CN1289933A - 一种测试电路板连接器的承接装置 - Google Patents
一种测试电路板连接器的承接装置 Download PDFInfo
- Publication number
- CN1289933A CN1289933A CN 99124693 CN99124693A CN1289933A CN 1289933 A CN1289933 A CN 1289933A CN 99124693 CN99124693 CN 99124693 CN 99124693 A CN99124693 A CN 99124693A CN 1289933 A CN1289933 A CN 1289933A
- Authority
- CN
- China
- Prior art keywords
- under test
- board under
- connector
- test
- posting
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Images
Landscapes
- Measuring Leads Or Probes (AREA)
Abstract
Description
Claims (4)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN 99124693 CN1125345C (zh) | 1999-12-30 | 1999-12-30 | 一种测试电路板连接器的承接装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN 99124693 CN1125345C (zh) | 1999-12-30 | 1999-12-30 | 一种测试电路板连接器的承接装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1289933A true CN1289933A (zh) | 2001-04-04 |
CN1125345C CN1125345C (zh) | 2003-10-22 |
Family
ID=5283566
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN 99124693 Expired - Lifetime CN1125345C (zh) | 1999-12-30 | 1999-12-30 | 一种测试电路板连接器的承接装置 |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN1125345C (zh) |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN100380131C (zh) * | 2002-03-14 | 2008-04-09 | 陶瓷元件技术公司 | 用于测试陶瓷表面贴装元件及其它电子元件的接触器组合装置 |
CN100455032C (zh) * | 2003-11-21 | 2009-01-21 | 华为技术有限公司 | 一种单板测试方法 |
CN102768293A (zh) * | 2012-07-24 | 2012-11-07 | 上海交通大学 | 一种有机电致发光器件测量夹具 |
CN104049170A (zh) * | 2013-06-26 | 2014-09-17 | 杭州戴雷科技有限公司 | 一种电连接器插拔寿命试验机及其使用方法 |
CN111342910A (zh) * | 2020-03-02 | 2020-06-26 | 瑞声精密制造科技(常州)有限公司 | 传输线测试装置 |
CN113967881A (zh) * | 2020-07-22 | 2022-01-25 | 上海复旦微电子集团股份有限公司 | 用于测试的夹具、设备及系统 |
-
1999
- 1999-12-30 CN CN 99124693 patent/CN1125345C/zh not_active Expired - Lifetime
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN100380131C (zh) * | 2002-03-14 | 2008-04-09 | 陶瓷元件技术公司 | 用于测试陶瓷表面贴装元件及其它电子元件的接触器组合装置 |
CN100455032C (zh) * | 2003-11-21 | 2009-01-21 | 华为技术有限公司 | 一种单板测试方法 |
CN102768293A (zh) * | 2012-07-24 | 2012-11-07 | 上海交通大学 | 一种有机电致发光器件测量夹具 |
CN104049170A (zh) * | 2013-06-26 | 2014-09-17 | 杭州戴雷科技有限公司 | 一种电连接器插拔寿命试验机及其使用方法 |
CN104049170B (zh) * | 2013-06-26 | 2016-06-22 | 杭州戴雷科技有限公司 | 一种电连接器插拔寿命试验机及其使用方法 |
CN111342910A (zh) * | 2020-03-02 | 2020-06-26 | 瑞声精密制造科技(常州)有限公司 | 传输线测试装置 |
CN111342910B (zh) * | 2020-03-02 | 2021-06-11 | 瑞声精密制造科技(常州)有限公司 | 传输线测试装置 |
CN113967881A (zh) * | 2020-07-22 | 2022-01-25 | 上海复旦微电子集团股份有限公司 | 用于测试的夹具、设备及系统 |
Also Published As
Publication number | Publication date |
---|---|
CN1125345C (zh) | 2003-10-22 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US5485096A (en) | Printed circuit board tester having a test bed with spring probes and easily replaceable switch cards | |
TW521151B (en) | Pin block structure for mounting contact pins | |
US6194908B1 (en) | Test fixture for testing backplanes or populated circuit boards | |
EP0790502A3 (en) | Probe, manufacture of same, and vertically operative type probe card assembly employing same | |
CN1125345C (zh) | 一种测试电路板连接器的承接装置 | |
EP1031839A2 (en) | Test fixture for matched impedance testing | |
CA1271565A (en) | Adaptor in apparatus for electronically testing printed circuit boards | |
CN212749146U (zh) | 一体式性能测试装置 | |
CN209896363U (zh) | 一种测试烧录工装用连接插头及测试烧录工装 | |
KR200388336Y1 (ko) | 컨택트 프로브 | |
CN2371564Y (zh) | 一种电子基板测试治具组 | |
CN211577232U (zh) | 一种用于自动驾驶芯片测试的垂直探针卡、插接安装结构和定位结构 | |
CN109085391B (zh) | 电子设备测试装置及电子设备 | |
CN219456263U (zh) | 一种pin针式连接器转接组件 | |
CN211179898U (zh) | 一种检测手机屏幕用的夹具 | |
CN206020473U (zh) | 一种用于fpc电性能测试的连接装置 | |
CN2590004Y (zh) | 印刷电路板测试装置的转接探针 | |
KR200394134Y1 (ko) | 반도체 검사용 프로브 카드 | |
CN218956635U (zh) | 一种小尺寸b2b连接结构 | |
CN218729019U (zh) | 一种板卡总线数据传输测试装置 | |
CN2545632Y (zh) | 微处理器插座的测试模块 | |
TWM456491U (zh) | 測試分類設備之接合板組與測試連接器之易拆組構造 | |
CN215728629U (zh) | 一种电路板工装 | |
CN219065523U (zh) | 放电插座检测定位装置 | |
US20010033180A1 (en) | Test pin with removable head |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
C56 | Change in the name or address of the patentee |
Owner name: ZTE CO., LTD. Free format text: FORMER NAME OR ADDRESS: SHENZHENG CITY ZTE CO., LTD. |
|
CP03 | Change of name, title or address |
Address after: 518057 Zhongxing building, science and technology south road, Nanshan District hi tech Industrial Park, Guangdong, Shenzhen Patentee after: ZTE Corporation Address before: 518057 Zhongxing building, hi tech Industrial Park, Shenzhen, Guangdong, Nanshan District Province, Liu Jian Patentee before: Zhongxing Communication Co., Ltd., Shenzhen City |
|
CX01 | Expiry of patent term | ||
CX01 | Expiry of patent term |
Granted publication date: 20031022 |