HK1049042A1 - 檢測玻璃中內含物的方法 - Google Patents

檢測玻璃中內含物的方法

Info

Publication number
HK1049042A1
HK1049042A1 HK02108878.8A HK02108878A HK1049042A1 HK 1049042 A1 HK1049042 A1 HK 1049042A1 HK 02108878 A HK02108878 A HK 02108878A HK 1049042 A1 HK1049042 A1 HK 1049042A1
Authority
HK
Hong Kong
Prior art keywords
inclusions
glass
detection
Prior art date
Application number
HK02108878.8A
Other languages
English (en)
Chinese (zh)
Inventor
Edwards Geoff
Original Assignee
Resolve Eng Pty Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Resolve Eng Pty Ltd filed Critical Resolve Eng Pty Ltd
Publication of HK1049042A1 publication Critical patent/HK1049042A1/zh

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/896Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958Inspecting transparent materials or objects, e.g. windscreens

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
HK02108878.8A 1999-09-02 2002-12-05 檢測玻璃中內含物的方法 HK1049042A1 (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
AUPQ2622A AUPQ262299A0 (en) 1999-09-02 1999-09-02 Detection of inclusions in glass
PCT/AU2000/001032 WO2001018532A1 (en) 1999-09-02 2000-09-01 Detection of inclusions in glass

Publications (1)

Publication Number Publication Date
HK1049042A1 true HK1049042A1 (zh) 2003-04-25

Family

ID=3816792

Family Applications (1)

Application Number Title Priority Date Filing Date
HK02108878.8A HK1049042A1 (zh) 1999-09-02 2002-12-05 檢測玻璃中內含物的方法

Country Status (7)

Country Link
EP (1) EP1210586A4 (de)
JP (1) JP2003508786A (de)
CN (1) CN1377462A (de)
AU (1) AUPQ262299A0 (de)
CA (1) CA2384005A1 (de)
HK (1) HK1049042A1 (de)
WO (1) WO2001018532A1 (de)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7142295B2 (en) * 2003-03-05 2006-11-28 Corning Incorporated Inspection of transparent substrates for defects
DE102004005019A1 (de) * 2004-01-30 2005-08-18 Isra Glass Vision Gmbh Verfahren zur Bestimmung der Tiefe eines Fehlers in einem Glasband
KR20070085258A (ko) * 2004-09-17 2007-08-27 디.바이스 사이언티픽 인코포레이티드 다이렉트 이미지 기술을 사용하는 평판 매체의 광학적 검사
GB0606217D0 (en) * 2006-03-29 2006-05-10 Pilkington Plc Glazing inspection
JPWO2009031420A1 (ja) * 2007-09-04 2010-12-09 旭硝子株式会社 透明板体内部の微小異物を検出する方法及びその装置
DE102013002602B4 (de) 2013-02-15 2022-05-05 Hegla Boraident Gmbh & Co. Kg Verfahren und Vorrichtung zur Detektion von Partikeln in Glas
DE102013107215B3 (de) * 2013-07-09 2014-10-09 Heraeus Quarzglas Gmbh & Co. Kg Verfahren zur Herstellung eines Spiegelsubstrat-Rohlings aus Titan-dotiertem Kieselglas für die EUV-Lithographie, sowie System zur Positionsbestimmung von Defekten in einem Rohling
WO2019171319A1 (en) * 2018-03-07 2019-09-12 Guardian Glass, LLC Method and system for detecting inclusions in float glass based on wavelength(s) analysis
US10481097B1 (en) 2018-10-01 2019-11-19 Guardian Glass, LLC Method and system for detecting inclusions in float glass based on spectral reflectance analysis
CN116835863B (zh) * 2023-07-14 2023-12-12 连云港双石特种玻璃有限公司 一种能准确控制特种玻璃厚度的加工设备及其使用方法

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3814946A (en) * 1972-12-04 1974-06-04 Asahi Glass Co Ltd Method of detecting defects in transparent and semitransparent bodies
US4025201A (en) * 1975-04-21 1977-05-24 Ball Brothers Service Corporation Method and apparatus for video inspection of articles of manufacture by decussate paths of light
US4136961A (en) * 1977-07-01 1979-01-30 Corning Glass Works Method and apparatus for detection of inclusions in glass article or the like
US4401893A (en) * 1981-07-29 1983-08-30 Intec Corporation Method and apparatus for optically inspecting a moving web of glass
EP0162120B1 (de) * 1984-05-14 1988-12-07 Ibm Deutschland Gmbh Verfahren und Einrichtung zur Oberflächenprüfung
EP0189551B1 (de) * 1984-12-14 1988-10-26 Flachglas Aktiengesellschaft Verfahren und Vorrichtung zum Prüfen von transparenten Materialbahnen, insbesondere Flachglasbändern
KR960012330B1 (ko) * 1987-05-27 1996-09-18 마쓰무라 미노루 투광판재의 식별형 결점 검출 장치
DE3800053A1 (de) * 1988-01-04 1989-07-13 Sick Optik Elektronik Erwin Optische fehlerinspektionsvorrichtung
US5235400A (en) * 1988-10-12 1993-08-10 Hitachi, Ltd. Method of and apparatus for detecting defect on photomask
FR2681429B1 (fr) * 1991-09-13 1995-05-24 Thomson Csf Procede et dispositif d'inspection du verre.
AT402860B (de) * 1993-06-22 1997-09-25 Oesterr Forsch Seibersdorf Verfahren und vorrichtung zur prüfung von transparenten gegenständen
JPH07294422A (ja) * 1994-04-27 1995-11-10 Mitsubishi Materials Corp 表面近傍結晶欠陥の検出方法およびその装置
NL1006378C2 (nl) * 1997-06-23 1998-12-24 Tno Werkwijze en inrichting voor het inspecteren van een voorwerp met betrekking tot verstoringen.

Also Published As

Publication number Publication date
JP2003508786A (ja) 2003-03-04
EP1210586A1 (de) 2002-06-05
CA2384005A1 (en) 2001-03-15
AUPQ262299A0 (en) 1999-09-23
EP1210586A4 (de) 2002-12-04
WO2001018532A1 (en) 2001-03-15
CN1377462A (zh) 2002-10-30

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