CN102103152A - Integrated probe module easy to use for entire liquid crystal display (LCD) detection equipment - Google Patents
Integrated probe module easy to use for entire liquid crystal display (LCD) detection equipment Download PDFInfo
- Publication number
- CN102103152A CN102103152A CN2009102543730A CN200910254373A CN102103152A CN 102103152 A CN102103152 A CN 102103152A CN 2009102543730 A CN2009102543730 A CN 2009102543730A CN 200910254373 A CN200910254373 A CN 200910254373A CN 102103152 A CN102103152 A CN 102103152A
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- China
- Prior art keywords
- module
- probe
- plate
- lcd
- guided plate
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R3/00—Apparatus or processes specially adapted for the manufacture or maintenance of measuring instruments, e.g. of probe tips
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/05—Flexible printed circuits [FPCs]
Abstract
The invention relates to an integrated probe module easy to use for entire liquid crystal display (LCD) detection equipment, comprising a module main body, a sheet module, an integrated circuit (IC) module, an upper guide plate, a lower guide plate, an IC plate, wherein, the module main body protrudes in front of the bottom surface to form a connection table, the sheet module is combined with the connection table; an accommodation groove is formed on the bottom surface; the IC module is combined with the rear end of the module main body; the upper guide plate is fixed in the accommodation groove to form a plurality of first insertion grooves and a plurality of first protruding holes; the lower guide plate is fixed on the bottom surface of the upper guide plate to form a plurality of second insertion grooves and a plurality of second protruding holes; one side of the IC plate is adhered with a drive IC; a first flexible printed circuit (FPC) and a second flexible printed circuit are formed at the two ends of one side of the IC plate; the first FPC and the second FPC can be electrically connected with the drive IC; and the IC plate is combined with the bottom surface of the IC module. By the integrated probe module provided by the invention, the part of the front of the guide plate is cut to lead the earthed projection of the probe to expose to be confirmed, thus avoiding the correction error in assembling and maintaining, and leading the assembling and maintenance to be easier.
Description
Technical field
The present invention is about the one-piece type probe module of LCD (LCD) checkout equipment of easy permutation, specify for, the present invention cuts a part with the front of guided plate, the ground connection projection of probe is exposed, can with the naked eye be confirmed, in addition the ground connection projection, the present invention is the fixed guide plate on module bodies, on IC (integrated circuit) module, fixedly be attached with the IC plate of drive IC, the module bodies that mutually combines then and IC module, thus form one.
Background technology
In general, LCD mainly as the display of TV, notebook computer etc., on its edge, be provided with dozens of even hundreds of the splicing ears that import electric signal (signal of video signal, synchronizing signal, form and aspect signal etc.) with high density, above-mentioned LCD will import test signal before being installed on product, whether qualified, above-mentioned detection is finished by probe assembly if detecting picture.
As shown in Figure 1, the existing probe assembly of the above-mentioned LCD of being used for detection comprises: module body 10; Be connected and fixed on the substrate fixer 20 of module body 10 bottom surfaces; Be connected the probe holder 30 of substrate fixer 20 bottom surfaces; Attached to the bottom surface of probe holder 30, upper surface is attached with drive IC, and forms figuratum film 40; Be attached to the probe module 50 of probe holder 30 bottom surfaces.
On the other hand, as shown in Figure 2, probe module 50 comprises: module 51, and this module 51 combines with probe holder 30; Permutation plate 53, this permutation plate 53 combines with module 51 bottom surfaces by cementing agent; The 1st guided plate 55, the 1st guided plate 55 combines with permutation plate 53 bottom surfaces by cementing agent, be formed with a plurality of insertion groove 55-1, can in described insertion groove 55-1, insert probe 60, and between two adjacent insertion groove 55-1, be formed with protrusion hole 55-2, make the ground connection projection 61 of probe 60 protruding upward; The 2nd guided plate 57, the 2nd guided plate 57 combines by the bottom surface of cementing agent with the 1st guided plate 55, and form with same modality with the 1st guided plate 55, the 2nd guided plate 57 has insertion groove 57-1 and protrudes hole 57-2, and intersect to form mutually with the probe 60 of the 1st guided plate 55, the ground connection projection 61 of probe 60 is protruded downwards.The 1st guided plate 55 and the 2nd guided plate 57 are formed by thin slice.
Above-mentioned probe module 50 contact the ground connection projection 61 of each probe 60 that protrudes on pattern that LCD plate (not shown) go up to form and the 2nd guided plate 57, and the ground connection projection 61 by each probe 60 of protruding on the 2nd guided plate 57 is to film 40 transmission signals.
But above-mentioned probe module owing to can't see the ground connection projection, therefore can not with the naked eye be confirmed when connecting the ground connection projection of LCD plate and probe, occur poor alignment easily.
In addition, owing to guided plate is formed by thin slice, so guided plate is damaged easily when being connected with the LCD plate.
For addressing the above problem, the applicant had once developed Republic of Korea registered patent communique No.10-0595840 (title: LCD checkout equipment probe module).
As shown in Figure 3, above-mentioned LCD checkout equipment comprises permutation film 110 and fender 120 with probe module.
At first, it is tabular that permutation film 110 is quadrilateral, be formed with a plurality of quadrilateral through holes 111 that probe 60 each ground connection projection 61 are passed through, and it is separated by a distance with through hole 111, be formed with a plurality of permutations hole 113 with corresponding shape, permutation film 110 is bonded in the place ahead, bottom surface of the 2nd guided plate 57, and permutation hole 113 is protruded forward.Here, permutation film 110 is made by polyamide material, and its thickness is less than the protrusion height of the ground connection projection 61 of probe 60.In addition, through hole 111 has the 1st through hole 111-1 that the ground connection projection 61 of the probe 60 that makes the 1st guided plate 55 is protruded, and is arranged on the 1st through hole 111-1 front end, the 2nd through hole 111-2 that the ground connection projection 61 of the probe 60 of the 2nd guided plate 57 is protruded.
Here, the width in permutation hole 113 is identical or wideer than the pattern width of LCD plate with the pattern width of LCD plate.
In addition, it is tabular that fender 120 is quadrilateral, is connected the 2nd guided plate 57 and permutation film 110 bottom surfaces by cementing agent, have the length identical with the 2nd guided plate 57, but width is smaller, and the ground connection projection 61 of probe 60 is exposed.The material of fender 120 is potteries.
But above-mentioned existing LCD checkout equipment probe module need form through hole and use on the permutation film, therefore, can and adhere to the error that produces in the engineering, cause module that deviation is set owing to processing film, thereby the permutation mistake takes place, assembling, maintenance and guarantee are put to no little inconvenience.
In addition, for above-mentioned existing LCD checkout equipment probe module, the ground connection projection of probe is sightless, mainly finishes setting indirectly by the permutation hole of permutation film, is easy to occur error
Moreover, above-mentioned existing LCD checkout equipment probe module and film, promptly TCP separates formation, occurs the permutation mistake easily in the process that mutually combines of probe and TCP.
Summary of the invention
The present invention proposes for addressing the above problem, its objective is provides a kind of LCD of easy permutation checkout equipment one-piece type probe module, this probe module cuts a part with the front of guided plate, the ground connection projection of probe is exposed, with the naked eye the ground connection projection is confirmed, thereby the permutation mistake occurs in the time of can preventing assembling in advance and safeguard guarantee, make assembling and safeguard that the guarantee operation becomes easy.
The object of the invention also is to provide a kind of one-piece type probe module of LCD checkout equipment of easy permutation, this probe module is the fixed guide plate on module bodies, on the IC module, fixedly be attached with the IC plate of drive IC, the module bodies that mutually combines then and IC module, make module bodies and IC module form one, thereby can prevent from advance in probe and TCP mutually combine process, the permutation mistake to occur.
For achieving the above object, the invention provides a kind of one-piece type probe module of LCD checkout equipment of easy permutation, this probe module comprises: probe module main body, this probe module main body are protruded in the place ahead, bottom surface and are formed with the connection platform; The thin slice module, this thin slice module is connected the platform combination by screw and described probe module main body, and is formed with accepting groove in the bottom surface; The IC module, this IC module combines with described probe module body rear; The top guided plate, this top guided plate is fixed in the accepting groove of described thin slice module by cementing agent, and be formed with a plurality of the 1st insertion grooves that make the correspondence insertion in 1: 1 of each probe, between described the 1st insertion groove, be formed with 1: 1 corresponding the insertion and the 1st protrusion hole protruding upward of ground connection projection that makes each probe; The lower guide plate, this lower guide plate is fixed in guided plate bottom surface, described top by cementing agent, and be formed with and make 1: 1 corresponding a plurality of the 2nd insertion groove that insert of each probe, being formed with 1: 1 correspondence of ground connection projection that makes each probe between described the 2nd insertion groove inserts and downward the 2nd protrusion hole of protruding, the 1st insertion groove of described the 2nd insertion groove and described top guided plate intersects to form mutually, and the described the 2nd the 1st protrusion hole of protruding hole and described top guided plate intersects to form symmetrically; The IC plate, one side attachment of this IC plate has drive IC, and be formed with 1FPC (flexible printed circuit board) and 2FPC respectively at the two ends of a side with a plurality of tie points, this 1FPC and 2FPC can form with described drive IC and be electrically connected, described IC plate combines by the bottom surface of screw with described IC module, can make the ground connection projection corresponding contact in 1: 1 of each tie point with the probe protruding upward of described top guided plate of described 1FPC.
The LCD checkout equipment of described easy permutation also comprises with one-piece type probe module: 3FPC, this 3FPC is formed with 1: the 1 corresponding tie point of each tie point with the 2FPC of described IC plate at its two ends, these tie points are by the tie point secure bond of cementing agent and described 2FPC; Module cage, the front of this module cage is " " font, and the place ahead, bottom surface is formed with perforate, and the ground connection projection of probe of the downward protrusion of described lower guide plate is exposed to the outside.
In addition, guided plate the place ahead, described top is cut open a part, has formed the 1st cut, and the part in the probe that is inserted into described the 1st insertion groove is exposed.
In addition, described lower guide plate is identical with described top guided plate, is formed with the 2nd cut.
The one-piece type probe module of LCD checkout equipment of easy permutation of the present invention, a part is cut in the front of guided plate, the ground connection projection of probe is exposed, can with the naked eye confirm the ground connection projection, thereby the permutation mistake occurs in the time of can preventing assembling in advance and safeguard guarantee, make assembling and safeguard that the guarantee operation becomes easy.
In addition, the present invention is the fixed guide plate on module bodies, on the IC module, fixedly be attached with the IC plate of drive IC, the module bodies that mutually combines then and IC module, make module bodies and IC module form one, thereby can prevent from advance in the process that mutually combines of probe and TCP, the permutation mistake to occur.
Description of drawings
Fig. 1 is a probe assembly structure oblique view in the past.
Fig. 2 is the exploded perspective view of probe module structure shown in Figure 1.
Fig. 3 be in the past the LCD checkout equipment with the exploded perspective view of probe module structure.
Fig. 4 is the oblique view of the LCD checkout equipment of the easy permutation that the present invention relates to one-piece type probe module.
Fig. 5 and Fig. 6 are the exploded perspective view of the LCD checkout equipment of the easy permutation that the present invention relates to one-piece type probe module.
Fig. 7 is the oblique view of the LCD checkout equipment of the easy permutation that the present invention relates to guided plate structure in upper and lower part in the one-piece type probe module.
Fig. 8 is the sectional side view of Fig. 4.
Fig. 9 to Figure 12 is the formation position view of the LCD checkout equipment of the easy permutation that the present invention relates to upper and lower part guided plate in the one-piece type probe module.
Reference numeral
200: probe module, 210: module bodies, 220: thin slice module, 230:IC module, 240: top guided plate, 250: lower guide plate, 260:IC plate, 270: the 3FPC, 280: module cage.
Embodiment
Below, with reference to accompanying drawing the LCD checkout equipment of the easy permutation that the present invention relates to structure with one-piece type probe module is elaborated.
In the following description, for well-known correlation function or structure,, will save detailed description if think it is specifically described and may causes confusion to understanding the main thought of the present invention.In addition, the term of using below defines on function of the present invention basis, might be different because of user's intention or custom.Therefore, its definition should be that the basis is understood with the whole content of this instructions.
Fig. 4 is the oblique view of the LCD checkout equipment of the easy permutation that the present invention relates to one-piece type probe module, Fig. 5 and Fig. 6 are the exploded perspective view of the LCD checkout equipment of the easy permutation that the present invention relates to one-piece type probe module, Fig. 7 is the oblique view of the LCD checkout equipment of the easy permutation that the present invention relates to guided plate structure in upper and lower part in the one-piece type probe module, Fig. 8 is the sectional side view of Fig. 4, and Fig. 9 to Figure 12 is the formation position view of the LCD checkout equipment of the easy permutation that the present invention relates to upper and lower part guided plate in the one-piece type probe module.
To shown in Figure 12, the LCD checkout equipment of easy permutation of the present invention comprises with probe module 200: module bodies 210 as Fig. 4; Thin slice module 220; IC module 230; Top guided plate 240; Lower guide plate 250; IC plate 260; 3FPC270; Module cage 280.
Top guided plate 240 is made by thin plate, rectangular tabular, be fixed in the accepting groove 221 of thin slice module 220 by cementing agent, broad ways equidistantly is formed with a plurality of the 1st insertion grooves 241, each probe 290 can 1: 1 correspondence be inserted, and being formed with the ground connection projection 291 that makes each probe 290 between the 1st adjacent insertion groove 241 can 1: 1 corresponding insertion and the 1st protrusion hole 243 protruding upward.Here, the place ahead of top guided plate 240 is cut open a part, has formed the 1st cut 245, and the part (about 10～15) in the probe 290 that is inserted into the 1st insertion groove 241 is exposed.In addition, as shown in Figure 9, if among the PAD310 of LCD plate 300, the width of MB PAD (perhaps logo PAD) 311 is identical with the width of Active PAD 313, then the 1st cut 245 will be top with first PAD of MB PAD (perhaps logoPAD) 311, be formed at corresponding part.In addition, as shown in figure 10, if among the PAD310 of LCD plate 300, with the continuous MB PAD (perhaps logo PAD) 311 that forms more than 3 of identical wide cut, then the 1st cut 245 will be top with first PAD of MB PAD (perhaps logo PAD) 311, be formed at corresponding part.In addition, as shown in figure 11, if among the PAD of LCD plate 300, owing to be formed with the wide cut Dummy PAD311a bigger on the MB PAD (perhaps logo PAD) 311 than the wide cut of ActivePAD 313, thereby fail to form more than 3 continuously with same widths, then the 1st cut 245 will form in the part with Dummy PAD311a and Active PAD 313 coupling parts (for example, beginning to N Active PAD from last Dummy PAD) correspondence.As shown in figure 12, if MB PAD (perhaps logo PAD) 311 does not exist among the PAD310 of LCD plate 300, then the 1st cut 245 will be top with first Active PAD 313, be formed at corresponding part.
On the other hand, lower guide plate 250 and top guided plate 240 are with identical material, identical size forms, be fixed in top guided plate 240 bottom surfaces by cementing agent, and be formed with and make can 1: 1 corresponding a plurality of the 2nd insertion grooves 251 that insert of each probe 290, being formed with the ground connection projection 291 that makes each probe 290 between the 2nd adjacent insertion groove 251 can 1: 1 correspondence insert and downward the 2nd protrusion hole 253 of protruding, the 2nd insertion groove 251 intersects to form mutually with the 1st insertion groove 241 of described top guided plate 240, and the 2nd the 1st protrusion hole 243 of protruding hole 253 and described top guided plate 240 intersects to form symmetrically.Lower guide plate 250 is formed with the 2nd cut 255 in the position identical with the 1st cut 245 of top guided plate 240.
In addition, IC plate 260 is made by metal material, in a side attachment drive IC 261 is arranged, and be formed with respectively at the two ends of a side have a plurality of tie point 263a, 265a the 1st, 2FPC263,265,1st, 2FPC263,265 can form with described drive IC 261 and be electrically connected, IC plate 260 combines by the bottom surface of screw with IC module 230, makes each the tie point 263a of 1FPC263 and the ground connection projection 291 of the probe protruding upward 290 of top guided plate 240 can corresponding contact in 1: 1.
In addition, 3FPC270 is formed with 1: the 1 corresponding tie point 271 of each tie point with the 2FPC265 of IC plate 260 at two ends, and these tie points 271 are by the tie point 265a secure bond of cementing agent and 2FPC265.
In addition, module cage 280 is made by metal material, and the front is " " font, and the place ahead, bottom surface is formed with perforate 281, and the ground connection projection 291 of probe 290 of the downward protrusion of lower guide plate 250 is exposed to the outside.
With reference to the accompanying drawings the LCD checkout equipment of the easy permutation that the present invention relates to assembling process and the operation with one-piece type probe module is elaborated.
At first, utilize adhesive bond top guided plate 240 and lower guide plate 250.
Under above-mentioned state, insert probe 290 to the 1st insertion groove 241 of top guided plate 240 and the 2nd insertion groove 251 of lower guide plate 250 respectively.
Like this, the ground connection projection 291 of protruding the probe 290 of the 2nd insertion groove 251 that hole 243 is inserted into lower guide plate 250 by the 1st of top guided plate 240 is come out protrusions, and the 2nd protrusion hole 253 by lower guide plate 250 is inserted into the ground connection projection 291 of probe 290 of the 1st insertion groove 241 of top guided plate 240 and also protrusion is come out.
Under above-mentioned state, utilize cementing agent that top guiding version 240 and lower guide plate 250 are fixed in the accepting groove 221 of thin slice module 220.At this moment, protruding the ground connection projection 291 of the probe 290 that protrudes in hole 243 by the 1st of top guided plate 240 will be by dip plane 223 to exposing outside.
Then, the thin slice module 220 that will be fixed with top guided plate 240 and lower guide plate 250 by screw and module bodies 210 is connected platform 211 combinations.
Then, Yi Bian with the naked eye confirm to protrude the ground connection projection 291 of the probe 290 that protrudes in hole 243 by the 1st of top guided plate 240, Yi Bian carry out permutation.At this moment, adopt the template that equidistantly forms at aligning on glass, confirm that then spacing between the ground connection projection 291 carries out the method for permutation.
Under above-mentioned state, the tie point 265a of the 2FPC265 of input side and the tie point 271 of 3FPC270 will pass through the cementing agent secure bond with the state of 1: 1 correspondence.
Then, the ground connection projection 291 of protruding the probe 290 in the 2nd insertion groove 251 that hole 243 is inserted into lower guide plate 250 at the tie point 263a of the 1FPC263 of IC plate 260 with by the 1st of top guided plate 240 is under the state of 1: 1 correspondence, by screw in conjunction with IC plate 260 and IC module 230.
At last, by screw IC module 230 is attached to connection platform 211 rear ends of module bodies 210 bottom surfaces, thereby finishes assembling.
On the other hand, the ground connection projection 291 of protruding the probe 290 that protrudes in hole 253 by the 2nd of lower guide plate 250 is also used with quadrat method and is carried out permutation.
The present invention can carry out various deformation, also can adopt variform, above only a kind of embodiment wherein is illustrated.But the present invention is not limited to above-mentioned embodiment, and all do not break away from the distortion embodiment of the technology of the present invention thought category and impartial embodiment and displacement embodiment all should belong to claim scope of the present invention.
Claims (4)
1. the one-piece type probe module of LCD checkout equipment of an easy permutation is characterized in that this probe module comprises: probe module main body, this probe module main body are protruded in its place ahead, bottom surface and are formed with the connection platform; The thin slice module, this thin slice module is connected the platform combination by screw and described probe module main body, and is formed with accepting groove in the bottom surface; The IC module, this IC module combines with the rear end of described probe module main body; The top guided plate, this top guided plate is fixed in the accepting groove of described thin slice module by cementing agent, and be formed with a plurality of the 1st insertion grooves that make the correspondence insertion in 1: 1 of each probe, between described the 1st insertion groove, be formed with 1: 1 corresponding the insertion and the 1st protrusion hole protruding upward of ground connection projection that makes each probe; The lower guide plate, this lower guide plate is fixed in the bottom surface of described top guided plate by cementing agent, and be formed with and make 1: 1 corresponding a plurality of the 2nd insertion groove that insert of each probe, being formed with 1: 1 correspondence of ground connection projection that makes each probe between described the 2nd insertion groove inserts and downward the 2nd protrusion hole of protruding, the 1st insertion groove of described the 2nd insertion groove and described top guided plate intersects to form mutually, and the described the 2nd the 1st protrusion hole of protruding hole and described top guided plate hands over justice to form symmetrically; And IC plate, one side attachment of this IC plate has drive IC, and the two ends in a side are formed with 1FPC and the 2FPC with a plurality of tie points respectively, this 1FPC and 2FPC can form with described drive IC and be electrically connected, described IC plate combines by the bottom surface of screw with described IC module, can make the ground connection projection corresponding contact in 1: 1 of each tie point with the probe protruding upward of described top guided plate of described 1FPC.
2. the one-piece type probe module of LCD checkout equipment of easy permutation according to claim 1, wherein, this probe module also comprises: 3FPC, this 3FPC is formed with 1: the 1 corresponding tie point of each tie point with the 2FPC of described IC plate at its two ends, these tie points are by the tie point secure bond of cementing agent and described 2FPC; Module cage, the front of this module cage is " " font, and the place ahead, bottom surface is formed with perforate, and the ground connection projection of probe of the downward protrusion of described lower guide plate is exposed to the outside.
3. the one-piece type probe module of LCD checkout equipment of easy permutation according to claim 1, wherein, a part is cut in guided plate the place ahead, described top, forms the 1st cut, thereby the part in the probe that is inserted into described the 1st insertion groove is exposed.
4. the one-piece type probe module of LCD checkout equipment of easy permutation according to claim 3, wherein, described lower guide plate is identical with described top guided plate, and is formed with the 2nd cut.
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2009102543730A CN102103152A (en) | 2009-12-22 | 2009-12-22 | Integrated probe module easy to use for entire liquid crystal display (LCD) detection equipment |
| KR1020100021197A KR101038456B1 (en) | 2009-12-22 | 2010-03-10 | Onebody type probe block easy align for lcd inspection equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2009102543730A CN102103152A (en) | 2009-12-22 | 2009-12-22 | Integrated probe module easy to use for entire liquid crystal display (LCD) detection equipment |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN102103152A true CN102103152A (en) | 2011-06-22 |
Family
ID=44156079
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2009102543730A Pending CN102103152A (en) | 2009-12-22 | 2009-12-22 | Integrated probe module easy to use for entire liquid crystal display (LCD) detection equipment |
Country Status (2)
| Country | Link |
|---|---|
| KR (1) | KR101038456B1 (en) |
| CN (1) | CN102103152A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108761152A (en) * | 2017-02-21 | 2018-11-06 | 北京兆维智能装备有限公司 | It is formed with the probe detection device of non-probe type connecter |
| CN109991451A (en) * | 2019-04-19 | 2019-07-09 | 南京微桥检测技术有限公司 | Display module Precision measurement crimps probe |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100545189B1 (en) * | 2001-11-01 | 2006-01-24 | 주식회사 유림하이테크산업 | Probe card for testing LCD |
| KR20060023250A (en) * | 2004-09-09 | 2006-03-14 | 주식회사 세디콘 | Probe block of lcd inspection system |
| KR100856865B1 (en) * | 2006-11-30 | 2008-09-08 | (주)유비프리시젼 | Probe assembly for having pattern glass |
| KR20090111655A (en) * | 2008-04-22 | 2009-10-27 | (주)이노웍스 | Probe Unit for inspected the Flat Panel Display Device |
-
2009
- 2009-12-22 CN CN2009102543730A patent/CN102103152A/en active Pending
-
2010
- 2010-03-10 KR KR1020100021197A patent/KR101038456B1/en not_active IP Right Cessation
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108761152A (en) * | 2017-02-21 | 2018-11-06 | 北京兆维智能装备有限公司 | It is formed with the probe detection device of non-probe type connecter |
| CN109991451A (en) * | 2019-04-19 | 2019-07-09 | 南京微桥检测技术有限公司 | Display module Precision measurement crimps probe |
| CN109991451B (en) * | 2019-04-19 | 2022-01-18 | 南京微桥检测技术有限公司 | Display module precision detection crimping testing device |
Also Published As
| Publication number | Publication date |
|---|---|
| KR101038456B1 (en) | 2011-06-01 |
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Application publication date: 20110622 |