CN1377462A - 玻璃中夹杂物的检测 - Google Patents
玻璃中夹杂物的检测 Download PDFInfo
- Publication number
- CN1377462A CN1377462A CN00813573A CN00813573A CN1377462A CN 1377462 A CN1377462 A CN 1377462A CN 00813573 A CN00813573 A CN 00813573A CN 00813573 A CN00813573 A CN 00813573A CN 1377462 A CN1377462 A CN 1377462A
- Authority
- CN
- China
- Prior art keywords
- snotter
- glass
- scattering
- laser
- detected
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
- G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Engineering & Computer Science (AREA)
- Textile Engineering (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
AUPQ2622A AUPQ262299A0 (en) | 1999-09-02 | 1999-09-02 | Detection of inclusions in glass |
AUPQ2622 | 1999-09-02 |
Publications (1)
Publication Number | Publication Date |
---|---|
CN1377462A true CN1377462A (zh) | 2002-10-30 |
Family
ID=3816792
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN00813573A Pending CN1377462A (zh) | 1999-09-02 | 2000-09-01 | 玻璃中夹杂物的检测 |
Country Status (7)
Country | Link |
---|---|
EP (1) | EP1210586A4 (de) |
JP (1) | JP2003508786A (de) |
CN (1) | CN1377462A (de) |
AU (1) | AUPQ262299A0 (de) |
CA (1) | CA2384005A1 (de) |
HK (1) | HK1049042A1 (de) |
WO (1) | WO2001018532A1 (de) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101449151B (zh) * | 2006-03-29 | 2011-06-29 | 皮尔金顿集团有限公司 | 对玻璃窗的检验 |
CN101790679B (zh) * | 2007-09-04 | 2012-05-09 | 旭硝子株式会社 | 检测透明板体内部的微小异物的方法及其装置 |
CN111712473A (zh) * | 2018-03-07 | 2020-09-25 | 佳殿玻璃有限公司 | 基于波长分析检测浮法玻璃中的夹杂物方法和系统 |
CN116835863A (zh) * | 2023-07-14 | 2023-10-03 | 连云港双石特种玻璃有限公司 | 一种能准确控制特种玻璃厚度的加工设备及其使用方法 |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7142295B2 (en) * | 2003-03-05 | 2006-11-28 | Corning Incorporated | Inspection of transparent substrates for defects |
DE102004005019A1 (de) * | 2004-01-30 | 2005-08-18 | Isra Glass Vision Gmbh | Verfahren zur Bestimmung der Tiefe eines Fehlers in einem Glasband |
KR20070085258A (ko) * | 2004-09-17 | 2007-08-27 | 디.바이스 사이언티픽 인코포레이티드 | 다이렉트 이미지 기술을 사용하는 평판 매체의 광학적 검사 |
DE102013002602B4 (de) | 2013-02-15 | 2022-05-05 | Hegla Boraident Gmbh & Co. Kg | Verfahren und Vorrichtung zur Detektion von Partikeln in Glas |
DE102013107215B3 (de) * | 2013-07-09 | 2014-10-09 | Heraeus Quarzglas Gmbh & Co. Kg | Verfahren zur Herstellung eines Spiegelsubstrat-Rohlings aus Titan-dotiertem Kieselglas für die EUV-Lithographie, sowie System zur Positionsbestimmung von Defekten in einem Rohling |
US10481097B1 (en) | 2018-10-01 | 2019-11-19 | Guardian Glass, LLC | Method and system for detecting inclusions in float glass based on spectral reflectance analysis |
Family Cites Families (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3814946A (en) * | 1972-12-04 | 1974-06-04 | Asahi Glass Co Ltd | Method of detecting defects in transparent and semitransparent bodies |
US4025201A (en) * | 1975-04-21 | 1977-05-24 | Ball Brothers Service Corporation | Method and apparatus for video inspection of articles of manufacture by decussate paths of light |
US4136961A (en) * | 1977-07-01 | 1979-01-30 | Corning Glass Works | Method and apparatus for detection of inclusions in glass article or the like |
US4401893A (en) * | 1981-07-29 | 1983-08-30 | Intec Corporation | Method and apparatus for optically inspecting a moving web of glass |
EP0162120B1 (de) * | 1984-05-14 | 1988-12-07 | Ibm Deutschland Gmbh | Verfahren und Einrichtung zur Oberflächenprüfung |
EP0189551B1 (de) * | 1984-12-14 | 1988-10-26 | Flachglas Aktiengesellschaft | Verfahren und Vorrichtung zum Prüfen von transparenten Materialbahnen, insbesondere Flachglasbändern |
KR960012330B1 (ko) * | 1987-05-27 | 1996-09-18 | 마쓰무라 미노루 | 투광판재의 식별형 결점 검출 장치 |
DE3800053A1 (de) * | 1988-01-04 | 1989-07-13 | Sick Optik Elektronik Erwin | Optische fehlerinspektionsvorrichtung |
US5235400A (en) * | 1988-10-12 | 1993-08-10 | Hitachi, Ltd. | Method of and apparatus for detecting defect on photomask |
FR2681429B1 (fr) * | 1991-09-13 | 1995-05-24 | Thomson Csf | Procede et dispositif d'inspection du verre. |
AT402860B (de) * | 1993-06-22 | 1997-09-25 | Oesterr Forsch Seibersdorf | Verfahren und vorrichtung zur prüfung von transparenten gegenständen |
JPH07294422A (ja) * | 1994-04-27 | 1995-11-10 | Mitsubishi Materials Corp | 表面近傍結晶欠陥の検出方法およびその装置 |
NL1006378C2 (nl) * | 1997-06-23 | 1998-12-24 | Tno | Werkwijze en inrichting voor het inspecteren van een voorwerp met betrekking tot verstoringen. |
-
1999
- 1999-09-02 AU AUPQ2622A patent/AUPQ262299A0/en not_active Abandoned
-
2000
- 2000-09-01 CN CN00813573A patent/CN1377462A/zh active Pending
- 2000-09-01 WO PCT/AU2000/001032 patent/WO2001018532A1/en not_active Application Discontinuation
- 2000-09-01 JP JP2001522071A patent/JP2003508786A/ja active Pending
- 2000-09-01 CA CA002384005A patent/CA2384005A1/en not_active Abandoned
- 2000-09-01 EP EP00958046A patent/EP1210586A4/de not_active Withdrawn
-
2002
- 2002-12-05 HK HK02108878.8A patent/HK1049042A1/zh unknown
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101449151B (zh) * | 2006-03-29 | 2011-06-29 | 皮尔金顿集团有限公司 | 对玻璃窗的检验 |
CN101790679B (zh) * | 2007-09-04 | 2012-05-09 | 旭硝子株式会社 | 检测透明板体内部的微小异物的方法及其装置 |
CN111712473A (zh) * | 2018-03-07 | 2020-09-25 | 佳殿玻璃有限公司 | 基于波长分析检测浮法玻璃中的夹杂物方法和系统 |
CN111712473B (zh) * | 2018-03-07 | 2022-02-25 | 佳殿玻璃有限公司 | 基于波长分析检测浮法玻璃中的夹杂物方法和系统 |
CN116835863A (zh) * | 2023-07-14 | 2023-10-03 | 连云港双石特种玻璃有限公司 | 一种能准确控制特种玻璃厚度的加工设备及其使用方法 |
CN116835863B (zh) * | 2023-07-14 | 2023-12-12 | 连云港双石特种玻璃有限公司 | 一种能准确控制特种玻璃厚度的加工设备及其使用方法 |
Also Published As
Publication number | Publication date |
---|---|
JP2003508786A (ja) | 2003-03-04 |
EP1210586A1 (de) | 2002-06-05 |
CA2384005A1 (en) | 2001-03-15 |
AUPQ262299A0 (en) | 1999-09-23 |
EP1210586A4 (de) | 2002-12-04 |
WO2001018532A1 (en) | 2001-03-15 |
HK1049042A1 (zh) | 2003-04-25 |
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Legal Events
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C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C02 | Deemed withdrawal of patent application after publication (patent law 2001) | ||
WD01 | Invention patent application deemed withdrawn after publication |