CN1307699C - 基于压接互连技术的电力电子集成模块的制备方法 - Google Patents

基于压接互连技术的电力电子集成模块的制备方法 Download PDF

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CN1307699C
CN1307699C CNB2005100417932A CN200510041793A CN1307699C CN 1307699 C CN1307699 C CN 1307699C CN B2005100417932 A CNB2005100417932 A CN B2005100417932A CN 200510041793 A CN200510041793 A CN 200510041793A CN 1307699 C CN1307699 C CN 1307699C
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曾翔君
何晓宇
杨旭
王兆安
王晓宝
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Xian Jiaotong University
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Abstract

本发明公开了一种基于压接互连工艺和混合封装技术的电力电子集成模块的制备方法,首次提出铍青铜弹簧压接互连工艺的原理以及采用该工艺设计制造电力电子集成模块的封装步骤。铍青铜压接互连工艺主要原理是通过铍青铜制作的特定形状和弹性的弹簧与绝缘栅双极型晶体管(IGBT)和快恢复二极管(FRED)管芯实现互连。铍青铜弹簧既提供足够大的压接力,同时又承担导电的功能。该工艺替代了商用模块中广泛采用的铝丝互连工艺,因此可以提高模块的长期可靠性。本说明书不仅阐述了铍青铜压接互连工艺的原理,而且还介绍了采用该工艺实现的一个半桥型电力电子集成模块,包括其封装步骤、模块的结构及实验结果。

Description

基于压接互连技术的电力电子集成模块的制备方法
技术领域
本发明属于电力电子技术领域涉及一种电路集成模块的制备,具体地说,是一种基于混合封装技术和压接互连工艺的电力电子集成模块制备方法。
背景技术
目前绝大多数商用的绝缘栅双极型晶体管(IGBT)模块采用的都是铝丝互连工艺,铝丝互连工艺的主要问题是长期可靠性的问题。实验表明,由于存在热应力和电磁应力等原因,70%以上的绝缘栅双极型晶体管(IGBT)模块失效的原因是由于铝丝键合点拔起(Lifting)。为了克服这个问题,需要寻找新的高可靠性的芯片互连工艺来代替铝丝互连工艺。压接工艺具有公认的高可靠性以及低成本的优势,因此在电力电子集成模块中采用压接互连工艺是十分有价值的研究内容。
发明内容
本发明的目的旨在提出一种基于压接互连工艺的电力电子集成模块制备方法。
实现上述目的的技术解决方案是,一种基于混合封装工艺和压接互连工艺的电力电子集成模块的制备方法,其特征在于:该方法采用铍青铜弹簧压接方式替代常规的铝丝键合工艺,并结合混合封装工艺实现制备多芯片电力电子集成模块,并在模块内部集成驱动和保护电路;方法包括下列步骤:
1)将Al2O3(或AlN)敷铜陶瓷板(DBC)腐蚀电路图形,然后把绝缘栅双极型晶体管(IGBT)和快恢复二极管(FRED)的管芯通过回流焊工艺焊接到DBC上。
2)通过回流焊工艺将敷铜陶瓷板与铜基板焊接在一起,构成模块的功率基板,绝缘栅双极型晶体管管芯的控制电极(即栅极和发射极)通过铝丝键合工艺从硅片上引出。
3)在每个绝缘栅双极型晶体管管芯的发射极键合区和每个快恢复二极管管芯的阳极键合区内放置特定大小0.8mm厚的铜过渡块,并在保持一定压力的情况下,用硅橡胶将过渡块与硅片表面进行粘接。
4)采用0.15mm铍青铜带(软态)在常温下进行压接弹簧预成形,然后对其进行2个小时的人工时效处理(即在一定温度条件下,通过真空保温使金属发生性能改变的热处理方式),使其具有优良的弹性和抗疲劳特性,最后在弹簧表面镀金。
5)采用无氧铜和线切割工艺制作模块特定形状的引出电极,并在表面进行镀镍。绝缘栅双极型晶体管管芯的集电极引出电极直接焊接到敷铜陶瓷板上,发射极引出电极用于焊接铍青铜弹簧。
6)采用足够厚度和刚度的环氧印刷电路板,在其一面制作驱动保护电路,印刷板的另一面用硅橡胶将绝缘栅双极型晶体管管芯发射极引出电极与之粘接固定。
7)在模块的功率基板上安装热压成型的压接支撑外壳和固定螺栓,在壳体内装入印刷电路板,并用螺母将印刷电路板上的弹簧压接到硅片表面的铜过渡块上,形变量由支撑壳体进行限定和保证。压接弹簧不仅提供足够大的压接力,同时也实现导电的功能。
8)在模块内填充硅凝胶保护,并将模块封盖即成。
上述采用压接工艺设计的半桥型集成模块样机的功率等级为1kW~5kW。
本发明首次提出铍青铜弹簧压接互连工艺的原理方法以及采用该工艺设计制造电力电子集成模块的封装步骤。铍青铜压接互连工艺主要原理是通过铍青铜制作的特定形状和弹性的弹簧与绝缘栅双极型晶体管(IGBT)和快恢复二极管(FRED)管芯实现互连。铍青铜弹簧既提供足够大的压接力,同时又承担导电的功能。该工艺替代了商用模块中广泛采用的铝丝互连工艺,因此可以提高模块的长期可靠性。
附图说明
图1是铍青铜弹簧压接互连工艺原理示意图;
图2是铍青铜弹簧的结构和尺寸设计图;
图3是IGBT的发射极引出电极与印刷电路板粘接后的照片;
图4是铍青铜压接弹簧的弹力—形变量曲线;
图5是组装后的半桥型集成模块的实物照片;
图6是采用铍青铜弹簧压接后的IGBT特性曲线;
图7是采用本发明制备的半桥集成模块的电气原理图。
以下结合附图和发明人给出的具体实施例对本发明作进一步的详细说明。
具体实施方式
附图1给出了铍青铜弹簧压接互连工艺的原理示意图。采用该工艺制造一个电力电子集成模块,其主要封装步骤如下:
1)在Al2O3(或AlN)敷铜陶瓷板(DBC)上腐蚀电路图形,然后把绝缘栅双极型晶体管(IGBT)和快恢复二极管(FRED)管芯通过回流焊工艺焊接到DBC上。
模块样机所采用的管芯为国际整流器公司(IR)的1200V/75A的IGBT和1200V/100A的FRED,其边长尺寸分别为:11.25mm×11.25mm和9.05mm×9.05mm。模块采用的DBC为Al2O3(96%)陶瓷板,厚度0.5mm,双面敷铜层厚度各为0.2mm。管芯与DBC之间焊料为Pb(92.5%)-Sn(5%)-Ag(2.5%)焊料,熔点为275℃。
2)采用回流焊工艺将DBC与铜基板焊接在一起,构成模块的功率基板,铜基板上预先制作压接固定用螺栓孔。IGBT管芯的控制电极(栅极和发射极)通过铝丝键合工艺从硅片上引出。
模块样机的铜基板尺寸为92.8mm×34mm×3mm,材料为无氧铜,表面镀镍处理,在焊接前进行预弯处理。铜基板与DBC之间的焊料为Sn(96.5%)-Ag(3.5%)焊料,熔点为221℃。
以上两步与常规IGBT模块的封装步骤相同,但是由于采用压接互连工艺,需要对管芯与DBC的焊接位置进行精确定位,这主要通过焊接模具来保证。
3)在焊接后的IGBT管芯的发射极(Emitter)键合区及FRED管芯的阳极(Anode)键合区内放置特定大小,厚度为0.8mm的铜过渡块(过渡块由纯铜或钼金属制造,表面进行高度抛光以及镀金处理)。在保持一定压力的情况下,用硅橡胶将过渡块与硅片表面进行粘接。
在硅片表面与弹簧之间放置铜过渡块主要为了保护硅片表面不会受到弹簧的损伤。硅片表面要与过渡块之间保持直接接触,为了固定过渡块的位置,采用硅橡胶进行粘接。这步工艺的要点是在完成固定的同时防止硅橡胶污染过渡块上下接触面,造成未来过大的接触电阻,因此需要在一定压力下进行涂胶,并且硅橡胶选择为室温硫化型(RTV)的。
模块样机的过渡块由纯铜制作,其中IGBT上过渡块尺寸为8mm×8mm×0.8mm,FRED上的尺寸为6mm×6mm×0.8mm。过渡块表面抛光并镀金,其光洁度需要达到0.32um以上,管芯与过渡块之间的粘接材料为单组分室温硫化型(RTV)的硅橡胶“赛立康”(商标名)。
4)铍青铜弹簧的制备:采用厚度为0.15mm,一定宽度的铍青铜带(软态)在常温下进行压接弹簧预成形,然后在300~320℃和真空条件下进行2个小时的保温(即时效处理工艺,该工艺是指在一定温度条件下,通过真空保温使金属发生性能改变的热处理方式),使其具有优良的弹性和抗疲劳特性,最后对弹簧表面镀金处理。
5)模块的引出电极制备以及弹簧的安装:采用无氧铜和线切割工艺制作模块特定形状的引出电极,并在表面进行镀镍处理。IGBT的集电极(Collector)引出电极通过回流焊直接焊接到DBC上,焊接定位通过焊接模具实现;发射极引出电极用来焊接铍青铜弹簧,弹簧的焊接仍然采用回流焊工艺,其定位通过阻焊工艺实现和保证。
样机模块的铍青铜弹簧由厚度为0.15mm,宽度为6mm的铍青铜带制成。铍青铜与发射极引出电极之间的焊料为Pb(36%)-Sn(62%)-Ag(2%)焊料,熔点为179℃。
附图2给出了铍青铜弹簧的形状和尺寸设计图。
6)采用具有足够厚度和刚度的环氧印刷电路板(PCB),在其一面制作驱动保护电路;印刷电路板的另一面与发射极引出电极通过硅橡胶粘接固定。
附图3为集成模块驱动保护电路PCB和发射极引出电极粘接后的实物照片。对于半桥型集成模块,总共有4个压接弹簧,分别实现对IGBT和FRED管芯的压接。压接弹簧既提供足够大的的压接力,同时又实现导电的功能。压接工艺主要承力对象是印刷电路板,因此要求电路板要具有一定的厚度和强度;另外,压接螺栓要均匀布局在印刷电路板的四周和中心,以保证压接力在板上的均匀分布。
模块样机的驱动保护电路采用的主要器件为集成驱动器HCPL-316J以及三端稳压块LM7806。印刷电路板厚度为2mm,印刷板与电极之间的粘接材料仍然采用单组分室温硫化的硅橡胶“赛立康”。
7)在模块的功率基板上安装热压成型的模块压接支撑外壳和固定螺栓,在壳体内装入印刷电路板,并用螺母将印刷电路板上的弹簧压接到硅片表面的铜过渡块上,弹簧形变量由支撑壳体进行限定和保证。
模块样机采用的支撑外壳是用有机玻璃制作,但是工艺本身要求外壳必须采用聚苯硫醚(PPS)等材料通过模具热压成形来制造。
附图4给出了实现测定的铍青铜压接弹簧的弹力—形变量曲线,支撑壳体确保压接形变量不会超过弹簧的弹性范围。
8)在模块内填充硅凝胶保护,并将模块封盖。
硅凝胶的灌充只要对硅片和DBC进行保护即可,因此其填充高度不超过铜过渡块的高度。附图5给出了模块组装过程中及完成后的实物照片。
采用铍青铜弹簧压接后IGBT的特性曲线通过实验测定,在附图6中给出,其中左图为耐压测试曲线,右图为V-I特性曲线。
采用压接互连工艺实现的半桥集成模块样机的电气原理图由附图7给出。模块的主电路由两个独立的单元构成,每个单元包括一个1200V/75A的IGBT和一个反并联的1200V/100A的FRED管芯。主电路的外部引出端子为P,E1,C2和N,当把E1和C2短接在一起,就构成了一个半桥主电路拓扑。模块内部包含完整的驱动和保护电路,如图所示,驱动保护电路主要由集成驱动器HCPL-316J和三端稳压器件LM7806构成。整个模块需要三个独立的供电电源,分别为一个+5V和两个+24V电源。24V电源在模块内部被变换成+18V和-6V,用以给驱动电路供电。驱动电路的输入接口包括输入复位/Reset,故障反馈/Fault和两个单独的控制信号输入Vin1和Vin2。图中的端子E1和C2在模块外由用户连接,即实现了半桥拓扑结构。

Claims (3)

1.一种基于混合封装工艺和压接互连技术的电力电子集成模块的制备方法,采用铍青铜弹簧压接方式替代常规的铝丝键合工艺,并结合混合封装工艺实现制备多芯片电力电子集成模块,并在模块内部集成驱动和保护电路;其特征在于,该方法包括下列步骤:
1)将Al2O3或AlN敷铜陶瓷板腐蚀电路图形,然后把绝缘栅双极型晶体管和快恢复二极管的管芯通过回流焊工艺焊接到敷铜陶瓷板上;
2)通过回流焊工艺将敷铜陶瓷板与铜基板焊接在一起,构成模块的功率基板,绝缘栅双极型晶体管管芯的控制电极即栅极和发射极通过铝丝键合工艺从硅片上引出;
3)在每个绝缘栅双极型晶体管管芯的发射极键合区和每个快恢复二极管管芯的阳极键合区内放置特定大小0.8mm厚的铜过渡块,并在定压状态下,用硅橡胶将铜过渡块与硅片表面进行粘接;
4)采用0.15mm铍青铜带在常温下进行压接弹簧预成形,然后对其进行2个小时的人工时效处理,使其具有优良的弹性和抗疲劳特性,最后在弹簧表面镀金;
5)采用无氧铜和线切割工艺制作模块特定形状的引出电极,并在表面进行镀镍,绝缘栅双极型晶体管管芯的集电极引出电极直接焊接到敷铜陶瓷板上,发射极引出电极用于焊接铍青铜弹簧;
6)采用足够厚度和刚度的环氧印刷电路板,在其一面制作驱动保护电路,印刷板的另一面用硅橡胶将绝缘栅双极型晶体管管芯发射极引出电极与之粘接固定;
7)在模块的功率基板上安装热压成型的压接支撑外壳和固定螺栓,在壳体内装入印刷电路板,并用螺母将印刷电路板上的弹簧压接到硅片表面的铜过渡块上,弹簧用于提供足够大的压接力和实现导电的功能,形变量由支撑壳体进行限定和保证;
8)在模块内填充硅凝胶保护,并将模块封盖即成。
2.如权利要求1所述的方法,其特征在于,所述的铍青铜带为软态铍青铜带。
3.如权利要求1所述的方法,其特征在于,采用压接工艺设计的半桥型集成模块样机的功率等级为1kW~5kW。
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JP4916494B2 (ja) * 2008-08-08 2012-04-11 ソニーケミカル&インフォメーションデバイス株式会社 圧着装置、圧着方法、および押圧板
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CN102129986B (zh) * 2010-12-29 2012-10-24 朝阳无线电元件有限责任公司 采用冶金键合方法制造玻封二极管的方法
WO2013091143A1 (zh) * 2011-12-21 2013-06-27 武汉飞恩微电子有限公司 微通道直接敷铜基板及其功率器件的封装结构和工艺
CN103904049B (zh) * 2012-12-25 2017-02-08 西安永电电气有限责任公司 一种igbt模块辅助电极结构及该结构的固定方法
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CN109801899B (zh) * 2018-12-27 2021-04-23 全球能源互联网研究院有限公司 一种功率半导体模块
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Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11233699A (ja) * 1998-02-12 1999-08-27 Mitsubishi Electric Corp パワー半導体モジュール
CN1541802A (zh) * 2003-11-07 2004-11-03 西安交通大学 金属与玻璃及陶瓷之间的阳极焊接方法
CN1571150A (zh) * 2004-05-01 2005-01-26 江苏长电科技股份有限公司 微型倒装晶体管及其制造方法

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11233699A (ja) * 1998-02-12 1999-08-27 Mitsubishi Electric Corp パワー半導体モジュール
CN1541802A (zh) * 2003-11-07 2004-11-03 西安交通大学 金属与玻璃及陶瓷之间的阳极焊接方法
CN1571150A (zh) * 2004-05-01 2005-01-26 江苏长电科技股份有限公司 微型倒装晶体管及其制造方法

Non-Patent Citations (3)

* Cited by examiner, † Cited by third party
Title
电子器件 曾翔君,余小玲,王晓宝,杨旭,王兆安,19.23,混合封装电力电子集成模块内功率电路对驱动保护电路的热影响 2004 *
电子器件 曾翔君,余小玲,王晓宝,杨旭,王兆安,19.23,混合封装电力电子集成模块内功率电路对驱动保护电路的热影响 2004;西安交通大学学报 余小玲,曾翔君,杨旭,冯全科,258.261,混合封装电力电子集成模块内的传热研究 2004 *
西安交通大学学报 余小玲,曾翔君,杨旭,冯全科,258.261,混合封装电力电子集成模块内的传热研究 2004 *

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