CN118901146A - 电磁波检测器、电磁波检测器阵列以及图像传感器 - Google Patents

电磁波检测器、电磁波检测器阵列以及图像传感器 Download PDF

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Publication number
CN118901146A
CN118901146A CN202380028949.XA CN202380028949A CN118901146A CN 118901146 A CN118901146 A CN 118901146A CN 202380028949 A CN202380028949 A CN 202380028949A CN 118901146 A CN118901146 A CN 118901146A
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CN
China
Prior art keywords
electrode
electromagnetic wave
layer
wave detector
dimensional material
Prior art date
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Pending
Application number
CN202380028949.XA
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English (en)
Chinese (zh)
Inventor
岛谷政彰
福岛昌一郎
小川新平
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
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Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority claimed from PCT/JP2023/000638 external-priority patent/WO2023181593A1/ja
Publication of CN118901146A publication Critical patent/CN118901146A/zh
Pending legal-status Critical Current

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    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N15/00—Thermoelectric devices without a junction of dissimilar materials; Thermomagnetic devices, e.g. using the Nernst-Ettingshausen effect
    • H10N15/10—Thermoelectric devices using thermal change of the dielectric constant, e.g. working above and below the Curie point
    • H10N15/15—Thermoelectric active materials

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  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Solid State Image Pick-Up Elements (AREA)
CN202380028949.XA 2022-03-25 2023-01-12 电磁波检测器、电磁波检测器阵列以及图像传感器 Pending CN118901146A (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2022049678 2022-03-25
JP2022-049678 2022-03-25
PCT/JP2023/000638 WO2023181593A1 (ja) 2022-03-25 2023-01-12 電磁波検出器、電磁波検出器アレイ及び画像センサ

Publications (1)

Publication Number Publication Date
CN118901146A true CN118901146A (zh) 2024-11-05

Family

ID=87886956

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CN202380028949.XA Pending CN118901146A (zh) 2022-03-25 2023-01-12 电磁波检测器、电磁波检测器阵列以及图像传感器

Country Status (3)

Country Link
US (1) US20250185515A1 (https=)
JP (1) JP7341373B1 (https=)
CN (1) CN118901146A (https=)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US12468074B2 (en) * 2023-12-20 2025-11-11 Toyota Motor Engineering & Manufacturing North America, Inc. Plasmonic borophene nanoribbon metal-insulator-metal structure for quantum imaging
WO2025163982A1 (ja) * 2024-01-31 2025-08-07 太陽誘電株式会社 光センサおよび光センサの製造方法

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102349955B1 (ko) * 2014-08-06 2022-01-11 삼성전자주식회사 다중 검출 모드를 지닌 포토 센서 및 그 동작 방법
JP6978775B2 (ja) * 2018-01-05 2021-12-08 国立研究開発法人理化学研究所 光電変換素子、光センサ、発電装置、及び光電変換方法
CN111788700B (zh) * 2018-03-06 2024-06-28 三菱电机株式会社 电磁波检测器以及具备该电磁波检测器的电磁波检测器阵列
JP7505239B2 (ja) * 2020-04-09 2024-06-25 富士通株式会社 光センサ、及びこれを用いた撮像装置

Also Published As

Publication number Publication date
JPWO2023181593A1 (https=) 2023-09-28
US20250185515A1 (en) 2025-06-05
JP7341373B1 (ja) 2023-09-08

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