CN1223931C - 逻辑电路的易测化设计 - Google Patents
逻辑电路的易测化设计 Download PDFInfo
- Publication number
- CN1223931C CN1223931C CNB021253897A CN02125389A CN1223931C CN 1223931 C CN1223931 C CN 1223931C CN B021253897 A CNB021253897 A CN B021253897A CN 02125389 A CN02125389 A CN 02125389A CN 1223931 C CN1223931 C CN 1223931C
- Authority
- CN
- China
- Prior art keywords
- computing
- rtl
- testability
- testability design
- circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/31704—Design for test; Design verification
Abstract
Description
Claims (6)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2001356330A JP3701230B2 (ja) | 2001-11-21 | 2001-11-21 | 論理回路のテスト容易化方法 |
JP356330/2001 | 2001-11-21 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1420430A CN1420430A (zh) | 2003-05-28 |
CN1223931C true CN1223931C (zh) | 2005-10-19 |
Family
ID=19167871
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CNB021253897A Expired - Fee Related CN1223931C (zh) | 2001-11-21 | 2002-07-30 | 逻辑电路的易测化设计 |
Country Status (4)
Country | Link |
---|---|
US (1) | US7437340B2 (zh) |
JP (1) | JP3701230B2 (zh) |
CN (1) | CN1223931C (zh) |
TW (1) | TWI281625B (zh) |
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7836649B2 (en) | 2002-05-03 | 2010-11-23 | Faus Group, Inc. | Flooring system having microbevels |
US7836648B2 (en) | 2002-05-03 | 2010-11-23 | Faus Group | Flooring system having complementary sub-panels |
US8112958B2 (en) | 2002-05-03 | 2012-02-14 | Faus Group | Flooring system having complementary sub-panels |
US8181407B2 (en) | 2002-05-03 | 2012-05-22 | Faus Group | Flooring system having sub-panels |
US8201377B2 (en) | 2004-11-05 | 2012-06-19 | Faus Group, Inc. | Flooring system having multiple alignment points |
US8209928B2 (en) | 1999-12-13 | 2012-07-03 | Faus Group | Embossed-in-registration flooring system |
US8875460B2 (en) | 1999-11-05 | 2014-11-04 | Faus Group, Inc. | Direct laminated floor |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103376399B (zh) * | 2012-04-24 | 2015-08-05 | 北京兆易创新科技股份有限公司 | 一种逻辑电路 |
CN103885819B (zh) * | 2012-12-21 | 2017-11-17 | 中国科学院微电子研究所 | 一种针对fpga面积优化的优先级资源共享方法 |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5513123A (en) | 1994-06-30 | 1996-04-30 | Nec Usa, Inc. | Non-scan design-for-testability of RT-level data paths |
US5949692A (en) * | 1996-08-28 | 1999-09-07 | Synopsys, Inc. | Hierarchical scan architecture for design for test applications |
US6311317B1 (en) * | 1999-03-31 | 2001-10-30 | Synopsys, Inc. | Pre-synthesis test point insertion |
US6931572B1 (en) * | 1999-11-30 | 2005-08-16 | Synplicity, Inc. | Design instrumentation circuitry |
-
2001
- 2001-11-21 JP JP2001356330A patent/JP3701230B2/ja not_active Expired - Fee Related
-
2002
- 2002-07-05 US US10/190,158 patent/US7437340B2/en not_active Expired - Fee Related
- 2002-07-11 TW TW091115417A patent/TWI281625B/zh not_active IP Right Cessation
- 2002-07-30 CN CNB021253897A patent/CN1223931C/zh not_active Expired - Fee Related
Cited By (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8875460B2 (en) | 1999-11-05 | 2014-11-04 | Faus Group, Inc. | Direct laminated floor |
US8209928B2 (en) | 1999-12-13 | 2012-07-03 | Faus Group | Embossed-in-registration flooring system |
US7836649B2 (en) | 2002-05-03 | 2010-11-23 | Faus Group, Inc. | Flooring system having microbevels |
US7836648B2 (en) | 2002-05-03 | 2010-11-23 | Faus Group | Flooring system having complementary sub-panels |
US8099919B2 (en) | 2002-05-03 | 2012-01-24 | Faus Group | Flooring system having microbevels |
US8112958B2 (en) | 2002-05-03 | 2012-02-14 | Faus Group | Flooring system having complementary sub-panels |
US8181407B2 (en) | 2002-05-03 | 2012-05-22 | Faus Group | Flooring system having sub-panels |
US8448400B2 (en) | 2002-05-03 | 2013-05-28 | Faus Group | Flooring system having complementary sub-panels |
US8201377B2 (en) | 2004-11-05 | 2012-06-19 | Faus Group, Inc. | Flooring system having multiple alignment points |
Also Published As
Publication number | Publication date |
---|---|
US7437340B2 (en) | 2008-10-14 |
TWI281625B (en) | 2007-05-21 |
CN1420430A (zh) | 2003-05-28 |
JP3701230B2 (ja) | 2005-09-28 |
JP2003157294A (ja) | 2003-05-30 |
US20030097347A1 (en) | 2003-05-22 |
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Legal Events
Date | Code | Title | Description |
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C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
ASS | Succession or assignment of patent right |
Owner name: CO., LTD. SYSTEM JD Free format text: FORMER OWNER: SEMICONDUCTOR MECHANICS RESEARCH CENTER CO., LTD. Effective date: 20070511 |
|
C41 | Transfer of patent application or patent right or utility model | ||
TR01 | Transfer of patent right |
Effective date of registration: 20070511 Address after: Fukuoka Prefecture Patentee after: KK systems JD Address before: Kanagawa Patentee before: Semiconductor Mechanics Research Center Co., Ltd. |
|
ASS | Succession or assignment of patent right |
Owner name: SEMICONDUCTOR MECHANICS RESEARCH CENTER CO., LTD. Free format text: FORMER OWNER: CO., LTD. SYSTEM JD Effective date: 20081010 |
|
C41 | Transfer of patent application or patent right or utility model | ||
TR01 | Transfer of patent right |
Effective date of registration: 20081010 Address after: Kanagawa Patentee after: Semiconductor Mechanics Research Center Co., Ltd. Address before: Fukuoka Prefecture Patentee before: KK systems JD |
|
C17 | Cessation of patent right | ||
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20051019 Termination date: 20110730 |