chaining pin plate 60 connects terminal 61 and correctly is connected on the circuit pattern of LCD70, outermost surface at the LCD70 of probe 50 side leading section, also as described above, by with chaining pin insertion groove 51 formed meter calibration tank 53 and can be connected correct position on same horizontal line.
Especially at the buffer part material 54 that the bottom possessed of the lateral surface of the leading section side of guide plate 50 when LCD70 makes, formation is ganged up with under the situation of projection 71 because in that the patterned side manufacturing is bad, can prevent from directly to contact, and can prevent damage because of the probe that breakage produced of guide plate 50 with the guide plate 50 of silicon materials.
In addition, form under the excessive situation, can cut off being connected between the circuit pattern of LCD terminal portions 61 and LCD, and the while also has the function of LCD70 being carried out the bad detection of product in the projection 71 of ganging up with of LCD70.
And notable attribute of the present invention is: form by the degree of depth that makes formed chaining pin insertion groove 51 in guide plate 50 and can recognize the degree of depth of the processability of chaining pin insertion groove 51 with microscope, and can correctly check.
That is: be by making the chaining pin insertion groove in preceding application invention in the degree of depth that forms about 500 μ m degree, and can't correctly carry out the inspection of machining state, even under the state that the chaining pin plate is inserted, also have the example that the insertion state of chaining pin plate can't be arranged uniformly.This is because the problem that loose contact produced between substrate circuit and LCD circuit pattern and a terminals, but check exactly by the processability that makes chaining pin insertion groove 51 in the present invention, therefore just can make the anti-possible trouble that terminates in of loose contact of sort circuit pattern.
Therefore, by structure of the present invention, can be by preventing the damage of probe, and further increase the service life, simultaneously by the stable electrical characteristics of keeping LCD, the reliability of inspection is increased substantially.
As mentioned above, the present invention is owing to have by making probe 50 and the thickness slimming of inserting the chaining pin plate 60 on this probe 50, therefore, when impelling whole slimming, can save Master Cost and carry out economic making, and form the structure of sealing by the both side ends that makes chaining pin insertion groove 51,, can stablize the effect that is connected with circuit pattern and reach so can prevent terminal 61,62 deflection deformations of the formed connection of the both-side ends of chaining pin plate 60.
And, the present invention forms the degree that can carry out the affirmation of machining state with microscope by the degree of depth that makes chaining pin insertion groove 51, because can make the evenly distributed and stable connection of chaining pin plate 60 be electrically connected the position, make the effect of checking that reliability further improves and can reach what is called.
When especially the present invention is connected with the LCD circuit pattern by the advance preventing probe, contact, can prevent that therefore damage from preventing, can reach the effect that increases substantially to product reliability and operating efficiency with the direct of silicon materials guide plate 50.
Claims (6)
1, a kind of LCD checks and uses probe, it is characterized in that: it possess by:
The assembling seat;
Substrate holder is fastened on bottom surface one side of above-mentioned assembling seat;
The chaining pin seat is fastened on the opposite side of the above-mentioned assembling seat bottom surface corresponding with the aforesaid substrate seat;
Circuit substrate, then in the bottom surface of aforesaid substrate seat, and upper surface then has drive IC;
Guide plate, possesses the bottom surface that has then at above-mentioned chaining pin seat, and upper surface forms uniformly at single direction and is open upwards and to most slotted hole chaining pin insertion grooves of lower recess, with the same horizontal line of chaining pin insertion groove on the outside end face of both sides on the meter calibration tank that forms, and an end of the front of chaining pin insertion groove connects downwards;
The chaining pin plate, possessing has in the chaining pin insertion groove that is inserted into above-mentioned guide plate downwards, and both sides form deflection deformation up and down, the terminal part of one side prolongs downwards and passes through to give prominence to the LCD connection end that forms downwards at the downward formed pilot hole of perforation of leading section of above-mentioned guide plate and the bottom surface of more above-mentioned guide plate, the opposite side terminal part projects upwards above above-mentioned guide plate and the substrate that forms connects terminally, projects upwards in the projection of ganging up with of the side of connecting airtight above-mentioned chaining pin plate on the rearward end upper lateral part surface of above-mentioned chaining pin plate and to constitute.
2, the LCD that records and narrates as claim 1 checks and uses probe, it is characterized in that:
The part of above-mentioned chaining pin plate and the close-connected bottom surface of above-mentioned guide plate forms upwards depression, and its part on the above-mentioned chaining pin plate is housed in formed tie point, and utilizes the epoxy resin of charging to combine.
3, the LCD probe of recording and narrating as claim 1 is characterized in that: on above-mentioned guide plate, possessing in the bottom of front outer surface has buffer unit.
4, the LCD that records and narrates as claim 3 checks and uses probe, and it is characterized in that: above-mentioned buffer unit is made of the tungsten metal wire.
5, the LCD that records and narrates as claim 3 checks and uses probe, and it is characterized in that: above-mentioned buffer unit is made of pottery.
6, the LCD that records and narrates as claim 1 checks and uses probe, and it is characterized in that: the chaining pin insertion groove of above-mentioned guide plate is to form the degree of depth of 200 μ m～300 μ m.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR200167754 | 2001-11-01 | ||
| KR1020010067754A KR100545189B1 (en) | 2001-11-01 | 2001-11-01 | Probe card for testing LCD |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN1417589A true CN1417589A (en) | 2003-05-14 |
| CN1217197C CN1217197C (en) | 2005-08-31 |
Family
ID=19715588
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN021459916A Expired - Fee Related CN1217197C (en) | 2001-11-01 | 2002-10-31 | Probe card for LCD detection |
Country Status (4)
| Country | Link |
|---|---|
| JP (1) | JP3585902B2 (en) |
| KR (1) | KR100545189B1 (en) |
| CN (1) | CN1217197C (en) |
| TW (1) | TW581871B (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN100424514C (en) * | 2005-08-09 | 2008-10-08 | 陈文祺 | Semiconductor test plate structure for preventing noise interference |
| CN100439924C (en) * | 2004-12-30 | 2008-12-03 | De&T株式会社 | Probe component of detecting device for plane display board detection |
| CN102103150B (en) * | 2009-12-22 | 2015-03-25 | Klt | Support needle and probe provided with support needle |
| CN109564241A (en) * | 2016-08-11 | 2019-04-02 | 泰克诺探头公司 | For testing the contact probe and corresponding measuring head of the device of electronic device |
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100599767B1 (en) * | 2004-06-07 | 2006-07-13 | (주)유비프리시젼 | a probe and an assembly body of probe with using the above probe |
| KR100684045B1 (en) * | 2005-08-08 | 2007-02-16 | 주식회사 프로텍 | Probe assembly for a tester of the liquid crystal display |
| TW200846668A (en) * | 2007-01-23 | 2008-12-01 | Nictech Co Ltd | Probe and probe card having the same |
| KR100883269B1 (en) * | 2008-02-14 | 2009-02-10 | (주) 루켄테크놀러지스 | Low cost lcd inspection system of probe unit |
| KR100872966B1 (en) * | 2008-04-15 | 2008-12-08 | 유명자 | A device for testing for display panel |
| JP5396104B2 (en) * | 2009-03-05 | 2014-01-22 | 株式会社日本マイクロニクス | Probe assembly |
| KR101123887B1 (en) * | 2009-11-11 | 2012-03-23 | 주식회사 코디에스 | Probe unit |
| CN102103152A (en) * | 2009-12-22 | 2011-06-22 | 沋博普利斯金股份有限公司 | Integrated probe module easy to use for entire liquid crystal display (LCD) detection equipment |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100198512B1 (en) * | 1996-02-06 | 1999-06-15 | 허기호 | Probe block for lcd inspection |
| KR200164792Y1 (en) * | 1999-09-13 | 2000-02-15 | 주식회사금강시스템 | Prove block for testing liquid crystal display |
-
2001
- 2001-11-01 KR KR1020010067754A patent/KR100545189B1/en not_active IP Right Cessation
-
2002
- 2002-10-22 TW TW091124320A patent/TW581871B/en not_active IP Right Cessation
- 2002-10-24 JP JP2002309466A patent/JP3585902B2/en not_active Expired - Fee Related
- 2002-10-31 CN CN021459916A patent/CN1217197C/en not_active Expired - Fee Related
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN100439924C (en) * | 2004-12-30 | 2008-12-03 | De&T株式会社 | Probe component of detecting device for plane display board detection |
| CN100424514C (en) * | 2005-08-09 | 2008-10-08 | 陈文祺 | Semiconductor test plate structure for preventing noise interference |
| CN102103150B (en) * | 2009-12-22 | 2015-03-25 | Klt | Support needle and probe provided with support needle |
| CN109564241A (en) * | 2016-08-11 | 2019-04-02 | 泰克诺探头公司 | For testing the contact probe and corresponding measuring head of the device of electronic device |
| CN109564241B (en) * | 2016-08-11 | 2022-08-09 | 泰克诺探头公司 | Test head for an apparatus for testing electronic devices |
Also Published As
| Publication number | Publication date |
|---|---|
| TW581871B (en) | 2004-04-01 |
| KR100545189B1 (en) | 2006-01-24 |
| JP2003202351A (en) | 2003-07-18 |
| CN1217197C (en) | 2005-08-31 |
| JP3585902B2 (en) | 2004-11-10 |
| KR20030037279A (en) | 2003-05-14 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| ASS | Succession or assignment of patent right |
Owner name: MICO TN CO., LTD. Free format text: FORMER OWNER: YIN XIU Effective date: 20061208 |
|
| C41 | Transfer of patent application or patent right or utility model | ||
| TR01 | Transfer of patent right |
Effective date of registration: 20061208 Address after: Gyeonggi Do, South Korea Patentee after: MiCo TN Limited by Share Ltd Address before: Seoul, South Korea Patentee before: Yin Xiu |
|
| C17 | Cessation of patent right | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20050831 Termination date: 20131031 |